TI SN74LVC2G66QDCURQ1

SN74LVC2G66-Q1
www.ti.com
SCES829A – JUNE 2011 – REVISED JULY 2012
DUAL BILATERAL ANALOG SWITCH
Check for Samples: SN74LVC2G66-Q1
FEATURES
1
•
•
•
•
•
•
•
Qualified for Automotive Applications
AEC-Q100 Qualified With the Following
Results:
– Device Temperature Grade 1: –40°C to
125°C Ambient Operating Temperature
Range
– Device HBM ESD Classification Level H2
– Device CDM ESD Classification Level C3B
1.65-V to 5.5-V VCC Operation
Inputs Accept Voltages to 5.5 V
High On-Off Output Voltage Ratio
High Degree of Linearity
High Speed, Typically 0.5 ns
•
•
(VCC = 3 V, CL = 50 pF)
Rail-to-Rail Input/Output
Low On-State Resistance, Typically ≉6 Ω
(VCC = 4.5 V)
DCU PACKAGE
(TOP VIEW)
1A
1B
2C
GND
1
8
VCC
2
7
3
6
4
5
1C
2B
2A
DESCRIPTION
The design of this dual bilateral analog switch is for 1.65-V to 5.5-V VCC operation. The SN74LVC2G66-Q1 can
handle both analog and digital signals. The device permits signals with amplitudes of up to 5.5 V (peak) to be
transmitted in either direction. Each switch section has its own enable-input control (C). A high-level voltage
applied to C turns on the associated switch section.
Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for
analog-to-digital and digital-to-analog conversion systems.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011–2012, Texas Instruments Incorporated
SN74LVC2G66-Q1
SCES829A – JUNE 2011 – REVISED JULY 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
PACKAGE (1)
TA
–40°C to 125°C
(1)
(2)
VSSOP – DCU
ORDERABLE PART NUMBER
Reel of 3000
SN74LVC2G66QDCURQ1
TOP-SIDE MARKING (2)
CAY_
Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
DCU: The actual top-side marking has one additional character that designates the assembly/test site.
FUNCTION TABLE
(EACH SECTION)
CONTROL
INPUT
(C)
SWITCH
L
Off
H
On
LOGIC DIAGRAM, EACH SWITCH (POSITIVE LOGIC)
1A
1C
1
2
1B
7
One of Two Switches
ABSOLUTE MAXIMUM RATINGS (1)
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
VCC
Supply voltage range (2)
–0.5
6.5
V
VI
Input voltage range (2)
–0.5
6.5
V
–0.5
VCC + 0.5
(3)
(2) (3) (4)
UNIT
VO
Switch I/O voltage range
IIK
Control input clamp current
VI < 0
–50
mA
II/OK
I/O port diode current
VI/O < 0 or VI/O > VCC
–50
mA
IT
On-state switch current
VI/O = 0 to VCC
±50
mA
±100
mA
Continuous current through VCC or GND
Tstg
Storage temperature range
ESD
ratin
gs
Human-Body Model (HBM) AEC-Q100 Classification Level H2
(1)
(2)
(3)
(4)
2
–65
Charged-Device Model (CDM) AEC-Q100 Classification Level C3B
V
150
°C
2
kV
750
V
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltages are with respect to ground, unless otherwise specified.
Exceeding the input and output negative-voltage ratings is permitted when in observance of the input and output clamp-current ratings.
This limit on this value is limited 5.5 V maximum.
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SCES829A – JUNE 2011 – REVISED JULY 2012
THERMAL INFORMATION
THERMAL METRIC
SN74LVC2G66Q1
(1)
DCU
UNIT
8 PINS
(2)
θJA
Junction-to-ambient thermal resistance
θJCtop
Junction-to-case (top) thermal resistance (3)
θJB
Junction-to-board thermal resistance (4)
(5)
204.4
°C/W
77
°C/W
83.2
°C/W
ψJT
Junction-to-top characterization parameter
7.1
°C/W
ψJB
Junction-to-board characterization parameter (6)
82.7
°C/W
θJCbot
Junction-to-case (bottom) thermal resistance (7)
N/A
°C/W
(1)
(2)
(3)
(4)
(5)
(6)
(7)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDECstandard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7).
The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θJA , using a procedure described in JESD51-2a (sections 6 and 7).
