TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Total Ionizing Dose (TID) Radiation Testing of the RH1078MJ8 Dual Precision Op Amp for Linear Technology Customer: Linear Technology, PO# 54873L RAD Job Number: 10-004 Part Type Tested: Linear Technology RH1078MJ8 Dual Precision Operational Amplifier Commercial Part Number: RH1078MJ8 Traceability Information: Lot Date Code: 0939A, Assy Lot# 540915.1, Fab Lot# W0933494.1, Wafer 12 (Obtained from Linear Technology PO 54873L). See photograph of unit under test in Appendix A. Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 2 control units. Serial numbers 255, 258, 309, 359, and 360 were biased during irradiation, serial numbers 416, 472, 473, 526, and 529 were unbiased during irradiation and serial numbers 530 and 561 were used as controls. See Appendix B for the radiation bias connection table. Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD. TID Dose Rate and Test Increments: 50-300rad(Si)/s with readings at pre-irradiation, 10, 20, 30 and 50krad(Si). TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations. Electrical measurements shall be made following each anneal increment. TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure. Test Hardware and Software: LTS2020 Tester, 2101 Family Board, 0600 Fixture, RH1078 DUT Board, and RH1078LT.SRC test program. Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using the JLSA 81-24 high dose rate Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD’s dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM 1019.5. Irradiation and Test Temperature: Room temperature for irradiation and test controlled to 24°C ± 6°C per MIL-STD-883. Total Ionizing Dose Test Result: PASSED. Units passed to the maximum tested total dose of 50krad(Si) with no significant degradation observed to any measured parameter. Further, the units do not exhibit ELDRS as defined in the current test method. An ISO 9001:2008 and DSCC Certified Company 1 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at RAD’s Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL-STD-750 and MIL-STD-883. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices” An ISO 9001:2008 and DSCC Certified Company 2 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2008 and DSCC Certified Company 3 TID Report 10-004 100412 R1.0 3.0. Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Test Conditions The RH1078MJ8 Dual Precision Op Amp described in this final report was irradiated using a split 15V supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in Appendix A for the full bias circuits. In our opinion these bias circuits satisfy the requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias.” The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum dose rate of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by low-energy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or testfixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the lead-aluminum box was determined based on TLD dosimetry measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work was 55.3rad(Si)/s with a precision of ±5%. During the total ionizing dose testing the following electrical parameters were measured pre- and postirradiation: ±15V Tests 1. 2. 3. 4. 5. Positive Supply Current (ICC2) Negative Supply Current (IEE2) Input Offset Voltage (VOS3 &VOS4) Input Offset Current (IOS3 & IOS4) + Input Bias Current (IB+3 & IB+4) An ISO 9001:2008 and DSCC Certified Company 4 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6. - Input Bias Current (IB-3 & IB-4) 7. Common Mode Rejection Ratio (CMRR3 & CMRR4) 8. Power Supply Rejection Ratio (PSRR3 & PSRR4) 9. Large Signal Voltage Gain (AVOL 5 &AVOL6) 10. Large Signal Voltage Gain (AVOL 7 &AVOL8) 11. VOUT High (VOUTHIGH5 & VOUTHIGH6) 12. VOUT High (VOUTHIGH7 & VOUTHIGH8) 13. VOUT Low (VOUTLOW7 & VOUTLOW8) 14. VOUT Low (VOUTLOW9 & VOUTLOW10) 15. +SR (Slew Rate 5 and Slew Rate 6) 16. -SR (Slew Rate 7 and Slew Rate 8) +5V Tests 17. Positive Supply Current (ICC2) 18. Negative Supply Current (IEE2) 19. Input Offset Voltage (VOS1 &VOS2) 20. Input Offset Current (IOS1 & IOS2) 21. + Input Bias Current (IB+1 & IB+2) 22. - Input Bias Current (IB-1 & IB-2) 23. Common Mode Rejection Ratio (CMRR1 & CMRR2) 24. Power Supply Rejection Ratio (PSRR1 & PSRR2) 25. Large Signal Voltage Gain (AVOL 1 &AVOL2) 26. Large Signal Voltage Gain (AVOL3 &AVOL4) 27. VOUT Low (VOUTLOW1 & VOUTLOW2) 28. VOUT Low (VOUTLOW3 & VOUTLOW4) 29. VOUT Low (VOUTLOW5 & VOUTLOW6) 30. VOUT High (VOUTHIGH1 & VOUTHIGH2) 31. VOUT High (VOUTHIGH3 & VOUTHIGH4) 32. +SR (Slew Rate 1 and Slew Rate 2) 33. -SR (Slew Rate 3 and Slew Rate 4) Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement resolution for each of the measurements. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a device to pass the total dose test: following the radiation exposure each of the 5 pieces irradiated under An ISO 9001:2008 and DSCC Certified Company 5 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a population representative of recent production runs. Smaller sample sizes may be used if agreed upon between the parties to the test. All of the selected devices shall have undergone appropriate elevated temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and repeat the electrical characterization on each part at each dose level. Post irradiation electrical measurements shall be performed per paragraph 3.10 where the low dose rate test is considered Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5 for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test does not apply to parameters which exhibit changes that are within experimental error or whose values are below the pre-irradiation electrical specification limits at low dose rate at the specification dose. Therefore, the data in this report can be analyzed along with the report titled “Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1078MJ8 Dual Precision Op Amp for Linear Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method. 5.0. TID Test Results Using the conditions stated above, the RH1078MJ8 Dual Precision Op Amp (from the lot date code identified on the first page of this test report) passed the total dose test to the maximum tested level of 50krad(Si) with no significant degradation observed on any measured parameter. Note that the data presented in this report for the units-under-test irradiated in the unbiased condition and the KTL statistics are for reference only and are not used for the determination of “PASS/FAIL” for the lot. Figures 5.1 through 5.62 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 – 5.62 show the corresponding raw data for each of these parameters. In these data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application An ISO 9001:2008 and DSCC Certified Company 6 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. In addition to the radiation test results, the data plots and tables described above contain anneal data. The anneals are performed to better understand the underlying physical mechanisms responsible for radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot passes or fails the total dose test. In all cases the parts either improved or exhibited no change during the anneal. As seen clearly in these figures, the pre- and post-irradiation data are well within the specification even after application of the KTL statistics and the control units, as expected, show no significant changes to any of the parameters throughout the course of the measurements. Therefore we can conclude that any observed degradation was due to the radiation exposure and not drift in the test equipment. An ISO 9001:2008 and DSCC Certified Company 7 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Supply Current @ +5V (A) 1.70E-04 1.50E-04 1.30E-04 1.10E-04 9.00E-05 7.00E-05 5.00E-05 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.1. Plot of Positive Supply Current @ +5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 8 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.1. Raw data for Positive Supply Current @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @ +5V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.12E-04 1.21E-04 1.16E-04 1.13E-04 1.09E-04 1.04E-04 1.11E-04 1.11E-04 1.14E-04 1.09E-04 1.11E-04 1.10E-04 10 1.05E-04 1.15E-04 1.13E-04 1.12E-04 1.07E-04 1.03E-04 1.10E-04 1.08E-04 1.13E-04 1.08E-04 1.13E-04 1.11E-04 20 1.03E-04 1.14E-04 1.09E-04 1.10E-04 1.04E-04 9.90E-05 1.05E-04 1.03E-04 1.10E-04 1.05E-04 1.13E-04 1.13E-04 30 9.70E-05 1.10E-04 1.06E-04 1.05E-04 1.00E-04 9.50E-05 1.03E-04 1.00E-04 1.09E-04 1.01E-04 1.13E-04 1.10E-04 50 9.30E-05 9.90E-05 9.90E-05 9.80E-05 9.60E-05 8.80E-05 9.50E-05 9.30E-05 9.60E-05 9.00E-05 1.12E-04 1.09E-04 60 9.10E-05 1.01E-04 9.90E-05 9.40E-05 9.30E-05 8.80E-05 9.50E-05 9.10E-05 1.00E-04 9.40E-05 1.12E-04 1.10E-04 70 9.00E-05 1.01E-04 9.80E-05 9.80E-05 9.20E-05 9.40E-05 9.90E-05 1.01E-04 1.04E-04 9.70E-05 1.14E-04 1.12E-04 1.14E-04 4.55E-06 1.27E-04 1.02E-04 1.10E-04 4.22E-06 1.22E-04 9.88E-05 1.08E-04 4.53E-06 1.20E-04 9.56E-05 1.04E-04 5.13E-06 1.18E-04 8.95E-05 9.70E-05 2.55E-06 1.04E-04 9.00E-05 9.56E-05 4.22E-06 1.07E-04 8.40E-05 9.58E-05 4.60E-06 1.08E-04 8.32E-05 1.10E-04 3.70E-06 1.20E-04 9.97E-05 1.50E-04 PASS 1.08E-04 3.65E-06 1.18E-04 9.84E-05 1.50E-04 PASS 1.04E-04 3.97E-06 1.15E-04 9.35E-05 1.50E-04 PASS 1.02E-04 5.08E-06 1.16E-04 8.77E-05 1.50E-04 PASS 9.24E-05 3.36E-06 1.02E-04 8.32E-05 1.50E-04 PASS 9.36E-05 4.51E-06 1.06E-04 8.12E-05 1.50E-04 PASS 9.90E-05 3.81E-06 1.09E-04 8.86E-05 1.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 9 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Supply Current @ +5V (A) -5.00E-05 -7.00E-05 -9.00E-05 -1.10E-04 -1.30E-04 -1.50E-04 -1.70E-04 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.2. Plot of Negative Supply Current @ +5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 10 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.2. Raw data for Negative Supply Current @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @ +5V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 -1.06E-04 -1.15E-04 -1.13E-04 -1.10E-04 -1.07E-04 -1.02E-04 -1.08E-04 -1.07E-04 -1.14E-04 -1.08E-04 -1.11E-04 -1.09E-04 10 -1.04E-04 -1.13E-04 -1.11E-04 -1.09E-04 -1.04E-04 -1.00E-04 -1.06E-04 -1.05E-04 -1.11E-04 -1.05E-04 -1.11E-04 -1.09E-04 20 -1.00E-04 -1.09E-04 -1.07E-04 -1.05E-04 -1.01E-04 -9.70E-05 -1.02E-04 -1.02E-04 -1.07E-04 -1.02E-04 -1.11E-04 -1.09E-04 30 -9.50E-05 -1.05E-04 -1.04E-04 -1.02E-04 -9.70E-05 -9.30E-05 -9.90E-05 -9.80E-05 -1.03E-04 -9.80E-05 -1.11E-04 -1.09E-04 50 -8.80E-05 -9.80E-05 -9.60E-05 -9.40E-05 -9.10E-05 -8.60E-05 -9.10E-05 -8.90E-05 -9.40E-05 -8.90E-05 -1.10E-04 -1.08E-04 60 -8.70E-05 -9.80E-05 -9.40E-05 -9.20E-05 -9.00E-05 -8.60E-05 -9.20E-05 -9.00E-05 -9.60E-05 -9.00E-05 -1.10E-04 -1.10E-04 70 -8.80E-05 -9.90E-05 -9.60E-05 -9.50E-05 -9.00E-05 -9.10E-05 -9.70E-05 -9.60E-05 -1.02E-04 -9.50E-05 -1.11E-04 -1.08E-04 -1.10E-04 3.83E-06 -9.97E-05 -1.21E-04 -1.08E-04 4.09E-06 -9.70E-05 -1.19E-04 -1.04E-04 3.85E-06 -9.39E-05 -1.15E-04 -1.01E-04 4.39E-06 -8.86E-05 -1.13E-04 -9.34E-05 3.97E-06 -8.25E-05 -1.04E-04 -9.22E-05 4.15E-06 -8.08E-05 -1.04E-04 -9.36E-05 4.51E-06 -8.12E-05 -1.06E-04 -1.08E-04 4.27E-06 -9.61E-05 -1.19E-04 -1.50E-04 PASS -1.05E-04 3.91E-06 -9.47E-05 -1.16E-04 -1.50E-04 PASS -1.02E-04 3.54E-06 -9.23E-05 -1.12E-04 -1.50E-04 PASS -9.82E-05 3.56E-06 -8.84E-05 -1.08E-04 -1.50E-04 PASS -8.98E-05 2.95E-06 -8.17E-05 -9.79E-05 -1.50E-04 PASS -9.08E-05 3.63E-06 -8.08E-05 -1.01E-04 -1.50E-04 PASS -9.62E-05 3.96E-06 -8.53E-05 -1.07E-04 -1.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 11 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 1 @ +5V (V) 3.00E-04 2.00E-04 1.00E-04 0.00E+00 -1.00E-04 -2.00E-04 -3.00E-04 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.3. Plot of Input Offset Voltage 1 @ +5V (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 12 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.3. Raw data for Input Offset Voltage 1 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 1 @ +5V (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.09E-05 5.41E-05 6.44E-05 -3.62E-05 2.32E-05 3.96E-05 1.88E-05 7.22E-05 7.93E-05 4.86E-05 1.30E-05 2.61E-05 10 2.44E-05 3.92E-05 5.18E-05 -5.42E-05 1.33E-05 3.45E-05 1.20E-05 6.63E-05 8.04E-05 3.86E-05 1.50E-05 2.91E-05 20 3.02E-05 3.51E-05 5.62E-05 -4.86E-05 1.83E-05 4.01E-05 1.19E-05 6.34E-05 7.69E-05 3.38E-05 1.69E-05 2.76E-05 30 3.98E-05 4.68E-05 5.89E-05 -4.29E-05 2.44E-05 4.45E-05 1.48E-05 6.65E-05 8.04E-05 4.02E-05 1.12E-05 3.03E-05 50 6.67E-05 5.90E-05 6.88E-05 -3.33E-05 3.74E-05 4.90E-05 2.62E-05 8.30E-05 9.68E-05 6.13E-05 1.17E-05 3.09E-05 60 7.99E-05 7.33E-05 8.13E-05 -2.24E-05 5.25E-05 5.00E-05 2.88E-05 8.25E-05 9.62E-05 6.47E-05 1.69E-05 2.92E-05 70 6.82E-05 5.22E-05 7.17E-05 -2.55E-05 4.77E-05 4.05E-05 1.66E-05 6.42E-05 9.28E-05 4.98E-05 1.06E-05 3.04E-05 2.93E-05 3.97E-05 1.38E-04 -7.97E-05 1.49E-05 4.13E-05 1.28E-04 -9.83E-05 1.82E-05 3.98E-05 1.27E-04 -9.10E-05 2.54E-05 4.02E-05 1.36E-04 -8.47E-05 3.97E-05 4.27E-05 1.57E-04 -7.73E-05 5.29E-05 4.36E-05 1.73E-04 -6.67E-05 4.28E-05 3.95E-05 1.51E-04 -6.56E-05 5.17E-05 2.46E-05 1.19E-04 -1.57E-05 -1.20E-04 PASS 1.20E-04 PASS 4.64E-05 2.71E-05 1.21E-04 -2.80E-05 -1.20E-04 PASS 1.20E-04 PASS 4.52E-05 2.55E-05 1.15E-04 -2.46E-05 -1.20E-04 PASS 1.20E-04 PASS 4.93E-05 2.53E-05 1.19E-04 -2.00E-05 -1.75E-04 PASS 1.75E-04 PASS 6.33E-05 2.78E-05 1.40E-04 -1.30E-05 -2.50E-04 PASS 2.50E-04 PASS 6.44E-05 2.65E-05 1.37E-04 -8.28E-06 -2.50E-04 PASS 2.50E-04 PASS 5.28E-05 2.83E-05 1.30E-04 -2.47E-05 -2.50E-04 PASS 2.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 13 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 2 @ +5V (V) 3.00E-04 2.00E-04 1.00E-04 0.00E+00 -1.00E-04 -2.00E-04 -3.00E-04 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.4. Plot of Input Offset Voltage 2 @ +5V (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 14 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.4. Raw data for Input Offset Voltage 2 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 2 @ +5V (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.95E-05 9.29E-05 1.81E-05 5.82E-05 6.92E-05 -8.83E-06 8.73E-05 4.96E-05 5.70E-05 -5.96E-05 -4.47E-05 6.77E-05 10 -5.89E-05 7.74E-05 3.02E-06 4.08E-05 5.15E-05 -1.13E-05 8.92E-05 4.54E-05 5.83E-05 -6.35E-05 -4.02E-05 7.04E-05 20 -5.11E-05 8.01E-05 4.81E-06 4.76E-05 6.31E-05 -1.04E-05 7.81E-05 4.21E-05 6.03E-05 -6.10E-05 -4.26E-05 6.82E-05 30 -4.72E-05 8.61E-05 1.16E-05 5.36E-05 6.98E-05 -3.52E-06 8.74E-05 5.03E-05 6.67E-05 -5.40E-05 -4.20E-05 6.82E-05 50 -2.56E-05 9.95E-05 3.11E-05 6.67E-05 9.00E-05 1.44E-05 9.83E-05 6.43E-05 8.57E-05 -3.04E-05 -4.24E-05 6.99E-05 60 -1.23E-05 1.12E-04 4.44E-05 8.11E-05 9.92E-05 1.89E-05 1.03E-04 7.16E-05 8.79E-05 -3.18E-05 -4.00E-05 7.16E-05 70 -3.13E-05 9.75E-05 3.06E-05 6.01E-05 9.96E-05 -5.22E-06 8.66E-05 4.48E-05 7.57E-05 -4.82E-05 -4.36E-05 6.96E-05 3.98E-05 5.19E-05 1.82E-04 -1.03E-04 2.28E-05 5.29E-05 1.68E-04 -1.22E-04 2.89E-05 5.27E-05 1.73E-04 -1.16E-04 3.47E-05 5.35E-05 1.82E-04 -1.12E-04 5.24E-05 5.09E-05 1.92E-04 -8.73E-05 6.48E-05 5.00E-05 2.02E-04 -7.23E-05 5.13E-05 5.43E-05 2.00E-04 -9.76E-05 2.51E-05 5.88E-05 1.86E-04 -1.36E-04 -1.20E-04 PASS 1.20E-04 PASS 2.36E-05 6.08E-05 1.90E-04 -1.43E-04 -1.20E-04 PASS 1.20E-04 PASS 2.18E-05 5.69E-05 1.78E-04 -1.34E-04 -1.20E-04 PASS 1.20E-04 PASS 2.94E-05 5.75E-05 1.87E-04 -1.28E-04 -1.75E-04 PASS 1.75E-04 PASS 4.64E-05 5.36E-05 1.93E-04 -1.01E-04 -2.50E-04 PASS 2.50E-04 PASS 5.00E-05 5.57E-05 2.03E-04 -1.03E-04 -2.50E-04 PASS 2.50E-04 PASS 3.07E-05 5.67E-05 1.86E-04 -1.25E-04 -2.50E-04 PASS 2.