RLAT_200K_Report_RH119W_F0258.1_W13.pdf

TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Radiation Lot Acceptance Testing (RLAT) of the RH119W High Performance
Dual Comparator for Linear Technology
Customer: Linear Technology, PO# 60334L.1
RAD Job Number: 11-425
Part Type Tested: RH119W High Performance Dual Comparator.
Traceability Information: Fab Lot Number: F0258.1, Wafer Number: 13, Assembly Lot Number:
601387.1, Date Code: 1049A. See photograph of unit under test in Appendix A.
Quantity of Units: 12 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 2
units for control. Serial numbers 1438-1442 were biased during irradiation, serial numbers 1443-1447
were unbiased during irradiation and serial numbers 1448 and 1449 were used as control. See Appendix
B for the radiation bias connection table.
Radiation and Electrical Test Increments: 50 to 300rad(Si)/s ionizing radiation with electrical test
increments: pre-irradiation, 20krad(Si), 50krad(Si), 100krad(Si) and 200krad(Si).
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
Overtest and Post-Irradiation Anneal: No overtest. No anneal.
Radiation Test Standard: MIL-STD-750E TM1019 and/or MIL-STD-883H TM1019 Condition A.
Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS04, Calibration Date: 04-2811, Calibration Due 04-28-12. LTS2101 Family Board, Entity ID FB02. LTS0607 Test Fixture, Entity
ID TF07. RH119 BGSS-0325 DUT Board. Test Program: RH119A.SRC
Facility and Radiation Source: Aeroflex RAD's Longmire Laboratories, Colorado Springs, CO.
Gamma rays provided by JLSA 81-24 Co60 source. Dosimetry performed by Air Ionization Chamber
(AIC) traceable to NIST. Aeroflex RAD's dosimetry has been audited by DSCC and Aeroflex RAD has
been awarded Laboratory Suitability for MIL-STD-750 and MIL-STD-883 TM 1019.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and
MIL-STD-750.
RLAT Result: PASSED. The units-under-test passed the total ionizing
dose test to the maximum tested dose level of 200krad(Si) with all
parameters remaining within their datasheet specifications.
An ISO 9001:2008 and DSCC Certified Company
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TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is
frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage
will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to
ensure a worst-case test condition MIL-STD-883 TM1019.8 calls out a dose rate of 50 to 300rad(Si)/s as
Condition A and further specifies that the time from the end of an incremental radiation exposure and
electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to
the beginning of the next incremental radiation step should be 2-hours or less. The work described in
this report was performed to meet MIL-STD-883 TM1019.8 Condition A.
2.0. Radiation Test Apparatus
The total ionizing dose testing described in this final report was performed using the facilities at
Aeroflex RAD's Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose
(TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are
held in the base of the irradiator heavily shielded by lead. During the radiation exposures the rod is
raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this
irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s,
determined by the distance from the source. For high-dose rate experiments the bias boards are placed in
a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required
dose rate. The irradiator calibration is maintained by Aeroflex RAD Longmire Laboratories using air
ionization chamber (AIC) equipment calibrated with traceability to the National Institute of Standards
and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at
Aeroflex RAD's Longmire Laboratory facility.
Aeroflex RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory
Suitability under MIL STD 750 and MIL-STD-883. Additional details regarding Aeroflex RAD
dosimetry for TM1019 Condition A testing are available in Aeroflex RAD's report to DSCC entitled:
"Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation
Assured Devices".
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TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 2.1. Aeroflex RAD's high dose rate Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately
120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet.
An ISO 9001:2008 and DSCC Certified Company
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TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
3.0. Radiation Test Conditions
The RH119W High Performance Dual Comparator described in this final report were irradiated using a
split 15V supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in
Appendix B for the full bias circuits. In our opinion, this bias circuit satisfies the requirements of MILSTD-883H TM1019.8 Section 3.9.3 Bias and Loading Conditions which states "The bias applied to the
test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage
for the intended application, if known. While maximum voltage is often worst case some bipolar linear
device parameters (e.g. input bias current or maximum output load current) exhibit more degradation
with 0 V bias."
The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental
readings at 20krad(Si), 50krad(Si) and 100krad(Si). Electrical testing occurred within one hour
following the end of each irradiation segment. For intermediate irradiations, the parts were tested and
returned to total dose exposure within two hours from the end of the previous radiation increment.
The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s
and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MILSTD-883H TM1019.8 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted."
The final dose rate within the high dose rate lead-aluminum enclosure was determined using calibration
calculations based on air ionization chamber (AIC) dosimetry performed just prior to beginning the total
dose irradiations. The final dose rate for this work was 55.49rad(Si)/s with a precision of ±5%.
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TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
4.0. Tested Parameters
During the total ionizing dose characterization testing the following electrical parameters were measured
pre- and post-irradiation:
1. Positive Supply Current (A) @ VS=±15V
2. Negative Supply Current (A) @ VS=±15V
3. Input Offset Voltage 1 (V) @ VS=±15V, VCM=0V
4. Input Offset Voltage 2 (V) @ VS=±15V, VCM=0V
5. Input Offset Current 1 (A) @ VS=±15V, VCM=0V
6. Input Offset Current 2 (A) @ VS=±15V, VCM=0V
7. Positive Bias Current 1 (A) @ VS=±15V, VCM=0V
8. Positive Bias Current 2 (A) @ VS=±15V, VCM=0V
9. Negative Bias Current 1 (A) @ VS=±15V, VCM=0V
10. Negative Bias Current 2 (A) @ VS=±15V, VCM=0V
11. Large signal Voltage Gain 1 (V/mV) @ VS=±15V, VCM=0V
12. Large signal Voltage Gain 2 (V/mV) @ VS=±15V, VCM=0V
13. Common Mode Rejection Ratio 1 (dB) @ VS=±15V
14. Common Mode Rejection Ratio 2 (dB) @ VS=±15V
15. Saturation Voltage 1 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA
16. Saturation Voltage 2 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA
17. Saturation Voltage 1 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA
18. Saturation Voltage 2 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA
19. Output Leakage Current 1 (A) @ VIN=5mV, VOUT to -VS=35V
20. Output Leakage Current 2 (A) @ VIN=5mV, VOUT to -VS=35V
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the total ionizing dose test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet
specification limits, then the lot could be logged as a failure.
An ISO 9001:2008 and DSCC Certified Company
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TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
5.0. Total Ionizing Dose Test Results
Based on this criterion the RH119W High Performance Dual Comparator (from the lot traceability
information provided on the first page of this test report) PASSED the total ionizing dose test to the
maximum tested dose level of 200krad(Si) with all parameters remaining within their datasheet
specifications.
Figures 5.1 through 5.20 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 - 5.20 show the corresponding raw data for each of these parameters. In the data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the average of the data points after application
of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
The control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained in control throughout the duration of the tests and the
observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section
to facilitate the location of a particular parameter.
