CEL NE651R479A-T1-A

NEC's 1 W, L&S-BAND
MEDIUM POWER GaAs HJ-FET NE651R479A
FEATURES
OUTLINE DIMENSIONS (Units in mm)
• LOW COST PLASTIC SURFACE MOUNT PACKAGE
Available on Tape and Reel
PACKAGE OUTLINE 79A
• USABLE TO 3.7 GHz:
Fixed Wireless Access, ISM, WLL, MMDS, IMT-2000,
PCS
1.5 ± 0.2
4.2 Max
Source
• HIGH OUTPUT POWER:
30 dBm TYP with 5.0 V Vdc
27 dBm TYP with 3.5 V Vdc
• LOW THERMAL RESISTANCE:
30°C/W
Gate
0.4 ± 0.15
0.2 ± 0.1
3.6 ± 0.2
0.9 ± 0.2
NEC's NE651R479A is a GaAs HJ-FET designed for medium
power mobile communications, Fixed Wireless Access, ISM,
WLL, PCS, IMT-2000, and MMDS transmitter and subscriber
applications. It is capable of delivering 0.5 Watts of output
power (CW) at 3.5 V, and 1 Watt of output power (CW) at 5 V
with high linear gain, high efficiency, and excellent linearity.
Reliability and performance uniformity are assured by NEC's
stringent quality and control procedures.
(Bottom View)
TYPICAL 5 V RF PERFORMANCE FOR REFERENCE (NOT SPECIFIED) (TC
SYMBOLS
POUT
GL
ηADD
ID
CHARACTERISTICS
UNITS
Output Power
Linear Gain1
MIN
1.2 Max
0.8 Max
5.7 Max
DESCRIPTION
Drain
1.0 Max
4.4 Max
X
8
Drain
0.8 ± 0.15
H
5.7 Max
0.6 ± 0.15
• HIGH LINEAR GAIN:
12 dB TYP at 1.9 GHz
T
Source
Gate
TYP
dBm
29.5
dB
12.0
Power Added Efficiency
%
58
Drain Current
mA
350
MAX
= 25°C)
TEST CONDITIONS
f = 1.9 GHz, VDS = 5 V
PIN = +15 dBm, RG = 1 k Ω,
IDSQ = 50 mA (RF OFF)
Note:
1. PIN = 0 dBm.
ELECTRICAL CHARACTERISTICS (TC
= 25°C)
PART NUMBER
NE651R479A
PACKAGE OUTLINE
SYMBOLS
CHARACTERISTICS
79A
UNITS
POUT
Output Power
dBm
GL
Linear Gain1
dB
Power Added Efficiency
%
ηADD
ID
IDSS
VP
BVGD
RTH
Drain Current
MIN
26.0
mA
Pinch-Off Voltage
V
-2.0
V
12
°C/W
TEST CONDITIONS
f = 1.9 GHz, VDS =3.5 V
PIN = +15 dBm, RG = 1 k Ω,
IDSQ = 50 mA (RF OFF)2
27.0
60
220
A
Thermal Resistance, Channel to Case
MAX
12.0
52
Saturated Drain Current
Gate to Drain Break Down Voltage
TYP
0.7
VDS = 2.5 V, VGS = 0 V
-0.4
VDS = 2.5 V, ID = 14 mA
IGD = 14 mA
30
50
Notes:
1. PIN = 0 dBm.
2. DC performance is 100% tested. Wafers are sample tested for RF performance.
Wafer rejection criteria for standard devices is 1 reject for sample lot.