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 15 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 1 @ +5V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.5. Plot of Input Offset Current 1 @ +5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 16 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.5. Raw data for Input Offset Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 1 @ +5V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.00E-11 -1.20E-10 -6.00E-11 0.00E+00 -7.00E-11 9.00E-11 -6.00E-11 -7.00E-11 -4.00E-11 -3.00E-11 -8.00E-11 -4.00E-11 10 1.00E-11 2.00E-11 -9.00E-11 -2.00E-11 1.60E-10 -1.00E-10 3.00E-11 -4.00E-11 -2.40E-10 -2.00E-10 -1.10E-10 -1.20E-10 20 2.00E-11 -8.00E-11 -6.00E-11 -2.00E-11 1.20E-10 -4.00E-11 1.30E-10 -1.30E-10 -8.00E-11 -3.10E-10 -1.10E-10 3.00E-11 30 -1.70E-10 6.00E-11 -1.90E-10 4.00E-11 1.10E-10 -3.00E-11 5.00E-11 -1.50E-10 -1.20E-10 -3.00E-10 -1.80E-10 0.00E+00 50 7.00E-11 1.10E-10 -3.80E-10 4.00E-11 2.00E-10 0.00E+00 6.00E-11 -4.10E-10 -8.00E-11 -2.40E-10 -1.60E-10 -6.00E-11 60 -4.00E-11 1.10E-10 -2.80E-10 -3.00E-11 1.20E-10 3.00E-11 5.00E-11 -2.60E-10 -2.00E-10 -1.10E-10 -2.10E-10 0.00E+00 70 -1.30E-10 2.60E-10 -2.60E-10 2.00E-10 -5.00E-11 -5.00E-11 -1.80E-10 -5.00E-11 -1.50E-10 -2.50E-10 -1.40E-10 -6.00E-11 -3.40E-11 7.67E-11 1.76E-10 -2.44E-10 1.60E-11 9.13E-11 2.66E-10 -2.34E-10 -4.00E-12 7.92E-11 2.13E-10 -2.21E-10 -3.00E-11 1.39E-10 3.52E-10 -4.12E-10 8.00E-12 2.25E-10 6.25E-10 -6.09E-10 -2.40E-11 1.62E-10 4.19E-10 -4.67E-10 4.00E-12 2.21E-10 6.09E-10 -6.01E-10 -2.20E-11 6.46E-11 1.55E-10 -1.99E-10 -8.00E-10 PASS 8.00E-10 PASS -1.10E-10 1.11E-10 1.95E-10 -4.15E-10 -2.00E-09 PASS 2.00E-09 PASS -8.60E-11 1.59E-10 3.50E-10 -5.22E-10 -2.00E-09 PASS 2.00E-09 PASS -1.10E-10 1.32E-10 2.52E-10 -4.72E-10 -8.00E-09 PASS 8.00E-09 PASS -1.34E-10 1.91E-10 3.90E-10 -6.58E-10 -1.30E-08 PASS 1.30E-08 PASS -9.80E-11 1.37E-10 2.78E-10 -4.74E-10 -1.30E-08 PASS 1.30E-08 PASS -1.36E-10 8.65E-11 1.01E-10 -3.73E-10 -1.30E-08 PASS 1.30E-08 PASS An ISO 9001:2008 and DSCC Certified Company 17 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 2 @ +5V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.6. Plot of Input Offset Current 2 @ +5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 18 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.6. Raw data for Input Offset Current 2 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 2 @ +5V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.00E-11 -1.20E-10 -9.00E-11 -1.40E-10 0.00E+00 -1.00E-11 -1.40E-10 -4.00E-11 -2.00E-11 1.40E-10 -5.00E-11 -2.20E-10 10 1.00E-11 -5.00E-11 -2.10E-10 -1.60E-10 -2.00E-11 1.30E-10 0.00E+00 -8.00E-11 -4.00E-11 2.00E-11 -4.00E-11 -1.50E-10 20 4.00E-11 -7.00E-11 -1.10E-10 -1.30E-10 -7.00E-11 1.60E-10 -1.50E-10 8.00E-11 -2.50E-10 2.80E-10 -4.00E-11 -2.70E-10 30 1.00E-10 -3.00E-11 -6.00E-11 -2.00E-11 -9.00E-11 2.00E-11 -9.00E-11 1.10E-10 -2.10E-10 2.90E-10 -6.00E-11 -2.00E-10 50 0.00E+00 1.00E-10 -1.00E-11 -1.40E-10 7.00E-11 6.00E-11 -3.00E-11 -2.00E-11 -1.80E-10 3.50E-10 -2.00E-11 -1.40E-10 60 1.00E-11 -2.30E-10 -2.00E-10 -3.00E-11 -4.00E-11 1.90E-10 1.90E-10 3.50E-10 1.20E-10 7.60E-10 0.00E+00 -1.60E-10 70 3.00E-11 -1.70E-10 0.00E+00 0.00E+00 6.00E-11 0.00E+00 2.00E-11 2.00E-11 -1.40E-10 3.00E-10 0.00E+00 -1.20E-10 -6.00E-11 8.15E-11 1.64E-10 -2.84E-10 -8.60E-11 9.45E-11 1.73E-10 -3.45E-10 -6.80E-11 6.57E-11 1.12E-10 -2.48E-10 -2.00E-11 7.25E-11 1.79E-10 -2.19E-10 4.00E-12 9.29E-11 2.59E-10 -2.51E-10 -9.80E-11 1.09E-10 2.01E-10 -3.97E-10 -1.60E-11 8.96E-11 2.30E-10 -2.62E-10 -1.40E-11 1.00E-10 2.61E-10 -2.89E-10 -8.00E-10 PASS 8.00E-10 PASS 6.00E-12 7.92E-11 2.23E-10 -2.11E-10 -2.00E-09 PASS 2.00E-09 PASS 2.40E-11 2.19E-10 6.26E-10 -5.78E-10 -2.00E-09 PASS 2.00E-09 PASS 2.40E-11 1.91E-10 5.48E-10 -5.00E-10 -8.00E-09 PASS 8.00E-09 PASS 3.60E-11 1.96E-10 5.73E-10 -5.01E-10 -1.30E-08 PASS 1.30E-08 PASS 3.22E-10 2.59E-10 1.03E-09 -3.88E-10 -1.30E-08 PASS 1.30E-08 PASS 4.00E-11 1.60E-10 4.79E-10 -3.99E-10 -1.30E-08 PASS 1.30E-08 PASS An ISO 9001:2008 and DSCC Certified Company 19 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 1 @ +5V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.7. Plot of Positive Input Bias Current 1 @ +5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 20 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.7. Raw data for Positive Input Bias Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 1 @ +5V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 9.00E-09 1.00E-08 9.77E-09 9.96E-09 9.33E-09 9.69E-09 9.33E-09 9.39E-09 9.57E-09 9.21E-09 9.50E-09 9.32E-09 10 1.06E-08 1.18E-08 1.16E-08 1.19E-08 1.10E-08 1.13E-08 1.09E-08 1.10E-08 1.14E-08 1.11E-08 9.58E-09 9.27E-09 20 1.29E-08 1.45E-08 1.42E-08 1.47E-08 1.32E-08 1.38E-08 1.33E-08 1.35E-08 1.39E-08 1.32E-08 9.55E-09 9.26E-09 30 1.55E-08 1.74E-08 1.71E-08 1.79E-08 1.57E-08 1.63E-08 1.59E-08 1.61E-08 1.65E-08 1.57E-08 9.46E-09 9.31E-09 50 2.11E-08 2.37E-08 2.27E-08 2.38E-08 2.09E-08 2.13E-08 2.08E-08 2.14E-08 2.22E-08 2.11E-08 9.50E-09 9.27E-09 60 2.28E-08 2.55E-08 2.43E-08 2.52E-08 2.22E-08 2.12E-08 2.06E-08 2.14E-08 2.20E-08 2.11E-08 9.54E-09 9.16E-09 70 2.35E-08 2.62E-08 2.50E-08 2.57E-08 2.33E-08 1.89E-08 1.83E-08 1.88E-08 1.94E-08 1.86E-08 9.46E-09 9.38E-09 9.61E-09 4.33E-10 1.08E-08 8.42E-09 1.14E-08 5.67E-10 1.29E-08 9.83E-09 1.39E-08 7.95E-10 1.60E-08 1.17E-08 1.67E-08 1.05E-09 1.96E-08 1.38E-08 2.24E-08 1.38E-09 2.62E-08 1.86E-08 2.40E-08 1.45E-09 2.80E-08 2.00E-08 2.47E-08 1.27E-09 2.82E-08 2.13E-08 9.44E-09 1.92E-10 9.96E-09 8.91E-09 -1.50E-08 PASS 1.50E-08 PASS 1.11E-08 2.10E-10 1.17E-08 1.06E-08 -2.00E-08 PASS 2.00E-08 PASS 1.35E-08 2.90E-10 1.43E-08 1.28E-08 -2.00E-08 PASS 2.00E-08 PASS 1.61E-08 3.00E-10 1.69E-08 1.53E-08 -4.00E-08 PASS 4.00E-08 PASS 2.14E-08 5.08E-10 2.28E-08 2.00E-08 -8.00E-08 PASS 8.00E-08 PASS 2.13E-08 4.90E-10 2.26E-08 1.99E-08 -8.00E-08 PASS 8.00E-08 PASS 1.88E-08 4.01E-10 1.99E-08 1.77E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2008 and DSCC Certified Company 21 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 2 @ +5V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.8. Plot of Positive Input Bias Current 2 @ +5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 22 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.8. Raw data for Positive Input Bias Current 2 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 2 @ +5V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 9.04E-09 1.00E-08 9.77E-09 9.85E-09 9.45E-09 9.72E-09 9.49E-09 9.34E-09 9.44E-09 9.37E-09 9.63E-09 9.31E-09 10 1.06E-08 1.20E-08 1.14E-08 1.17E-08 1.12E-08 1.15E-08 1.10E-08 1.11E-08 1.15E-08 1.13E-08 9.60E-09 9.29E-09 20 1.30E-08 1.45E-08 1.42E-08 1.47E-08 1.35E-08 1.39E-08 1.33E-08 1.36E-08 1.39E-08 1.36E-08 9.61E-09 9.34E-09 30 1.55E-08 1.76E-08 1.69E-08 1.77E-08 1.60E-08 1.64E-08 1.59E-08 1.63E-08 1.65E-08 1.63E-08 9.66E-09 9.36E-09 50 2.10E-08 2.38E-08 2.27E-08 2.34E-08 2.11E-08 2.14E-08 2.09E-08 2.16E-08 2.21E-08 2.18E-08 9.62E-09 9.27E-09 60 2.28E-08 2.56E-08 2.43E-08 2.48E-08 2.26E-08 2.14E-08 2.11E-08 2.19E-08 2.23E-08 2.18E-08 9.65E-09 9.23E-09 70 2.38E-08 2.64E-08 2.53E-08 2.54E-08 2.36E-08 1.91E-08 1.85E-08 1.90E-08 1.95E-08 1.91E-08 9.54E-09 9.33E-09 9.62E-09 3.85E-10 1.07E-08 8.57E-09 1.14E-08 5.32E-10 1.28E-08 9.91E-09 1.40E-08 7.21E-10 1.59E-08 1.20E-08 1.67E-08 9.79E-10 1.94E-08 1.41E-08 2.24E-08 1.28E-09 2.59E-08 1.89E-08 2.40E-08 1.30E-09 2.76E-08 2.04E-08 2.49E-08 1.17E-09 2.81E-08 2.17E-08 9.47E-09 1.51E-10 9.88E-09 9.06E-09 -1.50E-08 PASS 1.50E-08 PASS 1.13E-08 2.40E-10 1.19E-08 1.06E-08 -2.00E-08 PASS 2.00E-08 PASS 1.37E-08 2.65E-10 1.44E-08 1.29E-08 -2.00E-08 PASS 2.00E-08 PASS 1.63E-08 2.53E-10 1.70E-08 1.56E-08 -4.00E-08 PASS 4.00E-08 PASS 2.15E-08 4.73E-10 2.28E-08 2.02E-08 -8.00E-08 PASS 8.00E-08 PASS 2.17E-08 4.69E-10 2.30E-08 2.04E-08 -8.00E-08 PASS 8.00E-08 PASS 1.90E-08 3.70E-10 2.01E-08 1.80E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2008 and DSCC Certified Company 23 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Input Bias Current 1 @ +5V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.9. Plot of Negative Input Bias Current 1 @ +5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 24 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.9. Raw data for Negative Input Bias Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 1 @ +5V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.99E-09 9.96E-09 9.85E-09 9.88E-09 9.26E-09 9.74E-09 9.34E-09 9.44E-09 9.65E-09 9.20E-09 9.66E-09 9.29E-09 10 1.05E-08 1.19E-08 1.18E-08 1.19E-08 1.10E-08 1.14E-08 1.09E-08 1.11E-08 1.17E-08 1.11E-08 9.67E-09 9.39E-09 20 1.28E-08 1.45E-08 1.44E-08 1.47E-08 1.31E-08 1.38E-08 1.33E-08 1.37E-08 1.41E-08 1.36E-08 9.63E-09 9.28E-09 30 1.55E-08 1.75E-08 1.72E-08 1.77E-08 1.56E-08 1.63E-08 1.58E-08 1.63E-08 1.67E-08 1.61E-08 9.70E-09 9.34E-09 50 2.12E-08 2.37E-08 2.30E-08 2.36E-08 2.07E-08 2.13E-08 2.09E-08 2.18E-08 2.24E-08 2.17E-08 9.64E-09 9.33E-09 60 2.28E-08 2.54E-08 2.45E-08 2.51E-08 2.23E-08 2.12E-08 2.06E-08 2.17E-08 2.23E-08 2.13E-08 9.74E-09 9.24E-09 70 2.37E-08 2.61E-08 2.56E-08 2.56E-08 2.35E-08 1.89E-08 1.86E-08 1.90E-08 1.96E-08 1.87E-08 9.72E-09 9.34E-09 9.59E-09 4.35E-10 1.08E-08 8.39E-09 1.14E-08 6.29E-10 1.31E-08 9.68E-09 1.39E-08 8.57E-10 1.62E-08 1.15E-08 1.67E-08 1.08E-09 1.97E-08 1.38E-08 2.24E-08 1.42E-09 2.63E-08 1.85E-08 2.40E-08 1.41E-09 2.79E-08 2.02E-08 2.49E-08 1.20E-09 2.82E-08 2.16E-08 9.47E-09 2.21E-10 1.01E-08 8.87E-09 -1.50E-08 PASS 1.50E-08 PASS 1.12E-08 3.11E-10 1.21E-08 1.04E-08 -2.00E-08 PASS 2.00E-08 PASS 1.37E-08 2.95E-10 1.45E-08 1.29E-08 -2.00E-08 PASS 2.00E-08 PASS 1.62E-08 3.30E-10 1.71E-08 1.53E-08 -4.00E-08 PASS 4.00E-08 PASS 2.16E-08 5.80E-10 2.32E-08 2.00E-08 -8.00E-08 PASS 8.00E-08 PASS 2.14E-08 6.44E-10 2.32E-08 1.97E-08 -8.00E-08 PASS 8.00E-08 PASS 1.89E-08 3.84E-10 2.00E-08 1.79E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2008 and DSCC Certified Company 25 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Input Bias Current 2 @+5V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.10. Plot of Negative Input Bias Current 2 @+5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 26 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.10. Raw data for Negative Input Bias Current 2 @+5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 2 @+5V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 9.07E-09 1.01E-08 9.77E-09 1.01E-08 9.53E-09 9.74E-09 9.38E-09 9.37E-09 9.74E-09 9.23E-09 9.73E-09 9.44E-09 10 1.07E-08 1.21E-08 1.16E-08 1.19E-08 1.12E-08 1.13E-08 1.11E-08 1.12E-08 1.15E-08 1.13E-08 9.64E-09 9.54E-09 20 1.29E-08 1.46E-08 1.44E-08 1.48E-08 1.35E-08 1.38E-08 1.34E-08 1.37E-08 1.40E-08 1.35E-08 9.62E-09 9.48E-09 30 1.54E-08 1.76E-08 1.71E-08 1.77E-08 1.60E-08 1.62E-08 1.60E-08 1.64E-08 1.67E-08 1.60E-08 9.57E-09 9.56E-09 50 2.12E-08 2.39E-08 2.28E-08 2.34E-08 2.10E-08 2.12E-08 2.09E-08 2.18E-08 2.24E-08 2.15E-08 9.63E-09 9.58E-09 60 2.30E-08 2.58E-08 2.44E-08 2.49E-08 2.27E-08 2.12E-08 2.09E-08 2.17E-08 2.23E-08 2.13E-08 9.67E-09 9.49E-09 70 2.38E-08 2.64E-08 2.53E-08 2.56E-08 2.38E-08 1.91E-08 1.86E-08 1.91E-08 1.97E-08 1.88E-08 9.67E-09 9.57E-09 9.70E-09 4.22E-10 1.09E-08 8.55E-09 1.15E-08 5.80E-10 1.31E-08 9.90E-09 1.40E-08 7.93E-10 1.62E-08 1.19E-08 1.67E-08 1.00E-09 1.95E-08 1.40E-08 2.25E-08 1.30E-09 2.60E-08 1.89E-08 2.41E-08 1.31E-09 2.77E-08 2.05E-08 2.50E-08 1.16E-09 2.81E-08 2.18E-08 9.49E-09 2.34E-10 1.01E-08 8.85E-09 -1.50E-08 PASS 1.50E-08 PASS 1.13E-08 1.57E-10 1.17E-08 1.08E-08 -2.00E-08 PASS 2.00E-08 PASS 1.37E-08 2.29E-10 1.43E-08 1.31E-08 -2.00E-08 PASS 2.00E-08 PASS 1.63E-08 2.90E-10 1.71E-08 1.55E-08 -4.00E-08 PASS 4.00E-08 PASS 2.16E-08 5.81E-10 2.31E-08 2.00E-08 -8.00E-08 PASS 8.00E-08 PASS 2.15E-08 5.50E-10 2.30E-08 2.00E-08 -8.00E-08 PASS 8.00E-08 PASS 1.91E-08 4.07E-10 2.02E-08 1.80E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2008 and DSCC Certified Company 27 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio 1 @ +5V (dB) 1.10E+02 1.05E+02 1.00E+02 9.50E+01 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.11. Plot of Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 28 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.11. Raw data for Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 1 @ +5V (dB) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.06E+02 1.03E+02 1.05E+02 1.06E+02 1.07E+02 1.05E+02 1.05E+02 1.05E+02 1.06E+02 1.04E+02 1.04E+02 1.04E+02 10 1.05E+02 1.02E+02 1.05E+02 1.04E+02 1.05E+02 1.05E+02 1.05E+02 1.02E+02 1.02E+02 1.04E+02 1.04E+02 1.04E+02 20 1.06E+02 1.05E+02 1.05E+02 1.04E+02 1.03E+02 1.03E+02 1.02E+02 1.03E+02 1.04E+02 1.03E+02 1.04E+02 1.05E+02 30 1.05E+02 1.04E+02 1.06E+02 1.03E+02 1.08E+02 1.02E+02 1.02E+02 1.04E+02 1.04E+02 1.04E+02 1.02E+02 1.05E+02 50 1.03E+02 1.04E+02 1.05E+02 1.06E+02 1.03E+02 1.02E+02 1.02E+02 9.97E+01 1.02E+02 1.01E+02 1.03E+02 1.07E+02 60 1.12E+02 1.03E+02 1.08E+02 1.03E+02 1.03E+02 1.02E+02 1.03E+02 1.02E+02 1.02E+02 1.06E+02 1.04E+02 1.08E+02 70 1.05E+02 1.03E+02 1.06E+02 1.06E+02 1.07E+02 1.02E+02 1.02E+02 1.03E+02 1.08E+02 1.05E+02 1.05E+02 1.05E+02 1.05E+02 1.65E+00 1.10E+02 1.01E+02 1.04E+02 1.25E+00 1.08E+02 1.01E+02 1.05E+02 1.15E+00 1.08E+02 1.01E+02 1.05E+02 2.01E+00 1.10E+02 9.95E+01 1.04E+02 1.28E+00 1.08E+02 1.01E+02 1.06E+02 4.01E+00 1.17E+02 9.46E+01 1.05E+02 1.44E+00 1.09E+02 1.02E+02 1.05E+02 5.30E-01 1.06E+02 1.04E+02 9.40E+01 PASS 1.04E+02 1.56E+00 1.08E+02 9.93E+01 9.10E+01 PASS 1.03E+02 8.93E-01 1.06E+02 1.01E+02 9.10E+01 PASS 1.03E+02 9.78E-01 1.06E+02 1.00E+02 8.90E+01 PASS 1.01E+02 9.12E-01 1.04E+02 9.86E+01 8.70E+01 PASS 1.03E+02 1.72E+00 1.08E+02 9.84E+01 8.70E+01 PASS 1.04E+02 2.28E+00 1.10E+02 9.78E+01 8.70E+01 PASS An ISO 9001:2008 and DSCC Certified Company 29 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio 2 @ +5V (dB) 1.10E+02 1.05E+02 1.00E+02 9.50E+01 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.12. Plot of Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 30 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.12. Raw data for Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 2 @ +5V (dB) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.03E+02 1.04E+02 1.12E+02 1.03E+02 1.05E+02 1.04E+02 1.02E+02 1.04E+02 1.02E+02 1.00E+02 1.06E+02 1.04E+02 10 1.08E+02 1.02E+02 1.07E+02 1.05E+02 1.04E+02 1.03E+02 1.00E+02 1.05E+02 1.00E+02 1.04E+02 1.08E+02 1.02E+02 20 1.03E+02 1.02E+02 1.08E+02 1.06E+02 1.05E+02 1.00E+02 9.95E+01 1.02E+02 9.95E+01 1.01E+02 1.06E+02 1.04E+02 30 1.02E+02 1.03E+02 1.10E+02 1.07E+02 1.05E+02 1.01E+02 9.94E+01 1.02E+02 1.01E+02 1.03E+02 1.05E+02 1.03E+02 50 1.02E+02 1.02E+02 1.07E+02 1.08E+02 1.03E+02 1.01E+02 9.99E+01 1.01E+02 1.00E+02 9.97E+01 1.06E+02 1.06E+02 60 1.03E+02 1.04E+02 1.10E+02 1.03E+02 1.02E+02 1.02E+02 9.92E+01 1.02E+02 9.93E+01 1.02E+02 1.05E+02 1.02E+02 70 1.10E+02 1.06E+02 1.05E+02 1.08E+02 1.02E+02 1.04E+02 1.03E+02 1.06E+02 1.04E+02 1.03E+02 1.06E+02 1.04E+02 1.05E+02 3.69E+00 1.16E+02 9.52E+01 1.05E+02 2.20E+00 1.11E+02 9.91E+01 1.05E+02 2.33E+00 1.11E+02 9.85E+01 1.05E+02 3.19E+00 1.14E+02 9.66E+01 1.04E+02 3.13E+00 1.13E+02 9.57E+01 1.04E+02 3.20E+00 1.13E+02 9.55E+01 1.06E+02 2.83E+00 1.14E+02 9.85E+01 1.02E+02 1.63E+00 1.07E+02 9.80E+01 9.40E+01 PASS 1.02E+02 2.12E+00 1.08E+02 9.67E+01 9.10E+01 PASS 1.00E+02 9.44E-01 1.03E+02 9.78E+01 9.10E+01 PASS 1.01E+02 1.25E+00 1.05E+02 9.77E+01 8.90E+01 PASS 1.00E+02 7.39E-01 1.02E+02 9.84E+01 8.70E+01 PASS 1.01E+02 1.49E+00 1.05E+02 9.68E+01 8.70E+01 PASS 1.04E+02 1.55E+00 1.08E+02 9.96E+01 8.70E+01 PASS An ISO 9001:2008 and DSCC Certified Company 31 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Power Supply Rejection Ratio 1 @ +5V (dB) 1.40E+02 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.13. Plot of Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 32 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.13. Raw data for Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 1 @ +5V (dB) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.13E+02 1.09E+02 1.24E+02 1.12E+02 1.24E+02 1.32E+02 1.16E+02 1.29E+02 1.16E+02 1.29E+02 1.20E+02 1.30E+02 10 1.14E+02 1.11E+02 1.62E+02 1.14E+02 1.24E+02 1.32E+02 1.34E+02 1.40E+02 1.21E+02 1.31E+02 1.20E+02 1.28E+02 20 1.29E+02 1.13E+02 1.35E+02 1.10E+02 1.23E+02 1.35E+02 1.26E+02 1.20E+02 1.29E+02 1.19E+02 1.21E+02 1.43E+02 30 1.16E+02 1.12E+02 1.15E+02 1.16E+02 1.12E+02 1.40E+02 1.16E+02 1.19E+02 1.17E+02 1.47E+02 1.12E+02 1.36E+02 50 1.11E+02 1.11E+02 1.30E+02 1.12E+02 1.16E+02 1.26E+02 1.17E+02 1.35E+02 1.15E+02 1.33E+02 1.21E+02 1.26E+02 60 1.11E+02 1.09E+02 1.18E+02 1.12E+02 1.15E+02 1.22E+02 1.17E+02 1.29E+02 1.22E+02 1.30E+02 1.23E+02 1.30E+02 70 1.16E+02 1.11E+02 1.55E+02 1.18E+02 1.20E+02 1.26E+02 1.23E+02 1.24E+02 1.29E+02 1.28E+02 1.16E+02 1.35E+02 1.17E+02 6.96E+00 1.36E+02 9.75E+01 1.25E+02 2.11E+01 1.83E+02 6.71E+01 1.22E+02 1.06E+01 1.51E+02 9.29E+01 1.14E+02 2.07E+00 1.20E+02 1.08E+02 1.16E+02 8.16E+00 1.38E+02 9.35E+01 1.13E+02 3.72E+00 1.23E+02 1.03E+02 1.24E+02 1.75E+01 1.72E+02 7.59E+01 1.25E+02 7.60E+00 1.46E+02 1.04E+02 1.00E+02 PASS 1.32E+02 7.05E+00 1.51E+02 1.12E+02 1.00E+02 PASS 1.26E+02 6.93E+00 1.45E+02 1.07E+02 1.00E+02 PASS 1.28E+02 1.45E+01 1.68E+02 8.83E+01 1.00E+02 PASS 1.25E+02 9.22E+00 1.51E+02 1.00E+02 9.80E+01 PASS 1.24E+02 5.38E+00 1.39E+02 1.09E+02 9.80E+01 PASS 1.26E+02 2.68E+00 1.33E+02 1.19E+02 9.80E+01 PASS An ISO 9001:2008 and DSCC Certified Company 33 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Power Supply Rejection Ratio 2 @ +5V (dB) 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.14. Plot of Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 34 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.14. Raw data for Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 2 @ +5V (dB) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.19E+02 