VS-FA72SA50LC Datasheet

VS-FA72SA50LC
www.vishay.com
Vishay Semiconductors
Power MOSFET, 72 A
FEATURES
•
•
•
•
•
•
•
SOT-227
Fully isolated package
Easy to use and parallel
Low on-resistance
Dynamic dV/dt rating
Fully avalanche rated
Simple drive requirements
Low gate charge device
• Low drain to case capacitance
• Low internal inductance
• UL approved file E78996
• Designed for industrial level
• Material categorization: for definitions of compliance
please see www.vishay.com/doc?99912
PRODUCT SUMMARY
VDSS
500 V
RDS(on)
0.0615 
ID
72 A
Type
Modules - MOSFET
Package
SOT-227

DESCRIPTION
Third Generation Power MOSFETs from Vishay
Semiconductors provide the designer with the best
combination of fast switching, ruggedized device design,
low on-resistance and cost-effectiveness.
The SOT-227 package is universally preferred for all
commercial-industrial applications at power dissipation
levels to approximately 600 W to 1000 W. The low thermal
resistance of the SOT-227 contribute to its wide acceptance
throughout the industry.
ABSOLUTE MAXIMUM RATINGS
PARAMETER
Continuous drain current at VGS 10 V
Pulsed drain current
Power dissipation
Gate to source voltage
SYMBOL
ID
TEST CONDITIONS
TC = 25 °C
TC = 90 °C
IDM (1)
PD
MAX.
UNITS
72
52
A
228
TC = 25 °C
1136
TC = 90 °C
545
W
VGS
± 20
V
Single pulse avalanche energy
EAS (2)
725
mJ
Repetitive avalanche current
IAR (1)
22
A
Repetitive avalanche energy
EAR (1)
120
mJ
Peak diode recovery dV/dt
dV/dt (3)
10
V/ns
Operating junction and storage temperature range
TJ, TStg
-55 to +150
°C
VISO
2.5
kV
1.3
Nm
Insulation withstand voltage (AC-RMS)
Mounting torque
M4 screw, on terminals and heatsink
Notes
(1) Repetitive rating; pulse width limited by maximum junction temperature (see fig. 18)
(2) Starting T = 25 °C, L = 500 μH, R = 2.4 , I
J
g
AS = 57 A (see fig. 18)
(3) I  57 A, dI /dt  200 A/μs, V
SD
F
DD  V(BR)DSS, TJ  150 °C
Revision: 13-Aug-13
Document Number: 94782
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THERMAL - MECHANICAL SPECIFICATIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNITS
°C
TJ, TStg
- 55
-
150
Junction to case
RthJC
-
-
0.11
Case to heatsink
RthCS
-
0.05
-
-
30
-
g
Torque to terminal
-
-
1.1 (9.7)
Nm (lbf.in)
Torque to heatsink
-
-
Junction and storage temperature range
Flat, greased surface
Weight
Mounting torque
Case style
°C/W
1.3 (11.5) Nm (lbf.in)
SOT-227
ELECTRICAL CHARACTERISTICS (TJ = 25 °C unless otherwise noted)
PARAMETER
Drain to source breakdown voltage
Breakdown voltage temperature coefficient
Static drain to source on-resistance
Gate threshold voltage
Forward transconductance
Drain to source leakage current
Gate to source forward leakage
Gate to source reverse leakage
Total gate charge
SYMBOL
V(BR)DSS
V(BR)DSS/TJ
RDS(on) (1)
VGS(th)
gfs
IDSS
IGSS
Qg
Gate to source charge
Qgs
Gate to drain ("Miller") charge
Qgd
Turn-on delay time
td(on)
Rise time
Turn-off delay time
Fall time
Turn-on delay time
Rise time
Turn-off delay time
tr
td(off)
tf
td(on)
tr
td(off)
TEST CONDITIONS
MIN.
TYP.
MAX.
