Edge649 Octal Pin Electronics Driver/Receiver TEST AND MEASUREMENT PRODUCTS Description Featur es The Edge649 is an octal pin electronics driver and receiver combination fabricated in a high- performance CMOS process. It is designed for automatic test equipment and instrumentation where cost, functional density, and power are all at a premium. • • • • • • • • The Edge649 incorporates eight channels of programmable drivers and receivers into one package. Each channel has per pin driver levels, receiver threshold, and tristate control. 50 MHz Operation 11 V DUT I/O Range Programmable Output Levels Programmable Input Thresholds Per Pin Flexibility High Integration Levels 615 mW Quiescent Power Dissipation Edge648 Compatible The 11V driver output and receiver input range allows the Edge649 to interface directly between TTL, ECL, CMOS (3V, 5V, and 8V), and custom level circuitry. The Edge649 is pin and functionally compatible with the EDGE648, with the following performance differences: • reduced driver preshoot • faster driver propagation delay • superior driver pulse width distortion • higher driver Fmax operation • slightly slower driver output slew rates • higher comparator Fmax operation • lower comparator propagation delay • superior comparator pulse width distortion. Functional Block Diagram VHIGH VLOW 8 8 8 DATA IN Applications 8 8 DUT DVR EN* • • • • • • • Burn-In ATE Functional Board Testers In-Circuit Board Testers Combinational Board Testers Low Cost Chip Testers ASIC Verifiers VXI-Based Test Equipment Revision 5 / October 21, 2002 8 + DATA OUT – 1 8 THRESHOLD www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS PIN Description Pin Name Pin Number DATA IN (0:7) 64, 65, 66, 67, 3, 4, 5, 6 TTL compatible inputs that determine the high/low status of the DUT drivers. DATA OUT (0:7) 56, 57, 58, 59, 11, 12, 13, 14 CMOS level outputs that indicate the status of the DUT receivers. DUT (0:7) 46, 43, 40, 37, 33, 30, 27, 24 Pin electronic inputs/outputs that receive/drive the device under test. DVR EN (0:7) 60, 61, 62, 63, 7, 8, 9, 10 TTL compatible inputs that control the high impedance state of the DUT drivers. VHIGH (0:7) 45, 44, 39, 38, 32, 31, 26, 25 Unbuffered analog inputs that set the voltage level of a logical 1 of the DUT drivers. VLOW (0:7) 47, 42, 41, 36, 34, 29, 28, 23 Unbuffered analog inputs that set the voltage level of a logical 0 of the DUT drivers. THRESHOLD (0:7) 50, 51, 52, 53, 17, 18, 19, 20 Buffered analog input voltage that sets the threshold for the DUT comparators. VCC 21, 49 Analog positive power supply. VEE 22, 48 Analog negative power supply. VDD 1, 15, 55 GND 2, 16, 54, 68 Device ground. N/C 35 No connection. Revision 5 / October 21, 2002 Description Digital power supply. 2 www .semtech.com Edge649 DVR EN*0 DATA OUT3 DATA OUT2 DATA OUT1 DATA OUT0 VDD GND THRESHOLD3 THRESHOLD2 THRESHOLD1 THRESHOLD0 VCC VEE VLOW0 DUT0 VHIGH0 VHIGH1 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 TEST AND MEASUREMENT PRODUCTS PIN Description (continued) 3 33 DUT4 DATA IN5 4 32 VHIGH4 DATA IN6 5 31 VHIGH5 DATA IN7 6 30 DUT5 DVR EN*4 7 29 VLOW5 DVR EN*5 8 28 VLOW6 DVR EN*6 9 27 DUT6 Revision 5 / October 21, 2002 3 26 DATA IN4 VHIGH6 VLOW4 25 34 DUT7 NC 2 VHIGH7 VDD GND 24 VLOW3 35 VLOW7 36 1 23 68 22 GND VEE DUT3 21 37 VCC 67 20 DATA IN3 THRESHOLD7 VHIGH3 19 38 THRESHOLD6 66 THRESHOLD5 DATA IN2 18 VHIGH2 17 39 THRESHOLD4 65 16 DUT2 DATA IN1 GND DATA IN0 15 VLOW2 40 VDD 41 64 14 63 DATA OUT7 DVR EN*3 13 VLOW1 DATA OUT6 42 DATA OUT5 62 12 DVR EN*2 11 DUT1 DATA OUT4 43 10 61 DVR EN*7 DVR EN*1 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Circuit Description VHIGH and VLOW Driver Description VHIGH VLOW VHIGH and VLOW define the logical “1” and “0” levels of the DUT driver and can be adjusted anywhere over the range determined by VCC and VEE. Table 1 documents the relationship between the analog power to supplies (VCC and VEE), the driver range (VHIGH and VLOW), and the comparator threshold range (VTHRESHOLD). DATA IN DUT DVR