CENTRAL CP230_10

PROCESS
CP230
Power Transistor
NPN - Silicon Darlington Transistor Chip
PROCESS DETAILS
Process
EPITAXIAL BASE
Die Size
80 x 80 MILS
Die Thickness
8.0 MILS
Base Bonding Pad Area
18 x 27 MILS
Emitter Bonding Pad Area
34 x 34 MILS
Top Side Metalization
Al - 30,000Å
Back Side Metalization
Ti/Pd/Ag - 20,000Å
GEOMETRY
GROSS DIE PER 4 INCH WAFER
1,445
PRINCIPAL DEVICE TYPES
CZT122
CJD122
R2 (22-March 2010)
w w w. c e n t r a l s e m i . c o m
PROCESS
CP230
Typical Electrical Characteristics
R2 (22-March 2010)
w w w. c e n t r a l s e m i . c o m