STMICROELECTRONICS STP7NC40

STP7NC40
N-CHANNEL 400V - 0.75Ω - 6A TO-220
PowerMESH™II MOSFET
■
■
■
■
TYPE
VDSS
RDS(on)
ID
STP7NC40
400 V
<1Ω
6A
TYPICAL RDS(on) = 0.75Ω
EXCEPTIONAL dv/dt CAPABILITY
100% AVALANCHE TESTED
LOW GATE CHARGE
3
1
DESCRIPTION
The PowerMESH™II is the evolution of the first generation of MESH OVERLAY™. The layout refinements introduced greatly improve the Ron*area
figure of merit while keeping the device at the leading edge for what concerns swithing speed, gate
charge and ruggedness.
2
TO-220
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ HIGH-EFFICIENCY DC-DC CONVERTERS
■ UPS AND MOTOR CONTROL
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Parameter
Value
Unit
Drain-source Voltage (VGS = 0)
400
V
Drain-gate Voltage (RGS = 20 kΩ)
400
V
Gate- source Voltage
± 30
V
6
A
ID
Drain Current (continuos) at TC = 25°C
ID
Drain Current (continuos) at TC = 100°C
4
A
Drain Current (pulsed)
24
A
Total Dissipation at TC = 25°C
100
W
Derating Factor
0.8
W/°C
IDM (●)
PTOT
dv/dt(1)
Tstg
Tj
Peak Diode Recovery voltage slope
Storage Temperature
Max. Operating Junction Temperature
(●) Pulse width limited by safe operating area
March 2001
3
V/ns
–65 to 150
°C
150
°C
(1)ISD ≤6A, di/dt ≤100A/µs, VDD ≤ V (BR)DSS, T j ≤ T JMAX.
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STP7NC40
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
1.25
°C/W
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Rthc-sink
Thermal Resistance Case-sink Typ
0.5
°C/W
Maximum Lead Temperature For Soldering Purpose
300
°C
Tl
AVALANCHE CHARACTERISTICS
Symbol
Parameter
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V)
Max Value
Unit
6
A
320
mJ
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
V(BR)DSS
IDSS
IGSS
Parameter
Test Conditions
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
Gate-body Leakage
Current (VDS = 0)
VGS = ±30V
Min.
Typ.
Max.
400
Unit
V
VDS = Max Rating, TC = 125 °C
1
µA
50
µA
±100
nA
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10V, ID = 3 A
ID(on)
On State Drain Current
VDS > ID(on) x RDS(on)max,
VGS = 10V
Min.
Typ.
Max.
Unit
2
3
4
V
0.75
1
Ω
6
A
DYNAMIC
Symbol
gfs (1)
2/8
Parameter
Forward Transconductance
Test Conditions
VDS > ID(on) x RDS(on)max,
ID = 3 A
VDS = 25V, f = 1 MHz, VGS = 0
Min.
Typ.
Max.
Unit
5.1
S
530
pF
Ciss
Input Capacitance
Coss
Output Capacitance
90
pF
Crss
Reverse Transfer
Capacitance
15
pF
STP7NC40
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
Qg
Qgs
Qgd
Parameter
Turn-on Delay Time
Rise Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Test Conditions
Min.
VDD = 200V, ID = 3 A
RG = 4.7Ω VGS = 10V
(see test circuit, Figure 3)
VDD = 320V, ID =6A,
VGS = 10V
Typ.
Max.
Unit
11
ns
15
ns
18
4
8.5
23
nC
nC
nC
Typ.
Max.
Unit
SWITCHING OFF
Symbol
td(off)
tf
tc
Parameter
Off-voltage Rise Time
Fall Time
Cross-over Time
Test Conditions
Min.
8
12
23
Vclamp =320V, ID = 6 A
RG = 4.7Ω, VGS = 10V
(see test circuit, Figure 5)
ns
ns
ns
SOURCE DRAIN DIODE
Symbol
Max.
Unit
Source-drain Current
6
A
ISDM (2)
Source-drain Current (pulsed)
24
A
VSD (1)
Forward On Voltage
ISD = 6 A, VGS = 0
1.6
V
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 6 A, di/dt = 100A/µs,
VDD = 100V, Tj = 150°C
(see test circuit, Figure 5)
ISD
trr
Qrr
IRRM
Parameter
Test Conditions
Min.
Typ.
280
1.4
10
ns
µC
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedence
3/8
STP7NC40
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/8
STP7NC40
Normalized Gate Thereshold Voltage vs Temp.
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/8
STP7NC40
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/8
STP7NC40
TO-220 MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
4.40
4.60
0.173
0.181
C
1.23
1.32
0.048
0.051
D
2.40
2.72
0.094
D1
0.107
1.27
0.050
E
0.49
0.70
0.019
0.027
F
0.61
0.88
0.024
0.034
F1
1.14
1.70
0.044
0.067
F2
1.14
1.70
0.044
0.067
G
4.95
5.15
0.194
0.203
G1
2.4
2.7
0.094
0.106
H2
10.0
10.40
0.393
0.409
L2
16.4
0.645
13.0
14.0
0.511
0.551
L5
2.65
2.95
0.104
0.116
L6
15.25
15.75
0.600
0.620
L7
6.2
6.6
0.244
0.260
L9
3.5
3.93
0.137
0.154
DIA.
3.75
3.85
0.147
0.151
D1
C
D
A
E
L4
H2
G
G1
F1
L2
F2
F
Dia.
L5
L9
L7
L6
L4
P011C
7/8
STP7NC40
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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