California Eastern Laboratories
NE651R479A
TYPICAL 3.5 V RF PERFORMANCE FOR REFERENCE (NOT SPECIFIED) (TC
SYMBOLS
POUT
GL
ηADD
ID
CHARACTERISTICS
UNITS
Output Power
MIN
TYP
dBm
27.0
1
dB
14.0
Power Added Efficiency
%
60
Drain Current
mA
230
Linear Gain
MAX
= 25°C)
TEST CONDITIONS
f = 900 MHz, VDS =3.5 V
PIN = +13 dBm, RG = 1 k Ω,
IDSQ = 50 mA (RF OFF)
ABSOLUTE MAXIMUM RATINGS1 (TA = 25 °C)
RECOMMENDED OPERATING LIMITS
SYMBOLS
SYMBOL
PARAMETERS
UNITS
RATINGS
VDS
Drain to Source Voltage
V
8
VGS
Gate to Source Voltage
V
-4
IDS
Drain Current
A
1.0
IGF
Gate Forward Current
mA
10
IGR
Gate Reverse Current
mA
10
PT
Total Power Dissipation2
W
2.5
TCH
Channel Temperature
°C
150
TSTG
Storage Temperature
°C
-65 to +150
VDS
GCOMP
TCH
PARAMETER
Drain to Source Voltage
V
Gain Compression1
dB
3.0
Channel Temperature
°C
+125
3.5
Note:
1. Recommended maximum gain compression is 3.0 dB at
VDS = 4.2 to 5.5 V.
ORDERING INFORMATION
PART NUMBER
Notes:
1. Operation in excess of any one of these parameters may result
in permanent damage.
2. Mounted on a 50 x 50 x 1.6 mm double copper clad epoxy glass
PWB. TA = +85°C
UNITS MIN TYP MAX
NE651R479A-T1-A
NE651R479A-A
Note:
1. Embossed Tape, 12 mm wide.
QTY
1 kpcs/Reel
Bulk, 100 Pcs. Min.
6.0
NE651R479A
TYPICAL PERFORMANCE CURVES (TA = 25°C)
1.00
1.20
0.80
0.90
0.60
0.60
0.40
0.30
0.20
0.00
0.00
100
-1.20
5
Total Power Dissipation, PT (W)
1.50
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
Drain Current, ID (A)
Transconductance, Gm (mS)
TRANSCONDUCTANCE AND DRAIN CURRENT vs.
GATE VOLTAGE
4
RTH = 50°C/W
3
2
1
0
25
Gate Voltage, VG (V)
150
MAXIMUM AVAILABLE GAIN vs.
FREQUENCY
1.5
1.00
VGS =
0V
0.75
-0.2V
0.5
-0.4V
-0.6V
0.25
-0.8V
-1.0V
1
2
3
4
Drain Voltage, VD (V)
5
6
Maximum Available Gain, GMAG (dB)
30.0
1.25
Drain Current, ID (A)
100
Case/Circuit Temperature (TC)˚C
DRAIN CURRENT vs. DRAIN VOLTAGE
0
0
50
25.0
2.2 V, 50 mA
4.6 V, 100 mA
20.0
3.5 V, 50 mA
15.0
10.0
5.0
0.1
0.2
0.5
1.0
Frequency, f (GHz)
2.0
4.0
NE651R479A
TYPICAL SCATTERING PARAMETERS (TA = 25˚C)
j50
-20
j25
j100
-22.5
4.0
4.0
S12
-26
j10
-32
0
S22
10
25
50
100
0.5
S21
S11
8
-j10
0.5
14
17.5
-j25
-j100
20
Coordinates in Ohms
Frequency in GHz
VD = 5 V, ID = 100 mA
-j50
VD = 5 V, ID = 100 mA
FREQUENCY
S11
S21
S12
S22
K
GHz
MAG
ANG
MAG
ANG
MAG
ANG
MAG
ANG
0.50
0.60
0.70
0.80
0.90
1.00
1.10
1.20
1.30
1.40
1.50
1.60
1.70
1.80
1.90
2.00
2.10
2.20
2.30
2.40