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TID Report
11-425 111109 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Supply Current (A) @ VS=±15V
1.40E-02
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.1. Plot of Positive Supply Current (A) @ VS=±15V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
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TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.1. Raw data for Positive Supply Current (A) @ VS=±15V versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current (A) @ VS=±15V
Device
0
20
50
100
200
1438 7.37E-03 7.35E-03 7.34E-03 7.34E-03 7.33E-03
1439 7.34E-03 7.32E-03 7.30E-03 7.30E-03 7.29E-03
1440 7.95E-03 7.93E-03 7.91E-03 7.91E-03 7.90E-03
1441 7.38E-03 7.35E-03 7.34E-03 7.33E-03 7.33E-03
1442 7.38E-03 7.36E-03 7.34E-03 7.33E-03 7.33E-03
1443 7.60E-03 7.59E-03 7.59E-03 7.58E-03 7.56E-03
1444 7.45E-03 7.44E-03 7.38E-03 7.44E-03 7.43E-03
1445 7.34E-03 7.34E-03 7.34E-03 7.34E-03 7.32E-03
1446 7.67E-03 7.66E-03 7.66E-03 7.65E-03 7.64E-03
1447 7.58E-03 7.57E-03 7.56E-03 7.55E-03 7.55E-03
1448 7.38E-03 7.38E-03 7.38E-03 7.37E-03 7.36E-03
1449 7.55E-03 7.55E-03 7.56E-03 7.55E-03 7.56E-03
Biased Statistics
Average Biased
7.48E-03 7.46E-03 7.45E-03 7.44E-03 7.44E-03
Std Dev Biased
2.61E-04 2.62E-04 2.60E-04 2.62E-04 2.60E-04
Ps90%/90% (+KTL) Biased
8.20E-03 8.18E-03 8.16E-03 8.16E-03 8.15E-03
Ps90%/90% (-KTL) Biased
6.77E-03 6.74E-03 6.73E-03 6.72E-03 6.72E-03
Un-Biased Statistics
Average Un-Biased
7.53E-03 7.52E-03 7.51E-03 7.51E-03 7.50E-03
Std Dev Un-Biased
1.32E-04 1.28E-04 1.39E-04 1.22E-04 1.25E-04
Ps90%/90% (+KTL) Un-Biased
7.89E-03 7.87E-03 7.89E-03 7.85E-03 7.84E-03
Ps90%/90% (-KTL) Un-Biased
7.17E-03 7.17E-03 7.13E-03 7.18E-03 7.16E-03
Specification MAX
1.15E-02 1.15E-02 1.15E-02 1.15E-02 1.15E-02
Status
PASS
PASS
PASS
PASS
PASS
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TID Report
11-425 111109 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Negative Supply Current (A) @ VS=±15V
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
-2.00E-03
-2.50E-03
-3.00E-03
-3.50E-03
-4.00E-03
-4.50E-03
-5.00E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.2. Plot of Negative Supply Current (A) @ VS=±15V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
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TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.2. Raw data for Negative Supply Current (A) @ VS=±15V versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Supply Current (A) @ VS=±15V
Device
1438
1439
1440
1441
1442
1443
1444
1445
1446
1447
1448
1449
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-3.20E-03
-3.19E-03
-3.44E-03
-3.21E-03
-3.22E-03
-3.30E-03
-3.24E-03
-3.20E-03
-3.32E-03
-3.30E-03
-3.20E-03
-3.28E-03
Total
20
-3.19E-03
-3.18E-03
-3.43E-03
-3.20E-03
-3.21E-03
-3.31E-03
-3.24E-03
-3.19E-03
-3.32E-03
-3.30E-03
-3.20E-03
-3.28E-03
Dose (krad(Si))
50
100
-3.19E-03 -3.19E-03
-3.18E-03 -3.17E-03
-3.43E-03 -3.42E-03
-3.19E-03 -3.19E-03
-3.20E-03 -3.21E-03
-3.30E-03 -3.30E-03
-3.24E-03 -3.24E-03
-3.20E-03 -3.20E-03
-3.32E-03 -3.32E-03
-3.30E-03 -3.30E-03
-3.20E-03 -3.19E-03
-3.27E-03 -3.28E-03
200
-3.19E-03
-3.16E-03
-3.41E-03
-3.19E-03
-3.20E-03
-3.30E-03
-3.25E-03
-3.20E-03
-3.33E-03
-3.31E-03
-3.20E-03
-3.29E-03
-3.25E-03 -3.24E-03 -3.24E-03 -3.24E-03 -3.23E-03
1.06E-04 1.06E-04 1.08E-04 1.04E-04 1.02E-04
-2.96E-03 -2.95E-03 -2.94E-03 -2.95E-03 -2.95E-03
-3.54E-03 -3.53E-03 -3.53E-03 -3.52E-03 -3.51E-03
-3.27E-03
5.02E-05
-3.13E-03
-3.41E-03
-4.50E-03
PASS
-3.27E-03
5.54E-05
-3.12E-03
-3.42E-03
-4.50E-03
PASS
-3.27E-03
5.02E-05
-3.13E-03
-3.41E-03
-4.50E-03
PASS
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-3.27E-03
5.02E-05
-3.13E-03
-3.41E-03
-4.50E-03
PASS
-3.28E-03
5.26E-05
-3.13E-03
-3.42E-03
-4.50E-03
PASS
Input Offset Voltage 1 (V) @ VS=±15V, VCM=0V
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
-2.00E-03
-4.00E-03
-6.00E-03
-8.00E-03
-1.00E-02
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.3. Plot of Input Offset Voltage 1 (V) @ VS=±15V, VCM=0V versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
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TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.3. Raw data for Input Offset Voltage 1 (V) @ VS=±15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 1 (V) @ VS=±15V, VCM=0V
Device
0
20
50
100
200
1438 4.00E-04 4.30E-04 4.20E-04 4.40E-04 4.30E-04
1439 4.60E-04 4.80E-04 4.80E-04 4.80E-04 4.70E-04
1440 8.70E-04 8.80E-04 8.80E-04 8.80E-04 8.60E-04
1441 5.60E-04 5.70E-04 5.80E-04 5.70E-04 6.00E-04
1442 5.50E-04 5.70E-04 5.80E-04 5.70E-04 5.70E-04
1443 5.50E-04 5.40E-04 5.20E-04 5.10E-04 4.90E-04
1444 5.00E-04 4.80E-04 4.70E-04 4.70E-04 4.40E-04
1445 5.40E-04 5.20E-04 5.00E-04 4.90E-04 4.70E-04
1446 7.50E-04 7.60E-04 7.50E-04 7.30E-04 7.10E-04
1447 6.10E-04 6.10E-04 6.10E-04 5.70E-04 5.90E-04
1448 4.40E-04 4.50E-04 4.50E-04 4.40E-04 4.30E-04
1449 6.10E-04 6.40E-04 6.40E-04 6.40E-04 6.50E-04
Biased Statistics
Average Biased
5.68E-04 5.86E-04 5.88E-04 5.88E-04 5.86E-04
Std Dev Biased
1.81E-04 1.75E-04 1.77E-04 1.73E-04 1.68E-04
Ps90%/90% (+KTL) Biased
1.07E-03 1.07E-03 1.07E-03 1.06E-03 1.05E-03
Ps90%/90% (-KTL) Biased
7.09E-05 1.06E-04 1.03E-04 1.14E-04 1.24E-04
Un-Biased Statistics
Average Un-Biased
5.90E-04 5.82E-04 5.70E-04 5.54E-04 5.40E-04
Std Dev Un-Biased
9.77E-05 1.10E-04 1.13E-04 1.05E-04 1.10E-04
Ps90%/90% (+KTL) Un-Biased
8.58E-04 8.84E-04 8.81E-04 8.43E-04 8.43E-04
Ps90%/90% (-KTL) Un-Biased
3.22E-04 2.80E-04 2.59E-04 2.65E-04 2.37E-04
Specification MIN
-4.00E-03 -4.00E-03 -4.00E-03 -4.00E-03 -8.00E-03
Status
PASS
PASS
PASS
PASS
PASS
Specification MAX
4.00E-03 4.00E-03 4.00E-03 4.00E-03 8.00E-03
Status
PASS
PASS
PASS
PASS
PASS
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Input Offset Voltage 2 (V) @ VS=±15V, VCM=0V
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
-2.00E-03
-4.00E-03
-6.00E-03
-8.00E-03
-1.00E-02
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.4. Plot of Input Offset Voltage 2 (V) @ VS=±15V, VCM=0V versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
13
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.4. Raw data for Input Offset Voltage 2 (V) @ VS=±15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 2 (V) @ VS=±15V, VCM=0V
