ONSEMI NBSG11

NBSG11
2.5V/3.3VSiGe 1:2
Differential Clock Driver
with RSECL* Outputs
*Reduced Swing ECL
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The NBSG11 is a 1-to-2 differential fanout buffer, optimized for
low skew and ultra-low JITTER.
Inputs incorporate internal 50 termination resistors and accept
NECL (Negative ECL), PECL (Positive ECL), CML, LVCMOS,
LVTTL, or LVDS. Outputs are RSECL (Reduced Swing ECL),
400 mV.
•
•
•
•
•
•
•
MARKING
DIAGRAM*
SG
11
LYW
FCBGA-16
BA SUFFIX
CASE 489
Maximum Input Clock Frequency up to 12 GHz Typical
Maximum Input Data Rate up to 12 Gb/s Typical
30 ps Typical Rise and Fall Times
125 ps Typical Propagation Delay
RSPECL Output with Operating Range: VCC = 2.375 V to 3.465 V
with VEE = 0 V
RSNECL Output with RSNECL or NECL Inputs with
Operating Range: VCC = 0 V with VEE = -2.375 V to -3.465 V
RSECL Output Level (400 mV Peak-to-Peak Output), Differential
Output Only
50 Internal Input Termination Resistors
SG11
ALYW
QFN-16
MN SUFFIX
CASE 485G
A = Assembly Location
L = Wafer Lot
Y = Year
W = Work Week
•
• Compatible with Existing 2.5 V/3.3 V LVEP, EP, and LVEL Devices
*For further details, refer to Application Note
AND8002/D
ORDERING INFORMATION
Device
4x4 mm
FCBGA-16
100 Units / Tray
NBSG11BAR2
4x4 mm
FCBGA-16
500 / Tape & Reel
NBSG11MN
3x3 mm
QFN-16
123 Units / Rail
NBSG11MNR2
3x3 mm
QFN-16
3000 / Tape & Reel
NBSG11BAEVB
April, 2003 - Rev. 6
1
Shipping
NBSG11BA
Board
 Semiconductor Components Industries, LLC, 2003
Package
Description
NBSG11BA Evaluation Board
Publication Order Number:
NBSG11/D
NBSG11
1
A
VTCLK
B
2
3
4
NC
NC
Q1
VEE
CLK
VCC
VTCLK
1
CLK
2
VEE
NC
NC
VCC
16
15
14
13
Exposed Pad (EP)
12
Q0
11
Q0
Q1
NBSG11
CLK
C
VEE
VTCLK
D
VCC
NC
NC
CLK
3
10
Q1
VTCLK
4
9
Q1
Q0
Q0
Figure 1. BGA-16 Pinout (Top View)
5
6
7
8
VEE
NC
NC
VCC
Figure 2. QFN-16 Pinout (Top View)
Table 1. Pin Description
Pin
BGA
QFN
Name
I/O
D1
1
VTCLK
-
C1
2
CLK
ECL, CML,
LVCMOS, LVDS,
LVTTL Input
Inverted Differential Input. Internal 75 k to VEE and 36.5 k to VCC.
B1
3
CLK
ECL, CML,
LVCMOS, LVDS,
LVTTL Input
Noninverted Differential Input. Internal 75 k to VEE.
A1
4
VTCLK
-
Internal 50 Termination Pin. See Table 2.
B2,C2
5,16
VEE
-
Negative Supply Voltage
A2,A3,D2,
D3
6,7,14,15
NC
-
No Connect
B3,C3
8,13
VCC
-
Positive Supply Voltage
A4
9
Q1
RSECL Output
Inverted Differential Output 1. Typically Terminated with 50 to
VTT = VCC - 2 V
B4
10
Q1
RSECL Output
Noninverted Differential Output 1. Typically Terminated with 50 to
VTT = VCC - 2 V
C4
11
Q0
RSECL Output
Inverted Differential output 0. Typically Terminated with 50 to
VTT = VCC - 2 V
D4
12
Q0
RSECL Output
Noninverted Differential Output 0. Typically Terminated with 50 to
VTT = VCC - 2 V
N/A
-
EP
-
Description
Internal 50 Termination Pin. See Table 2.
Exposed Pad (Note 2)
1. The NC pins are electrically connected to the die and must be left open.
2. All VCC and VEE pins must be externally connected to Power Supply to guarantee proper operation. The thermally exposed pad on package
bottom (see case drawing) must be attached to a heat-sinking conduit.
3. In the differential configuration when the input termination pins (VTCLK, VTCLK) are connected to a common termination voltage, and
if no signal is applied then the device will be susceptible to self-oscillation.
