SSM25T03GH,J N-channel Enhancement-mode Power MOSFET PRODUCT SUMMARY BVDSS 30V R DS(ON) 35mΩ ID 20A DESCRIPTION The SSM25T03 acheives fast switching performance with low gate charge without a complex drive circuit. It is suitable for low voltage applications such as DC/DC converters and general load-switching circuits. Pb-free; RoHS-compliant TO-251 (IPAK) and TO-252 (DPAK) G G The through-hole version, the SSM250T03GJ in TO-251, is available for vertical mounting, where a small footprint is required on the board, and/or an external heatsink is to be attached. These devices are manufactured with an advanced process, providing improved on-resistance and switching performance. D D S S TO-251 (suffix J) The SSM25T03GH is in a TO-252 package, which is widely used for commercial and industrial surface-mount applications. TO-252 (suffix H) ABSOLUTE MAXIMUM RATINGS Symbol Parameter Value Units VDS Drain-source voltage 30 V VGS Gate-source voltage ±20 V ID Continuous drain current, TC = 25°C 20 A 12 A 45 A 20 W 0.16 W/°C TC = 100°C 1 IDM Pulsed drain current PD Total power dissipation, TC = 25°C Linear derating factor TSTG Storage temperature range -55 to 150 °C TJ Operating junction temperature range -55 to 150 °C THERMAL CHARACTERISTICS Symbol Parameter RΘ JC Maximum thermal resistance, junction-case Maximum thermal resistance, junction-ambient RΘ JA Value 6 110 Units °C/\W °C/W Notes: 1.Pulse width must be limited to avoid exceeding the safe operating area. 2.Pulse width <300us, duty cycle <2%. 10/2/2006 Rev.3.1 www.SiliconStandard.com 1 of 6 SSM25T03GH,J ELECTRICAL CHARACTERISTICS Symbol (at Tj = 25°C, unless otherwise specified) Parameter Test Conditions Min. Typ. Max. Units 30 - - V BVDSS Drain-source breakdown voltage VGS=0V, ID=250uA ∆ BV DSS/∆ Tj Breakdown voltage temperature coefficient Reference to 25°C, ID=1mA - 0.02 - V/°C RDS(ON) Static drain-source on-resistance VGS=10V, ID=12A - - 35 mΩ VGS=4.5V, ID=7A - - 55 mΩ VDS=VGS, ID=250uA 1 - 3 V VGS(th) Gate threshold voltage gfs Forward transconductance VDS=10V, ID=12A - 13 - S IDSS Drain-source leakage current VDS=30V, VGS=0V - - 1 uA VDS=24V ,VGS=0V, Tj =150°C - - 25 uA VGS=±20V - - ±100 nA ID=12A - 6 10 nC IGSS Gate-source leakage current 2 Qg Total gate charge Qgs Gate-source charge VDS=24V - 2 - nC Qgd Gate-drain ("Miller") charge VGS=4.5V - 4 - nC VDS=15V - 6 - ns 2 td(on) Turn-on delay time tr Rise time ID=12A - 200 - ns td(off) Turn-off delay time RG=3.3Ω , VGS=10V - 10 - ns tf Fall time RD=1.25Ω - 3 - ns Ciss Input capacitance VGS=0V - 440 705 pF Coss Output capacitance VDS=25V - 105 - pF Crss Reverse transfer capacitance f=1.0MHz - 75 - pF Min. Typ. IS=12A, VGS=0V - - 1.3 V IS=12A, VGS=0V, - 18 - ns dI/dt=100A/µs - 6 - nC Source-Drain Diode Symbol VSD Parameter Forward voltage 2 2 trr Reverse-recovery time Qrr Reverse-recovery charge Test Conditions Max. Units Notes: 1.Pulse width must be limited to avoid exceeding the maximum junction temperature of 150°C. 2.Pulse width <300us, duty cycle <2%. 