UTC-IC MJE13002

UTC MJE13002 NPN EPITAXIAL SILICON TRANSISTOR
NPN SILICON POWER TRANSISTOR
The UTC MJE13002 designed for use in high–volatge,high
speed,power switching in inductive circuit, It is particularly suited
for 115 and 220V switchmode applications such as switching
regulator’s,inverters,DC-DC converter,Motor control,
Solenoid/Relay drivers and deflection circuits.
FEATURES
*Collector-Emitter Sustaining Voltage:
VCEO (sus)=300V.
*Collector-Emitter Saturation Voltage:
VCE(sat)=1.0V(Max.) @Ic=1.0A, IB =0.25A
*Switch Time- tf =0.7μs(Max.) @Ic=1.0A.
1
TO-126
1: BASE
2:COLLECTOR
3: EMITTER
ABSOLUTE MAXIMUM RATINGS
PARAMETER
Collector-Emitter Voltage
Collector-Emitter Voltage
Emitter Base Voltage
Collector Current- Continuous
- Peak (1)
Base Current – Continuous
- Peak (1)
Emitter Current – Continuous
- Peak (1)
Total Power Dissipation @ TA=25℃
Derate above 25℃
Total Power Dissipation @ TC=25℃
Derate above 25℃
Operating and Storage Junction
Temperature Range
SYMBOL
RATING
UNIT
VCEO (sus)
VCEV
VEBO
Ic
ICM
IB
IBM
IE
IEM
PD
300
600
9
1.5
3
0.75
1.5
2.25
4.5
V
V
1.4
11.2
Watts
MW/℃
PD
40
320
Tj , Tstg
-65 to +150
Watts
MW/℃
℃
V
A
A
A
THERMAL CHARACTERISTICS
CHARACTERISTIC
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Ambient
Maximum Load Temperature for Soldering Purposes:
1/8” from Case for 5 Seconds
(1) Pulse Test : Pulse Width=5ms,Duty Cycle≤10%
UTC
SYMBOL
MAX
UNIT
RθJC
RθJA
TL
3.12
89
275
℃/W
℃/W
℃
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UTC MJE13002 NPN EPITAXIAL SILICON TRANSISTOR
Designer 's Data for “Worst Case” Conditions – The Designer 's Data Sheet permits the design of most circuits
entirely from the information presented. SOA Limit curves – representing boundaries on device characteristics – are
given to facilitate “Worst case” design.
ELECTRICAL CHARACTERISTICS (Tc=25℃
unless otherwise noted)
CHARACTERISTIC
OFF CHARACTERISTICS (1)
Collector-Emitter Sustaining Voltage
(Ic=10 mA , IB=0)
Collector Cutoff Current
(VCEV=Rated Value, VBE (off)=1.5 V)
(VCEV=Rated Value, VBE(off)=1.5V,Tc=100℃)
SYMBOL
MIN
VCEO(SUS)
300
TYP
MAX
V
ICEV
Emitter Cutoff Current
(VEB=9 V, Ic=0)
SECOND BREAKDOWN
Second Breakdown Collector Current with bass forward biased
mA
1
5
1
IEBO
Is/b
hFE1
hFE2
mA
See Figure 10
See Figure 11
RBSOA
Clamped Inductive SOA with base reverse biased
ON CHARACTERISTICS (1)
DC Current Gain
(Ic=0.5 A, VCE=2 V)
(Ic=1 A, VCE=2 V)
Collector-Emitter Saturation Voltage
(Ic=0.5A,IB=0.1A)
(Ic=1A,IB=0.25A)
