LTC2249 14-Bit, 80Msps Low Power 3V ADC U FEATURES DESCRIPTIO ■ The LTC®2249 is a 14-bit 80Msps, low power 3V A/D converter designed for digitizing high frequency, wide dynamic range signals. The LTC2249 is perfect for demanding imaging and communications applications with AC performance that includes 73dB SNR and 90dB SFDR for signals well beyond the Nyquist frequency. ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ Sample Rate: 80Msps Single 3V Supply (2.7V to 3.4V) Low Power: 222mW 73dB SNR at 70MHz Input 90dB SFDR at 70MHz Input No Missing Codes Flexible Input: 1VP-P to 2VP-P Range 575MHz Full Power Bandwidth S/H Clock Duty Cycle Stabilizer Shutdown and Nap Modes Pin Compatible Family 80Msps: LTC2229 (12-Bit), LTC2249 (14-Bit) 65Msps: LTC2228 (12-Bit), LTC2248 (14-Bit) 40Msps: LTC2227 (12-Bit), LTC2247 (14-Bit) 25Msps: LTC2226 (12-Bit), LTC2246 (14-Bit) 10Msps: LTC2225 (12-Bit), LTC2245 (14-Bit) 32-Pin (5mm × 5mm) QFN Package U APPLICATIO S ■ ■ ■ ■ ■ DC specs include ±1LSB INL (typ), ±0.5LSB DNL (typ) and no missing codes over temperature. The transition noise is a low 1.2LSBRMS. A single 3V supply allows low power operation. A separate output supply allows the outputs to drive 0.5V to 3.3V logic. A single-ended CLK input controls converter operation. An optional clock duty cycle stabilizer allows high performance at full speed for a wide range of clock duty cycles. , LTC and LT are registered trademarks of Linear Technology Corporation. Wireless and Wired Broadband Communication Imaging Systems Ultrasound Spectral Analysis Portable Instrumentation U TYPICAL APPLICATIO REFH REFL SNR vs Input Frequency, –1dB, 2V Range 75 FLEXIBLE REFERENCE 74 73 OVDD ANALOG INPUT INPUT S/H – 14-BIT PIPELINED ADC CORE CORRECTION LOGIC D13 • • • D0 OUTPUT DRIVERS OGND 72 SNR (dBFS) + 71 70 69 68 67 CLOCK/DUTY CYCLE CONTROL 66 65 0 2229 TA01 CLK 100 50 150 INPUT FREQUENCY (MHz) 200 2249 G09 2249f 1 LTC2249 U W U PACKAGE/ORDER I FOR ATIO ORDER PART NUMBER D11 D12 D13 OF SENSE VCM VDD TOP VIEW 32 31 30 29 28 27 26 25 AIN+ 1 24 D10 AIN– 2 23 D9 REFH 3 22 D8 REFH 4 LTC2249CUH LTC2249IUH 21 OVDD 33 REFL 5 20 OGND REFL 6 19 D7 VDD 7 18 D6 GND 8 17 D5 QFN PART* MARKING 2249 D4 D3 D2 OE CLK 9 10 11 12 13 14 15 16 SHDN Supply Voltage (VDD) ................................................. 4V Digital Output Ground Voltage (OGND) ....... –0.3V to 1V Analog Input Voltage (Note 3) ..... –0.3V to (VDD + 0.3V) Digital Input Voltage .................... –0.3V to (VDD + 0.3V) Digital Output Voltage ................ –0.3V to (OVDD + 0.3V) Power Dissipation ............................................ 1500mW Operating Temperature Range LTC2249C ............................................... 0°C to 70°C LTC2249I .............................................–40°C to 85°C Storage Temperature Range ..................–65°C to 125°C Lead Temperature (Soldering, 10 sec).................. 300°C MODE W OVDD = VDD (Notes 1, 2) D1 W W AXI U RATI GS D0 U ABSOLUTE UH PACKAGE 32-LEAD (5mm × 5mm) PLASTIC QFN TJMAX = 125°C, θJA = 34°C/W EXPOSED PAD IS GND (PIN 33) MUST BE SOLDERED TO PCB Consult LTC Marketing for parts specified with wider operating temperature ranges. *The temperature grade is identified by a label on the shipping container. U CO VERTER CHARACTERISTICS The ● denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) PARAMETER CONDITIONS MIN Resolution (No Missing Codes) ● 14 TYP MAX UNITS Bits Integral Linearity Error Differential Analog Input (Note 5) ● –4 ±1 4 LSB Differential Linearity Error Differential Analog Input ● –1 ±0.5 1 LSB Offset Error (Note 6) ● –12 ±2 12 mV Gain Error External Reference ● –2.5 ±0.5 2.5 Offset Drift Full-Scale Drift Internal Reference External Reference Transition Noise SENSE = 1V %FS ±10 µV/°C ±30 ±15 ppm/°C ppm/°C 1 LSBRMS U U A ALOG I PUT The ● denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS VIN Analog Input Range (AIN+ –AIN–) 2.7V < VDD < 3.4V (Note 7) ● MIN VIN,CM Analog Input Common Mode Differential Input (Note 7) ● 1 IIN Analog Input Leakage Current 0V < AIN+, AIN– ● ISENSE SENSE Input Leakage 0V < SENSE < 1V ● IMODE MODE Pin Leakage ● tAP Sample-and-Hold Acquisition Delay Time tJITTER Sample-and-Hold Acquisition Delay Time Jitter 0.2 psRMS CMRR Analog Input Common Mode Rejection Ratio 80 dB < VDD TYP MAX 1V to 2V 1.5 UNITS V 1.9 V –1 1 µA –3 3 µA –3 3 µA 0 ns 2249f 2 LTC2249 W U DY A IC ACCURACY The ● denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. AIN = –1dBFS. (Note 4) SYMBOL PARAMETER CONDITIONS SNR Signal-to-Noise Ratio 5MHz Input MIN SFDR Spurious Free Dynamic Range 2nd or 3rd Harmonic Spurious Free Dynamic Range 4th Harmonic or Higher 73 dB 70MHz Input 73 dB 140MHz Input 72.6 dB 90 dB ● 70.8 5MHz Input ● 40MHz Input 90 dB 70MHz Input 75 90 dB 140MHz Input 85 dB 5MHz Input ● 40MHz Input 81 140MHz Input Signal-to-Noise Plus Distortion Ratio 95 dB 95 dB 95 dB 90 dB 72.9 dB 72.8 dB 70MHz Input 72.8 dB 140MHz Input 72.1 dB 5MHz Input ● 