1.15E+02 1.17E+02 1.15E+02 1.16E+02 1.16E+02 1.36E+02 1.20E+02 1.11E+02 1.18E+02 1.15E+02 1.29E+02 10 1.15E+02 1.18E+02 1.19E+02 1.28E+02 1.17E+02 1.33E+02 1.26E+02 1.21E+02 1.12E+02 1.23E+02 1.17E+02 1.30E+02 20 1.14E+02 1.19E+02 1.17E+02 1.18E+02 1.20E+02 1.22E+02 1.27E+02 1.14E+02 1.12E+02 1.31E+02 1.14E+02 1.24E+02 30 1.14E+02 1.23E+02 1.16E+02 1.25E+02 1.17E+02 1.17E+02 1.30E+02 1.14E+02 1.13E+02 1.17E+02 1.14E+02 1.22E+02 50 1.14E+02 1.16E+02 1.14E+02 1.16E+02 1.15E+02 1.14E+02 1.44E+02 1.11E+02 1.11E+02 1.17E+02 1.17E+02 1.24E+02 60 1.12E+02 1.11E+02 1.13E+02 1.15E+02 1.12E+02 1.13E+02 1.26E+02 1.13E+02 1.09E+02 1.19E+02 1.14E+02 1.22E+02 70 1.16E+02 1.16E+02 1.20E+02 1.22E+02 1.15E+02 1.14E+02 1.37E+02 1.15E+02 1.12E+02 1.21E+02 1.21E+02 1.20E+02 1.16E+02 1.74E+00 1.21E+02 1.11E+02 1.19E+02 4.89E+00 1.33E+02 1.06E+02 1.18E+02 2.26E+00 1.24E+02 1.11E+02 1.19E+02 4.54E+00 1.31E+02 1.06E+02 1.15E+02 9.65E-01 1.18E+02 1.13E+02 1.13E+02 1.66E+00 1.17E+02 1.08E+02 1.18E+02 2.93E+00 1.26E+02 1.10E+02 1.20E+02 9.51E+00 1.46E+02 9.39E+01 1.00E+02 PASS 1.23E+02 7.81E+00 1.44E+02 1.02E+02 1.00E+02 PASS 1.21E+02 8.10E+00 1.43E+02 9.90E+01 1.00E+02 PASS 1.18E+02 6.70E+00 1.37E+02 1.00E+02 1.00E+02 PASS 1.20E+02 1.40E+01 1.58E+02 8.12E+01 9.80E+01 PASS 1.16E+02 6.61E+00 1.34E+02 9.79E+01 9.80E+01 PASS 1.20E+02 1.03E+01 1.48E+02 9.15E+01 9.80E+01 PASS An ISO 9001:2008 and DSCC Certified Company 35 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +5V, RL=open (V/mV) 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.15. Plot of Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 36 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.15. Raw data for Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +5V, RL=open (V/mV) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.00E+03 1.13E+03 1.18E+03 8.75E+02 9.66E+02 1.03E+03 9.76E+02 1.03E+03 1.06E+03 1.10E+03 1.03E+03 9.49E+02 10 1.33E+03 8.97E+02 9.81E+02 1.02E+03 8.88E+02 9.82E+02 1.12E+03 1.13E+03 1.38E+03 1.26E+03 1.03E+03 1.11E+03 20 1.11E+03 9.53E+02 1.03E+03 8.22E+02 9.52E+02 1.01E+03 1.28E+03 9.35E+02 1.44E+03 9.79E+02 1.12E+03 1.00E+03 30 1.10E+03 9.90E+02 9.96E+02 1.05E+03 1.21E+03 1.04E+03 1.01E+03 9.71E+02 8.86E+02 1.18E+03 1.01E+03 1.09E+03 50 1.52E+03 8.24E+02 8.71E+02 9.86E+02 1.19E+03 1.32E+03 1.11E+03 1.17E+03 1.59E+03 8.96E+02 1.07E+03 1.21E+03 60 1.57E+03 1.10E+03 1.05E+03 9.67E+02 1.16E+03 8.07E+02 1.18E+03 1.31E+03 1.08E+03 1.14E+03 1.05E+03 1.16E+03 70 1.45E+03 9.87E+02 9.31E+02 1.21E+03 1.15E+03 1.13E+03 9.66E+02 1.02E+03 1.12E+03 9.63E+02 8.72E+02 1.07E+03 1.03E+03 1.24E+02 1.37E+03 6.92E+02 1.02E+03 1.80E+02 1.52E+03 5.29E+02 9.75E+02 1.08E+02 1.27E+03 6.78E+02 1.07E+03 9.05E+01 1.32E+03 8.21E+02 1.08E+03 2.85E+02 1.86E+03 2.98E+02 1.17E+03 2.34E+02 1.81E+03 5.29E+02 1.15E+03 2.06E+02 1.71E+03 5.81E+02 1.04E+03 4.63E+01 1.17E+03 9.13E+02 1.50E+02 PASS 1.17E+03 1.54E+02 1.59E+03 7.53E+02 1.50E+02 PASS 1.13E+03 2.19E+02 1.73E+03 5.26E+02 1.50E+02 PASS 1.02E+03 1.07E+02 1.31E+03 7.24E+02 1.50E+02 PASS 1.22E+03 2.57E+02 1.92E+03 5.11E+02 1.00E+02 PASS 1.10E+03 1.86E+02 1.61E+03 5.94E+02 1.00E+02 PASS 1.04E+03 7.94E+01 1.26E+03 8.20E+02 1.00E+02 PASS An ISO 9001:2008 and DSCC Certified Company 37 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +5V, RL=open (V/mV) 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.16. Plot of Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 38 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.16. Raw data for Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +5V, RL=open (V/mV) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.38E+03 9.56E+02 1.21E+03 9.15E+02 9.57E+02 1.33E+03 1.19E+03 1.27E+03 1.21E+03 1.38E+03 1.12E+03 1.22E+03 10 1.27E+03 9.63E+02 1.02E+03 1.06E+03 1.12E+03 1.09E+03 1.23E+03 1.01E+03 1.19E+03 1.24E+03 1.01E+03 1.10E+03 20 1.23E+03 1.01E+03 1.01E+03 1.05E+03 9.88E+02 1.08E+03 1.01E+03 1.02E+03 1.15E+03 1.27E+03 1.22E+03 1.12E+03 30 1.32E+03 1.03E+03 1.08E+03 1.06E+03 1.14E+03 1.15E+03 9.98E+02 9.96E+02 1.31E+03 1.18E+03 9.57E+02 9.85E+02 50 1.35E+03 9.61E+02 1.03E+03 1.24E+03 1.06E+03 1.32E+03 1.18E+03 1.31E+03 1.28E+03 1.15E+03 9.45E+02 1.04E+03 60 1.43E+03 1.01E+03 9.82E+02 9.86E+02 1.33E+03 1.22E+03 1.13E+03 1.20E+03 1.04E+03 1.18E+03 9.21E+02 1.08E+03 70 1.10E+03 1.07E+03 9.17E+02 9.39E+02 1.35E+03 1.06E+03 1.27E+03 1.08E+03 1.08E+03 1.16E+03 1.12E+03 9.81E+02 1.08E+03 2.01E+02 1.63E+03 5.30E+02 1.09E+03 1.18E+02 1.41E+03 7.64E+02 1.06E+03 9.71E+01 1.32E+03 7.91E+02 1.13E+03 1.15E+02 1.44E+03 8.09E+02 1.13E+03 1.64E+02 1.58E+03 6.81E+02 1.15E+03 2.14E+02 1.73E+03 5.59E+02 1.08E+03 1.74E+02 1.55E+03 5.99E+02 1.28E+03 8.20E+01 1.50E+03 1.05E+03 1.50E+02 PASS 1.15E+03 9.65E+01 1.42E+03 8.88E+02 1.50E+02 PASS 1.11E+03 1.08E+02 1.40E+03 8.14E+02 1.50E+02 PASS 1.13E+03 1.33E+02 1.49E+03 7.64E+02 1.50E+02 PASS 1.25E+03 7.72E+01 1.46E+03 1.04E+03 1.00E+02 PASS 1.15E+03 6.93E+01 1.34E+03 9.63E+02 1.00E+02 PASS 1.13E+03 8.77E+01 1.37E+03 8.89E+02 1.00E+02 PASS An ISO 9001:2008 and DSCC Certified Company 39 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) 5.00E+03 4.00E+03 3.00E+03 2.00E+03 1.00E+03 0.00E+00 -1.00E+03 -2.00E+03 -3.00E+03 -4.00E+03 -5.00E+03 -6.00E+03 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.17. Plot of Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 40 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.17. Raw data for Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.35E+03 3.82E+03 7.03E+03 6.38E+03 2.37E+03 3.63E+03 2.10E+03 3.19E+03 2.60E+03 1.00E+04 1.00E+04 2.59E+03 10 2.03E+03 2.32E+03 6.11E+03 4.59E+03 2.76E+03 3.85E+03 1.90E+03 1.87E+03 3.22E+03 4.47E+03 4.27E+03 2.49E+03 24 hr Anneal 168 hr Anneal 20 1.05E+03 1.29E+03 3.08E+03 1.83E+03 1.54E+03 1.44E+03 1.29E+03 2.35E+03 2.30E+03 2.33E+03 7.06E+03 2.35E+03 30 9.14E+02 1.11E+03 2.17E+03 1.39E+03 1.30E+03 1.08E+03 1.08E+03 1.05E+03 1.59E+03 1.15E+03 9.36E+03 2.17E+03 50 5.84E+02 8.23E+02 1.08E+03 8.77E+02 8.38E+02 8.13E+02 8.55E+02 7.89E+02 7.63E+02 7.74E+02 9.64E+03 3.08E+03 60 5.83E+02 8.02E+02 1.40E+03 9.84E+02 8.08E+02 9.56E+02 8.21E+02 8.99E+02 8.78E+02 8.17E+02 1.00E+04 2.73E+03 70 8.54E+02 1.43E+03 1.95E+03 1.99E+03 1.04E+03 1.94E+03 1.30E+03 2.38E+03 1.54E+03 2.97E+03 1.00E+04 2.00E+03 4.19E+03 3.56E+03 1.76E+03 2.47E+03 1.74E+03 7.93E+02 1.10E+04 8.33E+03 3.93E+03 -2.57E+03 -1.20E+03 -4.18E+02 1.38E+03 4.81E+02 2.70E+03 6.18E+01 8.40E+02 1.76E+02 1.32E+03 3.59E+02 9.15E+02 3.04E+02 1.75E+03 7.99E+01 1.45E+03 5.16E+02 2.87E+03 3.71E+01 4.30E+03 3.06E+03 1.94E+03 3.24E+03 1.16E+03 5.29E+02 1.32E+04 6.25E+03 3.39E+03 -4.57E+03 -1.23E+02 4.92E+02 1.20E+02 1.20E+02 1.20E+02 PASS PASS PASS 1.19E+03 2.26E+02 1.81E+03 5.69E+02 5.00E+01 PASS 7.99E+02 3.68E+01 8.99E+02 6.98E+02 2.00E+01 PASS 8.74E+02 5.80E+01 1.03E+03 7.15E+02 2.00E+01 PASS 2.03E+03 6.70E+02 3.86E+03 1.90E+02 2.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 41 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) 3.50E+03 3.00E+03 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 -5.00E+02 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.18. Plot of Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 42 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.18. Raw data for Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 2.95E+03 3.23E+03 4.44E+03 2.78E+03 2.62E+03 1.91E+03 2.86E+03 1.68E+03 2.89E+03 3.24E+03 2.95E+03 2.78E+03 10 1.72E+03 2.67E+03 2.51E+03 1.87E+03 1.60E+03 1.71E+03 2.36E+03 1.54E+03 1.98E+03 1.96E+03 3.37E+03 3.18E+03 20 1.42E+03 1.51E+03 1.35E+03 1.69E+03 1.50E+03 1.44E+03 1.85E+03 1.37E+03 1.09E+03 1.70E+03 1.85E+03 3.21E+03 30 9.68E+02 1.13E+03 1.09E+03 1.07E+03 1.04E+03 8.87E+02 1.17E+03 8.36E+02 9.37E+02 1.10E+03 2.09E+03 4.46E+03 50 5.87E+02 7.06E+02 7.43E+02 8.52E+02 6.77E+02 7.02E+02 8.97E+02 5.64E+02 5.96E+02 8.34E+02 2.11E+03 5.07E+03 60 6.33E+02 9.71E+02 7.80E+02 9.07E+02 6.75E+02 6.23E+02 9.98E+02 7.23E+02 7.79E+02 8.76E+02 2.19E+03 5.25E+03 70 1.05E+03 2.00E+03 1.07E+03 1.47E+03 8.22E+02 9.78E+02 2.28E+03 1.16E+03 1.21E+03 1.38E+03 2.55E+03 3.03E+03 3.20E+03 7.28E+02 5.20E+03 1.21E+03 2.07E+03 4.83E+02 3.40E+03 7.48E+02 1.50E+03 1.27E+02 1.84E+03 1.15E+03 1.06E+03 5.98E+01 1.22E+03 8.95E+02 7.13E+02 9.69E+01 9.79E+02 4.47E+02 7.93E+02 1.45E+02 1.19E+03 3.95E+02 1.28E+03 4.64E+02 2.56E+03 1.15E+01 2.52E+03 6.77E+02 4.37E+03 6.60E+02 1.20E+02 PASS 1.91E+03 3.10E+02 2.76E+03 1.06E+03 1.20E+02 PASS 1.49E+03 2.97E+02 2.30E+03 6.76E+02 1.20E+02 PASS 9.86E+02 1.42E+02 1.38E+03 5.96E+02 5.00E+01 PASS 7.19E+02 1.45E+02 1.12E+03 3.20E+02 2.00E+01 PASS 8.00E+02 1.44E+02 1.19E+03 4.06E+02 2.00E+01 PASS 1.40E+03 5.11E+02 2.80E+03 ######## 2.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 43 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 1 @ +5V RL=open (V) 1.40E-02 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.19. Plot of Output Voltage Low 1 @ +5V RL=open (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 44 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.19. Raw data for Output Voltage Low 1 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +5V RL=open (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.61E-03 4.18E-03 4.40E-03 4.13E-03 4.06E-03 4.60E-03 4.21E-03 4.35E-03 4.23E-03 4.50E-03 4.04E-03 4.29E-03 10 4.45E-03 3.76E-03 4.38E-03 3.81E-03 4.56E-03 3.96E-03 4.53E-03 4.14E-03 4.46E-03 4.48E-03 4.46E-03 3.97E-03 20 4.33E-03 3.81E-03 4.24E-03 4.18E-03 4.73E-03 4.45E-03 4.46E-03 4.58E-03 4.65E-03 4.53E-03 4.40E-03 4.34E-03 30 4.24E-03 4.38E-03 4.50E-03 4.36E-03 4.45E-03 4.24E-03 4.72E-03 4.85E-03 4.75E-03 4.73E-03 4.90E-03 4.24E-03 50 4.85E-03 4.60E-03 4.99E-03 4.95E-03 4.36E-03 4.97E-03 5.04E-03 5.36E-03 4.97E-03 4.72E-03 3.99E-03 4.29E-03 60 4.85E-03 4.21E-03 4.55E-03 4.36E-03 4.77E-03 4.78E-03 4.82E-03 4.82E-03 4.92E-03 4.83E-03 4.51E-03 3.84E-03 70 4.46E-03 4.40E-03 4.43E-03 4.90E-03 4.08E-03 4.82E-03 4.78E-03 4.97E-03 4.66E-03 4.34E-03 4.60E-03 4.11E-03 4.28E-03 2.26E-04 4.90E-03 3.66E-03 4.19E-03 3.77E-04 5.23E-03 3.16E-03 4.26E-03 3.30E-04 5.16E-03 3.35E-03 4.39E-03 9.89E-05 4.66E-03 4.11E-03 4.75E-03 2.66E-04 5.48E-03 4.02E-03 4.55E-03 2.69E-04 5.29E-03 3.81E-03 4.45E-03 2.93E-04 5.26E-03 3.65E-03 4.38E-03 1.70E-04 4.84E-03 3.91E-03 6.00E-03 PASS 4.31E-03 2.51E-04 5.00E-03 3.63E-03 6.00E-03 PASS 4.53E-03 8.38E-05 4.76E-03 4.30E-03 6.00E-03 PASS 4.66E-03 2.39E-04 5.31E-03 4.00E-03 9.00E-03 PASS 5.01E-03 2.29E-04 5.64E-03 4.38E-03 1.30E-02 PASS 4.83E-03 5.18E-05 4.98E-03 4.69E-03 1.30E-02 PASS 4.71E-03 2.37E-04 5.36E-03 4.07E-03 1.30E-02 PASS An ISO 9001:2008 and DSCC Certified Company 45 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 2 @ +5V RL=open (V) 1.40E-02 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.20. Plot of Output Voltage Low 2 @ +5V RL=open (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 46 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.20. Raw data for Output Voltage Low 2 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +5V RL=open (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.24E-03 4.43E-03 4.45E-03 3.99E-03 4.14E-03 3.99E-03 4.01E-03 4.46E-03 4.04E-03 3.97E-03 4.16E-03 3.65E-03 10 4.38E-03 4.26E-03 4.43E-03 4.21E-03 4.04E-03 4.39E-03 4.19E-03 4.33E-03 4.41E-03 4.61E-03 4.13E-03 4.28E-03 20 4.23E-03 4.41E-03 4.66E-03 4.45E-03 4.53E-03 4.53E-03 4.55E-03 4.71E-03 4.38E-03 4.43E-03 4.09E-03 4.31E-03 30 4.36E-03 4.55E-03 4.33E-03 4.43E-03 4.53E-03 4.72E-03 4.61E-03 4.72E-03 4.63E-03 4.65E-03 4.11E-03 4.56E-03 50 4.45E-03 4.50E-03 4.43E-03 4.85E-03 4.40E-03 5.07E-03 5.05E-03 4.73E-03 5.15E-03 4.85E-03 4.65E-03 4.46E-03 60 4.18E-03 4.51E-03 4.51E-03 4.24E-03 4.46E-03 4.80E-03 4.70E-03 4.80E-03 4.73E-03 4.82E-03 4.35E-03 4.19E-03 70 4.46E-03 4.55E-03 3.84E-03 3.92E-03 4.48E-03 3.86E-03 3.87E-03 4.43E-03 4.68E-03 4.63E-03 4.09E-03 4.01E-03 4.25E-03 1.95E-04 4.78E-03 3.72E-03 4.26E-03 1.53E-04 4.68E-03 3.84E-03 4.46E-03 1.58E-04 4.89E-03 4.02E-03 4.44E-03 9.85E-05 4.71E-03 4.17E-03 4.53E-03 1.85E-04 5.03E-03 4.02E-03 4.38E-03 1.58E-04 4.81E-03 3.95E-03 4.25E-03 3.41E-04 5.18E-03 3.32E-03 4.09E-03 2.06E-04 4.66E-03 3.53E-03 6.00E-03 PASS 4.39E-03 1.52E-04 4.80E-03 3.97E-03 6.00E-03 PASS 4.52E-03 1.27E-04 4.87E-03 4.17E-03 6.00E-03 PASS 4.67E-03 5.13E-05 4.81E-03 4.53E-03 9.00E-03 PASS 4.97E-03 1.74E-04 5.45E-03 4.49E-03 1.30E-02 PASS 4.77E-03 5.20E-05 4.91E-03 4.63E-03 1.30E-02 PASS 4.29E-03 4.03E-04 5.40E-03 3.19E-03 1.30E-02 PASS An ISO 9001:2008 and DSCC Certified Company 47 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 1 @ +5V RL=2kΩ (V) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.21. Plot of Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 48 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.21. Raw data for Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +5V RL=2kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 9.40E-04 1.25E-03 1.00E-03 1.18E-03 1.04E-03 9.10E-04 9.80E-04 9.20E-04 1.12E-03 9.40E-04 1.05E-03 1.12E-03 10 8.30E-04 1.13E-03 1.18E-03 1.24E-03 1.02E-03 1.08E-03 9.90E-04 1.09E-03 1.16E-03 9.80E-04 1.03E-03 1.10E-03 20 7.80E-04 1.31E-03 1.09E-03 9.20E-04 8.90E-04 9.90E-04 8.70E-04 1.05E-03 1.05E-03 9.20E-04 1.19E-03 9.10E-04 30 9.60E-04 1.10E-03 1.08E-03 1.09E-03 9.90E-04 1.01E-03 1.14E-03 8.80E-04 9.50E-04 1.06E-03 8.80E-04 1.06E-03 50 7.30E-04 1.15E-03 8.80E-04 8.70E-04 9.40E-04 9.80E-04 9.50E-04 1.05E-03 8.70E-04 9.20E-04 1.01E-03 1.09E-03 60 7.10E-04 1.07E-03 9.90E-04 1.06E-03 9.90E-04 9.40E-04 8.60E-04 8.60E-04 1.01E-03 9.70E-04 1.00E-03 1.13E-03 70 8.80E-04 8.30E-04 1.01E-03 1.07E-03 8.80E-04 9.00E-04 1.03E-03 7.40E-04 9.70E-04 8.50E-04 1.09E-03 1.17E-03 1.08E-03 1.29E-04 1.44E-03 7.29E-04 1.08E-03 1.61E-04 1.52E-03 6.37E-04 9.98E-04 2.07E-04 1.57E-03 4.31E-04 1.04E-03 6.43E-05 1.22E-03 8.68E-04 9.14E-04 1.53E-04 1.33E-03 4.95E-04 9.64E-04 1.47E-04 1.37E-03 5.61E-04 9.34E-04 1.01E-04 1.21E-03 6.57E-04 9.74E-04 8.59E-05 1.21E-03 7.38E-04 2.00E-03 PASS 1.06E-03 7.52E-05 1.27E-03 8.54E-04 2.00E-03 PASS 9.76E-04 7.99E-05 1.20E-03 7.57E-04 2.00E-03 PASS 1.01E-03 9.98E-05 1.28E-03 7.34E-04 2.00E-03 PASS 9.54E-04 6.73E-05 1.14E-03 7.69E-04 2.00E-03 PASS 9.28E-04 6.69E-05 1.11E-03 7.45E-04 2.00E-03 PASS 8.98E-04 1.12E-04 1.20E-03 5.92E-04 2.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 49 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 2 @ +5V RL=2kΩ (V) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.22. Plot of Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 50 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.22. Raw data for Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +5V RL=2kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.11E-03 8.40E-04 9.90E-04 1.00E-03 1.03E-03 8.30E-04 1.14E-03 9.90E-04 1.15E-03 1.07E-03 1.06E-03 1.06E-03 10 1.15E-03 1.11E-03 1.10E-03 1.00E-03 9.90E-04 1.04E-03 1.13E-03 9.80E-04 9.90E-04 1.16E-03 1.08E-03 1.13E-03 20 1.11E-03 9.80E-04 9.10E-04 1.00E-03 1.00E-03 8.30E-04 1.01E-03 1.03E-03 8.00E-04 1.04E-03 9.90E-04 1.14E-03 30 9.70E-04 9.30E-04 8.00E-04 8.00E-04 9.30E-04 7.00E-04 9.60E-04 1.02E-03 1.04E-03 8.40E-04 1.11E-03 9.80E-04 50 7.80E-04 8.40E-04 9.20E-04 9.50E-04 9.00E-04 8.20E-04 8.80E-04 8.00E-04 9.40E-04 8.40E-04 8.60E-04 7.20E-04 60 8.40E-04 7.80E-04 8.80E-04 7.60E-04 7.50E-04 7.30E-04 1.02E-03 9.70E-04 9.60E-04 8.10E-04 1.12E-03 1.05E-03 70 7.30E-04 9.50E-04 7.60E-04 7.90E-04 7.70E-04 8.20E-04 8.40E-04 1.03E-03 1.03E-03 9.40E-04 8.30E-04 9.30E-04 9.94E-04 9.81E-05 1.26E-03 7.25E-04 1.07E-03 7.11E-05 1.26E-03 8.75E-04 1.00E-03 7.18E-05 1.20E-03 8.03E-04 8.86E-04 8.02E-05 1.11E-03 6.66E-04 8.78E-04 6.80E-05 1.06E-03 6.92E-04 8.02E-04 5.59E-05 9.55E-04 6.49E-04 8.00E-04 8.66E-05 1.04E-03 5.63E-04 1.04E-03 1.32E-04 1.40E-03 6.75E-04 2.00E-03 PASS 1.06E-03 8.15E-05 1.28E-03 8.36E-04 2.00E-03 PASS 9.42E-04 1.17E-04 1.26E-03 6.21E-04 2.00E-03 PASS 9.12E-04 1.42E-04 1.30E-03 5.23E-04 2.00E-03 PASS 8.56E-04 5.55E-05 1.01E-03 7.04E-04 2.00E-03 PASS 8.98E-04 1.22E-04 1.23E-03 5.63E-04 2.00E-03 PASS 9.32E-04 1.00E-04 1.21E-03 6.57E-04 2.