Features • Comprehensive Library of Standard Logic and I/O Cells • ATC18 Core and I/O Cells Designed to Operate with VDD = 1.8V ± 0.15V as Main Target Operating Conditions IO25 and IO33 Pad Libraries Provide Interfaces to 2.5V and 3V Environments Oscillators Provide Stable Clock Sources Basic Analog Input/Output, Power, Ground and Multiplexer Cells Available General-purpose Analog Cells Include Regulators, Power Management Cells, Op Amps, Comparators, ADCs and DACs, High-performance Analog Cells Can Be Developed on Request • Memory Cells Compiled to the Precise Requirements of the Design • Compatible with Atmel’s Extensive Range of Microcontroller, DSP, Standard-interface and Application-specific Cells • • • • Cell-based ASIC ATC18 1. Description The Atmel ATC18 Library is fabricated on a proprietary 0.18 micron, up to six-layermetal CMOS process intended for use with a supply voltage of 1.8V ± 0.15V. Table 11 shows the range for which Atmel library cells have been characterized. Table 1-1. Summary Recommended Operating Conditions Symbol Parameter Conditions Min Typ Max Unit VDD DC Supply Voltage Core and Standard I/Os 1.65 1.8 1.95 V VDD2.5 DC Supply voltage 2.5V Interface I/Os 2.25 2.5 2.75 V VDD3.3 DC Supply Voltage 3.3V Interface I/Os 3 3.3 3.6 V VI DC Input Voltage 0 VDD V VO DC Output Voltage 0 VDD V TEMP Operating Free Air Temperature Range -40 +85 °C TSG Storage Temperature -60 +150 °C Industrial NOTE: This is a summary document. The complete document is available under NDA. For more information, please contact your local Atmel sales office. 1389CS–CASIC–06-Nov-06 1.1 Absolute Maximum Ratings Operation of a device outside the range given in Table 1-2 may cause permanent damage to the device and/or affect reliability. Table 1-2. Absolute Maximum Ratings Symbol Parameter Conditions Min Max Unit VDD DC Supply Voltage Core -0.3 2.0 V VDD2.5 DC Supply voltage 2.5V Interface I/Os -0.3 4.0 V VDD3.3 DC Supply Voltage 3.3V Interface I/Os -0.3 4.0 V VI VI DC Input Voltage,1.8V I/Os -0.3 VDD + 0.3, 2.0 max V DC Input Voltage, 3.3V I/Os -0.3 VDD3.3 + 0.3, 4.0 max V DC Output Voltage, 1.8V I/Os -0.3 VDD+ 0.3, 2.0 max V DC Output Voltage, 3.3V I/Os -0.3 VDD3.3 + 0.3, 4.0 max V -40 +125 °C -60 +150 °C VO VO TEMP Operating Free Air Temperature Range TSG Storage Temperature Industrial The Atmel cell libraries have been designed in order to be compatible with each other. Simulation representations exist for three types of operating conditions. They correspond to the characterization conditions defined as follows: • MIN conditions (industrial best case): TJ = -40° C VDD(cell) = 1.95V Process = fast • TYP conditions (industrial typical case): TJ = +25° C VDD(cell) = 1.8V Process = typ • MAX conditions (industrial worst case): TJ = +100° C VDD(cell) = 1.60V Process = slow Delays to tristate are defined as delay to turn off (VGS < VT) of the driving devices. Output pad drain current corresponds to the output current of the pad when the output voltage is VOL or VOH. The output resistor of the pad and the voltage drop due to access resistors (in and out of the die) are taken into account. In order to have accurate timing estimates, all characterization has been run on electrical netlists extracted from the layout database. 2 ATC18 Summary 1389CS–CASIC–06-Nov-06 ATC18 Summary 2. Standard Cell Library SClib The Atmel Standard Cell Library, SClib, contains a comprehensive set of combinational logic and storage cells. The SClib library includes cells which belong to the following categories: • Buffers and Gates • Multiplexers • Flip-flops • Scan Flip-flops • Latches • Adders and Subtractors 2.1 Decoding the Cell Name Table 2-1 shows the naming conventions for the cells in the SClib library. Each cell name begins with either a two-, three-, or four-letter code that defines the type of cell. This indicates the range of standard cells available. Table 2-1. Code Cell Codes Description Code Description AD Adder INVB Balanced Inverter AH Half Adder INVT Inverting 3-State Buffer AS Adder/Subtractor LA D Latch AN AND Gate MI Inverting Multiplexer AOI AND-OR-Invert Gate MX Multiplexer AON AND-OR-AND-Invert Gates ND NAND Gate AOR AND-OR Gate NR NOR Gate Bus Holder OAI OR-AND-Invert Gate BUFB