2.50
2.60
2.70
2.80
2.90
3.00
3.10
3.20
3.30
3.40
3.50
3.6
3.7
3.8
3.9
4.0
0.905
0.905
0.904
0.904
0.904
0.903
0.903
0.903
0.902
0.902
0.901
0.900
0.900
0.899
0.898
0.898
0.897
0.896
0.896
0.895
0.895
0.894
0.894
0.893
0.892
0.891
0.890
0.889
0.889
0.888
0.887
0.886
0.886
0.885
0.885
0.882
-171.35
-176.45
179.28
172.25
172.25
169.17
166.26
163.57
160.94
158.40
155.94
153.50
151.13
148.74
146.42
144.10
141.78
139.45
137.20
134.95
132.69
130.42
128.13
125.84
123.53
121.12
118.74
116.40
113.93
111.57
109.17
106.64
1.04.11
101.52
98.85
95.89
7.390
6.174
5.310
4.650
4.144
3.729
3.393
3.115
2.878
2.675
2.497
2.344
2.207
2.087
1.978
1.882
1.794
1.714
1.641
1.575
1.514
1.458
1.406
1.360
1.315
1.273
1.237
1.199
1.167
1.134
1.105
1.078
1.052
1.027
1.005
0.985
85.67
81.57
77.91
74.54
71.29
68.22
65.17
62.32
59.48
56.63
53.91
51.18
48.51
45.82
43.18
40.54
37.96
35.31
32.77
30.22
27.72
25.19
22.65
20.17
17.71
15.17
12.88
10.24
7.72
5.26
279
0.35
-2.06
-4.48
-6.81
-9.16
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.031
0.030
0.031
0.031
0.031
0.031
0.031
0.031
0.032
0.032
0.032
3.68
1.08
-0.70
-2.57
-4.06
-5.54
-7.10
-8.31
-9.72
-11.05
-12.24
-13.54
-14.55
-16.11
-17.19
-18.30
-19.09
-20.36
-21.58
-22.87
-24.28
-25.45
-26.78
-27.62
-29.24
-30.07
-31.40
-31.97
-33.46
-34.38
-35.71
-37.09
-38.46
-39.84
-40.94
-42.41
0.664
0.667
0.669
0.669
0.670
0.670
0.671
0.672
0.672
0.673
0.674
0.675
0.675
0.676
0.677
0.679
0.680
0.680
0.682
0.684
0.686
0.687
0.689
0.690
0.693
0.695
0.699
0.699
0.703
0.704
0.708
0.711
0.715
0.719
0.725
0.734
-178.52
178.06
175.09
172.45
170.01
167.69
165.50
163.46
161.46
159.54
157.65
155.81
154.03
152.22
150.61
148.90
147.27
145.62
144.10
142.52
141.08
139.60
138.08
136.71
135.40
133.97
132.83
131.33
130.05
128.87
127.72
126.68
125.68
124.84
124.23
123.96
MAG1
(dB)
0.22
0.26
0.31
0.36
0.40
0.45
0.49
0.54
0.59
0.63
0.68
0.73
0.77
0.82
0.87
0.92
0.97
1.02
1.06
1.11
1.14
1.92
1.23
1.28
1.32
1.37
1.45
1.47
1.49
1.54
1.57
1.61
1.62
1.60
1.61
1.63
23.77
22.99
22.34
21.76
21.26
20.80
20.39
20.02
19.68
19.36
19.06
18.79
18.52
18.28
18.05
17.62
17.62
16.50
15.73
15.06
14.60
14.07
13.69
13.25
12.90
12.51
12.17
11.83
11.63
11.30
11.07
10.84
10.68
10.51
10.40
10.25
Note:
1. Gain calculation:
MAG =
|S21|
|S12|
(K ±
K 2- 1
). When K ≤ 1, MAG is undefined and MSG values are used. MSG =
MAG = Maximum Available Gain
MSG = Maximum Stable Gain
2
2
2