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 51 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 1 @ +5V IL=100uA (V) 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.23. Plot of Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 52 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.23. Raw data for Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +5V IL=100uA (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.03E-02 7.69E-02 7.83E-02 7.88E-02 7.90E-02 8.05E-02 7.86E-02 8.02E-02 7.97E-02 7.92E-02 8.00E-02 7.91E-02 10 8.16E-02 7.88E-02 7.95E-02 8.08E-02 8.08E-02 8.22E-02 8.04E-02 8.22E-02 8.13E-02 8.08E-02 8.03E-02 7.99E-02 20 8.34E-02 8.03E-02 8.05E-02 8.16E-02 8.16E-02 8.43E-02 8.19E-02 8.35E-02 8.25E-02 8.23E-02 8.07E-02 7.97E-02 30 8.46E-02 8.10E-02 8.22E-02 8.28E-02 8.25E-02 8.49E-02 8.27E-02 8.46E-02 8.37E-02 8.35E-02 8.08E-02 7.97E-02 50 8.64E-02 8.29E-02 8.43E-02 8.44E-02 8.49E-02 8.69E-02 8.48E-02 8.73E-02 8.65E-02 8.57E-02 8.11E-02 7.98E-02 60 8.67E-02 8.31E-02 8.39E-02 8.48E-02 8.49E-02 8.65E-02 8.43E-02 8.64E-02 8.53E-02 8.56E-02 8.03E-02 7.97E-02 70 8.72E-02 8.30E-02 8.35E-02 8.47E-02 8.45E-02 8.53E-02 8.31E-02 8.48E-02 8.42E-02 8.40E-02 8.05E-02 8.02E-02 7.87E-02 1.21E-03 8.20E-02 7.53E-02 8.03E-02 1.10E-03 8.33E-02 7.73E-02 8.15E-02 1.27E-03 8.49E-02 7.80E-02 8.26E-02 1.29E-03 8.61E-02 7.91E-02 8.46E-02 1.29E-03 8.81E-02 8.11E-02 8.47E-02 1.35E-03 8.84E-02 8.10E-02 8.46E-02 1.61E-03 8.90E-02 8.02E-02 7.96E-02 7.69E-04 8.17E-02 7.75E-02 1.30E-01 PASS 8.14E-02 8.13E-04 8.36E-02 7.91E-02 1.30E-01 PASS 8.29E-02 9.53E-04 8.55E-02 8.03E-02 1.30E-01 PASS 8.39E-02 9.01E-04 8.63E-02 8.14E-02 1.40E-01 PASS 8.62E-02 1.00E-03 8.90E-02 8.35E-02 1.50E-01 PASS 8.56E-02 8.97E-04 8.81E-02 8.31E-02 1.50E-01 PASS 8.43E-02 8.34E-04 8.66E-02 8.20E-02 1.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 53 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 2 @ +5V IL=100uA (V) 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.24. Plot of Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 54 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.24. Raw data for Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +5V IL=100uA (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.89E-02 8.08E-02 7.90E-02 8.08E-02 8.03E-02 8.08E-02 7.97E-02 7.93E-02 7.83E-02 7.92E-02 7.96E-02 7.92E-02 10 8.03E-02 8.22E-02 8.11E-02 8.21E-02 8.14E-02 8.29E-02 8.13E-02 8.13E-02 8.01E-02 8.14E-02 7.99E-02 8.00E-02 20 8.17E-02 8.33E-02 8.19E-02 8.34E-02 8.27E-02 8.45E-02 8.24E-02 8.27E-02 8.10E-02 8.22E-02 8.03E-02 8.00E-02 30 8.27E-02 8.42E-02 8.33E-02 8.51E-02 8.38E-02 8.50E-02 8.36E-02 8.43E-02 8.26E-02 8.35E-02 8.04E-02 7.96E-02 50 8.50E-02 8.67E-02 8.59E-02 8.69E-02 8.63E-02 8.75E-02 8.60E-02 8.64E-02 8.47E-02 8.63E-02 7.96E-02 8.01E-02 60 8.51E-02 8.66E-02 8.51E-02 8.66E-02 8.57E-02 8.71E-02 8.54E-02 8.53E-02 8.43E-02 8.57E-02 7.99E-02 8.00E-02 70 8.55E-02 8.68E-02 8.58E-02 8.60E-02 8.63E-02 8.57E-02 8.42E-02 8.40E-02 8.31E-02 8.39E-02 8.01E-02 8.01E-02 7.99E-02 9.26E-04 8.25E-02 7.74E-02 8.14E-02 7.69E-04 8.35E-02 7.93E-02 8.26E-02 7.77E-04 8.47E-02 8.05E-02 8.38E-02 9.32E-04 8.64E-02 8.13E-02 8.62E-02 7.46E-04 8.82E-02 8.41E-02 8.58E-02 7.74E-04 8.79E-02 8.37E-02 8.61E-02 4.96E-04 8.75E-02 8.47E-02 7.94E-02 8.93E-04 8.19E-02 7.70E-02 1.30E-01 PASS 8.14E-02 1.02E-03 8.42E-02 7.86E-02 1.30E-01 PASS 8.26E-02 1.29E-03 8.61E-02 7.90E-02 1.30E-01 PASS 8.38E-02 9.12E-04 8.63E-02 8.13E-02 1.40E-01 PASS 8.62E-02 1.00E-03 8.89E-02 8.34E-02 1.50E-01 PASS 8.56E-02 1.02E-03 8.84E-02 8.28E-02 1.50E-01 PASS 8.42E-02 9.51E-04 8.68E-02 8.16E-02 1.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 55 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +5V RL=open (V) 4.38E+00 4.36E+00 4.34E+00 4.32E+00 4.30E+00 4.28E+00 4.26E+00 4.24E+00 4.22E+00 4.20E+00 4.18E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.25. Plot of Output Voltage High 1 @ +5V RL=open (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 56 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.25. Raw data for Output Voltage High 1 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +5V RL=open (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.34E+00 4.33E+00 4.33E+00 4.33E+00 4.34E+00 4.34E+00 4.33E+00 4.34E+00 4.34E+00 4.34E+00 4.34E+00 4.33E+00 10 4.34E+00 4.34E+00 4.34E+00 4.34E+00 4.34E+00 4.35E+00 4.34E+00 4.35E+00 4.34E+00 4.35E+00 4.34E+00 4.34E+00 20 4.35E+00 4.34E+00 4.34E+00 4.35E+00 4.35E+00 4.36E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.34E+00 30 4.35E+00 4.34E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.36E+00 4.35E+00 4.35E+00 4.35E+00 4.34E+00 50 4.36E+00 4.34E+00 4.35E+00 4.35E+00 4.36E+00 4.36E+00 4.35E+00 4.36E+00 4.35E+00 4.36E+00 4.34E+00 4.34E+00 60 4.36E+00 4.34E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.34E+00 4.34E+00 70 4.36E+00 4.35E+00 4.35E+00 4.35E+00 4.36E+00 4.36E+00 4.35E+00 4.36E+00 4.35E+00 4.35E+00 4.35E+00 4.34E+00 4.33E+00 3.05E-03 4.34E+00 4.33E+00 4.34E+00 3.36E-03 4.35E+00 4.33E+00 4.34E+00 3.54E-03 4.35E+00 4.33E+00 4.35E+00 4.51E-03 4.36E+00 4.34E+00 4.35E+00 4.72E-03 4.36E+00 4.34E+00 4.35E+00 4.47E-03 4.36E+00 4.34E+00 4.35E+00 5.18E-03 4.37E+00 4.34E+00 4.34E+00 1.87E-03 4.34E+00 4.33E+00 4.20E+00 PASS 4.34E+00 2.17E-03 4.35E+00 4.34E+00 4.20E+00 PASS 4.35E+00 4.87E-03 4.36E+00 4.34E+00 4.20E+00 PASS 4.35E+00 3.05E-03 4.36E+00 4.34E+00 4.20E+00 PASS 4.36E+00 2.68E-03 4.36E+00 4.35E+00 4.20E+00 PASS 4.35E+00 2.55E-03 4.36E+00 4.35E+00 4.20E+00 PASS 4.35E+00 1.79E-03 4.36E+00 4.35E+00 4.20E+00 PASS An ISO 9001:2008 and DSCC Certified Company 57 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +5V RL=open (V) 4.38E+00 4.36E+00 4.34E+00 4.32E+00 4.30E+00 4.28E+00 4.26E+00 4.24E+00 4.22E+00 4.20E+00 4.18E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.26. Plot of Output Voltage High 2 @ +5V RL=open (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 58 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.26. Raw data for Output Voltage High 2 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +5V RL=open (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.33E+00 4.34E+00 4.33E+00 4.34E+00 4.33E+00 4.34E+00 4.33E+00 4.33E+00 4.33E+00 4.33E+00 4.33E+00 4.33E+00 10 4.34E+00 4.34E+00 4.34E+00 4.35E+00 4.34E+00 4.34E+00 4.34E+00 4.34E+00 4.34E+00 4.34E+00 4.34E+00 4.34E+00 20 4.34E+00 4.35E+00 4.34E+00 4.35E+00 4.35E+00 4.36E+00 4.35E+00 4.35E+00 4.34E+00 4.35E+00 4.34E+00 4.34E+00 30 4.34E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.34E+00 4.35E+00 4.34E+00 4.34E+00 50 4.35E+00 4.35E+00 4.35E+00 4.36E+00 4.35E+00 4.36E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.34E+00 4.34E+00 60 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.34E+00 4.35E+00 4.34E+00 4.34E+00 70 4.35E+00 4.36E+00 4.35E+00 4.36E+00 4.36E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.34E+00 4.34E+00 4.33E+00 2.30E-03 4.34E+00 4.33E+00 4.34E+00 3.36E-03 4.35E+00 4.33E+00 4.34E+00 2.41E-03 4.35E+00 4.34E+00 4.35E+00 4.04E-03 4.36E+00 4.34E+00 4.35E+00 2.70E-03 4.36E+00 4.35E+00 4.35E+00 2.30E-03 4.36E+00 4.34E+00 4.35E+00 2.00E-03 4.36E+00 4.35E+00 4.33E+00 2.59E-03 4.34E+00 4.33E+00 4.20E+00 PASS 4.34E+00 2.74E-03 4.35E+00 4.33E+00 4.20E+00 PASS 4.35E+00 5.36E-03 4.36E+00 4.33E+00 4.20E+00 PASS 4.35E+00 3.03E-03 4.36E+00 4.34E+00 4.20E+00 PASS 4.35E+00 2.97E-03 4.36E+00 4.34E+00 4.20E+00 PASS 4.35E+00 3.13E-03 4.36E+00 4.34E+00 4.20E+00 PASS 4.35E+00 2.74E-03 4.36E+00 4.34E+00 4.20E+00 PASS An ISO 9001:2008 and DSCC Certified Company 59 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +5V RL=2kΩ (V) 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.27. Plot of Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 60 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.27. Raw data for Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +5V RL=2kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 3.95E+00 3.97E+00 3.96E+00 3.97E+00 3.96E+00 3.95E+00 3.96E+00 3.96E+00 3.96E+00 3.96E+00 3.97E+00 3.95E+00 10 3.95E+00 3.97E+00 3.96E+00 3.97E+00 3.96E+00 3.95E+00 3.96E+00 3.96E+00 3.96E+00 3.96E+00 3.97E+00 3.96E+00 20 3.95E+00 3.97E+00 3.96E+00 3.97E+00 3.96E+00 3.96E+00 3.96E+00 3.96E+00 3.96E+00 3.96E+00 3.97E+00 3.96E+00 30 3.95E+00 3.97E+00 3.96E+00 3.97E+00 3.96E+00 3.95E+00 3.96E+00 3.96E+00 3.96E+00 3.96E+00 3.97E+00 3.96E+00 50 3.95E+00 3.96E+00 3.96E+00 3.96E+00 3.96E+00 3.95E+00 3.95E+00 3.96E+00 3.96E+00 3.95E+00 3.97E+00 3.96E+00 60 3.95E+00 3.96E+00 3.96E+00 3.96E+00 3.95E+00 3.95E+00 3.95E+00 3.95E+00 3.96E+00 3.95E+00 3.97E+00 3.96E+00 70 3.95E+00 3.97E+00 3.97E+00 3.97E+00 3.96E+00 3.95E+00 3.96E+00 3.96E+00 3.96E+00 3.96E+00 3.97E+00 3.96E+00 3.96E+00 6.07E-03 3.98E+00 3.94E+00 3.96E+00 6.66E-03 3.98E+00 3.94E+00 3.96E+00 6.66E-03 3.98E+00 3.94E+00 3.96E+00 7.53E-03 3.98E+00 3.94E+00 3.96E+00 7.46E-03 3.98E+00 3.94E+00 3.96E+00 7.09E-03 3.98E+00 3.94E+00 3.96E+00 6.88E-03 3.98E+00 3.94E+00 3.96E+00 3.77E-03 3.97E+00 3.95E+00 3.50E+00 PASS 3.96E+00 3.77E-03 3.97E+00 3.95E+00 3.50E+00 PASS 3.96E+00 2.17E-03 3.97E+00 3.95E+00 3.50E+00 PASS 3.96E+00 3.70E-03 3.97E+00 3.95E+00 3.50E+00 PASS 3.95E+00 3.65E-03 3.96E+00 3.94E+00 3.50E+00 PASS 3.95E+00 3.70E-03 3.96E+00 3.94E+00 3.50E+00 PASS 3.96E+00 3.81E-03 3.97E+00 3.95E+00 3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 61 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +5V RL=2kΩ (V) 4.10E+00 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.28. Plot of Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 62 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.28. Raw data for Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +5V RL=2kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 3.98E+00 3.99E+00 3.99E+00 3.99E+00 3.98E+00 3.98E+00 3.98E+00 3.98E+00 3.99E+00 3.98E+00 3.99E+00 3.98E+00 10 3.98E+00 3.99E+00 3.99E+00 3.99E+00 3.98E+00 3.98E+00 3.98E+00 3.99E+00 3.99E+00 3.98E+00 3.99E+00 3.98E+00 20 3.98E+00 3.99E+00 3.99E+00 3.99E+00 3.98E+00 3.98E+00 3.98E+00 3.99E+00 3.99E+00 3.98E+00 4.00E+00 3.98E+00 30 3.98E+00 3.99E+00 3.99E+00 3.99E+00 3.98E+00 3.98E+00 3.98E+00 3.99E+00 3.99E+00 3.98E+00 4.00E+00 3.98E+00 50 3.97E+00 3.99E+00 3.99E+00 3.99E+00 3.98E+00 3.97E+00 3.98E+00 3.98E+00 3.98E+00 3.98E+00 4.00E+00 3.98E+00 60 3.97E+00 3.99E+00 3.98E+00 3.98E+00 3.98E+00 3.97E+00 3.98E+00 3.98E+00 3.98E+00 3.98E+00 3.99E+00 3.98E+00 70 3.98E+00 3.99E+00 3.99E+00 3.99E+00 3.99E+00 3.98E+00 3.98E+00 3.99E+00 3.99E+00 3.98E+00 4.00E+00 3.99E+00 3.99E+00 4.80E-03 4.00E+00 3.97E+00 3.99E+00 5.22E-03 4.00E+00 3.97E+00 3.99E+00 4.97E-03 4.00E+00 3.97E+00 3.99E+00 6.53E-03 4.00E+00 3.97E+00 3.98E+00 6.02E-03 4.00E+00 3.97E+00 3.98E+00 5.55E-03 4.00E+00 3.97E+00 3.99E+00 5.55E-03 4.00E+00 3.97E+00 3.98E+00 3.90E-03 3.99E+00 3.97E+00 3.50E+00 PASS 3.98E+00 3.74E-03 3.99E+00 3.97E+00 3.50E+00 PASS 3.98E+00 2.30E-03 3.99E+00 3.98E+00 3.50E+00 PASS 3.98E+00 4.15E-03 3.99E+00 3.97E+00 3.50E+00 PASS 3.98E+00 3.65E-03 3.99E+00 3.97E+00 3.50E+00 PASS 3.98E+00 3.63E-03 3.99E+00 3.97E+00 3.50E+00 PASS 3.98E+00 4.09E-03 3.99E+00 3.97E+00 3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 63 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Slew Rate 1 @ +5V (V/us) 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.29. Plot of Positive Slew Rate 1 @ +5V (V/us) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 64 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.29. Raw data for Positive Slew Rate 1 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 1 @ +5V (V/us) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.10E-02 9.70E-02 9.60E-02 9.70E-02 9.20E-02 9.20E-02 1.00E-01 9.40E-02 9.90E-02 9.80E-02 9.60E-02 9.50E-02 10 9.00E-02 9.60E-02 9.50E-02 9.50E-02 9.00E-02 9.10E-02 9.60E-02 9.40E-02 9.60E-02 9.50E-02 9.70E-02 9.50E-02 20 8.80E-02 9.40E-02 9.30E-02 9.40E-02 8.80E-02 8.90E-02 9.50E-02 9.20E-02 9.60E-02 9.40E-02 9.80E-02 9.70E-02 30 8.70E-02 9.30E-02 9.20E-02 9.30E-02 8.70E-02 8.60E-02 9.20E-02 8.90E-02 9.30E-02 9.30E-02 9.70E-02 9.60E-02 50 8.10E-02 8.80E-02 8.90E-02 8.90E-02 8.30E-02 8.30E-02 8.90E-02 8.50E-02 8.80E-02 8.70E-02 9.80E-02 9.60E-02 60 8.30E-02 8.90E-02 8.80E-02 8.90E-02 8.30E-02 8.30E-02 8.90E-02 8.50E-02 9.00E-02 8.80E-02 9.70E-02 9.60E-02 70 8.40E-02 9.10E-02 9.00E-02 9.10E-02 8.60E-02 8.80E-02 9.30E-02 9.00E-02 9.30E-02 9.10E-02 9.70E-02 9.60E-02 9.46E-02 2.88E-03 1.02E-01 8.67E-02 9.32E-02 2.95E-03 1.01E-01 8.51E-02 9.14E-02 3.13E-03 1.00E-01 8.28E-02 9.04E-02 3.13E-03 9.90E-02 8.18E-02 8.60E-02 3.74E-03 9.63E-02 7.57E-02 8.64E-02 3.13E-03 9.50E-02 7.78E-02 8.84E-02 3.21E-03 9.72E-02 7.96E-02 9.66E-02 3.44E-03 1.06E-01 8.72E-02 4.00E-02 PASS 9.44E-02 2.07E-03 1.00E-01 8.87E-02 4.00E-02 PASS 9.32E-02 2.77E-03 1.01E-01 8.56E-02 4.00E-02 PASS 9.06E-02 3.05E-03 9.90E-02 8.22E-02 3.00E-02 PASS 8.64E-02 2.41E-03 9.30E-02 7.98E-02 2.00E-02 PASS 8.70E-02 2.92E-03 9.50E-02 7.90E-02 2.00E-02 PASS 9.10E-02 2.12E-03 9.68E-02 8.52E-02 2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 65 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Slew Rate 2 @ +5V (V/us) 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.30. Plot of Positive Slew Rate 2 @ +5V (V/us) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 66 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.30. Raw data for Positive Slew Rate 2 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 2 @ +5V (V/us) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.20E-02 9.80E-02 9.70E-02 9.80E-02 9.20E-02 9.20E-02 9.80E-02 9.40E-02 9.80E-02 9.70E-02 9.70E-02 9.60E-02 10 9.10E-02 9.60E-02 9.50E-02 9.60E-02 9.00E-02 9.10E-02 9.60E-02 9.30E-02 9.80E-02 9.60E-02 9.70E-02 9.50E-02 20 8.90E-02 9.50E-02 9.30E-02 9.40E-02 8.80E-02 8.90E-02 9.50E-02 9.10E-02 9.50E-02 9.40E-02 9.80E-02 9.50E-02 30 8.70E-02 9.30E-02 9.20E-02 9.30E-02 8.70E-02 8.70E-02 9.20E-02 9.00E-02 9.30E-02 9.20E-02 9.80E-02 9.50E-02 50 8.30E-02 8.80E-02 8.80E-02 8.80E-02 8.30E-02 8.40E-02 8.80E-02 8.40E-02 8.90E-02 8.70E-02 9.80E-02 9.60E-02 60 8.40E-02 9.00E-02 8.80E-02 9.00E-02 8.40E-02 8.40E-02 8.90E-02 8.50E-02 9.00E-02 9.00E-02 9.90E-02 9.40E-02 70 8.60E-02 9.10E-02 9.00E-02 9.20E-02 8.60E-02 8.80E-02 9.40E-02 9.00E-02 9.40E-02 9.30E-02 9.80E-02 9.60E-02 9.54E-02 3.13E-03 1.04E-01 8.68E-02 9.36E-02 2.88E-03 1.01E-01 8.57E-02 9.18E-02 3.11E-03 1.00E-01 8.33E-02 9.04E-02 3.13E-03 9.90E-02 8.18E-02 8.60E-02 2.74E-03 9.35E-02 7.85E-02 8.72E-02 3.03E-03 9.55E-02 7.89E-02 8.90E-02 2.83E-03 9.68E-02 8.12E-02 9.58E-02 2.68E-03 1.03E-01 8.84E-02 4.00E-02 PASS 9.48E-02 2.77E-03 1.02E-01 8.72E-02 4.00E-02 PASS 9.28E-02 2.68E-03 1.00E-01 8.54E-02 4.00E-02 PASS 9.08E-02 2.39E-03 9.73E-02 8.43E-02 3.00E-02 PASS 8.64E-02 2.30E-03 9.27E-02 8.01E-02 2.00E-02 PASS 8.76E-02 2.88E-03 9.55E-02 7.97E-02 2.00E-02 PASS 9.18E-02 2.68E-03 9.92E-02 8.44E-02 2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 67 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 0.00E+00 Negative Slew Rate 1 @ +5V (V/us) -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 -8.00E-02 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.31. Plot of Negative Slew Rate 1 @ +5V (V/us) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 68 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.31. Raw data for Negative Slew Rate 1 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 1 @ +5V (V/us) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -5.60E-02 -5.80E-02 -5.80E-02 -5.80E-02 -5.60E-02 -5.70E-02 -5.80E-02 -5.70E-02 -5.90E-02 -5.70E-02 -5.80E-02 -5.60E-02 10 -5.60E-02 -5.90E-02 -5.90E-02 -5.90E-02 -5.60E-02 -5.50E-02 -6.00E-02 -5.90E-02 -6.00E-02 -5.90E-02 -5.90E-02 -5.80E-02 20 -5.40E-02 -6.20E-02 -5.90E-02 -5.90E-02 -5.50E-02 -5.60E-02 -5.00E-02 -5.70E-02 -5.90E-02 -6.00E-02 -6.00E-02 -5.70E-02 30 -5.40E-02 -6.30E-02 -5.80E-02 -5.90E-02 -5.50E-02 -5.60E-02 -6.00E-02 -5.70E-02 -5.90E-02 -5.90E-02 -6.00E-02 -5.90E-02 50 -5.30E-02 -5.30E-02 -5.80E-02 -5.80E-02 -5.70E-02 -5.40E-02 -6.00E-02 -5.60E-02 -5.90E-02 -6.00E-02 -6.00E-02 -5.80E-02 24 hr Anneal 168 hr Anneal 60 -5.40E-02 -6.50E-02 -6.20E-02 -6.10E-02 -5.70E-02 -5.60E-02 -6.10E-02 -5.80E-02 -6.00E-02 -5.90E-02 -6.00E-02 -5.80E-02 70 -5.50E-02 -6.70E-02 -6.40E-02 -6.20E-02 -5.90E-02 -5.80E-02 -6.20E-02 -6.00E-02 -6.20E-02 -6.20E-02 -6.00E-02 -6.00E-02 -5.72E-02 -5.78E-02 -5.78E-02 -5.78E-02 -5.58E-02 -5.98E-02 -6.14E-02 1.10E-03 1.64E-03 3.27E-03 3.56E-03 2.59E-03 4.32E-03 4.62E-03 -5.42E-02 -5.33E-02 -4.88E-02 -4.80E-02 -4.87E-02 -4.79E-02 -4.87E-02 -6.02E-02 -6.23E-02 -6.68E-02 -6.76E-02 -6.29E-02 -7.17E-02 -7.41E-02 -5.76E-02 8.94E-04 -5.51E-02 -6.01E-02 -4.00E-02 PASS -5.86E-02 2.07E-03 -5.29E-02 -6.43E-02 -4.00E-02 PASS -5.64E-02 3.91E-03 -4.57E-02 -6.71E-02 -4.00E-02 PASS -5.82E-02 1.64E-03 -5.37E-02 -6.27E-02 -3.00E-02 PASS -5.78E-02 2.68E-03 -5.04E-02 -6.52E-02 -2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 69 -5.88E-02 1.92E-03 -5.35E-02 -6.41E-02 -2.00E-02 PASS -6.08E-02 1.79E-03 -5.59E-02 -6.57E-02 -2.00E-02 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Slew Rate 2 @ +5V (V/us) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.32. Plot of Negative Slew Rate 2 @ +5V (V/us) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 70 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.32. Raw data for Negative Slew Rate 2 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 2 @ +5V (V/us) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -5.60E-02 -5.80E-02 -5.80E-02 -6.00E-02 -5.60E-02 -5.60E-02 -5.90E-02 -5.70E-02 -5.90E-02 -5.90E-02 -5.80E-02 -5.70E-02 10 -5.50E-02 -5.90E-02 -5.90E-02 -6.00E-02 -5.60E-02 -5.60E-02 -5.90E-02 -5.80E-02 -6.20E-02 -5.90E-02 -6.00E-02 -6.00E-02 20 -5.50E-02 -5.70E-02 -5.70E-02 -5.80E-02 -5.50E-02 -5.50E-02 -5.80E-02 -5.70E-02 -6.00E-02 -5.90E-02 -6.10E-02 -5.70E-02 30 -5.50E-02 -5.60E-02 -5.70E-02 -5.80E-02 -5.40E-02 -5.50E-02 -5.80E-02 -5.80E-02 -6.10E-02 -6.10E-02 -6.00E-02 -5.80E-02 50 -5.40E-02 -5.40E-02 -5.60E-02 -5.60E-02 -5.40E-02 -5.30E-02 -5.60E-02 -5.60E-02 -5.90E-02 -5.70E-02 -6.00E-02 -5.80E-02 24 hr Anneal 168 hr Anneal 60 -5.40E-02 -5.60E-02 -5.70E-02 -5.60E-02 -5.40E-02 -5.40E-02 -5.80E-02 -5.80E-02 -6.00E-02 -5.80E-02 -6.10E-02 -5.80E-02 70 -5.80E-02 -5.80E-02 -5.90E-02 -5.80E-02 -5.60E-02 -5.70E-02 -6.10E-02 -6.10E-02 -6.20E-02 -6.10E-02 -6.10E-02 -5.90E-02 -5.76E-02 -5.78E-02 -5.64E-02 -5.60E-02 -5.48E-02 -5.54E-02 -5.78E-02 1.67E-03 2.17E-03 1.34E-03 1.58E-03 1.10E-03 1.34E-03 1.10E-03 -5.30E-02 -5.19E-02 -5.27E-02 -5.17E-02 -5.18E-02 -5.17E-02 -5.48E-02 -6.22E-02 -6.37E-02 -6.01E-02 -6.03E-02 -5.78E-02 -5.91E-02 -6.08E-02 -5.80E-02 1.41E-03 -5.41E-02 -6.19E-02 -4.00E-02 PASS -5.88E-02 2.17E-03 -5.29E-02 -6.47E-02 -4.00E-02 PASS -5.78E-02 1.92E-03 -5.25E-02 -6.31E-02 -4.00E-02 PASS -5.86E-02 2.51E-03 -5.17E-02 -6.55E-02 -3.00E-02 PASS -5.62E-02 2.17E-03 -5.03E-02 -6.21E-02 -2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 71 -5.76E-02 2.19E-03 -5.16E-02 -6.36E-02 -2.00E-02 PASS -6.04E-02 1.95E-03 -5.51E-02 -6.57E-02 -2.00E-02 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Supply Current @+15V (A) 2.50E-04 2.00E-04 1.50E-04 1.00E-04 5.00E-05 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.33. Plot of Positive Supply Current @+15V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 72 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.33. Raw data for Positive Supply Current @+15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @+15V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.14E-04 1.27E-04 1.20E-04 1.17E-04 1.16E-04 1.13E-04 1.21E-04 1.17E-04 1.24E-04 1.23E-04 1.18E-04 1.15E-04 10 1.15E-04 1.26E-04 1.26E-04 1.22E-04 1.18E-04 1.08E-04 1.23E-04 1.16E-04 1.25E-04 1.19E-04 1.25E-04 1.18E-04 20 1.12E-04 1.19E-04 1.15E-04 1.22E-04 1.16E-04 1.10E-04 1.12E-04 1.14E-04 1.19E-04 1.15E-04 1.22E-04 1.21E-04 30 1.11E-04 1.15E-04 1.22E-04 1.10E-04 1.11E-04 1.03E-04 1.12E-04 1.08E-04 1.17E-04 1.05E-04 1.25E-04 1.20E-04 50 1.00E-04 1.13E-04 1.17E-04 1.05E-04 1.02E-04 9.60E-05 1.00E-04 9.90E-05 1.09E-04 1.00E-04 1.26E-04 1.17E-04 60 9.70E-05 1.10E-04 1.16E-04 1.07E-04 1.01E-04 9.90E-05 1.00E-04 9.80E-05 1.09E-04 1.10E-04 1.19E-04 1.14E-04 70 1.00E-04 1.11E-04 1.09E-04 1.12E-04 1.05E-04 1.03E-04 1.04E-04 1.08E-04 1.14E-04 1.07E-04 1.17E-04 1.18E-04 1.19E-04 5.07E-06 1.33E-04 1.05E-04 1.21E-04 4.88E-06 1.35E-04 1.08E-04 1.17E-04 3.83E-06 1.27E-04 1.06E-04 1.14E-04 4.97E-06 1.27E-04 1.00E-04 1.07E-04 7.30E-06 1.27E-04 8.74E-05 1.06E-04 7.46E-06 1.27E-04 8.57E-05 1.07E-04 4.93E-06 1.21E-04 9.39E-05 1.20E-04 4.56E-06 1.32E-04 1.07E-04 2.00E-04 PASS 1.18E-04 6.69E-06 1.37E-04 9.99E-05 2.00E-04 PASS 1.14E-04 3.39E-06 1.23E-04 1.05E-04 2.00E-04 PASS 1.09E-04 5.61E-06 1.24E-04 9.36E-05 2.00E-04 PASS 1.01E-04 4.87E-06 1.14E-04 8.75E-05 2.00E-04 PASS 1.03E-04 5.81E-06 1.19E-04 8.73E-05 2.00E-04 PASS 1.07E-04 4.32E-06 1.19E-04 9.53E-05 2.00E-04 PASS An ISO 9001:2008 and DSCC Certified Company 73 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Supply Current @+15V (A) 0.00E+00 -5.00E-05 -1.00E-04 -1.50E-04 -2.00E-04 -2.50E-04 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.34. Plot of Negative Supply Current @+15V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 74 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.34. Raw data for Negative Supply Current @+15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @+15V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 -1.18E-04 -1.27E-04 -1.24E-04 -1.23E-04 -1.18E-04 -1.14E-04 -1.19E-04 -1.18E-04 -1.24E-04 -1.18E-04 -1.21E-04 -1.18E-04 10 -1.12E-04 -1.25E-04 -1.22E-04 -1.21E-04 -1.17E-04 -1.11E-04 -1.15E-04 -1.15E-04 -1.23E-04 -1.16E-04 -1.22E-04 -1.18E-04 20 -1.12E-04 -1.22E-04 -1.20E-04 -1.16E-04 -1.13E-04 -1.08E-04 -1.13E-04 -1.14E-04 -1.20E-04 -1.11E-04 -1.21E-04 -1.20E-04 30 -1.08E-04 -1.20E-04 -1.16E-04 -1.14E-04 -1.11E-04 -1.04E-04 -1.10E-04 -1.10E-04 -1.14E-04 -1.09E-04 -1.22E-04 -1.20E-04 50 -1.01E-04 -1.12E-04 -1.09E-04 -1.09E-04 -1.03E-04 -9.70E-05 -1.03E-04 -1.02E-04 -1.06E-04 -1.02E-04 -1.20E-04 -1.20E-04 60 -1.02E-04 -1.12E-04 -1.09E-04 -1.07E-04 -1.04E-04 -9.70E-05 -1.07E-04 -1.03E-04 -1.09E-04 -1.02E-04 -1.22E-04 -1.19E-04 70 -1.02E-04 -1.13E-04 -1.12E-04 -1.09E-04 -1.04E-04 -1.03E-04 -1.10E-04 -1.09E-04 -1.17E-04 -1.10E-04 -1.22E-04 -1.19E-04 -1.22E-04 3.94E-06 -1.11E-04 -1.33E-04 -1.19E-04 5.03E-06 -1.06E-04 -1.33E-04 -1.17E-04 4.34E-06 -1.05E-04 -1.28E-04 -1.14E-04 4.60E-06 -1.01E-04 -1.26E-04 -1.07E-04 4.60E-06 -9.42E-05 -1.19E-04 -1.07E-04 3.96E-06 -9.59E-05 -1.18E-04 -1.08E-04 4.85E-06 -9.47E-05 -1.21E-04 -1.19E-04 3.58E-06 -1.09E-04 -1.28E-04 -2.00E-04 PASS -1.16E-04 4.36E-06 -1.04E-04 -1.28E-04 -2.00E-04 PASS -1.13E-04 4.44E-06 -1.01E-04 -1.25E-04 -2.00E-04 PASS -1.09E-04 3.58E-06 -9.96E-05 -1.19E-04 -2.00E-04 PASS -1.02E-04 3.24E-06 -9.31E-05 -1.11E-04 -2.00E-04 PASS -1.04E-04 4.67E-06 -9.08E-05 -1.16E-04 -2.00E-04 PASS -1.10E-04 4.97E-06 -9.62E-05 -1.23E-04 -2.00E-04 PASS An ISO 9001:2008 and DSCC Certified Company 75 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 1 @ +15V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.35. Plot of Input Offset Voltage 1 @ +15V (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 76 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.35. Raw data for Input Offset Voltage 1 @ +15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 1 @ +15V (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.80E-05 3.92E-05 8.51E-05 -3.76E-05 1.94E-05 4.03E-05 3.97E-06 8.44E-05 8.74E-05 5.39E-05 2.82E-05 2.12E-05 10 3.27E-05 2.11E-05 6.74E-05 -5.46E-05 7.49E-06 3.28E-05 -7.60E-06 7.68E-05 8.43E-05 4.08E-05 2.73E-05 2.40E-05 20 3.06E-05 2.16E-05 7.47E-05 -4.79E-05 1.11E-05 3.44E-05 -5.20E-06 7.27E-05 8.40E-05 3.85E-05 2.67E-05 2.37E-05 30 4.22E-05 3.11E-05 7.41E-05 -4.48E-05 1.66E-05 3.99E-05 -4.12E-06 7.17E-05 8.36E-05 4.15E-05 3.05E-05 2.50E-05 50 6.81E-05 4.56E-05 7.88E-05 -3.68E-05 2.70E-05 4.82E-05 4.33E-06 8.94E-05 9.87E-05 5.70E-05 2.80E-05 2.19E-05 60 8.10E-05 5.48E-05 9.38E-05 -2.61E-05 3.93E-05 5.09E-05 4.08E-06 9.00E-05 9.91E-05 5.84E-05 3.05E-05 2.98E-05 70 7.05E-05 3.99E-05 8.47E-05 -3.29E-05 4.22E-05 4.31E-05 4.56E-07 7.43E-05 9.98E-05 5.20E-05 2.88E-05 2.68E-05 3.08E-05 4.50E-05 1.54E-04 -9.27E-05 1.48E-05 4.47E-05 1.37E-04 -1.08E-04 1.80E-05 4.41E-05 1.39E-04 -1.03E-04 2.39E-05 4.38E-05 1.44E-04 -9.63E-05 3.65E-05 4.57E-05 1.62E-04 -8.87E-05 4.86E-05 4.69E-05 1.77E-04 -8.00E-05 4.09E-05 4.54E-05 1.65E-04 -8.35E-05 5.40E-05 3.44E-05 1.48E-04 -4.03E-05 -3.50E-04 PASS 3.50E-04 PASS 4.54E-05 3.70E-05 1.47E-04 -5.61E-05 -3.50E-04 PASS 3.50E-04 PASS 4.49E-05 3.52E-05 1.41E-04 -5.17E-05 -3.50E-04 PASS 3.50E-04 PASS 4.65E-05 3.41E-05 1.40E-04 -4.69E-05 -5.00E-04 PASS 5.00E-04 PASS 5.95E-05 3.75E-05 1.62E-04 -4.32E-05 -6.50E-04 PASS 6.50E-04 PASS 6.05E-05 3.76E-05 1.63E-04 -4.25E-05 -6.50E-04 PASS 6.50E-04 PASS 5.39E-05 3.71E-05 1.56E-04 -4.78E-05 -6.50E-04 PASS 6.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 77 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 2 @ +15V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.36. Plot of Input Offset Voltage 2 @ +15V (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 78 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.36. Raw data for Input Offset Voltage 2 @ +15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 2 @ +15V (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -5.04E-05 1.04E-04 2.69E-05 6.88E-05 5.07E-05 -1.61E-05 8.21E-05 4.18E-05 2.52E-05 -7.16E-05 -5.75E-05 7.78E-05 10 -6.98E-05 8.62E-05 9.06E-06 5.29E-05 3.42E-05 -2.62E-05 7.38E-05 3.51E-05 2.49E-05 -7.97E-05 -5.72E-05 8.26E-05 20 -6.47E-05 8.63E-05 1.05E-05 5.97E-05 4.25E-05 -2.55E-05 7.21E-05 3.21E-05 2.61E-05 -8.21E-05 -5.91E-05 8.00E-05 30 -6.09E-05 9.47E-05 1.63E-05 6.12E-05 4.86E-05 -1.85E-05 7.58E-05 3.74E-05 3.17E-05 -7.05E-05 -5.64E-05 7.97E-05 50 -4.13E-05 1.09E-04 3.00E-05 7.33E-05 6.61E-05 -2.57E-07 8.70E-05 5.03E-05 4.14E-05 -5.56E-05 -5.69E-05 8.13E-05 60 -2.98E-05 1.20E-04 4.89E-05 8.68E-05 7.58E-05 2.03E-06 8.94E-05 5.60E-05 4.86E-05 -5.18E-05 -5.54E-05 8.25E-05 70 -4.41E-05 1.08E-04 3.73E-05 6.80E-05 7.99E-05 -1.63E-05 7.90E-05 3.57E-05 3.81E-05 -6.39E-05 -5.81E-05 8.04E-05 4.01E-05 5.79E-05 1.99E-04 -1.19E-04 2.25E-05 5.87E-05 1.84E-04 -1.39E-04 2.69E-05 5.81E-05 1.86E-04 -1.33E-04 3.20E-05 5.90E-05 1.94E-04 -1.30E-04 4.74E-05 5.70E-05 2.04E-04 -1.09E-04 6.03E-05 5.65E-05 2.15E-04 -9.46E-05 4.99E-05 5.84E-05 2.10E-04 -1.10E-04 1.23E-05 5.86E-05 1.73E-04 -1.48E-04 -3.50E-04 PASS 3.50E-04 PASS 5.58E-06 5.95E-05 1.69E-04 -1.58E-04 -3.50E-04 PASS 3.50E-04 PASS 4.53E-06 5.95E-05 1.68E-04 -1.59E-04 -3.50E-04 PASS 3.50E-04 PASS 1.12E-05 5.67E-05 1.67E-04 -1.44E-04 -5.00E-04 PASS 5.00E-04 PASS 2.46E-05 5.45E-05 1.74E-04 -1.25E-04 -6.50E-04 PASS 6.50E-04 PASS 2.89E-05 5.48E-05 1.79E-04 -1.21E-04 -6.50E-04 PASS 6.50E-04 PASS 1.45E-05 5.54E-05 1.66E-04 -1.37E-04 -6.50E-04 PASS 6.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 79 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 1 @ +15V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.37. Plot of Input Offset Current 1 @ +15V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 80 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.37. Raw data for Input Offset Current 1 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 1 @ +15V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.00E-11 -6.00E-11 -1.60E-10 -1.00E-11 -6.00E-11 2.00E-11 -8.00E-11 -2.00E-11 -4.00E-11 -1.00E-10 -1.80E-10 -2.00E-11 10 0.00E+00 -2.00E-11 -3.00E-11 -8.00E-11 -4.00E-11 4.00E-11 1.30E-10 -1.00E-11 -1.50E-10 -2.00E-11 -1.40E-10 -3.00E-11 20 -5.00E-11 0.00E+00 -6.00E-11 -3.00E-11 9.00E-11 -8.00E-11 8.00E-11 -1.90E-10 -1.10E-10 -2.40E-10 -6.00E-11 2.00E-11 30 0.00E+00 6.00E-11 -1.40E-10 5.00E-11 1.00E-10 3.00E-11 2.00E-11 -1.70E-10 -1.60E-10 -1.60E-10 -5.00E-11 -4.00E-11 50 7.00E-11 5.00E-11 -2.20E-10 1.00E-10 1.20E-10 2.00E-11 6.00E-11 -3.20E-10 -4.00E-11 -1.20E-10 -1.50E-10 1.00E-11 60 1.00E-10 7.00E-11 -3.00E-10 5.00E-11 9.00E-11 6.00E-11 8.00E-11 -2.60E-10 -2.50E-10 -1.40E-10 -9.00E-11 0.00E+00 70 -9.00E-11 1.20E-10 -3.20E-10 1.50E-10 1.00E-11 -1.20E-10 -2.40E-10 -2.00E-11 -1.80E-10 -1.80E-10 -1.60E-10 -1.00E-11 -4.20E-11 8.73E-11 1.97E-10 -2.81E-10 -3.40E-11 2.97E-11 4.73E-11 -1.15E-10 -1.00E-11 6.04E-11 1.56E-10 -1.76E-10 1.40E-11 9.32E-11 2.69E-10 -2.41E-10 2.40E-11 1.39E-10 4.05E-10 -3.57E-10 2.00E-12 1.70E-10 4.68E-10 -4.64E-10 -2.60E-11 1.90E-10 4.94E-10 -5.46E-10 -4.40E-11 4.77E-11 8.69E-11 -1.75E-10 -8.00E-10 PASS 8.00E-10 PASS -2.00E-12 1.02E-10 2.77E-10 -2.81E-10 -2.00E-09 PASS 2.00E-09 PASS -1.08E-10 1.23E-10 2.29E-10 -4.45E-10 -2.00E-09 PASS 2.00E-09 PASS -8.80E-11 1.03E-10 1.95E-10 -3.71E-10 -8.00E-09 PASS 8.00E-09 PASS -8.00E-11 1.50E-10 3.32E-10 -4.92E-10 -1.30E-08 PASS 1.30E-08 PASS -1.02E-10 1.64E-10 3.48E-10 -5.52E-10 -1.30E-08 PASS 1.30E-08 PASS -1.48E-10 8.32E-11 8.01E-11 -3.76E-10 -1.30E-08 PASS 1.30E-08 PASS An ISO 9001:2008 and DSCC Certified Company 81 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 2 @ +15V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.38. Plot of Input Offset Current 2 @ +15V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 82 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.38. Raw data for Input Offset Current 2 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 2 @ +15V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.20E-10 -1.50E-10 1.00E-11 -1.60E-10 2.00E-11 0.00E+00 0.00E+00 -2.00E-11 -7.00E-11 6.00E-11 -1.00E-11 -1.40E-10 10 1.00E-11 -9.00E-11 -1.30E-10 -9.00E-11 0.00E+00 0.00E+00 -4.00E-11 -5.00E-11 2.00E-11 7.00E-11 3.00E-11 -1.00E-10 20 8.00E-11 1.00E-11 -2.40E-10 -5.00E-11 2.00E-11 1.30E-10 -1.70E-10 4.00E-11 -2.00E-10 2.00E-10 -7.00E-11 -2.00E-10 30 0.00E+00 0.00E+00 -1.30E-10 -6.00E-11 2.00E-11 6.00E-11 -1.40E-10 8.00E-11 -1.00E-10 2.50E-10 -1.10E-10 -1.20E-10 50 6.00E-11 1.10E-10 -9.00E-11 -1.00E-10 8.00E-11 1.80E-10 -7.00E-11 3.00E-11 -1.20E-10 2.80E-10 -5.00E-11 -2.50E-10 60 -9.00E-11 -1.80E-10 -9.00E-11 -3.00E-11 -5.00E-11 2.80E-10 -1.00E-11 2.20E-10 8.00E-11 6.40E-10 0.00E+00 -1.30E-10 70 -1.20E-10 1.00E-11 -3.00E-11 -2.00E-11 -2.00E-11 0.00E+00 5.00E-11 -1.10E-10 -5.00E-11 2.90E-10 -4.00E-11 -1.60E-10 -8.00E-11 8.80E-11 1.61E-10 -3.21E-10 -6.00E-11 6.16E-11 1.09E-10 -2.29E-10 -3.60E-11 1.23E-10 3.01E-10 -3.73E-10 -3.40E-11 6.15E-11 1.35E-10 -2.03E-10 1.20E-11 9.93E-11 2.84E-10 -2.60E-10 -8.80E-11 5.76E-11 7.00E-11 -2.46E-10 -3.60E-11 4.93E-11 9.92E-11 -1.71E-10 -6.00E-12 4.67E-11 1.22E-10 -1.34E-10 -8.00E-10 PASS 8.00E-10 PASS 0.00E+00 4.85E-11 1.33E-10 -1.33E-10 -2.00E-09 PASS 2.00E-09 PASS -5.17E-27 1.78E-10 4.89E-10 -4.89E-10 -2.00E-09 PASS 2.00E-09 PASS 3.00E-11 1.56E-10 4.58E-10 -3.98E-10 -8.00E-09 PASS 8.00E-09 PASS 6.00E-11 1.68E-10 5.21E-10 -4.01E-10 -1.30E-08 PASS 1.30E-08 PASS 2.42E-10 2.50E-10 9.28E-10 -4.44E-10 -1.30E-08 PASS 1.30E-08 PASS 3.60E-11 1.54E-10 4.58E-10 -3.86E-10 -1.30E-08 PASS 1.30E-08 PASS An ISO 9001:2008 and DSCC Certified Company 83 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 1 @ +15V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.39. Plot of Positive Input Bias Current 1 @ +15V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 84 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.39. Raw data for Positive Input Bias Current 1 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 1 @ +15V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.25E-09 9.58E-09 9.28E-09 9.38E-09 8.69E-09 9.23E-09 8.59E-09 8.77E-09 9.02E-09 8.72E-09 8.95E-09 8.65E-09 10 9.86E-09 1.14E-08 1.09E-08 1.13E-08 1.02E-08 1.08E-08 1.02E-08 1.03E-08 1.08E-08 1.03E-08 8.97E-09 8.67E-09 20 1.19E-08 1.39E-08 1.35E-08 1.39E-08 1.23E-08 1.30E-08 1.24E-08 1.27E-08 1.30E-08 1.24E-08 8.90E-09 8.65E-09 30 1.43E-08 1.66E-08 1.60E-08 1.69E-08 1.48E-08 1.53E-08 1.48E-08 1.51E-08 1.55E-08 1.47E-08 8.91E-09 8.68E-09 50 1.97E-08 2.26E-08 2.14E-08 2.24E-08 1.97E-08 2.01E-08 1.94E-08 2.01E-08 2.09E-08 1.98E-08 9.01E-09 8.64E-09 60 2.12E-08 2.44E-08 2.30E-08 2.40E-08 2.08E-08 2.00E-08 1.92E-08 2.00E-08 2.07E-08 1.96E-08 8.96E-09 8.62E-09 70 2.19E-08 2.50E-08 2.37E-08 2.44E-08 2.17E-08 1.78E-08 1.70E-08 1.75E-08 1.81E-08 1.72E-08 8.98E-09 8.62E-09 9.04E-09 5.50E-10 1.05E-08 7.53E-09 1.07E-08 6.62E-10 1.25E-08 8.92E-09 1.31E-08 9.21E-10 1.56E-08 1.06E-08 1.57E-08 1.13E-09 1.88E-08 1.26E-08 2.12E-08 1.44E-09 2.51E-08 1.72E-08 2.27E-08 1.63E-09 2.71E-08 1.82E-08 2.34E-08 1.47E-09 2.74E-08 1.93E-08 8.87E-09 2.56E-10 9.57E-09 8.16E-09 -1.50E-08 PASS 1.50E-08 PASS 1.04E-08 3.02E-10 1.13E-08 9.62E-09 -2.00E-08 PASS 2.00E-08 PASS 1.27E-08 2.94E-10 1.35E-08 1.19E-08 -2.00E-08 PASS 2.00E-08 PASS 1.51E-08 3.53E-10 1.60E-08 1.41E-08 -4.00E-08 PASS 4.00E-08 PASS 2.01E-08 5.60E-10 2.16E-08 1.85E-08 -8.00E-08 PASS 8.00E-08 PASS 1.99E-08 5.52E-10 2.14E-08 1.84E-08 -8.00E-08 PASS 8.00E-08 PASS 1.75E-08 4.36E-10 1.87E-08 1.63E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2008 and DSCC Certified Company 85 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 2 @ +15V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.40. Plot of Positive Input Bias Current 2 @ +15V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 86 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.40. Raw data for Positive Input Bias Current 2 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 2 @ +15V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.34E-09 9.54E-09 9.26E-09 9.32E-09 8.95E-09 9.20E-09 8.77E-09 8.70E-09 8.90E-09 8.75E-09 8.97E-09 8.69E-09 10 9.82E-09 1.12E-08 1.09E-08 1.12E-08 1.04E-08 1.07E-08 1.03E-08 1.03E-08 1.07E-08 1.04E-08 9.07E-09 8.68E-09 20 1.19E-08 1.39E-08 1.33E-08 1.39E-08 1.26E-08 1.30E-08 1.24E-08 1.28E-08 1.28E-08 1.27E-08 8.97E-09 8.64E-09 30 1.44E-08 1.68E-08 1.61E-08 1.67E-08 1.51E-08 1.54E-08 1.48E-08 1.53E-08 1.55E-08 1.52E-08 8.92E-09 8.75E-09 50 1.96E-08 2.28E-08 2.13E-08 2.22E-08 1.98E-08 2.01E-08 1.95E-08 2.03E-08 2.08E-08 2.02E-08 8.99E-09 8.64E-09 60 2.12E-08 2.44E-08 2.29E-08 2.36E-08 2.11E-08 2.01E-08 1.96E-08 2.04E-08 2.08E-08 2.04E-08 9.03E-09 8.66E-09 70 2.20E-08 2.50E-08 2.38E-08 2.41E-08 2.21E-08 1.77E-08 1.71E-08 1.77E-08 1.82E-08 1.77E-08 9.00E-09 8.70E-09 9.08E-09 4.65E-10 1.04E-08 7.81E-09 1.07E-08 5.89E-10 1.23E-08 9.09E-09 1.31E-08 8.44E-10 1.54E-08 1.08E-08 1.58E-08 1.05E-09 1.87E-08 1.29E-08 2.11E-08 1.42E-09 2.50E-08 1.72E-08 2.26E-08 1.45E-09 2.66E-08 