(Ic=1.5A,IB=0.5A)
(Ic=1A,IB=0.25A,Tc=100℃)
Base-Emitter Saturation Voltage
(Ic=0.5A,IB=0.1A)
(Ic=1A,IB=0.25 A)
(Ic=1A,IB=0.25A,Tc=100℃)
UNIT
8
5
40
25
VCE(sat)
V
0.5
1
3
1
VBE(sat)
V
1
1.2
1.1
DYNAMIC CHARACTERISTICS
Current-Gain-Bandwidth Product
(Ic=100mA,VCE=10 V, f=1MHz)
Output Capacitance
(VCB=10V,IE=0,f=0.1MHz)
SWITCHING CHARACTERISTICS(TABLE 1)
Delay Time
(Vcc=125V,Ic=1A,
Rise Time
IB1=IB2=0.2A,tp=25μs,
Storage Time
Duty Cycle≤1%)
Fall Time
10
MHz
Cob
21
pF
td
0.05
0.5
2
0.4
0.1
1
4
0.7
μs
μs
μs
μs
1.7
0.29
0.15
4
0.75
μs
μs
μs
fT
tr
ts
tf
INDUCTIVE LOAD, CLAMPED (TABLE 1,FIGURE 12)
Storage Time
(Ic=1A,Vclamp=300V,
Crossover Time
IB1=0.2A,VBE(off)=5V,Tc=100℃)
Fall Time
tsv
tc
tfi
4
(1) Pulse Test : PW=300μs, Duty Cycle≤2%
CLASSIFICATION OF HFE1
RANK
RANGE
UTC
A
8 ~ 16
B
15 ~ 21
C
20 ~ 26
D
25 ~ 31
UNISONIC TECHNOLOGIES
E
30 ~ 36
F
35 ~ 40
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UTC MJE13002 NPN EPITAXIAL SILICON TRANSISTOR
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 2. Collector Saturation Region
VCE,COLLECTOR -EMITTER VOLTAGE (VOLTS)
Figure 1. DC Current Gain
80
60
Tj=150℃
hFE,DC CURRENT GAIN
40
25℃
30
20
-55℃
10
8
VCE=2V
- - - - - -VCE=5V
6
4
0.02 0.03 0.05 0.07 0.1
0.2
0.3
0.5 0.7
2
Tj=25℃
1.6
0.4
0
0.02
0.05 0.01
0.1
0.2
0.5
VBE(sat)@IC/IB=3
- - - - - - VBE(on)@VCE=2V
V,VOLTAGE (VOLTS)
25℃
0.8
25℃
0.6
150℃
0.4
0.02 0.03
0.05 0.07 0.1
0.2
0.3
0.25
IC/IB=3
Tj=-55℃
0.2
25℃
0.15
0.1
150℃
0.05
0.5 0.7 1
0
0.02 0.03
2
IC, COLLECTOR CURRENT (AMP)
0.05 0.07 0.1
VCE=250V
200
V,VOLTAGE (VOLTS)
125℃
100℃
1
10
75℃
50℃
Cib
100
70
50
30
20
0
10
REVERSE
-0.2
FORWARD
0
+0.2
+0.4
VBE,BASE-EMITTER VOLTAGE (VOLTS)
UTC
Cob
10
25℃
-0.4
2
300
Tj=150℃
2
0.5 0.7 1
500
3
10
0.3
Figure 6. Capacitance
Figure 5. Collector Cutoff Region
4
0.2
IC, COLLECTOR CURRENT (AMP)
10
-1
2
0.3
Tj=-55℃
1
10
1
0.35
1.2
V,VOLTAGE (VOLTS)
0.05
Figure 4. Collector-Emitter Saturation Region
Figure 3. Base-Emitter Voltage
1.4
IC,COLLECTOR CURRENT (米A)
0.02
IB, BASE CURRENT (AMP)
IC , COLLECTOR CURRENT (AMP)
10
1.5A
1A
0.8
2
1
Ic=0.1A 0.3A 0.5A
1.2
+0.
6
7
5
0.1 0.2
0.5 1
2
5
10
20
50
100 200 500
1000
VR,REVERSE VOLTAGE (VOLTS)
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UTC MJE13002 NPN EPITAXIAL SILICON TRANSISTOR
TABLE 1.TEST CONDITIONS FOR DYNAMIC PERFORMANCE
REVERSE BIAS SAFE OPERATING AREA AND INDUCTIVE SWITCHING
+5V
1N4933
Vcc
33
MJE210
L
TEST CIRCUITS
0.001μF
33
pw 5V
68
0.02μF
IB
5.1k
1k
*SELECTED FOR≧1kV
SCOPE
D1
-4.0V
51
T.U.T.