|S21|
, K = 1 + | ∆ | - |S11| - |S22| , ∆ = S11 S22 - S21 S12
|S12|
2 |S12 S21|
NE651R479A
TYPICAL SCATTERING PARAMETERS (TA = 25˚C)
+90˚
j50
+120˚
4.0
j25
+60˚
j100
0.5
4.0
S21
+150˚
+30˚
j10
S22
10
0
0.5
25
50
100
+180˚
+0˚
0.5
4.0
S11
S12
0.5
4.0
-j10
-30˚
-150˚
-j25
-j100
Coordinates in Ohms
Frequency in GHz
VD = 3.5 V, ID = 50 mA
-j50
-60˚
-120˚
-90˚
VD = 3.5 V, ID = 50 mA
FREQUENCY
S11
S21
S12
S22
K
GHz
MAG
ANG
MAG
ANG
MAG
ANG
MAG
ANG
0.50
0.60
0.70
0.80
0.90
1.00
1.10
1.20
1.30
1.40
1.50
1.60
1.70
1.80
1.90
2.00
2.10
2.20
2.30
2.40
2.50
2.60
2.70
2.80
2.90
3.00
3.10
3.20
3.30
3.40
3.50
3.60
3.70
3.80
3.90
4.00
0.89
0.89
0.89
0.89
0.89
0.89
0.89
0.89
0.89
0.89
0.89
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.88
0.87
0.87
0.87
0.87
0.87
0.87
0.87
0.87
0.87
-168.01
-173.64
-178.28
177.73
174.20
170.95
167.90
165.11
162.38
159.77
157.25
154.75
152.33
149.91
147.55
145.21
142.87
140.51
138.25
135.98
133.71
131.45
129.14
126.84
124.54
122.13
119.76
117.42
114.95
112.59
110.20
107.68
105.16
102.57
99.92
97.00
6.49
5.43
4.68
4.10
3.65
3.29
2.99
2.75
2.54
2.36
2.20
2.07
1.95
1.84
1.74
1.66
1.58
1.51
1.44
1.39
1.33
1.28
1.23
1.19
1.15
1.12
1.08
1.05
1.02
0.99
0.97
0.94
0.92
0.90
0.88
0.86
86.49
82.00
78.02
74.39
70.90
67.60
64.34
61.32
58.30
55.29
52.40
49.51
46.67
43.82
41.04
38.26
35.55
32.76
30.08
27.39
24.76
22.10
19.43
16.80
14.23
11.57
9.15
6.40
3.77
1.18
-1.40
-3.98
-6.50
-9.02
-11.46
-13.94
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
0.04
2.44
-0.91
-3.46
-5.97
-8.08
-10.18
-12.21
-14.08
-15.97
-17.77
-19.54
-21.34
-22.87
-24.84
-26.40
-28.02
-29.38
-31.08
-32.73
-34.35
-36.08
-37.68
-39.43
-40.80
-42.57
-44.05
-45.84
-46.80
-48.59
-49.84
-51.37
-53.04
-54.52
-56.08
-57.48
-59.08
0.63
0.63
0.63
0.63
0.63
0.63
0.64
0.64
0.64
0.64
0.64
0.64
0.64
0.64
0.65
0.65
0.65
0.65
0.65
0.66
0.66
0.66
0.66
0.66
0.67
0.67
0.68
0.68
0.68
0.68
0.69
0.69
0.70
0.70
0.71
0.72
-173.92
-177.95
178.68
175.74
173.09
170.63
168.31
166.20
164.15
162.17
160.27
158.40
156.62
154.81
153.20
151.49
149.87
148.24
146.74
145.17
143.74
142.27
140.78
139.41
138.12
136.69
135.56
134.07
132.79
131.61
130.47
129.41
128.40
127.55
126.90
126.57
MAG1
(dB)
0.17
0.21
0.25
0.29
0.32
0.36
0.40
0.43
0.47
0.50
0.56
0.60
0.64
0.67
0.72
0.77
0.81
0.86
0.89
0.93
0.96
1.03
1.05
1.10
1.13
1.20
1.22
1.27
1.29
1.34
1.36
1.40
1.41
1.44
1.44
1.45
21.59
20.82
20.17
19.59
19.09