1.86E-08 2.34E-08 1.30E-09 2.70E-08 1.98E-08 8.86E-09 2.02E-10 9.42E-09 8.31E-09 -1.50E-08 PASS 1.50E-08 PASS 1.05E-08 2.12E-10 1.11E-08 9.90E-09 -2.00E-08 PASS 2.00E-08 PASS 1.27E-08 2.48E-10 1.34E-08 1.21E-08 -2.00E-08 PASS 2.00E-08 PASS 1.52E-08 2.70E-10 1.60E-08 1.45E-08 -4.00E-08 PASS 4.00E-08 PASS 2.02E-08 4.88E-10 2.15E-08 1.88E-08 -8.00E-08 PASS 8.00E-08 PASS 2.02E-08 4.66E-10 2.15E-08 1.90E-08 -8.00E-08 PASS 8.00E-08 PASS 1.77E-08 3.86E-10 1.87E-08 1.66E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2008 and DSCC Certified Company 87 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Input Bias Current 1 @ +15V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.41. Plot of Negative Input Bias Current 1 @ +15V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 88 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.41. Raw data for Negative Input Bias Current 1 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 1 @ +15V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.41E-09 9.60E-09 9.35E-09 9.53E-09 8.61E-09 9.18E-09 8.83E-09 8.80E-09 8.97E-09 8.61E-09 9.03E-09 8.65E-09 10 9.84E-09 1.14E-08 1.10E-08 1.12E-08 1.03E-08 1.08E-08 1.01E-08 1.04E-08 1.10E-08 1.04E-08 9.01E-09 8.71E-09 20 1.20E-08 1.39E-08 1.36E-08 1.40E-08 1.22E-08 1.29E-08 1.23E-08 1.27E-08 1.32E-08 1.25E-08 9.03E-09 8.74E-09 30 1.45E-08 1.66E-08 1.63E-08 1.69E-08 1.46E-08 1.52E-08 1.46E-08 1.52E-08 1.56E-08 1.49E-08 9.12E-09 8.60E-09 50 1.97E-08 2.27E-08 2.19E-08 2.25E-08 1.94E-08 2.00E-08 1.93E-08 2.04E-08 2.09E-08 2.01E-08 9.01E-09 8.63E-09 60 2.12E-08 2.44E-08 2.32E-08 2.40E-08 2.08E-08 2.01E-08 1.93E-08 2.04E-08 2.09E-08 1.98E-08 9.02E-09 8.73E-09 70 2.20E-08 2.48E-08 2.40E-08 2.42E-08 2.18E-08 1.79E-08 1.72E-08 1.77E-08 1.81E-08 1.73E-08 9.01E-09 8.73E-09 9.10E-09 5.51E-10 1.06E-08 7.59E-09 1.08E-08 6.53E-10 1.25E-08 8.97E-09 1.31E-08 9.59E-10 1.58E-08 1.05E-08 1.58E-08 1.15E-09 1.89E-08 1.26E-08 2.12E-08 1.57E-09 2.56E-08 1.69E-08 2.27E-08 1.62E-09 2.71E-08 1.82E-08 2.34E-08 1.36E-09 2.71E-08 1.96E-08 8.88E-09 2.12E-10 9.46E-09 8.30E-09 -1.50E-08 PASS 1.50E-08 PASS 1.05E-08 3.43E-10 1.15E-08 9.58E-09 -2.00E-08 PASS 2.00E-08 PASS 1.27E-08 3.28E-10 1.36E-08 1.18E-08 -2.00E-08 PASS 2.00E-08 PASS 1.51E-08 3.48E-10 1.61E-08 1.42E-08 -4.00E-08 PASS 4.00E-08 PASS 2.01E-08 6.18E-10 2.18E-08 1.84E-08 -8.00E-08 PASS 8.00E-08 PASS 2.01E-08 6.19E-10 2.18E-08 1.84E-08 -8.00E-08 PASS 8.00E-08 PASS 1.76E-08 3.98E-10 1.87E-08 1.65E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2008 and DSCC Certified Company 89 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Input Bias Current 2 @ +15V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 v 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.42. Plot of Negative Input Bias Current 2 @ +15V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 90 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.42. Raw data for Negative Input Bias Current 2 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 2 @ +15V (A) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.42E-09 9.74E-09 9.35E-09 9.48E-09 8.93E-09 9.19E-09 8.85E-09 8.83E-09 9.04E-09 8.71E-09 8.97E-09 8.93E-09 10 9.87E-09 1.14E-08 1.11E-08 1.14E-08 1.04E-08 1.07E-08 1.04E-08 1.04E-08 1.07E-08 1.03E-08 9.08E-09 8.91E-09 20 1.19E-08 1.39E-08 1.36E-08 1.39E-08 1.26E-08 1.29E-08 1.26E-08 1.28E-08 1.31E-08 1.26E-08 9.14E-09 8.87E-09 30 1.43E-08 1.67E-08 1.61E-08 1.68E-08 1.51E-08 1.53E-08 1.48E-08 1.52E-08 1.55E-08 1.49E-08 9.03E-09 8.92E-09 50 1.97E-08 2.27E-08 2.15E-08 2.23E-08 1.99E-08 2.00E-08 1.95E-08 2.03E-08 2.09E-08 1.98E-08 9.10E-09 8.95E-09 60 2.12E-08 2.45E-08 2.30E-08 2.36E-08 2.11E-08 1.99E-08 1.95E-08 2.02E-08 2.08E-08 1.98E-08 9.16E-09 8.84E-09 70 2.19E-08 2.51E-08 2.40E-08 2.42E-08 2.21E-08 1.79E-08 1.72E-08 1.78E-08 1.83E-08 1.75E-08 9.15E-09 8.84E-09 9.18E-09 5.18E-10 1.06E-08 7.76E-09 1.08E-08 6.70E-10 1.27E-08 9.00E-09 1.32E-08 8.97E-10 1.56E-08 1.07E-08 1.58E-08 1.08E-09 1.88E-08 1.29E-08 2.12E-08 1.38E-09 2.50E-08 1.74E-08 2.27E-08 1.47E-09 2.67E-08 1.86E-08 2.35E-08 1.41E-09 2.73E-08 1.96E-08 8.92E-09 1.90E-10 9.44E-09 8.40E-09 -1.50E-08 PASS 1.50E-08 PASS 1.05E-08 1.79E-10 1.10E-08 1.00E-08 -2.00E-08 PASS 2.00E-08 PASS 1.28E-08 2.23E-10 1.34E-08 1.22E-08 -2.00E-08 PASS 2.00E-08 PASS 1.51E-08 3.01E-10 1.60E-08 1.43E-08 -4.00E-08 PASS 4.00E-08 PASS 2.01E-08 5.16E-10 2.15E-08 1.87E-08 -8.00E-08 PASS 8.00E-08 PASS 2.00E-08 5.14E-10 2.15E-08 1.86E-08 -8.00E-08 PASS 8.00E-08 PASS 1.77E-08 4.09E-10 1.88E-08 1.66E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2008 and DSCC Certified Company 91 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio 1 @ +15V (dB) 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.43. Plot of Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 92 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.43. Raw data for Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 1 @ +15V (dB) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.15E+02 1.09E+02 1.09E+02 1.12E+02 1.10E+02 1.09E+02 1.09E+02 1.08E+02 1.09E+02 1.08E+02 1.08E+02 1.10E+02 10 1.13E+02 1.09E+02 1.08E+02 1.11E+02 1.09E+02 1.08E+02 1.08E+02 1.08E+02 1.09E+02 1.07E+02 1.08E+02 1.11E+02 20 1.13E+02 1.09E+02 1.08E+02 1.11E+02 1.09E+02 1.07E+02 1.07E+02 1.07E+02 1.08E+02 1.07E+02 1.08E+02 1.10E+02 30 1.12E+02 1.08E+02 1.08E+02 1.11E+02 1.08E+02 1.07E+02 1.07E+02 1.07E+02 1.08E+02 1.07E+02 1.08E+02 1.10E+02 50 1.11E+02 1.07E+02 1.08E+02 1.10E+02 1.08E+02 1.07E+02 1.06E+02 1.06E+02 1.07E+02 1.06E+02 1.08E+02 1.10E+02 60 1.12E+02 1.08E+02 1.08E+02 1.10E+02 1.08E+02 1.06E+02 1.06E+02 1.06E+02 1.07E+02 1.06E+02 1.08E+02 1.10E+02 70 1.15E+02 1.09E+02 1.09E+02 1.10E+02 1.10E+02 1.08E+02 1.08E+02 1.07E+02 1.09E+02 1.07E+02 1.08E+02 1.10E+02 1.11E+02 2.46E+00 1.18E+02 1.04E+02 1.10E+02 1.99E+00 1.15E+02 1.05E+02 1.10E+02 2.01E+00 1.15E+02 1.04E+02 1.09E+02 1.90E+00 1.15E+02 1.04E+02 1.09E+02 1.52E+00 1.13E+02 1.05E+02 1.10E+02 1.86E+00 1.15E+02 1.04E+02 1.10E+02 2.47E+00 1.17E+02 1.04E+02 1.09E+02 3.89E-01 1.10E+02 1.08E+02 9.70E+01 PASS 1.08E+02 7.41E-01 1.10E+02 1.06E+02 9.40E+01 PASS 1.07E+02 4.55E-01 1.08E+02 1.06E+02 9.40E+01 PASS 1.07E+02 4.03E-01 1.08E+02 1.06E+02 9.20E+01 PASS 1.06E+02 4.71E-01 1.08E+02 1.05E+02 9.00E+01 PASS 1.06E+02 2.82E-01 1.07E+02 1.06E+02 9.00E+01 PASS 1.08E+02 7.50E-01 1.10E+02 1.06E+02 9.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 93 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio 2 @ +15V (dB) 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.44. Plot of Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 94 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.44. Raw data for Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 2 @ +15V (dB) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.09E+02 1.08E+02 1.12E+02 1.12E+02 1.10E+02 1.09E+02 1.07E+02 1.10E+02 1.08E+02 1.08E+02 1.11E+02 1.08E+02 10 1.09E+02 1.07E+02 1.11E+02 1.10E+02 1.09E+02 1.08E+02 1.06E+02 1.09E+02 1.07E+02 1.07E+02 1.12E+02 1.09E+02 20 1.08E+02 1.07E+02 1.10E+02 1.10E+02 1.08E+02 1.08E+02 1.06E+02 1.08E+02 1.07E+02 1.07E+02 1.12E+02 1.09E+02 30 1.08E+02 1.07E+02 1.09E+02 1.10E+02 1.08E+02 1.07E+02 1.06E+02 1.08E+02 1.06E+02 1.07E+02 1.12E+02 1.09E+02 50 1.07E+02 1.07E+02 1.09E+02 1.09E+02 1.08E+02 1.07E+02 1.05E+02 1.07E+02 1.06E+02 1.06E+02 1.12E+02 1.09E+02 60 1.08E+02 1.07E+02 1.10E+02 1.10E+02 1.08E+02 1.07E+02 1.05E+02 1.07E+02 1.06E+02 1.06E+02 1.12E+02 1.09E+02 70 1.09E+02 1.08E+02 1.11E+02 1.10E+02 1.09E+02 1.09E+02 1.06E+02 1.09E+02 1.07E+02 1.08E+02 1.11E+02 1.09E+02 1.10E+02 1.64E+00 1.15E+02 1.06E+02 1.09E+02 1.24E+00 1.13E+02 1.06E+02 1.09E+02 1.33E+00 1.12E+02 1.05E+02 1.08E+02 1.13E+00 1.11E+02 1.05E+02 1.08E+02 1.10E+00 1.11E+02 1.05E+02 1.09E+02 1.14E+00 1.12E+02 1.05E+02 1.09E+02 1.18E+00 1.13E+02 1.06E+02 1.08E+02 1.07E+00 1.11E+02 1.05E+02 9.70E+01 PASS 1.08E+02 9.26E-01 1.10E+02 1.05E+02 9.40E+01 PASS 1.07E+02 1.00E+00 1.10E+02 1.04E+02 9.40E+01 PASS 1.07E+02 7.54E-01 1.09E+02 1.05E+02 9.20E+01 PASS 1.06E+02 8.12E-01 1.08E+02 1.04E+02 9.00E+01 PASS 1.06E+02 7.84E-01 1.08E+02 1.04E+02 9.00E+01 PASS 1.08E+02 9.67E-01 1.10E+02 1.05E+02 9.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 95 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Power Supply Rejection Ratio 1 @ +15V (dB) 1.50E+02 1.40E+02 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.45. Plot of Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 96 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.45. Raw data for Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 1 @ +15V (dB) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.47E+02 1.31E+02 1.25E+02 1.32E+02 1.23E+02 1.31E+02 1.26E+02 1.32E+02 1.38E+02 1.66E+02 1.29E+02 1.39E+02 10 1.36E+02 1.26E+02 1.23E+02 1.45E+02 1.31E+02 1.36E+02 1.24E+02 1.34E+02 1.47E+02 1.37E+02 1.26E+02 1.34E+02 20 1.59E+02 1.26E+02 1.27E+02 1.34E+02 1.39E+02 1.34E+02 1.23E+02 1.36E+02 1.41E+02 1.46E+02 1.28E+02 1.30E+02 30 1.44E+02 1.26E+02 1.25E+02 1.52E+02 1.30E+02 1.32E+02 1.22E+02 1.38E+02 1.32E+02 1.28E+02 1.25E+02 1.31E+02 50 1.36E+02 1.22E+02 1.23E+02 1.26E+02 1.23E+02 1.24E+02 1.20E+02 1.33E+02 1.47E+02 1.38E+02 1.25E+02 1.26E+02 60 1.25E+02 1.25E+02 1.24E+02 1.43E+02 1.34E+02 1.33E+02 1.23E+02 1.32E+02 1.35E+02 1.39E+02 1.30E+02 1.30E+02 70 1.34E+02 1.23E+02 1.32E+02 1.29E+02 1.33E+02 1.38E+02 1.25E+02 1.29E+02 1.42E+02 1.41E+02 1.26E+02 1.38E+02 1.31E+02 9.45E+00 1.57E+02 1.06E+02 1.32E+02 8.95E+00 1.57E+02 1.08E+02 1.37E+02 1.34E+01 1.73E+02 1.00E+02 1.35E+02 1.20E+01 1.68E+02 1.02E+02 1.26E+02 6.10E+00 1.43E+02 1.09E+02 1.30E+02 8.28E+00 1.53E+02 1.07E+02 1.30E+02 4.33E+00 1.42E+02 1.18E+02 1.39E+02 1.58E+01 1.82E+02 9.53E+01 1.00E+02 PASS 1.36E+02 8.44E+00 1.59E+02 1.13E+02 1.00E+02 PASS 1.36E+02 8.66E+00 1.60E+02 1.12E+02 1.00E+02 PASS 1.30E+02 6.12E+00 1.47E+02 1.14E+02 1.00E+02 PASS 1.32E+02 1.07E+01 1.62E+02 1.03E+02 9.80E+01 PASS 1.32E+02 5.64E+00 1.48E+02 1.17E+02 9.80E+01 PASS 1.35E+02 7.74E+00 1.56E+02 1.14E+02 9.80E+01 PASS An ISO 9001:2008 and DSCC Certified Company 97 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Power Supply Rejection Ratio 2 @ +15V (dB) 1.40E+02 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.46. Plot of Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 98 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.46. Raw data for Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 2 @ +15V (dB) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.24E+02 1.36E+02 1.49E+02 1.28E+02 1.23E+02 1.31E+02 1.34E+02 1.25E+02 1.19E+02 1.23E+02 1.24E+02 1.35E+02 10 1.23E+02 1.34E+02 1.34E+02 1.33E+02 1.24E+02 1.23E+02 1.25E+02 1.31E+02 1.19E+02 1.27E+02 1.24E+02 1.26E+02 20 1.26E+02 1.41E+02 1.44E+02 1.36E+02 1.24E+02 1.23E+02 1.26E+02 1.25E+02 1.16E+02 1.22E+02 1.28E+02 1.25E+02 30 1.26E+02 1.30E+02 1.40E+02 1.32E+02 1.20E+02 1.27E+02 1.29E+02 1.26E+02 1.17E+02 1.24E+02 1.22E+02 1.29E+02 50 1.25E+02 1.43E+02 1.45E+02 1.38E+02 1.22E+02 1.23E+02 1.27E+02 1.26E+02 1.17E+02 1.22E+02 1.23E+02 1.26E+02 60 1.26E+02 1.37E+02 1.33E+02 1.37E+02 1.21E+02 1.21E+02 1.23E+02 1.24E+02 1.16E+02 1.23E+02 1.25E+02 1.28E+02 70 1.27E+02 1.32E+02 1.33E+02 1.34E+02 1.21E+02 1.26E+02 1.31E+02 1.30E+02 1.17E+02 1.28E+02 1.27E+02 1.26E+02 1.32E+02 1.09E+01 1.62E+02 1.02E+02 1.30E+02 5.40E+00 1.44E+02 1.15E+02 1.34E+02 8.94E+00 1.59E+02 1.10E+02 1.29E+02 7.48E+00 1.50E+02 1.09E+02 1.34E+02 1.06E+01 1.63E+02 1.05E+02 1.31E+02 7.07E+00 1.50E+02 1.12E+02 1.29E+02 5.28E+00 1.44E+02 1.15E+02 1.26E+02 6.30E+00 1.44E+02 1.09E+02 1.00E+02 PASS 1.25E+02 4.47E+00 1.37E+02 1.13E+02 1.00E+02 PASS 1.23E+02 3.90E+00 1.33E+02 1.12E+02 1.00E+02 PASS 1.25E+02 4.36E+00 1.37E+02 1.13E+02 1.00E+02 PASS 1.23E+02 3.81E+00 1.33E+02 1.12E+02 9.80E+01 PASS 1.22E+02 3.45E+00 1.31E+02 1.12E+02 9.80E+01 PASS 1.26E+02 5.77E+00 1.42E+02 1.11E+02 9.80E+01 PASS An ISO 9001:2008 and DSCC Certified Company 99 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) 4.00E+04 3.50E+04 3.00E+04 2.50E+04 2.00E+04 1.50E+04 1.00E+04 5.00E+03 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.47. Plot of Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 100 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.47. Raw data for Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.71E+04 2.91E+04 2.34E+04 2.57E+04 3.88E+04 3.00E+04 2.46E+04 2.65E+04 2.47E+04 2.96E+04 2.93E+04 2.55E+04 10 2.51E+04 2.95E+04 3.14E+04 3.17E+04 4.19E+04 3.90E+04 3.64E+04 2.24E+04 3.05E+04 3.28E+04 3.59E+04 2.41E+04 20 2.80E+04 2.48E+04 2.50E+04 3.09E+04 2.89E+04 2.78E+04 3.50E+04 1.84E+04 3.19E+04 2.70E+04 2.29E+04 3.56E+04 30 2.00E+04 2.63E+04 3.69E+04 2.33E+04 1.83E+04 2.86E+04 3.06E+04 2.59E+04 2.24E+04 2.89E+04 2.58E+04 2.75E+04 50 2.33E+04 2.00E+04 2.15E+04 3.16E+04 2.17E+04 3.52E+04 2.63E+04 3.96E+04 3.15E+04 3.44E+04 3.50E+04 2.84E+04 60 2.37E+04 2.61E+04 2.57E+04 2.39E+04 2.77E+04 2.41E+04 2.32E+04 2.88E+04 2.87E+04 3.71E+04 3.01E+04 4.98E+04 70 2.87E+04 1.51E+04 4.21E+04 3.04E+04 3.62E+04 3.32E+04 3.00E+04 3.49E+04 2.91E+04 2.98E+04 3.70E+04 1.79E+04 3.28E+04 9.91E+03 6.00E+04 5.65E+03 3.19E+04 6.19E+03 4.89E+04 1.49E+04 2.75E+04 2.63E+03 3.47E+04 2.03E+04 2.49E+04 7.34E+03 4.51E+04 4.81E+03 2.36E+04 4.63E+03 3.63E+04 1.09E+04 2.54E+04 1.64E+03 2.99E+04 2.09E+04 3.05E+04 1.01E+04 5.81E+04 2.79E+03 2.71E+04 2.57E+03 3.41E+04 2.00E+04 1.00E+03 PASS 3.22E+04 6.39E+03 4.97E+04 1.47E+04 1.00E+03 PASS 2.80E+04 6.27E+03 4.52E+04 1.08E+04 1.00E+03 PASS 2.73E+04 3.19E+03 3.60E+04 1.85E+04 7.00E+02 PASS 3.34E+04 4.94E+03 4.69E+04 1.98E+04 4.00E+02 PASS 2.84E+04 5.50E+03 4.35E+04 1.33E+04 4.00E+02 PASS 3.14E+04 2.50E+03 3.83E+04 2.45E+04 4.00E+02 PASS An ISO 9001:2008 and DSCC Certified Company 101 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) 4.00E+04 3.50E+04 3.00E+04 2.50E+04 2.00E+04 1.50E+04 1.00E+04 5.00E+03 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.48. Plot of Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 102 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.48. Raw data for Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 3.44E+04 2.30E+04 2.21E+04 3.89E+04 3.52E+04 2.71E+04 2.50E+04 3.40E+04 3.72E+04 3.28E+04 4.11E+04 2.73E+04 10 4.86E+04 3.19E+04 2.80E+04 3.74E+04 3.10E+04 3.01E+04 4.45E+04 3.06E+04 3.76E+04 2.59E+04 4.55E+04 3.48E+04 20 3.62E+04 4.44E+04 3.43E+04 3.68E+04 3.02E+04 3.23E+04 2.90E+04 2.76E+04 3.11E+04 3.05E+04 3.79E+04 2.63E+04 30 2.77E+04 3.46E+04 3.75E+04 4.20E+04 2.95E+04 2.81E+04 3.42E+04 3.31E+04 3.71E+04 3.93E+04 3.55E+04 4.07E+04 50 3.90E+04 2.92E+04 3.30E+04 2.77E+04 2.97E+04 2.99E+04 3.39E+04 3.23E+04 2.70E+04 2.67E+04 4.68E+04 2.75E+04 60 2.54E+04 3.06E+04 3.66E+04 4.18E+04 3.06E+04 3.30E+04 3.24E+04 2.77E+04 2.42E+04 3.75E+04 3.63E+04 3.98E+04 70 4.23E+04 2.47E+04 4.60E+04 3.25E+04 3.63E+04 3.21E+04 4.22E+04 4.11E+04 3.99E+04 2.63E+04 4.32E+04 4.66E+04 3.07E+04 7.67E+03 5.18E+04 9.73E+03 3.54E+04 8.14E+03 5.77E+04 1.31E+04 3.64E+04 5.16E+03 5.05E+04 2.22E+04 3.43E+04 5.82E+03 5.02E+04 1.83E+04 3.17E+04 4.49E+03 4.40E+04 1.94E+04 3.30E+04 6.30E+03 5.03E+04 1.57E+04 3.63E+04 8.34E+03 5.92E+04 1.35E+04 3.12E+04 5.03E+03 4.50E+04 1.74E+04 1.00E+03 PASS 3.37E+04 7.34E+03 5.39E+04 1.36E+04 1.00E+03 PASS 3.01E+04 1.86E+03 3.52E+04 2.50E+04 1.00E+03 PASS 3.43E+04 4.24E+03 4.60E+04 2.27E+04 7.00E+02 PASS 3.00E+04 3.19E+03 3.87E+04 2.12E+04 4.00E+02 PASS 3.10E+04 5.16E+03 4.51E+04 1.68E+04 4.00E+02 PASS 3.63E+04 6.87E+03 5.51E+04 1.75E+04 4.00E+02 PASS An ISO 9001:2008 and DSCC Certified Company 103 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) 2.00E+03 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.49. Plot of Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 104 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.49. Raw data for Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.54E+03 1.62E+03 1.89E+03 1.76E+03 1.58E+03 1.86E+03 1.62E+03 1.91E+03 1.75E+03 2.03E+03 2.32E+03 1.68E+03 10 1.49E+03 1.48E+03 1.92E+03 1.64E+03 1.52E+03 1.72E+03 1.60E+03 1.79E+03 1.74E+03 1.88E+03 2.15E+03 1.63E+03 20 1.40E+03 1.43E+03 1.79E+03 1.46E+03 1.36E+03 1.63E+03 1.47E+03 1.70E+03 1.63E+03 1.91E+03 2.23E+03 1.65E+03 30 1.26E+03 1.31E+03 1.81E+03 1.39E+03 1.35E+03 1.39E+03 1.40E+03 1.62E+03 1.46E+03 1.66E+03 2.14E+03 1.66E+03 50 1.07E+03 1.11E+03 1.53E+03 1.30E+03 1.16E+03 1.25E+03 1.20E+03 1.35E+03 1.36E+03 1.50E+03 2.21E+03 1.56E+03 60 1.11E+03 1.14E+03 1.53E+03 1.30E+03 1.13E+03 1.31E+03 1.24E+03 1.47E+03 1.37E+03 1.52E+03 2.17E+03 1.58E+03 70 1.25E+03 1.25E+03 1.88E+03 1.55E+03 1.34E+03 1.61E+03 1.50E+03 1.76E+03 1.56E+03 1.98E+03 2.13E+03 1.59E+03 1.68E+03 1.44E+02 2.07E+03 1.28E+03 1.61E+03 1.83E+02 2.11E+03 1.11E+03 1.49E+03 1.74E+02 1.97E+03 1.01E+03 1.42E+03 2.21E+02 2.03E+03 8.15E+02 1.23E+03 1.86E+02 1.74E+03 7.25E+02 1.24E+03 1.80E+02 1.74E+03 7.50E+02 1.45E+03 2.68E+02 2.19E+03 