MOSEL VITELIC PRELIMINARY V53C8125H ULTRA-HIGH PERFORMANCE, 128K X 8 FAST PAGE MODE CMOS DYNAMIC RAM HIGH PERFORMANCE 30 35 40 45 50 Max. RAS Access Time, (tRAC) 30 ns 35 ns 40 ns 45 ns 50 ns Max. Column Address Access Time, (tCAA) 16 ns 18 ns 20 ns 22 ns 24 ns Min. Fast Page Mode Cycle Time, (tPC) 19 ns 21 ns 23 ns 25 ns 28 ns Min. Read/Write Cycle Time, (tRC) 65 ns 70 ns 75 ns 80 ns 90 ns Features Description ■ 128K x 8-bit organization ■ RAS access time: 30, 35, 40, 45, 50 ns ■ Fast Page Mode supports sustained data rates up to 53 MHz ■ Read-Modify-Write, RAS-Only Refresh, CAS-Before-RAS Refresh capability ■ Refresh Interval: 256 cycles/8 ms ■ Available in 26/24 pin 300 mil SOJ and 28 pin TSOP-I packages The V53C8125H is a high speed 131,072 x 8 bit CMOS dynamic random access memory. The V53C8125H offers a combination of features: Fast Page Mode for high data bandwidth, fast usable speed, CMOS standby current. All inputs and outputs are TTL compatible. Input and output capacitances are significantly lowered to allow increased system performance. Fast Page Mode operation allows random access of up to 512 columns (x9) bits within a row with cycle times as short as 19 ns. Because of static circuitry, the CAS clock is not in the critical timing path. The flowthrough column address latches allow address pipelining while relaxing many critical system timing requirements for fast usable speed. These features make the V53C8125H ideally suited for graphics, digital signal processing and high performance peripherals. Device Usage Chart Operating Temperature Range 0°C to 70 °C Package Outline K T . . V53C8125H Rev. 1.7 August 1998 Access Time (ns) 30 . Power 35 40 45 50 Std. Temperature Mark . . . . . Blank 1 V53C8125H MOSEL VITELIC V 5 3 C 8 1 FAMILY Description Pkg. Pin Count SOJ K 26/24 TSOP-II T 28 2 5 H DEVICE PKG RAS A0 A1 A2 A3 VCC 8 9 10 26 25 300 mil 1 2 3 4 5 6 11 12 13 24 23 22 21 V SS I/O8 I/O7 I/O6 I/O5 CAS 19 18 17 16 15 14 OE A8 A7 A6 A5 A4 Address Inputs (A8: Column Address only) RAS Row Address Strobe CAS Column Address Strobe WE Write Enable OE Output Enable I/O1- I/O8 Data Input, Output VCC +5V Supply VSS 0V Supply NC No Connect August 1998 (30 ns) (35 ns) (40 ns) (45 ns) (50 ns) 8125H 01 28 Lead TSOP-I PIN CONFIGURATION Top View CAS I/O5 I/O6 I/O7 I/O8 VSS VSS NC I/O1 I/O2 I/O3 I/O4 NC WE 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 8125H 03 Pin Names A0-A 8 BLANK (0°C to 70°C) BLANK (NORMAL) 30 35 40 45 50 8125H 02 V53C8125H Rev. 1.7 TEMP. PWR. K (SOJ) T (TSOP) 26/24 Lead SOJ PIN CONFIGURATION Top View VSS I/O1 I/O2 I/O3 I/O4 WE SPEED ( t RAC) 2 OE A8 A7 A6 A5 A4 NC VCC NC A3 A2 A1 A0 RAS V53C8125H MOSEL VITELIC Absolute Maximum Ratings* Capacitance* TA = 25°C, VCC = 5 V ± 10%, VSS = 0 V Ambient Temperature Under Bias ................................. ñ10°C to +80°C Storage Temperature (plastic) ..... ñ55°C to +125°C Voltage Relative to VSS .................ñ1.0 V to +7.0 V Data Output Current ..................................... 50 mA Power Dissipation .......................................... 