Device
0
20
50
100
200
1438 4.60E-04 5.00E-04 5.00E-04 5.10E-04 5.10E-04
1439 2.70E-04 3.30E-04 3.20E-04 3.30E-04 3.30E-04
1440 4.60E-04 5.00E-04 5.20E-04 5.10E-04 5.20E-04
1441 5.20E-04 5.50E-04 5.60E-04 5.60E-04 5.50E-04
1442 5.90E-04 6.30E-04 6.30E-04 6.20E-04 6.40E-04
1443 5.80E-04 6.00E-04 6.00E-04 6.00E-04 5.70E-04
1444 4.80E-04 4.90E-04 4.80E-04 4.70E-04 4.40E-04
1445 6.30E-04 6.60E-04 6.40E-04 6.30E-04 6.10E-04
1446 4.20E-04 4.50E-04 4.40E-04 4.30E-04 4.10E-04
1447 4.80E-04 4.90E-04 4.80E-04 4.60E-04 4.30E-04
1448 6.30E-04 6.50E-04 6.40E-04 6.50E-04 6.40E-04
1449 5.80E-04 6.00E-04 5.80E-04 6.10E-04 6.00E-04
Biased Statistics
Average Biased
4.60E-04 5.02E-04 5.06E-04 5.06E-04 5.10E-04
Std Dev Biased
1.19E-04 1.10E-04 1.15E-04 1.08E-04 1.13E-04
Ps90%/90% (+KTL) Biased
7.86E-04 8.03E-04 8.22E-04 8.03E-04 8.20E-04
Ps90%/90% (-KTL) Biased
1.34E-04 2.01E-04 1.90E-04 2.09E-04 2.00E-04
Un-Biased Statistics
Average Un-Biased
5.18E-04 5.38E-04 5.28E-04 5.18E-04 4.92E-04
Std Dev Un-Biased
8.50E-05 8.81E-05 8.67E-05 9.04E-05 9.12E-05
Ps90%/90% (+KTL) Un-Biased
7.51E-04 7.80E-04 7.66E-04 7.66E-04 7.42E-04
Ps90%/90% (-KTL) Un-Biased
2.85E-04 2.96E-04 2.90E-04 2.70E-04 2.42E-04
Specification MIN
-4.00E-03 -4.00E-03 -4.00E-03 -4.00E-03 -8.00E-03
Status
PASS
PASS
PASS
PASS
PASS
Specification MAX
4.00E-03 4.00E-03 4.00E-03 4.00E-03 8.00E-03
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
14
Input Offset Current 1 (A) @ VS=±15V, VCM=0V
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.5. Plot of Input Offset Current 1 (A) @ VS=±15V, VCM=0V versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
15
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.5. Raw data for Input Offset Current 1 (A) @ VS=±15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current 1 (A) @ VS=±15V, VCM=0V
Device
1438
1439
1440
1441
1442
1443
1444
1445
1446
1447
1448
1449
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-9.55E-09
-8.25E-09
-1.04E-08
-1.03E-08
-1.23E-08
-5.62E-09
-1.22E-08
-4.56E-09
-1.09E-08
-1.09E-08
-2.77E-09
-1.09E-08
Total
20
-1.73E-08
-1.77E-08
-2.12E-08
-1.86E-08
-2.33E-08
-7.60E-09
-1.30E-08
1.82E-09
-9.04E-09
-8.21E-09
-9.30E-10
-6.31E-09
Dose (krad(Si))
50
100
-2.37E-08 -3.21E-08
-2.70E-08 -3.25E-08
-3.44E-08 -4.73E-08
-2.87E-08 -3.80E-08
-2.23E-08 -3.82E-08
-2.89E-09 -3.65E-09
-2.98E-09 -4.61E-09
3.67E-09 9.66E-09
-5.40E-09 -3.95E-09
8.00E-11 2.81E-09
-2.00E-11 1.81E-09
-6.31E-09 -1.00E-08
200
-6.24E-08
-5.48E-08
-8.26E-08
-6.38E-08
-5.82E-08
6.93E-09
1.00E-09
1.81E-08
-4.79E-09
1.43E-08
-2.55E-09
-1.10E-08
-1.02E-08 -1.96E-08 -2.72E-08 -3.76E-08 -6.44E-08
1.48E-09 2.57E-09 4.78E-09 6.13E-09 1.08E-08
-6.11E-09 -1.26E-08 -1.41E-08 -2.08E-08 -3.48E-08
-1.42E-08 -2.67E-08 -4.03E-08 -5.44E-08 -9.39E-08
-8.86E-09
3.50E-09
7.39E-10
-1.85E-08
-7.50E-08
PASS
7.50E-08
PASS
-7.21E-09
5.48E-09
7.80E-09
-2.22E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.50E-09
3.48E-09
8.05E-09
-1.11E-08
-1.50E-07
PASS
1.50E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
16
5.20E-11
6.15E-09
1.69E-08
-1.68E-08
-3.00E-07
PASS
3.00E-07
PASS
7.12E-09
9.39E-09
3.29E-08
-1.86E-08
-5.00E-07
PASS
5.00E-07
PASS
Input Offset Current 2 (A) @ VS=±15V, VCM=0V
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.6. Plot of Input Offset Current 2 (A) @ VS=±15V, VCM=0V versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
17
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.6. Raw data for Input Offset Current 2 (A) @ VS=±15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current 2 (A) @ VS=±15V, VCM=0V
Device
1438
1439
1440
1441
1442
1443
1444
1445
1446
1447
1448
1449
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.11E-08
-5.70E-09
-1.02E-08
-9.50E-09
-1.10E-08
-1.22E-08
-1.30E-08
-1.00E-08
-1.17E-08
-8.22E-09
-9.19E-09
-6.76E-09
Total
20
-2.14E-08
-1.60E-08
-2.41E-08
-2.59E-08
-2.39E-08
-1.38E-08
-1.41E-08
-9.35E-09
-1.11E-08
-1.14E-08
-1.09E-08
-8.28E-09
Dose (krad(Si))
50
100
-3.91E-08 -5.81E-08
-2.91E-08 -4.67E-08
-3.25E-08 -6.09E-08
-3.72E-08 -5.56E-08
-3.70E-08 -6.01E-08
-1.83E-08 -2.03E-08
-1.68E-08 -2.15E-08
-1.75E-08 -2.09E-08
-2.10E-08 -2.28E-08
-1.77E-08 -2.40E-08
-1.28E-08 -1.02E-08
-1.22E-08 -8.21E-09
200
-9.73E-08
-8.16E-08
-9.51E-08
-9.36E-08
-9.13E-08
-2.32E-08
-2.74E-08
-2.96E-08
-3.19E-08
-3.28E-08
-1.12E-08
-1.28E-08
-9.50E-09 -2.23E-08 -3.50E-08 -5.63E-08 -9.18E-08
2.22E-09 3.85E-09 4.10E-09 5.73E-09 6.10E-09
-3.41E-09 -1.17E-08 -2.38E-08 -4.06E-08 -7.51E-08
-1.56E-08 -3.28E-08 -4.62E-08 -7.20E-08 -1.09E-07
-1.10E-08
1.92E-09
-5.77E-09
-1.63E-08
-7.50E-08
PASS
7.50E-08
PASS
-1.19E-08
1.97E-09
-6.54E-09
-1.73E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.82E-08
1.61E-09
-1.38E-08
-2.27E-08
-1.50E-07
PASS
1.50E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
18
-2.19E-08
1.51E-09
-1.78E-08
-2.60E-08
-3.00E-07
PASS
3.00E-07
PASS
-2.90E-08
3.86E-09
-1.84E-08
-3.95E-08
-5.00E-07
PASS
5.00E-07
PASS
Positive Bias Current 1 (A) @ VS=±15V, VCM=0V
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.50E-06
2.00E-06
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
-2.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.7. Plot of Positive Bias Current 1 (A) @ VS=±15V, VCM=0V versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
19
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.7. Raw data for Positive Bias Current 1 (A) @ VS=±15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Bias Current 1 (A) @ VS=±15V, VCM=0V
Device
0
20
50
100
200
1438 3.32E-07 4.05E-07 4.56E-07 5.69E-07 7.01E-07
1439 3.28E-07 4.10E-07 4.50E-07 5.65E-07 6.79E-07
1440 3.38E-07 4.10E-07 4.88E-07 5.82E-07 7.11E-07
1441 3.36E-07 4.11E-07 4.41E-07 5.67E-07 6.84E-07
1442 3.48E-07 4.20E-07 4.41E-07 5.86E-07 7.09E-07
1443 3.41E-07 4.08E-07 4.46E-07 5.41E-07 6.78E-07
1444 3.61E-07 4.21E-07 4.52E-07 5.69E-07 7.09E-07
1445 3.34E-07 3.91E-07 4.48E-07 5.27E-07 6.59E-07
1446 3.21E-07 3.87E-07 4.24E-07 5.19E-07 6.51E-07
1447 3.56E-07 4.21E-07 4.38E-07 5.53E-07 6.92E-07
1448 3.43E-07 3.44E-07 3.51E-07 3.49E-07 3.46E-07
1449 3.50E-07 3.42E-07 3.48E-07 3.48E-07 3.43E-07
Biased Statistics
Average Biased
3.36E-07 4.11E-07 4.55E-07 5.74E-07 6.97E-07