UNITS
500
-
-
V
Reference to 25 °C, ID = 1 mA
-
0.64
-
V/°C
VGS = 10 V, ID = 34 A
-
61.5
80.0
m
VGS = 0 V, ID = 1.0 mA
2.0
3.0
4.0
VDS = VGS, ID = 250 μA, TJ = 125 °C
VDS = VGS, ID = 250 μA
-
1.9
-
VDS = 50 V, ID = 34 A
-
52.5
-
VDS = 500 V, VGS = 0 V
-
0.5
50
VDS = 500 V, VGS = 0 V, TJ = 125 °C
-
30
500
VDS = 500 V, VGS = 0 V, TJ = 150 °C
-
0.2
3.0
VGS = 20 V
-
-
200
VGS = - 20 V
-
-
- 200
ID = 60 A
VDS = 400 V
VGS = 10 V; see fig. 15 and 19 (1)
-
225
338
-
51
77
-
98
147
VDD = 250 V
ID = 60 A
Rg = 2.4
L = 500 μH; diode used: 60APH06
VDD = 250 V
ID = 60 A
Rg = 2.4
L = 500 μH; diode used: 60APH06
-
134
-
-
44
-
-
150
-
-
43
-
-
135
-
-
47
-
-
160
-
Fall time
tf
-
35
-
Internal source inductance
LS
Between lead, and center of die contact
-
5.0
-
VGS = 0 V
VDS = 25 V
f = 1.0 MHz, see fig. 14
-
10 000
-
-
1500
-
-
50
-
Input capacitance
Ciss
Output capacitance
Coss
Reverse transfer capacitance
Crss
V
S
μA
mA
nA
nC
ns
ns
nH
pF
Note
(1) Pulse width  300 μs, duty cycle  2 %
Revision: 13-Aug-13
Document Number: 94782
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SOURCE-DRAIN RATINGS AND CHARACTERISTICS
PARAMETER
SYMBOL
Continuous source current (body diode)
IS
ISM (1)
Pulsed source current (body diode)
TEST CONDITIONS
MIN.
TYP.
MAX.
-
-
72
-
-
228
TJ = 25 °C, IS = 57 A, VGS = 0 V
-
0.9
1.31
TJ = 125 °C, IS = 57 A, VGS = 0 V
-
0.75
-
-
660
-
-
46
-
A
-
15
-
μC
-
880
-
ns
-
50
-
A
-
23
-
μC
D
MOSFET symbol showing
the integral reverse p-n
junction diode.
G
UNITS
A
S
Diode forward voltage
VSD (2)
Reverse recovery time
trr
Reverse recovery current
Irr
Reverse recovery charge
Qrr
Reverse recovery time
trr
Reverse recovery current
Irr
Reverse recovery charge
Qrr
Forward turn-on time
ton
TJ = 25 °C, IF = 50 A, dIF/dt = 100 A/μs (2)
TJ = 125 °C, IF = 50 A, dIF/dt = 100 A/μs (2)
V
ns
Intrinsic turn-on time is negligible (turn-on is dominated by LS + LD)
160
180
140
160
IDS - Drain-Source Current (A)
Allowable Case Temperature (°C)
Notes
(1) Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11)
(2) Pulse width  300 μs, duty cycle  2 %
120
DC
100
80
60
40
20
VGS = 7 V
VGS = 8 V
VGS = 10 V
140
VGS = 12 V
120
VGS = 15 V
100
80
60
VGS = 6 V
VGS = 5 V
40
20
0
0
0
20
40
60
80
0
100
2
IDS - Continuous Drain-Source Current (A)
Fig. 3 - Typical Drain-to-Source Output Characteristics
at TJ = 25 °C
110
100
10
TJ = 25 °C
TJ = 150 °C
1
VGS = 10 V
0.1
0.1
VGS = 7 V
VGS = 8 V
100
TJ = 125 °C
IDS - Drain-to-Source Current (A)
IDS - Continuous Drain-Source Current (A)
Fig. 1 - Maximum DC MOSFET Drain-Source Current IDS (A)
4 6 8 10 12 14 16 18 20
VDS - Drain-to-Source Voltage (V)
90
VGS = 10 V
80
VGS = 12 V
70
VGS = 15 V
60
50
40
VGS = 6 V
VGS = 5 V
30
20
10
0
1.0
VDS - Drain-to-Source Voltage (V)
10
Fig. 2 - Typical Drain-to-Source Output Characteristics
0
2
4 6 8 10 12 14 16 18 20
VDS - Drain-to-Source Voltage (V)
Fig. 4 - Typical Drain-to-Source Current Output Characteristics
at TJ = 125 °C
Revision: 13-Aug-13
Document Number: 94782
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140
80
VGS = 7 V