1.0 W *Note: Operation above Absolute Maximum Ratings can adversely affect device reliability. Symbol Parameter Typ. Max. Unit CIN1 Address Input 3 4 pF CIN2 RAS, CAS, WE, OE 4 5 pF COUT Data Input/Output 5 7 pF *Note: Capacitance is sampled and not 100% tested. Block Diagram 128K x 8 OE WE CAS RAS RAS CLOCK GENERATOR CAS CLOCK GENERATOR WE CLOCK GENERATOR OE CLOCK GENERATOR VCC VSS I/O 1 DATA I/O BUS I/O2 COLUMN DECODERS Y0ñY8 I/O3 I/O BUFFER I/O4 I/O 5 SENSE AMPLIFIERS I/O6 REFRESH COUNTER I/O7 I/O8 512 x 8 A1 ï ï ï A7 A8 V53C8125H Rev. 1.7 August 1998 X0ñX7 ROW DECODERS A0 ADDRESS BUFFERS AND PREDECODERS 9 256 MEMORY ARRAY 8125H 16 3 V53C8125H MOSEL VITELIC DC and Operating Characteristics (1-2) TA = 0°C to 70°C, VCC = 5 V ± 10%, VSS = 0 V, unless otherwise specified. Symbol Parameter Access Time V53C8125H Min. Typ. Max. Unit Test Conditions Notes ILI Input Leakage Current (any input pin) Ò10 10 µA VSS ≤ VIN ≤ VCC ILO Output Leakage Current (for High-Z State) Ò10 10 µA VSS ≤ VOUT ≤ VCC RAS, CAS at VIH ICC1 VCC Supply Current, Operating 30 180 mA t RC = tRC (min.) 35 160 40 150 45 145 50 135 4 mA RAS, CAS at VIH, other inputs ≥ VSS 30 180 mA t RC = tRC (min.) 2 35 160 40 150 45 145 50 135 30 110 mA Minimum Cycle 1, 2 35 95 40 90 45 85 50 80 ICC2 VCC Supply Current, TTL Standby ICC3 VCC Supply Current, RAS-Only Refresh ICC4 VCC Supply Current, Fast Page Mode Operation 1, 2 ICC5 VCC Supply Current, Standby Output Enable other inputs ≥ VSS 2 mA RAS = VIH CAS = VIL ICC6 VCC Supply Current, CMOS Standby 1 mA RAS ≥ VCC Ò 0.2 V, CAS ≥ VCC Ò 0.2 V, All other inputs ≥ VSS VCC Supply Voltage 4.5 5.5 V VIL Input Low Voltage Ò1 0.8 V 3 VIH Input High Voltage 2.4 VCC + 1 V 3 VOL Output Low Voltage 0.4 V IOL = 4.2 mA VOH Output High Voltage 2.4 V IOH = Ò5 mA V53C8125H Rev. 1.7 August 1998 2.4 4 1 V53C8125H MOSEL VITELIC AC Characteristics TA = 0°C to 70°C, VCC = 5 V ±10%, VSS = 0V unless otherwise noted AC Test conditions, input pulse levels 0 to 3V 30 35 40 45 50 # Symbol Parameter 1 tRAS RAS Pulse Width 30 2 tRC Read or Write Cycle Time 65 70 75 80 90 ns 3 tRP RAS Precharge Time 25 25 25 25 30 ns 4 tCSH CAS Hold Time 30 35 40 45 50 ns 5 tCAS CAS Pulse Width 5 6 7 8 9 ns 6 tRCD RAS to CAS Delay 15 7 tRCS Read Command Setup Time 0 0 0 0 0 ns 8 tASR Row Address Setup Time 0 0 0 0 0 ns 9 tRAH Row Address Hold Time 5 6 7 8 9 ns 10 tASC Column Address Setup Time 0 0 0 0 0 ns 11 tCAH Column Address Hold Time 5 5 5 6 7 ns 12 tRSH (R) RAS Hold Time (Read Cycle) 10 10 10 10 10 ns 13 tCRP CAS to RAS Precharge Time 5 5 5 5 5 ns 14 tRCH Read Command Hold Time Referenced to CAS 0 0 0 0 0 ns 15 tRRH Read Command Hold Time Referenced to RAS 16 tROH RAS Hold Time Referenced to OE 17 tOAC Access Time from OE 10 11 12 13 14 ns 12 18 tCAC Access Time from CAS 10 11 12 13 14 ns 6,7,14 19 tRAC Access Time from RAS 30 35 40 45 50 ns 6, 8, 9 20 tCAA Access Time from Column Address 16 18 20 22 24 ns 6,7,10 21 tLZ OE or CAS to Low-Z Output 0 ns 16 22 tHZ OE or CAS to High-Z Output 0 ns 16 23 tAR Column Address Hold Time from RAS 26 24 tRAD RAS to Column Address Delay Time 10 25 tRSH (W) RAS or CAS Hold Time in Write Cycle 10 10 10 10 10 ns 26 tCWL Write Command to CAS Lead Time 10 11 12 13 14 ns 27 tWCS Write Command Setup Time 0 0 0 0 0 ns 28 tWCH Write Command Hold Time 5 5 5 6 7 ns V53C8125H Rev. 1.7 August 1998 Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Unit Notes 