7.19E+02 1.83E+03 1.57E+02 2.26E+03 1.40E+03 3.00E+02 PASS 1.75E+03 1.04E+02 2.03E+03 1.46E+03 3.00E+02 PASS 1.67E+03 1.60E+02 2.10E+03 1.23E+03 3.00E+02 PASS 1.51E+03 1.26E+02 1.85E+03 1.16E+03 2.00E+02 PASS 1.33E+03 1.16E+02 1.65E+03 1.01E+03 1.20E+02 PASS 1.38E+03 1.14E+02 1.69E+03 1.07E+03 1.20E+02 PASS 1.68E+03 1.91E+02 2.20E+03 1.16E+03 1.20E+02 PASS An ISO 9001:2008 and DSCC Certified Company 105 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.50. Plot of Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 106 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.50. Raw data for Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.46E+03 1.48E+03 1.49E+03 1.43E+03 1.41E+03 1.37E+03 1.44E+03 1.46E+03 1.45E+03 1.46E+03 1.47E+03 1.51E+03 10 1.39E+03 1.41E+03 1.37E+03 1.37E+03 1.35E+03 1.34E+03 1.41E+03 1.39E+03 1.39E+03 1.40E+03 1.41E+03 1.52E+03 20 1.27E+03 1.34E+03 1.33E+03 1.28E+03 1.25E+03 1.21E+03 1.35E+03 1.30E+03 1.30E+03 1.31E+03 1.43E+03 1.49E+03 30 1.28E+03 1.30E+03 1.25E+03 1.29E+03 1.20E+03 1.15E+03 1.29E+03 1.23E+03 1.19E+03 1.21E+03 1.41E+03 1.49E+03 50 1.05E+03 1.16E+03 1.08E+03 1.14E+03 1.02E+03 1.01E+03 1.20E+03 1.09E+03 1.05E+03 1.09E+03 1.40E+03 1.51E+03 60 1.08E+03 1.20E+03 1.12E+03 1.16E+03 1.03E+03 1.03E+03 1.17E+03 1.02E+03 1.10E+03 1.13E+03 1.40E+03 1.50E+03 70 1.22E+03 1.44E+03 1.31E+03 1.30E+03 1.13E+03 1.23E+03 1.36E+03 1.24E+03 1.28E+03 1.33E+03 1.43E+03 1.53E+03 1.45E+03 3.45E+01 1.55E+03 1.36E+03 1.38E+03 2.20E+01 1.44E+03 1.32E+03 1.29E+03 3.83E+01 1.40E+03 1.19E+03 1.26E+03 4.02E+01 1.37E+03 1.15E+03 1.09E+03 6.08E+01 1.26E+03 9.23E+02 1.12E+03 6.70E+01 1.30E+03 9.35E+02 1.28E+03 1.16E+02 1.60E+03 9.59E+02 1.44E+03 3.67E+01 1.54E+03 1.34E+03 3.00E+02 PASS 1.39E+03 2.62E+01 1.46E+03 1.31E+03 3.00E+02 PASS 1.29E+03 5.03E+01 1.43E+03 1.16E+03 3.00E+02 PASS 1.21E+03 5.13E+01 1.36E+03 1.07E+03 2.00E+02 PASS 1.09E+03 7.13E+01 1.28E+03 8.91E+02 1.20E+02 PASS 1.09E+03 6.60E+01 1.27E+03 9.09E+02 1.20E+02 PASS 1.29E+03 5.58E+01 1.44E+03 1.13E+03 1.20E+02 PASS An ISO 9001:2008 and DSCC Certified Company 107 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +15V RL=50kΩ (V) 1.44E+01 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.51. Plot of Output Voltage High 1 @ +15V RL=50kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 108 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.51. Raw data for Output Voltage High 1 @ +15V RL=50kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +15V RL=50kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 10 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 20 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 30 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 50 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 60 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 70 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.42E+01 1.42E+01 4.21E-03 1.43E+01 1.42E+01 1.42E+01 4.51E-03 1.43E+01 1.42E+01 1.42E+01 4.69E-03 1.43E+01 1.42E+01 1.42E+01 4.83E-03 1.43E+01 1.42E+01 1.42E+01 4.77E-03 1.43E+01 1.42E+01 1.42E+01 4.60E-03 1.43E+01 1.42E+01 1.42E+01 4.69E-03 1.43E+01 1.42E+01 1.42E+01 8.94E-04 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 4.47E-04 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 8.94E-04 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 8.94E-04 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 5.48E-04 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 4.47E-04 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 4.47E-04 1.42E+01 1.42E+01 1.30E+01 PASS An ISO 9001:2008 and DSCC Certified Company 109 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +15V RL=50kΩ (V) 1.44E+01 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.52. Plot of Output Voltage High 2 @ +15V RL=50kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 110 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.52. Raw data for Output Voltage High 2 @ +15V RL=50kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +15V RL=50kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 10 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 20 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 30 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 50 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 60 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 70 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 2.39E-03 1.43E+01 1.42E+01 1.43E+01 3.03E-03 1.43E+01 1.43E+01 1.43E+01 2.88E-03 1.43E+01 1.43E+01 1.43E+01 3.63E-03 1.43E+01 1.43E+01 1.43E+01 3.49E-03 1.43E+01 1.42E+01 1.43E+01 2.95E-03 1.43E+01 1.42E+01 1.43E+01 2.61E-03 1.43E+01 1.43E+01 1.43E+01 5.48E-04 1.43E+01 1.43E+01 1.30E+01 PASS 1.43E+01 8.94E-04 1.43E+01 1.43E+01 1.30E+01 PASS 1.43E+01 1.34E-03 1.43E+01 1.43E+01 1.30E+01 PASS 1.43E+01 7.07E-04 1.43E+01 1.43E+01 1.30E+01 PASS 1.43E+01 0.00E+00 1.43E+01 1.43E+01 1.30E+01 PASS 1.43E+01 8.94E-04 1.43E+01 1.43E+01 1.30E+01 PASS 1.43E+01 8.94E-04 1.43E+01 1.43E+01 1.30E+01 PASS An ISO 9001:2008 and DSCC Certified Company 111 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +15V RL=2kΩ (V) 1.35E+01 1.30E+01 1.25E+01 1.20E+01 1.15E+01 1.10E+01 1.05E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.53. Plot of Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 112 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.53. Raw data for Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +15V RL=2kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.30E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.30E+01 1.31E+01 1.31E+01 1.31E+01 1.30E+01 1.31E+01 1.30E+01 10 1.30E+01 1.31E+01 1.31E+01 1.31E+01 1.30E+01 1.30E+01 1.30E+01 1.31E+01 1.31E+01 1.30E+01 1.31E+01 1.30E+01 20 1.30E+01 1.31E+01 1.31E+01 1.31E+01 1.30E+01 1.30E+01 1.30E+01 1.31E+01 1.31E+01 1.30E+01 1.31E+01 1.30E+01 30 1.30E+01 1.31E+01 1.31E+01 1.31E+01 1.30E+01 1.30E+01 1.30E+01 1.31E+01 1.31E+01 1.30E+01 1.31E+01 1.30E+01 50 1.30E+01 1.31E+01 1.31E+01 1.31E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.31E+01 1.30E+01 1.31E+01 1.30E+01 60 1.30E+01 1.31E+01 1.31E+01 1.31E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.31E+01 1.30E+01 1.31E+01 1.30E+01 70 1.30E+01 1.31E+01 1.31E+01 1.31E+01 1.30E+01 1.30E+01 1.30E+01 1.31E+01 1.31E+01 1.30E+01 1.31E+01 1.30E+01 1.31E+01 1.24E-02 1.31E+01 1.30E+01 1.31E+01 1.18E-02 1.31E+01 1.30E+01 1.31E+01 1.25E-02 1.31E+01 1.30E+01 1.31E+01 1.27E-02 1.31E+01 1.30E+01 1.30E+01 1.38E-02 1.31E+01 1.30E+01 1.30E+01 1.28E-02 1.31E+01 1.30E+01 1.31E+01 1.26E-02 1.31E+01 1.30E+01 1.31E+01 1.41E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.30E+01 1.47E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.30E+01 1.38E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.30E+01 1.48E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.30E+01 1.43E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.30E+01 1.45E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.30E+01 1.48E-02 1.31E+01 1.30E+01 1.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 113 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +15V RL=2kΩ (V) 1.35E+01 1.30E+01 1.25E+01 1.20E+01 1.15E+01 1.10E+01 1.05E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.54. Plot of Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 114 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.54. Raw data for Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +15V RL=2kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 10 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 20 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 30 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 50 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 60 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 70 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.31E+01 1.07E-02 1.31E+01 1.31E+01 1.31E+01 1.09E-02 1.31E+01 1.31E+01 1.31E+01 1.14E-02 1.31E+01 1.31E+01 1.31E+01 1.12E-02 1.31E+01 1.31E+01 1.31E+01 1.22E-02 1.31E+01 1.31E+01 1.31E+01 1.20E-02 1.31E+01 1.31E+01 1.31E+01 1.16E-02 1.31E+01 1.31E+01 1.31E+01 1.41E-02 1.31E+01 1.31E+01 1.10E+01 PASS 1.31E+01 1.40E-02 1.31E+01 1.31E+01 1.10E+01 PASS 1.31E+01 1.26E-02 1.31E+01 1.31E+01 1.10E+01 PASS 1.31E+01 1.36E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.31E+01 1.40E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.31E+01 1.41E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.31E+01 1.39E-02 1.31E+01 1.31E+01 1.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 115 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage Low 1 @ +15V RL=50kΩ (V) -1.28E+01 -1.30E+01 -1.32E+01 -1.34E+01 -1.36E+01 -1.38E+01 -1.40E+01 -1.42E+01 -1.44E+01 -1.46E+01 -1.48E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.55. Plot of Output Voltage Low 1 @ +15V RL=50kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 116 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.55. Raw data for Output Voltage Low 1 @ +15V RL=50kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +15V RL=50kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 10 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 20 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 30 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 50 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 24 hr Anneal 168 hr Anneal 60 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 70 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.45E+01 1.14E-03 1.79E-03 1.30E-03 1.41E-03 8.94E-04 1.22E-03 1.30E-03 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.45E+01 -1.45E+01 1.41E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS -1.45E+01 1.67E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS -1.45E+01 1.87E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS -1.45E+01 1.30E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS An ISO 9001:2008 and DSCC Certified Company 117 -1.45E+01 1.79E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS -1.46E+01 1.87E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.45E+01 1.48E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage Low 2 @ +15V RL=50kΩ (V) -1.28E+01 -1.30E+01 -1.32E+01 -1.34E+01 -1.36E+01 -1.38E+01 -1.40E+01 -1.42E+01 -1.44E+01 -1.46E+01 -1.48E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.56. Plot of Output Voltage Low 2 @ +15V RL=50kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 118 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.56. Raw data for Output Voltage Low 2 @ +15V RL=50kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +15V RL=50kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 10 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 20 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 30 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 50 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 24 hr Anneal 168 hr Anneal 60 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 70 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.45E+01 3.08E-03 2.88E-03 2.61E-03 2.12E-03 2.30E-03 2.12E-03 2.28E-03 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.45E+01 -1.45E+01 1.64E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS -1.45E+01 1.73E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS -1.45E+01 2.19E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS -1.45E+01 1.52E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS An ISO 9001:2008 and DSCC Certified Company 119 -1.45E+01 1.64E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS -1.46E+01 2.07E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.45E+01 1.34E-03 -1.45E+01 -1.45E+01 -1.30E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage Low 1 @ +15V RL=2kΩ (V) -6.00E+00 -7.00E+00 -8.00E+00 -9.00E+00 -1.00E+01 -1.10E+01 -1.20E+01 -1.30E+01 -1.40E+01 -1.50E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.57. Plot of Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 120 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.57. Raw data for Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +15V RL=2kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 10 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 20 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 30 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 50 -1.36E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 24 hr Anneal 168 hr Anneal 60 -1.37E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.37E+01 -1.36E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 70 -1.36E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 3.98E-02 4.14E-02 4.08E-02 4.16E-02 4.14E-02 4.13E-02 4.10E-02 -1.35E+01 -1.35E+01 -1.34E+01 -1.34E+01 -1.34E+01 -1.35E+01 -1.34E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.38E+01 -1.37E+01 -1.36E+01 1.41E-02 -1.36E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 1.46E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 1.70E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 1.39E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 121 -1.36E+01 1.49E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS -1.37E+01 1.46E-02 -1.36E+01 -1.37E+01 -1.10E+01 PASS -1.36E+01 1.42E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage Low 2 @ +15V RL=2kΩ (V) -6.00E+00 -7.00E+00 -8.00E+00 -9.00E+00 -1.00E+01 -1.10E+01 -1.20E+01 -1.30E+01 -1.40E+01 -1.50E+01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.58. Plot of Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 122 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.58. Raw data for Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +15V RL=2kΩ (V) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 10 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 20 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 30 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 50 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 24 hr Anneal 168 hr Anneal 60 -1.37E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 70 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.37E+01 -1.36E+01 3.95E-02 4.11E-02 4.01E-02 4.15E-02 4.11E-02 4.04E-02 4.05E-02 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.38E+01 -1.37E+01 -1.36E+01 1.55E-02 -1.36E+01 -1.37E+01 -1.10E+01 PASS -1.36E+01 1.52E-02 -1.36E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 1.77E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 1.53E-02 -1.36E+01 -1.36E+01 -1.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 123 -1.36E+01 1.56E-02 -1.36E+01 -1.36E+01 -1.10E+01 PASS -1.37E+01 1.53E-02 -1.36E+01 -1.37E+01 -1.10E+01 PASS -1.36E+01 1.56E-02 -1.36E+01 -1.36E+01 -1.10E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Slew Rate 1 @ +15V (V/us) 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.59. Plot of Positive Slew Rate 1 @ +15V (V/us) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 124 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.59. Raw data for Positive Slew Rate 1 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 1 @ +15V (V/us) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.13E-01 1.04E-01 9.80E-02 1.16E-01 1.10E-01 1.12E-01 1.24E-01 1.16E-01 1.18E-01 1.25E-01 1.22E-01 1.18E-01 10 1.09E-01 1.26E-01 1.18E-01 1.17E-01 1.10E-01 1.11E-01 1.19E-01 1.13E-01 1.20E-01 1.16E-01 1.16E-01 9.90E-02 20 1.11E-01 1.19E-01 1.15E-01 1.17E-01 1.06E-01 9.80E-02 1.15E-01 1.12E-01 1.20E-01 1.14E-01 1.18E-01 1.19E-01 30 1.08E-01 1.14E-01 1.10E-01 9.90E-02 1.09E-01 1.09E-01 1.15E-01 1.06E-01 1.15E-01 1.16E-01 1.18E-01 1.18E-01 50 1.03E-01 9.30E-02 1.08E-01 1.08E-01 9.50E-02 9.50E-02 1.13E-01 1.07E-01 1.11E-01 1.06E-01 1.24E-01 1.20E-01 60 1.05E-01 1.10E-01 1.11E-01 1.12E-01 9.90E-02 1.04E-01 1.10E-01 1.09E-01 1.14E-01 1.06E-01 1.20E-01 1.16E-01 70 7.20E-02 1.14E-01 1.15E-01 1.16E-01 1.05E-01 1.10E-01 1.18E-01 1.12E-01 1.19E-01 1.10E-01 1.18E-01 1.13E-01 1.08E-01 7.22E-03 1.28E-01 8.84E-02 1.16E-01 6.89E-03 1.35E-01 9.71E-02 1.14E-01 5.18E-03 1.28E-01 9.94E-02 1.08E-01 5.52E-03 1.23E-01 9.29E-02 1.01E-01 7.09E-03 1.21E-01 8.20E-02 1.07E-01 5.41E-03 1.22E-01 9.26E-02 1.04E-01 1.86E-02 1.55E-01 5.33E-02 1.19E-01 5.48E-03 1.34E-01 1.04E-01 6.00E-02 PASS 1.16E-01 3.83E-03 1.26E-01 1.05E-01 5.00E-02 PASS 1.12E-01 8.26E-03 1.34E-01 8.92E-02 5.00E-02 PASS 1.12E-01 4.44E-03 1.24E-01 1.00E-01 4.00E-02 PASS 1.06E-01 6.99E-03 1.26E-01 8.72E-02 3.00E-02 PASS 1.09E-01 3.85E-03 1.19E-01 9.81E-02 3.00E-02 PASS 1.14E-01 4.38E-03 1.26E-01 1.02E-01 3.