40MHz Input IMD UNITS dB 70MHz Input S/(N+D) MAX 73 40MHz Input SFDR TYP 70.2 Intermodulation Distortion fIN1 = 28.2MHz, fIN2 = 26.8MHz 90 dB Full Power Bandwidth Figure 8 Test Circuit 575 MHz U U U I TER AL REFERE CE CHARACTERISTICS (Note 4) PARAMETER CONDITIONS MIN TYP MAX VCM Output Voltage IOUT = 0 1.475 1.500 1.525 VCM Output Tempco ±30 UNITS V ppm/°C VCM Line Regulation 2.7V < VDD < 3.4V 3 mV/V VCM Output Resistance –1mA < IOUT < 1mA 4 Ω 2249f 3 LTC2249 U U DIGITAL I PUTS A D DIGITAL OUTPUTS The ● denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS LOGIC INPUTS (CLK, OE, SHDN) VIH High Level Input Voltage VDD = 3V ● VIL Low Level Input Voltage VDD = 3V ● IIN Input Current VIN = 0V to VDD ● CIN Input Capacitance (Note 7) 2 V –10 0.8 V 10 µA 3 pF LOGIC OUTPUTS OVDD = 3V COZ Hi-Z Output Capacitance OE = High (Note 7) 3 pF ISOURCE Output Source Current VOUT = 0V 50 mA ISINK Output Sink Current VOUT = 3V 50 mA VOH High Level Output Voltage IO = –10µA IO = –200µA ● IO = 10µA IO = 1.6mA ● VOL Low Level Output Voltage 2.7 2.995 2.99 0.005 0.09 V V V V 0.4 OVDD = 2.5V VOH High Level Output Voltage IO = –200µA 2.49 V VOL Low Level Output Voltage IO = 1.6mA 0.09 V VOH High Level Output Voltage IO = –200µA 1.79 V VOL Low Level Output Voltage IO = 1.6mA 0.09 V OVDD = 1.8V U W POWER REQUIRE E TS The ● denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 8) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS VDD Analog Supply Voltage (Note 9) ● 2.7 3 3.4 V OVDD Output Supply Voltage (Note 9) IVDD Supply Current ● ● 0.5 3 3.6 V 74 86 mA PDISS Power Dissipation ● 222 258 mW PSHDN Shutdown Power SHDN = H, OE = H, No CLK 2 mW PNAP Nap Mode Power SHDN = H, OE = L, No CLK 15 mW 2249f 4 LTC2249 WU TI I G CHARACTERISTICS The ● denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS MIN fs Sampling Frequency (Note 9) ● 1 tL CLK Low Time Duty Cycle Stabilizer Off Duty Cycle Stabilizer On (Note 7) ● ● 5.9 5 tH CLK High Time Duty Cycle Stabilizer Off Duty Cycle Stabilizer On (Note 7) ● ● tAP Sample-and-Hold Aperture Delay tD CLK to DATA Delay CL = 5pF (Note 7) ● Data Access Time After OE↓ CL = 5pF (Note 7) BUS Relinquish Time (Note 7) TYP MAX UNITS 80 MHz 6.25 6.25 500 500 ns ns 5.9 5 6.25 6.25 500 500 ns ns 1.4 2.7 5.4 ns ● 4.3 10 ns ● 3.3 8.5 0 Pipeline Latency ns 6 Note 1: Absolute Maximum Ratings are those values beyond which the life of a device may be impaired. Note 2: All voltage values are with respect to ground with GND and OGND wired together (unless otherwise noted). Note 3: When these pin voltages are taken below GND or above VDD, they will be clamped by internal diodes. This product can handle input currents of greater than 100mA below GND or above VDD without latchup. Note 4: VDD = 3V, fSAMPLE = 80MHz, input range = 2VP-P with differential drive, unless otherwise noted. ns Cycles Note 5: Integral nonlinearity is defined as the deviation of a code from a straight line passing through the actual endpoints of the transfer curve. The deviation is measured from the center of the quantization band. Note 6: Offset error is the offset voltage measured from –0.5 LSB when the output code flickers between 00 0000 0000 0000 and 11 1111 1111 1111. Note 7: Guaranteed by design, not subject to test. Note 8: VDD = 3V, fSAMPLE = 80MHz, input range = 1VP-P with differential drive. Note 9: Recommended operating conditions. U W TYPICAL PERFOR A CE CHARACTERISTICS 8192 Point FFT, fIN = 5MHz, –1dB, 2V Range Typical DNL, 2V Range Typical INL, 2V Range 2.0 1.5 1.0 0 0.8 –10 –20 0.6 0.5 0 –0.5 –1.0 –30 0.4 AMPLITUDE (dB) DNL ERROR (LSB) INL ERROR (LSB) 1.0 0.2 0 –0.2 –0.4 –0.8 –2.0 –1.0 0 4096 8192 12288 16384 CODE –80 –100 –110 –120 0 4096 8192 12288 16384 CODE 2249 G01 –60 –70 –90 –0.6 –1.5 –40 –50 2249 G02 0 5 10 15 20 25 30 FREQUENCY (MHz) 35 40 2249 G03 2249f 5 LTC2249 U W TYPICAL PERFOR A CE CHARACTERISTICS 8192 Point FFT, fIN = 70MHz, –1dB, 2V Range 0 0 0 –10 –10 –20 –20 –20 –30 –30 –30 –60 –70 –80 –40 AMPLITUDE (dB) –40 –50 –50 –60 –70 –80 –40 –50 –60 –70 –80 –90 –90 –90 –100 –100 –100 –110 –110 –110 –120 –120 0 5 10 15 20 25 30 FREQUENCY (MHz) 35 40 5 0 10 15 20 25 30 FREQUENCY (MHz) 35 2249 G04 0 50000 45000 –20 40000 –30 COUNT –80 15000 25292 0 5 10 15 20 25 30 FREQUENCY (MHz) 35 40 69 66 1987 178 26 552 8203 70 67 6150 5194 8201 71 68 12558 5000 0 8205 8207 CODE 65 8209 2249 G09 SNR and SFDR vs Sample Rate, 2V Range, fIN = 5MHz, –1dB SNR and SFDR vs Clock Duty Cycle 95 100 100 200 100 50 150 INPUT FREQUENCY (MHz) 0 2249 G08 2249 G07 SFDR vs Input Frequency, –1dB, 2V Range 40 72 10000 –110 35 73 35969 25000 20000 –100 15 20 25 30 FREQUENCY (MHz) 74 30000 –70 –90 10 75 43161 SNR (dBFS) –40 –60 5 SNR vs Input Frequency, –1dB, 2V Range 35000 –50 0 2249 G06 Grounded Input Histogram –10 –120 –120 40 2249 G05 8192 Point 2-Tone FFT, fIN = 28.2MHz and 26.8MHz, –1dB, 2V Range AMPLITUDE (dB) 8192 Point FFT, fIN = 140MHz, –1dB, 2V Range –10 AMPLITUDE (dB) AMPLITUDE (dB) 8192 Point FFT, fIN = 30MHz, –1dB, 2V Range SFDR: DCS ON 95 90 SFDR (dBFS) 85 80 75 SNR AND SFDR (dBFS) SNR AND SFDR (dBFS) 90 90 SFDR 80 SNR 70 SFDR: DCS OFF 85 80 75 60 SNR: DCS ON 70 SNR: DCS OFF 65 0 50 100 150 INPUT FREQUENCY (MHz) 200 2249 G10 50 70 0 10 20 30 40 50 60 70 80 90 100 110 SAMPLE RATE (Msps) 2249 G11 30 35 40 45 50 55 60 CLOCK DUTY CYCLE (%) 65 70 2249 G12 2249f 6 LTC2249 U W TYPICAL PERFOR A CE CHARACTERISTICS SFDR vs Input Level, fIN = 70MHz, 2V Range SNR vs Input Level, fIN = 70MHz, 2V Range 80 120 dBFS 70 100 60 SFDR (dBc AND dBFS) SNR (dBc AND dBFS) dBFS 110 50 40 dBc 30 20 90 80 70 dBc 60 50 100dBc SFDR REFERENCE LINE 40 30 20 10 10 0 –70 –60 –50 –40 –30 –20 INPUT LEVEL (dBFS) –10 0 –80 0 –40 –60 –20 INPUT LEVEL (dBFS) 2249 G13 2249 G14 IOVDD vs Sample Rate, 5MHz Sine Wave Input, –1dB, OVDD = 1.8V IVDD vs Sample Rate, 5MHz Sine Wave Input, –1dB 85 7 80 6 IOVDD (mA) IVDD (mA) 0 75 2V RANGE 70 1V RANGE 5 4 65 3 60 2 55 1 50 0 0 10 20 30 40 50 60 70 80 90 100 SAMPLE RATE (Msps) 0 10 20 30 40 50 60 70 80 90 100 SAMPLE RATE (Msps) 2249 G15 2249 G16 U U U PI FU CTIO S AIN+ (Pin 1): Positive Differential Analog Input. AIN- (Pin 2): Negative Differential Analog Input. REFH (Pins 3, 4): ADC High Reference. Short together and bypass to pins 5, 6 with a 0.1µF ceramic chip capacitor as close to the pin as possible. Also bypass to pins 5, 6 with an additional 2.2µF ceramic chip capacitor and to ground with a 1µF ceramic chip capacitor. REFL (Pins 5, 6): ADC Low Reference. Short together and bypass to pins 3, 4 with a 0.1µF ceramic chip capacitor as close to the pin as possible. Also bypass to pins 3, 4 with an additional 2.2µF ceramic chip capacitor and to ground with a 1µF ceramic chip capacitor. VDD (Pins 7, 32): 3V Supply. Bypass to GND with 0.1µF ceramic chip capacitors. GND (Pin 8): ADC Power Ground. CLK (Pin 9): Clock Input. The input sample starts on the positive edge. SHDN (Pin 10): Shutdown Mode Selection Pin. Connecting SHDN to GND and OE to GND results in normal 2249f 7 LTC2249 U U U PI FU CTIO S operation with the outputs enabled. Connecting SHDN to GND and OE to VDD results in normal operation with the outputs at high impedance. Connecting SHDN to VDD and OE to GND results in nap mode with the outputs at high impedance. Connecting SHDN to VDD and OE to VDD results in sleep mode with the outputs at high impedance. straight binary output format and turns the clock duty cycle stabilizer off. 1/3 VDD selects straight binary output format and turns the clock duty cycle stabilizer on. 2/3 VDD selects 2’s complement output format and turns the clock duty cycle stabilizer on. VDD selects 2’s complement output format and turns the clock duty cycle stabilizer off. OE (Pin 11): Output Enable Pin. Refer to SHDN pin function. SENSE (Pin 30): Reference Programming Pin. Connecting SENSE to VCM selects the internal reference and a ±0.5V input range. VDD selects the internal reference and a ±1V input range. An external reference greater than 0.5V and less than 1V applied to SENSE selects an input range of ±VSENSE. ±1V is the largest valid input range. D0 – D13 (Pins 12, 13, 14, 15, 16, 17, 18, 19, 22, 23, 24, 25, 26, 27): Digital Outputs. D13 is the MSB. OGND (Pin 20): Output Driver Ground. OVDD (Pin 21): Positive Supply for the Output Drivers. Bypass to ground with 0.1µF ceramic chip capacitor. VCM (Pin 31): 1.5V Output and Input Common Mode Bias. Bypass to ground with 2.2µF ceramic chip capacitor. OF (Pin 28): Over/Under Flow Output. High when an over or under flow has occurred. GND (Exposed Pad) (Pin 33): ADC Power Ground. The exposed pad on the bottom of the package needs to be soldered to ground. MODE (Pin 29): Output Format and Clock Duty Cycle Stabilizer Selection Pin. Connecting MODE to GND selects W FUNCTIONAL BLOCK DIAGRA U U AIN+ AIN– VCM INPUT S/H FIRST PIPELINED ADC STAGE SECOND PIPELINED ADC STAGE THIRD PIPELINED ADC STAGE FOURTH PIPELINED ADC STAGE FIFTH PIPELINED ADC STAGE 1.5V REFERENCE SIXTH PIPELINED ADC STAGE SHIFT REGISTER AND CORRECTION 2.2µF RANGE SELECT REFH SENSE REFL INTERNAL CLOCK SIGNALS OVDD REF BUF OF D13 CLOCK/DUTY CYCLE CONTROL DIFF REF AMP CONTROL LOGIC OUTPUT DRIVERS • • • D0 REFH 0.1µF 2249 F01 REFL OGND CLK MODE SHDN OE 2.2µF 1µF 1µF Figure 1. Functional Block Diagram 2249f 8 LTC2249 WU W TI I G DIAGRA tAP N+4 N+2 N ANALOG INPUT N+3 tH N+5 N+1 tL CLK tD N–5 N–6 D0-D13, OF N–4 N–3 N–2 N–1 2249 TD01 U W U U APPLICATIO S I FOR ATIO DYNAMIC PERFORMANCE Intermodulation Distortion Signal-to-Noise Plus Distortion Ratio If the ADC input signal consists of more than one spectral component, the ADC transfer function nonlinearity can produce intermodulation distortion (IMD) in addition to THD. IMD is the change in one sinusoidal input caused by the presence of another sinusoidal input at a different frequency. The signal-to-noise plus distortion ratio [S/(N + D)] is the ratio between the RMS amplitude of the fundamental input frequency and the RMS amplitude