ELDRS Report_RH1078MW_Fab Lot WP1630.1.pdf

ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1078MW Dual Precision Op Amp for Linear Technology
Customer: Linear Technology (PO 49797L)
RAD Job Number: 08-127
Part Type Tested: Linear Technology RH1078MW Dual Precision Op Amp
Commercial Part Number: RH1078MW
Traceability Information: Fab #WP1630.1, Wafer 8, Lot #A21527, Date Code 0741A (Obtained from Linear
Technology PO 49797L). See photograph of unit under test in Appendix A.
Quantity of Units: 11 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 control unit.
Serial numbers 520, 521, 522, 523 and 524 were biased during irradiation, serial numbers 525, 527, 528, 530 and
531 were unbiased during irradiation and serial number 532 will be used as the control. See Appendix B for the
radiation bias connection table.
External Traveler: None required
Pre-Irradiation Burn-In: Burn-In performed by Linear Devices prior to receipt by RAD.
TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30, and 50krad(Si)
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations.
Electrical measurements shall be made following each anneal increment.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Hardware: LTS2020 Tester, 2101 Family Board, 0600 Fixture, and RH1078 DUT Card.
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the GB-150 low dose rate Co60 source. Dosimetry performed by CaF TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019.5.
Irradiation and Test Temperature: All irradiations and electrical tests performed at room temperature
controlled to 24°C ± 6°C per MIL STD 883.
ELDRS Test Result: PASSED. All parts met datasheet specifications to
50krad(Si) with no substantial degradation to any measured parameter other
than open loop gain (see text for a discussion of open loop gain)
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ELDRS Report
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could
potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source. For the low dose rate ELDRS testing described in this report, the devices are placed
approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation
Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60
irradiator at RAD’s Longmire Laboratory facility.
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ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
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Colorado Springs, CO 80919
(719) 531-0800
Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately
50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters.
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ELDRS Report
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3.0.
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Radiation Test Conditions
The RH1078MW dual operational amplifier described in this final report was tested using two bias
conditions, statically biased with a split 15V supply and all pins tied to ground, see Appendix A for
details on biasing conditions. These devices were irradiated to a maximum total ionizing dose level of
50krad(Si) with incremental readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within
one hour following the end of each irradiation segment. For intermediate irradiations, the units were
tested and returned to total dose exposure within two hours from the end of the previous radiation
increment. The ELDRS bias board was positioned in the Co-60 cell to provide the required
10mrad(Si)/s and was located inside a lead-aluminum box. The lead-aluminum box is required under
MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted”.
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10.0mrad(Si)/s with a precision of ±5%.
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ELDRS Report
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4.0.
Radiation Assured Devices
5017 N. 30th Street
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Tested Parameters
The following parameters were tested during the course of this work (note that the symbol names, e.g.
AVOL3 and AVOL4 match the worksheet names in the Excel file that contains the raw data and do not
necessarily refer to the channel number for this dual op-amp):
1. Positive Supply Current (ICC)
2. Negative Supply Current (IEE)
3. Input Offset Voltage (VOS1 &VOS2)
4. Input Offset Current (IOS1 & IOS2)
5. + Input Bias Current (IB+1 & IB+2)
6. - Input Bias Current (IB-1 & IB-2)
7. Common Mode Rejection Ratio (CMRR1 & CMRR2)
8. Power Supply Rejection Ratio (PSRR1 & PSRR2)
9. Large Signal Voltage Gain (AVOL 1 &AVOL2)
10. Large Signal Voltage Gain (AVOL3 &AVOL4)
11. VOUT Low (VOUTLOW1 & VOUTLOW2)
12. VOUT Low (VOUTLOW3 & VOUTLOW4)
13. VOUT Low (VOUTLOW5 & VOUTLOW6)
14. VOUT High (VOUTHIGH1 & VOUTHIGH2)
15. VOUT High (VOUTHIGH3 & VOUTHIGH4)
16. +SR (Slew Rate 1 and Slew Rate 2)
17. -SR (Slew Rate 3 and Slew Rate 4)
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per
MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival
probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using
a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a
device to pass the ELDRS testing: following the radiation exposure the unit shall pass the specification
value and the average value for the each device must pass the specification value when the KTL limits
are applied. If either of these conditions is not satisfied following the radiation exposure, then the lot
could be logged as an RLAT failure.
Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
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ELDRS Report
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Radiation Assured Devices
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(719) 531-0800
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each
sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median
Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled “Radiation
Lot Acceptance Testing (RLAT) of the RH1078MW Dual Operational Amplifier for Linear
Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
5.0. ELDRS Test Results
Using the conditions stated above, the RH1078MW devices passed the ELDRS test to 50krad(Si). Most
measured parameters showed no significant degradation with radiation. In several cases, open loop
gain showed substantial degradation with radiation, however in no case was it sufficient to cause the
parameter to exceed the post-irradiation specification (before application of the KTL statistics). Open
loop gain exhibits a very large distribution in the sample population primarily due to an extreme
sensitivity to input conditions. This leads to a very large standard deviation and a statistical error often
greater than the measured value. Since the average value of the units under test was approximately an
order of magnitude higher than the specification value and the KTL statistics is dominated by
measurement precision, we conclude that this lot passes the ELDRS test. If necessary, larger samples
sizes could be used to qualify these parameters using an “attributes” approach. This report also shows
the AVOL data using unit of dB, which helps to remove the measurement error and allow the reader to
better analyze the radiation response.
Figures 5.1 through 5.66 show plots of all the measured parameters versus total ionizing dose. In the
data plots the solid diamonds are the average of the measured data points for the sample irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated in the biased condition while the
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ELDRS Report
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Radiation Assured Devices
5017 N. 30th Street
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(719) 531-0800
shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on
the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
Tables 5.1 through 5.66 show the raw data, averages, standard deviation, +KTL statistics, -KTL
statistics, specification limit and Pass/Fail condition for each parameter. Appendix D provides a list of
all the figures in this results section to facilitate the location of a particular parameter.
As seen clearly in these tables and figures, the pre- and post-irradiation data are well within the
specification even after application of the KTL statistics (with certain exceptions, as noted below). The
control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained under control during the course of the testing.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited
to this approach due to inherent large variations. The parameters measured in this report where the preirradiation KTL values are out of specification include Input Offset Voltage and Power Supply Rejection
Ratio. In both cases these parameters were in specification at the 50krad(Si) read point due to the
“loosening” of the post-irradiation specifications relative to the standard deviation of the sample
population and/or our measurement precision. If necessary, larger samples sizes could be used to
qualify these parameters using an “attributes” approach.
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ELDRS Report
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Radiation Assured Devices
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(719) 531-0800
Tables 5.1 through 5.66
show the raw data, averages,
standard deviation, Ps90%/90%
+KTL statistics,
-KTL
Average Biased
Average Un-Biased
(+KTL) Biased
statistics, specification limit
and
Pass/Fail
condition
for
each
parameter.
Appendix
D
provides
a
list
of
Ps90%/90% (+KTL) Un-Biased
Specification MAX
all the figures in this results section to facilitate the location of a particular parameter.
1.60E-04
Positive Supply Current @+5V (A)
As seen clearly in these tables and figures, the pre- and post-irradiation data are well within the
specification
1.40E-04 even after application of the KTL statistics (with certain exceptions, as noted below). The
control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained under control during the course of the testing.
1.20E-04
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique,
1.00E-04which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited
to this approach due to inherent large variations. The parameters measured in this report where the pre8.00E-05 KTL values are out of specification include Input Offset Voltage, Power Supply Rejection
irradiation
Ratio and Open Loop Gain, where the device exhibits a relatively large distribution in the sample
6.00E-05 and/or an extreme sensitivity to input conditions, resulting in a very large standard deviation
population
and a statistical error often greater than the measured value. If necessary, larger samples sizes could be
used
to qualify these parameters using an “attributes” approach.
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.1. Plot of Positive Supply Current @+5V (A) versus total dose. The data show no significant change
with total dose. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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ELDRS Report
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Radiation Assured Devices
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(719) 531-0800
Table 5.1. Raw data for Positive Supply Current @+5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @+5V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
9.20E-05
8.90E-05
9.60E-05
9.00E-05
1.01E-04
9.50E-05
9.30E-05
9.00E-05
9.10E-05
9.70E-05
9.70E-05
10
9.00E-05
8.60E-05
9.30E-05
8.80E-05
9.90E-05
9.10E-05
9.00E-05
8.70E-05
8.70E-05
9.30E-05
9.80E-05
20
8.50E-05
8.20E-05
9.00E-05
8.50E-05
9.60E-05
8.80E-05
8.60E-05
8.30E-05
8.30E-05
8.90E-05
9.70E-05
30
8.10E-05
8.00E-05
8.60E-05
8.20E-05
9.20E-05
8.40E-05
8.40E-05
8.20E-05
8.10E-05
8.60E-05
9.60E-05
50
7.30E-05
7.00E-05
7.80E-05
7.20E-05
8.60E-05
7.90E-05
7.70E-05
7.50E-05
7.40E-05
7.90E-05
9.70E-05
60
7.40E-05
7.20E-05
7.70E-05
7.40E-05
8.50E-05
7.80E-05
7.80E-05
7.50E-05
7.30E-05
8.10E-05
9.60E-05
70
7.50E-05
7.30E-05
8.00E-05
7.40E-05
8.60E-05
8.20E-05
8.20E-05
7.90E-05
7.90E-05
8.50E-05
9.60E-05
9.36E-05
4.93E-06
1.07E-04
8.01E-05
9.12E-05
5.07E-06
1.05E-04
7.73E-05
8.76E-05
5.50E-06
1.03E-04
7.25E-05
8.42E-05
4.92E-06
9.77E-05
7.07E-05
7.58E-05
6.42E-06
9.34E-05
5.82E-05
7.64E-05
5.13E-06
9.05E-05
6.23E-05
7.76E-05
5.41E-06
9.24E-05
6.28E-05
9.32E-05
8.96E-05
8.58E-05
8.34E-05 7.68E-05
2.86E-06
2.61E-06
2.77E-06
1.95E-06 2.28E-06
1.01E-04
9.68E-05
9.34E-05
8.87E-05 8.31E-05
8.53E-05
8.24E-05
7.82E-05
7.81E-05 7.05E-05
1.50E-04
1.50E-04
1.50E-04
1.50E-04 1.50E-04
PASS
PASS
PASS
PASS
PASS
7.70E-05
3.08E-06
8.55E-05
6.85E-05
1.50E-04
PASS
8.14E-05
2.51E-06
8.83E-05
7.45E-05
1.50E-04
PASS
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Radiation Assured Devices
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Supply Current @+5V (A)
0.00E+00
-2.00E-05
-4.00E-05
-6.00E-05
-8.00E-05
-1.00E-04
-1.20E-04
-1.40E-04
-1.60E-04
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.2. Plot of Negative Supply Current @+5V (A) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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Table 5.2. Raw data for Negative Supply Current @+5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @+5V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
-6.80E-05
-7.50E-05
-7.50E-05
-7.20E-05
-8.20E-05
-7.50E-05
-7.50E-05
-7.80E-05
-5.50E-05
-7.70E-05
-9.40E-05
70
-6.90E-05
-8.20E-05
-7.70E-05
-5.10E-05
-8.30E-05
-8.10E-05
-8.00E-05
-7.80E-05
-7.40E-05
-8.10E-05
-9.40E-05
0
-9.00E-05
-8.70E-05
-9.30E-05
-8.80E-05
-9.90E-05
-9.10E-05
-9.00E-05
-8.70E-05
-8.80E-05
-9.20E-05
-9.30E-05
10
-8.60E-05
-8.30E-05
-9.00E-05
-8.60E-05
-9.60E-05
-8.80E-05
-8.70E-05
-8.50E-05
-8.40E-05
-9.00E-05
-9.30E-05
20
-8.10E-05
-7.90E-05
-8.50E-05
-8.10E-05
-9.20E-05
-8.50E-05
-8.30E-05
-8.00E-05
-7.90E-05
-8.60E-05
-9.30E-05
30
-7.90E-05
-7.60E-05
-8.20E-05
-7.80E-05
-8.90E-05
-8.20E-05
-8.10E-05
-7.80E-05
-7.70E-05
-8.30E-05
-9.40E-05
-9.14E-05
4.83E-06
-7.82E-05
-1.05E-04
-8.82E-05
5.02E-06
-7.44E-05
-1.02E-04
-8.36E-05
5.18E-06
-6.94E-05
-9.78E-05
-8.08E-05 -7.30E-05 -7.44E-05 -7.24E-05
5.07E-06 8.92E-06 5.13E-06 1.32E-05
-6.69E-05 -4.86E-05 -6.03E-05 -3.63E-05
-9.47E-05 -9.74E-05 -8.85E-05 -1.09E-04
-8.96E-05 -8.68E-05 -8.26E-05 -8.02E-05
2.07E-06
2.39E-06
3.05E-06
2.59E-06
-8.39E-05 -8.03E-05 -7.42E-05 -7.31E-05
-9.53E-05 -9.33E-05 -9.10E-05 -8.73E-05
-1.50E-04 -1.50E-04 -1.50E-04 -1.50E-04
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
11
50
-6.10E-05
-8.00E-05
-7.30E-05
-6.80E-05
-8.30E-05
-7.60E-05
-7.50E-05
-7.00E-05
-5.40E-05
-7.70E-05
-9.40E-05
24 hr
Anneal
-7.04E-05
9.56E-06
-4.42E-05
-9.66E-05
-1.50E-04
PASS
-7.20E-05
9.59E-06
-4.57E-05
-9.83E-05
-1.50E-04
PASS
-7.88E-05
2.95E-06
-7.07E-05
-8.69E-05
-1.50E-04
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 1 @ +5V (V)
3.00E-04
2.00E-04
1.00E-04
0.00E+00
-1.00E-04
-2.00E-04
-3.00E-04
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.3. Plot of Input Offset Voltage 1 @ +5V (V) versus total dose. The data show no significant change
with total dose. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
12
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.3. Raw data for Input Offset Voltage 1 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 1 @ +5V (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.65E-05
5.61E-05
4.18E-05
-2.76E-05
-5.72E-05
4.51E-05
1.48E-05
3.97E-05
-1.01E-05
-4.12E-05
-5.15E-05
10
2.54E-06
4.66E-05
3.22E-05
-4.43E-05
-6.69E-05
4.01E-05
3.99E-06
3.14E-05
-2.38E-05
-5.33E-05
-4.70E-05
20
9.77E-06
5.34E-05
3.49E-05
-4.19E-05
-6.15E-05
3.16E-05
-3.51E-06
2.40E-05
-3.14E-05
-6.64E-05
-5.19E-05
30
1.85E-05
6.99E-05
4.17E-05
-2.87E-05
-5.16E-05
3.74E-05
-7.49E-06
2.87E-05
-2.66E-05
-6.93E-05
-4.88E-05
50
2.90E-05
9.56E-05
4.88E-05
-6.53E-06
-3.82E-05
3.65E-05
-1.43E-05
2.72E-05
-2.31E-05
-8.19E-05
-5.09E-05
60
3.01E-05
8.85E-05
4.90E-05
-1.16E-05
-3.77E-05
3.41E-05
-1.73E-05
2.89E-05
-2.03E-05
-8.18E-05
-5.19E-05
70
2.27E-05
8.41E-05
3.26E-05
-1.75E-05
-5.29E-05
3.18E-05
-1.79E-05
2.83E-05
-2.67E-05
-6.64E-05
-5.13E-05
7.91E-06
4.83E-05
1.40E-04
-1.24E-04
-5.97E-06
4.87E-05
1.28E-04
-1.39E-04
-1.07E-06
4.92E-05
1.34E-04
-1.36E-04
9.95E-06 2.57E-05
4.99E-05 5.14E-05
1.47E-04 1.67E-04
-1.27E-04 -1.15E-04
2.37E-05
4.97E-05
1.60E-04
-1.13E-04
1.38E-05
5.20E-05
1.56E-04
-1.29E-04
-1.13E-05
4.68E-05
1.17E-04
-1.40E-04
-2.50E-04
PASS
2.50E-04
PASS
-1.02E-05
4.10E-05
1.02E-04
-1.23E-04
-2.50E-04
PASS
2.50E-04
PASS
9.65E-06 -3.14E-07 -9.14E-06 -7.44E-06
3.59E-05
3.88E-05
4.05E-05
4.34E-05
1.08E-04
1.06E-04
1.02E-04
1.11E-04
-8.88E-05 -1.07E-04 -1.20E-04 -1.26E-04
-1.20E-04 -1.20E-04 -1.20E-04 -1.75E-04
FAIL
FAIL
FAIL
PASS
1.20E-04
1.20E-04
1.20E-04
1.75E-04
FAIL
FAIL
FAIL
PASS
An ISO 9001:2000 Certified Company
13
-1.11E-05
4.71E-05
1.18E-04
-1.40E-04
-2.50E-04
PASS
2.50E-04
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 2 @ +5V (V)
3.00E-04
2.00E-04
1.00E-04
0.00E+00
-1.00E-04
-2.00E-04
-3.00E-04
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.4. Plot of Input Offset Voltage 2 @ +5V (V) versus total dose. The data show no significant change
with total dose. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
14
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.4. Raw data for Input Offset Voltage 2 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
Total Dose (krad(Si))
Input Offset Voltage 2 @ +5V (V)
0
-8.07E-07
-7.21E-06
1.05E-05
-5.82E-05
1.19E-05
-2.22E-05
-2.13E-05
-2.94E-05
8.51E-05
-3.60E-05
5.54E-05
10
-1.46E-05
-2.05E-05
-8.58E-06
-6.62E-05
-5.68E-06
-3.76E-05
-4.01E-05
-4.53E-05
6.39E-05
-5.58E-05
5.27E-05
20
-1.63E-05
-1.69E-05
-7.25E-06
-5.74E-05
-3.27E-06
-3.89E-05
-4.53E-05
-4.94E-05
5.57E-05
-6.56E-05
5.08E-05
30
-5.08E-06
-3.14E-06
-3.14E-06
-4.72E-05
1.45E-06
-4.06E-05
-4.46E-05
-4.53E-05
5.25E-05
-6.70E-05
5.53E-05
60
1.69E-05
2.11E-05
1.20E-05
-2.45E-05
7.73E-06
-3.16E-05
-4.75E-05
-4.49E-05
5.36E-05
-7.46E-05
5.14E-05
70
1.17E-07
1.78E-05
1.81E-06
-5.48E-05
-8.34E-06
-3.36E-05
-5.16E-05
-5.58E-05
5.13E-05
-6.69E-05
4.98E-05
-8.75E-06
2.88E-05
7.01E-05
-8.76E-05
-2.31E-05
2.47E-05
4.47E-05
-9.10E-05
-2.02E-05
2.16E-05
3.89E-05
-7.94E-05
-1.14E-05 7.53E-06 6.64E-06
2.02E-05 1.90E-05 1.81E-05
4.38E-05 5.97E-05 5.64E-05
-6.67E-05 -4.47E-05 -4.31E-05
-8.69E-06