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2
NBSG11
VCC
VTCLK
Q1
36.5 K
50 Q1
CLK
CLK
50 75 K
Q0
75 K
Q0
VTCLK
VEE
Figure 3. Logic Diagram
Table 2. Interfacing Options
INTERFACING OPTIONS
CONNECTIONS
CML
Connect VTCLK and VTCLK to VCC
LVDS
Connect VTCLK and VTCLK together
AC-COUPLED
Bias VTCLK and VTCLK Inputs within
(VIHCMR) Common Mode Range
RSECL, PECL, NECL
Standard ECL Termination Techniques
LVTTL, LVCMOS
An external voltage should be be applied to the
unused complementary differential input.
Nominal voltage is 1.5 V for LVTTL and VCC/2
for LVCMOS inputs.
Table 3. ATTRIBUTES
Characteristics
Value
Internal Input Pulldown Resistor (CLK, CLK)
75 k
Internal Input Pullup Resistor (CLK)
ESD Protection
36.5 k
Human Body Model
Machine Model
> 2 kV
> 100 V
FCBGA-16
QFN-16
Level 3
Level 1
Moisture Sensitivity (Note 4)
Flammability Rating
Oxygen Index: 28 to 34
Transistor Count
UL 94 V-0 @ 0.125 in
125
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
4. For additional information, see Application Note AND8003/D.
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NBSG11
Table 4. MAXIMUM RATINGS (Note 5)
Symbol
Parameter
Condition 1
Condition 2
Rating
Units
VCC
Positive Power Supply
VEE = 0 V
3.6
V
VEE
Negative Power Supply
VCC = 0 V
-3.6
V
VI
Positive Input
Negative Input
VEE = 0 V
VCC = 0 V
3.6
-3.6
V
V
VINPP
Differential Input Voltage
2.8
|VCC - VEE|
V
V
Iout
Output Current
Continuous
Surge
25
50
mA
mA
TA
Operating Temperature Range
16 FCBGA
16 QFN
-40 to +70
-40 to +85
°C
Tstg
Storage Temperature Range
-65 to +150
°C
JA
Thermal Resistance (Junction-to-Ambient)
(Note 6)
0 LFPM
500 LFPM
0 LFPM
500 LFPM
16 FCBGA
16 FCBGA
16 QFN
16 QFN
108
86
41.6
35.2
°C/W
°C/W
°C/W
°C/W
JC
Thermal Resistance (Junction-to-Case)
1S2P (Note 6)
2S2P (Note 7)
16 FCBGA
16 QFN
5.0
4.0
°C/W
°C/W
Tsol
Wave Solder
< 15 Seconds
225
°C
VI ≤ VCC
VI ≥ VEE
VCC - VEE VCC - VEE <
|D - D|
2.8 V
2.8 V
5. Maximum Ratings are those values beyond which device damage may occur.
6. JEDEC standard multilayer board - 1S2P (1 signal, 2 power).
7. JEDEC standard multilayer board - 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad.
Table 5. DC CHARACTERISTICS, INPUT WITH RSPECL OUTPUT VCC = 2.5 V; VEE = 0 V (Note 8)
-40 °C
Symbol
Characteristic
25°C
70°C(BGA)/85°C(QFN)**
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
45
60
75
45
60
75
45
60
75
mA
IEE
Negative Power Supply Current
VOH
Output HIGH Voltage (Note 9)
1450
1530
1575
1525
1565
1600
1550
1590
1625
mV
VOUTPP
Output Amplitude Voltage
350
410
525
350
410
525
350
410
525
mV
VIH
Input HIGH Voltage (Single-Ended)
(Note 11)
VCC1435
mV
VCC1000
mV*
VCC
VCC1435
mV
VCC1000
mV*
VCC
VCC1435
mV
VCC1000
mV*
VCC
V
VIL
Input LOW Voltage (Single-Ended)
(Note 12)
VIH2.5 V
VCC1400
mV*
VIH150 mV
VIH2.5 V
VCC1400
mV*
VIH150
mV
VIH2.5 V
VCC1400
mV*
VIH150
mV
V
VIHCMR
Input HIGH Voltage Common Mode
Range (Differential Configuration)
(Note 10)
1.2
2.5
1.2
2.5
1.2
2.5
V
RTIN
Internal Input Termination Resistor
45
50
55
45
50
55
45
50
55
IIH
Input HIGH Current (@ VIH, VIHMAX)
80
150
80
150
80
150
A
IIL
Input LOW Current (@ VIL, VILMIN)
25
100
25
100
25
100
A
NOTE: SiGe circuits are designed to meet the DC specifications shown in the above table after thermal equilibrium has been established. The
circuit is in a test socket or mounted on a printed circuit board and transverse airflow greater than 500 lfpm is maintained.