of all other frequency components at the ADC output. The output is band limited to frequencies above DC to below half the sampling frequency. Signal-to-Noise Ratio The signal-to-noise ratio (SNR) is the ratio between the RMS amplitude of the fundamental input frequency and the RMS amplitude of all other frequency components except the first five harmonics and DC. Total Harmonic Distortion Total harmonic distortion is the ratio of the RMS sum of all harmonics of the input signal to the fundamental itself. The out-of-band harmonics alias into the frequency band between DC and half the sampling frequency. THD is expressed as: THD = 20Log √(V22 + V32 + V42 + . . . Vn2)/V1 where V1 is the RMS amplitude of the fundamental frequency and V2 through Vn are the amplitudes of the second through nth harmonics. The THD calculated in this data sheet uses all the harmonics up to the fifth. If two pure sine waves of frequencies fa and fb are applied to the ADC input, nonlinearities in the ADC transfer function can create distortion products at the sum and difference frequencies of mfa ± nfb, where m and n = 0, 1, 2, 3, etc. The 3rd order intermodulation products are 2fa + fb, 2fb + fa, 2fa – fb and 2fb – fa. The intermodulation distortion is defined as the ratio of the RMS value of either input tone to the RMS value of the largest 3rd order intermodulation product. Spurious Free Dynamic Range (SFDR) Spurious free dynamic range is the peak harmonic or spurious noise that is the largest spectral component excluding the input signal and DC. This value is expressed in decibels relative to the RMS value of a full scale input signal. Input Bandwidth The input bandwidth is that input frequency at which the amplitude of the reconstructed fundamental is reduced by 3dB for a full scale input signal. 2249f 9 LTC2249 U W U U APPLICATIO S I FOR ATIO Aperture Delay Time The time from when CLK reaches mid-supply to the instant that the input signal is held by the sample and hold circuit. Aperture Delay Jitter The variation in the aperture delay time from conversion to conversion. This random variation will result in noise when sampling an AC input. The signal to noise ratio due to the jitter alone will be: SNRJITTER = –20log (2π) • fIN • tJITTER CONVERTER OPERATION As shown in Figure 1, the LTC2249 is a CMOS pipelined multistep converter. The converter has six pipelined ADC stages; a sampled analog input will result in a digitized value six cycles later (see the Timing Diagram section). For optimal AC performance the analog inputs should be driven differentially. For cost sensitive applications, the analog inputs can be driven single-ended with slightly worse harmonic distortion. The CLK input is single-ended. The LTC2249 has two phases of operation, determined by the state of the CLK input pin. Each pipelined stage shown in Figure 1 contains an ADC, a reconstruction DAC and an interstage residue amplifier. In operation, the ADC quantizes the input to the stage and the quantized value is subtracted from the input by the DAC to produce a residue. The residue is amplified and output by the residue amplifier. Successive stages operate out of phase so that when the odd stages are outputting their residue, the even stages are acquiring that residue and vice versa. the second stage produces its residue which is acquired by the third stage. An identical process is repeated for the third, fourth and fifth stages, resulting in a fifth stage residue that is sent to the sixth stage ADC for final evaluation. Each ADC stage following the first has additional range to accommodate flash and amplifier offset errors. Results from all of the ADC stages are digitally synchronized such that the results can be properly combined in the correction logic before being sent to the output buffer. SAMPLE/HOLD OPERATION AND INPUT DRIVE Sample/Hold Operation Figure 2 shows an equivalent circuit for the LTC2249 CMOS differential sample-and-hold. The analog inputs are connected to the sampling capacitors (CSAMPLE) through NMOS transistors. The capacitors shown attached to each input (CPARASITIC) are the summation of all other capacitance associated with each input. LTC2249 VDD CSAMPLE 4pF 15Ω AIN+ CPARASITIC 1pF VDD AIN– CSAMPLE 4pF 15Ω CPARASITIC 1pF VDD CLK 2249 F02 When CLK is low, the analog input is sampled differentially directly onto the input sample-and-hold capacitors, inside the “Input S/H” shown in the block diagram. At the instant that CLK transitions from low to high, the sampled input is held. While CLK is high, the held input voltage is buffered by the S/H amplifier which drives the first pipelined ADC stage. The first stage acquires the output of the S/H during this high phase of CLK. When CLK goes back low, the first stage produces its residue which is acquired by the second stage. At the same time, the input S/H goes back to acquiring the analog input. When CLK goes back high, Figure 2. Equivalent Input Circuit