Std Dev Biased
7.56E-09 5.37E-09 1.96E-08 9.50E-09 1.45E-08
Ps90%/90% (+KTL) Biased
3.57E-07 4.26E-07 5.09E-07 6.00E-07 7.36E-07
Ps90%/90% (-KTL) Biased
3.16E-07 3.96E-07 4.01E-07 5.48E-07 6.57E-07
Un-Biased Statistics
Average Un-Biased
3.42E-07 4.06E-07 4.41E-07 5.42E-07 6.78E-07
Std Dev Un-Biased
1.64E-08 1.62E-08 1.12E-08 1.99E-08 2.38E-08
Ps90%/90% (+KTL) Un-Biased
3.87E-07 4.50E-07 4.72E-07 5.96E-07 7.43E-07
Ps90%/90% (-KTL) Un-Biased
2.98E-07 3.61E-07 4.11E-07 4.87E-07 6.13E-07
Specification MIN
-5.00E-07 -7.50E-07 -1.00E-06 -1.50E-06 -2.00E-06
Status
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-07 7.50E-07 1.00E-06 1.50E-06 2.00E-06
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
20
Positive Bias Current 2 (A) @ VS=±15V, VCM=0V
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.50E-06
2.00E-06
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
-2.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.8. Plot of Positive Bias Current 2 (A) @ VS=±15V, VCM=0V versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
21
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.8. Raw data for Positive Bias Current 2 (A) @ VS=±15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Bias Current 2 (A) @ VS=±15V, VCM=0V
Device
0
20
50
100
200
1438 3.29E-07 4.16E-07 4.48E-07 6.09E-07 7.47E-07
1439 3.24E-07 4.13E-07 4.66E-07 6.02E-07 7.36E-07
1440 3.39E-07 4.29E-07 5.14E-07 6.22E-07 7.71E-07
1441 3.38E-07 4.24E-07 5.10E-07 6.11E-07 7.57E-07
1442 3.50E-07 4.36E-07 5.20E-07 6.23E-07 7.57E-07
1443 3.44E-07 4.17E-07 4.98E-07 5.80E-07 7.43E-07
1444 3.62E-07 4.32E-07 5.11E-07 6.02E-07 7.63E-07
1445 3.41E-07 4.09E-07 4.97E-07 5.76E-07 7.33E-07
1446 3.27E-07 3.97E-07 4.54E-07 5.57E-07 7.07E-07
1447 3.62E-07 4.31E-07 5.11E-07 5.96E-07 7.57E-07
1448 3.56E-07 3.55E-07 3.56E-07 3.52E-07 3.55E-07
1449 3.43E-07 3.46E-07 3.47E-07 3.46E-07 3.47E-07
Biased Statistics
Average Biased
3.36E-07 4.24E-07 4.92E-07 6.13E-07 7.54E-07
Std Dev Biased
9.60E-09 9.35E-09 3.24E-08 8.61E-09 1.30E-08
Ps90%/90% (+KTL) Biased
3.62E-07 4.49E-07 5.81E-07 6.37E-07 7.89E-07
Ps90%/90% (-KTL) Biased
3.10E-07 3.98E-07 4.03E-07 5.90E-07 7.18E-07
Un-Biased Statistics
Average Un-Biased
3.47E-07 4.17E-07 4.94E-07 5.82E-07 7.41E-07
Std Dev Un-Biased
1.48E-08 1.52E-08 2.34E-08 1.80E-08 2.24E-08
Ps90%/90% (+KTL) Un-Biased
3.88E-07 4.59E-07 5.58E-07 6.32E-07 8.02E-07
Ps90%/90% (-KTL) Un-Biased
3.07E-07 3.76E-07 4.30E-07 5.33E-07 6.79E-07
Specification MIN
-5.00E-07 -7.50E-07 -1.00E-06 -1.50E-06 -2.00E-06
Status
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-07 7.50E-07 1.00E-06 1.50E-06 2.00E-06
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
22
Negative Bias Current 1 (A) @ VS=±15V, VCM=0V
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.50E-06
2.00E-06
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
-2.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.9. Plot of Negative Bias Current 1 (A) @ VS=±15V, VCM=0V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted
line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
23
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.9. Raw data for Negative Bias Current 1 (A) @ VS=±15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Bias Current 1 (A) @ VS=±15V, VCM=0V
Device
0
20
50
100
200
1438 3.16E-07 3.87E-07 4.55E-07 5.36E-07 6.35E-07
1439 3.17E-07 3.87E-07 4.56E-07 5.31E-07 6.20E-07
1440 3.28E-07 3.92E-07 4.58E-07 5.31E-07 5.84E-07
1441 3.25E-07 3.89E-07 4.56E-07 5.26E-07 6.28E-07
1442 3.34E-07 3.99E-07 4.73E-07 5.48E-07 6.47E-07
1443 3.34E-07 3.97E-07 4.70E-07 5.40E-07 6.84E-07
1444 3.48E-07 4.11E-07 4.83E-07 5.44E-07 7.10E-07
1445 3.33E-07 3.96E-07 4.70E-07 5.40E-07 6.75E-07
1446 3.12E-07 3.76E-07 4.47E-07 5.13E-07 6.41E-07
1447 3.48E-07 4.12E-07 4.85E-07 5.54E-07 7.11E-07
1448 3.48E-07 3.48E-07 3.47E-07 3.47E-07 3.44E-07
1449 3.36E-07 3.39E-07 3.36E-07 3.37E-07 3.38E-07
Biased Statistics
Average Biased
3.24E-07 3.91E-07 4.59E-07 5.34E-07 6.23E-07
Std Dev Biased
7.85E-09 5.31E-09 7.52E-09 8.19E-09 2.39E-08
Ps90%/90% (+KTL) Biased
3.46E-07 4.05E-07 4.80E-07 5.57E-07 6.88E-07
Ps90%/90% (-KTL) Biased
3.02E-07 3.76E-07 4.39E-07 5.12E-07 5.57E-07
Un-Biased Statistics
Average Un-Biased
3.35E-07 3.98E-07 4.71E-07 5.38E-07 6.84E-07
Std Dev Un-Biased
1.48E-08 1.49E-08 1.52E-08 1.54E-08 2.90E-08
Ps90%/90% (+KTL) Un-Biased
3.76E-07 4.39E-07 5.13E-07 5.81E-07 7.64E-07
Ps90%/90% (-KTL) Un-Biased
2.94E-07 3.57E-07 4.29E-07 4.96E-07 6.05E-07
Specification MIN
-5.00E-07 -7.50E-07 -1.00E-06 -1.50E-06 -2.00E-06
Status
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-07 7.50E-07 1.00E-06 1.50E-06 2.00E-06
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
24
Negative Bias Current 2 (A) @ VS=±15V, VCM=0V
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.50E-06
2.00E-06
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
-2.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.10. Plot of Negative Bias Current 2 (A) @ VS=±15V, VCM=0V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted
line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
25
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.10. Raw data for Negative Bias Current 2 (A) @ VS=±15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Bias Current 2 (A) @ VS=±15V, VCM=0V
Device
0
20
50
100
200
1438 3.21E-07 3.93E-07 4.65E-07 5.49E-07 6.51E-07
1439 3.22E-07 4.00E-07 4.75E-07 5.31E-07 6.61E-07
1440 3.29E-07 4.03E-07 4.82E-07 5.49E-07 6.78E-07
1441 3.28E-07 3.99E-07 4.73E-07 5.53E-07 6.62E-07
1442 3.38E-07 4.08E-07 4.83E-07 5.60E-07 6.64E-07
1443 3.32E-07 4.04E-07 4.84E-07 5.57E-07 7.22E-07
1444 3.53E-07 4.19E-07 4.94E-07 5.44E-07 7.34E-07
1445 3.33E-07 4.02E-07 4.81E-07 5.55E-07 7.05E-07
1446 3.13E-07 3.84E-07 4.62E-07 5.36E-07 6.77E-07
1447 3.53E-07 4.21E-07 4.94E-07 5.43E-07 7.28E-07
1448 3.45E-07 3.45E-07 3.42E-07 3.43E-07 3.43E-07
1449 3.38E-07 3.37E-07 3.35E-07 3.37E-07 3.35E-07
Biased Statistics
Average Biased
3.27E-07 4.01E-07 4.75E-07 5.48E-07 6.63E-07
Std Dev Biased
6.94E-09 5.71E-09 7.22E-09 1.08E-08 9.71E-09
Ps90%/90% (+KTL) Biased
3.46E-07 4.16E-07 4.95E-07 5.78E-07 6.90E-07
Ps90%/90% (-KTL) Biased
3.08E-07 3.85E-07 4.56E-07 5.19E-07 6.37E-07
Un-Biased Statistics
Average Un-Biased