EN* The VHIGH and VLOW inputs are unbuffered in that they also provide the driver output current (see Figure 3), so the source of VHIGH and VLOW must have ample current drive capability. Figure 1. Driver Diagram As shown in Figure 1, Edge649 supports programmable high and low levels and tristate per channel. There are no shared lines between any drivers. The DVR EN* and DATA IN signals are TTL compatible inputs that control the driver (see Figure 2). VHIGH With DVR EN* high, the DUT driver goes into a high impedance state. With DVR EN* low, DATA IN high forces the driver into a high state (DUT = VHIGH), and DATA IN low forces the driver low (DUT = VLOW). DUT DVR EN* VLOW DATA IN VHIGH DUT Figure 3. Simplified Model of the Unbuffered Output Stage VLOW Figure 2. Driver Functionality Drive/Receive Common Mode Range Threshold Range Power Supply Conditions 0V <= DUT <= +6.5V 0.1V <= THRESHOLD <= 3.0V VCC = +6.5V VEE = 0V 0V <= DUT <= +8V 0.1V <= THRESHOLD <= 4.5V VCC = +8V VEE = 0V 0V <= DUT <= +11V 0.1V <= THRESHOLD <= 7.5V VCC + 11V VEE = 0V -3V <= DUT <= +8V -2.9V <= THRESHOLD <= 4.5V VCC = +8V VEE = -3V Table 1. Power Supply Requirement Revision 5 / October 21, 2002 4 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Driver Output Protection In a functional testing environment, where a resistor is added in series with the driver output, the Edge649 can withstand a short to any legal DUT voltage for an indefinite amount of time. In a low impedance application with no additional output series resistance, care must be exercised and systems should be designed to check for this condition and tristate the driver if a short is detected. Receiver Functionality Edge649 supports programmable thresholds per channel. There are no shared lines between comparators. THRESHOLD is a high input impedance analog input which defines a logical “1” and “0” at the DUT (see Figure 4). If the DUT voltage is more positive than THRESHOLD, DATA OUT will be high. With DUT lower than THRESHOLD, DATA OUT will be low. DATA OUT + DUT – THRESHOLD THRESHOLD DUT DATA OUT Tpd Figure 4. Receiver Functionality Revision 5 / October 21, 2002 5 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Application Infor mation Power Supplies The Edge649 uses three power supplies: VDD, VCC and VEE. VDD is the digital supply for all of the data inputs and outputs. VCC and VEE are the analog power supplies for the Edge649 drivers and comparators. In order to protect the Edge649 and avoid damaging it, the following power supply requirements must be satisifed at all times: Also, VEE ≤ GND ≤ VDD ≤ VCC VEE ≤ All Inputs ≤ VCC at all times VCC and VEE, which power the DUT drivers and receivers, should also be decoupled to GND with a .1 µF chip capacitor in parallel with a .001 µF chip capacitor. A VCC and VEE plane, or at least a solid power bus, is recommended for optimal performance. VHIGH and VLOW Decoupling The three-diode configuration shown in Figure 5, used on a once-per-board basis, insures power supply sequence and fault tolerance. As the VHIGH and VLOW inputs are unbuffered and must supply the driver output current, decoupling capacitors for these inputs are recommended in proportion to the amount of output current the application requires VCC Expanding the Common Mode Range Although the Edge649 can drive and receive 11V swings, these 11 V signals can be adjusted over an 14V range. By using programmable regulators V1 and V2 for the VCC and VEE supplies (feasible because these two analog power supplies do not supply driver output current), the Edge649 I/O range can be optimized for a variety of applications (see Figure 6). VDD 1N5820 or Equivalent VEE V1 Figure 5. Power Supply Protection Scheme VCC The sequence below can be used as a guideline with the Edge649: Power-On Sequencing 1. VCC (substrate) 2. VEE 3. VDD 4. Inputs Edge 649 Power-Off Sequencing 1. Inputs 2. VDD 3. VEE 4. VCC VDD V2 Power Supplies Decoupling Figure 6. VDD, which provides the digital power, should be decoupled to GND with