75K 20 35 16 75K 24 0 6 28 0 28 11 5 32 0 6 12 19 75K 36 0 13 0 8 40 23 ns 4 5 14 ns ns 0 7 ns 0 10 35 20 50 0 0 30 17 18 75K 9 0 6 45 0 8 0 14 17 75K 0 7 5 40 ns 26 ns 11 12, 13 5 V53C8125H MOSEL VITELIC AC Characteristics (ContÌd) 30 35 40 45 50 # Symbol Parameter 29 tWP Write Pulse Width 5 5 5 6 7 ns 30 tWCR Write Command Hold Time from RAS 26 28 30 35 40 ns 31 tRWL Write Command to RAS Lead Time 10 11 12 13 14 ns 32 tDS Data in Setup Time 0 0 0 0 0 ns 14 33 tDH Data in Hold Time 5 5 5 6 7 ns 14 34 tWOH Write to OE Hold Time 5 5 6 7 8 ns 14 35 tOED OE to Data Delay Time 5 5 6 7 8 ns 14 36 tRWC Read-Modify-Write Cycle Time 100 105 110 115 130 ns 37 tRRW Read-Modify-Write Cycle RAS Pulse Width 65 70 75 80 87 ns 38 tCWD CAS to WE Delay 26 28 30 32 34 ns 12 39 tRWD RAS to WE Delay in ReadModify-Write Cycle 50 54 58 62 68 ns 12 40 tCRW CAS Pulse Width (RMW) 44 46 48 50 52 ns 41 tAWD Col. Address to WE Delay 32 35 38 41 42 ns 42 tPC Fast Page Mode Read or Write Cycle Time 19 21 23 25 28 ns 43 tCP CAS Precharge Time 4 4 5 6 7 ns 44 tCAR Column Address to RAS Setup Time 16 18 20 22 24 ns 45 tCAP Access Time from Column Precharge 46 tDHR Data in Hold Time Referenced to RAS 26 28 30 35 40 ns 47 tCSR CAS Setup Time CAS- beforeRAS Refresh 10 10 10 10 10 ns 48 tRPC RAS to CAS Precharge Time 0 0 0 0 0 ns 49 tCHR CAS Hold Time CAS-beforeRAS Refresh 7 8 8 10 12 ns 50 tPCM Fast Page Mode Read-ModifyWrite Cycle Time 56 58 60 51 tT Transition Time (Rise and Fall) 3 52 tREF Refresh Interval (512 Cycles) V53C8125H Rev. 1.7 August 1998 Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Unit Notes 19 50 21 3 8 50 8 6 23 3 25 65 50 8 27 70 3 50 8 ns 12 7 ns 3 50 ns 15 8 ms 17 V53C8125H MOSEL VITELIC Notes: 1. ICC is dependent on output loading when the device output is selected. Specified ICC (max.) is measured with the output open. 2. ICC is dependent upon the number of address transitions. Specified ICC (max.) is measured with a maximum of two transitions per address cycle in Fast Page Mode. 3. Specified VIL (min.) is steady state operating. During transitions, VIL (min.) may undershoot to Ò1.0 V for a period not to exceed 20 ns. All AC parameters are measured with VIL (min.) ≥ VSS and VIH (max.) ≤ VCC. 4. tRCD (max.) is specified for reference only. Operation within tRCD (max.) limits insures that tRAC (max.) and tCAA (max.) can be met. If tRCD is greater than the specified tRCD (max.), the access time is controlled by tCAA and tCAC. 5. Either tRRH or tRCH must be satisified for a Read Cycle to occur. 6. Measured with a load equivalent to two TTL inputs and 50 pF. 7. Access time is determined by the longest of tCAA, tCAC and tCAP. 8. Assumes that tRAD ≤ tRAD (max.). If tRAD is greater than tRAD (max.), tRAC will increase by the amount that tRAD exceeds tRAD (max.). 9. Assumes that tRCD ≤ tRCD (max.). If tRCD is greater than tRCD (max.), tRAC will increase by the amount that tRCD exceeds tRCD (max.). 10. Assumes that tRAD ≥ tRAD (max.). 11. Operation within the tRAD (max.) limit ensures that tRAC (max.) can be met. tRAD (max.) is specified as a reference point only. If tRAD is greater than the specified tRAD (max.) limit, the access time is controlled by tCAA and tCAC. 12. tWCS, tRWD, tAWD and tCWD are not restrictive operating parameters. 