2.75E-05
6.67E-05
-8.40E-05
-4.77E-06 -2.30E-05 -2.87E-05 -2.90E-05
5.06E-05
4.91E-05
4.82E-05
4.67E-05
1.34E-04
1.12E-04
1.03E-04
9.92E-05
-1.43E-04 -1.57E-04 -1.61E-04 -1.57E-04
-1.20E-04 -1.20E-04 -1.20E-04 -1.75E-04
FAIL
FAIL
FAIL
PASS
1.20E-04
1.20E-04
1.20E-04
1.75E-04
FAIL
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
15
50
1.86E-05
2.06E-05
1.48E-05
-2.56E-05
9.17E-06
-3.39E-05
-5.15E-05
-4.88E-05
4.79E-05
-7.92E-05
5.22E-05
168 hr
Anneal
-3.31E-05
4.82E-05
9.90E-05
-1.65E-04
-2.50E-04
PASS
2.50E-04
PASS
-2.90E-05 -3.13E-05
4.88E-05 4.77E-05
1.05E-04 9.96E-05
-1.63E-04 -1.62E-04
-2.50E-04 -2.50E-04
PASS
PASS
2.50E-04 2.50E-04
PASS
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 1 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.5. Plot of Input Offset Current 1 @ +5V (A) versus total dose. The data show no significant change
with total dose. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
16
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.5. Raw data for Input Offset Current 1 @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 1 @ +5V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
168 hr
Anneal
60
0.00E+00
-1.70E-10
-1.10E-10
-1.40E-10
1.20E-10
0.00E+00
-1.90E-10
2.30E-10
0.00E+00
0.00E+00
-8.00E-11
70
-9.00E-11
6.00E-11
-1.80E-10
-1.00E-10
-2.00E-11
4.00E-11
-4.00E-10
5.00E-11
-6.00E-11
-5.00E-11
-1.00E-10
0
-8.00E-11
-4.00E-11
-1.90E-10
-1.50E-10
-3.00E-11
4.00E-11
-1.30E-10
2.00E-11
-3.00E-11
8.00E-11
-8.00E-11
10
-8.00E-11
-1.10E-10
-1.90E-10
-1.20E-10
-1.00E-11
4.00E-11
-1.90E-10
8.00E-11
-1.10E-10
6.00E-11
-8.00E-11
20
-9.00E-11
-2.10E-10
-2.70E-10
-2.20E-10
9.00E-11
0.00E+00
-1.20E-10
1.20E-10
-1.30E-10
-1.00E-11
-1.10E-10
30
-2.00E-11
-1.50E-10
-1.40E-10
-2.00E-10
1.10E-10
2.00E-11
-1.30E-10
2.20E-10
-2.00E-11
6.00E-11
-7.00E-11
-9.80E-11
6.98E-11
9.34E-11
-2.89E-10
-1.02E-10
6.53E-11
7.72E-11
-2.81E-10
-1.40E-10
1.45E-10
2.56E-10
-5.36E-10
-8.00E-11 -6.80E-11 -6.00E-11 -6.60E-11
1.25E-10 1.03E-10 1.19E-10 9.04E-11
2.63E-10 2.14E-10 2.67E-10 1.82E-10
-4.23E-10 -3.50E-10 -3.87E-10 -3.14E-10
-4.00E-12 -2.40E-11 -2.80E-11
3.00E-11
8.08E-11
1.19E-10
1.02E-10
1.28E-10
2.18E-10
3.03E-10
2.53E-10
3.80E-10
-2.26E-10 -3.51E-10 -3.09E-10 -3.20E-10
-8.00E-10 -2.00E-09 -2.00E-09 -8.00E-09
PASS
PASS
PASS
PASS
8.00E-10
2.00E-09
2.00E-09
8.00E-09
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
17
50
-8.00E-11
-1.20E-10
-1.50E-10
-1.00E-10
1.10E-10
5.00E-11
-1.30E-10
2.50E-10
2.00E-11
-4.00E-11
-8.00E-11
24 hr
Anneal
3.00E-11
1.41E-10
4.16E-10
-3.56E-10
-1.30E-08
PASS
1.30E-08
PASS
8.00E-12
1.49E-10
4.16E-10
-4.00E-10
-1.30E-08
PASS
1.30E-08
PASS
-8.40E-11
1.84E-10
4.20E-10
-5.88E-10
-1.30E-08
PASS
1.30E-08
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 2 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.6. Plot of Input Offset Current 2 @ +5V (A) versus total dose. The data show no significant change
with total dose. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
18
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.6. Raw data for Input Offset Current 2 @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 2 @ +5V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
168 hr
Anneal
60
-2.10E-10
-1.80E-10
-1.00E-10
-1.80E-10
-4.30E-10
3.60E-10
6.50E-10
6.30E-10
3.70E-10
5.70E-10
-3.00E-11
70
-2.50E-10
1.66E-09
-6.00E-11
-5.00E-11
-3.40E-10
0.00E+00
-1.20E-10
1.30E-10
6.00E-11
3.00E-11
-3.00E-11
0
-1.50E-10
-1.40E-10
-5.00E-11
2.00E-11
-1.50E-10
-2.00E-11
-7.00E-11
-1.60E-10
-1.00E-10
-1.40E-10
-8.00E-11
10
-1.20E-10
-6.00E-11
0.00E+00
4.00E-11
-2.00E-10
-1.00E-10
-1.00E-10
-1.20E-10
-1.30E-10
-1.00E-10
-3.00E-11
20
-1.70E-10
-1.20E-10
-5.00E-11
1.00E-11
-2.40E-10
-7.00E-11
3.00E-11
-6.00E-11
-1.20E-10
-1.30E-10
-8.00E-11
30
-1.70E-10
-6.00E-11
-8.00E-11
-1.10E-10
-2.50E-10
0.00E+00
2.00E-10
8.00E-11
-5.00E-11
-6.00E-11
-4.00E-11
-9.40E-11
7.64E-11
1.15E-10
-3.03E-10
-6.80E-11
9.55E-11
1.94E-10
-3.30E-10
-1.14E-10
9.81E-11
1.55E-10
-3.83E-10
-1.34E-10 -1.58E-10 -2.20E-10 1.92E-10
7.70E-11 9.76E-11 1.24E-10 8.30E-10
7.72E-11 1.10E-10 1.21E-10 2.47E-09
-3.45E-10 -4.26E-10 -5.61E-10 -2.08E-09
-9.80E-11 -1.10E-10 -7.00E-11
3.40E-11
5.59E-11
1.41E-11
6.36E-11
1.08E-10
5.52E-11 -7.12E-11
1.04E-10
3.30E-10
-2.51E-10 -1.49E-10 -2.44E-10 -2.62E-10
-8.00E-10 -2.00E-09 -2.00E-09 -8.00E-09
PASS
PASS
PASS
PASS
8.00E-10
2.00E-09
2.00E-09
8.00E-09
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
19
50
-1.30E-10
-1.10E-10
-9.00E-11
-1.30E-10
-3.30E-10
1.50E-10
3.70E-10
3.50E-10
1.20E-10
2.00E-10
-7.00E-11
24 hr
Anneal
2.38E-10
1.15E-10
5.54E-10
-7.79E-11
-1.30E-08
PASS
1.30E-08
PASS
5.16E-10
1.41E-10
9.03E-10
1.29E-10
-1.30E-08
PASS
1.30E-08
PASS
2.00E-11
9.19E-11
2.72E-10
-2.32E-10
-1.30E-08
PASS
1.30E-08
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 1 @ +5V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.7. Plot of Positive Input Bias Current 1 @ +5V (A) versus total dose. The data show an increase
with radiation, however not sufficient for the parameter to exceed its post-irradiation test limits. The solid
diamonds are the average of the measured data points for the sample irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
20
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.7. Raw data for Positive Input Bias Current 1 @ +5V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 1 @ +5V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.78E-09
8.60E-09
7.96E-09
8.62E-09
9.95E-09
8.76E-09
8.44E-09
8.27E-09
8.37E-09
8.59E-09
7.99E-09
10
1.13E-08
1.09E-08
1.03E-08
1.10E-08
1.27E-08
1.07E-08
1.03E-08
1.03E-08
1.01E-08
1.06E-08
8.06E-09
20
1.50E-08
1.42E-08
1.36E-08
1.45E-08
1.67E-08
1.31E-08
1.27E-08
1.27E-08
1.23E-08
1.31E-08
8.03E-09
30
1.87E-08
1.77E-08
1.69E-08
1.80E-08
2.08E-08
1.53E-08
1.50E-08
1.51E-08
1.46E-08
1.55E-08
8.10E-09
50
2.61E-08
2.45E-08
2.35E-08
2.50E-08
2.88E-08
1.98E-08
1.93E-08
1.96E-08
1.87E-08
2.02E-08
8.09E-09
60
2.62E-08
2.46E-08
2.35E-08
2.50E-08
2.90E-08
1.98E-08
1.92E-08
1.95E-08
1.87E-08
2.01E-08
8.06E-09
70
2.51E-08
2.42E-08
2.24E-08
2.44E-08
2.83E-08
1.80E-08
1.75E-08
1.77E-08
1.71E-08
1.84E-08
8.06E-09
8.78E-09
7.24E-10
1.08E-08
6.80E-09
1.12E-08
9.16E-10
1.37E-08
8.72E-09
1.48E-08
1.20E-09
1.81E-08
1.15E-08
1.84E-08
1.48E-09
2.25E-08
1.43E-08
2.56E-08
2.04E-09
3.12E-08
2.00E-08
2.57E-08
2.07E-09
3.13E-08
2.00E-08
2.49E-08
2.17E-09
3.08E-08
1.89E-08
8.49E-09
1.04E-08
1.28E-08
1.51E-08 1.95E-08 1.95E-08
1.92E-10
2.32E-10
3.36E-10
3.46E-10 5.67E-10 5.29E-10
9.01E-09
1.10E-08
1.37E-08
1.60E-08 2.11E-08 2.09E-08
7.96E-09
9.76E-09
1.19E-08
1.41E-08 1.80E-08 1.80E-08
-1.50E-08 -2.00E-08 -2.00E-08 -4.00E-08 -8.00E-08 -8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
2.00E-08
4.00E-08 8.00E-08 8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.77E-08
4.71E-10
1.90E-08
1.65E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2000 Certified Company
21
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 2 @ +5V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.8. Plot of Positive Input Bias Current 2 @ +5V (A) versus total dose. The data show an increase
with radiation, however not sufficient for the parameter to exceed its post-irradiation test limits. The solid
diamonds are the average of the measured data points for the sample irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
22
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.8. Raw data for Positive Input Bias Current 2 @ +5V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 2 @ +5V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.77E-09
8.60E-09
8.12E-09
8.88E-09
9.77E-09
8.91E-09
8.62E-09
8.54E-09
8.29E-09
8.43E-09
8.12E-09
10
1.13E-08
1.10E-08
1.04E-08
1.12E-08
1.25E-08
1.08E-08
1.05E-08
1.06E-08
1.01E-08
1.05E-08
8.18E-09
20
1.48E-08
1.43E-08
1.36E-08
1.46E-08
1.63E-08
1.33E-08
1.30E-08
1.31E-08
1.24E-08
1.31E-08
8.16E-09
30
1.85E-08
1.79E-08
1.70E-08
1.81E-08
2.04E-08
1.57E-08
1.54E-08
1.56E-08
1.47E-08
1.56E-08
8.18E-09
50
2.56E-08
2.46E-08
2.36E-08
2.49E-08
2.82E-08
2.03E-08
2.00E-08
2.04E-08
1.90E-08
2.05E-08
8.20E-09
60
2.57E-08
2.46E-08
2.36E-08
2.50E-08
2.82E-08
2.05E-08
2.02E-08
2.06E-08
1.92E-08
2.09E-08
8.18E-09
70
2.47E-08
2.42E-08
2.25E-08
2.46E-08
2.78E-08
1.84E-08
1.80E-08
1.84E-08
1.72E-08
1.84E-08
8.18E-09
8.83E-09
6.01E-10
1.05E-08
7.18E-09
1.13E-08
7.62E-10
1.34E-08
9.18E-09
1.47E-08
9.96E-10
1.75E-08
1.20E-08
1.84E-08
1.25E-09
2.18E-08
1.49E-08
2.54E-08
1.76E-09
3.02E-08
2.06E-08
2.54E-08
1.74E-09
3.02E-08
2.06E-08
2.48E-08
1.92E-09
3.00E-08
1.95E-08
8.56E-09
1.05E-08
1.30E-08
1.54E-08 2.00E-08 2.03E-08
2.33E-10
2.46E-10
3.48E-10
4.12E-10 6.05E-10 6.46E-10
9.20E-09
1.12E-08
1.39E-08
1.65E-08 2.17E-08 2.20E-08
7.92E-09
9.83E-09
1.20E-08
1.42E-08 1.84E-08 1.85E-08
-1.50E-08 -2.00E-08 -2.00E-08 -4.00E-08 -8.00E-08 -8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
2.00E-08
4.00E-08 8.00E-08 8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.81E-08
5.25E-10
1.95E-08
1.66E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2000 Certified Company
23
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current 1 @ +5V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.9. Plot of Negative Input Bias Current 1 @ +5V (A) versus total dose. The data show an increase
with radiation, however not sufficient for the parameter to exceed its post-irradiation test limits. The solid
diamonds are the average of the measured data points for the sample irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
24
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.9. Raw data for Negative Input Bias Current 1 @ +5V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 1 @ +5V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.88E-09
8.68E-09
8.21E-09
8.81E-09
1.00E-08
8.76E-09
8.64E-09
8.31E-09
8.44E-09
8.51E-09
8.13E-09
10
1.14E-08
1.10E-08
1.05E-08
1.12E-08
1.27E-08
1.07E-08
1.05E-08
1.02E-08
1.03E-08
1.06E-08
8.12E-09
20
1.51E-08
1.45E-08
1.38E-08
1.47E-08
1.67E-08
1.31E-08
1.29E-08
1.26E-08
1.25E-08
1.31E-08
8.12E-09
30
1.88E-08
1.79E-08
1.70E-08
1.83E-08
2.07E-08
1.54E-08
1.51E-08
1.49E-08
1.47E-08
1.55E-08
8.23E-09
50
2.62E-08
2.47E-08
2.37E-08
2.52E-08
2.88E-08
1.98E-08
1.95E-08
1.94E-08
1.88E-08
2.03E-08
8.17E-09
60
2.62E-08
2.48E-08
2.37E-08
2.53E-08
2.89E-08
1.98E-08
1.94E-08
1.94E-08
1.87E-08
2.02E-08
8.19E-09
70
2.54E-08
2.42E-08
2.26E-08
2.46E-08
2.84E-08
1.80E-08
1.79E-08
1.77E-08
1.72E-08
1.85E-08
8.14E-09
8.92E-09
6.68E-10
1.08E-08
7.09E-09
1.14E-08
8.36E-10
1.37E-08
9.08E-09
1.50E-08
1.09E-09
1.79E-08
1.20E-08
1.85E-08
1.38E-09
2.23E-08
1.47E-08
2.57E-08
1.95E-09
3.11E-08
2.04E-08
2.58E-08
1.96E-09
3.12E-08
2.04E-08
2.50E-08
2.13E-09
3.09E-08
1.92E-08
8.53E-09
1.05E-08
1.28E-08
1.51E-08 1.96E-08 1.95E-08
1.75E-10
1.89E-10
3.01E-10
3.19E-10 5.73E-10 5.46E-10
9.01E-09
1.10E-08
1.37E-08
1.60E-08 2.11E-08 2.10E-08
8.05E-09
9.93E-09
1.20E-08
1.42E-08 1.80E-08 1.80E-08
-1.50E-08 -2.00E-08 -2.00E-08 -4.00E-08 -8.00E-08 -8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
2.00E-08
4.00E-08 8.00E-08 8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.79E-08
4.63E-10
1.91E-08
1.66E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2000 Certified Company
25
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current 2 @+5V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.10. Plot of Negative Input Bias Current 2 @+5V (A) versus total dose. The data show an increase
with radiation, however not sufficient for the parameter to exceed its post-irradiation test limits. The solid
diamonds are the average of the measured data points for the sample irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
26
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.10. Raw data for Negative Input Bias Current 2 @+5V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 2 @+5V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.98E-09
8.75E-09
8.17E-09
8.89E-09
9.94E-09
8.95E-09
8.73E-09
8.73E-09
8.42E-09
8.61E-09
8.17E-09
10
1.15E-08
1.11E-08
1.05E-08
1.12E-08
1.27E-08
1.09E-08
1.06E-08
1.07E-08
1.02E-08
1.06E-08
8.23E-09
20
1.50E-08
1.45E-08
1.38E-08
1.47E-08
1.66E-08
1.34E-08
1.30E-08
1.32E-08
1.26E-08
1.32E-08
8.22E-09
30
1.87E-08
1.80E-08
1.71E-08
1.82E-08
2.07E-08
1.57E-08
1.53E-08
1.55E-08
1.47E-08
1.57E-08
8.27E-09
50
2.58E-08
2.48E-08
2.37E-08
2.52E-08
2.86E-08
2.02E-08
1.97E-08
2.01E-08
1.90E-08
2.04E-08
8.23E-09
60
2.59E-08
2.48E-08
2.38E-08
2.53E-08
2.87E-08
2.02E-08
1.96E-08
2.00E-08
1.89E-08
2.04E-08
8.24E-09
70
2.51E-08
2.26E-08
2.26E-08
2.48E-08
2.82E-08
1.85E-08
1.81E-08
1.83E-08
1.72E-08
1.84E-08
8.20E-09
8.95E-09
6.39E-10
1.07E-08
7.19E-09
1.14E-08
8.23E-10
1.36E-08
9.13E-09
1.49E-08
1.07E-09
1.78E-08
1.20E-08
1.85E-08
1.32E-09
2.22E-08
1.49E-08
2.56E-08
1.85E-09
3.07E-08
2.06E-08
2.57E-08
1.85E-09
3.08E-08
2.06E-08
2.46E-08
2.30E-09
3.09E-08
1.83E-08
8.69E-09
1.06E-08
1.31E-08
1.54E-08 1.99E-08 1.98E-08
1.94E-10
2.37E-10
3.14E-10
3.97E-10 5.67E-10 5.80E-10
9.22E-09
1.13E-08
1.40E-08
1.65E-08 2.14E-08 2.14E-08
8.16E-09
9.98E-09
1.22E-08
1.43E-08 1.83E-08 1.82E-08
-1.50E-08 -2.00E-08 -2.00E-08 -4.00E-08 -8.00E-08 -8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
2.00E-08
4.00E-08 8.00E-08 8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.81E-08
5.21E-10
1.95E-08
1.67E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2000 Certified Company
27
Common Mode Rejection Ratio 1 @ +5V (dB)
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.11. Plot of Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
28
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.11. Raw data for Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 1 @ +5V (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.03E+02
1.05E+02
1.04E+02
1.05E+02
1.06E+02
1.03E+02
1.04E+02
1.12E+02
1.10E+02
1.07E+02
1.03E+02
10
1.03E+02
1.05E+02
1.02E+02
1.02E+02
1.04E+02
1.02E+02
1.03E+02
1.10E+02
1.07E+02
1.03E+02
1.03E+02
20
1.01E+02
1.03E+02
1.01E+02
1.03E+02
1.03E+02
1.01E+02
1.04E+02
1.08E+02
1.08E+02
1.04E+02
1.02E+02
30
1.02E+02
1.03E+02
1.03E+02
1.02E+02
1.04E+02
1.03E+02
1.03E+02
1.08E+02
1.06E+02
1.03E+02
1.04E+02
50
1.00E+02
1.02E+02
1.02E+02
1.03E+02
1.06E+02
1.01E+02
1.02E+02
1.05E+02
1.05E+02
1.02E+02
1.03E+02
60
1.00E+02
1.03E+02
1.02E+02
1.03E+02
1.03E+02
9.93E+01
1.03E+02
1.05E+02
1.04E+02
1.02E+02
1.04E+02
70
1.01E+02
1.03E+02
1.01E+02
1.03E+02
1.06E+02
1.05E+02
1.05E+02
1.07E+02
1.05E+02
1.04E+02
1.05E+02
1.04E+02
8.43E-01
1.07E+02
1.02E+02
1.03E+02
1.56E+00
1.07E+02
9.89E+01
1.02E+02
1.05E+00
1.05E+02
9.93E+01
1.03E+02
9.44E-01
1.05E+02
1.00E+02
1.03E+02
2.26E+00
1.09E+02
9.64E+01
1.02E+02
1.29E+00
1.06E+02
9.88E+01
1.03E+02
2.04E+00
1.09E+02
9.75E+01
1.07E+02 1.05E+02 1.05E+02 1.04E+02
3.62E+00 3.45E+00 3.06E+00 2.25E+00
1.17E+02 1.15E+02 1.13E+02 1.11E+02
9.74E+01 9.57E+01 9.65E+01 9.82E+01
9.40E+01 9.10E+01 9.10E+01 8.90E+01
PASS
PASS
PASS
PASS
1.03E+02
1.93E+00
1.08E+02
9.77E+01
8.70E+01
PASS
1.03E+02
2.28E+00
1.09E+02
9.63E+01
8.70E+01
PASS
1.05E+02
9.23E-01
1.08E+02
1.03E+02
8.70E+01
PASS
An ISO 9001:2000 Certified Company
29
Common Mode Rejection Ratio 2 @ +5V (dB)
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.12. Plot of Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
30
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.12. Raw data for Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 2 @ +5V (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.06E+02
1.06E+02
1.06E+02
1.11E+02
1.02E+02
1.05E+02
1.08E+02
1.12E+02
1.07E+02
1.12E+02
1.04E+02
10
1.06E+02
1.06E+02
1.03E+02
1.08E+02
1.01E+02
1.03E+02
1.09E+02
1.09E+02
1.04E+02
1.11E+02
1.04E+02
20
1.03E+02
1.04E+02
1.04E+02
1.09E+02
1.03E+02
1.03E+02
1.05E+02
1.08E+02
1.03E+02
1.08E+02
1.03E+02
30
1.04E+02
1.04E+02
1.04E+02
1.08E+02
1.01E+02
1.03E+02
1.07E+02
1.07E+02
1.02E+02
1.08E+02
1.06E+02
50
1.04E+02
1.03E+02
1.03E+02
1.09E+02
1.02E+02
1.02E+02
1.04E+02
1.06E+02
1.00E+02
1.07E+02
1.04E+02
60
1.03E+02
1.05E+02
1.02E+02
1.08E+02
1.01E+02
1.01E+02
1.05E+02
1.06E+02
1.01E+02
1.07E+02
1.05E+02
70
1.04E+02
1.16E+02
1.04E+02
1.07E+02
1.02E+02
1.04E+02
1.09E+02
1.09E+02
1.03E+02
1.09E+02
1.05E+02
1.06E+02
3.31E+00
1.15E+02
9.72E+01
1.05E+02
2.58E+00
1.12E+02
9.78E+01
1.05E+02
2.52E+00
1.12E+02
9.78E+01
1.04E+02
2.51E+00
1.11E+02
9.74E+01
1.04E+02
2.70E+00
1.12E+02
9.68E+01
1.04E+02
2.84E+00
1.12E+02
9.61E+01
1.07E+02
5.29E+00
1.21E+02
9.21E+01
1.09E+02 1.07E+02 1.05E+02 1.05E+02
3.05E+00 3.46E+00 2.54E+00 2.68E+00
1.17E+02 1.17E+02 1.12E+02 1.13E+02
1.00E+02 9.77E+01 9.84E+01 9.80E+01
9.40E+01 9.10E+01 9.10E+01 8.90E+01
PASS
PASS
PASS
PASS
1.04E+02
2.91E+00
1.12E+02
9.60E+01
8.70E+01
PASS
1.04E+02
2.94E+00
1.12E+02
9.60E+01
8.70E+01
PASS
1.07E+02
3.06E+00
1.15E+02
9.84E+01
8.70E+01
PASS
An ISO 9001:2000 Certified Company
31
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio 1 @ +5V (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.13. Plot of Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
32
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.13. Raw data for Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 1 @ +5V (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.29E+02
1.18E+02
1.27E+02
1.21E+02
1.12E+02
1.18E+02
1.26E+02
1.16E+02
1.22E+02
1.21E+02
1.33E+02
10
1.25E+02
1.15E+02
1.23E+02
1.23E+02
1.12E+02
1.16E+02
1.25E+02
1.15E+02
1.22E+02
1.26E+02
1.27E+02
20
1.21E+02
1.14E+02
1.25E+02
1.17E+02
1.10E+02
1.15E+02
1.35E+02
1.11E+02
1.14E+02
1.17E+02
1.32E+02
30
1.27E+02
1.13E+02
1.41E+02
1.17E+02
1.12E+02
1.16E+02
1.33E+02
1.14E+02
1.19E+02
1.21E+02
1.61E+02
50
1.21E+02
1.11E+02
1.35E+02
1.13E+02
1.09E+02
1.14E+02
1.40E+02
1.12E+02
1.16E+02
1.18E+02
1.37E+02
60
1.22E+02
1.11E+02
1.38E+02
1.12E+02
1.10E+02
1.15E+02
1.26E+02
1.11E+02
1.16E+02
1.14E+02
1.45E+02
70
1.21E+02
1.12E+02
1.52E+02
1.15E+02
1.09E+02
1.13E+02
1.55E+02
1.14E+02
1.20E+02
1.22E+02
1.21E+02
1.21E+02
6.75E+00
1.40E+02
1.03E+02
1.20E+02
5.53E+00
1.35E+02
1.04E+02
1.17E+02
5.69E+00
1.33E+02
1.02E+02
1.22E+02
1.23E+01
1.56E+02
8.86E+01
1.18E+02
1.07E+01
1.47E+02
8.86E+01
1.19E+02
1.19E+01
1.51E+02
8.61E+01
1.22E+02
1.76E+01
1.70E+02
7.34E+01
1.20E+02 1.21E+02 1.18E+02 1.21E+02
3.80E+00 5.22E+00 9.44E+00 7.45E+00
1.31E+02 1.35E+02 1.44E+02 1.41E+02
1.10E+02 1.07E+02 9.24E+01 1.00E+02
1.00E+02 1.00E+02 1.00E+02 1.00E+02
PASS
PASS
FAIL
FAIL
1.20E+02
1.16E+01
1.52E+02
8.82E+01
9.80E+01
FAIL
1.16E+02
5.56E+00
1.32E+02
1.01E+02
9.80E+01