Balanced Buffer OAN OR-AND-OR-Invert Gates BUFF Non-Inverting Buffer BUFT Non-Inverting 3-State Buffer BH CG OR ORA OR Gate OR-AND Gate Carry Generator SD Multiplexed Scan D Flip-Flop Clock Buffer SE Multiplexed Scan Enable D Flip-Flop DE D-Enabled Flip-Flop SU Subtractor DF D Flip-Flop XN Exclusive NOR Gate Inverter XR Exclusive OR Gate CLK2 INV0 3 1389CS–CASIC–06-Nov-06 2.2 Cell Matrices Table 2-2 and Table 2-3 show storage elements in the SClib library. Note that all storage elements feature buffered clock inputs and buffered output. Table 2-2. D Flip-Flops Macro Name Clear ∞ Single Output 2 x Drive ∞ ∞ ∞ DFCRBx ∞ ∞ ∞ DFCRQx • • • DFCRNx • • • DFNRBx ∞ ∞ DFNRQx ∞ ∞ ∞ ∞ ∞ ∞ • ∞ ∞ ∞ ∞ ∞ DENRQx ∞ ∞ ∞ ∞ DENRBx ∞ ∞ ∞ DFPRBx ∞ DEPRQx ∞ ∞ DECRQx Table 2-3. • ∞ Scan Flip-flops Macro Name Single Output Set Clear 1xDrive 2xDrive • • • • SDCRBx • • • SDCRNx • • • • SDCRQx • • • • SDNRBx • • SDNRNx • • • SDNRQx • • • • • • • • • • • • • • SDBRBx SDPRBx • • SECRQx SENRQx SEPRQx 4 Enabled D Input 1 x Drive DFBRBx Set • ATC18 Summary 1389CS–CASIC–06-Nov-06 ATC18 Summary 3. Input/Output Pad Cell Libraries IO18lib, IO25lib and IO33lib The Atmel Input/Output Cell Library IO18lib contains a comprehensive list of input, output, bidirectional and tristate cells. The ATC18 (1.8V) cell library includes a special set of I/O cells, IO25lib (IO33lib), for interfacing with external 2.5V (3.3V) devices. 3.1 Voltage Levels The IO18lib library is made up exclusively of low-voltage chip interface circuits powered by a voltage level in the range of 1.65V to 1.95V. The library is compatible with SClib, 1.8-volt standard cell library. 3.2 Power and Ground Pads Designers are strongly encouraged to provide three kinds of power pairs for the IO18lib library. These are “AC”, “DC” and core power pairs. AC power is used by the I/O to switch its output from one state to the other. This switching generates noise in the AC power buses on the chip. DC power is used by the I/O to maintain its output in a steady state. The best noise performance is achieved when the DC power buses on the chip are free of noise; you are encouraged to use separate power pairs for AC and DC power to prevent most of the noise in the AC power buses from reaching the DC power buses. You can use the same power pairs to supply both DC power to the I/Os and power to the core without affecting noise performance. Table 3-1. VSS Power Pad Combinations Core Switching I/O Quiet I/O Vssi/gnd VssAC VssDC •/ • • • •/ • •/ • • VSS VSS pv18d00 VSS • pv18e00 VSS • pv18b00 VSS • pv18f00 VSS pv18c00 VSS Library Cell Name Signal Name pv18i18 VDD pv18a18 VDD • pv18d18 VDD • pv18e18 VDD • pv18b18 VDD • pv18f18 VDD pv18c18 VDD VDD Power Pad Combinations Switching I/O Quiet I/O Vddi/vdd VddAC VddDC •/ • • • •/ • /• pv18i00 pv18a00 Core •/ • Signal Name • /• Table 3-2. Library Cell Name • 5 1389CS–CASIC–06-Nov-06 3.3 Cell Matrices Table 3-3. CMOS Pads CMOS Cell Name 3-state I/O PC18B01 Output Only Drive Strength Pad Sites Used • 1x 1 PC18B02 • 2x 1 PC18B03 • 3x 1 PC18B04 • 4x 1 PC18B05 • 5x 1 PC18O01 • 1x 1 PC18O02 • 2x 1 PC18O03 • 3x 1 PC18O04 • 4x 1 PC18O05 • 5x 1 PC18T01 • 1x 1 PC18T02 • 2x 1 PC18T03 • 3x 1 PC18T04 • 4x 1 PC18T05 • 5x 1 3-state Output Only Drive Strength Pad Sites Used Table 3-4. TTL Pads TTL Cell Name 3-state I/O Output Only PT18B01 • 2 mA 1 PT18B02 • 4 mA 1 PT18B03 • 8 mA 1 PT18O01 • 2 mA 1 PT18O02 • 4 mA 1 PT18O03 • 8 mA 1 PT18T01 • 2 mA 1 PT18T02 • 4 mA 1 PT18T03 • 8 mA 1 Table 3-5. CMOS/TTL Input Only Pad Schmitt Input Level Shifter CMOS Cell Name Input Levels PC18D01 CMOS PC18D11 CMOS PC18D21 CMOS • PC18D31 CMOS • Note: 6 3-state Output Only Non-inverting Inverting • Pad Sites Used 1 • • 1 1 • 1 All 3-state I/Os, 3-state output only and input pads are also available with pull-up and pull-down device. ATC18 Summary 1389CS–CASIC–06-Nov-06 ATC18 Summary 4. Basic Analog Cell Library, ANA18lib, ANA25lib, ANA33lib The Atmel basic analog library makes the following parts available: • Multiplexer modules – Multiplexers to minimize cross-talk (for use with high-impedance nodes). – Multiplexers to minimize ON resistance. • Analog input and output cells • Analog power and ground cells A special set of basic analog I/O cells, ANA25lib (ANA33lib), is available for interfacing with external 2.5V (3.3V) devices. 