During the sample phase when CLK is low, the transistors connect the analog inputs to the sampling capacitors and they charge to and track the differential input voltage. When CLK transitions from low to high, the sampled input voltage is held on the sampling capacitors. During the hold phase when CLK is high, the sampling capacitors are disconnected from the input and the held voltage is passed to the ADC core for processing. As CLK transitions from 2249f 10 LTC2249 U W U U APPLICATIO S I FOR ATIO high to low, the inputs are reconnected to the sampling capacitors to acquire a new sample. Since the sampling capacitors still hold the previous sample, a charging glitch proportional to the change in voltage between samples will be seen at this time. If the change between the last sample and the new sample is small, the charging glitch seen at the input will be small. If the input change is large, such as the change seen with input frequencies near Nyquist, then a larger charging glitch will be seen. Single-Ended Input For cost sensitive applications, the analog inputs can be driven single-ended. With a single-ended input the harmonic distortion and INL will degrade, but the SNR and DNL will remain unchanged. For a single-ended input, AIN+ should be driven with the input signal and AIN– should be connected to 1.5V or VCM. Common Mode Bias For optimal performance the analog inputs should be driven differentially. Each input should swing ±0.5V for the 2V range or ±0.25V for the 1V range, around a common mode voltage of 1.5V. The VCM output pin (Pin 31) may be used to provide the common mode bias level. VCM can be tied directly to the center tap of a transformer to set the DC input level or as a reference level to an op amp differential driver circuit. The VCM pin must be bypassed to ground close to the ADC with a 2.2µF or greater capacitor. For the best performance, it is recommended to have a source impedance of 100Ω or less for each input. The source impedance should be matched for the differential inputs. Poor matching will result in higher even order harmonics, especially the second. Input Drive Circuits Figure 3 shows the LTC2249 being driven by an RF transformer with a center tapped secondary. The secondary center tap is DC biased with VCM, setting the ADC input signal at its optimum DC level. Terminating on the transformer secondary is desirable, as this provides a common mode path for charging glitches caused by the sample and hold. Figure 3 shows a 1:1 turns ratio transformer. Other turns ratios can be used if the source impedance seen by the ADC does not exceed 100Ω for each ADC input. A disadvantage of using a transformer is the loss of low frequency response. Most small RF transformers have poor performance at frequencies below 1MHz. Figure 4 demonstrates the use of a differential amplifier to convert a single ended input signal into a differential input signal. The advantage of this method is that it provides low frequency input response; however, the limited gain bandwidth of most op amps will limit the SFDR at high input frequencies. VCM 2.2µF 0.1µF Input Drive Impedance As with all high performance, high speed ADCs, the dynamic performance of the LTC2249 can be influenced by the input drive circuitry, particularly the second and third harmonics. Source impedance and reactance can influence SFDR. At the falling edge of CLK, the sampleand-hold circuit will connect the 4pF sampling capacitor to the input pin and start the sampling period. The sampling period ends when CLK rises, holding the sampled input on the sampling capacitor. Ideally the input circuitry should be fast enough to fully charge the sampling capacitor during the sampling period 1/(2FENCODE); however, this is not always possible and the incomplete settling may degrade the SFDR. The sampling glitch has been designed to be as linear as possible to minimize the effects of incomplete settling. ANALOG INPUT T1 1:1 25Ω AIN+ LTC2249 25Ω 0.1µF 12pF 25Ω AIN– T1 = MA/COM ETC1-1T 25Ω RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZE 2249 F03 Figure 3. Single-Ended to Differential Conversion Using a Transformer VCM HIGH SPEED DIFFERENTIAL 25Ω AMPLIFIER ANALOG INPUT + AIN+ LTC2249 + CM – 2.2µF 12pF – 25Ω AIN– 2249 F04 Figure 4. Differential Drive with an Amplifier 2249f 11 LTC2249 U W U U APPLICATIO S I FOR ATIO Figure 5 shows a single-ended input circuit. The impedance seen by the analog inputs should be matched. This circuit is not recommended if low distortion is required. VCM 2.2µF 0.1µF ANALOG INPUT 10k 25Ω ANALOG INPUT 0.1µF AIN+ 12pF For input frequencies above 70MHz, the input circuits of Figure 6, 7 and 8 are recommended. The balun transformer gives better high frequency response than a flux coupled center tapped transformer. The coupling capacitors allow the analog inputs to be DC biased at 1.5V. In Figure 8, the series inductors are impedance matching elements that maximize the ADC bandwidth. VCM 