10/2/2006 Rev.3.1 www.SiliconStandard.com 2 of 6 SSM25T03GH,J 50 50 10V 10V 7.0V o T C =25 C o T C = 150 C ID , Drain Current (A) ID , Drain Current (A) 7.0V 40 40 30 5.0V 4.5V 20 10 30 5.0V 20 4.5V V G =3.0V 10 V G =3.0V 0 0 0 1 2 3 4 5 0 Fig 1. Typical Output Characteristics 2 3 4 5 Fig 2. Typical Output Characteristics 1.6 105 ID=7A I D = 12 A V G =10V 1.4 o 85 T C =25 C Normalized RDS(ON) RDS(ON) (mΩ ) 1 V DS , Drain-to-Source Voltage (V) V DS , Drain-to-Source Voltage (V) 65 1.2 1.0 45 0.8 25 0.6 2 4 6 8 10 -50 0 50 100 150 T j , Junction Temperature ( o C) V GS , Gate-to-Source Voltage (V) Fig 3. On-Resistance vs. Gate Voltage Fig 4. Normalized On-Resistance vs. Junction Temperature 10 1.8 Normalized VGS(th) (V) 8 6 IS (A) T j =150 o C T j =25 o C 4 1.4 1 0.6 2 0.2 0 0 0.2 0.4 0.6 0.8 1 V SD , Source-to-Drain Voltage (V) Fig 5. Forward Characteristic of Reverse Diode 10/2/2006 Rev.3.1 1.2 -50 0 50 100 150 T j , Junction Temperature ( o C) Fig 6. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 3 of 6 SSM25T03GH,J f=1.0MHz 14 1000 ID=12A C iss V DS =15V V DS =20V V DS =24V 10 8 C (pF) VGS , Gate to Source Voltage (V) 12 6 C oss 100 C rss 4 2 0 10 0 4 8 12 16 1 5 Q G , Total Gate Charge (nC) 9 13 17 21 25 29 V DS ,Drain-to-Source Voltage (V) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 100 Normalized Thermal Response (R thjc) 1 10 ID (A) 100us 1ms 10ms 100ms DC 1 o T c =25 C Single Pulse Duty factor=0.5 0.2 0.1 0.1 0.05 PDM 0.02 t T 0.01 Single Pulse Duty factor = t/T Peak Tj = PDM x Rthjc + T C 0.01 0.1 0.1 1 10 100 0.00001 0.0001 V DS ,Drain-to-Source Voltage (V) 0.001 0.01 0.1 1 t , Pulse Width (s) Fig 9. Maximum Safe Operating Area Fig 10. Effective Transient Thermal Impedance 30 VG V DS =5V ID , Drain Current (A) 25 T j =25 o C 20 QG T j =150 o C 4.5V QGS 15 QGD 10 5 Charge Q 0 0 2 4 6 8 V GS , Gate-to-Source Voltage (V) Fig 11. Transfer Characteristics 10/2/2006 Rev.3.1 Fig 12. Gate Charge Waveform www.SiliconStandard.com 4 of 6 SSM25T03GH,J PHYSICAL DIMENSIONS: TO-251 (I-PAK) D A D1 c1 E2 E1 E A1 B2 F B1 F1 c e Millimeters SYMBOLS MIN NOM MAX A 2.20 2.30 2.40 A1 0.90 1.20 1.50 B1 0.50 0.60 0.70 B2 0.60 0.72 0.90 c c1 0.45 0.50 0.60 0.45 0.50 0.55 D 6.40 6.60 6.80 D1 5.20 5.35 5.50 E 6.80 7.00 7.20 E1 5.40 5.60 5.80 E2 1.40 1.50 1.60 e -- 2.30 -- F 7.20 7.50 7.80 F1 1.50 1.60 1.80 1.All dimensions are in millimeters. 2.Dimensions do not include mold protrusions. e PHYSICAL DIMENSIONS: TO-252 (D-PAK) A E S Y M B O L c2 H D L4 A A e SEE VIEW B MIN. MAX. 1.80 2.80 c WITH PLATING BASE METAL SECTION A-A θ SEATING PLANE L1 0.00 0.13 0.40 1.00 b3 4.80 5.90 c 0.35 0.65 c2 0.40 0.89 D 5.10 6.30 E 6.00 7.00 2.30 BSC H 7.80 L 1.00 2.55 L1 2.20 3.05 L2 0.35 0.65 L3 0.50 2.03 L4 0.50 1.20 θ 0° 8° 11.05 A1 L2 L A1 b e b GAUGE PLANE TO-252-3L MILLIMETERS A L3 b3 VIEW B 10/2/2006 Rev.3.1 www.SiliconStandard.com 5 of 6 SSM25T03GH,J PART MARKING PART NUMBER: 25T03GH or 25T03GJ XXXXXX DATE/LOT CODE: (YWWSSS) Y = last digit of the year WW = week SSS = lot code sequence YWWSSS PACKING: Moisture sensitivity level MSL3 TO-252: 3000 pcs in antistatic tape on a reel packed inside a moisture barrier bag (MBB). TO-251: 1000pcs in tubes packed inside a moisture barrier bag (MBB). Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, expressed or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 10/2/2006 Rev.3.1 www.SiliconStandard.com 6 of 6