SECOS SMG2328NE

SMG2328NE
6.3 A, 20 V, RDS(ON) 22 m
N-Channel Enhancement MOSFET
Elektronische Bauelemente
RoHS Compliant Product
A suffix of “-C” specifies halogen & lead-free
SC-59
DESCRIPTION
These miniature surface mount MOSFETs utilize a
high cell density trench process to provide low RDS(on) and to
ensure minimal power loss and heat dissipation. Typical
applications are DC-DC converters and power management
in portable and battery-powered products such as computers,
printers,PCMCIA cards, cellular and cordless telephones.
A
L
3
3
C B
Top View
1
1
K
2
E
2
D
FEATURES




F
Low RDS(on) provides higher efficiency and extends battery life.
Low thermal impedance copper leadframe SC-59 saves board
space.
Fast switching speed.
High performance trench technology.
REF.
A
B
C
D
E
F
PACKAGE INFORMATION
Package
MPQ
LeaderSize
SC-59
3K
7’ inch
G
Millimeter
Min.
Max.
2.70
3.10
2.25
3.00
1.30
1.70
1.00
1.40
1.70
2.30
0.35
0.50
H
REF.
G
H
J
K
L
J
Millimeter
Min.
Max.
0.10 REF.
0.40 REF.
0.10
0.20
0.45
0.55
0.85
1.15
ESD
Protection
Diode
2KV
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
Parameter
Symbol
Rating
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current 1
VDS
VGS
TA=25°C
TA=70°C
Pulsed Drain Current 2
Continuous Source Current (Diode Conduction) 1
TA=25°C
Power Dissipation 1
TA=70°C
Operating Junction and Storage Temperature Range
ID
IDM
IS
PD
TJ, TSTG
20
±8
6.3
5.2
20
1.6
1.3
0.9
-55 ~ 150
Unit
V
V
A
A
A
W
°C
Thermal Resistance Data
Maximum Junction to Ambient 1
t≦5 sec
Steady-State
RθJA
100
166
°C/W
Notes:
1. Surface Mounted on 1” x 1” FR4 Board.
2. Pulse width limited by maximum junction temperature.
http://www.SeCoSGmbH.com/
05-Jan-2011 Rev. A
Any changes of specification will not be informed individually.
Page 1 of 2
SMG2328NE
6.3 A, 20 V, RDS(ON) 22 m
N-Channel Enhancement MOSFET
Elektronische Bauelemente
ELECTRICAL CHARACTERISTICS (TA=25°C unless otherwise specified)
Parameter
Symbol Min
Typ Max Unit
Test Conditions
Static
Gate-Threshold Voltage
VGS(th)
0.4
-
-
V
VDS = VGS, ID = 250μA
Gate-Body Leakage
IGSS
-
-
±100
nA
VDS = 0V, VGS= ±8V
Zero Gate Voltage Drain Current
IDSS
-
-
1
-
-
10
On-State Drain Current 1
ID(ON)
10
-
-
-
-
22
-
-
26
Drain-Source On-Resistance 1
RDS(ON)
μA
A
mΩ
VDS = 16V, VGS= 0V
VDS = 16V, VGS= 0V, TJ=55°C
VDS = 5V, VGS= 4.5V
VGS= 4.5V, ID = 6.5A
VGS= 2.5V, ID = 5.8A
Forward Transconductance 1
gFS
-
11.3
-
S
VDS= 10V,,ID = 6.5A
Diode Forward Voltage
VSD
-
0.75
-
V
IS= 1.6A, VGS= 0V
Dynamic 2
Total Gate Charge
Qg
-
13.4
-
Gate-Source Charge
Qgs
-
0.9
-
Gate-Drain Charge
Qgd
-
2.0
-
Turn-On Delay Time
Td(ON)
-
8
-
Tr
-
24
-
Td(OFF)
-
35
-
Tf
-
10
-
Rise Time
Turn-Off Delay Time
Fall Time
nC
ID= 6.5A
VDS= 10V
VGS= 4.5V
nS
ID= 1A, VDD= 10V
VGEN= 4.5V
RL= 15Ω
Notes:
1. Pulse test:PW ≦ 300 us duty cycle ≦ 2%.
2. Guaranteed by design, not subject to production testing.
http://www.SeCoSGmbH.com/
05-Jan-2011 Rev. A
Any changes of specification will not be informed individually.
Page 2 of 2