8. Input and output parameters vary 1:1 with VCC. VEE can vary +0.125 V to -0.965 V.
9. All loading with 50 to VCC - 2.0 V. VOH/VOL measured at VIH/VIL.
10. VIHCMR min varies 1:1 with VEE, VIHCMR max varies 1:1 with VCC. The VIHCMR range is referenced to the most positive side of the differential
input signal.
11. VIH cannot exceed VCC.
12. VIL always ≥ VEE.
*Typicals used for testing purposes.
**The device packaged in FCBGA-16 have maximum temperature specification of 70°C and devices packaged in QFN-16 have maximum
temperature specification of 85°C.
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NBSG11
Table 6. DC CHARACTERISTICS, INPUT WITH RSPECL OUTPUT VCC = 3.3 V; VEE = 0 V (Note 13)
-40 °C
Symbol
Characteristic
25°C
70°C(BGA)/85°C(QFN)**
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
IEE
Negative Power Supply Current
45
60
75
45
60
75
45
60
75
mA
VOH
Output HIGH Voltage (Note 14)
2250
2330
2375
2325
2365
2400
2350
2390
2425
mV
VOUTPP
Output Amplitude Voltage
350
410
525
350
410
525
350
410
525
mV
VIH
Input HIGH Voltage (Single-Ended)
(Note 16)
VCC1435
mV
VCC1000
mV*
VCC
VCC1435
mV
VCC1000
mV*
VCC
VCC1435
mV
VCC1000
mV*
VCC
V
VIL
Input LOW Voltage (Single-Ended)
(Note 17)
VIH2.5 V
VCC1400
mV*
VIH150
mV
VIH2.5 V
VCC1400
mV*
VIH150
mV
VIH2.5 V
VCC1400
mV*
VIH150
mV
V
VIHCMR
Input HIGH Voltage Common Mode
Range (Note 15)
(Differential Configuration)
1.2
3.3
1.2
3.3
1.2
3.3
V
RTIN
Internal Input Termination Resistor
45
50
55
45
50
55
45
50
55
IIH
Input HIGH Current (@ VIH, VIHMAX)
80
150
80
150
80
150
A
IIL
Input LOW Current (@ VIL, VILMIN)
25
100
25
100
25
100
A
NOTE: SiGe Circuits are designed to meet the DC specifications shown in the above table after thermal equilibrium has been established. The
circuit is in a test socket or mounted on a printed circuit board and transverse airflow greater than 500 lfpm is maintained.
13. Input and output parameters vary 1:1 with VCC. VEE can vary +0.925 V to -0.165 V.
14. All loading with 50 to VCC - 2.0 V. VOH/VOL measured at VIH/VIL.
15. VIHCMR min varies 1:1 with VEE, VIHCMR max varies 1:1 with VCC. The VIHCMR range is referenced to the most positive side of the differential
input signal.
16. VIH cannot exceed VCC.
17. VIL always ≥ VEE.
*Typicals used for testing purposes.
**The device packaged in FCBGA-16 have maximum temperature specification of 70°C and devices packaged in QFN-16 have maximum
temperature specification of 85°C.
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NBSG11
Table 7. DC CHARACTERISTICS, NECL OR RSNECL INPUT WITH NECL OUTPUT
VCC = 0 V; VEE = -3.465 V to -2.375 V (Note 18)
-40 °C
Symbol
Characteristic
25°C
70°C(BGA)/85°C(QFN)**
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
IEE
Negative Power Supply Current
45
60
75
45
60
75
45
60
75
mA
VOH
Output HIGH Voltage (Note 19)
-1050
-970
-925
-975
-935
-900
-950
-910
-875
mV
VOUTPP
Output Amplitude Voltage
350
410
525
350
410
525
350
410
525
mV
VIH
Input HIGH Voltage (Single-Ended)
(Note 21)
VCC1435
mV
VCC1000
mV*
VCC
VCC1435
mV
VCC1000
mV*
VCC
VCC1435
mV
VCC1000
mV*
VCC
V
VIL
Input LOW Voltage (Single-Ended) (Note 22)
VIH2.5 V
VCC1400
mV*
VIH150
mV
VIH2.5 V
VCC1400
mV*
VIH150
mV
VIH2.5 V
VCC1400
mV*
VIH150
mV
V
VIHCMR
Input HIGH Voltage Common Mode Range
(Differential Configuration) (Note 20)
0.0
V
RTIN
Internal Input Termination Resistor
50
55
IIH
IIL
VEE+1.2
45
0.0
50
55
Input HIGH Current (@ VIH, VIHMAX)
80
Input LOW Current (@ VIL, VILMIN)
25
VEE+1.2
45
0.0
VEE+1.2
50
55
45
150
80
150
80
150
A
100
25
100
25
100
A
NOTE: SiGe circuits are designed to meet the DC specifications shown in the above table after thermal equilibrium has been established. The
circuit is in a test socket or mounted on a printed circuit board and transverse airflow greater than 500lfpm is maintained.
