ETC STB45NF3LLT4

STB45NF3LL
N-CHANNEL 30V - 0.014Ω - 45A D2PAK
STripFET II POWER MOSFET
TYPE
STB45NF3LL
■
■
■
■
VDSS
RDS(on)
ID
30V
<0.018Ω
45A
TYPICAL RDS(on) = 0.016Ω @4.5V
OPTIMAL RDS(ON) x Qg TRADE-OFF @ 4.5V
CONDUCTION LOSSES REDUCED
SWITCHING LOSSES REDUCED
DESCRIPTION
This application specific Power MOSFET is the
third genaration of STMicroelectronics unique
“Single Feature Size ” strip-based process. The
resulting transistor shows the best trade-off between on-resistance ang gate charge. When used
as high and low side in buck regulators, it gives the
best performance in terms of both conduction and
switching losses. This is extremely important for
motherboards where fast switching and high efficiency are of paramount importance.
3
1
D2PAK
ADD SUFFIX “T4” FOR ORDERING IN TAPE & REEL
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ SPECIFICALLY DESIGNED AND OPTIMISED
FOR HIGH EFFICIENCY DC/DC
CONVERTERS
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Value
Unit
Drain-source Voltage (VGS = 0)
Parameter
30
V
Drain-gate Voltage (RGS = 20 kΩ)
30
V
± 16
V
Gate- source Voltage
ID
Drain Current (continuos) at TC = 25°C
45
A
ID
Drain Current (continuos) at TC = 100°C
32
A
IDM (●)
Drain Current (pulsed)
180
A
PTOT
Total Dissipation at TC = 25°C
70
W
Derating Factor
0.46
W/°C
Single Pulse Avalanche Energy
241
mJ
– 55 to 175
°C
EAS (1)
Tstg
Tj
Storage Temperature
Max. Operating Junction Temperature
( ●) Pulse width limi ted by safe operating area
October 2001
(1) Starting Tj= 25°C, ID= 22.5A, VDD= 24V
1/9
STB45NF3LL
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
2.14
°C/W
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Maximum Lead Temperature For Soldering Purpose
300
°C
Tl
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
V(BR)DSS
IDSS
IGSS
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
Zero Gate Voltage
Drain Current (V GS = 0)
VDS = Max Rating
1
µA
VDS = Max Rating, TC = 125 °C
10
µA
Gate-body Leakage
Current (VDS = 0)
VGS = ± 16 V
±100
nA
Max.
Unit
30
V
ON (1)
Symbol
Parameter
VGS(th)
Gate Threshold Voltage
R DS(on)
Static Drain-source On
Resistance
Test Conditions
VDS = VGS, ID = 250µA
Min.
Typ.
1
V
VGS = 10 V, I D = 22.5 A
0.014
0.018
Ω
VGS = 4.5V, ID = 22.5 A
0.016
0.020
Ω
Typ.
Max.
Unit
DYNAMIC
Symbol
gfs (1)
2/9
Parameter
Test Conditions
Min.
Forward Transconductance
VDS =15 V , ID = 22.5 A
20
S
VDS = 25V, f = 1 MHz, VGS = 0
C iss
Input Capacitance
800
pF
Coss
Output Capacitance
250
pF
Crss
Reverse Transfer
Capacitance
60
pF
STB45NF3LL
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
Qg
Qgs
Q gd
Parameter
Turn-on Delay Time
Rise Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Test Conditions
Min.
VDD = 15 V, I D = 22.5A
RG = 4.7Ω VGS = 4.5V
(Resistive Load, see Fig. 3)
VDD = 24V, ID = 45A,
VGS = 5V
Typ.
Max.
Unit
17
ns
100
ns
12.5
4.6
5.2
17
nC
nC
nC
Typ.
Max.
Unit
SWITCHING OFF
Symbol
td(off)
tf
Parameter
Turn-off-Delay Time
Fall Time
Test Condit ions
Min.
VDD = 15V, ID = 22.5A,
R G = 4.7Ω, VGS = 4.5V
(Resistive Load, see Fig. 3)
20
21
ns
ns
SOURCE DRAIN DIODE
Symbol
Max.
Unit
Source-drain Current
45
A
ISDM (2)
Source-drain Current (pulsed)
180
A
VSD (1)
Forward On Voltage
ISD = 45A, VGS = 0
1.3
V
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 45A, di/dt = 100A/µs,
VDD = 15V, Tj = 150°C
(see test circuit, Figure 5)
ISD
trr
Qrr
IRRM
Parameter
Test Conditions
Min.
Typ.
35
44
2.5
ns
nC
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedance
3/9
STB45NF3LL
Output Characteristics
Transconductance
Gate Charge vs Gate-source Voltage
4/9
Transfer Characteristics
Static Drain-source On Resistance
Capacitance Variations
STB45NF3LL
Normalized Gate Thereshold Voltage vs Temp.
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
Normalized Breakdown Voltage vs Tj
5/9
STB45NF3LL
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/9
STB45NF3LL
D2PAK MECHANICAL DATA
mm.
inch
DIM.
MIN.
TYP
MAX.
MIN.
TYP.
MAX.
A
4.4
4.6
0.173
0.181
A1
2.49
2.69
0.098
0.106
A2
0.03
0.23
0.001
0.009
B
0.7
0.93
0.027
0.036
B2
1.14
1.7
0.044
0.067
C
0.45
0.6
0.017
0.023
C2
1.23
1.36
0.048
0.053
D
8.95
9.35
0.352
0.368
D1
E
8
0.315
10
E1
10.4
0.393
8.5
0.334
G
4.88
5.28
0.192
0.208
L
15
15.85
0.590
0.625
L2
1.27
1.4
0.050
0.055
L3
1.4
1.75
0.055
0.068
M
2.4
3.2
0.094
0.126
R
0.015
0º
8º
3
V2
0.4
7/9
1
STB45NF3LL
D2PAK
FOOTPRINT
TUBE SHIPMENT (no suffix)*
TAPE AND REEL SHIPMENT (suffix ”T4”)*
REEL MECHANICAL DATA
DIM.
mm
MIN.
DIM.
mm
A0
MIN.
10.5
MAX. MIN. MAX.
10.7 0.413 0.421
B0
15.7
15.9
0.618 0.626
D
1.5
1.6
0.059 0.063
D1
E
1.59
1.65
1.61
1.85
0.062 0.063
0.065 0.073
F
K0
11.4
4.8
11.6
5.0
0.449 0.456
0.189 0.197
P0
3.9
4.1
0.153 0.161
P1
11.9
12.1
0.468 0.476
P2
R
1.9
50
2.1
0.075 0.082
1.574
T
W
0.25
23.7
0.35 0.0098 0.0137
24.3 0.933 0.956
* on sales type
8/9
inch
MIN.
330
MAX.
A
B
1.5
C
D
12.8
20.2
13.2
0.504 0.520
0795
G
24.4
26.4
0.960 1.039
N
100
T
TAPE MECHANICAL DATA
MAX.
inch
BASE QTY
1000
12.992
0.059
3.937
30.4
1.197
BULK QTY
1000
STB45NF3LL
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a trademark of STMicroelectronics
 2001 STMicroelectronics – Printed in Italy – All Rights Reserved
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