PD- 94208 IRFB42N20D SMPS MOSFET HEXFET® Power MOSFET Applications High frequency DC-DC converters l Motor Control l Uninterrutible Power Supplies l VDSS 200V Benefits l Low Gate-to-Drain Charge to Reduce Switching Losses l Fully Characterized Capacitance Including Effective COSS to Simplify Design, (See App. Note AN1001) l Fully Characterized Avalanche Voltage and Current RDS(on) max ID 0.055Ω 44A TO-220AB Absolute Maximum Ratings Parameter ID @ TC = 25°C ID @ TC = 100°C IDM PD @TA = 25°C PD @TC = 25°C VGS dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Power Dissipation Linear Derating Factor Gate-to-Source Voltage Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torqe, 6-32 or M3 screw Max. Units 44 31 180 2.4 330 2.2 ± 30 2.5 -55 to + 175 A W W/°C V V/ns °C 300 (1.6mm from case ) 10 lbf•in (1.1N•m) Thermal Resistance Parameter RθJC RθCS RθJA Notes Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient through www.irf.com Typ. Max. Units ––– 0.50 ––– 0.45 ––– 62 °C/W are on page 8 1 5/7/01 IRFB42N20D Static @ TJ = 25°C (unless otherwise specified) Parameter Drain-to-Source Breakdown Voltage ∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient RDS(on) Static Drain-to-Source On-Resistance VGS(th) Gate Threshold Voltage V(BR)DSS IDSS Drain-to-Source Leakage Current IGSS Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Min. 200 ––– ––– 3.0 ––– ––– ––– ––– Typ. ––– 0.26 ––– ––– ––– ––– ––– ––– Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, ID = 1mA 0.055 Ω VGS = 10V, ID = 26A 5.5 V VDS = VGS, ID = 250µA 25 VDS = 200V, VGS = 0V µA 250 VDS = 160V, VGS = 0V, TJ = 150°C 100 VGS = 30V nA -100 VGS = -30V Dynamic @ TJ = 25°C (unless otherwise specified) gfs Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss Coss Coss Coss eff. Parameter Forward Transconductance Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Output Capacitance Effective Output Capacitance Min. 21 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– 91 24 43 18 69 29 32 3430 530 100 5310 210 400 Max. Units Conditions ––– S VDS = 50V, ID = 26A 140 ID = 26A 36 nC VDS = 160V 65 VGS = 10V, ––– VDD = 100V ––– ID = 26A ns ––– RG = 1.8Ω ––– VGS = 10V ––– VGS = 0V ––– VDS = 25V ––– pF ƒ = 1.0MHz ––– VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz ––– VGS = 0V, VDS = 160V, ƒ = 1.0MHz ––– VGS = 0V, VDS = 0V to 160V Avalanche Characteristics Parameter EAS IAR EAR Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Typ. Max. Units ––– ––– ––– 510 26 33 mJ A mJ Diode Characteristics IS ISM VSD trr Qrr ton 2 Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol 44 ––– ––– showing the A G integral reverse ––– ––– 180 S p-n junction diode. ––– ––– 1.3 V TJ = 25°C, IS = 26A, VGS = 0V ––– 220 330 ns TJ = 25°C, IF = 26A ––– 1860 2790 nC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) www.irf.com IRFB42N20D 1000 1000 VGS 15V 10V 8.0V 7.0V 6.5V 6.0V 5.5V BOTTOM 5.0V 100 100 10 1 0.1 5.0V 20µs PULSE WIDTH TJ = 25 °C 0.01 0.1 1 10 10 5.0V 3.5 R DS(on) , Drain-to-Source On Resistance (Normalized) TJ = 175 ° C 10 TJ = 25 ° C V DS = 50V 20µs PULSE WIDTH 0.1 5 6 7 8 9 10 VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com 10 100 Fig 2. Typical Output Characteristics 1000 1 1 VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 100 20µs PULSE WIDTH TJ = 175 °C 1 0.1 100 VDS , Drain-to-Source Voltage (V) I D , Drain-to-Source Current (A) VGS 15V 10V 8.0V 7.0V 6.5V 6.0V 5.5V BOTTOM 5.0V TOP I D , Drain-to-Source Current (A) I D , Drain-to-Source Current (A) TOP 11 ID = 44A 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -60 -40 -20 VGS = 10V 0 20 40 60 