The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
Spacer
RECOMMENDED OPERATING CONDITIONS (1)
MIN
MAX
VCC
Supply voltage
1.65
5.5
V
VI/O
I/O port voltage
0
VCC
V
VCC = 1.65 V to 1.95 V
VIH
High-level input voltage, control input
VCC × 0.65
VCC = 2.3 V to 2.7 V
VCC × 0.7
VCC = 3 V to 3.6 V
VCC × 0.7
VCC = 4.5 V to 5.5 V
VCC × 0.7
VCC = 1.65 V to 1.95 V
VIL
Low-level input voltage, control input
VI
Control input voltage
Input transition rise/fall time
TA
Operating free-air temperature
VCC × 0.35
VCC × 0.3
VCC = 3 V to 3.6 V
VCC × 0.3
V
VCC × 0.3
0
5.5
VCC = 1.65 V to 1.95 V
20
VCC = 2.3 V to 2.7 V
20
VCC = 3 V to 3.6 V
10
VCC = 4.5 V to 5.5 V
(1)
V
VCC = 2.3 V to 2.7 V
VCC = 4.5 V to 5.5 V
Δt/Δv
UNIT
V
ns/V
10
–40
125
°C
Hold all unused inputs of the device at VCC or GND to ensure proper device operation. See the TI application report, Implications of
Slow or Floating CMOS Inputs, literature number SCBA004.
Copyright © 2011–2012, Texas Instruments Incorporated
Product Folder Link(s): SN74LVC2G66-Q1
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SN74LVC2G66-Q1
SCES829A – JUNE 2011 – REVISED JULY 2012
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ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
ron
TEST CONDITIONS
On-state switch resistance
ron(p)
Peak on-state resistance
VI = VCC or GND,
VC = VIH
(see Figure 1 and Figure 2)
VI = VCC to GND,
VC = VIH
(see Figure 1 and Figure 2)
VCC
MIN TYP (1)
MAX
IS = 4 mA
1.65 V
12.5
35
IS = 8 mA
2.3 V
9
30
IS = 24 mA
3V
7.5
20
IS = 32 mA
4.5 V
6
15
IS = 4 mA
1.65 V
85
120 (1)
IS = 8 mA
2.3 V
22
30 (1)
IS = 24 mA
3V
12
25
IS = 32 mA
4.5 V
7.5
20
IS = 4 mA
1.65 V
10
IS = 8 mA
2.3 V
8
IS = 24 mA
3V
6
IS = 32 mA
4.5 V
UNIT
Ω
Ω
Difference of on-state resistance
between switches
VI = VCC to GND,
VC = VIH
(see Figure 1 and Figure 2)
IS(off)
Off-state switch leakage current
VI = VCC and VO = GND or
VI = GND and VO = VCC,
VC = VIL (see Figure 3)
5.5 V
IS(on)
On-state switch leakage current
VI = VCC or GND, VC = VIH, VO = Open
(see Figure 4)
5.5 V
II
Control input current
VC = VCC or GND
5.5 V
ICC
Supply current
VC = VCC or GND
5.5 V
ΔICC
Supply-current change
VC = VCC – 0.6 V
5.5 V
Cic
Control input capacitance
5V
3.5
pF
Cio(off)
Switch input/output capacitance
5V
6
pF
Cio(on)
Switch input/output capacitance
5V
14
pF
Δron
(1)
Ω
5
±2
±0.1 (1)
±2
±0.1 (1)
±1
±0.1 (1)
15
1 (1)
500
μA
μA
μA
μA
μA
TA = 25°C
SWITCHING CHARACTERISTICS
over recommended operating free-air temperature range (unless otherwise noted) (see Figure 5)
PARAMETER
(1)
(2)
4
FROM
(INPUT)
TO
(OUTPUT)
VCC = 1.8 V
± 0.15 V
VCC = 2.5 V
± 0.2 V
VCC = 3.3 V
± 0.3 V
VCC = 5 V
± 0.5 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
UNIT
ten
(1)
C
A or B
2.3
12
1.6
7.5
1.5
6.4
1.3
5.9
ns
tdis
(2)
C
A or B
2.2
12.5
1.2
7.9
2
9.2
1.1
8.3
ns
tPZL and tPZH are the same as ten.
tPLZ and tPHZ are the same as tdis.