18.64
18.23
17.86
17.51
17.19
16.99
16.72
16.46
16.21
15.98
15.86
15.65
15.45
15.26
15.08
14.91
13.82
13.24
12.64
12.17
11.61
11.38
10.94
10.71
10.34
10.14
9.86
9.67
9.47
9.34
9.20
Note:
1. Gain calculation:
MAG =
|S21|
|S12|
(K ±
K 2- 1
). When K ≤ 1, MAG is undefined and MSG values are used. MSG =
MAG = Maximum Available Gain
MSG = Maximum Stable Gain
2
2
2
|S21|
, K = 1 + | ∆ | - |S11| - |S22| , ∆ = S11 S22 - S21 S12
|S12|
2 |S12 S21|
NE651R79A
APPLICATION CIRCUIT (2.50 - 2.70 GHz)
VG
VD
GND
J4
J3
C2
C8
C10
C3
C9
C11
P1
GND
C12
C13
J1
J2
RFOUT
C1
8 X
R1
C5
T H
RFIN
C4
C6
U1
NE65XXX79A-EV
100637
Contact CEL Engineering for artwork
and more detailed information.
.034
J4
J3
VD
VG
C13 C11
J1
RF Input
C9
C3
L = .890
W = .010
C2
C8
C10
C12
R6
NE651R479A
C5
J2
RF Output
C4
L = .280
W = .050
1
L = .874
W = .010
TF-100637
L = .260
W = .050
C1
TEST CIRCUIT BLK
4
15
2-56 X 3/16 PHILLIPS PAN HEAD
14
C2, C3
CASE 1 100 pF CAP MURATA
13
MCR03J201
R1
0603 200 OHM RESISTOR ROHM
12
100A5R1CP150X
C1, C5
CASE A 5.1 pF CAP ATC
11
1
100A002CP150X
C4
CASE A 2.0 pF CAP ATC
10
1
100A1R5JP150X
C6
CASE A 1.5 pF CAP ATC
9
2
491A105K025AS-X
C12, C13
CASE A 1uF KEMET
8
2
GRM40X7R104K025BL
C10, C11
0805 1uF CAP MURATA
7
2
GRM40C0G102J050BD
C8, C9
0805 1000 pF CAP MURATA
6
1
NE6510179A
U1
IC NEC
5
1
703401
P1
GROUND LUG CONCORD
4
1
1250-003
J3, J4
FEEDTHRU MURATA
3
1
2052-5636-02
J1, J2
FLANGE MOUNT JACK RECEPTACLE
2
2
FD-100637
PCB
NE6500379A-EVAL FABRICATION DRAWING
1
2
MA101J
1
2
NE651R79A
TYPICAL APPLICATION CIRCUIT PERFORMANCE at VDS = 3.5 V and VDS = 5 V
GAIN AND SATURATED POWER vs.
FREQUENCY
GAIN AND SATURATED POWER vs.
FREQUENCY
13
27
12
11
Gain (db) 3.5 V at 50 mA
Gain (db) 3.5 V at 250 mA
POUT (db) 3.5 V at 50 mA
POUT (db) 3.5 V at 250 mA
9
8
1.9
1.92
1.94
1.96
1.98
2.00
26
14
13
12
11
8
1.9
50
Gain, GA (dB)
40
30
20
FC = 1.96 GHz,
VDS = 3.5 V
4
2
0
10
70
50
14
12
Gain, IDSQ = 50 mA
PAE, IDSQ = 50 mA
Gain, IDSQ = 100 mA
PAE, IDSQ = 100 mA
Gain, IDSQ = 250 mA
PAE, IDSQ = 250 mA
10
8
6
4
0
-10
-20
-30
-40
-50
IDSQ = 50 mA
IDSQ = 100 mA
IDSQ = 250 mA
-60
0 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34
Total Output Power, POUT (dBm)
30
20
0
10
0
0 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34
Output Power, POUT (dBm)
Third Order Intermodulation Distortion, IM3 (dBc)
Third Order Intermodulation Distortion, IM3 (dBc)
THIRD ORDER INTERMODULATION vs.