FAIL
1.25E+02
1.74E+01
1.73E+02
7.71E+01
9.80E+01
FAIL
An ISO 9001:2000 Certified Company
33
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio 2 @ +5V (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.14. Plot of Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
34
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.14. Raw data for Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 2 @ +5V (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.17E+02
1.16E+02
1.30E+02
1.12E+02
1.27E+02
1.22E+02
1.18E+02
1.15E+02
1.33E+02
1.19E+02
1.54E+02
10
1.18E+02
1.15E+02
1.20E+02
1.13E+02
1.26E+02
1.20E+02
1.18E+02
1.15E+02
1.26E+02
1.18E+02
1.37E+02
20
1.13E+02
1.11E+02
1.16E+02
1.11E+02
1.24E+02
1.17E+02
1.13E+02
1.12E+02
1.25E+02
1.15E+02
1.31E+02
30
1.13E+02
1.13E+02
1.22E+02
1.10E+02
1.22E+02
1.19E+02
1.15E+02
1.12E+02
1.35E+02
1.17E+02
1.25E+02
50
1.12E+02
1.11E+02
1.16E+02
1.10E+02
1.23E+02
1.15E+02
1.13E+02
1.10E+02
1.25E+02
1.13E+02
1.36E+02
60
1.11E+02
1.11E+02
1.14E+02
1.08E+02
1.23E+02
1.17E+02
1.12E+02
1.10E+02
1.20E+02
1.13E+02
1.24E+02
70
1.13E+02
1.13E+02
1.19E+02
1.10E+02
1.27E+02
1.15E+02
1.14E+02
1.11E+02
1.26E+02
1.15E+02
1.34E+02
1.20E+02
7.61E+00
1.41E+02
9.96E+01
1.18E+02
5.32E+00
1.33E+02
1.04E+02
1.15E+02
5.48E+00
1.30E+02
1.00E+02
1.16E+02
5.58E+00
1.31E+02
1.01E+02
1.15E+02
5.42E+00
1.30E+02
9.98E+01
1.13E+02
5.63E+00
1.29E+02
9.80E+01
1.16E+02
6.65E+00
1.34E+02
9.80E+01
1.22E+02 1.19E+02 1.16E+02 1.19E+02
6.93E+00 4.31E+00 5.38E+00 8.99E+00
1.41E+02 1.31E+02 1.31E+02 1.44E+02
1.03E+02 1.08E+02 1.02E+02 9.47E+01
1.00E+02 1.00E+02 1.00E+02 1.00E+02
FAIL
PASS
PASS
FAIL
1.15E+02
5.92E+00
1.32E+02
9.91E+01
9.80E+01
PASS
1.14E+02
3.87E+00
1.25E+02
1.04E+02
9.80E+01
PASS
1.16E+02
5.45E+00
1.31E+02
1.01E+02
9.80E+01
FAIL
An ISO 9001:2000 Certified Company
35
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +5V, RL=open (V/mV)
2.00E+03
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.15. Plot of Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
36
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.15. Raw data for Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +5V, RL=open (V/mV)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.32E+03
1.27E+03
1.32E+03
1.36E+03
1.19E+03
1.36E+03
1.23E+03
1.63E+03
1.43E+03
1.33E+03
1.31E+03
10
1.20E+03
1.17E+03
1.09E+03
1.41E+03
1.09E+03
1.18E+03
1.43E+03
1.51E+03
1.19E+03
1.48E+03
1.14E+03
20
1.33E+03
1.22E+03
1.41E+03
1.51E+03
1.52E+03
1.43E+03
1.35E+03
1.27E+03
1.90E+03
1.15E+03
1.14E+03
30
1.75E+03
1.50E+03
1.61E+03
1.27E+03
1.11E+03
1.19E+03
1.17E+03
1.76E+03
1.15E+03
1.28E+03
1.46E+03
50
1.81E+03
1.79E+03
1.83E+03
2.27E+03
1.73E+03
1.79E+03
1.12E+03
1.23E+03
1.57E+03
1.41E+03
1.14E+03
60
1.49E+03
1.65E+03
1.59E+03
2.25E+03
1.50E+03
1.26E+03
1.82E+03
2.47E+03
1.45E+03
1.52E+03
1.39E+03
70
1.16E+03
1.78E+03
1.25E+03
1.26E+03
1.36E+03
1.37E+03
1.25E+03
1.51E+03
1.60E+03
1.31E+03
1.22E+03
1.29E+03
6.73E+01
1.48E+03
1.11E+03
1.19E+03
1.31E+02
1.55E+03
8.31E+02
1.40E+03
1.26E+02
1.75E+03
1.05E+03
1.45E+03
2.58E+02
2.16E+03
7.42E+02
1.89E+03
2.18E+02
2.48E+03
1.29E+03
1.69E+03
3.16E+02
2.56E+03
8.27E+02
1.36E+03
2.42E+02
2.03E+03
6.98E+02
1.39E+03 1.36E+03 1.42E+03 1.31E+03
1.49E+02 1.60E+02 2.87E+02 2.57E+02
1.80E+03 1.80E+03 2.20E+03 2.01E+03
9.84E+02 9.19E+02 6.32E+02 6.07E+02
1.50E+02 1.50E+02 1.50E+02 1.50E+02
PASS
PASS
PASS
PASS
1.42E+03
2.66E+02
2.15E+03
6.95E+02
1.00E+02
PASS
1.70E+03
4.72E+02
3.00E+03
4.09E+02
1.00E+02
PASS
1.41E+03
1.45E+02
1.80E+03
1.01E+03
1.00E+02
PASS
An ISO 9001:2000 Certified Company
37
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +5V, RL=open (V/mV)
2.00E+03
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.16. Plot of Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
38
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.16. Raw data for Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +5V, RL=open (V/mV)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.36E+03
1.27E+03
1.34E+03
1.37E+03
1.18E+03
1.26E+03
1.26E+03
1.36E+03
1.49E+03
1.21E+03
1.28E+03
10
1.20E+03
1.25E+03
1.32E+03
1.43E+03
1.10E+03
1.19E+03
1.15E+03
1.50E+03
1.35E+03
1.30E+03
1.14E+03
20
1.54E+03
1.59E+03
1.30E+03
1.34E+03
9.72E+02
1.58E+03
1.10E+03
1.27E+03
1.49E+03
1.38E+03
1.25E+03
30
1.89E+03
1.28E+03
1.29E+03
1.92E+03
1.11E+03
1.14E+03
1.29E+03
1.69E+03
1.52E+03
1.23E+03
1.14E+03
50
1.75E+03
1.68E+03
1.56E+03
2.16E+03
1.18E+03
1.19E+03
1.25E+03
1.69E+03
1.25E+03
1.64E+03
1.18E+03
60
2.13E+03
1.74E+03
1.62E+03
2.60E+03
1.25E+03
1.33E+03
1.63E+03
1.39E+03
1.17E+03
1.08E+03
1.28E+03
70
1.80E+03
1.58E+03
1.48E+03
1.53E+03
1.03E+03
1.66E+03
1.20E+03
1.58E+03
1.43E+03
1.17E+03
1.22E+03
1.30E+03
8.15E+01
1.53E+03
1.08E+03
1.26E+03
1.26E+02
1.61E+03
9.17E+02
1.35E+03
2.45E+02
2.02E+03
6.78E+02
1.50E+03
3.79E+02
2.53E+03
4.58E+02
1.67E+03
3.52E+02
2.63E+03
7.02E+02
1.87E+03
5.15E+02
3.28E+03
4.57E+02
1.48E+03
2.81E+02
2.25E+03
7.14E+02
1.31E+03 1.30E+03 1.37E+03 1.38E+03
1.11E+02 1.39E+02 1.86E+02 2.27E+02
1.62E+03 1.68E+03 1.88E+03 2.00E+03
1.01E+03 9.20E+02 8.57E+02 7.54E+02
1.50E+02 1.50E+02 1.50E+02 1.50E+02
PASS
PASS
PASS
PASS
1.41E+03
2.40E+02
2.06E+03
7.47E+02
1.00E+02
PASS
1.32E+03
2.12E+02
1.90E+03
7.39E+02
1.00E+02
PASS
1.41E+03
2.20E+02
2.01E+03
8.04E+02
1.00E+02
PASS
An ISO 9001:2000 Certified Company
39
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV)
2.00E+03
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.17. Plot of Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose. The data show
substantial degradation with radiation, however it is not sufficient for the parameter to exceed its postirradiation test limits. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
40
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.17. Raw data for Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
2.52E+03
1.39E+03
1.57E+03
1.48E+03
1.77E+03
1.33E+03
2.20E+03
1.36E+03
1.30E+03
1.71E+03
1.58E+03
10
1.49E+03
9.38E+02
1.21E+03
1.08E+03
1.18E+03
1.14E+03
1.76E+03
1.08E+03
1.04E+03
1.38E+03
1.31E+03
20
9.65E+02
7.30E+02
1.20E+03
9.34E+02
1.08E+03
8.76E+02
1.26E+03
5.93E+02
8.54E+02
7.99E+02
1.47E+03
30
7.03E+02
6.42E+02
8.18E+02
6.10E+02
7.46E+02
7.61E+02
9.37E+02
5.62E+02
6.03E+02
8.08E+02
1.84E+03
50
4.58E+02
3.97E+02
6.42E+02
4.36E+02
5.68E+02
4.27E+02
5.53E+02
3.62E+02
4.13E+02
4.90E+02
1.48E+03
60
4.46E+02
4.10E+02
5.28E+02
4.52E+02
5.43E+02
4.53E+02
6.41E+02
3.68E+02
4.18E+02
5.30E+02
1.81E+03
70
8.15E+02
6.15E+02
9.28E+02
5.82E+02
8.66E+02
7.20E+02
1.23E+03
5.44E+02
7.70E+02
8.70E+02
1.34E+03
1.75E+03
4.56E+02
3.00E+03
4.98E+02
1.18E+03
2.03E+02
1.74E+03
6.21E+02
9.82E+02
1.77E+02
1.47E+03
4.98E+02
7.04E+02
8.25E+01
9.30E+02
4.78E+02
5.00E+02
1.02E+02
7.79E+02
2.21E+02
4.76E+02
5.70E+01
6.32E+02
3.20E+02
7.61E+02
1.54E+02
1.18E+03
3.39E+02
1.58E+03 1.28E+03 8.77E+02 7.34E+02
3.86E+02 3.02E+02 2.43E+02 1.53E+02
2.64E+03 2.11E+03 1.54E+03 1.15E+03
5.23E+02 4.51E+02 2.11E+02 3.14E+02
1.20E+02 1.20E+02 1.20E+02 5.00E+01
PASS
PASS
PASS
PASS
4.49E+02
7.39E+01
6.52E+02
2.46E+02
2.00E+01
PASS
4.82E+02
1.07E+02
7.75E+02
1.89E+02
2.00E+01
PASS
8.28E+02
2.56E+02
1.53E+03
1.26E+02
2.00E+01
PASS
An ISO 9001:2000 Certified Company
41
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV)
3.00E+03
2.00E+03
1.00E+03
0.00E+00
-1.00E+03
-2.00E+03
-3.00E+03
-4.00E+03
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.18. Plot of Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose. The data show
substantial degradation with radiation, however it is not sufficient for any of the individual units to exceed the
post-irradiation test limits. Note that the KTL values are out of specification pre-irradiation and throughout
the measurement. As discussed in the text of this report we attribute this to the large standard deviation within
the sample population caused by the sensitivity of the measurement to input conditions. The solid diamonds
are the average of the measured data points for the sample irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
42
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.18. Raw data for Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.39E+03
1.51E+03
1.61E+03
1.17E+03
4.97E+03
1.62E+03
1.54E+03
1.21E+03
2.17E+03
1.44E+03
2.27E+03
10
9.94E+02
1.12E+03
1.47E+03
8.76E+02
5.27E+03
1.37E+03
1.21E+03
8.87E+02
1.53E+03
1.31E+03
2.50E+03
20
7.96E+02
7.47E+02
9.17E+02
7.13E+02
2.93E+03
1.05E+03
9.24E+02
7.34E+02
1.01E+03
8.69E+02
2.42E+03
30
5.94E+02
6.33E+02
7.44E+02
5.55E+02
2.39E+03
7.83E+02
6.89E+02
6.20E+02
8.72E+02
6.37E+02
2.16E+03
50
3.90E+02
4.14E+02
4.93E+02
3.75E+02
1.30E+03
5.56E+02
4.97E+02
4.02E+02
6.14E+02
5.04E+02
2.19E+03
60
4.08E+02
4.20E+02
5.26E+02
3.82E+02
1.32E+03
5.46E+02
5.56E+02
4.30E+02
5.32E+02
4.62E+02
2.15E+03
70
6.61E+02
7.38E+02
7.82E+02
5.59E+02
9.99E+02
9.63E+02
7.78E+02
6.31E+02
9.45E+02
7.19E+02
2.49E+03
2.13E+03
1.59E+03
6.50E+03
-2.24E+03
1.94E+03
1.87E+03
7.07E+03
-3.18E+03
1.22E+03
9.60E+02
3.85E+03
-1.41E+03
9.83E+02
7.90E+02
3.15E+03
-1.18E+03
5.95E+02
3.99E+02
1.69E+03
-4.98E+02
6.12E+02
4.01E+02
1.71E+03
-4.88E+02
7.48E+02
1.64E+02
1.20E+03
2.98E+02
1.60E+03 1.26E+03 9.17E+02 7.20E+02
3.56E+02 2.38E+02 1.24E+02 1.06E+02
2.57E+03 1.91E+03 1.26E+03 1.01E+03
6.19E+02 6.07E+02 5.76E+02 4.30E+02
1.20E+02 1.20E+02 1.20E+02 5.00E+01
FAIL
FAIL
FAIL
FAIL
5.14E+02
7.86E+01
7.30E+02
2.99E+02
2.00E+01
FAIL
5.05E+02
5.61E+01
6.59E+02
3.51E+02
2.00E+01
FAIL
8.07E+02
1.44E+02
1.20E+03
4.13E+02
2.00E+01
PASS
An ISO 9001:2000 Certified Company
43
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +5V, RL=open (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.19. Plot of Open Loop Gain 1 @ +5V, RL=open (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
44
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.19. Raw data for Open Loop Gain 1 @ +5V, RL=open (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +5V, RL=open (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.22E+02
1.22E+02
1.22E+02
1.23E+02
1.21E+02
1.23E+02
1.22E+02
1.24E+02
1.23E+02
1.22E+02
1.22E+02
10
1.22E+02
1.21E+02
1.21E+02
1.23E+02
1.21E+02
1.21E+02
1.23E+02
1.24E+02
1.22E+02
1.23E+02
1.21E+02
20
1.22E+02
1.22E+02
1.23E+02
1.24E+02
1.24E+02
1.23E+02
1.23E+02
1.22E+02
1.26E+02
1.21E+02
1.21E+02
30
1.25E+02
1.24E+02
1.24E+02
1.22E+02
1.21E+02
1.22E+02
1.21E+02
1.25E+02
1.21E+02
1.22E+02
1.23E+02
50
1.25E+02
1.25E+02
1.25E+02
1.27E+02
1.25E+02
1.25E+02
1.21E+02
1.22E+02
1.24E+02
1.23E+02
1.21E+02
24 hr
Anneal
60
1.23E+02
1.24E+02
1.24E+02
1.27E+02
1.24E+02
1.22E+02
1.25E+02
1.28E+02
1.23E+02
1.24E+02
1.23E+02
168 hr
Anneal
70
1.21E+02
1.25E+02
1.22E+02
1.22E+02
1.23E+02
1.23E+02
1.22E+02
1.24E+02
1.24E+02
1.22E+02
1.22E+02
1.22E+02 1.21E+02 1.23E+02 1.23E+02 1.25E+02 1.24E+02 1.23E+02
4.60E-01 9.19E-01 7.97E-01 1.60E+00 9.44E-01 1.48E+00 1.43E+00
1.23E+02 1.24E+02 1.25E+02 1.27E+02 1.28E+02 1.29E+02 1.27E+02
1.21E+02 1.19E+02 1.21E+02 1.19E+02 1.23E+02 1.20E+02 1.19E+02
1.23E+02
9.05E-01
1.25E+02
1.20E+02
1.04E+02
PASS
1.23E+02
1.05E+00
1.25E+02
1.20E+02
1.04E+02
PASS
1.23E+02
1.64E+00
1.27E+02
1.18E+02
1.04E+02
PASS
1.22E+02
1.54E+00
1.26E+02
1.18E+02
1.04E+02
PASS
An ISO 9001:2000 Certified Company
45
1.23E+02
1.62E+00
1.27E+02
1.19E+02
1.00E+02
PASS
1.24E+02
2.24E+00
1.31E+02
1.18E+02
1.00E+02
PASS
1.23E+02
8.87E-01
1.25E+02
1.20E+02
1.00E+02
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +5V, RL=open (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.20. Plot of Open Loop Gain 2 @ +5V, RL=open (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
46
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.20. Raw data for Open Loop Gain 2 @ +5V, RL=open (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
50
1.25E+02
1.25E+02
1.24E+02
1.27E+02
1.21E+02
1.22E+02
1.22E+02
1.25E+02
1.22E+02
1.24E+02
1.21E+02
24 hr
Anneal
60
1.27E+02
1.25E+02
1.24E+02
1.28E+02
1.22E+02
1.23E+02
1.24E+02
1.23E+02
1.21E+02
1.21E+02
1.22E+02
168 hr
Anneal
70
1.25E+02
1.24E+02
1.23E+02
1.24E+02
1.20E+02
1.24E+02
1.22E+02
1.24E+02
1.23E+02
1.21E+02
1.22E+02
1.22E+02 1.22E+02 1.22E+02 1.23E+02 1.24E+02
5.57E-01 8.66E-01 1.70E+00 2.17E+00 1.89E+00
1.24E+02 1.24E+02 1.27E+02 1.29E+02 1.29E+02
1.21E+02 1.20E+02 1.18E+02 1.17E+02 1.19E+02
1.25E+02
2.41E+00
1.32E+02
1.19E+02
1.23E+02
1.81E+00
1.28E+02
1.18E+02
1.22E+02
1.38E+00
1.26E+02
1.19E+02
1.00E+02
PASS
1.23E+02
1.37E+00
1.27E+02
1.19E+02
1.00E+02
PASS
Total Dose (krad(Si))
Open Loop Gain 2 @ +5V, RL=open (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.23E+02
1.22E+02
1.23E+02
1.23E+02
1.21E+02
1.22E+02
1.22E+02
1.23E+02
1.23E+02
1.22E+02
1.22E+02
1.22E+02
7.17E-01
1.24E+02
1.20E+02
1.04E+02
PASS
10
1.22E+02
1.22E+02
1.22E+02
1.23E+02
1.21E+02
1.22E+02
1.21E+02
1.24E+02
1.23E+02
1.22E+02
1.21E+02
1.22E+02
9.14E-01
1.25E+02
1.20E+02
1.04E+02
PASS
20
1.24E+02
1.24E+02
1.22E+02
1.23E+02
1.20E+02
1.24E+02
1.21E+02
1.22E+02
1.23E+02
1.23E+02
1.22E+02
1.23E+02
1.22E+00
1.26E+02
1.19E+02
1.04E+02
PASS
30
1.26E+02
1.22E+02
1.22E+02
1.26E+02
1.21E+02
1.21E+02
1.22E+02
1.25E+02
1.24E+02
1.22E+02
1.21E+02
1.23E+02
1.40E+00
1.27E+02
1.19E+02
1.04E+02
PASS
An ISO 9001:2000 Certified Company
47
1.23E+02
1.45E+00
1.27E+02
1.19E+02
1.00E+02
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +5V, RL=50kΩ (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.21. Plot of Open Loop Gain 1 @ +5V, RL=50kΩ (dB) versus total dose. The data show some
degradation with radiation, however not sufficient to cause the parameter to exceed the specification value.
The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
48
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.21. Raw data for Open Loop Gain 1 @ +5V, RL=50kΩ (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
0
1.28E+02
1.23E+02
1.24E+02
1.23E+02
1.25E+02
1.22E+02
1.27E+02
1.23E+02
1.22E+02
1.25E+02
1.24E+02
10
1.23E+02
1.19E+02
1.22E+02
1.21E+02
1.21E+02
1.21E+02
1.25E+02
1.21E+02
1.20E+02
1.23E+02
1.22E+02
20
1.20E+02
1.17E+02
1.22E+02
1.19E+02
1.21E+02
1.19E+02
1.22E+02
1.15E+02
1.19E+02
1.18E+02
1.23E+02
30
1.17E+02
1.16E+02
1.18E+02
1.16E+02
1.17E+02
1.18E+02
1.19E+02
1.15E+02
1.16E+02
1.18E+02
1.25E+02
50
1.13E+02
1.12E+02
1.16E+02
1.13E+02
1.15E+02
1.13E+02
1.15E+02
1.11E+02
1.12E+02
1.14E+02
1.23E+02
24 hr
Anneal
60
1.13E+02
1.12E+02
1.14E+02
1.13E+02
1.15E+02
1.13E+02
1.16E+02
1.11E+02
1.12E+02
1.14E+02
1.25E+02
1.25E+02
2.05E+00
1.30E+02
1.19E+02
1.21E+02
1.47E+00
1.25E+02
1.17E+02
1.20E+02
1.63E+00
1.24E+02
1.15E+02
1.17E+02
1.01E+00
1.20E+02
1.14E+02
1.14E+02
1.72E+00
1.19E+02
1.09E+02
1.14E+02
1.04E+00
1.16E+02
1.11E+02
1.17E+02
1.82E+00
1.22E+02
1.12E+02
1.24E+02
1.96E+00
1.29E+02
1.18E+02
1.02E+02
PASS
1.22E+02
1.91E+00
1.27E+02
1.17E+02
1.02E+02
PASS
1.19E+02
2.34E+00
1.25E+02
1.12E+02
1.02E+02
PASS
1.17E+02
1.83E+00
1.22E+02
1.12E+02
9.40E+01
PASS
1.13E+02
1.42E+00
1.17E+02
1.09E+02
8.60E+01
PASS
1.13E+02
1.88E+00
1.19E+02
1.08E+02
8.60E+01
PASS
1.18E+02
2.59E+00
1.25E+02
1.11E+02
8.60E+01
PASS
Total Dose (krad(Si))
Open Loop Gain 1 @ +5V, RL=50kΩ (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
An ISO 9001:2000 Certified Company
49
168 hr
Anneal
70
1.18E+02
1.16E+02
1.19E+02
1.15E+02
1.19E+02
1.17E+02
1.22E+02
1.15E+02
1.18E+02
1.19E+02
1.23E+02
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +5V, RL=50kΩ (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.22. Plot of Open Loop Gain 2 @ +5V, RL=50kΩ (dB) versus total dose. The data show some
degradation with radiation, however not sufficient to cause the parameter to exceed the final post-irradiation
specification value. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
50
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.22. Raw data for Open Loop Gain 2 @ +5V, RL=50kΩ (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
0
1.23E+02
1.24E+02
1.24E+02
1.21E+02
1.34E+02
1.24E+02
1.24E+02
1.22E+02
1.27E+02
1.23E+02
1.27E+02
10
1.20E+02
1.21E+02
1.23E+02
1.19E+02
1.34E+02
1.23E+02
1.22E+02
1.19E+02
1.24E+02
1.22E+02
1.28E+02
20
1.18E+02
1.17E+02
1.19E+02
1.17E+02
1.29E+02
1.20E+02
1.19E+02
1.17E+02
1.20E+02
1.19E+02
1.28E+02
30
1.15E+02
1.16E+02
1.17E+02
1.15E+02
1.28E+02
1.18E+02
1.17E+02
1.16E+02
1.19E+02
1.16E+02
1.27E+02
50
1.12E+02
1.12E+02
1.14E+02
1.11E+02
1.22E+02
1.15E+02
1.14E+02
1.12E+02
1.16E+02
1.14E+02
1.27E+02
24 hr
Anneal
60
1.12E+02
1.12E+02
1.14E+02
1.12E+02
1.22E+02
1.15E+02
1.15E+02
1.13E+02
1.15E+02
1.13E+02
1.27E+02
1.25E+02
5.00E+00
1.39E+02
1.11E+02
1.24E+02
6.33E+00
1.41E+02
1.06E+02
1.20E+02
5.16E+00
1.34E+02
1.06E+02
1.18E+02
5.28E+00
1.33E+02
1.04E+02
1.14E+02
4.53E+00
1.27E+02
1.02E+02
1.15E+02
4.48E+00
1.27E+02
1.02E+02
1.17E+02
1.86E+00
1.22E+02
1.12E+02
1.24E+02
1.85E+00
1.29E+02
1.19E+02
1.02E+02
PASS
1.22E+02
1.78E+00
1.27E+02
1.17E+02
1.02E+02
PASS
1.19E+02
1.23E+00
1.23E+02
1.16E+02
1.02E+02
PASS
1.17E+02
1.25E+00
1.21E+02
1.14E+02
9.40E+01
PASS
1.14E+02
1.37E+00
1.18E+02
1.10E+02
8.60E+01
PASS
1.14E+02
9.91E-01
1.17E+02
1.11E+02
8.60E+01
PASS
1.18E+02
1.57E+00
1.22E+02
1.14E+02
8.60E+01
PASS
Total Dose (krad(Si))
Open Loop Gain 2 @ +5V, RL=50kΩ (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
An ISO 9001:2000 Certified Company
51
168 hr
Anneal
70
1.16E+02
1.17E+02
1.18E+02
1.15E+02
1.20E+02
1.20E+02
1.18E+02
1.16E+02
1.20E+02
1.17E+02
1.28E+02
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 1 @ +5V RL=open (V)
1.40E-02
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.23. Plot of Output Voltage Low 1 @ +5V RL=open (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
52
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.23. Raw data for Output Voltage Low 1 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +5V RL=open (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.26E-03
4.50E-03
4.40E-03
4.47E-03
4.40E-03
4.42E-03
4.35E-03
4.42E-03
4.36E-03
4.31E-03
4.43E-03
10
4.98E-03
5.12E-03
5.03E-03
5.05E-03
4.96E-03
5.02E-03
5.08E-03
5.00E-03
5.12E-03
5.02E-03
4.78E-03
20
5.27E-03
5.54E-03
5.30E-03
5.32E-03
5.23E-03
5.27E-03
5.32E-03
5.30E-03
5.42E-03
5.17E-03
4.73E-03
30
5.50E-03
5.76E-03
5.62E-03
5.69E-03
5.40E-03
5.50E-03
5.60E-03
5.67E-03
5.81E-03
5.49E-03
4.91E-03
50
6.11E-03
6.41E-03
6.28E-03
6.23E-03
6.01E-03
6.09E-03
6.19E-03
6.25E-03
6.50E-03
6.11E-03
4.85E-03
60
6.11E-03
6.31E-03
6.19E-03
6.21E-03
5.84E-03
6.04E-03
6.19E-03
6.28E-03
6.38E-03
6.08E-03
4.86E-03
70
5.76E-03
6.04E-03
5.79E-03
5.89E-03
5.66E-03
5.57E-03