13. tWCS (min.) must be satisfied in an Early Write Cycle. 14. tDS and tDH are referenced to the latter occurrence of CAS or WE. 15. tT is measured between VIH (min.) and VIL (max.). AC-measurements assume tT = 3 ns. 16. Assumes a three-state test load (5 pF and a 380 Ohm Thevenin equivalent). 17. An initial 200 µs pause and 8 RAS-containing cycles are required when exiting an extended period of bias without clocks. An extended period of time without clocks is defined as one that exceeds the specified Refresh Interval. V53C8125H Rev. 1.7 August 1998 7 V53C8125H MOSEL VITELIC Waveforms of Read Cycle t RC (2) t RAS (1) RAS t RP (3) t AR (23) VIH VIL t CSH (4) t CRP (13) CAS t RCD (6) VIL t CRP (13) t RAD (24) t RAH (9) t ASR (8) ADDRESS t RSH (R)(12) t CAS (5) VIH VIH ROW ADDRESS VIL t CAH (11) t ASC (10) COLUMN ADDRESS t RCH (14) t CAR (44) t RCS (7) WE t RRH (15) VIH VIL t ROH (16) t CAA (20) OE t OAC (17) VIH VIL t CAC (18) t RAC (19) I/O t HZ (22) t HZ (22) VOH VALID DATA-OUT VOL t LZ (21) 8125H 04 Waveforms of Early Write Cycle t RC (2) t RAS (1) RAS t RP (3) t AR (23) V IH V IL t CSH (4) t CRP (13) CAS t RCD (6) t RSH (W)(25) t CAS (5) V IH V IL t CAR (44) t CAH (11) t RAH (9) t ASR (8) ADDRESS t CRP (13) V IH V IL t ASC (10) ROW ADDRESS COLUMN ADDRESS t WCH (28) t RAD (24) t CWL (26) WE t WP (29) t WCS (27) V IH V IL t WCR (30) t RWL (31) OE V IH V IL t DHR (46) t DS (32) I/O V IH V IL t DH (33) VALID DATA-IN HIGH-Z 8125H 05 Donít Care V53C8125H Rev. 1.7 August 1998 8 Undefined V53C8125H MOSEL VITELIC Waveforms of OE-Controlled Write Cycle t RC (2) t RAS (1) RAS V IL t CSH (4) t CRP (13) CAS t RCD (6) t RSH (W)(12) t CAS (5) V IH t CRP (13) V IL t RAD (24) t RAH (9) t ASR (8) ADDRESS t RP (3) t AR (23) V IH V IH t ASC (10) ROW ADDRESS V IL t CAR (44) t CAH (11) COLUMN ADDRESS t CWL (26) t RWL (31) t WP (29) WE V IH V IL t WOH (34) OE V IH V IL t OED (35) I/O t DH (33) t DS (32) V IH VALID DATA-IN V IL 8125H 06 Waveforms of Read-Modify-Write Cycle t RWC (36) tRRW (37) RAS t RP (3) t AR (23) VIH VIL t CSH (4) t CRP (13) CAS t RCD (6) t RSH (W)(25) t CRW (40) VIH VIL t t RAH (9) VIH ROW ADDRESS VIL COLUMN ADDRESS t AWD (41) t CWD (38) t RAD (24) t RWD (39) WE OE CAH (11) t ASC (10) t ASR (8) ADDRESS t CRP (13) t RWL (31) t WP (29) VIH VIL t CAA (20) t OAC (17) VIH VIL t OED (35) t CAC (18) t RAC (19) I/O t CWL (26) VIH VOH VIL VOL t DH (33) t HZ (22) t DS (32) VALID DATA-OUT VALID DATA-IN t LZ (21) 8125H 07 Donít Care V53C8125H Rev. 1.7 August 1998 9 Undefined V53C8125H MOSEL VITELIC Waveforms of Fast Page Mode Read Cycle RAS t PC (42) t CP (43) t CSH (4) t RAH (9) t CAR (44) t ASC (10) t CAH (11) t ASC (10) V IH ROW ADDRESS COLUMN ADDRESS t CAH (11) COLUMN ADDRESS COLUMN ADDRESS t RCH (14) t CAH (11) t RCS (7) t RCS (7) t RCS (7) V IL t CAA (20) t CAA (20) t CAP (45) t OAC (17) t RRH (15) t OAC (17) V IH V IL t HZ (22) t RAC (19) t CAC (18) t LZ (21) t CAC (18) t CAC (18) t HZ (22) V OH t HZ (22) t HZ (22) VALID DATA OUT V OL t HZ (22) t HZ (22) t LZ (21) t LZ (21) I/O t RCH (14) V IH t OAC (17) OE t CRP (13) t CAS (5) t CAS (5) V IL V IL WE t RSH (R)(12) t CAS (5) V IH t ASR (8) ADDRESS RP (3) V IL t RCD (6) t CRP (13) CAS t t RAS (1) t AR (23) V IH VALID DATA OUT VALID DATA OUT 8125H 08 Waveforms of Fast Page Mode Write Cycle t RP (3) t AR (23) RAS t RAS (1) V IH V IL t CRP (13) t RCD (6) CAS t PC (42) t CP (43) t CAS (5) V IH t RSH (W)(25) t CRP (13) t CAS (5) t CAS (5) V IL t CSH (4) t RAH (9) t CAR (44) t ASC (10) t ASR (8) ADDRESS V IH ROW ADD V IL t ASC (10) t CAH (11) t CAH (11) COLUMN ADDRESS t RAD (24) COLUMN ADDRESS t CWL (26) t WCS (27) OE t WCH (28) t WCH (28) t RWL (31) t WCH (28) t WP (29) t WP (29) V IH V IL VIH V IL V IH V IL t DS (32) t DH (33) t DS (32) t DH (33) t DS (32) I/O t CWL (26) t WCS (27) t WP (29) WE COLUMN ADDRESS t CWL (26) t WCS (27) t CAH (11) VALID DATA IN VALID DATA IN OPEN t DH (33) VALID DATA IN OPEN 8125H 09 Donít Care V53C8125H Rev. 1.7 August 1998 10 Undefined V53C8125H MOSEL VITELIC Waveforms of Fast Page Mode Read-Write Cycle RAS t RAS (1) VIH V IL t CSH (4) t RCD (6) t RP (3) t PCM (50) t RSH (W)(25) t CRP (13) t CAS (5) t CP (43) t CAS (5) V CAS IH V t CAS (5) t RAD (24) IL t RAH (9) t CAR (44) t ASC (10) ADDRESS IH ROW ADD V IL t ASC (10) t CAH (11) t ASR (8) V t ASC (10) t CAH (11) COLUMN ADDRESS t CAH (11) COLUMN ADDRESS t RWD (39) COLUMN ADDRESS t CWD (38) t RCS (7) t CWD (38) t RWL (31) t CWL (26) t CWL (26) t CWD (38) t CWL (26) V WE IH V IL t AWD (41) t AWD (41) t AWD (41) t WP (29) t CAA (20) t OAC (17) t WP (29) t WP (29) t OAC (17) t OAC (17) V OE IH V IL t CAP (45) t CAP (45) t CAA (20) t CAA (20) t OED (35) t CAC (18) t RAC (19) t OED (35) t CAC (18) t HZ (22) t HZ (22) t DH (33) t DH (33) t DS (32) t DS (32) I/O V I/OH OUT V I/OL OUT IN t LZ (21) t LZ (21) t OED (35) t CAC (18) t HZ (22) t DH (33) t DS (32) OUT IN IN 8125H 10 t LZ (21) Waveforms of RAS-Only Refresh Cycle t RC (2) RAS t RAS (1) V IH t RP (3) V IL t CRP (13) CAS V IH V IL t ASR (8) ADDRESS V IH t RAH (9) ROW ADDR V IL 8125H 11 NOTE: WE, OE = Donít care Donít Care V53C8125H Rev. 1.7 August 1998 11 Undefined V53C8125H MOSEL VITELIC Waveforms of CAS-before-RAS Refresh Counter Test Cycle t RAS (1) RAS t RP (3) V IH V IL t CSR (47) CAS ADDRESS t CHR (49) t RSH (W)(25) t CAS (5) t CP (43) V IH V IL V IH V IL READ CYCLE WE t RRH (15) t RCH (14) t RCS (7) V IH V IL t ROH (16) t OAC (17) OE V IH V IL t HZ (22) t HZ (22) t LZ (21) I/O V IH DOUT V IL t RWL (31) t CWL (26) WRITE CYCLE WE OE V IL V IH V IL t I/O t WCH (28) t WCS (27) V IH DS (32) V IH t DH (33) D IN V IL 8125H 12 Waveforms of CAS-before-RAS Refresh Cycle t RC (2) t RP (3) RAS t RAS (1) t RP (3) V IH V IL t RPC (48) t CP (43) t CHR (49) t CSR (47) CAS V IH V IL t HZ (22) I/O V OH V OL 8125H 13 NOTE: WE, OE, A 0 ñA 7 = Donít care Donít Care V53C8125H Rev. 1.7 August 1998 12 Undefined V53C8125H MOSEL VITELIC Waveforms of Hidden Refresh Cycle (Read) t RC (2) RAS V IH t RSH (R)(12) t CRP (13) V IL V IH t RAD (24) t ASC (10) t CAH (11) COLUMN ADDRESS ROW ADD V IL t RCS (7) WE t CHR (49) V IH t ASR (8) t RAH (9) ADDRESS t RP (3) t RAS (1) V IL t RCD (6) t CRP (13) CAS t RC (2) tRP (3) t RAS (1) t AR (23) t RRH (15) V IH V IL t CAA (20) t OAC (17) OE V IH V IL t CAC (18) t LZ (21) t RAC (19) t HZ (22) t HZ (22) V OH I/O VALID DATA V OL 8125H 14 Waveforms of Hidden Refresh Cycle (Write) t RC (2) V IH RAS t RAS (1) t RP (3) V IL t RCD (6) t