TOTAL OUTPUT POWER
40
FC = 1.96 GHz,
VDS = 5 V
2
Output Power, POUT (dBm)
10
2.02
60
0
FC = 1.96 GHz, POUT = Each Tone
VDS = 3.5 V
2.00
16
0 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34
20
1.98
18
Gain, GA (dB)
60
16
6
1.96
20
Power Added Efficiency, PAE (%)
18
8
1.94
POWER ADDED EFFICIENCY& GAIN vs.
OUTPUT POWER
70
10
1.92
28
Frequency, f (GHz)
POWER ADDED EFFICIENCY& GAIN vs.
OUTPUT POWER
Gain, IDSQ = 50 mA
PAE, IDSQ = 50 mA
Gain, IDSQ = 100 mA
PAE, IDSQ = 100 mA
Gain, IDSQ = 250 mA
PAE, IDSQ = 250 mA
29
Gain (db) 5 V at 50 mA
Gain (db) 5 V at 250 mA
POUT (db) 5 V at 50 mA
POUT (db) 5 V at 250 mA
9
25
Frequency, f (GHz)
14
30
10
2.02
20
31
THIRD ORDER INTERMODULATION vs.
TOTAL OUTPUT POWER
20
10
FC = 1.96 GHz, POUT = Each Tone
VDS = 5 V
0
-10
-20
-30
-40
IDSQ = 50 mA
IDSQ = 100 mA
IDSQ = 250 mA
-50
-60
0 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34
Total Output Power, POUT (dBm)
Power Added Efficiency, PAE (%)
10
32
15
Saturated Power, POUT (dBm)
28
14
16
Gain, G (dB)
15
Saturated Power, POUT (dBm)
29
16
12
33
17
17
Gain, G (dB)
18
30
18
NE651R479A
OUTPUT POWER vs. INPUT POWER
34
Test Condition: Circuit optimized
for P-2dB from 2.64 to 2.69 GHz
Instantaneous Bandwidth when
biasing at 5 V 50 mA
Output Power, POUT (dBm)
32
30
28
26
24
20
100 mA
200 mA
350 mA
50 mA
150 mA
300 mA
18
16
8
10
12
14
16
18
20
22
Input Power, PIN (dBm)
24
26
28
Third Order Intermodulation Distortion, IM3 (dBc)
TYPICAL APPLICATION CIRCUIT PERFORMANCE at VDS = 5 V, f = 2.66 GHz
THIRD ORDER INTERMODULATION vs.
TOTAL OUTPUT POWER
-20
Test Condition: Circuit optimized
for P-2dB from 2.64 to 2.69 GHz
Instantaneous Bandwidth when
biasing at 5 V 50 mA
-25
-30
-35
-40
-45
50 mA
150 mA
300 mA
100 mA
200 mA
350 mA
-50
16
18
20
22
24
26
Total Output Power, POUT (dBm)
28
NE651R479A
RECOMMENDED P.C.B. LAYOUT (Units in mm)
4.0
1.7
Drain
5.9
Gate
1.2
1.0
0.5
Source
through hole ∅ 0.2X33
0.5
0.5
6.1
RECOMMENDED SOLDERING CONDITIONS1
This product should be soldered under the following recommended conditions. For soldering methods and conditions other than those
recommended below, contact your CEL sales representative.