2.2µF 12Ω AIN+ LTC2249 8pF 25Ω 12Ω AIN– T1 = MA/COM, ETC 1-1-13 RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZE 2249 F06 Figure 6. Recommended Front End Circuit for Input Frequencies Between 70MHz and 170MHz VCM 2.2µF 0.1µF AIN+ ANALOG INPUT LTC2249 25Ω 0.1µF T1 0.1µF Figure 9 shows the LTC2249 reference circuitry consisting of a 1.5V bandgap reference, a difference amplifier and switching and control circuit. The internal voltage reference can be configured for two pin selectable input ranges of 2V (±1V differential) or 1V (±0.5V differential). Tying the SENSE pin to VDD selects the 2V range; tying the SENSE pin to VCM selects the 1V range. The 1.5V bandgap reference serves two functions: its output provides a DC bias point for setting the common mode voltage of any external input circuitry; additionally, the reference is used with a difference amplifier to generate the differential reference levels needed by the internal ADC circuitry. An external bypass capacitor is required for the 1.5V reference output, VCM. This provides a high frequency low impedance path to ground for internal and external circuitry. 0.1µF T1 0.1µF 2249 F08 Reference Operation The 25Ω resistors and 12pF capacitor on the analog inputs serve two purposes: isolating the drive circuitry from the sample-and-hold charging glitches and limiting the wideband noise at the converter input. 25Ω AIN– 2249 F05 Figure 5. Single-Ended Drive ANALOG INPUT 6.8nH Figure 8. Recommended Front End Circuit for Input Frequencies Above 300MHz AIN– 0.1µF 0.1µF 25Ω T1 = MA/COM, ETC 1-1-13 RESISTORS, CAPACITORS, INDUCTORS ARE 0402 PACKAGE SIZE LTC2249 25Ω 0.1µF T1 2.2µF 10k AIN+ LTC2249 25Ω VCM 0.1µF 6.8nH 25Ω T1 = MA/COM, ETC 1-1-13 RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZE AIN– 2249 F07 Figure 7. Recommended Front End Circuit for Input Frequencies Between 170MHz and 300MHz The difference amplifier generates the high and low reference for the ADC. High speed switching circuits are connected to these outputs and they must be externally bypassed. Each output has two pins. The multiple output pins are needed to reduce package inductance. Bypass capacitors must be connected as shown in Figure 9. Other voltage ranges in-between the pin selectable ranges can be programmed with two external resistors as shown in Figure 10. An external reference can be used by applying its output directly or through a resistor divider to SENSE. It is not recommended to drive the SENSE pin with a logic device. The SENSE pin should be tied to the appropriate level as close to the converter as possible. If the SENSE pin is driven externally, it should be bypassed to ground as close to the device as possible with a 1µF ceramic capacitor. 2249f 12 LTC2249 U W U U APPLICATIO S I FOR ATIO CLEAN SUPPLY LTC2249 4Ω VCM 1.5V 4.7µF 1.5V BANDGAP REFERENCE FERRITE BEAD 2.2µF 1V 0.5V 0.1µF RANGE DETECT AND CONTROL TIE TO VDD FOR 2V RANGE; TIE TO VCM FOR 1V RANGE; RANGE = 2 • VSENSE FOR 0.5V < VSENSE < 1V SINUSOIDAL CLOCK INPUT 0.1µF CLK 50Ω SENSE 1k 1k LTC2249 NC7SVU04 BUFFER 2249 F11 INTERNAL ADC HIGH REFERENCE 1µF Figure 11. Sinusoidal Single-Ended CLK Drive REFH 2.2µF 0.1µF The noise performance of the LTC2249 can depend on the clock signal quality as much as on the analog input. Any noise present on the clock signal will result in additional aperture jitter that will be RMS summed with the inherent ADC aperture jitter. DIFF AMP 1µF REFL INTERNAL ADC LOW REFERENCE 2249 F09 Figure 9. Equivalent Reference Circuit 1.5V VCM 2.2µF Maximum and Minimum Conversion Rates 12k 0.75V 12k SENSE In applications where jitter is critical, such as when digitizing high input frequencies, use as large an amplitude as possible. Also, if the ADC is clocked with a sinusoidal signal, filter the CLK signal to reduce wideband noise and distortion products generated by the source. LTC2249 1µF 2249 F10 Figure 10. 1.5V Range ADC Input Range The input range can be set based on the application. The 2V input range will provide the best signal-to-noise performance while maintaining excellent SFDR. The 1V input range will have better SFDR performance, but the SNR will degrade by 5.7dB. See the Typical Performance Characteristics section. Driving the Clock Input The CLK input can be driven directly with a CMOS or TTL level signal. A sinusoidal clock can also be used along with a low-jitter squaring circuit before the CLK pin (see Figure 11). The maximum conversion rate for the LTC2249 is 80Msps. For the ADC to operate properly, the CLK signal should have a 50% (±5%) duty cycle. Each half cycle must have at least 5.9ns for the ADC internal circuitry to have enough settling time for proper operation. An optional clock duty cycle stabilizer circuit can be used if the input clock has a non 50% duty cycle. This circuit uses the rising edge of the CLK pin to sample the analog input. The falling edge of CLK is ignored and the internal falling edge is generated by a phase-locked loop. The input clock duty cycle can vary from 40% to 60% and the clock duty cycle stabilizer will maintain a constant 50% internal duty cycle. If the clock is turned off for a long period of time, the duty cycle stabilizer circuit will require a hundred clock cycles for the PLL to lock onto the input clock. To use the clock duty cycle stabilizer, the MODE pin should be connected to 1/3VDD or 2/3VDD using external resistors. 