SSM3K15AMFV TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS III) SSM3K15AMFV Load Switching Applications Symbol Rating Unit Drain-Source voltage VDSS 30 V Gate-Source voltage VGSS ± 20 V DC ID 100 Pulse IDP 400 Drain current Drain dissipation PD(Note 1) mA 150 mW Channel temperature Tch 150 °C Storage temperature range Tstg −55 to 150 °C 0.32±0.05 0.4 0.8±0.05 1 3 2 0.13±0.05 Characteristics 0.8±0.05 Absolute Maximum Ratings (Ta = 25°C) 1.2±0.05 0.4 Low ON-resistance: RDS(ON) = 3.6 Ω (max) (@VGS = 4 V) RDS(ON) = 6.0 Ω (max) (@VGS = 2.5 V) 0.5±0.05 • 1.2±0.05 2.5 V drive 0.22±0.05 Unit: mm • 1.Gate VESM 2.Source 3.Drain Note: Using continuously under heavy loads (e.g. the application of JEDEC ― high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the JEITA ― reliability significantly even if the operating conditions (i.e. TOSHIBA 2-1L1B operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Weight: 1.5 mg (typ.) Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Mounted on FR4 board (25.4 mm × 25.4 mm × 1.6 mm, Cu Pad:0.585mm2) 0.5mm 0.45mm 0.45mm 0.4mm Marking Equivalent Circuit (top view) 3 3 DI 1 2 1 2 1 2010-11-29 SSM3K15AMFV Electrical characteristics (Ta = 25°C) Characteristics Symbol Drain-Source breakdown voltage Test Condition V (BR) DSS ID = 0.1 mA, VGS = 0 V V (BR) DSX ID = 0.1 mA, VGS = -10 V (Note 3) Min Typ. Max 30 ⎯ ⎯ 16 ⎯ ⎯ Unit V Drain cut-off current IDSS VDS = 30 V, VGS = 0 V ⎯ ⎯ 1 μA Gate leakage current IGSS VGS = ±16 V, VDS = 0 V ⎯ ⎯ ±1 μA Gate threshold voltage Vth VDS = 3 V, ID = 0.1 mA 0.8 ⎯ 1.5 V Forward transfer admittance |Yfs| mS Drain-Source ON-resistance RDS (ON) Input capacitance Ciss Output capacitance Coss Reverse transfer capacitance Crss Switching time VDS = 3 V, ID = 10 mA (Note 2) 35 ⎯ ⎯ ID = 10 mA, VGS = 4 V (Note 2) ⎯ 2.3 3.6 ID = 10 mA, VGS = 2.5 V (Note 2) ⎯ 3.5 6.0 ⎯ 13.5 ⎯ ⎯ 8.0 ⎯ ⎯ 6.5 ⎯ VDS = 3 V, VGS = 0 V, f = 1 MHz Turn-on time ton VDD = 5 V, ID = 10 mA ⎯ 5.5 ⎯ Turn-off time toff VGS = 0 to 5 V, RG = 50 Ω ⎯ 35 ⎯ ⎯ -0.85 -1.2 Drain-source forward voltage VDSF ID = -100 mA, VGS = 0 V (Note 2) Ω pF ns V Note 2: Pulse test Note 3: If a reverse bias is applied between gate and source, this device enters V(BR)DSX mode. Note that the drain-source breakdown voltage is lowered in this mode. Switching Time Test Circuit (a) Test circuit 5 V OUT 10 μs RG IN 0 (b) VIN VDD = 5 V RG = 50 Ω Duty ≤ 1% VIN: tr, tf < 5 ns Common source Ta = 25°C 5V 0V (c) VOUT VDD 90% 10% VDD 90% 10% VDS (ON) tr ton tf toff Precaution Vth can be expressed as voltage between gate and source when low operating current value is ID = 0.1 mA for this product. For normal switching operation, VGS (on) requires higher voltage than Vth and VGS (off) requires lower voltage than Vth. (Relationship can be established as follows: VGS (off) < Vth < VGS (on) ) Please take this into consideration for using the device. Do not use this device under