5. General-purpose Analog Cell Library, GPlib The General-purpose Analog Cell Library (GPlib) is composed of cells performing various analog functions. Currently available are: • Regulators • Power Management Cells • Op Amps • Comparators • ADCs • DACs • PLLs Additional high-performance, complex analog cells can be developed according to specific customer requirements. 6. Oscillator Cell Library, OSC18lib The Atmel Oscillator Library provides stable clock sources. It comprises five standard oscillators. The Atmel two-pad oscillators are designed with the Pierce three-point oscillator structure. For the 32.768 kHz oscillator, the load capacitance must be between 6 pF and 12.5 pF. For high-frequency oscillators, the load capacitance must be between 15 pF and 20 pF. External capacitors must be added in order to obtain the correct load capacitance. Clock output is high at off state (onosc = 0). The oscillators provide a bypass mode (onosc = 0), clock = not (xin). Table 6-1 gives the available OSC18lib cells and their major characteristics. Table 6-1. Oscillator Cells Cell Name Description OSC18f33K 32.786 kHz crystal OSC18f9M 9 MHz crystal oscillator OSC18f16M 16 MHz crystal oscillator OSC18f27M 27 MHz crystal oscillator 7 1389CS–CASIC–06-Nov-06 7. Compiled CMOS Memories The Atmel CMOS Memory Compiler Library enables users to compile memories for the functions Single-port Synchronous RAM, Dual-port Synchronous RAM, Via Programmable ROM and Two-port Synchronous Register File according to their precise requirements. Memories compiled in this way can be instanced as often as required in designs, alongside cells from other Atmel CBIC libraries. 7.1 Single-port Synchronous SRAM Key features of the single-port synchronous SRAM are: • High-density (HD) SRAM • 350 MHz worst-case cycle time • Zero Quiescent Current • 3-state outputs • Several aspect ratios for optimization • Separate Data-in, Data-out pins support a write-through feature • Asynchronous write-through for testing interface shadow logic • BIST interface • Optional Sub-word write decode The single-port SRAM compiler is a high-density RAM compiler with quiescent current consumption equal to zero when the SRAM is not in a read or write mode. The compiler is optimized for a power supply voltage range of 1.62V to 1.98V and can operate at voltages as low as 1.2V. The SRAM instances can be built with several aspect ratios for maximum area and performance optimization. Separate output (Q) and input (D) pins allow a write-through cycle feature. An asynchronous write through mode (AWT) allows testing of interface shadow logic. Built-in BIST interface allows for easy connection to most memBIST solutions. The special test modes allow externally bypassing read and write self-timed circuits and adjusting read and write margins. The SRAM memory also includes a sub-word feature where selective write to each group of 8-bit subwords can be done. A maskable write enable signal is provided for each 8-bit group. Table 7-1 gives the range of permitted single-port synchronous RAM configurations. Table 7-1. Configuration Range Parameter Min Max Increment Address Locations (words) 32 16K 1 x CM(1) Word Size (Number of I/O bits) 2 128 1 bit 128 512K Total Bits in Core (Word Size x Address Locations) Note: 7.2 1. CM = 4, 8, 16: Column Mux option Dual-port Synchronous RAM Key features of the dual-port synchronous RAM are: • High-density (HD) SRAM • 300 MHz worst-case cycle time • Zero Quiescent Current • 3-state outputs 8 ATC18 Summary 1389CS–CASIC–06-Nov-06 ATC18 Summary • Several aspect ratios for optimization • Separate Data-in, Data-out pins support a write-through feature • Asynchronous write-through for testing interface shadow logic • BIST interface • Optional Sub-word decode The dual-port synchronous RAM compiler is a high-density RAM compiler with quiescent current consumption equal to zero when the SRAM is not in a read or write mode. The compiler is optimized for a power supply voltage range of 1.62V to 1.98V and can operate at voltages as low as 1.2V. The SRAM instances can be built with several aspect ratios for maximum area and performance optimization. Separate