ZETEX ZXMN6A09G

ZXMN6A09G
60V N-CHANNEL ENHANCEMENT MODE MOSFET
SUMMARY
V(BR)DSS= 60V; RDS(ON)= 0.045
ID= 5.1A
DESCRIPTION
This new generation of TRENCH MOSFETs from Zetex utilizes a unique structure
that combines the benefits of low on-resistance with fast switching speed. This
makes them ideal for high efficiency, low voltage, power management applications.
FEATURES
SOT223
• Low on-resistance
• Fast switching speed
• Low threshold
• Low gate drive
• Low profile SOIC package
APPLICATIONS
• DC - DC Converters
• Power Management Functions
• Relay and Solenoid driving
• Motor control
ORDERING INFORMATION
DEVICE
REEL
SIZE
TAPE
WIDTH
QUANTITY
PER REEL
ZXMN6A09GTA
7”
12mm
1000 units
ZXMN6A09GTC
13”
12mm
4000 units
DEVICE MARKING
• ZXMN
6A09
Top View
PROVISIONAL ISSUE D - SEPTEMBER 2003
1
SEMICONDUCTORS
ZXMN6A09G
ABSOLUTE MAXIMUM RATINGS.
PARAMETER
SYMBOL
Drain-Source Voltage
V DSS
LIMIT
60
UNIT
V
Gate Source Voltage
V GS
⫾20
V
Continuous Drain Current (V GS =10V; T A =25°C) (b)
(V GS =10V; T A =70°C) (b)
(V GS =10V; T A =25°C) (a)
ID
6.9
5.6
5.0
A
Pulsed Drain Current (c)
I DM
30.6
A
Continuous Source Current (Body Diode) (b)
IS
3.5
A
Pulsed Source Current (Body Diode) (c)
I SM
30.6
A
Power Dissipation at T A =25°C (a)(d)
Linear Derating Factor
PD
2.0
16
W
mW/°C
Power Dissipation at T A =25°C (b)(d)
Linear Derating Factor
PD
3.9
31
W
mW/°C
Operating and Storage Temperature Range
T j :T stg
-55 to +150
°C
VALUE
UNIT
THERMAL RESISTANCE
PARAMETER
SYMBOL
Junction to Ambient
(a)(d)
R θJA
62.5
°C/W
Junction to Ambient
(b)(d)
R θJA
32.2
°C/W
NOTES
(a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions
(b) For a device surface mounted on FR4 PCB measured at t⭐5 secs.
(c) Repetitive rating 25mm x 25mm FR4 PCB, D=0.02 pulse width=300µs - pulse width limited by maximum junction temperature.
PROVISIONAL ISSUE D - SEPTEMBER 2003
SEMICONDUCTORS
2
ZXMN6A09G
CHARACTERISTICS
PROVISIONAL ISSUE D - SEPTEMBER 2003
3
SEMICONDUCTORS
ZXMN6A09G
ELECTRICAL CHARACTERISTICS (at TA = 25°C unless otherwise stated).
PARAMETER
SYMBOL MIN.
TYP.
MAX.
UNIT CONDITIONS
STATIC
Drain-Source Breakdown Voltage
V (BR)DSS 60
Zero Gate Voltage Drain Current
I DSS
Gate-Body Leakage
I GSS
Gate-Source Threshold Voltage
V GS(th)
Static Drain-Source On-State Resistance
(1)
R DS(on)
Forward Transconductance (3)
g fs
Input Capacitance
V
I D =250µA, V GS =0V
1
µA
V DS =60V, V GS =0V
100
nA
V GS =±20V, V DS =0V
V
I =250µA, VDS= VGS
D
Ω
Ω
V GS =10V, I D =8.2A
V GS =4.5V, I D =7.4A
15
S
V DS =15V,I D =8.2A
C iss
1407
pF
Output Capacitance
C oss
121
pF
Reverse Transfer Capacitance
C rss
59
pF
Turn-On Delay Time
t d(on)
4.9
ns
Rise Time
tr
5.0
ns
Turn-Off Delay Time
t d(off)
25.3
ns
Fall Time
tf
4.6
ns
Gate Charge
Qg
12.4
nC
Total Gate Charge
Qg
24.2
nC
Gate-Source Charge
Q gs
5.2
nC
Gate-Drain Charge
Q gd
3.5
nC
Diode Forward Voltage (1)
V SD
0.85
Reverse Recovery Time (3)
t rr
Reverse Recovery Charge (3)
Q rr
1.0
0.045
0.070
DYNAMIC (3)
V DS =40 V, V GS =0V,
f=1MHz
SWITCHING(2) (3)
V DD =15V, I D =3.5A
R G ≅6.0Ω, V GS =10V
(refer to test
circuit)
V DS =15V,V GS =5V,
I D =3.5A
V DS =15V,V GS =10V,
I D =3.5A
SOURCE-DRAIN DIODE
0.95
V
T J =25°C, I S =6.6A,
V GS =0V
26.3
ns
T J =25°C, I F =3.5A,
di/dt= 100A/µs
26.6
nC
NOTES
(1) Measured under pulsed conditions. Width=300µs. Duty cycle ≤ 2% .
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
PROVISIONAL ISSUE D - SEPTEMBER 2003
SEMICONDUCTORS
4
ZXMN6A09G
TYPICAL CHARACTERISTICS
PROVISIONAL ISSUE D - SEPTEMBER 2003
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SEMICONDUCTORS
ZXMN6A09G
PROVISIONAL ISSUE D - SEPTEMBER 2003
SEMICONDUCTORS
6
ZXMN6A09G
PACKAGE OUTLINE
PAD LAYOUT DETAILS
4.6
2.0 min
(3x)
2.3
1.5 min
(3x)
6.8
2.0 min
3.8 min
PACKAGE DIMENSIONS
MILLIMETRES
DIM
MILLIMETRES
DIM
MIN
MAX
ᎏ
1.80
D
A1
0.02
0.10
e
2.30 BASIC
A2
1.55
1.65
e1
4.60 BASIC
b
0.66
0.84
E
6.70
7.30
b2
2.90
3.10
E1
3.30
3.70
C
0.23
0.33
L
0.90
ᎏ
A
MIN
MAX
6.30
6.70
© Zetex plc 2003
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PROVISIONAL ISSUE D - SEPTEMBER 2003
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SEMICONDUCTORS