TUT
RB
VCE
2N2905
270
47
1/2W 100
NOTE
PW and Vcc Adjusted for Desired Ic
RB Adjusted for Desired IB1
CIRCUIT
VALUES
Rc
Vclamp
Ic
RB
1k
+5V
1N4933
+125V
MR826*
1N4933
2N2222
1k
DUTY CYCLE≦10%
tr,tf≦10ns
RESISTIVE
SWITHCING
MJE200
-VBE(off)
Coil Data :
FERROXCUBE core #6656
Full Bobbin (-200 Turns) #20
GAP for 30 mH/2 A
Lcoil=50mH
Vcc=125V
Rc=125Ω
D1=1N5820 or
Equiv.
RB=47Ω
Vcc=20V
Vclamp=300V
TEST WAVEFORMS
OUTPUT WAVEFORMS
Ic
tf CLAMPED
Ic(pk)
t
t1
+10.3V
t1 Adjusted to
Obtain Ic
tf
t1=
VCE
VCE or
Vclamp
TIME
t
t2
t2=
Lcoil(Icpk)
Vcc
25μS
0
Test Equipment
Scope-Tektronics
475 or Equivalent
-8.5V
tr,tf<10ns
Duty Cycly=1.0%
RB and Rc adjusted
for desired IB and Ic
Lcoil(Icpk)
Vclamp
TABLE 2.TYPICAL INDUCTIVE SWITCHING PERFORMANCE
Ic
AMP
0.5
Tc
℃
Tsv
Trv
Tfi
Tti
Tc
μs
μs
μs
μs
μs
0.30
0.30
0.14
0.26
0.10
0.22
0.35
0.40
0.05
0.06
0.05
0.08
0.30
0.36
0.16
0.29
0.16
0.28
25
1.3
0.23
100
1.6
0.26
1
25
1.5
0.10
100
1.7
0.13
1.5
25
1.8
0.07
100
3
0.08
Note: All Data Recorded in the inductive Switching Circuit Table 1
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UTC MJE13002 NPN EPITAXIAL SILICON TRANSISTOR
SWITCHING TIMES NOTE
In resistive switching circuits, rise, fall, and storage times have been defined and apply to both current and voltage
waveforms since they are in phase, However, for inductive loads which are common to SWITCHMODE power
supplies and hammer drivers, current and voltage waveforms are not in phase. Therefore, separate measurements
must be made on each wave form to determine the total switching time, For this reason, the following new terms
have been defined.
tsv=Voltage Storage Time, 90% IB1 to 10% Vclamp
trv=Voltage Rise Time, 10-90% Vclamp
tfi=Current Fall Time, 90-10% Ic
tti=Current Tail, 10-2% Ic
tc=Crossover Time, 10% Vclamp to 10% IC
An enlarged portion of the inductive switching waveforms is shown in Figure 7 to aid in the visual identity of these
terms.
For the designer, there is minimal switching loss during storage time and the predominant switching power losses
occur during the crossover interval and can be obtained using the standard equation from AN-222:
PSWT=1/2 VccIc (tc)f
In general, trv + tfi≒tc. However, at lower test currents this relationship may not be valid.
As is common with most switching transistor, resistive switching is specified at 25℃ and has become a benchmark
for designers. However, for designers of high frequency converter circuits, the user oriented specifications which
make this a “SWITCHMODE” transistor are the inductive switching speeds (tc and tsv) which are guaranteed at 100
℃
SAFE OPERATING AREA INFORMATION
FORWARD BIAS
There are two limitations on the power handling ability of a transistor: average junction temperature and second
break-down. Safe operating area curves indicate Ic – VCE limits of the transistor that must be observed for reliable
operation; i.e., the transistor must not be subjected to greater dissipation than the curves indicate.
The data of Figure 10 is based on Tc=25℃; TJ(pk) is variable depending on power level. Second breakdown
pulse limits are valid for duty cycles to 10% but must be derated when Tc≧25℃. Second breakdown limitations do
not derate the same as thermal limitations. Allowable current at the voltages shown on Figure 10 may be found at
any case tem-perature by using the appropriate curve on Figure 12.
TJ(pk) may be calculated from the data in Figure 10. At high case temperatures, thermal limitations will reduce
the power that can be handled to values less than the limitations imposed by second breakdown.