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 125 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Slew Rate 2 @ +15V (V/us) 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.60. Plot of Positive Slew Rate 2 @ +15V (V/us) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 126 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.60. Raw data for Positive Slew Rate 2 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 2 @ +15V (V/us) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.09E-01 1.22E-01 1.16E-01 1.15E-01 1.11E-01 1.14E-01 1.23E-01 1.01E-01 1.16E-01 1.19E-01 1.21E-01 1.15E-01 10 1.13E-01 1.17E-01 1.22E-01 1.18E-01 1.13E-01 1.10E-01 1.18E-01 1.14E-01 1.22E-01 1.16E-01 1.03E-01 1.20E-01 20 1.13E-01 1.15E-01 1.18E-01 1.14E-01 1.13E-01 9.70E-02 1.17E-01 1.12E-01 1.14E-01 1.13E-01 1.18E-01 1.14E-01 30 1.10E-01 1.15E-01 1.15E-01 1.19E-01 1.09E-01 1.09E-01 1.19E-01 1.05E-01 1.14E-01 1.13E-01 1.18E-01 1.16E-01 50 1.07E-01 1.13E-01 1.12E-01 1.12E-01 1.04E-01 9.80E-02 1.10E-01 1.08E-01 1.10E-01 1.09E-01 1.22E-01 1.16E-01 60 9.30E-02 1.09E-01 1.10E-01 1.13E-01 1.02E-01 1.03E-01 1.11E-01 1.03E-01 1.10E-01 1.07E-01 1.22E-01 9.80E-02 70 1.09E-01 1.09E-01 1.12E-01 1.13E-01 1.05E-01 9.70E-02 1.19E-01 1.16E-01 1.16E-01 1.09E-01 1.15E-01 1.21E-01 1.15E-01 5.03E-03 1.28E-01 1.01E-01 1.17E-01 3.78E-03 1.27E-01 1.06E-01 1.15E-01 2.07E-03 1.20E-01 1.09E-01 1.14E-01 4.10E-03 1.25E-01 1.02E-01 1.10E-01 3.91E-03 1.20E-01 9.89E-02 1.05E-01 8.02E-03 1.27E-01 8.34E-02 1.10E-01 3.13E-03 1.18E-01 1.01E-01 1.15E-01 8.32E-03 1.37E-01 9.18E-02 6.00E-02 PASS 1.16E-01 4.47E-03 1.28E-01 1.04E-01 5.00E-02 PASS 1.11E-01 7.83E-03 1.32E-01 8.91E-02 5.00E-02 PASS 1.12E-01 5.29E-03 1.27E-01 9.75E-02 4.00E-02 PASS 1.07E-01 5.10E-03 1.21E-01 9.30E-02 3.00E-02 PASS 1.07E-01 3.77E-03 1.17E-01 9.65E-02 3.00E-02 PASS 1.11E-01 8.85E-03 1.36E-01 8.71E-02 3.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 127 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Slew Rate 1 @ +15V (V/us) 0.00E+00 -2.00E-02 -4.00E-02 -6.00E-02 -8.00E-02 -1.00E-01 -1.20E-01 -1.40E-01 -1.60E-01 0 10 20 30 40 50 24-Hr 60 Anneal 168-Hr 70 Anneal Total Dose (krad(Si)) Figure 5.61. Plot of Negative Slew Rate 1 @ +15V (V/us) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 128 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.61. Raw data for Negative Slew Rate 1 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 1 @ +15V (V/us) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.18E-01 -1.26E-01 -1.24E-01 -1.22E-01 -1.25E-01 -1.19E-01 -1.23E-01 -1.21E-01 -1.30E-01 -1.27E-01 -1.22E-01 -1.22E-01 10 -1.18E-01 -1.26E-01 -1.17E-01 -1.06E-01 -1.02E-01 -1.07E-01 -1.18E-01 -1.23E-01 -1.23E-01 -1.26E-01 -1.30E-01 -1.20E-01 20 -1.17E-01 -1.23E-01 -1.19E-01 -1.26E-01 -1.15E-01 -1.15E-01 -1.27E-01 -1.14E-01 -1.27E-01 -1.22E-01 -1.23E-01 -1.22E-01 30 -1.17E-01 -1.28E-01 -1.23E-01 -1.22E-01 -1.17E-01 -1.09E-01 -1.02E-01 -1.18E-01 -1.21E-01 -1.21E-01 -1.15E-01 -1.03E-01 50 -1.09E-01 -1.22E-01 -1.18E-01 -1.17E-01 -1.09E-01 -9.70E-02 -1.13E-01 -1.13E-01 -1.13E-01 -1.13E-01 -1.24E-01 -1.22E-01 24 hr Anneal 168 hr Anneal 60 -1.11E-01 -1.22E-01 -1.13E-01 -1.17E-01 -1.11E-01 -9.50E-02 -1.21E-01 -1.13E-01 -1.19E-01 -1.17E-01 -1.24E-01 -1.25E-01 70 -1.16E-01 -1.20E-01 -1.15E-01 -1.23E-01 -1.15E-01 -1.12E-01 -1.22E-01 -1.03E-01 -1.25E-01 -1.22E-01 -1.27E-01 -1.24E-01 -1.23E-01 -1.14E-01 -1.20E-01 -1.21E-01 -1.15E-01 -1.15E-01 -1.18E-01 3.16E-03 9.71E-03 4.47E-03 4.62E-03 5.79E-03 4.71E-03 3.56E-03 -1.14E-01 -8.72E-02 -1.08E-01 -1.09E-01 -9.91E-02 -1.02E-01 -1.08E-01 -1.32E-01 -1.40E-01 -1.32E-01 -1.34E-01 -1.31E-01 -1.28E-01 -1.28E-01 -1.24E-01 4.47E-03 -1.12E-01 -1.36E-01 -6.00E-02 PASS -1.19E-01 7.50E-03 -9.88E-02 -1.40E-01 -5.00E-02 PASS -1.21E-01 6.28E-03 -1.04E-01 -1.38E-01 -5.00E-02 PASS -1.14E-01 8.41E-03 -9.11E-02 -1.37E-01 -4.00E-02 PASS -1.10E-01 7.16E-03 -9.02E-02 -1.29E-01 -3.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 129 -1.13E-01 1.05E-02 -8.42E-02 -1.42E-01 -3.00E-02 PASS -1.17E-01 9.15E-03 -9.17E-02 -1.42E-01 -3.00E-02 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Slew Rate 2 @ +15V (V/us) 0.00E+00 -2.00E-02 -4.00E-02 -6.00E-02 -8.00E-02 -1.00E-01 -1.20E-01 -1.40E-01 -1.60E-01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-Hr 60 Anneal 168-Hr 70 Anneal Figure 5.62. Plot of Negative Slew Rate 2 @ +15V (V/us) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 130 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table 5.62. Raw data for Negative Slew Rate 2 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 2 @ +15V (V/us) Device 255 258 309 359 360 416 472 473 526 529 530 561 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.24E-01 -1.23E-01 -1.21E-01 -1.27E-01 -1.19E-01 -1.19E-01 -1.25E-01 -1.23E-01 -1.28E-01 -1.27E-01 -1.23E-01 -1.21E-01 10 -1.21E-01 -1.11E-01 -1.25E-01 -1.27E-01 -1.19E-01 -1.18E-01 -1.27E-01 -1.17E-01 -1.25E-01 -1.21E-01 -1.29E-01 -1.06E-01 20 -1.22E-01 -1.18E-01 -1.26E-01 -1.24E-01 -1.20E-01 -1.15E-01 -1.23E-01 -1.23E-01 -1.22E-01 -1.26E-01 -1.29E-01 -1.22E-01 30 -1.16E-01 -1.27E-01 -1.18E-01 -1.23E-01 -1.15E-01 -1.13E-01 -1.20E-01 -1.17E-01 -1.26E-01 -1.08E-01 -1.27E-01 -1.24E-01 50 -1.10E-01 -1.16E-01 -1.22E-01 -1.22E-01 -1.11E-01 -9.50E-02 -1.17E-01 -1.11E-01 -1.19E-01 -1.23E-01 -1.21E-01 -1.26E-01 24 hr Anneal 168 hr Anneal 60 -1.15E-01 -1.17E-01 -1.22E-01 -1.20E-01 -1.12E-01 -1.13E-01 -1.18E-01 -1.20E-01 -1.20E-01 -1.17E-01 -1.33E-01 -1.22E-01 70 -1.13E-01 -1.19E-01 -1.05E-01 -1.20E-01 -1.12E-01 -1.18E-01 -1.29E-01 -1.15E-01 -1.29E-01 -1.25E-01 -1.25E-01 -1.23E-01 -1.23E-01 -1.21E-01 -1.22E-01 -1.20E-01 -1.16E-01 -1.17E-01 -1.14E-01 3.03E-03 6.23E-03 3.16E-03 5.07E-03 5.76E-03 3.96E-03 6.06E-03 -1.14E-01 -1.04E-01 -1.13E-01 -1.06E-01 -1.00E-01 -1.06E-01 -9.72E-02 -1.31E-01 -1.38E-01 -1.31E-01 -1.34E-01 -1.32E-01 -1.28E-01 -1.30E-01 -1.24E-01 3.58E-03 -1.15E-01 -1.34E-01 -6.00E-02 PASS -1.22E-01 4.34E-03 -1.10E-01 -1.33E-01 -5.00E-02 PASS -1.22E-01 4.09E-03 -1.11E-01 -1.33E-01 -5.00E-02 PASS -1.17E-01 6.83E-03 -9.81E-02 -1.36E-01 -4.00E-02 PASS -1.13E-01 1.10E-02 -8.30E-02 -1.43E-01 -3.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 131 -1.18E-01 2.88E-03 -1.10E-01 -1.25E-01 -3.00E-02 PASS -1.23E-01 6.42E-03 -1.06E-01 -1.41E-01 -3.00E-02 PASS TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The high dose rate total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. Samples of the RH1078MJ8 Dual Precision Op Amp described in this report were irradiated biased with a static split 15V supply and unbiased (all leads tied to ground). The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with a pre-irradiation baseline reading as well as incremental readings at 10, 20, and 30krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. In addition, all unitsunder-test received a 24hr room temperature and 168hr 100°C anneal, using the same bias conditions as the radiation exposure. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a device to pass the total dose test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. Using the conditions stated above, the RH1078MJ8 Dual Precision Op Amp (from the lot date code identified on the first page of this test report) passed the total dose test to the maximum tested level of 50krad(Si) with no significant degradation observed on any measured parameter. Note that the data presented in this report for the units-under-test irradiated in the unbiased condition and the KTL statistics are for reference only and are not used for the determination of “PASS/FAIL” for the lot. Further, the data in this report can be analyzed along with the report titled “Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1078MJ8 Dual Precision Op Amp for Linear Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method. An ISO 9001:2008 and DSCC Certified Company 132 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of device-under-test to show part markings An ISO 9001:2008 and DSCC Certified Company 133 TID Report 10-004 100412 R1.0 Appendix B: TID Bias Connections Biased Samples: Pin 1 2 3 4 5 6 7 8 Function OUT A -INPUT A +INPUT A V+INPUT B -INPUT B OUT B V+ Connection / Bias To Pin 2 via 10kΩ Resistor To Pin 1 via 10kΩ Resistor To 8V via 10kΩ Resistor To –15V using 0.1μF Decoupling To 8V via 10kΩ Resistor To Pin 9 via 10kΩ Resistor To Pin 8 via 10kΩ Resistor To +15V using 0.1μF Decoupling Unbiased Samples: Pin 1 2 3 4 5 6 7 8 Function OUT A -INPUT A +INPUT A V+INPUT B -INPUT B OUT B V+ Connection / Bias GND GND GND GND GND GND GND GND An ISO 9001:2008 and DSCC Certified Company 134 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from LINEAR TECHNOLOGY CORPORATION RH1078M Datasheet. Figure B.2. J8 package drawing (for reference only). This figure was extracted from LINEAR TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K “MICROCIRCUIT, LINEAR, MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY, PRECISION OP AMP”. An ISO 9001:2008 and DSCC Certified Company 135 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, operational amplifiers, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1. Note that test numbers 19 and 20 are modified from the datasheet condition of VCM=100mV to VCM=0V. This is because the LTS2020 measurement circuit has an impedance of ~333kΩ, such that at 100mV it is effectively injecting ~300nA of current. This is enough to raise the measured VOL by ~1mV. In our estimation, modifying the test condition as specified, plus biasing the amp not being measured to have a VOUT of ~100mV to make sure it’s not saturated, reduces the current injected by the measurement circuit to ~30nA or less. A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2008 and DSCC Certified Company 136 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 Table C.1. Measured parameters and test conditions for the RH1078MJ8. TEST NUMBER TEST DESCRIPTION TEST CONDITIONS 1 Positive Supply Current (ICC2) V=+5V 2 Negative Supply Current (IEE2) V=+5V 3&4 Input Offset Voltage (VOS1 &VOS2) V=+5V 5&6 Input Offset Current (IOS1 & IOS2) V=+5V 7&8 + Input Bias Current (IB+1 & IB+2) V=+5V 9 & 10 - Input Bias Current (IB-1 & IB-2) V=+5V 11 & 12 Common Mode Rejection Ratio (CMRR1 & CMRR2) V=+5V, VCM = 0V to 3.5V 13 & 14 Power Supply Rejection Ratio (PSRR1 & PSRR2) V= 2.3V to 12V 15 & 16 Large Signal Voltage Gain (AVOL 1 &AVOL2) V=+5V, RL =Open 17 & 18 Large Signal Voltage Gain (AVOL3 &AVOL4) V=+5V, RL =50kΩ 19 & 20 VOUT Low (VOUTLOW1 & VOUTLOW2) V=+5V, RL =Open, VCM = 0V* 21 & 22 VOUT Low (VOUTLOW3 & VOUTLOW4) V=+5V, RL =2kΩ 23 & 24 VOUT Low (VOUTLOW5 & VOUTLOW6) V=+5V, ISINK=100µA 25 & 26 VOUT High (VOUTHIGH1 & VOUTHIGH2) V=+5V, RL =Open 27 & 28 VOUT High (VOUTHIGH3 & VOUTHIGH4) V=+5V, RL =2kΩ 29 & 30 +SR (Slew Rate 1 and Slew Rate 2) V=+5V, AV=1 31 & 32 -SR (Slew Rate 3 and Slew Rate 4) V=+5V, AV=1 33 Positive Supply Current (ICC2) V=±15V 34 Negative Supply Current (IEE2) V=±15V 35 & 36 Input Offset Voltage (VOS3 &VOS4) V=±15V 37 & 38 Input Offset Current (IOS3 & IOS4) V=±15V 39 & 40 + Input Bias Current (IB+3 & IB+4) V=±15V 41 & 42 - Input Bias Current (IB-3 & IB-4) V=±15V An ISO 9001:2008 and DSCC Certified Company 137 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 TEST NUMBER TEST DESCRIPTION TEST CONDITIONS 43 & 44 Common Mode Rejection Ratio (CMRR3 & CMRR4) V=±15V, VCM = 13.5V, –15V Power Supply Rejection Ratio (PSRR3 & PSRR4) V= 5V, 0V to ±18V Large Signal Voltage Gain (AVOL 5 &AVOL6) V=±15V, RL=50kΩ 49 & 50 Large Signal Voltage Gain (AVOL 7 &AVOL8) V=±15V, RL=2kΩ 51 & 52 VOUT High (VOUTHIGH5 & VOUTHIGH6) V=±15V, RL=50kΩ 53 & 54 VOUT High (VOUTHIGH7 & VOUTHIGH8) V=±15V, RL=2kΩ 55 & 56 VOUT Low (VOUTLOW7 & VOUTLOW8) V=±15V, RL=50kΩ 57 & 58 VOUT Low (VOUTLOW9 & VOUTLOW10) V=±15V, RL=2kΩ 59 & 60 +SR (Slew Rate 5 and Slew Rate 6) V=±15V, AV=1 60 & 61 -SR (Slew Rate 7 and Slew Rate 8) V=±15V, AV=1 45 & 46 47 & 48 * This is non-datasheet condition, see above for explanation. An ISO 9001:2008 and DSCC Certified Company 138 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution for the RH1078MJ8. Pre-Irradiation Specification Measurement Resolution/Precision Positive Supply Current (ICC) 1.5E-04A ± 1.31E-06A Negative Supply Current (IEE) -1.5E-04A ± 1.07E-06A Input Offset Voltage (VOS1 &VOS2) ±1.2E-04V ± 3.41E-06V Input Offset Current (IOS1 & IOS2) ±8E-10A ± 5.06E-11A + Input Bias Current (IB+1 & IB+2) ±1.5E-08A ± 5.88E-11A - Input Bias Current (IB-1 & IB-2) ±1.5E-08A ± 8.03E-11A 94dB ± 3.12E+00 dB 100dB ± 5.70E+00dB Large Signal Voltage Gain (AVOL 1 &AVOL2) 150V/mV ± 2.69E+02V/mV Large Signal Voltage Gain (AVOL3 &AVOL4) 120V/mV ± 7.13E+02 V/mV VOUT Low (VOUTLOW1 & VOUTLOW2) 6E-03V ± 1.16E-04V VOUT Low (VOUTLOW3 & VOUTLOW4) 2E-03V ± 3.43E-05V VOUT Low (VOUTLOW5 & VOUTLOW6) 1.3E-01V ± 3.22E-04V VOUT High (VOUTHIGH1 & VOUTHIGH2) 4.2V ± 3.11E-03V VOUT High (VOUTHIGH3 & VOUTHIGH4) 3.5V ± 2.13E-03V +SR (Slew Rate 1 and Slew Rate 2) 4E-02V/μs ± 1.07E-03V/μs -SR (Slew Rate 3 and Slew Rate 4) -4E-02V/μs ± 1.81E-03 V/μs 2E-04A ± 1.74E-06A Measured Parameter Common Mode Rejection Ratio (CMRR1 & CMRR2) Power Supply Rejection Ratio (PSRR1 & PSRR2) Positive Supply Current (ICC2) An ISO 9001:2008 and DSCC Certified Company 139 TID Report 10-004 100412 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Pre-Irradiation Specification Measurement Resolution/Precision Negative Supply Current (IEE2) -2E-04A ± 9.73E-07A Input Offset Voltage (VOS3 &VOS4) ±3.5E-4V ± 2.51E-06V Input Offset Current (IOS3 & IOS4) ±8E-10A ± 3.54E-11A + Input Bias Current (IB+3 & IB+4) ±1.5E-08A ± 3.89E-11A - Input Bias Current (IB-3 & IB-4) ±1.5E-08A ± 7.51E-11A 97dB ± 2.98E-01dB 100dB ± 4.20E+00dB Large Signal Voltage Gain (AVOL 5 &AVOL6) 1000V/mV ± 2.34E+04V/mV Large Signal Voltage Gain (AVOL 7 &AVOL8) 300V/mV ± 7.07E+01V/mV VOUT High (VOUTHIGH5 & VOUTHIGH6) 13V ± 2.38E-03V VOUT High (VOUTHIGH7 & VOUTHIGH8) 11V ± 1.17E-03V VOUT Low (VOUTLOW7 & VOUTLOW8) -13V ± 1.75E-03V VOUT Low (VOUTLOW9 & VOUTLOW10) -11V ± 4.14E-03V +SR (Slew Rate 5 and Slew Rate 6) 6E-02V/μs ± 6.97E-03V/μs -SR (Slew Rate 7 and Slew Rate 8) -6E-02V/μs ± 9.02E-03V/μs Measured Parameter Common Mode Rejection Ratio (CMRR3 & CMRR4) Power Supply Rejection Ratio (PSRR3 & PSRR4) An ISO 9001:2008 and DSCC Certified Company 140 TID Report 10-004 100412 R1.0 Appendix D: List of Figures used in Section 5 (Test Results) 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 5.14 5.15 5.16 5.17 5.18 5.19 5.20 5.21 5.22 5.23 5.24 5.25 5.26 5.27 5.28 5.29 5.30 5.31 5.32 5.33 5.34 5.35 5.36 5.37 5.38 5.39 Positive Supply Current @ +5V (A) Negative Supply Current @ +5V (A) Input Offset Voltage 1 @ +5V (V) Input Offset Voltage 2 @ +5V (V) Input Offset Current 1 @ +5V (A) Input Offset Current 2 @ +5V (A) Positive Input Bias Current 1 @ +5V (A) Positive Input Bias Current 2 @ +5V (A) Negative Input Bias Current 1 @ +5V (A) Negative Input Bias Current 2 @+5V (A) Common Mode Rejection Ratio 1 @ +5V (dB) Common Mode Rejection Ratio 2 @ +5V (dB) Power Supply Rejection Ratio 1 @ +5V (dB) Power Supply Rejection Ratio 2 @ +5V (dB) Open Loop Gain 1 @ +5V, RL=open (V/mV) Open Loop Gain 2 @ +5V, RL=open (V/mV) Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) Output Voltage Low 1 @ +5V RL=open (V) Output Voltage Low 2 @ +5V RL=open (V) Output Voltage Low 1 @ +5V RL=2kΩ (V) Output Voltage Low 2 @ +5V RL=2kΩ (V) Output Voltage Low 1 @ +5V IL=100uA (V) Output Voltage Low 2 @ +5V IL=100uA (V) Output Voltage High 1 @ +5V RL=open (V) Output Voltage High 2 @ +5V RL=open (V) Output Voltage High 1 @ +5V RL=2kΩ (V) Output Voltage High 2 @ +5V RL=2kΩ (V) Positive Slew Rate 1 @ +5V (V/us) Positive Slew Rate 2 @ +5V (V/us) Negative Slew Rate 1 @ +5V (V/us) Negative Slew Rate 2 @ +5V (V/us) Positive Supply Current @ +15V (A) Negative Supply Current @ +15V (A) Input Offset Voltage 1 @ +15V (V) Input Offset Voltage 2 @ +15V (V) Input Offset Current 1 @ +15V (A) Input Offset Current 2 @ +15V (A) Positive Input Bias Current 1 @ +15V (A) An ISO 9001:2008 and DSCC Certified Company 141 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 TID Report 10-004 100412 R1.0 5.40 5.41 5.42 5.43 5.44 5.45 5.46 5.47 5.48 5.49 5.50 5.51 5.52 5.53 5.54 5.55 5.56 5.57 5.58 5.59 5.60 5.61 5.62 Positive Input Bias Current 2 @ +15V (A) Negative Input Bias Current 1 @ +15V (A) Negative Input Bias Current 2 @ +15V (A) Common Mode Rejection Ratio 1 @ +15V (dB) Common Mode Rejection Ratio 2 @ +15V (dB) Power Supply Rejection Ratio 1 @ +15V (dB) Power Supply Rejection Ratio 2 @ +15V (dB) Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) Output Voltage High 1 @ +15V RL=open (V) Output Voltage High 2 @ +15V RL=open (V) Output Voltage High 1 @ +15V RL=2kΩ (V) Output Voltage High 2 @ +15V RL=2kΩ (V) Output Voltage Low 1 @ +15V RL=open (V) Output Voltage Low 2 @ +15V RL=open (V) Output Voltage Low 1 @ +15V RL=2kΩ (V) Output Voltage Low 2 @ +15V RL=2kΩ (V) Positive Slew Rate 1 @ +15V (V/us) Positive Slew Rate 2 @ +15V (V/us) Negative Slew Rate 1 @ +15V (V/us) Negative Slew Rate 2 @ +15V (V/us) An ISO 9001:2008 and DSCC Certified Company 142 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800