### AVAGO MM-JESD22-A115-A

```AEDR-8400-140 and AEDR-8400-142
Reflective Surface Mount Optical Encoder
Reliability Data Sheet
Description
Failure Rate Prediction
The following cumulative test results have been obtained
from testing performed at Avago Technologies Malaysia
in accordance with the latest revisions of JEDEC Standard.
Avago tests parts at the absolute maximum rated conditions recommended for the device. The actual performance you obtain from Avago parts depends on the
electrical and environmental characteristics of your application but will probably be better than the performance
outlined in Table 1.
The failure rate of semiconductor devices is determined
by the junction temperature of the device. The relationship between ambient given by the following:
TJ(°C) = TA(°C) + qJAPAVG
Where,
TA = ambient temperature in °C
qJA = thermal resistance of junction-to-ambient in °C/
Watt
PAVG = average power dissipated in Watt
The estimated MTTF and failure rate at temperatures
lower than the actual stress temperature can be determined by using an Arrhenius model for temperature
acceleration. Results of such calculations are shown in
the table below using an activation energy of 0.43eV
(reference MIL-HDBK-217).
Table 1. Life Tests
Demonstrated Performance
Point Typical Performance
Test Name
Stress Test
Conditions
Total Device
Hours
Units
Tested
Total
Failed
MTTF
Failure Rate
(% /1 K Hours)
High Temperature
Operating Life
VCC=3.0V, TA=85°C,
1500hours
45,000
30
0
49,180
2.03
Table 2.
Ambient
Temperature
(°C)
Junction
Temperature
(°C)
85
Point Typical Performance [1]
in Time
Performance in Time [2]
(90% Confidence)
MTTF [1]
Failure Rate
(% / 1K Hours)
MTTF [2]
Failure Rate
(% /1K Hours)
89.7
49,180
2.03
19,520
5.12
75
79.7
72,640
1.38
28,840
3.47
65
69.7
109,800
0.91
43,580
2.29
55
59.7
170,000
0.59
67,500
1.48
45
49.7
270,700
0.37
107,400
0.93
35
39.7
443,800
0.23
176,200
0.57
25
29.7
751,900
0.13
298,500
0.34
Notes:
1. The point typical MTTF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero
failures, one failure is assumed for this calculation.
2. The 90% Confidence MTTF represents the minimum level of reliability performance which is expected from 90% of all samples. This confidence
interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This particular distribution is
commonly used in describing useful life failures.
3. Failures are catastrophic or parametric. Catastrophic failures are open, short, no logic output, no dynamic parameters while parametric failures
are failures to meet an electrical characteristic as specified in product catalog such as output voltage, duty or state errors.
Example of Failure Rate Calculation
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is:
(8 hours/day) x (5 days/week) / (168 hours/week) = 0.25
The point failure rate per year (8760 hours) at 55°C ambient temperature is:
(0.59% / 1K hours) x 0.25 X (8760 hours/year) = 1.29% per year
Similarly, 90% confidence level failure rate per year at 55°C:
(1.48% / 1K hours) X 0.25 X (8760 hours/year) = 3.24% per year
Table 3. Environmental Tests
Test Name
Test Conditions
Units Tested
Units Failed
Temperature Cycle
-40°C to 85°C, 15min dwell time, 5 min transfer, 1000 cycles
30
0
Wet High Temperature Storage life
TA=85°C, RH=85%, 1000 hours
30
0
Table 4. Electrical Tests
Test Name
Reference
Test Conditions
Units Tested
Units Failed
ESD- Human Body Model
HBM-JESD22-A114D
Up to 4kV applied to all pins versus ground
9
0
ESD- Machine Model
MM-JESD22-A115-A
Up to 300V applied to all pins versus ground
9
0
Table 5. Mechanical and Vibration shock
Test Name
Test Conditions
Units Tested
Units Failed
Mechanical Shock
15,20,30g 11ms,
5 successive shocks in each direction of 3 perpendicular axes of units
15
Pass
Vibration Shock
15,25,30g 20-2kHz, 10 cycles for ach g level.
15
Pass
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www.avagotech.com
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