avalanche mode. It may cause the device to break down. Handling Precaution When handling individual devices (which are not yet mounting on a circuit board), be sure that the environment is protected against electrostatic electricity. Operators should wear anti-static clothing, and containers and other objects that come into direct contact with devices should be made of anti-static materials. Thermal resistance Rth (ch-a) and power dissipation PD vary depending on board material, board area, board thickness and pad area. When using this device, please take heat dissipation into consideration 2 2010-11-29 SSM3K15AMFV ID – VDS ID – VGS 1000 Common source Ta = 25 °C Pulse test 10 V 300 ID 3.0 V 100 2.7 V 200 10 Ta = 100 °C Drain current Drain current (mA) 4.0 V ID (mA) 400 2.5 V 2.3 V 100 1 − 25 °C 25 °C 0.1 Common source VDS = 3 V Pulse test VGS = 2.1 V 0 0 0.2 0.4 0.6 0.8 Drain-source voltage VDS 0.01 0 1.0 (V) 1.0 2.1 V 2.3 V 2.5 V Drain-source ON-resistance RDS (ON) (Ω) 4 4.0 V 3 2 VGS = 10 V 1 Common source Ta = 25°C Pulse test 100 200 Drain current 300 ID 10 8 6 25 °C 4 Ta = 100 °C 2 − 25 °C 0 400 0 2 RDS (ON) – Ta Gate threshold voltage 3 10 mA / 4 V Common source Pulse test 0 50 Ambient temperature VGS 10 (V) Common source VDS = 3 V ID = 0.1 mA Vth (V) ID = 10 mA / VGS = 2.5 V 4 1 8 Vth – Ta 2.0 5 0 −50 6 4 Gate-source voltage (mA) 6 2 (V) ID = 10 mA Common source Pulse test 2.7 V 3.0 V 0 4.0 RDS (ON) – VGS 5 Drain-source ON-resistance RDS (ON) (Ω) VGS 12 6 Drain-source ON-resistance RDS (ON) (Ω) 3.0 Gate-source voltage RDS (ON) – ID 0 2.0 100 Ta 1.0 0 −50 150 (°C) 0 50 Ambient temperature 3 100 Ta 150 (°C) 2010-11-29 1000 IDR (mA) Common source VDS = 3 V Ta=25°C Pulse test 100 Drain reverse current Forward transfer admittance IDR – VDS |Yfs| – ID 1000 ⎪Yfs⎪ (mS) SSM3K15AMFV 10 1 100 10 1 Drain current ID 25 °C 10 Common source VGS = 0 V Pulse test D Ta =100 °C 1 S –0.5 –1.0 Drain-source voltage (mA) VDS –1.5 (V) t – ID 1000 Common source VDD = 5 V VGS = 0 to 5 V Ta = 25 °C RG = 50Ω (pF) (ns) toff 100 tf t C Ciss Switching time Capacitance IDR G −25 °C 0.1 0 1000 C – VDS 100 100 10 Coss Common source Ta = 25°C f = 1 MHz VGS = 0 V 10 ton Crss tr 1 1 0.1 1 10 Drain-source voltage 100 VDS 1 (V) 10 Drain current 100 ID 1000 (mA) PD – Ta Power dissipation PD (mW) 250 Mounted on FR4 board (25.4 mm × 25.4 mm × 1.6 mmt, Cu Pad: 0.585 mm2 ) 200 150 100 50 0 0 20 40 60 80 100 Ambient temperature 120 Ta 140 160 (°C) 4 2010-11-29 SSM3K15AMFV RESTRICTIONS ON PRODUCT USE • Toshiba Corporation, and its subsidiaries and affiliates (collectively “TOSHIBA”), reserve the right to make changes to the information in this document, and related hardware, software and systems (collectively “Product”) without notice. • This document and any information herein may not be reproduced without prior written permission from TOSHIBA. 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