5.66E-03
5.60E-03
5.82E-03
5.47E-03
4.86E-03
4.41E-03
9.26E-05
4.66E-03
4.15E-03
5.03E-03
6.30E-05
5.20E-03
4.86E-03
5.33E-03
1.21E-04
5.66E-03
5.00E-03
5.59E-03
1.45E-04
5.99E-03
5.20E-03
6.21E-03
1.54E-04
6.63E-03
5.78E-03
6.13E-03
1.78E-04
6.62E-03
5.64E-03
5.83E-03
1.44E-04
6.22E-03
5.43E-03
4.37E-03
5.05E-03
5.30E-03
5.61E-03 6.23E-03
4.76E-05
5.02E-05
9.02E-05
1.32E-04 1.65E-04
4.50E-03
5.19E-03
5.54E-03
5.98E-03 6.68E-03
4.24E-03
4.91E-03
5.05E-03
5.25E-03 5.78E-03
6.00E-03
6.00E-03
6.00E-03
9.00E-03 1.30E-02
PASS
PASS
PASS
PASS
PASS
6.19E-03
1.40E-04
6.58E-03
5.81E-03
1.30E-02
PASS
5.62E-03
1.29E-04
5.98E-03
5.27E-03
1.30E-02
PASS
An ISO 9001:2000 Certified Company
53
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 2 @ +5V RL=open (V)
1.40E-02
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.24. Plot of Output Voltage Low 2 @ +5V RL=open (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
54
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.24. Raw data for Output Voltage Low 2 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
Total Dose (krad(Si))
Output Voltage Low 2 @ +5V RL=open (V)
168 hr
Anneal
0
4.28E-03
4.21E-03
4.15E-03
4.26E-03
4.15E-03
4.18E-03
4.09E-03
4.09E-03
4.25E-03
4.15E-03
4.13E-03
10
4.90E-03
5.00E-03
4.71E-03
5.05E-03
4.61E-03
4.90E-03
4.85E-03
4.88E-03
4.95E-03
4.71E-03
4.37E-03
20
5.35E-03
5.33E-03
5.06E-03
5.37E-03
4.79E-03
5.05E-03
5.00E-03
5.11E-03
5.27E-03
4.95E-03
4.41E-03
30
5.67E-03
5.69E-03
5.45E-03
5.69E-03
5.13E-03
5.47E-03
5.47E-03
5.47E-03
5.54E-03
5.32E-03
4.48E-03
50
6.40E-03
6.50E-03
6.09E-03
6.43E-03
5.60E-03
6.03E-03
6.01E-03
6.06E-03
6.19E-03
5.76E-03
4.44E-03
60
6.46E-03
6.35E-03
6.09E-03
6.46E-03
5.55E-03
5.99E-03
5.96E-03
5.98E-03
6.16E-03
5.82E-03
4.37E-03
70
5.86E-03
5.98E-03
5.60E-03
5.98E-03
5.40E-03
5.49E-03
5.37E-03
5.45E-03
5.59E-03
5.28E-03
4.43E-03
4.21E-03
6.04E-05
4.38E-03
4.04E-03
4.85E-03
1.88E-04
5.37E-03
4.34E-03
5.18E-03
2.52E-04
5.87E-03
4.49E-03
5.53E-03
2.43E-04
6.19E-03
4.86E-03
6.20E-03
3.72E-04
7.23E-03
5.18E-03
6.18E-03
3.84E-04
7.24E-03
5.13E-03
5.76E-03
2.56E-04
6.47E-03
5.06E-03
4.15E-03
4.86E-03
5.08E-03
5.45E-03 6.01E-03
6.72E-05
9.04E-05
1.24E-04
8.08E-05 1.56E-04
4.34E-03
5.11E-03
5.41E-03
5.68E-03 6.44E-03
3.97E-03
4.61E-03
4.74E-03
5.23E-03 5.58E-03
6.00E-03
6.00E-03
6.00E-03
9.00E-03 1.30E-02
PASS
PASS
PASS
PASS
PASS
5.98E-03
1.21E-04
6.31E-03
5.65E-03
1.30E-02
PASS
5.44E-03
1.18E-04
5.76E-03
5.11E-03
1.30E-02
PASS
An ISO 9001:2000 Certified Company
55
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 1 @ +5V RL=2kΩ (V)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.25. Plot of Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
56
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.25. Raw data for Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +5V RL=2kΩ (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
9.90E-04
9.60E-04
9.80E-04
9.40E-04
9.70E-04
9.80E-04
9.40E-04
9.30E-04
8.60E-04
9.70E-04
9.80E-04
10
9.70E-04
8.90E-04
9.50E-04
9.50E-04
1.00E-03
9.70E-04
9.50E-04
9.40E-04
9.10E-04
9.80E-04
9.70E-04
20
8.80E-04
8.20E-04
8.60E-04
8.50E-04
9.00E-04
9.30E-04
8.70E-04
8.50E-04
8.10E-04
8.80E-04
9.00E-04
30
9.00E-04
8.70E-04
9.00E-04
9.00E-04
9.20E-04
9.60E-04
9.40E-04
9.30E-04
8.30E-04
9.40E-04
9.60E-04
50
7.80E-04
7.30E-04
7.90E-04
7.60E-04
8.20E-04
8.40E-04
8.30E-04
7.60E-04
7.50E-04
8.10E-04
9.00E-04
60
7.60E-04
7.10E-04
7.60E-04
7.50E-04
7.90E-04
8.70E-04
8.20E-04
8.00E-04
7.80E-04
8.20E-04
8.70E-04
70
7.40E-04
7.20E-04
7.60E-04
7.50E-04
7.90E-04
8.60E-04
9.00E-04
8.10E-04
7.60E-04
8.20E-04
8.80E-04
9.68E-04
1.92E-05
1.02E-03
9.15E-04
9.52E-04
4.02E-05
1.06E-03
8.42E-04
8.62E-04
3.03E-05
9.45E-04
7.79E-04
8.98E-04
1.79E-05
9.47E-04
8.49E-04
7.76E-04
3.36E-05
8.68E-04
6.84E-04
7.54E-04
2.88E-05
8.33E-04
6.75E-04
7.52E-04
2.59E-05
8.23E-04
6.81E-04
9.36E-04
9.50E-04
8.68E-04
9.20E-04 7.98E-04
4.72E-05
2.74E-05
4.38E-05
5.15E-05 4.09E-05
1.07E-03
1.03E-03
9.88E-04
1.06E-03 9.10E-04
8.07E-04
8.75E-04
7.48E-04
7.79E-04 6.86E-04
2.00E-03
2.00E-03
2.00E-03
2.00E-03 2.00E-03
PASS
PASS
PASS
PASS
PASS
8.18E-04
3.35E-05
9.10E-04
7.26E-04
2.00E-03
PASS
8.30E-04
5.29E-05
9.75E-04
6.85E-04
2.00E-03
PASS
An ISO 9001:2000 Certified Company
57
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 2 @ +5V RL=2kΩ (V)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.26. Plot of Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
58
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.26. Raw data for Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +5V RL=2kΩ (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.90E-04
9.20E-04
9.20E-04
9.10E-04
1.10E-03
9.20E-04
8.90E-04
8.90E-04
8.70E-04
9.00E-04
9.60E-04
10
9.00E-04
9.30E-04
9.50E-04
9.10E-04
1.08E-03
9.10E-04
9.00E-04
8.80E-04
8.90E-04
9.40E-04
9.60E-04
20
8.60E-04
8.30E-04
8.90E-04
8.20E-04
1.02E-03
8.40E-04
7.90E-04
7.80E-04
8.10E-04
8.70E-04
9.00E-04
30
8.80E-04
9.00E-04
9.40E-04
8.60E-04
1.04E-03
9.10E-04
8.60E-04
8.70E-04
8.70E-04
8.80E-04
9.20E-04
50
8.20E-04
7.70E-04
8.70E-04
7.90E-04
9.30E-04
7.90E-04
8.00E-04
7.80E-04
7.60E-04
8.10E-04
8.90E-04
60
8.10E-04
7.90E-04
8.60E-04
7.80E-04
9.60E-04
7.80E-04
7.90E-04
7.50E-04
7.70E-04
8.00E-04
8.80E-04
70
7.40E-04
7.40E-04
7.60E-04
7.30E-04
9.40E-04
7.70E-04
8.70E-04
7.60E-04
7.90E-04
8.10E-04
8.80E-04
9.48E-04
8.58E-05
1.18E-03
7.13E-04
9.54E-04
7.30E-05
1.15E-03
7.54E-04
8.84E-04
8.08E-05
1.11E-03
6.62E-04
9.24E-04
7.13E-05
1.12E-03
7.29E-04
8.36E-04
6.47E-05
1.01E-03
6.59E-04
8.40E-04
7.38E-05
1.04E-03
6.38E-04
7.82E-04
8.90E-05
1.03E-03
5.38E-04
8.94E-04
9.04E-04
8.18E-04
8.78E-04 7.88E-04
1.82E-05
2.30E-05
3.70E-05
1.92E-05 1.92E-05
9.44E-04
9.67E-04
9.19E-04
9.31E-04 8.41E-04
8.44E-04
8.41E-04
7.17E-04
8.25E-04 7.35E-04
2.00E-03
2.00E-03
2.00E-03
2.00E-03 2.00E-03
PASS
PASS
PASS
PASS
PASS
7.78E-04
1.92E-05
8.31E-04
7.25E-04
2.00E-03
PASS
8.00E-04
4.36E-05
9.20E-04
6.80E-04
2.00E-03
PASS
An ISO 9001:2000 Certified Company
59
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 1 @ +5V IL=100uA (V)
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.27. Plot of Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
60
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.27. Raw data for Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +5V IL=100uA (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.61E-02
8.83E-02
8.56E-02
8.67E-02
8.82E-02
8.69E-02
8.67E-02
8.69E-02
8.80E-02
8.56E-02
8.58E-02
10
8.79E-02
9.03E-02
8.72E-02
8.86E-02
8.98E-02
8.86E-02
8.82E-02
8.89E-02
8.98E-02
8.71E-02
8.62E-02
20
8.89E-02
9.13E-02
8.83E-02
8.94E-02
9.08E-02
8.97E-02
8.91E-02
8.97E-02
9.08E-02
8.82E-02
8.61E-02
30
9.11E-02
9.36E-02
9.05E-02
9.17E-02
9.30E-02
9.16E-02
9.12E-02
9.18E-02
9.29E-02
9.04E-02
8.69E-02
50
9.48E-02
9.72E-02
9.37E-02
9.51E-02
9.61E-02
9.39E-02
9.35E-02
9.42E-02
9.55E-02
9.26E-02
8.66E-02
60
9.47E-02
9.69E-02
9.37E-02
9.50E-02
9.61E-02
9.35E-02
9.31E-02
9.39E-02
9.53E-02
9.24E-02
8.64E-02
70
9.32E-02
9.61E-02
9.24E-02
9.42E-02
9.51E-02
9.15E-02
9.12E-02
9.16E-02
9.30E-02
9.02E-02
8.62E-02
8.70E-02
1.23E-03
9.03E-02
8.36E-02
8.88E-02
1.28E-03
9.23E-02
8.52E-02
8.97E-02
1.25E-03
9.32E-02
8.63E-02
9.20E-02
1.27E-03
9.55E-02
8.85E-02
9.54E-02
1.30E-03
9.89E-02
9.18E-02
9.53E-02
1.25E-03
9.87E-02
9.18E-02
9.42E-02
1.47E-03
9.82E-02
9.02E-02
8.68E-02
8.85E-02
8.95E-02
9.16E-02 9.39E-02
8.48E-04
9.66E-04
9.52E-04
9.12E-04 1.07E-03
8.91E-02
9.12E-02
9.21E-02
9.41E-02 9.69E-02
8.45E-02
8.59E-02
8.69E-02
8.91E-02 9.10E-02
1.30E-01
1.30E-01
1.30E-01
1.40E-01 1.50E-01
PASS
PASS
PASS
PASS
PASS
9.36E-02
1.08E-03
9.66E-02
9.07E-02
1.50E-01
PASS
9.15E-02
9.78E-04
9.42E-02
8.88E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
61
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 2 @ +5V IL=100uA (V)
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.28. Plot of Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
62
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.28. Raw data for Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +5V IL=100uA (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.57E-02
8.63E-02
8.28E-02
8.64E-02
8.34E-02
8.65E-02
8.49E-02
8.59E-02
8.63E-02
8.40E-02
8.33E-02
10
8.75E-02
8.81E-02
8.46E-02
8.81E-02
8.48E-02
8.81E-02
8.64E-02
8.79E-02
8.82E-02
8.57E-02
8.35E-02
20
8.85E-02
8.91E-02
8.55E-02
8.90E-02
8.57E-02
8.91E-02
8.74E-02
8.87E-02
8.91E-02
8.66E-02
8.35E-02
30
9.08E-02
9.14E-02
8.76E-02
9.14E-02
8.76E-02
9.11E-02
8.95E-02
9.06E-02
9.12E-02
8.87E-02
8.43E-02
50
9.44E-02
9.45E-02
9.08E-02
9.46E-02
9.03E-02
9.31E-02
9.17E-02
9.31E-02
9.39E-02
9.09E-02
8.40E-02
60
9.43E-02
9.45E-02
9.07E-02
9.45E-02
9.03E-02
9.29E-02
9.12E-02
9.28E-02
9.34E-02
9.08E-02
8.38E-02
70
9.30E-02
9.37E-02
8.94E-02
9.38E-02
8.95E-02
9.08E-02
8.95E-02
9.06E-02
9.13E-02
8.87E-02
8.36E-02
8.49E-02
1.69E-03
8.95E-02
8.03E-02
8.66E-02
1.78E-03
9.15E-02
8.17E-02
8.76E-02
1.80E-03
9.25E-02
8.26E-02
8.97E-02
1.98E-03
9.52E-02
8.43E-02
9.29E-02
2.19E-03
9.89E-02
8.69E-02
9.28E-02
2.17E-03
9.88E-02
8.69E-02
9.19E-02
2.24E-03
9.80E-02
8.57E-02
8.55E-02
8.72E-02
8.82E-02
9.02E-02 9.25E-02
1.06E-03
1.14E-03
1.12E-03
1.07E-03 1.18E-03
8.84E-02
9.04E-02
9.12E-02
9.32E-02 9.58E-02
8.26E-02
8.41E-02
8.51E-02
8.73E-02 8.93E-02
1.30E-01
1.30E-01
1.30E-01
1.40E-01 1.50E-01
PASS
PASS
PASS
PASS
PASS
9.22E-02
1.16E-03
9.54E-02
8.91E-02
1.50E-01
PASS
9.02E-02
1.06E-03
9.31E-02
8.73E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
63
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +5V RL=open (V)
4.40E+00
4.38E+00
4.36E+00
4.34E+00
4.32E+00
4.30E+00
4.28E+00
4.26E+00
4.24E+00
4.22E+00
4.20E+00
4.18E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.29. Plot of Output Voltage High 1 @ +5V RL=open (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
64
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.29. Raw data for Output Voltage High 1 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +5V RL=open (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
4.38E+00
4.31E+00
4.38E+00
4.38E+00
4.39E+00
4.37E+00
4.37E+00
4.38E+00
4.38E+00
4.37E+00
4.35E+00
70
4.37E+00
4.37E+00
4.38E+00
4.38E+00
4.38E+00
4.36E+00
4.37E+00
4.37E+00
4.37E+00
4.37E+00
4.35E+00
0
4.30E+00
4.31E+00
4.30E+00
4.30E+00
4.31E+00
4.30E+00
4.30E+00
4.30E+00
4.30E+00
4.30E+00
4.30E+00
10
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.35E+00
20
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.35E+00
30
4.37E+00
4.37E+00
4.37E+00
4.37E+00
4.37E+00
4.37E+00
4.37E+00
4.37E+00
4.37E+00
4.37E+00
4.36E+00
4.30E+00
3.21E-03
4.31E+00
4.29E+00
4.36E+00
3.03E-03
4.37E+00
4.35E+00
4.36E+00
3.44E-03
4.37E+00
4.35E+00
4.37E+00 4.36E+00 4.37E+00 4.37E+00
3.36E-03 4.11E-02 3.11E-02 4.45E-03
4.38E+00 4.48E+00 4.45E+00 4.39E+00
4.36E+00 4.25E+00 4.28E+00 4.36E+00
4.30E+00 4.36E+00 4.36E+00 4.37E+00
1.30E-03
2.49E-03
1.41E-03
1.92E-03
4.31E+00 4.37E+00 4.36E+00 4.37E+00
4.30E+00 4.35E+00 4.35E+00 4.36E+00
4.20E+00 4.20E+00 4.20E+00 4.20E+00
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
65
50
4.38E+00
4.29E+00
4.38E+00
4.38E+00
4.39E+00
4.37E+00
4.38E+00
4.38E+00
4.38E+00
4.38E+00
4.36E+00
24 hr
Anneal
4.38E+00
3.56E-03
4.38E+00
4.37E+00
4.20E+00
PASS
4.37E+00
3.29E-03
4.38E+00
4.36E+00
4.20E+00
PASS
4.37E+00
2.70E-03
4.37E+00
4.36E+00
4.20E+00
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +5V RL=open (V)
4.38E+00
4.36E+00
4.34E+00
4.32E+00
4.30E+00
4.28E+00
4.26E+00
4.24E+00
4.22E+00
4.20E+00
4.18E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.30. Plot of Output Voltage High 2 @ +5V RL=open (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
66
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.30. Raw data for Output Voltage High 2 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +5V RL=open (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
4.37E+00
4.37E+00
4.36E+00
4.37E+00
4.36E+00
4.36E+00
4.36E+00
4.37E+00
4.36E+00
4.36E+00
4.34E+00
70
4.37E+00
4.37E+00
4.36E+00
4.37E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.34E+00
0
4.30E+00
4.30E+00
4.29E+00
4.30E+00
4.29E+00
4.30E+00
4.30E+00
4.30E+00
4.29E+00
4.30E+00
4.29E+00
10
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.34E+00
20
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.34E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.34E+00
30
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.35E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.35E+00
4.29E+00
2.70E-03
4.30E+00
4.29E+00
4.35E+00
3.24E-03
4.36E+00
4.34E+00
4.35E+00
3.11E-03
4.36E+00
4.34E+00
4.36E+00 4.37E+00 4.37E+00 4.36E+00
3.96E-03 6.78E-03 6.02E-03 5.97E-03
4.37E+00 4.39E+00 4.38E+00 4.38E+00
4.35E+00 4.35E+00 4.35E+00 4.35E+00
4.30E+00 4.35E+00 4.35E+00 4.36E+00
1.41E-03
1.92E-03
1.79E-03
1.58E-03
4.30E+00 4.36E+00 4.35E+00 4.36E+00
4.29E+00 4.35E+00 4.34E+00 4.36E+00
4.20E+00 4.20E+00 4.20E+00 4.20E+00
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
67
50
4.38E+00
4.37E+00
4.36E+00
4.37E+00
4.36E+00
4.36E+00
4.37E+00
4.37E+00
4.37E+00
4.37E+00
4.35E+00
24 hr
Anneal
4.37E+00
1.79E-03
4.37E+00
4.36E+00
4.20E+00
PASS
4.36E+00
1.67E-03
4.37E+00
4.36E+00
4.20E+00
PASS
4.36E+00
1.79E-03
4.36E+00
4.35E+00
4.20E+00
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +5V RL=2kΩ (V)
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
3.45E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.31. Plot of Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
68
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.31. Raw data for Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +5V RL=2kΩ (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
3.90E+00
3.89E+00
3.89E+00
3.90E+00
3.93E+00
3.90E+00
3.91E+00
3.89E+00
3.88E+00
3.91E+00
3.91E+00
70
3.90E+00
3.89E+00
3.89E+00
3.90E+00
3.93E+00
3.90E+00
3.91E+00
3.90E+00
3.88E+00
3.91E+00
3.90E+00
0
3.86E+00
3.85E+00
3.85E+00
3.86E+00
3.89E+00
3.86E+00
3.87E+00
3.86E+00
3.84E+00
3.87E+00
3.86E+00
10
3.90E+00
3.90E+00
3.90E+00
3.91E+00
3.93E+00
3.91E+00
3.91E+00
3.90E+00
3.88E+00
3.92E+00
3.90E+00
20
3.90E+00
3.89E+00
3.89E+00
3.90E+00
3.93E+00
3.90E+00
3.91E+00
3.90E+00
3.88E+00
3.91E+00
3.90E+00
30
3.90E+00
3.90E+00
3.90E+00
3.90E+00
3.93E+00
3.91E+00
3.91E+00
3.90E+00
3.88E+00
3.91E+00
3.91E+00
3.86E+00
1.41E-02
3.90E+00
3.82E+00
3.91E+00
1.44E-02
3.95E+00
3.87E+00
3.90E+00
1.48E-02
3.94E+00
3.86E+00
3.90E+00 3.90E+00 3.90E+00 3.90E+00
1.52E-02 1.54E-02 1.54E-02 1.46E-02
3.95E+00 3.94E+00 3.94E+00 3.94E+00
3.86E+00 3.86E+00 3.86E+00 3.86E+00
3.86E+00 3.90E+00 3.90E+00 3.90E+00
1.21E-02
1.23E-02
1.28E-02
1.30E-02
3.89E+00 3.94E+00 3.93E+00 3.94E+00
3.82E+00 3.87E+00 3.86E+00 3.87E+00
3.50E+00 3.50E+00 3.50E+00 3.50E+00
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
69
50
3.90E+00
3.89E+00
3.89E+00
3.90E+00
3.93E+00
3.90E+00
3.91E+00
3.89E+00
3.88E+00
3.91E+00
3.91E+00
24 hr
Anneal
3.90E+00
1.29E-02
3.93E+00
3.86E+00
3.50E+00
PASS
3.90E+00
1.27E-02
3.93E+00
3.86E+00
3.50E+00
PASS
3.90E+00
1.33E-02
3.94E+00
3.86E+00
3.50E+00
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +5V RL=2kΩ (V)
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
3.45E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.32. Plot of Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
70
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.32. Raw data for Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +5V RL=2kΩ (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.96E+00
3.93E+00
3.94E+00
3.93E+00
3.91E+00
3.94E+00
3.94E+00
70
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.96E+00
3.94E+00
3.94E+00
3.93E+00
3.92E+00
3.95E+00
3.94E+00
0
3.89E+00
3.89E+00
3.89E+00
3.89E+00
3.91E+00
3.90E+00
3.90E+00
3.89E+00
3.88E+00
3.90E+00
3.89E+00
10
3.94E+00
3.93E+00
3.94E+00
3.94E+00
3.96E+00
3.94E+00
3.95E+00
3.94E+00
3.92E+00
3.95E+00
3.94E+00
20
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.95E+00
3.94E+00
3.94E+00
3.93E+00
3.91E+00
3.94E+00
3.94E+00
30
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.96E+00
3.94E+00
3.95E+00
3.94E+00
3.92E+00
3.95E+00
3.94E+00
3.90E+00
1.02E-02
3.92E+00
3.87E+00
3.94E+00
1.10E-02
3.97E+00
3.91E+00
3.93E+00
1.16E-02
3.97E+00
3.90E+00
3.94E+00 3.93E+00 3.93E+00 3.94E+00
1.15E-02 1.20E-02 1.21E-02 1.13E-02
3.97E+00 3.97E+00 3.97E+00 3.97E+00
3.91E+00 3.90E+00 3.90E+00 3.90E+00
3.89E+00 3.94E+00 3.93E+00 3.94E+00
1.12E-02
1.12E-02
1.22E-02
1.18E-02
3.92E+00 3.97E+00 3.97E+00 3.97E+00
3.86E+00 3.91E+00 3.90E+00 3.90E+00
3.50E+00 3.50E+00 3.50E+00 3.50E+00
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
71
50
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.96E+00
3.93E+00
3.94E+00
3.93E+00
3.91E+00
3.94E+00
3.94E+00
24 hr
Anneal
3.93E+00
1.19E-02
3.96E+00
3.90E+00
3.50E+00
PASS
3.93E+00
1.20E-02
3.96E+00
3.90E+00
3.50E+00
PASS
3.93E+00
1.24E-02
3.97E+00
3.90E+00
3.50E+00
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E-01
Positive Slew Rate 1 @ +5V (V/us)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.33. Plot of Positive Slew Rate 1 @ +5V (V/us) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
72
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.33. Raw data for Positive Slew Rate 1 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 1 @ +5V (V/us)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
8.40E-02
8.10E-02
8.70E-02
8.30E-02
9.50E-02
8.40E-02
8.70E-02
8.30E-02
8.00E-02
8.90E-02
8.60E-02
10
7.90E-02
7.90E-02
8.50E-02
8.10E-02
9.20E-02
8.10E-02
8.30E-02
8.10E-02
7.60E-02
8.60E-02
8.60E-02
20
7.80E-02
7.50E-02
8.30E-02
7.70E-02
8.80E-02
7.90E-02
8.20E-02
7.80E-02
7.30E-02
8.10E-02
8.40E-02
30
7.60E-02
7.30E-02
8.00E-02
7.60E-02
8.90E-02
7.70E-02
8.10E-02
7.60E-02
7.30E-02
8.10E-02
8.60E-02
50
7.20E-02
7.40E-02
7.70E-02
7.20E-02
8.60E-02
7.30E-02
7.60E-02
7.20E-02
6.80E-02
7.90E-02
8.60E-02
60
7.20E-02
6.60E-02
7.70E-02
7.20E-02
8.50E-02
7.30E-02
7.50E-02
7.20E-02
6.80E-02
7.80E-02
8.40E-02
70
7.50E-02
7.00E-02
7.80E-02
7.40E-02
8.60E-02
7.70E-02
8.00E-02
7.60E-02
7.20E-02
8.00E-02
8.60E-02
8.60E-02
5.48E-03
1.01E-01
7.10E-02
8.32E-02
5.50E-03
9.83E-02
6.81E-02
8.02E-02
5.26E-03
9.46E-02
6.58E-02
7.88E-02
6.22E-03
9.59E-02
6.17E-02
7.62E-02
5.85E-03
9.22E-02
6.02E-02
7.44E-02
7.09E-03
9.38E-02
5.50E-02
7.66E-02
5.98E-03
9.30E-02
6.02E-02
8.46E-02
8.14E-02
7.86E-02
7.76E-02 7.36E-02
3.51E-03
3.65E-03
3.51E-03
3.44E-03 4.16E-03
9.42E-02
9.14E-02
8.82E-02
8.70E-02 8.50E-02
7.50E-02
7.14E-02
6.90E-02