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SCES829A – JUNE 2011 – REVISED JULY 2012
ANALOG SWITCH CHARACTERISTICS
TA = 25°C
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
TEST CONDITIONS
VCC
CL = 50 pF, RL = 600 Ω,
fin = sine wave
(see Figure 6)
Frequency response
(switch on)
A or B
B or A
CL = 5 pF, RL = 50 Ω,
fin = sine wave
(see Figure 6)
CL = 50 pF, RL = 600 Ω,
fin = 1 MHz (sine wave)
(see Figure 7)
(1)
Crosstalk
(between switches)
A or B
B or A
CL = 5 pF, RL = 50 Ω,
fin = 1 MHz (sine wave)
(see Figure 7)
Crosstalk
(control input to signal output)
C
CL = 50 pF, RL = 600 Ω,
fin = 1 MHz (square wave)
(see Figure 8)
A or B
CL = 50 pF, RL = 600 Ω,
fin = 1 MHz (sine wave)
(see Figure 9)
Feedthrough attenuation
(switch off)
A or B
B or A
CL = 5 pF, RL = 50 Ω,
fin = 1 MHz (sine wave)
(see Figure 9)
CL = 50 pF, RL = 10 kΩ,
fin = 1 kHz (sine wave)
(see Figure 10)
Sine-wave distortion
A or B
B or A
CL = 50 pF, RL = 10 kΩ,
fin = 10 kHz (sine wave)
(see Figure 10)
(1)
TYP
1.65 V
35
2.3 V
120
3V
175
4.5 V
195
1.65 V
>300
2.3 V
>300
3V
>300
4.5 V
>300
1.65 V
–58
2.3 V
–58
3V
–58
4.5 V
–58
1.65 V
–42
2.3 V
–42
3V
–42
4.5 V
–42
1.65 V
35
2.3 V
50
3V
70
4.5 V
100
1.65 V
–58
2.3 V
–58
3V
–58
4.5 V
–58
1.65 V
–42
2.3 V
–42
3V
–42
4.5 V
–42
1.65 V
0.1
2.3 V
0.025
3V
0.015
4.5 V
0.01
1.65 V
0.15
2.3 V
0.025
3V
0.015
4.5 V
0.01
UNIT
MHz
dB
mV
dB
%
Adjust fin voltage to obtain 0 dBm at input.
OPERATING CHARACTERISTICS
TA = 25°C
PARAMETER
Cpd
Power-dissipation capacitance
TEST
CONDITIONS
VCC = 1.8 V
VCC = 2.5 V
VCC = 3.3 V
VCC = 5 V
TYP
TYP
TYP
TYP
f = 10 MHz
8
9
9.5
11
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UNIT
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pF
5
SN74LVC2G66-Q1
SCES829A – JUNE 2011 – REVISED JULY 2012
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PARAMETER MEASUREMENT INFORMATION
VCC
VCC
B or A
A or B
VI = VCC or GND
VO
C
VC
VIH
(On)
GND
IS
r on +
V
VI * VO
W
IS
VI - VO
Figure 1. On-State Resistance Test Circuit
100
VCC = 1.65 V
ron - Ω
VCC = 2.3 V
VCC = 3.0 V
10
1
0.0
VCC = 4.5 V
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
VIN - V
Figure 2. Typical ron as a Function of Input Voltage (VI) for VI = 0 to VCC
6
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SCES829A – JUNE 2011 – REVISED JULY 2012
PARAMETER MEASUREMENT INFORMATION (continued)
VCC
VCC
VI
B or A
A or B
A
VIL
VO
C
VC
(Off)
GND
Condition 1: VI = GND, VO = VCC
Condition 2: VI = VCC, VO = GND
Figure 3. Off-State Switch Leakage-Current Test Circuit
VCC
VCC
VI = VCC or GND
B or A
A or B
A
VO
VO = Open
VIH
C
VC
(On)
GND
Figure 4. On-State Leakage-Current Test Circuit
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SN74LVC2G66-Q1
SCES829A – JUNE 2011 – REVISED JULY 2012
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PARAMETER MEASUREMENT INFORMATION (continued)
VLOAD
S1
RL
From Output
Under Test
Open
TEST
GND
CL
(see Note A)
S1
Open
VLOAD
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
RL
GND
LOAD CIRCUIT
INPUTS
VCC
1.8 V ± 0.15 V
2.5 V ± 0.2 V
3.3 V ± 0.3 V
5 V ± 0.5 V
VI
tr/tf
VCC
VCC
VCC
VCC
≤2 ns
≤2 ns
≤2.5 ns
≤2.5 ns
VM
VLOAD
CL
RL
V∆
VCC/2
VCC/2
VCC/2
VCC/2
2 × VCC
2 × VCC
2 × VCC
2 × VCC
30 pF
30 pF
50 pF
50 pF
1 kΩ
500 Ω
500 Ω
500 Ω
0.15 V
0.15 V
0.3 V
0.3 V
VI
Timing Input
VM
0V
tW
tsu
VI
Input
VM
VM
th
VI
Data Input
VM
VM
0V
0V
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VI
VM
Input
VM
0V
tPLH
VOH
VM
VOL
tPHL
tPLZ
VLOAD/2
VM
tPZH
VM
VM
VM
0V
Output
Waveform 1
S1 at VLOAD
(see Note B)
tPLH
VOH
Output
VM
tPZL
tPHL
VM
Output
VI
Output
Control
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
Output
Waveform 2
S1 at GND
(see Note B)
VOL + V∆
VOL
tPHZ
VM
VOH – V∆
VOH
≈0 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators have the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω.