a .1 µF chip capacitor in parallel with a .001 µF chip capacitor. The bypass capacitors should be as close to the device as possible. Power and ground planes are recommended to provide a low inductance return path. Revision 5 / October 21, 2002 6 There are three rules which govern the supplies V1 and V2: 1) 2) 3) VDD + 1.5V ≤ V1 ≤ +11V –3V ≤ V2 ≤ 0V (V1 – V2) ≤ 11V www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Application Infor mation (continued) Window Comparator Trinary Driver Certain applications require a dual threshold window comparator to distinguish between the DUT being high, low, or floating. To support this application, two Edge649 channels can be combined to create one channel with a window comparator (see Figure 7). Notice that connecting two DUT pins ties together the positive inputs of both receivers. The result is a difference in polarity between the digital outputs reporting the high and low status of the DUT. At times, there is a need for a three-level driver. Typically, two levels are required for the standard digital “1” and “0” pattern generation. The third level provides a higher voltage to place the device under test (DUT) into a programming or test mode. By controlling the DATA IN and DVR EN* inputs, a trinary driver with tristate is realizable (see Figure 8). Driver with Pull Up/Pull Down – DUT HIGH High Threshold + DUT + DUT LOW* – Low Threshold Figure 7. Edge649 as a Window Comparator Once two receivers are connected as window comparators, the two drivers also get connected in parallel. This dual driver configuration supports a multitude of applications that have traditionally been difficult to accommodate. VHIGH A As the drivers are unbuffered, paralleling two drivers for one DUT node provides a means for adding pull up or pull down capability. By connecting the VHIGH and VLOW inputs of one driver through a resistor to a voltage, additional functionality that would normally require an external relay on the DUT transmission line to engage and disengage these functions is realizable. One common application for the pull up feature is testing open collector devices. The pull down satisfies open emitter DUTs (typically ECL). Either the pull up or down could be used to establish a default high impedance voltage on a bidirectional bus. Notice that in all applications, the resistors can be switched dynamically or statically. VLOW A DATA IN A DVR EN*A VHIGH B VHIGH B VHIGH A VLOW A DUT DATA IN B DVR EN*B Figure 8. Trinary Driver Revision 5 / October 21, 2002 7 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Application Infor mation (continued) Also, either the pull up or pull down resistor could be used to terminate the transmission from the DUT to the pin electronics in an effort to minimize any reflections. VHIGH A VLOW A DATA IN A DUT Two Logic Family Driver Many test systems support exactly two families of driver and receiver levels and select between family A and family B settings on a per-pin basis, typically using an analog multiplexer, (See Figure 11.) Common examples of these families are: DVR EN*A Family A = TTL Family B = CMOS or Family A = TTL Family B = ECL VHIGH B VPULL UP DATA IN B VPULL DOWN DVR EN*B VLOW B Figure 9. Driver with Pull Up/Pull Down The Edge649 supports this system architecture with minimal hardware and the elimination of the per-pin analog multiplexer. The drive and receive levels need to be generated once per system, then distributed and buffered suitably. Trinary Driver with Termination Other combinations are also possible. For example, two parallel drivers can be configured to implement one trinary driver with a pull down (or pull up) dynamic termination (see Figure 10). VHIGH A Two drivers in parallel also offer the possibility of connecting force and sense parametric circuitry to the DUT without adding additional circuitry to the controlled impedance DUT line. For example, Figure 12 shows the second driver being utilized to force a current and measure a voltage. VLOW A DATA IN A