6.82E-02 6.22E-02
4.00E-02
4.00E-02
4.00E-02
3.00E-02 2.00E-02
PASS
PASS
PASS
PASS
PASS
7.32E-02
3.70E-03
8.33E-02
6.31E-02
2.00E-02
PASS
7.70E-02
3.32E-03
8.61E-02
6.79E-02
2.00E-02
PASS
An ISO 9001:2000 Certified Company
73
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E-01
Positive Slew Rate 2 @ +5V (V/us)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.34. Plot of Positive Slew Rate 2 @ +5V (V/us) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
74
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.34. Raw data for Positive Slew Rate 2 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 2 @ +5V (V/us)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
8.40E-02
8.10E-02
8.80E-02
8.40E-02
9.60E-02
8.50E-02
8.70E-02
8.30E-02
8.00E-02
9.00E-02
8.70E-02
10
8.10E-02
7.80E-02
8.50E-02
8.20E-02
9.20E-02
8.10E-02
8.30E-02
8.10E-02
7.60E-02
8.60E-02
8.50E-02
20
7.80E-02
7.40E-02
8.20E-02
7.90E-02
8.80E-02
7.90E-02
8.20E-02
7.70E-02
7.30E-02
8.30E-02
8.40E-02
30
7.60E-02
7.40E-02
8.00E-02
7.60E-02
8.90E-02
7.90E-02
7.90E-02
7.70E-02
7.30E-02
8.20E-02
8.60E-02
50
7.40E-02
7.00E-02
7.60E-02
7.30E-02
8.60E-02
7.40E-02
7.60E-02
7.30E-02
6.90E-02
7.80E-02
8.50E-02
60
7.30E-02
7.10E-02
7.60E-02
7.50E-02
8.50E-02
7.30E-02
7.70E-02
7.30E-02
6.90E-02
7.70E-02
8.50E-02
70
7.50E-02
7.10E-02
7.80E-02
7.50E-02
8.60E-02
7.70E-02
7.90E-02
7.70E-02
7.30E-02
8.10E-02
8.80E-02
8.66E-02
5.81E-03
1.03E-01
7.07E-02
8.36E-02
5.32E-03
9.82E-02
6.90E-02
8.02E-02
5.22E-03
9.45E-02
6.59E-02
7.90E-02
6.00E-03
9.55E-02
6.25E-02
7.58E-02
6.10E-03
9.25E-02
5.91E-02
7.60E-02
5.39E-03
9.08E-02
6.12E-02
7.70E-02
5.61E-03
9.24E-02
6.16E-02
8.50E-02
8.14E-02
7.88E-02
7.80E-02 7.40E-02
3.81E-03
3.65E-03
4.02E-03
3.32E-03 3.39E-03
9.54E-02
9.14E-02
8.98E-02
8.71E-02 8.33E-02
7.46E-02
7.14E-02
6.78E-02
6.89E-02 6.47E-02
4.00E-02
4.00E-02
4.00E-02
3.00E-02 2.00E-02
PASS
PASS
PASS
PASS
PASS
7.38E-02
3.35E-03
8.30E-02
6.46E-02
2.00E-02
PASS
7.74E-02
2.97E-03
8.55E-02
6.93E-02
2.00E-02
PASS
An ISO 9001:2000 Certified Company
75
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Negative Slew Rate 1 @ +5V (V/us)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.35. Plot of Negative Slew Rate 1 @ +5V (V/us) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
76
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.35. Raw data for Negative Slew Rate 1 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 1 @ +5V (V/us)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
168 hr
Anneal
60
-4.50E-02
-4.50E-02
-4.60E-02
-4.60E-02
-5.20E-02
-4.80E-02
-4.80E-02
-4.80E-02
-4.40E-02
-5.20E-02
-5.20E-02
70
-4.70E-02
-4.40E-02
-4.90E-02
-4.70E-02
-5.60E-02
-5.20E-02
-5.20E-02
-5.00E-02
-4.70E-02
-5.30E-02
-5.30E-02
0
-5.00E-02
-4.90E-02
-5.30E-02
-5.00E-02
-5.70E-02
-5.00E-02
-5.20E-02
-5.00E-02
-4.70E-02
-5.30E-02
-5.20E-02
10
-4.90E-02
-4.80E-02
-5.10E-02
-4.90E-02
-5.60E-02
-4.90E-02
-5.10E-02
-4.90E-02
-4.70E-02
-5.20E-02
-5.60E-02
20
-4.90E-02
-4.60E-02
-5.00E-02
-4.80E-02
-5.50E-02
-5.00E-02
-4.70E-02
-5.00E-02
-4.40E-02
-5.20E-02
-5.20E-02
30
-4.80E-02
-4.60E-02
-4.90E-02
-4.80E-02
-5.50E-02
-5.00E-02
-5.10E-02
-4.90E-02
-4.60E-02
-5.00E-02
-5.30E-02
-5.18E-02
3.27E-03
-4.28E-02
-6.08E-02
-5.06E-02
3.21E-03
-4.18E-02
-5.94E-02
-4.96E-02
3.36E-03
-4.04E-02
-5.88E-02
-4.92E-02 -4.74E-02 -4.68E-02 -4.86E-02
3.42E-03 3.65E-03 2.95E-03 4.51E-03
-3.98E-02 -3.74E-02 -3.87E-02 -3.62E-02
-5.86E-02 -5.74E-02 -5.49E-02 -6.10E-02
-5.04E-02 -4.96E-02 -4.86E-02 -4.92E-02
2.30E-03
1.95E-03
3.13E-03
1.92E-03
-4.41E-02 -4.43E-02 -4.00E-02 -4.39E-02
-5.67E-02 -5.49E-02 -5.72E-02 -5.45E-02
-4.00E-02 -4.00E-02 -4.00E-02 -3.00E-02
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
77
50
-4.70E-02
-4.30E-02
-4.80E-02
-4.60E-02
-5.30E-02
-4.90E-02
-4.80E-02
-4.60E-02
-4.40E-02
-5.00E-02
-5.30E-02
24 hr
Anneal
-4.74E-02
2.41E-03
-4.08E-02
-5.40E-02
-2.00E-02
PASS
-4.80E-02
2.83E-03
-4.02E-02
-5.58E-02
-2.00E-02
PASS
-5.08E-02
2.39E-03
-4.43E-02
-5.73E-02
-2.00E-02
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Slew Rate 2 @ +5V (V/us)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.36. Plot of Negative Slew Rate 2 @ +5V (V/us) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
78
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.36. Raw data for Negative Slew Rate 2 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 2 @ +5V (V/us)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
-4.60E-02
-4.30E-02
-4.60E-02
-4.40E-02
-5.40E-02
-4.80E-02
-4.70E-02
-4.60E-02
-4.40E-02
-5.00E-02
-5.20E-02
70
-4.50E-02
-4.60E-02
-5.00E-02
-4.60E-02
-5.70E-02
-5.10E-02
-4.80E-02
-4.80E-02
-4.80E-02
-5.10E-02
-5.20E-02
0
-5.00E-02
-4.80E-02
-5.30E-02
-5.00E-02
-5.70E-02
-5.10E-02
-5.30E-02
-5.00E-02
-4.80E-02
-5.50E-02
-5.30E-02
10
-4.90E-02
-4.80E-02
-5.20E-02
-4.90E-02
-5.70E-02
-5.10E-02
-5.30E-02
-4.70E-02
-4.90E-02
-5.30E-02
-5.30E-02
20
-4.90E-02
-4.70E-02
-4.90E-02
-4.80E-02
-5.60E-02
-5.00E-02
-4.90E-02
-4.70E-02
-4.60E-02
-5.10E-02
-5.00E-02
30
-4.90E-02
-4.60E-02
-5.10E-02
-4.60E-02
-5.50E-02
-4.90E-02
-5.10E-02
-4.70E-02
-4.70E-02
-5.30E-02
-5.40E-02
-5.16E-02
3.51E-03
-4.20E-02
-6.12E-02
-5.10E-02
3.67E-03
-4.09E-02
-6.11E-02
-4.98E-02
3.56E-03
-4.00E-02
-5.96E-02
-4.94E-02 -4.68E-02 -4.66E-02 -4.88E-02
3.78E-03 4.21E-03 4.34E-03 4.97E-03
-3.90E-02 -3.53E-02 -3.47E-02 -3.52E-02
-5.98E-02 -5.83E-02 -5.85E-02 -6.24E-02
-5.14E-02 -5.06E-02 -4.86E-02 -4.94E-02
2.70E-03
2.61E-03
2.07E-03
2.61E-03
-4.40E-02 -4.34E-02 -4.29E-02 -4.22E-02
-5.88E-02 -5.78E-02 -5.43E-02 -5.66E-02
-4.00E-02 -4.00E-02 -4.00E-02 -3.00E-02
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
79
50
-4.40E-02
-4.40E-02
-4.70E-02
-4.50E-02
-5.40E-02
-4.70E-02
-5.00E-02
-4.40E-02
-4.40E-02
-5.10E-02
-5.40E-02
24 hr
Anneal
-4.72E-02
3.27E-03
-3.82E-02
-5.62E-02
-2.00E-02
PASS
-4.70E-02
2.24E-03
-4.09E-02
-5.31E-02
-2.00E-02
PASS
-4.92E-02
1.64E-03
-4.47E-02
-5.37E-02
-2.00E-02
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Supply Current @+15V (A)
2.50E-04
2.00E-04
1.50E-04
1.00E-04
5.00E-05
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.37. Plot of Positive Supply Current @+15V (A) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
80
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.37. Raw data for Positive Supply Current @+15V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @+15V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.02E-04
9.80E-05
1.05E-04
1.00E-04
1.12E-04
1.04E-04
1.00E-04
1.00E-04
9.90E-05
1.05E-04
1.06E-04
10
9.80E-05
9.50E-05
1.03E-04
9.80E-05
1.10E-04
1.01E-04
9.90E-05
9.70E-05
9.50E-05
1.01E-04
1.05E-04
20
9.40E-05
9.20E-05
9.90E-05
9.40E-05
1.05E-04
9.70E-05
9.50E-05
9.40E-05
9.10E-05
9.80E-05
1.05E-04
30
9.20E-05
8.80E-05
9.70E-05
9.20E-05
1.03E-04
9.50E-05
9.50E-05
9.10E-05
8.90E-05
9.60E-05
1.06E-04
50
8.40E-05
8.30E-05
9.00E-05
8.60E-05
9.80E-05
8.90E-05
8.80E-05
8.40E-05
8.30E-05
9.00E-05
1.06E-04
60
8.50E-05
8.30E-05
9.00E-05
8.40E-05
9.80E-05
8.80E-05
8.90E-05
8.40E-05
8.40E-05
9.00E-05
1.05E-04
70
8.80E-05
8.40E-05
9.20E-05
8.70E-05
9.90E-05
9.50E-05
9.40E-05
9.20E-05
8.80E-05
9.50E-05
1.06E-04
1.03E-04
5.46E-06
1.18E-04
8.84E-05
1.01E-04
5.89E-06
1.17E-04
8.46E-05
9.68E-05
5.26E-06
1.11E-04
8.24E-05
9.44E-05
5.77E-06
1.10E-04
7.86E-05
8.82E-05
6.10E-06
1.05E-04
7.15E-05
8.80E-05
6.20E-06
1.05E-04
7.10E-05
9.00E-05
5.79E-06
1.06E-04
7.41E-05
1.02E-04
9.86E-05
9.50E-05
9.32E-05 8.68E-05
2.70E-06
2.61E-06
2.74E-06
3.03E-06 3.11E-06
1.09E-04
1.06E-04
1.03E-04
1.02E-04 9.53E-05
9.42E-05
9.14E-05
8.75E-05
8.49E-05 7.83E-05
2.00E-04
2.00E-04
2.00E-04
2.00E-04 2.00E-04
PASS
PASS
PASS
PASS
PASS
8.70E-05
2.83E-06
9.48E-05
7.92E-05
2.00E-04
PASS
9.28E-05
2.95E-06
1.01E-04
8.47E-05
2.00E-04
PASS
An ISO 9001:2000 Certified Company
81
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Supply Current @+15V (A)
0.00E+00
-5.00E-05
-1.00E-04
-1.50E-04
-2.00E-04
-2.50E-04
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.38. Plot of Negative Supply Current @+15V (A) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
82
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.38. Raw data for Negative Supply Current @+15V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @+15V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
-8.40E-05
-8.20E-05
-8.90E-05
-8.50E-05
-9.80E-05
-8.90E-05
-8.80E-05
-8.60E-05
-8.20E-05
-9.10E-05
-1.07E-04
70
-8.60E-05
-8.50E-05
-9.10E-05
-8.70E-05
-9.90E-05
-9.40E-05
-9.50E-05
-9.00E-05
-8.80E-05
-9.60E-05
-1.06E-04
0
-1.01E-04
-1.00E-04
-1.05E-04
-1.00E-04
-1.12E-04
-1.02E-04
-1.02E-04
-9.80E-05
-9.80E-05
-1.04E-04
-1.07E-04
10
-9.80E-05
-9.50E-05
-1.01E-04
-9.80E-05
-1.09E-04
-1.00E-04
-1.00E-04
-9.70E-05
-9.60E-05
-1.01E-04
-1.05E-04
20
-9.30E-05
-9.10E-05
-9.90E-05
-9.30E-05
-1.06E-04
-9.70E-05
-9.50E-05
-9.20E-05
-9.00E-05
-9.70E-05
-1.06E-04
30
-9.10E-05
-8.90E-05
-9.60E-05
-9.10E-05
-1.03E-04
-9.40E-05
-9.40E-05
-9.00E-05
-8.80E-05
-9.50E-05
-1.06E-04
-1.04E-04
5.13E-06
-8.95E-05
-1.18E-04
-1.00E-04
5.36E-06
-8.55E-05
-1.15E-04
-9.64E-05
6.15E-06
-7.95E-05
-1.13E-04
-9.40E-05 -8.78E-05 -8.76E-05 -8.96E-05
5.66E-06 6.42E-06 6.35E-06 5.73E-06
-7.85E-05 -7.02E-05 -7.02E-05 -7.39E-05
-1.10E-04 -1.05E-04 -1.05E-04 -1.05E-04
-1.01E-04 -9.88E-05 -9.42E-05 -9.22E-05
2.68E-06
2.17E-06
3.11E-06
3.03E-06
-9.34E-05 -9.29E-05 -8.57E-05 -8.39E-05
-1.08E-04 -1.05E-04 -1.03E-04 -1.01E-04
-2.00E-04 -2.00E-04 -2.00E-04 -2.00E-04
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
83
50
-8.40E-05
-8.20E-05
-9.00E-05
-8.50E-05
-9.80E-05
-8.90E-05
-8.80E-05
-8.50E-05
-8.30E-05
-9.00E-05
-1.06E-04
24 hr
Anneal
-8.70E-05
2.92E-06
-7.90E-05
-9.50E-05
-2.00E-04
PASS
-8.72E-05
3.42E-06
-7.78E-05
-9.66E-05
-2.00E-04
PASS
-9.26E-05
3.44E-06
-8.32E-05
-1.02E-04
-2.00E-04
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 1 @ +15V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.39. Plot of Input Offset Voltage 1 @ +15V (V) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
84
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.39. Raw data for Input Offset Voltage 1 @ +15V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 1 @ +15V (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.88E-05
4.55E-05
4.61E-05
-2.98E-05
-6.51E-05
2.12E-05
2.41E-05
4.87E-05
1.76E-05
-4.82E-05
-6.55E-05
10
3.99E-06
2.86E-05
3.04E-05
-4.88E-05
-7.92E-05
1.33E-05
1.30E-05
3.60E-05
-3.63E-07
-6.36E-05
-6.73E-05
20
8.69E-06
3.39E-05
2.96E-05
-4.81E-05
-7.18E-05
7.84E-06
1.80E-06
2.58E-05
-1.04E-05
-7.73E-05
-7.18E-05
30
1.62E-05
5.10E-05
3.60E-05
-3.48E-05
-6.22E-05
1.04E-05
-1.23E-07
3.33E-05
-3.75E-06
-8.01E-05
-6.93E-05
50
2.89E-05
7.33E-05
4.37E-05
-1.68E-05
-5.11E-05
7.48E-06
-7.25E-06
3.18E-05
-3.87E-06
-9.43E-05
-7.21E-05
60
2.72E-05
7.09E-05
4.30E-05
-2.05E-05
-5.17E-05
5.92E-06
-1.14E-05
2.81E-05
-3.38E-06
-9.30E-05
-7.25E-05
70
2.02E-05
6.38E-05
3.02E-05
-2.73E-05
-6.70E-05
3.98E-06
-9.30E-06
3.18E-05
-4.96E-06
-7.81E-05
-7.11E-05
5.09E-06
5.00E-05
1.42E-04
-1.32E-04
-1.30E-05
4.89E-05
1.21E-04
-1.47E-04
-9.55E-06
4.77E-05
1.21E-04
-1.40E-04
1.23E-06 1.56E-05
4.80E-05 4.95E-05
1.33E-04 1.51E-04
-1.30E-04 -1.20E-04
1.38E-05
4.94E-05
1.49E-04
-1.22E-04
3.96E-06
5.13E-05
1.45E-04
-1.37E-04
-1.47E-05
4.62E-05
1.12E-04
-1.41E-04
-6.50E-04
PASS
6.50E-04
PASS
-1.13E-05
4.06E-05
1.00E-04
-1.23E-04
-6.50E-04
PASS
6.50E-04
PASS
1.27E-05 -3.39E-07 -1.04E-05 -8.05E-06
3.61E-05
3.77E-05
3.96E-05
4.28E-05
1.12E-04
1.03E-04
9.81E-05
1.09E-04
-8.64E-05 -1.04E-04 -1.19E-04 -1.25E-04
-3.50E-04 -3.50E-04 -3.50E-04 -5.00E-04
PASS
PASS
PASS
PASS
3.50E-04
3.50E-04
3.50E-04
5.00E-04
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
85
-1.32E-05
4.78E-05
1.18E-04
-1.44E-04
-6.50E-04
PASS
6.50E-04
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 2 @ +15V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.40. Plot of Input Offset Voltage 2 @ +15V (V) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
86
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.40. Raw data for Input Offset Voltage 2 @ +15V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 2 @ +15V (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
168 hr
Anneal
60
1.93E-06
-1.57E-06
-1.14E-05
-3.58E-05
1.85E-05
-3.21E-05
-5.66E-05
-4.53E-05
4.49E-05
-7.65E-05
4.41E-05
70
-1.15E-05
1.61E-04
-1.80E-05
-6.20E-05
4.59E-06
-3.25E-05
-5.54E-05
-5.12E-05
4.88E-05
-6.51E-05
4.34E-05
0
-6.12E-06
-1.77E-05
8.84E-07
-5.76E-05
2.82E-05
-1.58E-05
-2.12E-05
-1.39E-05
9.23E-05
-2.61E-05
5.33E-05
10
-2.74E-05
-3.86E-05
-2.52E-05
-7.00E-05
5.07E-06
-3.27E-05
-4.53E-05
-3.38E-05
6.57E-05
-5.16E-05
4.52E-05
20
-2.97E-05
-3.47E-05
-2.66E-05
-6.51E-05
4.70E-06
-3.83E-05
-4.99E-05
-4.11E-05
5.20E-05
-6.36E-05
4.30E-05
30
-1.70E-05
-2.44E-05
-2.36E-05
-5.36E-05
1.41E-05
-3.90E-05
-4.82E-05
-3.84E-05
5.06E-05
-6.59E-05
4.84E-05
-1.05E-05
3.13E-05
7.53E-05
-9.62E-05
-3.13E-05
2.71E-05
4.30E-05
-1.05E-04
-3.03E-05
2.48E-05
3.79E-05
-9.84E-05
-2.09E-05 -4.07E-06 -5.65E-06 1.48E-05
2.41E-05 1.99E-05 2.00E-05 8.53E-05
4.53E-05 5.06E-05 4.91E-05 2.49E-04
-8.71E-05 -5.87E-05 -6.04E-05 -2.19E-04
3.08E-06 -1.95E-05 -2.82E-05 -2.82E-05
5.01E-05
4.83E-05
4.59E-05
4.54E-05
1.40E-04
1.13E-04
9.77E-05
9.64E-05
-1.34E-04 -1.52E-04 -1.54E-04 -1.53E-04
-3.50E-04 -3.50E-04 -3.50E-04 -5.00E-04
PASS
PASS
PASS
PASS
3.50E-04
3.50E-04
3.50E-04
5.00E-04
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
87
50
3.01E-06
-7.32E-07
-8.58E-06
-3.43E-05
2.03E-05
-3.48E-05
-5.83E-05
-4.96E-05
4.56E-05
-7.97E-05
4.60E-05
24 hr
Anneal
-3.54E-05
4.81E-05
9.66E-05
-1.67E-04
-6.50E-04
PASS
6.50E-04
PASS
-3.31E-05
4.66E-05
9.45E-05
-1.61E-04
-6.50E-04
PASS
6.50E-04
PASS
-3.11E-05
4.62E-05
9.56E-05
-1.58E-04
-6.50E-04
PASS
6.50E-04
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 1 @ +15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.41. Plot of Input Offset Current 1 @ +15V (A) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
88
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.41. Raw data for Input Offset Current 1 @ +15V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 1 @ +15V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
168 hr
Anneal
60
-7.00E-11
-1.80E-10
-1.80E-10
-1.90E-10
1.40E-10
0.00E+00
-2.00E-10
1.70E-10
4.00E-11
-1.20E-10
-9.00E-11
70
-1.10E-10
5.00E-11
-2.40E-10
-1.00E-10
0.00E+00
7.00E-11
-4.10E-10
2.00E-11
-5.00E-11
-6.00E-11
-8.00E-11
0
-8.00E-11
-7.00E-11
-1.80E-10
-1.50E-10
-5.00E-11
3.00E-11
-1.50E-10
1.00E-11
-6.00E-11
6.00E-11
-8.00E-11
10
-1.00E-10
-9.00E-11
-2.00E-10
-9.00E-11
0.00E+00
0.00E+00
-1.20E-10
8.00E-11
-1.20E-10
7.00E-11
-8.00E-11
20
-7.00E-11
-1.80E-10
-2.30E-10
-2.40E-10
1.00E-10
-5.00E-11
-1.30E-10
1.40E-10
-1.20E-10
4.00E-11
-8.00E-11
30
-4.00E-11
-1.40E-10
-1.50E-10
-1.90E-10
1.00E-10
3.00E-11
-1.30E-10
1.90E-10
-5.00E-11
2.00E-11
-7.00E-11
-1.06E-10
5.59E-11
4.74E-11
-2.59E-10
-9.60E-11
7.09E-11
9.85E-11
-2.90E-10
-1.24E-10
1.42E-10
2.66E-10
-5.14E-10
-8.40E-11 -8.20E-11 -9.60E-11 -8.00E-11
1.17E-10 1.13E-10 1.41E-10 1.12E-10
2.36E-10 2.27E-10 2.90E-10 2.27E-10
-4.04E-10 -3.91E-10 -4.82E-10 -3.87E-10
-2.20E-11 -1.80E-11 -2.40E-11
1.20E-11
8.41E-11
9.81E-11
1.14E-10
1.18E-10
2.09E-10
2.51E-10
2.89E-10
3.37E-10
-2.53E-10 -2.87E-10 -3.37E-10 -3.13E-10
-8.00E-10 -2.00E-09 -2.00E-09 -8.00E-09
PASS
PASS
PASS
PASS
8.00E-10
2.00E-09
2.00E-09
8.00E-09
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
89
50
-7.00E-11
-1.40E-10
-2.00E-10
-1.00E-10
1.00E-10
1.00E-10
-1.70E-10
2.10E-10
0.00E+00
-1.20E-10
-9.00E-11
24 hr
Anneal
4.00E-12
1.56E-10
4.32E-10
-4.24E-10
-1.30E-08
PASS
1.30E-08
PASS
-2.20E-11
1.44E-10
3.72E-10
-4.16E-10
-1.30E-08
PASS
1.30E-08
PASS
-8.60E-11
1.89E-10
4.32E-10
-6.04E-10
-1.30E-08
PASS
1.30E-08
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 2 @ +15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.42. Plot of Input Offset Current 2 @ +15V (A) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
90
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.42. Raw data for Input Offset Current 2 @ +15V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 2 @ +15V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
168 hr
Anneal
60
-2.10E-10
-1.20E-10
-1.30E-10
-1.90E-10
-3.50E-10
2.60E-10
4.60E-10
3.90E-10
2.30E-10
3.50E-10
-5.00E-11
70
-2.50E-10
1.73E-09
-8.00E-11
-6.00E-11
-3.10E-10
-4.00E-11
-1.90E-10
9.00E-11
0.00E+00
-4.00E-11
-4.00E-11
0
-1.30E-10
-1.30E-10
-5.00E-11
2.00E-11
-1.80E-10
-2.00E-11
-9.00E-11
-1.60E-10
-1.10E-10
-1.00E-10
-7.00E-11
10
-1.20E-10
-9.00E-11
0.00E+00
3.00E-11
-2.30E-10
-8.00E-11
-7.00E-11
-6.00E-11
-1.40E-10
-6.00E-11
-3.00E-11
20
-1.70E-10
-1.00E-10
-6.00E-11
0.00E+00
-2.30E-10
-7.00E-11
4.00E-11
-1.50E-10
-1.00E-10
-1.80E-10
-4.00E-11
30
-1.70E-10
-6.00E-11
-1.70E-10
-1.20E-10
-2.50E-10
0.00E+00
1.50E-10
4.00E-11
-1.00E-11
-1.80E-10
-4.00E-11
-9.40E-11
7.89E-11
1.22E-10
-3.10E-10
-8.20E-11
1.03E-10
2.01E-10
-3.65E-10
-1.12E-10
9.04E-11
1.36E-10
-3.60E-10
-1.54E-10 -1.72E-10 -2.00E-10 2.06E-10
7.02E-11 7.92E-11 9.22E-11 8.59E-10
3.85E-11 4.51E-11 5.28E-11 2.56E-09
-3.47E-10 -3.89E-10 -4.53E-10 -2.15E-09
-9.60E-11 -8.20E-11 -9.20E-11 0.00E+00
5.03E-11
3.35E-11
8.53E-11
1.19E-10
4.19E-11
9.76E-12
1.42E-10
3.26E-10
-2.34E-10 -1.74E-10 -3.26E-10 -3.26E-10
-8.00E-10 -2.00E-09 -2.00E-09 -8.00E-09
PASS
PASS
PASS
PASS
8.00E-10
2.00E-09
2.00E-09
8.00E-09
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
91
50
-1.90E-10
-1.00E-10
-1.50E-10
-1.20E-10
-3.00E-10
3.00E-11
2.30E-10
1.40E-10
3.00E-11
9.00E-11
-4.00E-11
24 hr
Anneal
1.04E-10
8.41E-11
3.35E-10
-1.27E-10
-1.30E-08
PASS
1.30E-08
PASS
3.38E-10
9.42E-11
5.96E-10
7.98E-11
-1.30E-08
PASS
1.30E-08
PASS
-3.60E-11
1.01E-10
2.41E-10
-3.13E-10
-1.30E-08
PASS
1.30E-08
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 1 @ +15V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.43. Plot of Positive Input Bias Current 1 @ +15V (A) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
92
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.43. Raw data for Positive Input Bias Current 1 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 1 @ +15V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.33E-09
8.11E-09
7.39E-09
8.17E-09
9.51E-09
8.32E-09
7.99E-09
7.80E-09
7.87E-09
8.04E-09
7.41E-09
10
1.06E-08
1.02E-08
9.50E-09
1.04E-08
1.21E-08
1.01E-08
9.74E-09
9.73E-09
9.49E-09
9.94E-09
7.48E-09
20
1.41E-08
1.34E-08
1.25E-08
1.36E-08
1.59E-08