CRP (13) CAS t RC (2) t RP (3) t RAS (1) t AR (23) t RSH (12) t CHR (49) t CRP (13) V IH V IL t RAD (24) t ASC (10) t ASR (8) t RAH (9) ADDRESS V IH V IL t CAH (11) ROW ADD COLUMN ADDRESS t WCH (28) t WCS (27) WE V IH V IL OE V IH V IL t DS (32) I/O V IH V IL t DH (33) VALID DATA-IN t DHR (46) 8125H 15 Donít Care V53C8125H Rev. 1.7 August 1998 13 Undefined V53C8125H MOSEL VITELIC Functional Description Refresh Cycle The V53C8125H is a CMOS dynamic RAM optimized for high data bandwidth, low power applications. It is functionally similar to a traditional dynamic RAM. The V53C8125H reads and writes data by multiplexing an 17-bit address into a 8-bit row and an 9-bit column address. The row address is latched by the Row Address Strobe (RAS). The column address ìflows throughî an internal address buffer and is latched by the Column Address Strobe (CAS). Because access time is primarily dependent on a valid column address rather than the precise time that the CAS edge occurs, the delay time from RAS to CAS has little effect on the access time. To retain data, 256 Refresh Cycles are required in each 8 ms period. There are two ways to refresh the memory: 1. 2. Memory Cycle A memory cycle is initiated by bringing RAS low. Any memory cycle, once initiated, must not be ended or aborted before the minimum tRAS time has expired. This ensures proper device operation and data integrity. A new cycle must not be initiated until the minimum precharge time tRP/tCP has elapsed. By clocking each of the 512 row addresses (A0 through A8) with RAS at least once every 8 ms. Any Read, Write, Read-Modify-Write or RASonly cycle refreshes the addressed row. Using a CAS-before-RAS Refresh Cycle. If CAS makes a transition from low to high to low after the previous cycle and before RAS falls, CAS-before-RAS refresh is activated. The V53C8125H uses the output of an internal 9-bit counter as the source of row addresses and ignore external address inputs. CAS-before-RAS is a ìrefresh-onlyî mode and no data access or device selection is allowed. Thus, the output remains in the High-Z state during the cycle. A CAS-before-RAS counter test mode is provided to ensure reliable operation of the internal refresh counter. Read Cycle Fast Page Mode Operation A Read cycle is performed by holding the Write Enable (WE) signal High during a RAS/CAS operation. The column address must be held for a minimum specified by tAR. Data Out becomes valid only when tOAC, tRAC, tCAA and tCAC are all satisifed. As a result, the access time is dependent on the timing relationships between these parameters. For example, the access time is limited by tCAA when tRAC, tCAC and tOAC are all satisfied. Fast Page Mode operation permits all 256 columns within a selected row of the device to be randomly accessed at a high data rate. Maintaining RAS low while performing successive CAS cycles retains the row address internally and eliminates the need to reapply it for each cycle. The column address buffer acts as a transparent or flow-through latch while CAS is high. Thus, access begins from the occurrence of a valid column address rather than from the falling edge of CAS, eliminating tASC and tT from the critical timing path. CAS latches the address into