80 100 120 140 160 180 TJ , Junction Temperature ( °C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRFB42N20D VGS = 0V, f = 1 MHZ Ciss = Cgs + Cgd, Cds SHORTED Crss = Cgd Coss = Cds + Cgd C, Capacitance(pF) 10000 Ciss Coss 1000 Crss 100 VGS , Gate-to-Source Voltage (V) 20 100000 10 1 10 100 ID = 26A VDS = 160V VDS = 100V VDS = 40V 16 12 8 4 FOR TEST CIRCUIT SEE FIGURE 13 0 1000 0 20 VDS , Drain-to-Source Voltage (V) 1000 ID, Drain-to-Source Current (A) ISD , Reverse Drain Current (A) 1000 100 80 100 120 140 OPERATION IN THIS AREA LIMITED BY R DS (on) 100 TJ = 175 ° C 10 1 TJ = 25 ° C V GS = 0 V 0.4 0.6 0.8 1.0 1.2 VSD ,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 60 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 0.1 0.2 40 QG , Total Gate Charge (nC) 100µsec 10 1msec 1 Tc = 25°C Tj = 175°C Single Pulse 0.1 1.4 1 10msec 10 100 1000 VDS , Drain-toSource Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRFB42N20D 50 VDS VGS I D , Drain Current (A) 40 RD D.U.T. RG + -VDD 30 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 20 Fig 10a. Switching Time Test Circuit 10 VDS 90% 0 25 50 75 100 125 150 175 TC , Case Temperature ( ° C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 1 D = 0.50 0.20 0.1 0.10 0.05 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE) P DM 0.01 t1 t2 0.001 0.00001 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRFB42N20D D R IV E R L VDS D .U .T RG + - VD D IA S 2V0GS V A 0 .0 1 Ω tp Fig 12a. Unclamped Inductive Test Circuit V (B R )D SS tp EAS , Single Pulse Avalanche Energy (mJ) 1000 1 5V TOP 800 BOTTOM ID 11A 19A 26A 600 400 200 0 25 50 75 100 125 150 175 Starting TJ , Junction Temperature ( °C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. QG 10 V 50KΩ 12V .2µF .3µF QGS QGD D.U.T. VG + V - DS VGS 3mA Charge Fig 13a. Basic Gate Charge Waveform 6 IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit www.irf.com IRFB42N20D Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + • • • • RG dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Driver Gate Drive P.W. D= Period + - VDD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFET® Power MOSFETs www.irf.com 7 IRFB42N20D TO-220AB Package Outline Dimensions are shown in millimeters (inches) 10.5 4 (.4 15) 10.2 9 (.4 05) 2.87 (.11 3) 2.62 (.10 3) -B- 3 .78 (.14 9) 3 .54 (.13 9) 4 .69 (.18 5) 4 .20 (.16 5) -A- 1.3 2 (.052) 1.2 2 (.048) 6.47 (.2 55) 6.10 (.2 40) 4 15 .24 (.6 00 ) 14 .84 (.5 84 ) 1.15 (.04 5) MIN 1 2 14.09 (.5 55 ) 13.47 (.5 30 ) 4 .06 (.16 0) 3 .55 (.14 0) 3X 3X LE A D A S S IG N ME N T S 1 - G A TE 2 - D R A IN 3 - SO URCE 4 - D R A IN 3 1.40 (.05 5) 1.15 (.04 5) 0 .93 (.0 37 ) 0 .69 (.0 27 ) 0.3 6 (.01 4) 3X M B A M 2 .92 (.115 ) 2 .64 (.104 ) 2 .5 4 (.1 00) 2X N O TE S : 1 D IME N S IO N IN G & TO L E R A N C IN G P E R A N S I Y 14.5 M, 19 82. 2 C O N TR O LLIN G D IM E N S IO N : IN C H 0.55 (.0 22) 0.46 (.0 18) 3 O U TL IN E C O NF O R MS T O JE D E C O U TL IN E T O -2 20 A B . 4 H E A T S IN K & LE A D ME A S U R E ME N T S D O N O T IN C L U D E B U R R S . TO-220AB Part Marking Information EXAMPLE: THIS IS AN IRF1010 LOT CODE 1789 AS S EMBLED ON WW 19, 1997 IN T HE AS S EMBLY LINE "C" INTERNAT IONAL RECTIFIER LOGO AS S EMBLY LOT CODE PART NUMBER DATE CODE YEAR 7 = 1997 WEEK 19 LINE C Notes: Repetitive rating; pulse width limited by max. junction temperature. Starting TJ = 25°C, L = 1.45mH RG = 25Ω, IAS = 26A, VGS=10V ISD ≤ 26A, di/dt ≤ 110A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C Pulse width ≤ 400µs; duty cycle ≤ 2%. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.5/01 8 www.irf.com