2249f 13 LTC2249 U W U U APPLICATIO S I FOR ATIO The lower limit of the LTC2249 sample rate is determined by droop of the sample-and-hold circuits. The pipelined architecture of this ADC relies on storing analog signals on small valued capacitors. Junction leakage will discharge the capacitors. The specified minimum operating frequency for the LTC2249 is 1Msps. DIGITAL OUTPUTS Digital Output Buffers Using the MODE pin, the LTC2249 parallel digital output can be selected for offset binary or 2’s complement format. Connecting MODE to GND or 1/3VDD selects straight binary output format. Connecting MODE to 2/3VDD or VDD selects 2’s complement output format. An external resistor divider can be used to set the 1/3VDD or 2/3VDD logic values. Table 1 shows the logic states for the MODE pin. Table 1. MODE Pin Function Figure 12 shows an equivalent circuit for a single output buffer. Each buffer is powered by OVDD and OGND, isolated from the ADC power and ground. The additional N-channel transistor in the output driver allows operation down to low voltages. The internal resistor in series with the output makes the output appear as 50Ω to external circuitry and may eliminate the need for external damping resistors. As with all high speed/high resolution converters, the digital output loading can affect the performance. The digital outputs of the LTC2249 should drive a minimal capacitive load to avoid possible interaction between the digital outputs and sensitive input circuitry. The output should be buffered with a device such as an ALVCH16373 CMOS latch. For full speed operation the capacitive load should be kept under 10pF. Lower OVDD voltages will also help reduce interference from the digital outputs. LTC2249 OVDD VDD Data Format 0.5V TO VDD VDD 0.1µF MODE Pin Output Format Clock Duty Cycle Stablizer 0 Straight Binary Off 1/3VDD Straight Binary On 2/3VDD 2’s Complement On VDD 2’s Complement Off Overflow Bit When OF outputs a logic high the converter is either overranged or underranged. Output Driver Power Separate output power and ground pins allow the output drivers to be isolated from the analog circuitry. The power supply for the digital output buffers, OVDD, should be tied to the same power supply as for the logic being driven. For example if the converter is driving a DSP powered by a 1.8V supply, then OVDD should be tied to that same 1.8V supply. OVDD can be powered with any voltage from 500mV up to the VDD of the part. OGND can be powered with any voltage from GND up to 1V and must be less than OVDD. The logic outputs will swing between OGND and OVDD. OVDD DATA FROM LATCH PREDRIVER LOGIC 43Ω TYPICAL DATA OUTPUT OE OGND 2249 F12 Figure 12. Digital Output Buffer Output Enable The outputs may be disabled with the output enable pin, OE. OE high disables all data outputs including OF. The data access and bus relinquish times are too slow to allow the outputs to be enabled and disabled during full speed operation. The output Hi-Z state is intended for use during long periods of inactivity. 2249f 14 LTC2249 U W U U APPLICATIO S I FOR ATIO Sleep and Nap Modes The converter may be placed in shutdown or nap modes to conserve power. Connecting SHDN to GND results in normal operation. Connecting SHDN to VDD and OE to VDD results in sleep mode, which powers down all circuitry including the reference and typically dissipates 1mW. When exiting sleep mode it will take milliseconds for the output data to become valid because the reference capacitors have to recharge and stabilize. Connecting SHDN to VDD and OE to GND results in nap mode, which typically dissipates 15mW. In nap mode, the on-chip reference circuit is kept on, so that recovery from nap mode is faster than that from sleep mode, typically taking 100 clock cycles. In both sleep and nap modes, all digital outputs are disabled and enter the Hi-Z state. High quality ceramic bypass capacitors should be used at the VDD, OVDD, VCM, REFH, and REFL pins. Bypass capacitors must be located as close to the pins as possible. Of particular importance is the 0.1µF capacitor between REFH and REFL. This capacitor should be placed as close to the device as possible (1.5mm or less). A size 0402 ceramic capacitor is recommended. The large 2.2µF capacitor between REFH and REFL can be somewhat further away. The traces connecting the pins and bypass capacitors must be kept short and should be made as wide as possible. The LTC2249 differential inputs should run parallel and close to each other. The input traces should be as