18. Input and output parameters vary 1:1 with VCC.
19. All loading with 50 to VCC - 2.0 V. VOH/VOL measured at VIH/VIL.
20. VIHCMR min varies 1:1 with VEE, VIHCMR max varies 1:1 with VCC. The VIHCMR range is referenced to the most positive side of the differential
input signal.
21. VIH cannot exceed VCC.
22. VIL always ≥ VEE.
*Typicals used for testing purposes.
**The device packaged in FCBGA-16 have maximum temperature specification of 70°C and devices packaged in QFN-16 have maximum
temperature specification of 85°C.
Table 8. AC CHARACTERISTICS for FCBGA-16
VCC = 0 V; VEE = -3.465 V to -2.375 V or VCC = 2.375 V to 3.465 V; VEE = 0 V
-40 °C
Symbol
Characteristic
fmax
Maximum Frequency
(See Figure 4. Fmax/JITTER) (Note 23)
tPLH,
tPHL
Propagation Delay to
Output Differential
tSKEW
Duty Cycle Skew (Note 24)
Within-Device Skew (Note 25)
Device-to-Device Skew (Note 26)
tJITTER
RMS Random Clock Jitter
Min
Typ
10.709
12
90
125
160
3
6
25
0.2
Input Voltage Swing/Sensitivity
(Differential Configuration) (Note 27)
tr
tf
Output Rise/Fall Times
(20% - 80%) @ 1 GHz
Max
70°C
Min
Typ
Max
Min
Typ
10.709
12
90
125
160
15
15
50
3
6
25
1
0.2
Max
10.709
12
90
125
160
ps
15
15
50
3
6
25
15
15
50
ps
1
0.2
1
Unit
GHz
ps
fin < 10 GHz
Peak-to-Peak Data Dependent Jitter
fin < 10 Gb/s
VINPP
25°C
TBD
75
Q, Q
20
30
TBD
2600
75
55
20
30
TBD
2600
75
55
20
30
2600
mV
55
ps
23. Measured using a 500 mV source, 50% duty cycle clock source. All loading with 50 to VCC-2.0 V. For minimum fmax value of 10.709 GHz,
output amplitude is approximately 200 mV (as shown in Figure 4, where output P-P spec is shown as a minimum/guarantee of around
150 mV). Input edge rates 40 ps (20% - 80%).
24. See Figure 5. tSKEW = |tPLH - tPHL| for a nominal 50% Differential Clock Input Waveform.
25. Within-Device skew is defined as identical transitions on similar paths through a device.
26. Device-to-device skew for identical transitions at identical VCC levels.
27. VINPP (MAX) cannot exceed VCC - VEE.
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NBSG11
Table 9. AC CHARACTERISTICS for QFN-16 VCC = 0 V; VEE = -3.465 V to -2.375 V or VCC = 2.375 V to 3.465 V; VEE = 0 V
-40 °C
Symbol
Characteristic
fmax
Maximum Frequency
(See Figure 4. Fmax/JITTER) (Note 28)
tPLH,
tPHL
Propagation Delay to
Output Differential
tSKEW
Duty Cycle Skew (Note 29)
Within-Device Skew (Note 30)
Device-to-Device Skew (Note 31)
tJITTER
RMS Random Clock Jitter
25°C
Min
Typ
Max
10.5
12
90
125
160
3
6
25
0.2
85°C
Min
Typ
Max
Min
Typ
10.5
12
90
125
160
15
15
50
3
6
25
1
0.2
Max
10.5
12
90
125
160
ps
15
15
50
3
6
25
15
15
50
ps
1
0.2
1
Unit
GHz
ps
fin < 10 GHz
Peak-to-Peak Data Dependent Jitter
fin < 10 Gb/s
VINPP
Input Voltage Swing/Sensitivity
(Differential Configuration) (Note 32)
tr
tf
Output Rise/Fall Times
(20% - 80%) @ 1 GHz
TBD
75
Q, Q
15
30
TBD
2600
75
55
20
30
TBD
2600
75
55
20
30
2600
mV
55
ps
28. Measured using a 500 mV source, 50% duty cycle clock source. All loading with 50 to VCC-2.0 V. For minimum fmax value of 10.5 GHz,
output amplitude is approximately 200 mV (as shown in Figure 4, where output P-P spec is shown as a minimum/guarantee of around
150 mV). Input edge rates 40 ps (20% - 80%).