the column address buffer and acts as an output enable. During Fast Page Mode operation, Read, Write, Read-Modify-Write or ReadWrite-Read cycles are possible at random addresses within a row. Following the initial entry cycle into Fast Page Mode, access is tCAA or tCAP controlled. If the column address is valid prior to the rising edge of CAS, the access time is referenced to the CAS rising edge and is specified by tCAP. If the column address is valid after the rising CAS edge, access is timed from the occurrence of a valid address and is specified by tCAA. In both cases, the falling edge of CAS latches the address and enables the output. Write Cycle A Write Cycle is performed by taking WE and CAS low during a RAS operation. The column address is latched by CAS. The Write Cycle can be WE controlled or CAS controlled depending on whether WE or CAS falls later. Consequently, the input data must be valid at or before the falling edge of WE or CAS, whichever occurs last. In the CAScontrolled Write Cycle, when the leading edge of WE occurs prior to the CAS low transition, the I/O data pins will be in the High-Z state at the beginning of the Write function. Ending the Write with RAS or CAS will maintain the output in the High-Z state. In the WE controlled Write Cycle, OE must be in the high state and tOED must be satisfied. V53C8125H Rev. 1.7 August 1998 14 V53C8125H MOSEL VITELIC Power-On Fast Page Mode provides sustained data rates up to 53 MHz for applications that require high data rates such as bit-mapped graphics or high-speed signal processing. The following equation can be used to calculate the maximum data rate: After application of the VCC supply, an initial pause of 200 µs is required followed by a minimum of 8 initialization cycles (any combination of cycles containing a RAS clock). Eight initialization cycles are required after extended periods of bias without clocks (greater than the Refresh Interval). During Power-On, the VCC current requirement of the V53C8125H is dependent on the input levels of RAS and CAS. If RAS is low during Power-On, the device will go into an active cycle and IDD will exhibit current transients. It is recommended that RAS and CAS track with VCC or be held at a valid VIH during Power-On to avoid current surges. 256 Data Rate = ---------------------------------------t RC + 255 × t PC Data Output Operation The V53C8125H Input/Output is controlled by OE, CAS, WE and RAS. A RAS low transition enables the transfer of data to and from the selected row address in the Memory Array. A RAS high transition disables data transfer and latches the output data if the output is enabled. After a memory cycle is initiated with a RAS low transition, a CAS low transition or CAS low level enables the internal I/O path. A CAS high transition or a CAS high level disables the I/O path and the output driver if it is enabled. A CAS low transition while RAS is high has no effect on the I/O data path or on the output drivers. The output drivers, when otherwise enabled, can be disabled by holding OE high. The OE signal has no effect on any data stored in the output latches. A WE low level can also disable the output drivers when CAS is low. During a Write cycle, if WE goes