1.24E-08
1.20E-08
1.20E-08
1.16E-08
1.23E-08
7.47E-09
30
1.76E-08
1.66E-08
1.56E-08
1.70E-08
1.98E-08
1.46E-08
1.41E-08
1.42E-08
1.37E-08
1.45E-08
7.52E-09
50
2.46E-08
2.32E-08
2.17E-08
2.37E-08
2.74E-08
1.89E-08
1.82E-08
1.85E-08
1.77E-08
1.89E-08
7.48E-09
60
2.46E-08
2.32E-08
2.18E-08
2.37E-08
2.75E-08
1.87E-08
1.80E-08
1.83E-08
1.76E-08
1.87E-08
7.51E-09
70
2.38E-08
2.29E-08
2.08E-08
2.31E-08
2.70E-08
1.70E-08
1.63E-08
1.65E-08
1.60E-08
1.70E-08
7.48E-09
8.30E-09
7.66E-10
1.04E-08
6.20E-09
1.06E-08
9.50E-10
1.32E-08
7.96E-09
1.39E-08
1.25E-09
1.73E-08
1.05E-08
1.73E-08
1.55E-09
2.15E-08
1.31E-08
2.41E-08
2.12E-09
2.99E-08
1.83E-08
2.42E-08
2.15E-09
3.00E-08
1.83E-08
2.35E-08
2.25E-09
2.97E-08
1.73E-08
8.00E-09
9.81E-09
1.21E-08
1.42E-08 1.84E-08 1.83E-08
2.01E-10
2.41E-10
3.05E-10
3.38E-10 4.96E-10 4.68E-10
8.55E-09
1.05E-08
1.29E-08
1.51E-08 1.98E-08 1.95E-08
7.45E-09
9.14E-09
1.12E-08
1.33E-08 1.71E-08 1.70E-08
-1.50E-08 -2.00E-08 -2.00E-08 -4.00E-08 -8.00E-08 -8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
2.00E-08
4.00E-08 8.00E-08 8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.66E-08
4.35E-10
1.78E-08
1.54E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2000 Certified Company
93
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 2 @ +15V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.44. Plot of Positive Input Bias Current 2 @ +15V (A) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
94
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.44. Raw data for Positive Input Bias Current 2 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 2 @ +15V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.30E-09
8.08E-09
7.48E-09
8.37E-09
9.22E-09
8.41E-09
8.10E-09
8.02E-09
7.76E-09
7.90E-09
7.49E-09
10
1.06E-08
1.02E-08
9.58E-09
1.06E-08
1.18E-08
1.02E-08
9.91E-09
9.95E-09
9.45E-09
9.79E-09
7.57E-09
20
1.39E-08
1.34E-08
1.26E-08
1.38E-08
1.55E-08
1.26E-08
1.23E-08
1.23E-08
1.16E-08
1.22E-08
7.55E-09
30
1.73E-08
1.68E-08
1.56E-08
1.70E-08
1.92E-08
1.48E-08
1.45E-08
1.47E-08
1.38E-08
1.45E-08
7.56E-09
50
2.41E-08
2.32E-08
2.18E-08
2.36E-08
2.67E-08
1.92E-08
1.88E-08
1.91E-08
1.78E-08
1.90E-08
7.55E-09
60
2.41E-08
2.32E-08
2.18E-08
2.36E-08
2.67E-08
1.93E-08
1.88E-08
1.92E-08
1.78E-08
1.92E-08
7.56E-09
70
2.33E-08
2.28E-08
2.08E-08
2.33E-08
2.64E-08
1.73E-08
1.67E-08
1.72E-08
1.60E-08
1.70E-08
7.54E-09
8.29E-09
6.27E-10
1.00E-08
6.57E-09
1.06E-08
8.00E-10
1.28E-08
8.37E-09
1.38E-08
1.05E-09
1.67E-08
1.09E-08
1.72E-08
1.31E-09
2.08E-08
1.36E-08
2.39E-08
1.80E-09
2.88E-08
1.90E-08
2.39E-08
1.78E-09
2.88E-08
1.90E-08
2.33E-08
1.98E-09
2.87E-08
1.79E-08
8.04E-09
9.86E-09
1.22E-08
1.44E-08 1.88E-08 1.89E-08
2.44E-10
2.77E-10
3.52E-10
4.14E-10 5.66E-10 6.06E-10
8.71E-09
1.06E-08
1.32E-08
1.56E-08 2.03E-08 2.05E-08
7.37E-09
9.10E-09
1.12E-08
1.33E-08 1.72E-08 1.72E-08
-1.50E-08 -2.00E-08 -2.00E-08 -4.00E-08 -8.00E-08 -8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
2.00E-08
4.00E-08 8.00E-08 8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.68E-08
5.00E-10
1.82E-08
1.55E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2000 Certified Company
95
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current 1 @ +15V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.45. Plot of Negative Input Bias Current 1 @ +15V (A) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
96
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.45. Raw data for Negative Input Bias Current 1 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 1 @ +15V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.42E-09
8.20E-09
7.62E-09
8.32E-09
9.55E-09
8.27E-09
8.11E-09
7.83E-09
7.95E-09
7.98E-09
7.51E-09
10
1.08E-08
1.04E-08
9.70E-09
1.05E-08
1.21E-08
1.01E-08
9.90E-09
9.64E-09
9.62E-09
9.91E-09
7.58E-09
20
1.42E-08
1.36E-08
1.28E-08
1.39E-08
1.58E-08
1.24E-08
1.21E-08
1.19E-08
1.17E-08
1.24E-08
7.58E-09
30
1.76E-08
1.68E-08
1.58E-08
1.72E-08
1.97E-08
1.45E-08
1.44E-08
1.40E-08
1.38E-08
1.45E-08
7.61E-09
50
2.47E-08
2.34E-08
2.20E-08
2.39E-08
2.74E-08
1.88E-08
1.84E-08
1.83E-08
1.78E-08
1.91E-08
7.59E-09
60
2.47E-08
2.34E-08
2.20E-08
2.40E-08
2.74E-08
1.87E-08
1.83E-08
1.82E-08
1.76E-08
1.89E-08
7.61E-09
70
2.40E-08
2.29E-08
2.10E-08
2.33E-08
2.71E-08
1.70E-08
1.68E-08
1.66E-08
1.61E-08
1.71E-08
7.56E-09
8.42E-09
7.03E-10
1.03E-08
6.50E-09
1.07E-08
8.89E-10
1.31E-08
8.26E-09
1.41E-08
1.12E-09
1.71E-08
1.10E-08
1.74E-08
1.43E-09
2.13E-08
1.35E-08
2.43E-08
2.00E-09
2.98E-08
1.88E-08
2.43E-08
2.00E-09
2.98E-08
1.88E-08
2.36E-08
2.22E-09
2.97E-08
1.76E-08
8.03E-09
9.83E-09
1.21E-08
1.43E-08 1.85E-08 1.83E-08
1.68E-10
1.96E-10
2.91E-10
3.13E-10 4.93E-10 4.85E-10
8.49E-09
1.04E-08
1.29E-08
1.51E-08 1.99E-08 1.97E-08
7.57E-09
9.29E-09
1.13E-08
1.34E-08 1.72E-08 1.70E-08
-1.50E-08 -2.00E-08 -2.00E-08 -4.00E-08 -8.00E-08 -8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
2.00E-08
4.00E-08 8.00E-08 8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.67E-08
4.18E-10
1.78E-08
1.56E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2000 Certified Company
97
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current 2 @ +15V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.46. Plot of Negative Input Bias Current 2 @ +15V (A) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
98
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.46. Raw data for Negative Input Bias Current 2 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 2 @ +15V (A)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.47E-09
8.22E-09
7.58E-09
8.37E-09
9.46E-09
8.45E-09
8.23E-09
8.24E-09
7.89E-09
8.05E-09
7.57E-09
10
1.08E-08
1.04E-08
9.64E-09
1.05E-08
1.20E-08
1.03E-08
1.00E-08
1.01E-08
9.61E-09
9.91E-09
7.60E-09
20
1.41E-08
1.36E-08
1.27E-08
1.38E-08
1.57E-08
1.27E-08
1.22E-08
1.25E-08
1.18E-08
1.23E-08
7.63E-09
30
1.76E-08
1.68E-08
1.58E-08
1.71E-08
1.95E-08
1.48E-08
1.44E-08
1.46E-08
1.39E-08
1.47E-08
7.64E-09
50
2.43E-08
2.33E-08
2.20E-08
2.38E-08
2.71E-08
1.92E-08
1.85E-08
1.90E-08
1.78E-08
1.90E-08
7.60E-09
60
2.44E-08
2.34E-08
2.20E-08
2.39E-08
2.71E-08
1.90E-08
1.84E-08
1.88E-08
1.77E-08
1.89E-08
7.62E-09
70
2.37E-08
2.11E-08
2.10E-08
2.34E-08
2.67E-08
1.74E-08
1.69E-08
1.71E-08
1.60E-08
1.71E-08
7.59E-09
8.42E-09
6.77E-10
1.03E-08
6.56E-09
1.07E-08
8.54E-10
1.30E-08
8.32E-09
1.40E-08
1.10E-09
1.70E-08
1.10E-08
1.74E-08
1.37E-09
2.11E-08
1.36E-08
2.41E-08
1.87E-09
2.92E-08
1.90E-08
2.42E-08
1.89E-09
2.93E-08
1.90E-08
2.32E-08
2.34E-09
2.96E-08
1.68E-08
8.17E-09
9.99E-09
1.23E-08
1.45E-08 1.87E-08 1.86E-08
2.12E-10
2.54E-10
3.29E-10
3.74E-10 5.60E-10 5.26E-10
8.75E-09
1.07E-08
1.32E-08
1.55E-08 2.02E-08 2.00E-08
7.59E-09
9.29E-09
1.14E-08
1.34E-08 1.72E-08 1.71E-08
-1.50E-08 -2.00E-08 -2.00E-08 -4.00E-08 -8.00E-08 -8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
2.00E-08
4.00E-08 8.00E-08 8.00E-08
PASS
PASS
PASS
PASS
PASS
PASS
1.69E-08
5.17E-10
1.83E-08
1.55E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2000 Certified Company
99
Common Mode Rejection Ratio 1 @ +15V (dB)
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.47. Plot of Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
100
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.47. Raw data for Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 1 @ +15V (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
1.07E+02
1.08E+02
1.07E+02
1.09E+02
1.09E+02
1.05E+02
1.06E+02
1.13E+02
1.10E+02
1.07E+02
1.07E+02
70
1.08E+02
1.08E+02
1.07E+02
1.09E+02
1.09E+02
1.06E+02
1.07E+02
1.16E+02
1.12E+02
1.09E+02
1.07E+02
0
1.08E+02
1.09E+02
1.09E+02
1.11E+02
1.10E+02
1.07E+02
1.08E+02
1.19E+02
1.16E+02
1.10E+02
1.07E+02
10
1.08E+02
1.09E+02
1.08E+02
1.09E+02
1.10E+02
1.06E+02
1.07E+02
1.16E+02
1.13E+02
1.09E+02
1.07E+02
20
1.07E+02
1.08E+02
1.08E+02
1.09E+02
1.09E+02
1.06E+02
1.07E+02
1.15E+02
1.12E+02
1.08E+02
1.07E+02
30
1.07E+02
1.08E+02
1.07E+02
1.09E+02
1.09E+02
1.06E+02
1.07E+02
1.14E+02
1.11E+02
1.08E+02
1.07E+02
1.09E+02
1.02E+00
1.12E+02
1.07E+02
1.09E+02
9.08E-01
1.11E+02
1.06E+02
1.08E+02
9.04E-01
1.11E+02
1.06E+02
1.08E+02 1.08E+02 1.08E+02 1.08E+02
8.89E-01 9.46E-01 8.25E-01 8.58E-01
1.11E+02 1.11E+02 1.10E+02 1.11E+02
1.06E+02 1.05E+02 1.06E+02 1.06E+02
1.12E+02 1.10E+02 1.09E+02 1.09E+02
5.12E+00 4.18E+00 3.67E+00 3.56E+00
1.26E+02 1.22E+02 1.19E+02 1.19E+02
9.79E+01 9.88E+01 9.92E+01 9.93E+01
9.70E+01 9.40E+01 9.40E+01 9.20E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
101
50
1.07E+02
1.08E+02
1.07E+02
1.09E+02
1.09E+02
1.05E+02
1.06E+02
1.13E+02
1.10E+02
1.07E+02
1.07E+02
24 hr
Anneal
1.08E+02
3.10E+00
1.17E+02
9.97E+01
9.00E+01
PASS
1.08E+02
3.25E+00
1.17E+02
9.92E+01
9.00E+01
PASS
1.10E+02
3.96E+00
1.21E+02
9.91E+01
9.00E+01
PASS
Common Mode Rejection Ratio 2 @ +15V (dB)
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.48. Plot of Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
102
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.48. Raw data for Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 2 @ +15V (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.10E+02
1.08E+02
1.07E+02
1.12E+02
1.07E+02
1.09E+02
1.11E+02
1.17E+02
1.06E+02
1.13E+02
1.07E+02
10
1.09E+02
1.07E+02
1.06E+02
1.11E+02
1.06E+02
1.08E+02
1.10E+02
1.15E+02
1.06E+02
1.11E+02
1.07E+02
20
1.08E+02
1.07E+02
1.06E+02
1.11E+02
1.06E+02
1.07E+02
1.09E+02
1.13E+02
1.05E+02
1.10E+02
1.07E+02
30
1.08E+02
1.07E+02
1.06E+02
1.11E+02
1.06E+02
1.07E+02
1.09E+02
1.13E+02
1.05E+02
1.10E+02
1.07E+02
50
1.08E+02
1.07E+02
1.06E+02
1.10E+02
1.06E+02
1.07E+02
1.08E+02
1.12E+02
1.04E+02
1.09E+02
1.07E+02
60
1.08E+02
1.07E+02
1.06E+02
1.11E+02
1.06E+02
1.07E+02
1.08E+02
1.11E+02
1.04E+02
1.09E+02
1.07E+02
70
1.09E+02
1.11E+02
1.06E+02
1.11E+02
1.06E+02
1.08E+02
1.10E+02
1.14E+02
1.05E+02
1.11E+02
1.07E+02
1.09E+02
2.36E+00
1.15E+02
1.02E+02
1.08E+02
2.20E+00
1.14E+02
1.02E+02
1.08E+02
1.99E+00
1.13E+02
1.02E+02
1.08E+02
2.06E+00
1.13E+02
1.02E+02
1.07E+02
1.96E+00
1.13E+02
1.02E+02
1.08E+02
2.11E+00
1.13E+02
1.02E+02
1.09E+02
2.49E+00
1.16E+02
1.02E+02
1.11E+02 1.10E+02 1.09E+02 1.09E+02
4.08E+00 3.32E+00 3.08E+00 3.14E+00
1.22E+02 1.19E+02 1.17E+02 1.17E+02
1.00E+02 1.01E+02 1.01E+02 1.00E+02
9.70E+01 9.40E+01 9.40E+01 9.20E+01
PASS
PASS
PASS
PASS
1.08E+02
2.76E+00
1.15E+02
1.00E+02
9.00E+01
PASS
1.08E+02
2.79E+00
1.16E+02
1.00E+02
9.00E+01
PASS
1.09E+02
3.20E+00
1.18E+02
1.01E+02
9.00E+01
PASS
An ISO 9001:2000 Certified Company
103
Power Supply Rejection Ratio 1 @ +15V (dB)
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.60E+02
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.49. Plot of Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
104
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.49. Raw data for Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 1 @ +15V (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.38E+02
1.23E+02
1.44E+02
1.33E+02
1.29E+02
1.21E+02
1.34E+02
1.33E+02
1.22E+02
1.28E+02
1.24E+02
10
1.51E+02
1.25E+02
1.44E+02
1.31E+02
1.29E+02
1.20E+02
1.34E+02
1.36E+02
1.22E+02
1.25E+02
1.24E+02
20
1.36E+02
1.24E+02
1.42E+02
1.38E+02
1.31E+02
1.20E+02
1.31E+02
1.56E+02
1.23E+02
1.27E+02
1.23E+02
30
1.36E+02
1.24E+02
1.36E+02
1.34E+02
1.27E+02
1.20E+02
1.28E+02
1.59E+02
1.22E+02
1.29E+02
1.24E+02
50
1.36E+02
1.24E+02
1.35E+02
1.34E+02
1.28E+02
1.20E+02
1.31E+02
1.47E+02
1.23E+02
1.27E+02
1.24E+02
60
1.37E+02
1.22E+02
1.36E+02
1.32E+02
1.30E+02
1.20E+02
1.36E+02
1.60E+02
1.23E+02
1.27E+02
1.23E+02
70
1.44E+02
1.24E+02
1.49E+02
1.32E+02
1.27E+02
1.20E+02
1.36E+02
1.39E+02
1.22E+02
1.31E+02
1.23E+02
1.34E+02
7.91E+00
1.55E+02
1.12E+02
1.36E+02
1.08E+01
1.65E+02
1.06E+02
1.34E+02
6.92E+00
1.53E+02
1.15E+02
1.31E+02
5.52E+00
1.47E+02
1.16E+02
1.32E+02
5.21E+00
1.46E+02
1.17E+02
1.31E+02
5.92E+00
1.48E+02
1.15E+02
1.35E+02
1.06E+01
1.64E+02
1.06E+02
1.28E+02 1.27E+02 1.31E+02 1.32E+02
6.08E+00 7.26E+00 1.43E+01 1.57E+01
1.44E+02 1.47E+02 1.71E+02 1.75E+02
1.11E+02 1.08E+02 9.20E+01 8.85E+01
1.00E+02 1.00E+02 1.00E+02 1.00E+02
PASS
PASS
FAIL
FAIL
1.30E+02
1.07E+01
1.59E+02
1.00E+02
9.80E+01
PASS
1.33E+02
1.61E+01
1.77E+02
8.90E+01
9.80E+01
FAIL
1.30E+02
8.62E+00
1.53E+02
1.06E+02
9.80E+01
PASS
An ISO 9001:2000 Certified Company
105
Power Supply Rejection Ratio 2 @ +15V (dB)
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.60E+02
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.50. Plot of Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
106
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.50. Raw data for Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 2 @ +15V (dB)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.30E+02
1.24E+02
1.25E+02
1.39E+02
1.28E+02
1.32E+02
1.40E+02
1.27E+02
1.48E+02
1.34E+02
1.33E+02
10
1.31E+02
1.23E+02
1.23E+02
1.43E+02
1.26E+02
1.32E+02
1.42E+02
1.29E+02
1.38E+02
1.37E+02
1.33E+02
20
1.28E+02
1.23E+02
1.23E+02
1.37E+02
1.27E+02
1.35E+02
1.34E+02
1.31E+02
1.54E+02
1.37E+02
1.31E+02
30
1.29E+02
1.23E+02
1.22E+02
1.35E+02
1.25E+02
1.36E+02
1.34E+02
1.32E+02
1.58E+02
1.38E+02
1.30E+02
50
1.27E+02
1.22E+02
1.21E+02
1.30E+02
1.24E+02
1.40E+02
1.33E+02
1.34E+02
1.42E+02
1.42E+02
1.34E+02
60
1.26E+02
1.21E+02
1.22E+02
1.33E+02
1.26E+02
1.48E+02
1.31E+02
1.44E+02
1.38E+02
1.56E+02
1.31E+02
70
1.28E+02
1.24E+02
1.22E+02
1.34E+02
1.24E+02
1.34E+02
1.44E+02
1.31E+02
1.51E+02
1.39E+02
1.29E+02
1.29E+02
5.99E+00
1.46E+02
1.13E+02
1.29E+02
8.45E+00
1.53E+02
1.06E+02
1.28E+02
5.91E+00
1.44E+02
1.11E+02
1.27E+02
5.46E+00
1.42E+02
1.12E+02
1.25E+02
3.85E+00
1.36E+02
1.14E+02
1.26E+02
4.63E+00
1.38E+02
1.13E+02
1.27E+02
4.89E+00
1.40E+02
1.13E+02
1.36E+02 1.36E+02 1.38E+02 1.40E+02
8.23E+00 5.21E+00 9.09E+00 1.05E+01
1.59E+02 1.50E+02 1.63E+02 1.68E+02
1.13E+02 1.21E+02 1.13E+02 1.11E+02
1.00E+02 1.00E+02 1.00E+02 1.00E+02
PASS
PASS
PASS
PASS
1.38E+02
4.24E+00
1.50E+02
1.26E+02
9.80E+01
PASS
1.43E+02
9.60E+00
1.70E+02
1.17E+02
9.80E+01
PASS
1.40E+02
8.16E+00
1.62E+02
1.18E+02
9.80E+01
PASS
An ISO 9001:2000 Certified Company
107
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV)
4.50E+04
4.00E+04
3.50E+04
3.00E+04
2.50E+04
2.00E+04
1.50E+04
1.00E+04
5.00E+03
0.00E+00
-5.00E+03
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.51. Plot of Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose. The data show
substantial degradation with radiation, however it is not sufficient for any of the individual units to exceed the
post-irradiation test limits. Note that the KTL values are out of specification pre-irradiation and throughout
the measurement. As discussed in the text of this report we attribute this to the large standard deviation within
the sample population caused by the sensitivity of the measurement to input conditions. The solid diamonds
are the average of the measured data points for the sample irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
108
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.51. Raw data for Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
3.31E+04
4.05E+04
3.24E+04
6.20E+04
4.57E+04
2.74E+04
5.20E+04
4.23E+04
5.45E+04
3.59E+04
3.25E+04
10
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
20
1.00E+04
6.26E+03
1.00E+04
7.60E+03
1.00E+04
1.00E+04
1.00E+04
6.16E+03
8.23E+03
1.00E+04
1.00E+04
30
8.03E+03
5.23E+03
1.00E+04
6.26E+03
1.00E+04
6.71E+03
1.00E+04
4.78E+03
5.48E+03
9.80E+03
1.00E+04
50
3.60E+03
2.74E+03
4.64E+03
2.87E+03
4.65E+03
2.99E+03
6.54E+03
2.61E+03
2.85E+03
3.35E+03
1.00E+04
60
3.39E+03
2.97E+03
4.92E+03
3.30E+03
5.00E+03
3.14E+03
8.19E+03
2.72E+03
2.87E+03
3.98E+03
1.00E+04
70
1.00E+04
5.73E+03
1.00E+04
6.39E+03
1.00E+04
6.49E+03
1.00E+04
4.17E+03
6.25E+03
7.29E+03
1.00E+04
4.27E+04
1.21E+04
7.59E+04
9.57E+03
1.00E+04
0.00E+00
1.00E+04
1.00E+04
8.77E+03
1.75E+03
1.36E+04
3.98E+03
7.90E+03
2.16E+03
1.38E+04
1.98E+03
3.70E+03
9.24E+02
6.23E+03
1.17E+03
3.91E+03
9.66E+02
6.56E+03
1.27E+03
8.42E+03
2.17E+03
1.44E+04
2.47E+03
4.24E+04 1.00E+04 8.88E+03 7.36E+03
1.13E+04 0.00E+00 1.70E+03 2.42E+03
7.33E+04 1.00E+04 1.35E+04 1.40E+04
1.16E+04 1.00E+04 4.22E+03 7.07E+02
1.00E+03 1.00E+03 1.00E+03 7.00E+02
PASS
PASS
PASS
PASS
3.67E+03
1.63E+03
8.14E+03
-8.02E+02
4.00E+02
FAIL
4.18E+03
2.29E+03
1.05E+04
-2.11E+03
4.00E+02
FAIL
6.84E+03
2.11E+03
1.26E+04
1.06E+03
4.00E+02
PASS
An ISO 9001:2000 Certified Company
109
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV)
6.00E+04
5.00E+04
4.00E+04
3.00E+04
2.00E+04
1.00E+04
0.00E+00
-1.00E+04
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.52. Plot of Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose. The data show
substantial degradation with radiation, however it is not sufficient for any of the individual units to exceed the
post-irradiation test limits. Note that the KTL values are out of specification pre-irradiation and throughout
the measurement. As discussed in the text of this report we attribute this to the large standard deviation within
the sample population caused by the sensitivity of the measurement to input conditions. The solid diamonds
are the average of the measured data points for the sample irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
110
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.52. Raw data for Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
3.91E+04
3.19E+04
6.07E+04
4.29E+04
3.35E+04
5.18E+04
4.18E+04
5.28E+04
3.88E+04
5.87E+04
5.45E+04
10
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
1.00E+04
20
7.48E+03
7.73E+03
1.00E+04
7.14E+03
1.00E+04
1.00E+04
1.00E+04
8.13E+03
1.00E+04
1.00E+04
1.00E+04
30
4.24E+03
6.17E+03
7.97E+03
5.12E+03
1.00E+04
1.00E+04
8.50E+03
5.75E+03
1.00E+04
7.45E+03
1.00E+04
50
2.62E+03
2.98E+03
3.63E+03
2.51E+03
1.00E+04
5.43E+03
4.10E+03
2.71E+03
3.78E+03
3.36E+03
1.00E+04
60
2.64E+03
3.28E+03
4.06E+03
2.80E+03
1.00E+04
5.64E+03
4.03E+03
2.69E+03
4.93E+03
3.33E+03
1.00E+04
70
5.94E+03
8.13E+03
1.00E+04
5.69E+03
7.21E+03
1.00E+04
9.69E+03
5.52E+03
1.00E+04
6.36E+03
1.00E+04
4.16E+04
1.16E+04
7.33E+04
9.92E+03
1.00E+04
0.00E+00
1.00E+04
1.00E+04
8.47E+03
1.41E+03
1.23E+04
4.60E+03
6.70E+03
2.31E+03
1.30E+04
3.62E+02
4.35E+03
3.19E+03
1.31E+04
-4.40E+03
4.55E+03
3.09E+03
1.30E+04
-3.93E+03
7.39E+03
1.76E+03
1.22E+04
2.57E+03
4.88E+04 1.00E+04 9.62E+03 8.34E+03
8.24E+03 0.00E+00 8.37E+02 1.80E+03
7.14E+04 1.00E+04 1.19E+04 1.33E+04
2.62E+04 1.00E+04 7.33E+03 3.39E+03
1.00E+03 1.00E+03 1.00E+03 7.00E+02
PASS
PASS
PASS
FAIL
3.87E+03
1.01E+03
6.65E+03
1.09E+03
4.00E+02
FAIL