DVR EN*A DUT VHIGH B Parametric Functions VTERMINATION DATA IN B Notice that the VHIGH and VLOW pins are used from different drivers to allow the force and sense functions to be active simultaneously. DVR EN*B Figure 10. Trinary Driver with Termination CHANNEL 1 CHANNEL n VHIGH A VHIGH B DVR EN*A DVR EN*A DVR DATA DVR DATA DUT0 DUT0 DVR EN*B DVR EN*B VLOW B VLOW A Figure 11. Family A/B Using Two Drivers Per Pin Revision 5 / October 21, 2002 8 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Application Infor mation (continued) Optional Output Configuration Certain functional applications require a series output resistor yet also demand that the comparator be connected directly to the DUT, not via the backmatch resistor. To create this configuration, two distinct termination resistors may be connected to the VHIGH and VLOW input pins (see Figure 13). VHIGH PROGRAMMABLE CURRENT SOURCE VHIGH DUT DATA IN A VLOW DATA EN* A VLOW DUT VOLTAGE MEASUREMENT UNIT DATA IN B DATA EN* B Figure 13. Functional Application with the Comparator Connected Directly to the DUT Figure 12. Edge649 Supporting Parametric Testing Thermal Information Parameter Symbol Min Typ Max Units T hermal R esist anc e Junc t ion t o C ase θJC 9.8 oC / W Junc t ion t o A ir St ill A ir 50 LF P M 400 LF P M θJA θJA θJA 34 26 19 oC / W oC / W Revision 5 / October 21, 2002 9 oC / W www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Package Infor mation 68 Pin PLCC Package θJA = 42 to 48˚C / W 0.990 SQ [25.146] PIN Descriptions 0.953 SQ [24.206] 0.045 SQ [1.143] 0.048 [1.219] 0.800 REF [20.32] 0.175 [4.445] 0.016 [0.406] 0.029 [0.736] 0.016 [0.406] See Detail A 0.910 [23.114] 0.113 [2.87] 0.029 [0.736] ; ; ; 0.020 [0.508] MIN 0.065 [1.651] 0.030 [0.762] Notes: (unless otherwise specified) 1. Dimensions are in inches [millimeters]. 2. Tolerances are: .XXX ± 0.005 [0.127]. 3. PLCC packages are intended for surface mounting on solder lands on 0.050 [1.27] centers. Revision 5 / October 21, 2002 10 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Recommended Operating Conditions Parameter Symbol Min Typ Max Units Digital Power Supply VDD 4.5 5 5. 5 V Analog Positive Power Supply VCC VDD + 2.0 11 V Analog Negative Power Supply VEE -3 0 V VCC - VEE 7.0 11 V TA TJ 0 0 +70 +125 oC Symbol Min Max Units 13 V Total Analog Power Supply Ambient Operating Temperature oC Absolute Maximum Ratings Parameter T ot al A nalog P ow er Supply V C C - V EE Typ P osit iv e A nalog P ow er Supply VCC +5.0 13 V Neg at iv e A nalog P ow er Supply V EE -4.0 0.5 V Driv er Hig h Out put V olt ag e VH I G H V EE - .5 V C C + .5 V Driv er Low Out put V olt ag e VLO W V EE - .5 V C C + .5 V Driv er Out put Sw ing VH I G H - VLO W -5 12 V R ec eiv er T hreshold V olt ag e T HR ESHOLD V EE - .5 V C C + .5 V DA T A I N DV R EN* GND - .5 V DD + .5 V V DD 0 6.5 V A mbient Operat ing T emperat ure TA -55 +125 oC St orag e T emperat ure TS -65 +150 oC Junc t ion T emperat ure TJ +150 oC Soldering T emperat ure T SOL 260 oC Dig it al I nput s Dig it al P ow er Supply Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these, or any other conditions beyond those listed, is not implied. Exposure to absolute maximum conditions for extended periods may affect device reliability. Revision 5 / October 21, 2002 11 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS DC Characteristics Parameter Symbol Min Typ Max Units VEE + 3 VEE + 7 VCC VCC V V VEE VEE VCC – 3 VCC – 7 V V – 125 +125 mA 40 17 Ω Ω Driver/Receiver Characteristics Driver High Voltage Level @ ± 1 mA @ ± 125 mA VHIGH Driver Low Voltage Level @ ±1 mA @ ±125 mA VLOW DC Driver Output Current (Note 1) IOUT Driver Output Impedance @ ± 1 mA @ ± 125 mA ROUT DUT Pin Capacitance COUT 8 20 pF DUT Output voltage DUT<0:7> VEE VCC V Receiver Threshold Level VTHRESHOLD VEE + 0.1 VCC – 3.5 V Threshold Bias Current IBIAS 0 1.0 µA DUT Leakage Input Current ILEAK .002 1.0 µA Receiver Offset Voltage VOS 45 200 mV Quiescent Power Supply Current Positive Power Supply Negative Power