FAIRCHILD FQB3N60C

QFET
TM
FQB3N60C
600V N-Channel MOSFET
Features
Description
• 3A, 600V, RDS(on) = 3.4Ω @ VGS = 10 V
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficiency switched mode power supplies, active power factor
correction, electronic lamp ballasts based on half bridge
topology.
• Low gate charge ( typical 10.5 nC)
• Low Crss ( typical 5 pF)
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
D
D
G
S
G
D2-PAK
FQB Series
S
Absolute Maximum Ratings
Symbol
Parameter
VDSS
Drain-Source Voltage
ID
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
IDM
Drain Current
- Pulsed
VGSS
Gate-Source voltage
EAS
Single Pulsed Avalanche Energy
IAR
Avalanche Current
EAR
dv/dt
PD
Power Dissipation
FQB3N60C
Unit
600
V
3
1.8
A
A
12
A
±30
V
(Note 2)
150
mJ
(Note 1)
3
A
Repetitive Avalanche Energy
(Note 1)
7.5
mJ
Peak Diode Recovery dv/dt
(Note 3)
4.5
V/ns
75
0.62
W
W/°C
-55 to +150
°C
300
°C
(Note 1)
(TC = 25°C)
- Derate above 25°C
TJ, TSTG
Operating and Storage Temperature Range
TL
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
Thermal Characteristics
Symbol
Parameter
Typ.
Max.
Unit
RθJC
Thermal Resistance, Junction-to-Case
--
1.67
°C/W
RθJA*
Thermal Resistance, Junction-to-Ambient*
--
40
°C/W
RθJA
Thermal Resistance, Junction-to-Ambient
--
62.5
°C/W
* When mounted on the minimum pad size recommended (PCB Mount)
©2006 Fairchild Semiconductor Corporation
FQB3N60C REV. A1
1
www.fairchildsemi.com
FQB3N60C 600V N-Channel MOSFET
May 2006
Device Marking
Device
Package
Reel Size
Tape Width
Quantity
FQB3N60C
FQB3N60CTM
D2-PAK
330mm
24mm
800
Electrical Characteristics
Symbol
TC = 25°C unless otherwise noted
Parameter
Conditions
Min.
Typ.
Max Units
600
--
--
V
Off Characteristics
BVDSS
Drain-Source Breakdown Voltage
VGS = 0V, ID = 250μA
ΔBVDSS
/ ΔTJ
Breakdown Voltage Temperature
Coefficient
ID = 250μA, Referenced to 25°C
--
0.6
--
V/°C
IDSS
Zero Gate Voltage Drain Current
VDS = 600V, VGS = 0V
VDS = 480V, TC = 125°C
---
---
1
10
μA
μA
IGSSF
Gate-Body Leakage Current, Forward
VGS = 30V, VDS = 0V
--
--
100
nA
IGSSR
Gate-Body Leakage Current, Reverse
VGS = -30V, VDS = 0V
--
--
-100
nA
2.0
--
4.0
V
--
2.8
3.4
Ω
--
3.5
--
S
--
435
565
pF
--
45
60
pF
--
5
8
pF
--
12
34
ns
--
30
70
ns
--
35
80
ns
--
35
80
ns
--
10.5
14
nC
--
2.1
--
nC
--
4.5
--
nC
3
A
On Characteristics
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250μA
RDS(on)
Static Drain-Source
On-Resistance
VGS = 10V, ID = 1.5A
gFS
Forward Transconductance
VDS = 40V, ID = 1.5A
(Note 4)
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = 25V, VGS = 0V,
f = 1.0MHz
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = 300V, ID = 3A
RG = 25Ω
(Note 4, 5)
VDS = 480V, ID = 3A
VGS = 10V
(Note 4, 5)
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
ISM
Maximum Pulsed Drain-Source Diode Forward Current
--
--
12
A
VSD
Drain-Source Diode Forward Voltage
VGS = 0V, IS = 3A
--
--
1.4
V
trr
Reverse Recovery Time
260
--
ns
Reverse Recovery Charge
VGS = 0V, IS = 3A
dIF/dt =100A/μs
--
Qrr
--
1.6
--
μC
(Note 4)
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. IAS = 3A, VDD = 50V, L=30mH, RG = 25Ω, Starting TJ = 25°C
3. ISD ≤ 3A, di/dt ≤ 200A/μs, VDD ≤ BVDSS, Starting TJ = 25°C
4. Pulse Test: Pulse width ≤ 300μs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
FQB3N60C REV. A1
2