4.12E+03
1.19E+03
7.37E+03
8.72E+02
4.00E+02
FAIL
8.31E+03
2.19E+03
1.43E+04
2.31E+03
4.00E+02
PASS
An ISO 9001:2000 Certified Company
111
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV)
2.00E+03
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.53. Plot of Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose. The data show
substantial degradation with radiation, however it’s not sufficient to cause the parameter to exceed the postirradiation specification. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
112
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.53. Raw data for Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.89E+03
1.56E+03
1.89E+03
1.75E+03
1.60E+03
1.61E+03
2.15E+03
1.37E+03
1.62E+03
1.59E+03
1.75E+03
10
1.70E+03
1.40E+03
1.64E+03
1.51E+03
1.44E+03
1.44E+03
2.06E+03
1.31E+03
1.50E+03
1.47E+03
1.78E+03
20
1.50E+03
1.34E+03
1.60E+03
1.45E+03
1.43E+03
1.36E+03
1.89E+03
1.22E+03
1.42E+03
1.39E+03
1.81E+03
30
1.32E+03
1.14E+03
1.43E+03
1.22E+03
1.24E+03
1.29E+03
1.79E+03
1.05E+03
1.22E+03
1.30E+03
1.79E+03
50
1.13E+03
9.48E+02
1.21E+03
1.06E+03
1.12E+03
1.05E+03
1.44E+03
8.42E+02
1.07E+03
1.01E+03
1.69E+03
60
1.09E+03
9.24E+02
1.25E+03
1.04E+03
1.10E+03
1.08E+03
1.45E+03
8.52E+02
9.98E+02
1.04E+03
1.70E+03
70
1.50E+03
1.18E+03
1.70E+03
1.31E+03
1.30E+03
1.29E+03
1.88E+03
1.07E+03
1.32E+03
1.35E+03
1.74E+03
1.74E+03
1.56E+02
2.16E+03
1.31E+03
1.54E+03
1.31E+02
1.90E+03
1.18E+03
1.46E+03
9.38E+01
1.72E+03
1.21E+03
1.27E+03
1.11E+02
1.58E+03
9.67E+02
1.09E+03
9.81E+01
1.36E+03
8.23E+02
1.08E+03
1.17E+02
1.40E+03
7.59E+02
1.40E+03
2.04E+02
1.96E+03
8.38E+02
1.67E+03 1.56E+03 1.45E+03 1.33E+03
2.88E+02 2.89E+02 2.55E+02 2.78E+02
2.46E+03 2.35E+03 2.15E+03 2.09E+03
8.80E+02 7.63E+02 7.56E+02 5.69E+02
3.00E+02 3.00E+02 3.00E+02 2.00E+02
PASS
PASS
PASS
PASS
1.08E+03
2.19E+02
1.68E+03
4.79E+02
1.20E+02
PASS
1.08E+03
2.23E+02
1.70E+03
4.71E+02
1.20E+02
PASS
1.38E+03
3.02E+02
2.21E+03
5.54E+02
1.20E+02
PASS
An ISO 9001:2000 Certified Company
113
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV)
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.54. Plot of Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose. The data show
substantial degradation with radiation, however it’s not sufficient to cause the parameter to exceed the postirradiation specification. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
114
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.54. Raw data for Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.39E+03
1.45E+03
1.46E+03
1.47E+03
1.69E+03
1.51E+03
1.46E+03
1.35E+03
1.59E+03
1.37E+03
1.53E+03
10
1.25E+03
1.34E+03
1.30E+03
1.29E+03
1.58E+03
1.38E+03
1.34E+03
1.22E+03
1.48E+03
1.26E+03
1.54E+03
20
1.14E+03
1.19E+03
1.24E+03
1.16E+03
1.57E+03
1.34E+03
1.23E+03
1.15E+03
1.34E+03
1.13E+03
1.51E+03
30
1.02E+03
1.08E+03
1.17E+03
1.05E+03
1.55E+03
1.18E+03
1.12E+03
1.02E+03
1.28E+03
1.05E+03
1.50E+03
50
8.42E+02
9.04E+02
9.65E+02
8.71E+02
1.44E+03
1.05E+03
9.64E+02
8.62E+02
1.03E+03
8.68E+02
1.56E+03
60
8.43E+02
9.09E+02
9.79E+02
8.67E+02
1.45E+03
1.02E+03
9.81E+02
8.88E+02
1.04E+03
8.78E+02
1.51E+03
70
1.08E+03
1.20E+03
1.24E+03
1.07E+03
1.89E+03
1.27E+03
1.18E+03
1.08E+03
1.37E+03
1.11E+03
1.51E+03
1.49E+03
1.15E+02
1.81E+03
1.18E+03
1.35E+03
1.31E+02
1.71E+03
9.92E+02
1.26E+03
1.76E+02
1.74E+03
7.79E+02
1.17E+03
2.20E+02
1.78E+03
5.70E+02
1.00E+03
2.46E+02
1.68E+03
3.29E+02
1.01E+03
2.49E+02
1.69E+03
3.25E+02
1.30E+03
3.40E+02
2.23E+03
3.64E+02
1.46E+03 1.34E+03 1.24E+03 1.13E+03
1.00E+02 1.01E+02 9.87E+01 1.04E+02
1.73E+03 1.61E+03 1.51E+03 1.41E+03
1.18E+03 1.06E+03 9.69E+02 8.44E+02
3.00E+02 3.00E+02 3.00E+02 2.00E+02
PASS
PASS
PASS
PASS
9.54E+02
8.79E+01
1.20E+03
7.13E+02
1.20E+02
PASS
9.62E+02
7.60E+01
1.17E+03
7.54E+02
1.20E+02
PASS
1.20E+03
1.20E+02
1.53E+03
8.73E+02
1.20E+02
PASS
An ISO 9001:2000 Certified Company
115
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +15V RL=open (V)
1.44E+01
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.55. Plot of Output Voltage High 1 @ +15V RL=open (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
116
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.55. Raw data for Output Voltage High 1 @ +15V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +15V RL=open (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
70
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
0
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
10
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
20
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
30
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
5.89E-03
1.43E+01
1.42E+01
1.42E+01
6.15E-03
1.42E+01
1.42E+01
1.42E+01
6.26E-03
1.42E+01
1.42E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01
6.76E-03 6.26E-03 6.26E-03 6.00E-03
1.42E+01 1.42E+01 1.42E+01 1.42E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01
3.97E-03
4.15E-03
4.93E-03
4.36E-03
1.42E+01 1.42E+01 1.42E+01 1.42E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01
1.30E+01 1.30E+01 1.30E+01 1.30E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
117
50
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
24 hr
Anneal
1.42E+01
4.56E-03
1.42E+01
1.42E+01
1.30E+01
PASS
1.42E+01
4.45E-03
1.42E+01
1.42E+01
1.30E+01
PASS
1.42E+01
4.56E-03
1.42E+01
1.42E+01
1.30E+01
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +15V RL=open (V)
1.44E+01
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.56. Plot of Output Voltage High 2 @ +15V RL=open (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
118
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.56. Raw data for Output Voltage High 2 @ +15V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +15V RL=open (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
70
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
1.43E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
0
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
10
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
1.43E+01
1.43E+01
1.42E+01
1.43E+01
1.42E+01
20
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
30
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.42E+01
1.43E+01
1.43E+01
1.43E+01
3.71E-03
1.43E+01
1.42E+01
1.43E+01
3.90E-03
1.43E+01
1.42E+01
1.42E+01
3.71E-03
1.43E+01
1.42E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01
4.09E-03 3.65E-03 4.34E-03 3.90E-03
1.43E+01 1.43E+01 1.43E+01 1.43E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01
1.43E+01 1.42E+01 1.42E+01 1.43E+01
3.74E-03
3.85E-03
4.18E-03
4.02E-03
1.43E+01 1.43E+01 1.43E+01 1.43E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01
1.30E+01 1.30E+01 1.30E+01 1.30E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
119
50
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
1.43E+01
1.42E+01
1.42E+01
1.43E+01
1.43E+01
24 hr
Anneal
1.42E+01
4.22E-03
1.43E+01
1.42E+01
1.30E+01
PASS
1.42E+01
4.34E-03
1.43E+01
1.42E+01
1.30E+01
PASS
1.42E+01
4.76E-03
1.43E+01
1.42E+01
1.30E+01
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +15V RL=2kΩ (V)
1.35E+01
1.30E+01
1.25E+01
1.20E+01
1.15E+01
1.10E+01
1.05E+01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.57. Plot of Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
120
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.57. Raw data for Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +15V RL=2kΩ (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
1.29E+01
70
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
1.29E+01
0
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
1.29E+01
10
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
1.29E+01
20
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
1.29E+01
30
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
1.29E+01
1.29E+01
3.94E-02
1.30E+01
1.28E+01
1.29E+01
3.96E-02
1.30E+01
1.28E+01
1.29E+01
4.08E-02
1.30E+01
1.28E+01
1.29E+01 1.29E+01 1.29E+01 1.29E+01
4.10E-02 4.16E-02 4.17E-02 4.11E-02
1.30E+01 1.30E+01 1.30E+01 1.30E+01
1.28E+01 1.28E+01 1.28E+01 1.28E+01
1.29E+01 1.29E+01 1.29E+01 1.29E+01
3.67E-02
3.64E-02
3.77E-02
3.71E-02
1.30E+01 1.30E+01 1.30E+01 1.30E+01
1.28E+01 1.28E+01 1.28E+01 1.28E+01
1.10E+01 1.10E+01 1.10E+01 1.10E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
121
50
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
1.29E+01
24 hr
Anneal
1.29E+01
3.71E-02
1.30E+01
1.28E+01
1.10E+01
PASS
1.29E+01
3.71E-02
1.30E+01
1.28E+01
1.10E+01
PASS
1.29E+01
3.78E-02
1.30E+01
1.28E+01
1.10E+01
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +15V RL=2kΩ (V)
1.35E+01
1.30E+01
1.25E+01
1.20E+01
1.15E+01
1.10E+01
1.05E+01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.58. Plot of Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
122
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.58. Raw data for Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +15V RL=2kΩ (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.29E+01
1.30E+01
1.30E+01
70
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.29E+01
1.30E+01
1.30E+01
0
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.30E+01
1.30E+01
10
1.30E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.30E+01
1.30E+01
20
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.29E+01
1.30E+01
1.30E+01
30
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
2.98E-02
1.31E+01
1.29E+01
1.30E+01
3.06E-02
1.31E+01
1.29E+01
1.30E+01
3.17E-02
1.30E+01
1.29E+01
1.30E+01 1.30E+01 1.30E+01 1.30E+01
3.20E-02 3.18E-02 3.22E-02 3.09E-02
1.30E+01 1.30E+01 1.30E+01 1.30E+01
1.29E+01 1.29E+01 1.29E+01 1.29E+01
1.30E+01 1.30E+01 1.30E+01 1.30E+01
3.09E-02
3.16E-02
3.23E-02
3.19E-02
1.31E+01 1.30E+01 1.30E+01 1.30E+01
1.29E+01 1.29E+01 1.29E+01 1.29E+01
1.10E+01 1.10E+01 1.10E+01 1.10E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
123
50
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.29E+01
1.30E+01
1.30E+01
24 hr
Anneal
1.29E+01
3.23E-02
1.30E+01
1.29E+01
1.10E+01
PASS
1.29E+01
3.23E-02
1.30E+01
1.29E+01
1.10E+01
PASS
1.30E+01
3.22E-02
1.30E+01
1.29E+01
1.10E+01
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Low 1 @ +15V RL=open (V)
-1.28E+01
-1.30E+01
-1.32E+01
-1.34E+01
-1.36E+01
-1.38E+01
-1.40E+01
-1.42E+01
-1.44E+01
-1.46E+01
-1.48E+01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.59. Plot of Output Voltage Low 1 @ +15V RL=open (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
124
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.59. Raw data for Output Voltage Low 1 @ +15V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +15V RL=open (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
70
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
0
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
10
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
20
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
30
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
3.35E-03
-1.46E+01
-1.46E+01
-1.46E+01
3.35E-03
-1.46E+01
-1.46E+01
-1.46E+01
3.13E-03
-1.46E+01
-1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
3.13E-03 3.35E-03 3.35E-03 3.35E-03
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
1.67E-03
1.79E-03
1.67E-03
1.67E-03
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
125
50
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
24 hr
Anneal
-1.46E+01
1.79E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
-1.46E+01
1.95E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
-1.46E+01
1.64E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Low 2 @ +15V RL=open (V)
-1.28E+01
-1.30E+01
-1.32E+01
-1.34E+01
-1.36E+01
-1.38E+01
-1.40E+01
-1.42E+01
-1.44E+01
-1.46E+01
-1.48E+01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.60. Plot of Output Voltage Low 2 @ +15V RL=open (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
126
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.60. Raw data for Output Voltage Low 2 @ +15V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +15V RL=open (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
70
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
0
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
10
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
20
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
30
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
2.61E-03
-1.46E+01
-1.46E+01
-1.46E+01
3.03E-03
-1.46E+01
-1.46E+01
-1.46E+01
3.03E-03
-1.46E+01
-1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
2.83E-03 3.03E-03 2.61E-03 3.00E-03
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
1.79E-03
2.00E-03
2.07E-03
2.28E-03
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
127
50
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
24 hr
Anneal
-1.46E+01
2.59E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
-1.46E+01
2.00E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
-1.46E+01
1.92E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Low 1 @ +15V RL=2kΩ (V)
0.00E+00
-2.00E+00
-4.00E+00
-6.00E+00
-8.00E+00
-1.00E+01
-1.20E+01
-1.40E+01
-1.60E+01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.61. Plot of Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
128
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.61. Raw data for Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +15V RL=2kΩ (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
-1.35E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
70
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
0
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
10
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
20
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
30
-1.35E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
4.10E-02
-1.35E+01
-1.37E+01
-1.36E+01
4.26E-02
-1.34E+01
-1.37E+01
-1.36E+01
4.24E-02
-1.34E+01
-1.37E+01
-1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01
4.27E-02 4.20E-02 4.26E-02 4.20E-02
-1.34E+01 -1.34E+01 -1.34E+01 -1.34E+01
-1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01
-1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01
1.84E-02
1.92E-02
1.94E-02
1.90E-02
-1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01
-1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01
-1.10E+01 -1.10E+01 -1.10E+01 -1.10E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
129
50
-1.35E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
24 hr
Anneal
-1.35E+01
1.87E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.35E+01
1.86E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
1.83E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Low 2 @ +15V RL=2kΩ (V)
0.00E+00
-2.00E+00
-4.00E+00
-6.00E+00
-8.00E+00
-1.00E+01
-1.20E+01
-1.40E+01
-1.60E+01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.62. Plot of Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
130
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.62. Raw data for Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +15V RL=2kΩ (V)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
10
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
20
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
30
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
50
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
24 hr
Anneal
168 hr
Anneal
60
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
70
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01
3.71E-02 3.84E-02 3.80E-02 3.85E-02 3.82E-02 3.86E-02 3.87E-02
-1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01
-1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01
-1.36E+01
1.90E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
2.06E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
2.01E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
1.95E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
An ISO 9001:2000 Certified Company
131
-1.36E+01
1.99E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
1.95E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
1.92E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Slew Rate 1 @ +15V (V/us)
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.63. Plot of Positive Slew Rate 1 @ +15V (V/us) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
132
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.63. Raw data for Positive Slew Rate 1 @ +15V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 1 @ +15V (V/us)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
7.90E-02
9.90E-02
1.05E-01
1.01E-01
1.16E-01
1.01E-01
1.08E-01
1.00E-01
9.30E-02
1.10E-01
1.09E-01
10
1.20E-01
1.15E-01
1.25E-01
1.21E-01
1.33E-01
1.25E-01
1.28E-01
1.20E-01
1.18E-01
1.39E-01
1.45E-01
20
1.14E-01
1.07E-01
1.22E-01
1.12E-01
1.28E-01
1.29E-01
1.17E-01
1.19E-01
1.15E-01
1.17E-01
1.29E-01
30
1.14E-01
1.15E-01
1.20E-01
1.13E-01
1.23E-01
1.19E-01
1.27E-01
1.17E-01
1.03E-01
1.31E-01
1.22E-01
50
1.05E-01
1.09E-01
1.24E-01
1.17E-01
1.18E-01
1.21E-01
1.27E-01
1.07E-01
1.06E-01
1.19E-01
1.27E-01
60
1.18E-01
1.13E-01
1.10E-01
1.05E-01
1.28E-01
1.19E-01
1.27E-01
1.13E-01
1.02E-01
1.06E-01
1.22E-01
70
1.08E-01
1.16E-01
1.14E-01
1.11E-01
1.25E-01
1.26E-01
1.20E-01
1.17E-01
1.10E-01
1.16E-01
1.21E-01
1.00E-01
1.35E-02
1.37E-01
6.31E-02
1.23E-01
6.72E-03
1.41E-01
1.04E-01
1.17E-01
8.35E-03
1.40E-01
9.37E-02
1.17E-01
4.30E-03
1.29E-01
1.05E-01
1.15E-01
7.57E-03
1.35E-01
9.38E-02
1.15E-01
8.76E-03
1.39E-01
9.08E-02
1.15E-01
6.46E-03
1.33E-01
9.71E-02
1.02E-01
6.80E-03
1.21E-01
8.37E-02
6.00E-02
PASS
1.26E-01
8.28E-03
1.49E-01
1.03E-01
5.00E-02
PASS
1.19E-01
5.55E-03
1.35E-01
1.04E-01
5.00E-02
PASS
1.19E-01 1.16E-01
1.08E-02 9.17E-03
1.49E-01 1.41E-01
8.98E-02 9.09E-02
4.00E-02 3.00E-02
PASS
PASS
1.13E-01
1.00E-02
1.41E-01
8.59E-02
3.00E-02
PASS
1.18E-01
5.85E-03
1.34E-01
1.02E-01
3.00E-02
PASS
An ISO 9001:2000 Certified Company
133
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Slew Rate 2 @ +15V (V/us)
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.64. Plot of Positive Slew Rate 2 @ +15V (V/us) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
134
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.64. Raw data for Positive Slew Rate 2 @ +15V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 2 @ +15V (V/us)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.05E-01
9.50E-02
9.50E-02
1.07E-01
1.17E-01
1.07E-01
1.04E-01
1.07E-01
9.20E-02
1.11E-01
1.05E-01
10
1.17E-01
1.14E-01
1.19E-01
1.22E-01