3.37E-07 4.06E-07 4.83E-07 5.47E-07 7.13E-07
Std Dev Un-Biased
1.70E-08 1.50E-08 1.33E-08 8.95E-09 2.29E-08
Ps90%/90% (+KTL) Un-Biased
3.83E-07 4.47E-07 5.20E-07 5.72E-07 7.76E-07
Ps90%/90% (-KTL) Un-Biased
2.90E-07 3.64E-07 4.47E-07 5.23E-07 6.50E-07
Specification MIN
-5.00E-07 -7.50E-07 -1.00E-06 -1.50E-06 -2.00E-06
Status
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-07 7.50E-07 1.00E-06 1.50E-06 2.00E-06
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
26
TID Report
11-425 111109 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Large signal Voltage Gain 1 (V/mV) @ VS=±15V,
VCM=0V
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.11. Plot of Large signal Voltage Gain 1 (V/mV) @ VS=±15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
27
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.11. Raw data for Large signal Voltage Gain 1 (V/mV) @ VS=±15V, VCM=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large signal Voltage Gain 1 (V/mV) @ VS=±15V, VCM=0V
Device
1438
1439
1440
1441
1442
1443
1444
1445
1446
1447
1448
1449
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.77E+01
6.42E+01
4.14E+01
4.84E+01
4.16E+01
3.85E+01
4.00E+01
4.95E+01
3.66E+01
3.34E+01
4.39E+01
4.87E+01
Total
20
3.74E+01
5.73E+01
4.45E+01
5.35E+01
4.14E+01
4.55E+01
5.16E+01
5.01E+01
3.05E+01
4.45E+01
4.71E+01
4.11E+01
Dose (krad(Si))
50
100
3.99E+01 4.76E+01
5.73E+01 5.14E+01
4.14E+01 3.56E+01
6.65E+01 7.83E+01
4.42E+01 4.84E+01
3.34E+01 4.17E+01
5.68E+01 4.05E+01
6.08E+01 5.70E+01
4.51E+01 4.91E+01
4.11E+01 4.11E+01
5.19E+01 5.24E+01
4.91E+01 3.37E+01
200
3.73E+01
5.12E+01
4.84E+01
5.39E+01
4.42E+01
3.76E+01
4.73E+01
7.13E+01
4.11E+01
5.47E+01
4.03E+01
3.36E+01
4.87E+01
9.29E+00
7.41E+01
2.32E+01
4.68E+01
8.34E+00
6.97E+01
2.40E+01
4.99E+01
1.16E+01
8.16E+01
1.81E+01
5.23E+01
1.58E+01
9.55E+01
9.06E+00
4.70E+01
6.50E+00
6.48E+01
2.92E+01
3.96E+01
6.06E+00
5.62E+01
2.30E+01
1.00E+01
PASS
4.44E+01
8.35E+00
6.73E+01
2.15E+01
1.00E+01
PASS
4.74E+01
1.13E+01
7.84E+01
1.65E+01
1.00E+01
PASS
4.59E+01
7.13E+00
6.54E+01
2.63E+01
1.00E+01
PASS
5.04E+01
1.34E+01
8.71E+01
1.37E+01
5.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
28
TID Report
11-425 111109 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Large signal Voltage Gain 2 (V/mV) @ VS=±15V,
VCM=0V
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.12. Plot of Large signal Voltage Gain 2 (V/mV) @ VS=±15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
29
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.12. Raw data for Large signal Voltage Gain 2 (V/mV) @ VS=±15V, VCM=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large signal Voltage Gain 2 (V/mV) @ VS=±15V, VCM=0V
Device
1438
1439
1440
1441
1442
1443
1444
1445
1446
1447
1448
1449
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
8.36E+01
7.46E+01
7.12E+01
6.78E+01
6.58E+01
8.89E+01
7.82E+01
9.40E+01
5.68E+01
7.64E+01
9.27E+01
7.56E+01
Total
20
7.81E+01
8.67E+01
6.80E+01
7.74E+01
6.58E+01
4.87E+01
6.03E+01
9.54E+01
8.29E+01
7.73E+01
7.83E+01
7.48E+01
Dose (krad(Si))
50
100
7.87E+01 6.91E+01
7.57E+01 8.74E+01
6.80E+01 9.27E+01
7.83E+01 7.74E+01
7.83E+01 7.74E+01
6.78E+01 7.31E+01
8.36E+01 5.77E+01
9.14E+01 6.58E+01
7.38E+01 6.88E+01
8.16E+01 9.91E+01
9.27E+01 6.09E+01
7.31E+01 5.98E+01
200
6.88E+01
1.04E+02
6.84E+01
7.56E+01
5.93E+01
7.65E+01
1.02E+02
8.66E+01
9.20E+01
8.49E+01
6.93E+01
9.01E+01
7.26E+01
7.00E+00
9.18E+01
5.34E+01
7.52E+01
8.45E+00
9.84E+01
5.20E+01
7.58E+01
4.52E+00
8.82E+01
6.34E+01
8.08E+01
9.29E+00
1.06E+02
5.53E+01
7.53E+01
1.72E+01
1.23E+02
2.80E+01
7.89E+01
1.43E+01
1.18E+02
3.95E+01
1.00E+01
PASS
7.29E+01
1.85E+01
1.24E+02
2.22E+01
1.00E+01
PASS
7.96E+01
9.11E+00
1.05E+02
5.47E+01
1.00E+01
PASS
7.29E+01
1.57E+01
1.16E+02
2.99E+01
1.00E+01
PASS
8.84E+01
9.35E+00
1.14E+02
6.27E+01
5.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
30
Common Mode Rejection Ratio 1 (dB) @ VS=±15V
TID Report
11-425 111109 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.13. Plot of Common Mode Rejection Ratio 1 (dB) @ VS=±15V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted
line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
31
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.13. Raw data for Common Mode Rejection Ratio 1 (dB) @ VS=±15V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 1 (dB) @ VS=±15V
Device
1438
1439
1440
1441
1442
1443
1444
1445
1446
1447
1448
1449
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.10E+02
1.37E+02
1.15E+02
1.21E+02
1.10E+02
1.28E+02
1.13E+02
1.19E+02
1.13E+02
1.18E+02
1.25E+02
1.22E+02
Total
20
1.14E+02
1.27E+02
1.18E+02
1.18E+02
1.18E+02
1.15E+02
1.21E+02
1.13E+02
1.07E+02
1.20E+02
1.15E+02
1.30E+02
Dose (krad(Si))
50
100
1.14E+02 1.14E+02
1.38E+02 1.24E+02
1.11E+02 1.18E+02
1.22E+02 1.39E+02
1.13E+02 1.11E+02
1.18E+02 1.26E+02
1.12E+02 1.16E+02
1.13E+02 1.22E+02
1.07E+02 1.09E+02
1.17E+02 1.15E+02
1.25E+02 1.20E+02
1.22E+02 1.16E+02
200
1.12E+02
1.42E+02
1.18E+02
1.42E+02
1.13E+02
1.17E+02
1.14E+02
1.22E+02
1.13E+02
1.13E+02
1.17E+02
1.18E+02
1.18E+02
1.14E+01
1.50E+02
8.72E+01
1.19E+02
5.05E+00
1.33E+02
1.05E+02
1.20E+02
1.13E+01
1.51E+02
8.85E+01
1.21E+02
1.10E+01
1.51E+02
9.08E+01
1.25E+02
1.53E+01
1.67E+02
8.34E+01
1.18E+02
6.33E+00
1.36E+02
1.01E+02
9.00E+01
PASS
1.15E+02
5.78E+00
1.31E+02
9.95E+01
9.00E+01
PASS
1.13E+02
4.30E+00
1.25E+02
1.02E+02
9.00E+01
PASS
1.18E+02
6.38E+00
1.35E+02
1.00E+02
9.00E+01
PASS
1.16E+02
3.90E+00
1.27E+02
1.05E+02
9.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
32
Common Mode Rejection Ratio 2 (dB) @ VS=±15V
TID Report
11-425 111109 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.14. Plot of Common Mode Rejection Ratio 2 (dB) @ VS=±15V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted
line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
33
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.14. Raw data for Common Mode Rejection Ratio 2 (dB) @ VS=±15V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 2 (dB) @ VS=±15V
Device
1438
1439
1440
1441
1442
1443
1444
1445
1446
1447
1448
1449
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.42E+02
1.20E+02
1.09E+02
1.30E+02
1.39E+02
1.42E+02
1.34E+02
1.25E+02
1.30E+02
1.20E+02
1.28E+02
1.20E+02