REVERSE BIAS
For inductive loads, high voltage and high current must be sustained simultaneously during turn–off, in most
cases, with the base to emitter junction reverse biased. Under these conditions the collector voltage must be held to
a safe level at or below a specific value of collector current. This can be accomplished by several means such as
active clamping, RC snubbing, load line shaping, etc. The safe level for these devices is specified as Reverse Bias
Safe Operating Area and represents the voltage–current conditions during re-verse biased turn–off. This rating is
verified under clamped conditions so that the device is never subjected to an ava-lanche mode. Figure 11 gives
RBSOA characteristics.
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UTC MJE13002 NPN EPITAXIAL SILICON TRANSISTOR
Figure 7. Inductive Switching Measurements
Vclamp
90% Vclamp
1
0.7
90% Ic
trv
0.5
tti
tfi
t,TIME(米S)
tsv
Ic
Figure 8. Turn-On Time
2
ICPK
tc
VCE
10% Vclamp
IB
10%
ICPK
90% IB1
Vcc=125V
Ic/IB=5
TJ=25℃
tr
0.3
0.2
td @ VBE(off)=5V
0.1
0.07
2% IC
0.05
0.03
0.02
0.02 0.03
TIME
Ic,COLLECTOR CURRENT (AMP)
t,TIME(米S)
3
1
0.7
0.5
tr
0.2
1
0
20
10μS
2
100μS
1
5.0ms
0.2
0.1
0.05
1.0ms
dc
0.5
Tc=25℃
THERMAL LIMIT (SINGLE PULSE)
BONDING WIRE LIMIT
SECOND BREAKDOWN LIMIT
CURVES APPLY BELOW RATED VCEO
0.02
0.1
0.02 0.03
0.05 0.07 0.1
0.2
0.3
0.0
1 5
2
0.5 0.7 1
IC, COLLECTOR CURRENT (AMP)
20
10
Figure 11. Reverse Bias Safe Operating Area
POWER DERATING FACTOR
1.2
VBE(off)=9V
Tj≦100℃
IB1=1A
5V
0.4
200
500
300
Figure 12. Forward Bias Power Derating
1
0.8
100
50
VCE,COLLECTOR-EMITTERVOLTAGE (VOLTS)
1.6
V,VOLTAGE (VOLTS)
0.5 0.7
5
2
0.3
0.3
10
Vcc=125V
Ic/IB=5
TJ=25℃
ts
5
0.2
Figure 10. Active Region Safe Operating Area
Figure 9. Turn-Off Time
10
7
0.05 0.07 0.1
IC, COLLECTOR CURRENT (AMP)
SECOND BREAKDOWN
DERATING
0.8
0.6
THERMAL
DERATING
0.4
0.2
3V
1.5V
0
0
100
200
30
0
40
0
0
500
600
700
800
VCEV,COLLECTOR-EMITTER LAMP VOLTAGE(VOLTS)
UTC
20
40
60
80
100
120
140
160
IC, CASE TEMPERATURE (℃)
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UTC MJE13002 NPN EPITAXIAL SILICON TRANSISTOR
Figure 13. Thermal Response
r(t),EFFECTIVE TRANSIENT THERMAL
RESISTANCE (NORMALIZED)
1
0.7
D=0.5
0.5
0.3
0.2
0.1
0.07
0.05
0.2
0.1
0.02
0.01
0.03
0.02
0.01
0.01
ZθJC(t)=r(t) RθJC
RθJC=3.12℃/W MAX
D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t1
TJ(pk)-TC=P(pk) RθJC(t)
0.05
SINGLE PULSE
0.02 0.03
0.05
0.1
0.2 0.3
0.5
1
2
3
5
10
20
50
P (PK)
t1
t2
DUTY CYCLE,D=t1/t2
100
200
500
1000
IC, COLLECTOR CURRENT (AMP)
UTC assumes no responsibility for equipment failures that result from using products at values that
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or
other parameters) listed in products specifications of any and all UTC products described or contained
herein. UTC products are not designed for use in life support appliances, devices or systems where
malfunction of these products can be reasonably expected to result in personal injury. Reproduction in
whole or in part is prohibited without the prior written consent of the copyright owner. The information
presented in this document does not form part of any quotation or contract, is believed to be accurate
and reliable and may be changed without notice.
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