Supply Digital Power Supply ICC IEE IDD 25 25 20 40 40 35 mA mA mA – 200 Digital Inputs DATA IN (0:7), DVR EN* (0:7) 2.0 V Input High Voltage VIHMIN Input Low Voltage VILMAX 0.8 V Input Current IIN 1.0 µA Input Capacitance CIN 5 pF Digital Outputs DATA OUT (0:7) Output Voltage High (Note 2) VOH Output Voltage Low (Note 3) VOL DC Output current IOUT Note 1 : Note 2: Note 3: VDD – .4 –4 V GND + .4 V 4 mA Output current specification is per individual driver. Output current of 4 mA. Output current of –4 mA. Revision 5 / October 21, 2002 12 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS AC Characteristics Parameter Symbol Min Typ Max Units T1 T2 T3 T4 12 8 17 12 20 15 25 20 33 27 38 33 ns ns ns ns Propagation Delay DATA IN <0:7> to DUT <0:7> (Note 2) DUT <0:7> to DATA OUT <0:7> (Note 3) Active to HiZ (Note 4) HiZ to Active (Note 4) DUT Output Rise/Fall Times (Note 1) 1V Swing (20% - 80%) 3V Swing (10% - 90%) 5V Swing (10% - 90%) 8V Swing (10% - 90%) 10V Swing (10% - 90%) Digital Outputs (DATA OUT <0:7>) DATA OUT Rise Time (10% - 90%) DATA OUT Fall Time (10% - 90%) TR TF Minimum Pulse Width Driver Output Comparator Output Maximum Operating Frequency Fmax 3.0 3.5 4.0 4.5 5.0 ns ns ns ns ns 2 2 ns ns 20 10 ns ns 50 MHz AC Test Conditions: VCC = 8V, VEE = –3V, VDD = 5V. Note 1: Note 2: Note 3: Note 4: Into 18 inches of 50Ω transmission line terminated with 1KΩ and 5 pF with the proper series termination resistor. Measured at 2.5V with a 10 mA load under the following conditions: VHIGH = +5.0V, VLOW = 0V, VCC = +8V, VEE = -3V, and VDD = +5V. Measured at 2.5V with a 4 mA load. Load = 10 mA and measured when a 500 mV change at the output is detected. T1 T2 DATA IN DUT DATA OUT DVR EN* HiZ DUT T3 Revision 5 / October 21, 2002 T4 13 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Ordering Infor mation Model Number Package E649APJ 68-Pin PLCC EVM649APJ Edge649 Evaluation Module Contact Infor mation Semtech Corporation Test and Measurement Division 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633 Revision 5 / October 21, 2002 14 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Revision History Current Revision Date: October 21, 2002 Previous Revision Date: June 11, 2002 Page # Section Name 6 Power Supplies Previous Revision Current Revision Para 1 rewritten. Para 2 deleted. Power On & Off Sequencing added Current Revision Date: June 11, 2002 Previous Revision Date: December 6, 2001 Page # Section Name Previous Revision Current Revision 2 Pin Descriptions VLOW Change Pin #44 to Pin #47 14 Ordering Information E649BPJ EVM649EVM E649APJ EVM649APJ Revision 5 / October 21, 2002 15 www .semtech.com Edge649 TEST AND MEASUREMENT PRODUCTS Revision History Current Revision Date: December 6, 2001 Previous Revision Date: October 28, 1996 Page # Section Name Previous Revision Current Revision 4 Circuit Description Table 1 Update Threshold Ranges 11 Recommended Operating Conditions Delete: Driver High Output Voltage Driver Low Output Voltage Total Driver Output Swing Receiver Threshold Voltage Analog Positive Power Supply, Min: VDD + 1.5 Total Analog Power Supply, Min: 6.5 12 Analog Positive Power Supply, Min: VDD + 2.0 Total Analog Power Supply, Min: 7.0 Add: Driver High Voltage Driver Low Voltage Driver Output Impedance DC Characteristics Delete: Driver Headroom Delete: Output Voltage Swing 13 Driver High Voltage @ ±1 mA, Min: VEE @ ± 125 mA, VEE + 6 Driver High Voltage Level @ ±1 mA, Min: VEE + 3 @ ± 125 mA, VEE + 7 Driver Low Voltqge @ ±1 mA, Max: VCC @ ± 125 mA, Max: VCC – 6 Driver Low Voltqge Level @ ±1 mA, Max: VCC – 3 @ ± 125 mA, Max: VCC – 7 Driver Output Impedance @ ± 1 mA, Max: TBD @ ±125 mA, Max: 12 Driver Output Impedance @ ± 1 mA, Max: 40 @ ±125 mA, Max: 17 Receiver Threshold Level, Max: VCC – 1.5 Receiver Threshold Level, Max: VCC – 3.5 Receiver Offset Voltage, Min: –100, Typ: +25, Max: 100 Receiver Offset Voltage, Min: –200, Typ: 45, Max: 200 AC Characteristics Revision 5 / October 21, 2002 Add: AC Test Conditions 16 www .semtech.com