Total
20
1.20E+02
1.14E+02
1.09E+02
1.29E+02
1.19E+02
1.13E+02
1.42E+02
1.22E+02
1.20E+02
1.19E+02
1.29E+02
1.14E+02
Dose (krad(Si))
50
100
1.25E+02 1.28E+02
1.23E+02 1.20E+02
1.09E+02 1.09E+02
1.21E+02 1.10E+02
1.36E+02 1.36E+02
1.15E+02 1.39E+02
1.34E+02 1.25E+02
1.16E+02 1.28E+02
1.25E+02 1.21E+02
1.19E+02 1.42E+02
1.27E+02 1.25E+02
1.10E+02 1.12E+02
200
1.20E+02
1.20E+02
1.09E+02
1.14E+02
1.26E+02
1.26E+02
1.15E+02
1.20E+02
1.20E+02
1.26E+02
1.39E+02
1.14E+02
1.28E+02
1.35E+01
1.65E+02
9.08E+01
1.18E+02
7.76E+00
1.39E+02
9.69E+01
1.23E+02
9.93E+00
1.50E+02
9.56E+01
1.21E+02
1.17E+01
1.53E+02
8.86E+01
1.18E+02
6.54E+00
1.36E+02
9.98E+01
1.30E+02
8.61E+00
1.54E+02
1.07E+02
9.00E+01
PASS
1.23E+02
1.12E+01
1.54E+02
9.25E+01
9.00E+01
PASS
1.22E+02
7.99E+00
1.44E+02
9.99E+01
9.00E+01
PASS
1.31E+02
8.95E+00
1.56E+02
1.07E+02
9.00E+01
PASS
1.22E+02
4.40E+00
1.34E+02
1.09E+02
9.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
34
Saturation Voltage 1 (V) @ +VS = +4.5V, -VS=0V, VIN=6mV, ISINK = 3.2mA
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.15. Plot of Saturation Voltage 1 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA versus
total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
35
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.15. Raw data for Saturation Voltage 1 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA
versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Saturation Voltage 1 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA
Device
0
20
50
100
200
1438 3.07E-01 3.07E-01 3.09E-01 3.13E-01 3.17E-01
1439 3.05E-01 3.06E-01 3.08E-01 3.11E-01 3.16E-01
1440 3.00E-01 3.01E-01 3.03E-01 3.07E-01 3.10E-01
1441 3.10E-01 3.10E-01 3.10E-01 3.14E-01 3.19E-01
1442 3.11E-01 3.10E-01 3.11E-01 3.14E-01 3.20E-01
1443 3.05E-01 3.04E-01 3.06E-01 3.09E-01 3.13E-01
1444 3.09E-01 3.08E-01 3.09E-01 3.11E-01 3.16E-01
1445 3.05E-01 3.03E-01 3.06E-01 3.08E-01 3.13E-01
1446 3.03E-01 3.02E-01 3.04E-01 3.06E-01 3.11E-01
1447 3.10E-01 3.09E-01 3.11E-01 3.12E-01 3.18E-01
1448 3.00E-01 3.01E-01 3.01E-01 3.02E-01 3.01E-01
1449 3.07E-01 3.05E-01 3.06E-01 3.06E-01 3.06E-01
Biased Statistics
Average Biased
3.07E-01 3.07E-01 3.08E-01 3.12E-01 3.16E-01
Std Dev Biased
4.39E-03 3.70E-03 3.11E-03 2.95E-03 3.91E-03
Ps90%/90% (+KTL) Biased
3.19E-01 3.17E-01 3.17E-01 3.20E-01 3.27E-01
Ps90%/90% (-KTL) Biased
2.95E-01 2.97E-01 3.00E-01 3.04E-01 3.06E-01
Un-Biased Statistics
Average Un-Biased
3.06E-01 3.05E-01 3.07E-01 3.09E-01 3.14E-01
Std Dev Un-Biased
2.97E-03 3.11E-03 2.77E-03 2.39E-03 2.77E-03
Ps90%/90% (+KTL) Un-Biased
3.15E-01 3.14E-01 3.15E-01 3.16E-01 3.22E-01
Ps90%/90% (-KTL) Un-Biased
2.98E-01 2.97E-01 3.00E-01 3.03E-01 3.07E-01
Specification MAX
4.00E-01 4.00E-01 4.00E-01 4.00E-01 4.00E-01
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
36
Saturation Voltage 2 (V) @ +VS = +4.5V, -VS=0V, VIN=6mV, ISINK = 3.2mA
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.16. Plot of Saturation Voltage 2 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA versus
total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
37
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.16. Raw data for Saturation Voltage 2 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA
versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Saturation Voltage 2 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA
Device
0
20
50
100
200
1438 3.07E-01 3.07E-01 3.09E-01 3.12E-01 3.16E-01
1439 3.04E-01 3.04E-01 3.07E-01 3.09E-01 3.14E-01
1440 3.02E-01 3.00E-01 3.02E-01 3.05E-01 3.11E-01
1441 3.05E-01 3.05E-01 3.06E-01 3.11E-01 3.15E-01
1442 3.09E-01 3.08E-01 3.11E-01 3.13E-01 3.18E-01
1443 3.02E-01 3.00E-01 3.03E-01 3.05E-01 3.10E-01
1444 3.08E-01 3.05E-01 3.07E-01 3.10E-01 3.14E-01
1445 3.01E-01 3.00E-01 3.01E-01 3.03E-01 3.09E-01
1446 3.03E-01 3.01E-01 3.02E-01 3.04E-01 3.09E-01
1447 3.09E-01 3.06E-01 3.08E-01 3.09E-01 3.16E-01
1448 2.97E-01 2.96E-01 2.96E-01 2.96E-01 2.95E-01
1449 3.03E-01 3.02E-01 3.03E-01 3.02E-01 3.02E-01
Biased Statistics
Average Biased
3.05E-01 3.05E-01 3.07E-01 3.10E-01 3.15E-01
Std Dev Biased
2.70E-03 3.11E-03 3.39E-03 3.16E-03 2.59E-03
Ps90%/90% (+KTL) Biased
3.13E-01 3.13E-01 3.16E-01 3.19E-01 3.22E-01
Ps90%/90% (-KTL) Biased
2.98E-01 2.96E-01 2.98E-01 3.01E-01 3.08E-01
Un-Biased Statistics
Average Un-Biased
3.05E-01 3.02E-01 3.04E-01 3.06E-01 3.12E-01
Std Dev Un-Biased
3.65E-03 2.88E-03 3.11E-03 3.11E-03 3.21E-03
Ps90%/90% (+KTL) Un-Biased
3.15E-01 3.10E-01 3.13E-01 3.15E-01 3.20E-01
Ps90%/90% (-KTL) Un-Biased
2.95E-01 2.95E-01 2.96E-01 2.98E-01 3.03E-01
Specification MAX
4.00E-01 4.00E-01 4.00E-01 4.00E-01 4.00E-01
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
38
Saturation Voltage 1 (V) @ VS = ±15V, VIN=-5mV, IOUT =
25mA
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.17. Plot of Saturation Voltage 1 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
39
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.17. Raw data for Saturation Voltage 1 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Saturation Voltage 1 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA
Device
0
20
50
100
200
1438 6.40E-01 6.37E-01 6.39E-01 6.43E-01 6.48E-01
1439 6.32E-01 6.28E-01 6.32E-01 6.37E-01 6.44E-01
1440 6.17E-01 6.15E-01 6.19E-01 6.22E-01 6.27E-01
1441 6.32E-01 6.30E-01 6.33E-01 6.39E-01 6.44E-01
1442 6.40E-01 6.37E-01 6.39E-01 6.44E-01 6.50E-01
1443 6.28E-01 6.28E-01 6.30E-01 6.33E-01 6.42E-01
1444 6.36E-01 6.34E-01 6.41E-01 6.38E-01 6.45E-01
1445 6.35E-01 6.30E-01 6.34E-01 6.35E-01 6.41E-01
1446 6.20E-01 6.18E-01 6.20E-01 6.23E-01 6.29E-01
1447 6.34E-01 6.33E-01 6.34E-01 6.38E-01 6.44E-01
1448 6.19E-01 6.20E-01 6.20E-01 6.20E-01 6.21E-01
1449 6.26E-01 6.26E-01 6.26E-01 6.25E-01 6.26E-01
Biased Statistics
Average Biased
6.32E-01 6.29E-01 6.32E-01 6.37E-01 6.43E-01
Std Dev Biased
9.39E-03 9.02E-03 8.17E-03 8.86E-03 9.10E-03
Ps90%/90% (+KTL) Biased
6.58E-01 6.54E-01 6.55E-01 6.61E-01 6.68E-01
Ps90%/90% (-KTL) Biased
6.06E-01 6.05E-01 6.10E-01 6.13E-01 6.18E-01
Un-Biased Statistics
Average Un-Biased
6.31E-01 6.29E-01 6.32E-01 6.33E-01 6.40E-01
Std Dev Un-Biased
6.69E-03 6.39E-03 7.69E-03 6.19E-03 6.46E-03
Ps90%/90% (+KTL) Un-Biased
6.49E-01 6.46E-01 6.53E-01 6.50E-01 6.58E-01