VGS = 8 V
VGS = 10 V
70
VGS = 12 V
60
VGS = 15 V
IDS - Drain-to-Source Current (A)
90
50
40
30
VGS = 6 V
20
VGS = 5 V
10
IDS - Drain-to-Source Current (A)
100
0
0
2
4 6 8 10 12 14 16 18 20
VDS - Drain-to-Source Voltage (V)
TJ = 125 °C
TJ = 150 °C
60
40
20
TJ = 25 °C
10
180
IDS - Drain-to-Source Current (A)
ID = 60 A
VGS = 10 V
160
140
120
100
80
1
TJ = 150 °C
0.1
TJ = 125 °C
0.01
0.001
TJ = 25 °C
0.0001
60
0.00001
40
0
0
20 40 60 80 100 120 140 160
TJ - Junction Temperature (°C)
100
200
300
400
500
600
VDS - Drain-to-Source Voltage (V)
Fig. 9 - Typical MOSFET Zero Gate Voltage Drain Current
280
5
4.5
240
200
160
TJ = 150 °C
TJ = 25 °C
120
80
TJ = 125 °C
0
VGSTH - Threshold Voltage (V)
RDS(on) - Drain-to-Source On-Resistance (mΩ)
80
Fig. 8 - Typical MOSFET Transfer Characteristics
200
Fig. 6 - Typical Drain-to-Source On-Resistance vs. Temperature
IFSD - Forward Source-to-Drain Current (A)
100
0
2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0 7.5 8.0 8.5 9.0 9.5
VGS - Gate-to-Source Voltage (V)
Fig. 5 - Typical Drain-to-Source Current Output Characteristics
at TJ = 150 °C
40
120
4
TJ = 25 °C
3.5
3
TJ = 125 °C
2.5
2
1.5
TJ = 150 °C
1
0.5
0
0.0
0.5
1.0
1.5
2.0
VFSD - Drain-to-Source Forward Voltage Drop
Characteristics (V)
Fig. 7 - Typical Body Diode Forward Voltage Drop Characteristics
0.20
0.40
0.60
ID (mA)
0.80
1.00
Fig. 10 - Typical MOSFET Threshold Voltage
Revision: 13-Aug-13
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1
td(off)
Switching Time (μs)
Switching time (μs)
1
td(on)
tf
0.1
td(on)
td(off)
tr
0.1
tf
tr
0.01
0.01
0
10
20
30
40
50
60
Drain-to-source current - Ids (A)
70
0
Fig. 11 - Typical MOSFET Switching Time vs. IDS, TJ = 125 °C,
VDD = 250 V, VGS = 10 V, L = 500 μH, RG = 2.4 
Diode used: 60APH06
10
20
30
Rg (Ω)
40
50
60
Fig. 12 - Typical MOSFET Switching Time vs. Rg, TJ = 125 °C,
IDS = 100 A, VDD = 250 V, VGS = 10 V, L = 500 μH
Diode used: 60APH06
Z thJC - Thermal Impedance
Junction to Case (°C/W)
1
0.1
Notes:
PDM
0.75
0.50
0.25
0.1
0.05
0.02
DC
0.01
0.001
0.00001
0.0001
t1
t2
1. Duty Cycle, D =
t1
t2
2. Peak TJ = PDM x ZthJC + TC
0.001
0.01
0.1
1
t 1 - Rectangular Pulse Duration (s)
Fig. 13 - Maximum Thermal Impedance ZthJC Characteristics, MOSFET
VGS
Ciss
Crss
Coss
C - Capacitance (pF)
12 000
20
= 0 V,
f = 1 MHz
= Cgs + Cgd, Cds SHORTED
= Cgd
= Cds + Cgd
V GS - Gate-to-Source Voltage (V)
15 000
Ciss
9000
6000
Coss
3000
Crss
0
ID = 57 A
16
12
8
4
FOR TEST CIRCUIT
SEE FIGURE 19
0
1
10
100
VDS - Drain-to-Source Voltage (V)
Fig. 14 - Typical Capacitance vs. Drain-to-Source Voltage
VDS = 400 V
VDS = 250 V
VDS = 100 V
0
60
120
180
240
300
Q g - Total Gate Charge (nC)
360
Fig. 15 - Typical Gate Charge vs. Gate-to-Source Voltage
Revision: 13-Aug-13
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1000
ID - Drain Current (A)
OPERATION IN THIS AREA LIMITED
BY RDS(on)
100
10 μs
100 μs
10
1 ms
TC = 25 °C
TJ = 150 °C
Single Pulse
1
1
10
10 ms
100
1000
10 000
V DS - Drain-to-Source Voltage (V)
Fig. 16 - Maximum Safe Operating Area
V(BR)DSS
RD
VDS
tp
VGS
D.U.T.