SOLDERING METHOD
Infrared Reflow
SOLDERING CONDITIONS
Package peak temperature: 235 ˚C or below
RECOMMENDED
CONDITION SYMBOL
IR35-00-2
Time: 30 seconds or less (at 210 ˚C)
Count: 2, Exposure limit: none
Partial Heating
PIN temperature: 260 ˚C
Time: 5 seconds or less (per pin row)
Exposure limit: none
Note:
1. Caution: Do not use different soldering methods together (except for partial heating).
-
NE651R479A
NONLINEAR MODEL
DRAIN
SCHEMATIC
Ldpkg
L=0.001 nH
GATE
Ld
L=0.55 nH
Q1
Lspkg
L=0.001 nH
Cdspkg
C=0.1 pF
Lg
L=1.45 nH
Cdspkg
C=0.1 pF
FET NONLINEAR MODEL PARAMETERS
Parameters
VTO
VTOSC
ALPHA
BETA
GAMMA
Q1
Parameters
Q1
0.9255
RG
1.0
1.5
RS
0.05
KF
0
0
0.964
0
GAMMADC(2) 0.002
Q
DELTA
VBI
RIS
RID
1.43
1
BETATCE
0
0
FFE
XTI
VTOTC
0.2e-12
CBS
100e-12
RDB
0 1
14e-12
CGDO 1.1e-12
0.3
DELTA2
0.2
(4)
DELTA1
0.5
Infinity
UNITS
Parameter
capacitance resistance 60
CGSO(3)
VBR
3
30e-12
CDS
FC
1
EG
0
0
TAU
AF
0
27
1e-16 N
RGMET
SOURCE
0.2
TNOM
0.6 IS
1.5
RD
Lspkg
L=0.001 nH
(1)
inductance Units
picofarads
nanohenries
ohms
MODEL RANGE
Frequency: 0.5 to 4 GHz
Bias: VDS = 2.2 V to 4.6 V, ID = 50 mA to 350 mA
Date:
6/02/2003
(1) Series IV Libra TOM Model
The parameter in Libra corresponds to the parameter in PSpice:
(2) GAMMADC GAMMA
(3) CGSO CGS
(4) CGDO CGD
11/02/2006
4590 Patrick Henry Drive
Santa Clara, CA 95054-1817
Telephone: (408) 919-2500
Facsimile: (408) 988-0279
Subject: Compliance with EU Directives
CEL certifies, to its knowledge, that semiconductor and laser products detailed below are compliant
with the requirements of European Union (EU) Directive 2002/95/EC Restriction on Use of Hazardous
Substances in electrical and electronic equipment (RoHS) and the requirements of EU Directive
2003/11/EC Restriction on Penta and Octa BDE.
CEL Pb-free products have the same base part number with a suffix added. The suffix –A indicates
that the device is Pb-free. The –AZ suffix is used to designate devices containing Pb which are
exempted from the requirement of RoHS directive (*). In all cases the devices have Pb-free terminals.
All devices with these suffixes meet the requirements of the RoHS directive.
This status is based on CEL’s understanding of the EU Directives and knowledge of the materials that
go into its products as of the date of disclosure of this information.
Restricted Substance
per RoHS
Concentration Limit per RoHS
(values are not yet fixed)
Concentration contained
in CEL devices
-A
Not Detected
Lead (Pb)
< 1000 PPM
Mercury
< 1000 PPM
Not Detected
Cadmium
< 100 PPM
Not Detected
Hexavalent Chromium
< 1000 PPM
Not Detected
PBB
< 1000 PPM
Not Detected
PBDE
< 1000 PPM
Not Detected
-AZ
(*)
If you should have any additional questions regarding our devices and compliance to environmental
standards, please do not hesitate to contact your local representative.
Important Information and Disclaimer: Information provided by CEL on its website or in other communications concerting the substance
content of its products represents knowledge and belief as of the date that it is provided. CEL bases its knowledge and belief on information
provided by third parties and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better
integrate information from third parties. CEL has taken and continues to take reasonable steps to provide representative and accurate
information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. CEL and CEL
suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for
release.
In no event shall CEL’s liability arising out of such information exceed the total purchase price of the CEL part(s) at issue sold by CEL to
customer on an annual basis.
See CEL Terms and Conditions for additional clarification of warranties and liability.