Ps90%/90% (-KTL) Un-Biased
6.12E-01 6.11E-01 6.11E-01 6.16E-01 6.22E-01
Specification MAX
1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
40
Saturation Voltage 2 (V) @ VS = ±15V, VIN=-5mV, IOUT =
25mA
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.18. Plot of Saturation Voltage 2 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
41
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.18. Raw data for Saturation Voltage 2 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Saturation Voltage 2 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA
Device
0
20
50
100
200
1438 6.29E-01 6.25E-01 6.29E-01 6.31E-01 6.39E-01
1439 6.22E-01 6.17E-01 6.23E-01 6.26E-01 6.32E-01
1440 6.15E-01 6.12E-01 6.17E-01 6.20E-01 6.27E-01
1441 6.25E-01 6.22E-01 6.24E-01 6.29E-01 6.35E-01
1442 6.29E-01 6.27E-01 6.29E-01 6.35E-01 6.39E-01
1443 6.24E-01 6.20E-01 6.21E-01 6.26E-01 6.34E-01
1444 6.32E-01 6.29E-01 6.35E-01 6.34E-01 6.41E-01
1445 6.23E-01 6.19E-01 6.21E-01 6.23E-01 6.30E-01
1446 6.15E-01 6.11E-01 6.14E-01 6.17E-01 6.25E-01
1447 6.33E-01 6.31E-01 6.32E-01 6.34E-01 6.42E-01
1448 6.10E-01 6.10E-01 6.11E-01 6.11E-01 6.11E-01
1449 6.18E-01 6.19E-01 6.19E-01 6.18E-01 6.17E-01
Biased Statistics
Average Biased
6.24E-01 6.21E-01 6.24E-01 6.28E-01 6.34E-01
Std Dev Biased
5.83E-03 6.11E-03 4.98E-03 5.63E-03 5.08E-03
Ps90%/90% (+KTL) Biased
6.40E-01 6.37E-01 6.38E-01 6.44E-01 6.48E-01
Ps90%/90% (-KTL) Biased
6.08E-01 6.04E-01 6.11E-01 6.13E-01 6.20E-01
Un-Biased Statistics
Average Un-Biased
6.25E-01 6.22E-01 6.25E-01 6.27E-01 6.34E-01
Std Dev Un-Biased
7.37E-03 8.12E-03 8.68E-03 7.33E-03 7.23E-03
Ps90%/90% (+KTL) Un-Biased
6.46E-01 6.44E-01 6.48E-01 6.47E-01 6.54E-01
Ps90%/90% (-KTL) Un-Biased
6.05E-01 6.00E-01 6.01E-01 6.07E-01 6.15E-01
Specification MAX
1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
42
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Output Leakage Current 1 (A) @ VIN=5mV, VOUT to VS=35V
Specification MAX
2.50E-06
2.00E-06
1.50E-06
1.00E-06
5.00E-07
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.19. Plot of Output Leakage Current 1 (A) @ VIN=5mV, VOUT to -VS=35V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
43
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.19. Raw data for Output Leakage Current 1 (A) @ VIN=5mV, VOUT to -VS=35V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Leakage Current 1 (A) @ VIN=5mV, VOUT to -VS=35V
Device
1438
1439
1440
1441
1442
1443
1444
1445
1446
1447
1448
1449
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
3.00E-09
1.00E-09
3.00E-09
3.00E-09
4.00E-09
0.00E+00
0.00E+00
2.00E-09
4.00E-09
1.00E-09
0.00E+00
2.00E-09
Total
20
0.00E+00
0.00E+00
0.00E+00
0.00E+00
2.00E-09
0.00E+00
0.00E+00
1.00E-09
1.00E-09
2.00E-09
2.00E-09
4.00E-09
2.80E-09 4.00E-10 3.20E-09 2.20E-09 1.00E-09
1.10E-09 8.94E-10 2.95E-09 1.92E-09 1.00E-09
5.80E-09 2.85E-09 1.13E-08 7.47E-09 3.74E-09
-2.04E-10 -2.05E-09 -4.89E-09 -3.07E-09 -1.74E-09
1.40E-09 8.00E-10 1.00E-09 1.60E-09 1.60E-09
1.67E-09 8.37E-10 1.00E-09 2.51E-09 1.34E-09
5.99E-09 3.09E-09 3.74E-09 8.48E-09 5.28E-09
-3.19E-09 -1.49E-09 -1.74E-09 -5.28E-09 -2.08E-09
2.00E-06 2.00E-06 2.00E-06 2.00E-06 2.00E-06
PASS
PASS
PASS
PASS
PASS
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Dose (krad(Si))
50
100
200
8.00E-09 2.00E-09 0.00E+00
3.00E-09 5.00E-09 2.00E-09
2.00E-09 0.00E+00 0.00E+00
3.00E-09 3.00E-09 1.00E-09
0.00E+00 1.00E-09 2.00E-09
1.00E-09 1.00E-09 0.00E+00
0.00E+00 0.00E+00 1.00E-09
2.00E-09 0.00E+00 3.00E-09
2.00E-09 6.00E-09 3.00E-09
0.00E+00 1.00E-09 1.00E-09
4.00E-09 4.00E-09 4.00E-09
0.00E+00 2.00E-09 3.00E-09
TID Report
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Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Output Leakage Current 2 (A) @ VIN=5mV, VOUT to VS=35V
Specification MAX
2.50E-06
2.00E-06
1.50E-06
1.00E-06
5.00E-07
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.20. Plot of Output Leakage Current 2 (A) @ VIN=5mV, VOUT to -VS=35V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
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TID Report
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Colorado Springs, CO 80919
(719) 531-0800
Table 5.20. Raw data for Output Leakage Current 2 (A) @ VIN=5mV, VOUT to -VS=35V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Leakage Current 2 (A) @ VIN=5mV, VOUT to -VS=35V
Device
1438
1439
1440
1441
1442
1443
1444
1445
1446
1447
1448
1449
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.00E-09
3.00E-09
1.00E-09
1.00E-09
1.00E-09
0.00E+00
4.00E-09
2.00E-09
0.00E+00
0.00E+00
5.00E-09
0.00E+00
Total
20
4.00E-09
4.00E-09
1.00E-09
5.00E-09
0.00E+00
4.00E-09
3.00E-09
0.00E+00
0.00E+00
0.00E+00
2.00E-09
1.00E-09
1.40E-09 2.80E-09 2.00E-09 1.20E-09 2.40E-09
8.94E-10 2.17E-09 1.41E-09 8.37E-10 2.30E-09
3.85E-09 8.74E-09 5.88E-09 3.49E-09 8.71E-09
-1.05E-09 -3.14E-09 -1.88E-09 -1.09E-09 -3.91E-09
1.20E-09 1.40E-09 2.20E-09 2.20E-09 2.20E-09
1.79E-09 1.95E-09 1.48E-09 1.48E-09 1.48E-09
6.11E-09 6.75E-09 6.27E-09 6.27E-09 6.27E-09
-3.71E-09 -3.95E-09 -1.87E-09 -1.87E-09 -1.87E-09
2.00E-06 2.00E-06 2.00E-06 2.00E-06 2.00E-06
PASS
PASS
PASS
PASS
PASS
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Dose (krad(Si))
50
100
200
1.00E-09 1.00E-09 1.00E-09
0.00E+00 1.00E-09 0.00E+00
3.00E-09 2.00E-09 6.00E-09
3.00E-09 0.00E+00 3.00E-09
3.00E-09 2.00E-09 2.00E-09
2.00E-09 0.00E+00 4.00E-09
3.00E-09 2.00E-09 2.00E-09
4.00E-09 4.00E-09 2.00E-09
0.00E+00 2.00E-09 0.00E+00
2.00E-09 3.00E-09 3.00E-09
2.00E-09 5.00E-09 3.00E-09
1.00E-09 0.00E+00 4.00E-09
TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
6.0. Summary / Conclusions
The total ionizing dose testing described in this final report was performed using the facilities at
Aeroflex RAD's Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose
(TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are
held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised
by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in
this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by
the distance from the source.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the total ionizing dose test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could
be logged as a failure.