RG
+
- VDD
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
I AS
Fig. 18b - Unclamped Inductive Waveforms
Fig. 17a - Switching Time Test Circuit
VDS
QG
90%
10V
QGS
QGD
VG
0%
GS
td(on)
tr
t d(off)
tf
Charge
Fig. 19a - Basic Gate Charge Waveform
Fig. 17b - Switching Time Waveforms
Current regulator
Same type as D.U.T.
50 KW
.2 µF
12 V
.3 µF
15 V
D.U.T.
L
VDS
+
V
- DS
Driver
VGS
D.U.T
RG
IAS
20 V
tp
+
- VDD
0.01 W
Fig. 18a - Unclamped Inductive Test Circuit
3 mA
A
IG
ID
Current sampling resistors
Fig. 19b - Gate Charge Test Circuit
Revision: 13-Aug-13
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VS-FA72SA50LC
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+
D.U.T.
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
3
+
2
-
-
4
+
1
RG
•
•
•
•
+
dV/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by duty factor "D"
D.U.T. - Device under test
-
VDD
Fig. 19c - Peak Diode Recovery dV/dt Test Circuit
Driver Gate Drive
D=
Period
P.W.
P.W.
Period
VGS=10V
*
D.U.T. ISD Waveform
Reverse
Recovery
Current
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Re-Applied
Voltage
Body Diode
VDD
Forward Drop
Inductor Curent
Ripple ≤ 5%
ISD
* VGS = 5V for Logic Level Devices
Fig. 20 - For N-Channel Power MOSFETs
Revision: 13-Aug-13
Document Number: 94782
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ORDERING INFORMATION TABLE
Device code
VS-
F
A
72
S
A
50
LC
1
2
3
4
5
6
7
8
1
-
Vishay Semiconductors product
2
-
Power MOSFET
3
-
A = Generation 3, MOSFET silicon die
4
-
Current rating (72 = 72 A)
5
-
Single switch
6
-
Package indicator (SOT-227)
7
-
Voltage rating (50 = 500 V)
8
-
LC = Low charge
CIRCUIT CONFIGURATION
CIRCUIT
CIRCUIT
CONFIGURATION CODE
CIRCUIT DRAWING
D (3)
3
(D)
2
(G)
4
(S)
1
(S)
G (2)
S (1-4)
Lead Assignment
Single switch
S
(S)
(D)
4
3
1
2
(S)
(G)
LINKS TO RELATED DOCUMENTS
Dimensions
www.vishay.com/doc?95423
Packaging information
www.vishay.com/doc?95425
Revision: 13-Aug-13
Document Number: 94782
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Outline Dimensions
www.vishay.com
Vishay Semiconductors
SOT-227 Generation II
DIMENSIONS in millimeters (inches)
38.30 (1.508)
37.80 (1.488)
Ø 4.10 (0.161)
Ø 4.30 (0.169)
-A-
4 x M4 nuts
6.25 (0.246)
6.50 (0.256)
12.50 (0.492)
13.00 (0.512)
25.70 (1.012)
24.70 (0.972)
-B-
7.45 (0.293)
7.60 (0.299)
14.90 (0.587)
15.20 (0.598)
R full 2.10 (0.083)
2.20 (0.087)
30.50 (1.200)
29.80 (1.173)
31.50 (1.240)
32.10 (1.264)
4x
2.20 (0.087)
1.90 (0.075)
8.30 (0.327)
7.70 (0.303)
0.25 (0.010) M C A M B M
4.10 (0.161)
4.50 (0.177)
12.30 (0.484)
11.70 (0.460)
-C0.13 (0.005)
25.00 (0.984)
25.50 (1.004)
Note
• Controlling dimension: millimeter
Revision: 02-Aug-12
Document Number: 95423
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Revision: 02-Oct-12
1
Document Number: 91000