D. The outputs are measured one at a time, with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd.
H. All parameters and waveforms are not applicable to all devices.
Figure 5. Load Circuit and Voltage Waveforms
8
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SCES829A – JUNE 2011 – REVISED JULY 2012
PARAMETER MEASUREMENT INFORMATION (continued)
VCC
VCC
0.1 µF
VO
C
VC
VIH
50 Ω
fin
B or A
A or B
RL
(On)
GND
CL
VCC/2
RL/CL: 600 Ω/50 pF
RL/CL: 50 Ω/5 pF
Figure 6. Frequency Response (Switch On)
VCC
VCC
0.1 µF
Rin
600 Ω
fin
1B or 1A
1A or 1B
RL
600 Ω
C
VC
VIH
50 Ω
VO1
CL
50 pF
(On)
VCC/2
2B or 2A
2A or 2B
Rin
600 Ω
VO2
RL
600 Ω
C
VC
VIL
(Off)
GND
CL
50 pF
VCC/2
20log10(VO2/VI1) or
20log10(VO1/VI2)
Figure 7. Crosstalk (Between Switches)
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PARAMETER MEASUREMENT INFORMATION (continued)
VCC
VCC
B or A
A or B
VCC/2
VO
Rin
600 Ω
CL
50 pF
RL
600 Ω
C
VC
50 Ω
GND
VCC/2
Figure 8. Crosstalk (Control Input, Switch Output)
VCC
VCC
0.1 µF
fin
50 Ω
B or A
A or B
RL
VIL
C
VC
VO
RL
(Off)
GND
VCC/2
CL
VCC/2
RL/CL: 600 Ω/50 pF
RL/CL: 50 Ω/5 pF
Figure 9. Feedthrough (Switch Off)
10
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SCES829A – JUNE 2011 – REVISED JULY 2012
PARAMETER MEASUREMENT INFORMATION (continued)
VCC
VCC
10 µF
fin
600 Ω
VIH
10 µF
B or A
A or B
VO
RL
10 kΩ
C
VC
(On)
GND
CL
50 pF
VCC/2
VCC = 1.65 V, VI = 1.4 VP-P
VCC = 2.3 V, VI = 2 VP-P
VCC = 3 V, VI = 2.5 VP-P
VCC = 4.5 V, VI = 4 VP-P
Figure 10. Sine-Wave Distortion
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PACKAGE OPTION ADDENDUM
www.ti.com
24-Jul-2012
PACKAGING INFORMATION
Orderable Device
SN74LVC2G66QDCURQ1
Status
(1)
Package Type Package
Drawing
ACTIVE
US8
DCU
Pins
Package Qty
8
3000
Eco Plan
(2)
Green (RoHS
& no Sb/Br)
Lead/
Ball Finish
MSL Peak Temp
(3)
Samples
(Requires Login)
CU NIPDAU Level-1-260C-UNLIM
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF SN74LVC2G66-Q1 :
• Catalog: SN74LVC2G66
NOTE: Qualified Version Definitions:
• Catalog - TI's standard catalog product
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
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24-Jul-2012
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
SN74LVC2G66QDCURQ1
Package Package Pins
Type Drawing
US8
DCU
8
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
3000
180.0
8.4
Pack Materials-Page 1
2.25
B0
(mm)
K0
(mm)
P1
(mm)
3.35
1.05
4.0
W
Pin1
(mm) Quadrant
8.0
Q3
PACKAGE MATERIALS INFORMATION
www.ti.com
24-Jul-2012
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
SN74LVC2G66QDCURQ1
US8
DCU
8
3000
202.0
201.0
28.0
Pack Materials-Page 2
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