Based on this criterion the RH119W High Performance Dual Comparator (from the lot date code
identified on the first page of this test report) PASSED the total ionizing dose test to the maximum
tested dose level of 200krad(Si) with all parameters remaining within their datasheet specifications.
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TID Report
11-425 111109 R1.2
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Appendix A: Photograph of a Sample Unit-Under-Test to Show Part Traceability
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TID Report
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(719) 531-0800
Appendix B: Radiation Bias Connections and Absolute Maximum Ratings
TID Radiation Biased Conditions: Extracted from Linear Technology RH119 Datasheet.
Pin Function
1
OUT1
Connection / Bias
+15V Via 10kΩ
2
GND1
GND
3
+IN1
4
-IN1
5
V-
To Pin 8 and –15V via 10kΩ
To Pin 9 and +15V via 10kΩ
To Pin 8 via 100Ω
-15V
6
OUT2
+15V Via 10kΩ
7
GND2
8
+IN2
9
-IN2
GND
To Pin 3 and –15V via 10kΩ
To Pin 4 via 100Ω
To Pin 4 and +15V via 10kΩ
10
V+
+15V
Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted
from Linear Technology RH119 Datasheet.
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TID Radiation Unbiased Conditions:
Pin Function Connection / Bias
1
OUT1
GND
2
GND1
GND
3
+IN1
GND
4
-IN1
GND
5
V-
GND
6
OUT2
GND
7
GND2
GND
8
+IN2
GND
9
-IN2
GND
10
V+
GND
Absolute Maximum Ratings:
Parameter
Max Rating
Supply Voltage
36V
Output to Negative supply Voltage
36V
Ground to Negative Supply Voltage 25V
Ground to Positive Supply Voltage
18V
Differential Input Voltage
±5V
Differential Input Current
±5mA
Figure B.2. W package drawing (for reference only). This figure was extracted from Linear Technology RH119
Datasheet.
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TID Report
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Appendix C: Electrical Test Parameters and Conditions
The expected ranges of values as well as the measurement conditions are taken from Linear Technology
RH119 Datasheet. All electrical tests for this device are performed on one of Aeroflex RAD's LTS2020
Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The measured parameters and test conditions are shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020
for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table
C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between
tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90
KTL statistics were applied to the measured standard deviation to generate the final measurement range.
This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020
mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the
measurement resolution is limited by the internal DACs, which results in a measured standard deviation
of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify
these parameters using an “attributes” approach.
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TID Report
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Table C.1. Measured parameters and test conditions for the RH119W High Performance Dual Comparator.
Parameter
Symbol
Test Conditions
Positive Supply Current (A)
Icc
VS=±15V
Negative Supply Current (A)
Iss
VS=±15V
Input Offset Voltage (V)
Vos1, Vos2
VS=±15V, VCM=0V
Input Offset Current (A)
Ios1, Ios2
VS=±15V, VCM=0V
Positive Bias Current (A)
Ib+1, Ib+2
VS=±15V, VCM=0V
Negative Bias Current (A)
Ib-1, Ib-2
VS=±15V, VCM=0V
Large signal Voltage Gain (V/mV)
Avol1, Avol2
VS=±15V, VCM=0V
Common Mode Rejection Ratio (dB)
CMRR1, CMRR2 VS=±15V
Saturation Voltage (V)
Vola1, Vola2
+VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA
Saturation Voltage (V)
Volb1, Volb2
VS=±15V, VIN=-5mV, IOUT = 25mA
Output Leakage Current (A)
Icex1, Icex2
VS=±15V, VIN=5mV, VOUT to -VS=35V
Table C.2. Measured parameters, pre-irradiation specifications and measurement precision for the RH119W High
Performance Dual Comparator.
Parameter
Pre-Irradiation Specification
MIN
Icc
MAX
1.15E-02
Measurement Precision/Resolution
±1.05E-04
Iss
-4.50E-03
±9.97E-06
Vos1, Vos2
-4.00E-03
4.00E-03
±3.05E-05
Ios1, Ios2
-7.50E-08
7.50E-08
±3.64E-09
Ib+1, Ib+2
-5.00E-07
5.00E-07
±9.61E-09
Ib-1, Ib-2
-5.00E-07
5.00E-07
±7.02E-09
Avol1, Avol2
1.00E+01
±2.16E+01
CMRR1, CMRR2
9.00E+01
±1.63E+01
Vola1, Vola2
4.00E-01
±4.61E-03
Volb1, Volb2
1.50E+00
±7.43E-03
Icex1, Icex2
2.00E-06
±3.80E-09
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TID Report
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Appendix D: List of Figures Used in the Results Section (Section 5)
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
5.9.
5.10.
5.11.
5.12.
5.13.
5.14.
5.15.
5.16.
5.17.
5.18.
5.19.
5.20.
Positive Supply Current (A) @ VS=±15V
Negative Supply Current (A) @ VS=±15V
Input Offset Voltage 1 (V) @ VS=±15V, VCM=0V
Input Offset Voltage 2 (V) @ VS=±15V, VCM=0V
Input Offset Current 1 (A) @ VS=±15V, VCM=0V
Input Offset Current 2 (A) @ VS=±15V, VCM=0V
Positive Bias Current 1 (A) @ VS=±15V, VCM=0V
Positive Bias Current 2 (A) @ VS=±15V, VCM=0V
Negative Bias Current 1 (A) @ VS=±15V, VCM=0V
Negative Bias Current 2 (A) @ VS=±15V, VCM=0V
Large signal Voltage Gain 1 (V/mV) @ VS=±15V, VCM=0V
Large signal Voltage Gain 2 (V/mV) @ VS=±15V, VCM=0V
Common Mode Rejection Ratio 1 (dB) @ VS=±15V
Common Mode Rejection Ratio 2 (dB) @ VS=±15V
Saturation Voltage 1 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA
Saturation Voltage 2 (V) @ +VS = +4.5V, -VS=0V, VIN=-6mV, ISINK = 3.2mA
Saturation Voltage 1 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA
Saturation Voltage 2 (V) @ VS = ±15V, VIN=-5mV, IOUT = 25mA
Output Leakage Current 1 (A) @ VIN=5mV, VOUT to -VS=35V
Output Leakage Current 2 (A) @ VIN=5mV, VOUT to -VS=35V
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