1.28E-01
1.17E-01
1.26E-01
1.32E-01
1.09E-01
1.26E-01
1.25E-01
20
1.25E-01
1.13E-01
1.26E-01
1.21E-01
1.27E-01
1.30E-01
1.12E-01
1.11E-01
1.13E-01
1.17E-01
1.15E-01
30
1.14E-01
1.11E-01
1.12E-01
1.12E-01
1.30E-01
1.15E-01
1.31E-01
1.14E-01
1.38E-01
1.22E-01
1.43E-01
50
1.08E-01
1.12E-01
1.21E-01
1.11E-01
1.35E-01
1.09E-01
1.26E-01
1.06E-01
1.04E-01
1.24E-01
1.22E-01
60
1.09E-01
1.09E-01
1.23E-01
1.19E-01
1.25E-01
1.16E-01
1.16E-01
1.08E-01
1.01E-01
1.07E-01
1.17E-01
70
1.15E-01
1.11E-01
1.17E-01
1.19E-01
1.50E-01
1.20E-01
1.23E-01
1.14E-01
1.08E-01
1.23E-01
1.20E-01
1.04E-01
9.23E-03
1.29E-01
7.85E-02
1.20E-01
5.34E-03
1.35E-01
1.05E-01
1.22E-01
5.73E-03
1.38E-01
1.07E-01
1.16E-01
8.01E-03
1.38E-01
9.38E-02
1.17E-01
1.10E-02
1.47E-01
8.73E-02
1.17E-01
7.62E-03
1.38E-01
9.61E-02
1.22E-01
1.57E-02
1.65E-01
7.93E-02
1.04E-01
7.26E-03
1.24E-01
8.43E-02
6.00E-02
PASS
1.22E-01
9.03E-03
1.47E-01
9.72E-02
5.00E-02
PASS
1.17E-01
7.83E-03
1.38E-01
9.51E-02
5.00E-02
PASS
1.24E-01 1.14E-01
1.04E-02 1.04E-02
1.52E-01 1.42E-01
9.56E-02 8.53E-02
4.00E-02 3.00E-02
PASS
PASS
1.10E-01
6.43E-03
1.27E-01
9.20E-02
3.00E-02
PASS
1.18E-01
6.50E-03
1.35E-01
9.98E-02
3.00E-02
PASS
An ISO 9001:2000 Certified Company
135
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Slew Rate 1 @ +15V (V/us)
0.00E+00
-2.00E-02
-4.00E-02
-6.00E-02
-8.00E-02
-1.00E-01
-1.20E-01
-1.40E-01
-1.60E-01
-1.80E-01
-2.00E-01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.65. Plot of Negative Slew Rate 1 @ +15V (V/us) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
136
70
ELDRS Report
08-127 090619 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.65. Raw data for Negative Slew Rate 1 @ +15V (V/us) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 1 @ +15V (V/us)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
-1.11E-01
-1.17E-01
-1.16E-01
-1.10E-01
-1.24E-01
-1.17E-01
-1.16E-01
-1.15E-01
-1.16E-01
-1.17E-01
-4.30E-02
70
-1.23E-01
-1.16E-01
-1.20E-01
-1.23E-01
-1.45E-01
-1.19E-01
-1.28E-01
-1.25E-01
-1.25E-01
-1.37E-01
-1.34E-01
0
-1.06E-01
-9.80E-02
-1.17E-01
-1.05E-01
-1.27E-01
-9.20E-02
-9.70E-02
-1.01E-01
-9.60E-02
-1.14E-01
-9.90E-02
10
-1.42E-01
-1.29E-01
-1.34E-01
-1.25E-01
-1.62E-01
-1.30E-01
-1.27E-01
-1.27E-01
-1.24E-01
-1.35E-01
-1.31E-01
20
-1.22E-01
-1.14E-01
-1.28E-01
-1.24E-01
-1.39E-01
-1.19E-01
-1.20E-01
-1.21E-01
-1.12E-01
-1.30E-01
-1.42E-01
30
-1.19E-01
-1.18E-01
-1.17E-01
-1.19E-01
-1.35E-01
-1.13E-01
-1.30E-01
-1.11E-01
-1.14E-01
-1.40E-01
-1.42E-01
-1.11E-01
1.14E-02
-7.93E-02
-1.42E-01
-1.38E-01
1.46E-02
-9.83E-02
-1.79E-01
-1.25E-01
9.15E-03
-1.00E-01
-1.51E-01
-1.22E-01 -1.21E-01 -1.16E-01 -1.25E-01
7.54E-03 8.28E-03 5.59E-03 1.13E-02
-1.01E-01 -9.83E-02 -1.00E-01 -9.43E-02
-1.42E-01 -1.44E-01 -1.31E-01 -1.56E-01
-1.00E-01
8.46E-03
-7.68E-02
-1.23E-01
-6.00E-02
PASS
-1.29E-01
4.16E-03
-1.17E-01
-1.40E-01
-5.00E-02
PASS
-1.20E-01
6.43E-03
-1.03E-01
-1.38E-01
-5.00E-02
PASS
-1.22E-01
1.28E-02
-8.66E-02
-1.57E-01
-4.00E-02
PASS
An ISO 9001:2000 Certified Company
137
50
-1.22E-01
-1.09E-01
-1.29E-01
-1.17E-01
-1.28E-01
-1.09E-01
-1.25E-01
-1.13E-01
-1.08E-01
-1.26E-01
-1.34E-01
24 hr
Anneal
-1.16E-01
8.70E-03
-9.23E-02
-1.40E-01
-3.00E-02
PASS
-1.16E-01
8.37E-04
-1.14E-01
-1.18E-01
-3.00E-02
PASS
-1.27E-01
6.57E-03
-1.09E-01
-1.45E-01
-3.00E-02
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Slew Rate 2 @ +15V (V/us)
0.00E+00
-2.00E-02
-4.00E-02
-6.00E-02
-8.00E-02
-1.00E-01
-1.20E-01
-1.40E-01
-1.60E-01
-1.80E-01
0
10
20
30
40
50
60
Total Dose (krad(Si))
Figure 5.66. Plot of Negative Slew Rate 2 @ +15V (V/us) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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Table 5.66. Raw data for Negative Slew Rate 2 @ +15V (V/us) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 2 @ +15V (V/us)
Device
520
521
522
523
524
525
527
528
530
531
532
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
60
-1.09E-01
-1.07E-01
-1.15E-01
-1.22E-01
-1.40E-01
-1.10E-01
-1.37E-01
-1.20E-01
-1.16E-01
-1.26E-01
-1.29E-01
70
-1.09E-01
-1.15E-01
-1.35E-01
-1.23E-01
-1.36E-01
-1.14E-01
-1.33E-01
-1.20E-01
-1.19E-01
-1.33E-01
-1.37E-01
0
-1.00E-01
-1.01E-01
-1.14E-01
-1.08E-01
-1.20E-01
-1.08E-01
-1.12E-01
-9.90E-02
-9.80E-02
-1.15E-01
-1.11E-01
10
-1.28E-01
-1.25E-01
-1.32E-01
-1.19E-01
-1.52E-01
-1.37E-01
-1.27E-01
-1.21E-01
-1.19E-01
-1.33E-01
-1.31E-01
20
-1.17E-01
-1.22E-01
-1.35E-01
-1.16E-01
-1.34E-01
-1.28E-01
-1.33E-01
-1.31E-01
-1.15E-01
-1.24E-01
-1.29E-01
30
-1.22E-01
-1.23E-01
-1.23E-01
-1.26E-01
-1.30E-01
-1.26E-01
-1.28E-01
-1.13E-01
-1.17E-01
-1.19E-01
-1.29E-01
-1.09E-01
8.53E-03
-8.52E-02
-1.32E-01
-1.31E-01
1.26E-02
-9.68E-02
-1.66E-01
-1.25E-01
9.15E-03
-9.97E-02
-1.50E-01
-1.25E-01 -1.20E-01 -1.19E-01 -1.24E-01
3.27E-03 1.20E-02 1.33E-02 1.19E-02
-1.16E-01 -8.76E-02 -8.21E-02 -9.08E-02
-1.34E-01 -1.53E-01 -1.55E-01 -1.56E-01
-1.06E-01
7.64E-03
-8.55E-02
-1.27E-01
-6.00E-02
PASS
-1.27E-01
7.67E-03
-1.06E-01
-1.48E-01
-5.00E-02
PASS
-1.26E-01
7.12E-03
-1.07E-01
-1.46E-01
-5.00E-02
PASS
-1.21E-01
6.27E-03
-1.03E-01
-1.38E-01
-4.00E-02
PASS
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-1.22E-01
-1.03E-01
-1.24E-01
-1.17E-01
-1.36E-01
-1.16E-01
-1.15E-01
-1.19E-01
-1.08E-01
-1.21E-01
-1.27E-01
24 hr
Anneal
-1.16E-01
4.97E-03
-1.02E-01
-1.29E-01
-3.00E-02
PASS
-1.22E-01
1.03E-02
-9.35E-02
-1.50E-01
-3.00E-02
PASS
-1.24E-01
8.70E-03
-9.99E-02
-1.48E-01
-3.00E-02
PASS
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6.0. Summary / Conclusions
The low dose rate total ionizing dose testing described in this final report was performed using the
facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. For the low
dose rate ELDRS testing described in this report, the devices were placed approximately 2-meters from
the Co-60 rods to achieve the required 10mrad(Si)/s dose rate. Samples of the RH1078MW quad
operational amplifier described in this report were irradiated biased with a split 15V supply and
unbiased (all leads tied to ground). The devices were irradiated to a maximum total ionizing dose level
of 50krad(Si) with a pre-rad baseline reading as well as incremental readings at 10, 20, and 30krad(Si).
Electrical testing occurred within one hour following the end of each irradiation segment. For
intermediate irradiations, the units were tested and returned to total dose exposure within two hours from
the end of the previous radiation increment. In addition, all units-under-test received a 24hr room
temperature and168hr 100°C anneal, using the same bias conditions as the radiation exposure.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
were presented in this report. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 99/90 and a 5-piece sample size. Note that the following criteria was used to
determine the outcome of the testing: following the radiation exposure each parameter had to pass the
specification value and the average value for the ten-piece sample must pass the specification value
when the KTL limits are applied. If these conditions were not both satisfied following the radiation
exposure, then the lot would be logged as an RLAT failure.
Using the conditions stated above, the RH1078MW passed the ELDRS test to 50krad(Si). Most
measured parameters showed no significant degradation with radiation. In several cases, open loop
gain showed substantial degradation with radiation, however in no case was it sufficient to cause the
parameter to exceed the post-irradiation specification (before application of the KTL statistics). If
necessary, larger samples sizes could be used to qualify these units using an “attributes” approach. This
report also shows the AVOL data using unit of dB, which helps to remove the measurement error and
allow the reader to better analyze the radiation response.
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Appendix A: Photograph of device-under-test to show part markings
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Appendix B: TID Bias Connections
Biased Samples:
Pin
1
2
3
4
5
6
7
8
9
10
Function
OUT A
-INPUT A
+INPUT A
N/C
VN/C
+INPUT B
-INPUT B
OUT B
V+
Connection / Bias
To Pin 2 via 10kΩ Resistor
To Pin 1 via 10kΩ Resistor
To 8V via 10kΩ Resistor
N/C
To –15V using 0.1μF Decoupling
N/C
To 8V via 10kΩ Resistor
To Pin 9 via 10kΩ Resistor
To Pin 8 via 10kΩ Resistor
To +15V using 0.1μF Decoupling
Unbiased Samples:
Pin
1
2
3
4
5
6
7
8
9
10
Function
OUT A
-INPUT A
+INPUT A
N/C
VN/C
+INPUT B
-INPUT B
OUT B
V+
Connection / Bias
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
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Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was
extracted from LINEAR TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K
“MICROCIRCUIT, LINEAR, MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY,
PRECISION OP AMP”.
Figure B.2. W package drawing (for reference only). This figure was extracted from LINEAR
TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K “MICROCIRCUIT, LINEAR,
MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY, PRECISION OP AMP”.
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
operational amplifiers, voltage comparators, D to A and A to D converters. The LTS2020 Test System
achieves accuracy and sensitivity through the use of software self-calibration and an internal relay
matrix with separate family boards and custom personality adapter boards. The tester uses this relay
matrix to connect the required test circuits, select the appropriate voltage / current sources and establish
the needed measurement loops for all the tests performed. The measured parameters and test conditions
are shown in Table C.1.
Test numbers 19 and 20 are modified from the datasheet condition of VCM=100mV to VCM=0V. This is
because the LTS2020 measurement circuit has an impedance of ~333kΩ, such that at 100mV it is
effectively injecting ~300nA of current. This is enough to raise the measured VOL by ~1mV. In our
estimation, modifying the test condition as specified, plus biasing the amp not being measured to have a
VOUT of ~100mV to make sure it’s not saturated, reduces the current injected by the measurement circuit
to ~30nA or less. For reference, on SN532, Linear’s data is 4.19 and 4.11 mV for the A and B amps,
respectively. On the LTS2020 with VCM=100mV we measured 5.88 and 5.41 mV. With VCM=0V we
measured Vol of 4.46 and 4.13 mV.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested
repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and
standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited
to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain,
where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard
deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes
could be used to qualify these parameters using an “attributes” approach.
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Table C.1. Measured parameters and test conditions for the RH1078MW.
TEST
NUMBER
TEST
DESCRIPTION
TEST
CONDITIONS
1
Positive Supply Current (ICC2)
V=+5V
2
Negative Supply Current (IEE2)
V=+5V
3&4
Input Offset Voltage (VOS1 &VOS2)
V=+5V
5&6
Input Offset Current (IOS1 & IOS2)
V=+5V
7&8
+ Input Bias Current (IB+1 & IB+2)
V=+5V
9 & 10
- Input Bias Current (IB-1 & IB-2)
V=+5V
11 & 12
13 & 14
15 & 16
17 & 18
Common Mode Rejection Ratio
(CMRR1 & CMRR2)
Power Supply Rejection Ratio
(PSRR1 & PSRR2)
Large Signal Voltage Gain (AVOL 1
&AVOL2)
Large Signal Voltage Gain (AVOL3
&AVOL4)
V=+5V, VCM = 0V to 3.5V
V= 2.3V to 12V
V=+5V, RL =Open
V=+5V, RL =50kΩ
19 & 20
VOUT Low (VOUTLOW1 & VOUTLOW2)
V=+5V, RL =Open, VCM = 0V*
21 & 22
VOUT Low (VOUTLOW3 & VOUTLOW4)
V=+5V, RL =2kΩ
23 & 24
VOUT Low (VOUTLOW5 & VOUTLOW6)
V=+5V, ISINK=100µA
25 & 26
VOUT High (VOUTHIGH1 & VOUTHIGH2)
V=+5V, RL =Open
27 & 28
VOUT High (VOUTHIGH3 & VOUTHIGH4)
V=+5V, RL =2kΩ
29 & 30
+SR (Slew Rate 1 and Slew Rate 2)
V=+5V, AV=1
31 & 32
-SR (Slew Rate 3 and Slew Rate 4)
V=+5V, AV=1
* This is non-datasheet condition, see above for explanation.
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33
Positive Supply Current (ICC2)
V=±15V
34
Negative Supply Current (IEE2)
V=±15V
35 & 36
Input Offset Voltage (VOS3 &VOS4)
V=±15V
37 & 38
Input Offset Current (IOS3 & IOS4)
V=±15V
39 & 40
+ Input Bias Current (IB+3 & IB+4)
V=±15V
41 & 42
- Input Bias Current (IB-3 & IB-4)
V=±15V
43 & 44
45 & 46
47 & 48
49 & 50
Common Mode Rejection Ratio
(CMRR3 & CMRR4)
Power Supply Rejection Ratio
(PSRR3 & PSRR4)
Large Signal Voltage Gain (AVOL 5
&AVOL6)
Large Signal Voltage Gain (AVOL 7
&AVOL8)
V=±15V, VCM = 13.5V, –15V
V= 5V, 0V to ±18V
V=±15V, RL=50kΩ
V=±15V, RL=2kΩ
51 & 52
VOUT High (VOUTHIGH5 & VOUTHIGH6)
V=±15V, RL=50kΩ
53 & 54
VOUT High (VOUTHIGH7 & VOUTHIGH8)
V=±15V, RL=2kΩ
55 & 56
VOUT Low (VOUTLOW7 & VOUTLOW8)
V=±15V, RL=50kΩ
57 & 58
VOUT Low (VOUTLOW9 & VOUTLOW10)
V=±15V, RL=2kΩ
59 & 60
+SR (Slew Rate 5 and Slew Rate 6)
V=±15V, AV=1
60 & 61
-SR (Slew Rate 7 and Slew Rate 8)
V=±15V, AV=1
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Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution
for the RH1078MW.
Pre-Irradiation
Specification
Measurement
Resolution/Precision
Positive Supply Current (ICC)
1.5E-04A
± 1.31E-06A
Negative Supply Current (IEE)
-1.5E-04A
± 1.07E-06A
Input Offset Voltage (VOS1 &VOS2)
±1.2E-04V
± 3.41E-06V
Input Offset Current (IOS1 & IOS2)
±8E-10A
± 5.06E-11A
+ Input Bias Current (IB+1 & IB+2)
±1.5E-08A
± 5.88E-11A
- Input Bias Current (IB-1 & IB-2)
±1.5E-08A
± 8.03E-11A
94dB
± 3.12E+00 dB
100dB
± 5.70E+00dB
150V/mV
± 2.69E+02V/mV
120V/mV
± 7.13E+02 V/mV
VOUT Low (VOUTLOW1 & VOUTLOW2)
6E-03V
± 1.16E-04V
VOUT Low (VOUTLOW3 & VOUTLOW4)
2E-03V
± 3.43E-05V
VOUT Low (VOUTLOW5 & VOUTLOW6)
1.3E-01V
± 3.22E-04V
VOUT High (VOUTHIGH1 & VOUTHIGH2)
4.2V
± 3.11E-03V
VOUT High (VOUTHIGH3 & VOUTHIGH4)
3.5V
± 2.13E-03V
+SR (Slew Rate 1 and Slew Rate 2)
4E-02V/μs
± 1.07E-03V/μs
-SR (Slew Rate 3 and Slew Rate 4)
-4E-02V/μs
± 1.81E-03 V/μs
Measured Parameter
Common Mode Rejection Ratio
(CMRR1 & CMRR2)
Power Supply Rejection Ratio
(PSRR1 & PSRR2)
Large Signal Voltage Gain (AVOL 1
&AVOL2)
Large Signal Voltage Gain (AVOL3
&AVOL4)
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Pre-Irradiation
Specification
Measurement
Resolution/Precision
Positive Supply Current (ICC2)
2E-04A
± 1.74E-06A
Negative Supply Current (IEE2)
-2E-04A
± 9.73E-07A
Input Offset Voltage (VOS3 &VOS4)
±3.5E-4V
± 2.51E-06V
Input Offset Current (IOS3 & IOS4)
±8E-10A
± 3.54E-11A
+ Input Bias Current (IB+3 & IB+4)
±1.5E-08A
± 3.89E-11A
- Input Bias Current (IB-3 & IB-4)
±1.5E-08A
± 7.51E-11A
97dB
± 2.98E-01dB
100dB
± 4.20E+00dB
1000V/mV
± 2.34E+04V/mV
300V/mV
± 7.07E+01V/mV
VOUT High (VOUTHIGH5 & VOUTHIGH6)
13V
± 2.38E-03V
VOUT High (VOUTHIGH7 & VOUTHIGH8)
11V
± 1.17E-03V
VOUT Low (VOUTLOW7 & VOUTLOW8)
-13V
± 1.75E-03V
VOUT Low (VOUTLOW9 & VOUTLOW10)
-11V
± 4.14E-03V
+SR (Slew Rate 5 and Slew Rate 6)
6E-02V/μs
± 6.97E-03V/μs
-SR (Slew Rate 7 and Slew Rate 8)
-6E-02V/μs
± 9.02E-03V/μs
Measured Parameter
Common Mode Rejection Ratio
(CMRR3 & CMRR4)
Power Supply Rejection Ratio (PSRR3
& PSRR4)
Large Signal Voltage Gain (AVOL 5
&AVOL6)
Large Signal Voltage Gain (AVOL 7
&AVOL8)
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Appendix D: List of Figures used in Section 5 (ELDRS Test Results)
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
5.20
5.21
5.22
5.23
5.24
5.25
5.26
5.27
5.28
5.29
5.30
5.31
5.32
5.33
5.34
5.35
5.36
5.37
5.38
5.39
Positive Supply Current @+5V (A)
Negative Supply Current @+5V (A)
Input Offset Voltage 1 @ +5V (V)
Input Offset Voltage 2 @ +5V (V)
Input Offset Current 1 @ +5V (A)
Input Offset Current 2 @ +5V (A)
Positive Input Bias Current 1 @ +5V (A)
Positive Input Bias Current 2 @ +5V (A)
Negative Input Bias Current 1 @ +5V (A)
Negative Input Bias Current 2 @+5V (A)
Common Mode Rejection Ratio 1 @ +5V (dB)
Common Mode Rejection Ratio 2 @ +5V (dB)
Power Supply Rejection Ratio 1 @ +5V (dB)
Power Supply Rejection Ratio 2 @ +5V (dB)
Open Loop Gain 1 @ +5V, RL=open (V/mV)
Open Loop Gain 2 @ +5V, RL=open (V/mV)
Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV)
Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV)
Open Loop Gain 1 @ +5V, RL=open (dB)
Open Loop Gain 2 @ +5V, RL=open (dB)
Open Loop Gain 1 @ +5V, RL=50kΩ (dB)
Open Loop Gain 2 @ +5V, RL=50kΩ (dB)
Output Voltage Low 1 @ +5V RL=open (V)
Output Voltage Low 2 @ +5V RL=open (V)
Output Voltage Low 1 @ +5V RL=2kΩ (V)
Output Voltage Low 2 @ +5V RL=2kΩ (V)
Output Voltage Low 1 @ +5V IL=100uA (V)
Output Voltage Low 2 @ +5V IL=100uA (V)
Output Voltage High 1 @ +5V RL=open (V)
Output Voltage High 2 @ +5V RL=open (V)
Output Voltage High 1 @ +5V RL=2kΩ (V)
Output Voltage High 2 @ +5V RL=2kΩ (V)
Positive Slew Rate 1 @ +5V (V/us)
Positive Slew Rate 2 @ +5V (V/us)
Negative Slew Rate 1 @ +5V (V/us)
Negative Slew Rate 2 @ +5V (V/us)
Positive Supply Current @+15V (A)
Negative Supply Current @+15V (A)
Input Offset Voltage 1 @ +15V (V)
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5.40
5.41
5.42
5.43
5.44
5.45
5.46
5.47
5.48
5.49
5.50
5.51
5.52
5.53
5.54
5.55
5.56
5.57
5.58
5.59
5.60
5.61
5.62
5.63
5.64
5.65
5.66
Input Offset Voltage 2 @ +15V (V)
Input Offset Current 1 @ +15V (A)
Input Offset Current 2 @ +15V (A)
Positive Input Bias Current 1 @ +15V (A)
Positive Input Bias Current 2 @ +15V (A)
Negative Input Bias Current 1 @ +15V (A)
Negative Input Bias Current 2 @ +15V (A)
Common Mode Rejection Ratio 1 @ +15V (dB)
Common Mode Rejection Ratio 2 @ +15V (dB)
Power Supply Rejection Ratio 1 @ +15V (dB)
Power Supply Rejection Ratio 2 @ +15V (dB)
Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV)
Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV)
Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV)
Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV)
Output Voltage High 1 @ +15V RL=open (V)
Output Voltage High 2 @ +15V RL=open (V)
Output Voltage High 1 @ +15V RL=2kΩ (V)
Output Voltage High 2 @ +15V RL=2kΩ (V)
Output Voltage Low 1 @ +15V RL=open (V)
Output Voltage Low 2 @ +15V RL=open (V)
Output Voltage Low 1 @ +15V RL=2kΩ (V)
Output Voltage Low 2 @ +15V RL=2kΩ (V)
Positive Slew Rate 1 @ +15V (V/us)
Positive Slew Rate 2 @ +15V (V/us)
Negative Slew Rate 1 @ +15V (V/us)
Negative Slew Rate 2 @ +15V (V/us)
An ISO 9001:2000 Certified Company
150
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
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