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FQB3N60C 600V N-Channel MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
10
Figure 2. Transfer Characteristics
1
10
VGS
15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
Bottom : 5.0 V
1
10
ID, Drain Current [A]
ID, Drain Current [A]
Top :
0
o
150 C
o
25 C
o
-55 C
∝ Notes :
1. VDS = 40V
2. 250レs Pulse Test
∝ Notes :
1. 250レs Pulse Test
2. TC = 25∩
10
-1
10
0
10
10
1
0
2
4
6
8
10
VGS, Gate-Source Voltage [V]
VDS, Drain-Source Voltage [V]
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
12
1
10
IDR, Reverse Drain Current [A]
RDS(ON) [ヘ ],
Drain-Source On-Resistance
10
8
VGS = 10V
6
4
VGS = 20V
2
0
10
150∩
25∩
∝ Notes :
1. VGS = 0V
2. 250レs Pulse Test
∝ Note : TJ = 25∩
0
-1
0
1
2
3
4
5
6
10
7
0.2
0.4
Figure 5. Capacitance Characteristics
Coss
500
Ciss
VGS, Gate-Source Voltage [V]
Capacitances [pF]
600
400
300
∝ Note ;
1. V GS = 0 V
2. f = 1 MHz
Crss
100
10
1.2
1.4
1.6
VDS = 120V
VDS = 300V
8
VDS = 480V
6
4
2
∝ Note : ID = 3A
0
10
0
10
1
0
2
4
6
8
10
12
QG, Total Gate Charge [nC]
VDS, Drain-Source Voltage [V]
FQB3N60C REV. A1
1.0
Figure 6. Gate Charge Characteristics
C iss = C gs + C gd (C ds = shorted)
C oss = C ds + C gd
C rss = C gd
700
0
-1
10
0.8
12
800
200
0.6
VSD, Source-Drain voltage [V]
ID, Drain Current [A]
3
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FQB3N60C 600V N-Channel MOSFET
Typical Performance Characteristics
FQB3N60C 600V N-Channel MOSFET
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
3.0
RDS(ON), (Normalized)
Drain-Source On-Resistance
BVDSS, (Normalized)
Drain-Source Breakdown Voltage
1.2
1.1
1.0
♦ Notes :
0.9
0.8
-100
1. VGS = 0 V
2. ID = 250 μA
-50
0
50
100
150
2.5
2.0
1.5
1.0
♦ Notes :
0.5
1. VGS = 10 V
2. ID = 1.5 A
0.0
-100
200
-50
o
0
50
100
150
200
o
TJ, Junction Temperature [ C]
TJ, Junction Temperature [ C]
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current
vs. Case Temperature
3
Operation in This Area
is Limited by R DS(on)
10 μs
1
100 μs
ID, Drain Current [A]
ID, Drain Current [A]
10
1 ms
10 ms
0
10
DC
-1
10
∝ Notes :
2
1
o
1. TC = 25 C
o
2. TJ = 150 C
3. Single Pulse
-2
10
0
10
1
2
10
0
25
3
10
10
50
75
100
125
150
TC, Case Temperature [∩ ]
VDS, Drain-Source Voltage [V]
Zヨ JC(t), Thermal Response
Figure 11. Transient Thermal Response Curve
10
0
D = 0 .5
∝ N o te s :
1 . Z ヨ J C(t) = 1 .6 7 ∩ /W M a x .
2 . D u ty F a c to r, D = t 1 /t 2
3 . T J M - T C = P D M * Z ヨ J C(t)
0 .2
0 .1
10
0 .0 5
-1
0 .0 2
PDM
0 .0 1
s in g le p u ls e
10
t1
t2
-2
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ]
FQB3N60C REV. A1
4
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FQB3N60C 600V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FQB3N60C REV. A1
5
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FQB3N60C 600V N-Channel MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FQB3N60C REV. A1
6
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FQB3N60C 600V N-Channel MOSFET
Mechanical Dimensions
D2-PAK
Dimensions in Millimeters
FQB3N60C REV. A1
7
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PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
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any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I19
8
FQB3N60C REV. A1
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FQB3N60C 600V N-Channel MOSFET
TRADEMARKS