low at a time in relationship to CAS that would normally cause the outputs to be active, it is necessary to use OE to disable the output drivers prior to the WE low transition to allow Data In Setup Time (tDS) to be satisfied. V53C8125H Rev. 1.7 August 1998 Table 1. V53C8125H Data Output Operation for Various Cycle Types 15 Cycle Type I/O State Read Cycles Data from Addressed Memory Cell CAS-Controlled Write Cycle (Early Write) High-Z WE-Controlled Write Cycle (Late Write) OE Controlled. High OE = High-Z I/Os Read-Modify-Write Cycles Data from Addressed Memory Cell Fast Page Mode Read Data from Addressed Memory Cell Fast Page Mode Write Cycle (Early Write) High-Z Fast Page Mode Read-ModifyWrite Cycle Data from Addressed Memory Cell RAS-only Refresh High-Z CAS-before-RAS Refresh Cycle Data remains as in previous cycle CAS-only Cycles High-Z V53C8125H MOSEL VITELIC Package Diagrams 26/24-pin 300 mil SOJ 0.332 ñ 0.342 [8.43 ñ 8.69] Unit in inches [mm] 0.296 ñ 0.304 [7.52 ñ 7.72] 0.665 ñ 0.698 [16.89 ñ 17.73] 0.125 ñ 0.135 [3.175 ñ 3.429] 0.082 ñ 0.093 [2.08 ñ 2.36] 0.028 Typ. [0.711 Typ.] 0.05 Typ. [1.27 Typ.] 0.018 Typ. [0.457 Typ.] 0.025 Min. [0.635 Min.] 0.255 ñ 0.275 [6.477 ñ 6.985] 28-pin TSOP-I Unit in inches .035 ñ .043 Detail ì Aî .520 ñ .535 .039 DIA. Pin # 1 I.D. .004 .047 .461 ñ .469 .035 ñ .043 .000 .079 DIA. x .004 Deep Fixed Pin (1 Plcs.) .002 ñ .006 .022 .311 ñ .319 .022 C.O.O. denotes country of orgin .055 ñ .063 .010 Top View .022 Bottom View See Detail ìBî .055 ñ .063 D .037 ñ .041 See Detail ìAî D .007 ñ .011 .007 ñ .009 .08 ñ .20 0∞ñ 6∞ Gage Plane .012 MAX .004 ñ .008 With Plating .020 ñ .028 Base Metal .004 ñ .006 Detail ì Aî Section ì D-Dî V53C8125H Rev. 1.7 August 1998 16 0.25 BSC Detail ì Bî MOSEL VITELIC WORLDWIDE OFFICES V53C8125H U.S.A. TAIWAN JAPAN 3910 NORTH FIRST STREET SAN JOSE, CA 95134 PHONE: 408-433-6000 FAX: 408-433-0185 7F, NO. 102 MIN-CHUAN E. ROAD, SEC. 3 TAIPEI PHONE: 886-2-2545-1213 FAX: 886-2-2545-1209 WBG MARINE WEST 25F 6, NAKASE 2-CHOME MIHAMA-KU, CHIBA-SHI CHIBA 261-71 PHONE: 81-43-299-6000 FAX: 81-43-299-6555 HONG KONG 19 DAI FU STREET TAIPO INDUSTRIAL ESTATE TAIPO, NT, HONG KONG PHONE: 852-2665-4883 FAX: 852-2664-7535 1 CREATION ROAD I SCIENCE BASED IND. PARK HSIN CHU, TAIWAN, R.O.C. PHONE: 886-3-578-3344 FAX: 886-3-579-2838 GERMANY (CONTINENTAL EUROPE & ISRAEL ) 71083 HERRENBERG BENZSTR. 32 GERMANY PHONE: +49 7032 2796-0 FAX: +49 7032 2796 22 IRELAND & UK BLOCK A UNIT 2 BROOMFIELD BUSINESS PARK MALAHIDE CO. DUBLIN, IRELAND PHONE: +353 1 8038020 FAX: +353 1 8038049 U.S. SALES OFFICES NORTHWESTERN SOUTHWESTERN CENTRAL & SOUTHEASTERN 3910 NORTH FIRST STREET SAN JOSE, CA 95134 PHONE: 408-433-6000 FAX: 408-433-0185 SUITE 200 5150 E. PACIFIC COAST HWY. LONG BEACH, CA 90804 PHONE: 562-498-3314 FAX: 562-597-2174 604 FIELDWOOD CIRCLE RICHARDSON, TX 75081 PHONE: 972-690-1402 FAX: 972-690-0341 NORTHEASTERN SUITE 436 20 TRAFALGAR SQUARE NASHUA, NH 03063 PHONE: 603-889-4393 FAX: 603-889-9347 © Copyright 1998, MOSEL VITELIC Inc. The information in this document is subject to change without notice. MOSEL VITELIC makes no commitment to update or keep current the information contained in this document. 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