29. See Figure 5. tSKEW = |tPLH - tPHL| for a nominal 50% Differential Clock Input Waveform.
30. Within-Device skew is defined as identical transitions on similar paths through a device.
31. Device-to-device skew for identical transitions at identical VCC levels.
32. VINPP (MAX) cannot exceed VCC - VEE.
600
8.5
500
7.5
OUTPUT AMP.
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6.5
400
5.5
OUTPUT P-P SPEC
300
4.5
3.5
200
2.5
100
1.5
RMS JITTER
0.5
0
1
2
3
4
5
6
7
8
9
INPUT FREQUENCY (GHz)
10
11
12
Figure 4. Output Voltage Amplitude (VOUTPP) / RMS Jitter vs.
Input Frequency (fin) at Ambient Temperature (Typical)
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-0.5
JITTERout ps (RMS)
OUTPUT VOLTAGE AMPLITUDE (mV)
9.5
NBSG11
CLK
VINPP = VIH(CLK) - VIL(CLK)
CLK
Q
VOUTPP = VOH(Q) - VOL(Q)
Q
tPLH
tPHL
Figure 5. AC Reference Measurement
Q
D
Receiver
Device
Driver
Device
Q
D
50 50 VTT
VTT = VCC - 2.0 V
Figure 6. Typical Termination for Output Driver and Device Evaluation
(Refer to Application Note AND8020 - Termination of ECL Logic Devices)
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NBSG11
PACKAGE DIMENSIONS
FCBGA-16
BA SUFFIX
PLASTIC 4X4 (mm) BGA FLIP CHIP PACKAGE
CASE 489-01
ISSUE O
LASER MARK FOR PIN 1
IDENTIFICATION IN
THIS AREA
-XD
M
-YK
E
M
0.20
3X
e
4
3
2
FEDUCIAL FOR PIN A1
IDENTIFICATION IN THIS AREA
1
A
3
B
b
16 X
C
D
S
VIEW M-M
0.15
M
Z X Y
0.08
M
Z
5
0.15 Z
A
A2
A1
16 X
4
-Z-
0.10 Z
DETAIL K
ROTATED 90 CLOCKWISE
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NOTES:
1. DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3. DIMENSION b IS MEASURED AT THE MAXIMUM
SOLDER BALL DIAMETER, PARALLEL TO DATUM
PLANE Z.
4. DATUM Z (SEATING PLANE) IS DEFINED BY THE
SPHERICAL CROWNS OF THE SOLDER BALLS.
5. PARALLELISM MEASUREMENT SHALL EXCLUDE
ANY EFFECT OF MARK ON TOP SURFACE OF
PACKAGE.
DIM
A
A1
A2
b
D
E
e
S
MILLIMETERS
MIN
MAX
1.40 MAX
0.25
0.35
1.20 REF
0.30
0.50
4.00 BSC
4.00 BSC
1.00 BSC
0.50 BSC
NBSG11
PACKAGE DIMENSIONS
16 PIN QFN
MN SUFFIX
CASE 485G-01
ISSUE O
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION D APPLIES TO PLATED TERMINAL
AND IS MEASURED BETWEEN 0.25 AND 0.30 MM
FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED PAD
AS WELL AS THE TERMINALS.
-XA
M
-Y-
DIM
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
B
N
0.25 (0.010) T
0.25 (0.010) T
J
R
MILLIMETERS
MIN
MAX
3.00 BSC
3.00 BSC
0.80
1.00
0.23
0.28
1.75
1.85
1.75
1.85
0.50 BSC
0.875
0.925
0.20 REF
0.00
0.05
0.35
0.45
1.50 BSC
1.50 BSC
0.875
0.925
0.60
0.80
INCHES
MIN
MAX
0.118 BSC
0.118 BSC
0.031
0.039
0.009
0.011
0.069
0.073
0.069
0.073
0.020 BSC
0.034
0.036
0.008 REF
0.000
0.002
0.014
0.018
0.059 BSC
0.059 BSC
0.034
0.036
0.024
0.031
C
0.08 (0.003) T
-T-
K
SEATING
PLANE
E
H
G
L
5
8
4
9
F
12
1
16
D
13
P
NOTE 3
0.10 (0.004)
M
T X Y
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