output (Q) and input (D) pins allow a write-through cycle feature. An asynchronous write-through mode (AWT) allows testing of interface shadow logic through scan. Built-in BIST interface allows for easy connection to most memBIST solutions. The special test modes allow externally bypassing read and write self-timed circuits and adjusting read and write margins. The SRAM compiler also includes a sub-word feature where selective write to each group of 8-bit sub-words can be done. A maskable write enable signal is provided for each 8-bit group. Table 7-2 gives the range of permitted dual-port synchronous RAM configurations. Table 7-2. Configuration Range Parameter Min Max Increment Address Locations (words) 32 8K 1 x CM(1) Word Size (Number of I/O bits) 2 128 1 bit 128 256K Total Bits in Core (Word Size x Address Locations) Note: 7.3 1. CM = 4, 8, 16: Column Mux option Via Programmable ROM Key features of the via programmable ROM are: • 1-port high-density synchronous via-2 programmable ROM • 290 MHz worst-case cycle time (2K x 16) with no limitation on clock duty cycle • Zero Quiescent Current • 3-state outputs • Several aspect ratios for optimization • Programming support The via programmable ROM compiler is a high-density low-power synchronous ROM compiler. The quiescent current consumption is zero when the ROM is not enabled. The compiler is optimized for a power supply voltage range of 1.62V to 1.98V and can operate at voltages as low as 1.26V. The ROM instances can be built with several aspect ratios for maximum area and performance optimization. Within limits, the user has flexibility in specifying the logical size of the ROM, including word size, number of address locations and column mux. 9 1389CS–CASIC–06-Nov-06 Table 7-3 gives the range of permitted via programmable ROM configurations. Table 7-3. Configuration Range Parameter Min Address Locations (words) Increment 64K 4 x CM(1) 8 64 1 bit 2K 1M 256 Word Size (Number of I/O bits) Total Bits in Core (Word Size x Address Locations) Notes: Max (2) 1. CM = 16, 32, 64: Column Mux option 2. Min = 256 for CM = 16; min = 512 for CM = 32; min = 1K for CM = 64 7.4 Two-port Synchronous Register File Key features of the two-port synchronous register file are: • 2-Port (1R, 1W) high-speed/low-power Register File • 500MHz worst-case cycle time for 32 words x 32 bits • Zero Quiescent Current • 3-state outputs • Several aspect ratios for optimization • Separate Data-in, Data-out pins • Optional sub word write decode The two-port synchronous register file compiler is a 2-port (1R, 1W) memory designed in 0.18micron process. This is a high-speed/low-power synchronous register file compiler. The quiescent current consumption is zero when all Register File inputs (including CLKA and CLKB) are stable. The compiler is optimized for a power supply voltage range of 1.6V to 2.0V and can operate at voltages as low as 1.2V. The Register File instances can be built with several aspect ratios for maximum area and performance optimization. Separate clocks (CLKA, CLKB), output (QB), and input (DA) pins allow independent read and write cycles. Built-in BIST interface allows for easy connection to most memBIST solutions. The memory also includes a sub-word feature where selective write to each group of 2-, 4- or 8-bit sub-words can be done. A maskable write enable signal is optionally provided for each 2-, 4-, or 8-bit group. Within limits, the user has flexibility in specifying the logical size of the Register File, including word size, number of address locations and column mux. Table 7-4 gives the range of permitted two-port synchronous register file configurations. Table 7-4. Configuration Range Parameter Min Max Increment 8 1024 1 x CM(1) Word Size (Number of I/O bits) 2(2) 256 1 bit Total Bits in Core (Word Size x Address Locations) 16 16K Address Locations (words) Notes: 1. CM = 1, 2, 4: Column Mux option 2. Minimum word size is 8 at column mux 4. 10 ATC18 Summary 1389CS–CASIC–06-Nov-06 ATC18 Summary 8. Revision History Table 8-1. Revision History Document Ref. Comments 1389AS First issue. 1389BS Reformatted. 1389CS Added Table 1-2, “Absolute Maximum Ratings,” on page 2. 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