short as possible to minimize capacitance and to minimize noise pickup. Grounding and Bypassing Heat Transfer The LTC2249 requires a printed circuit board with a clean, unbroken ground plane. A multilayer board with an internal ground plane is recommended. Layout for the printed circuit board should ensure that digital and analog signal lines are separated as much as possible. In particular, care should be taken not to run any digital track alongside an analog signal track or underneath the ADC. Most of the heat generated by the LTC2249 is transferred from the die through the bottom-side exposed pad and package leads onto the printed circuit board. For good electrical and thermal performance, the exposed pad should be soldered to a large grounded pad on the PC board. It is critical that all ground pins are connected to a ground plane of sufficient area. 2249f 15 J3 CLOCK INPUT R8 49.9Ω C12 0.1µF VDD E1 EXT REF VCM VDD R9 1k R7 1k VCM VDD 4 2 EXT REF 5 6 3 1 JP3 SENSE NC7SVU04 NC7SVU04 C10 0.1µF C5 4.7µF 6.3V 4 • C19 0.1µF R10 33Ω VDD GND R16 1k R15 1k R14 1k VDD 7 5 3 1 GND 1/3VDD 2/3VDD VDD 8 6 4 GND C15 2.2µF VDD 2 C8 0.1µF C2 8.2pF C11 0.1µF VDD JP4 MODE JP2 OE C7 2.2µF R6 12.4Ω VDD C4 0.1µF R4 24.9Ω R3 24.9Ω R2 12.4Ω C14 0.1µF VCM VDD VDD C9 1µF C6 1µF JP1 SHDN R5 1k •3 2 T1 ETC1-1-13 5 1 C13 0.1µF C3 0.1µF VCM C1 0.1µF C20 0.1µF 29 30 31 32 11 10 9 8 7 6 5 4 3 2 1 D2 REFH REFL C26 10µF 6.3V MODE D4 OVDD OF D13 D12 D11 D10 D9 D8 D7 D6 D5 R18 100k R17 105k OGND 33 GND SENSE VCM VDD OE SHDN CLK GND VDD REFL D3 D1 AIN– REFH D0 LTC2249 AIN+ LT1763 C16 0.1µF VCC VDD C28 1µF VCC VCC OE1 47 I0 46 I1 44 I2 43 I3 41 I4 40 I5 38 I6 37 I7 36 I8 35 I9 33 I10 32 I11 30 I12 29 I13 27 I14 26 I15 NC7SV86P5X 1 8 IN OUT 2 7 ADJ GND 3 6 GND GND 4 5 BYP SHDN VCC C27 0.01µF 20 21 28 27 26 25 24 23 22 19 18 17 16 15 14 13 12 GND OE2 1 24 28 7 4 10 18 15 21 31 E3 GND C18 0.1µF C25 4.7µF E4 PWR GND E2 VDD 3V 5 6 8 7 C17 0.1µF 24LC025 1 VCC A0 2 WP A1 3 A2 SCL 4 A3 SDA RN4A 33Ω RN4B 33Ω RN4C 33Ω RN4D 33Ω RN3A 33Ω RN3B 33Ω RN3C 33Ω RN3D 33Ω RN2A 33Ω RN2B 33Ω RN2C 33Ω RN2D 33Ω RN1A 33Ω RN1B 33Ω RN1C 33Ω RN1D 33Ω VDD 2 O0 3 O1 5 O2 6 O3 8 O4 9 O5 11 O6 12 O7 13 O8 14 O9 16 O10 17 O11 19 O12 20 O13 22 O14 23 O15 VCC GND 48 LE2 GND GND VCC GND VCC GND GND GND 74VCX16373MTD LE1 25 42 39 45 34 C21 0.1µF R11 10k R12 10k C22 0.1µF VCC R13 10k C23 0.1µF 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 40 38 2249 TA02 C24 0.1µF 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 3201S-40G1 39 39 37 37 35 35 33 33 31 31 29 29 27 27 25 25 23 23 21 21 19 19 17 17 15 15 13 13 11 11 9 9 7 7 5 5 3 3 1 1 U U W 16 L1 BEAD R1 OPT VCC APPLICATIO S I FOR ATIO U J1 ANALOG INPUT VCC LTC2249 2249f LTC2249 U W U U APPLICATIO S I FOR ATIO Topside Silkscreen Top Inner Layer 2 GND 2249f 17 LTC2249 U W U U APPLICATIO S I FOR ATIO Bottomside Inner Layer 3 Power Silkscreen Bottom 2249f 18 LTC2249 U PACKAGE DESCRIPTIO UH Package 32-Lead Plastic QFN (5mm × 5mm) (Reference LTC DWG # 05-08-1693) 0.70 ±0.05 5.50 ±0.05 4.10 ±0.05 3.45 ±0.05 (4 SIDES) PACKAGE OUTLINE 0.25 ± 0.05 0.50 BSC RECOMMENDED SOLDER PAD LAYOUT 5.00 ± 0.10 (4 SIDES) BOTTOM VIEW—EXPOSED PAD 0.23 TYP (4 SIDES) R = 0.115 TYP 0.75 ± 0.05 0.00 – 0.05 31 32 0.40 ± 0.10 PIN 1 TOP MARK (NOTE 6) 1 2 3.45 ± 0.10 (4-SIDES) (UH) QFN 0603 0.200 REF NOTE: 1. DRAWING PROPOSED TO BE A JEDEC PACKAGE OUTLINE M0-220 VARIATION WHHD-(X) (TO BE APPROVED) 2. DRAWING NOT TO SCALE 3. ALL DIMENSIONS ARE IN MILLIMETERS 0.25 ± 0.05 0.50 BSC 4. DIMENSIONS OF EXPOSED PAD ON BOTTOM OF PACKAGE DO NOT INCLUDE MOLD FLASH. MOLD FLASH, IF PRESENT, SHALL NOT EXCEED 0.20mm ON ANY SIDE 5. EXPOSED PAD SHALL BE SOLDER PLATED 6. SHADED AREA IS ONLY A REFERENCE FOR PIN 1 LOCATION ON THE TOP AND BOTTOM OF PACKAGE 2249f Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 19 LTC2249 RELATED PARTS PART NUMBER DESCRIPTION COMMENTS LTC1741 12-Bit, 65Msps ADC 72dB SNR, 87dB SFDR, 48-Pin TSSOP Package LTC1742 14-Bit, 65Msps ADC 76.5dB SNR, 90dB SFDR, 48-Pin TSSOP Package LTC1743 12-Bit, 50Msps ADC 72.5dB SNR, 90dB SFDR, 48-Pin TSSOP Package LTC1744 14-Bit, 50Msps ADC 77dB SNR, 90dB SFDR, 48-Pin TSSOP Package LTC1745 12-Bit, 25Msps ADC 72.2dB SNR, 380mW SFDR, 48-Pin TSSOP Package LTC1746 14-Bit, 25Msps ADC 77.5dB SNR, 390mW SFDR, 48-Pin TSSOP Package LTC1747 12-Bit, 80Msps ADC 72dB SNR, 87dB SFDR, 48-Pin TSSOP Package LTC1748 14-Bit, 80Msps ADC 76.3dB SNR, 90dB SFDR, 48-Pin TSSOP Package LTC1749 12-Bit, 80Msps Wideband ADC Up to 500MHz IF Undersampling, 87dB SFDR LTC1750 14-Bit, 80Msps Wideband ADC Up to 500MHz IF Undersampling, 90dB SFDR LTC2220 12-Bit, 170Msps ADC 890mW, 67.7dB SNR, 9mm x 9mm QFN Package LTC2221 12-Bit, 135Msps ADC 630mW, 67.8dB SNR, 9mm x 9mm QFN Package LTC2222 12-Bit, 105Msps ADC 475mW, 68.4dB SNR, 7mm x 7mm QFN Package LTC2223 12-Bit, 80Msps ADC 366mW, 68.5dB SNR, 7mm x 7mm QFN Package LTC2224 12-Bit, 135Msps ADC 630mW, 67.6dB SNR, 7mm x 7mm QFN Package LTC2225 12-Bit, 10Msps ADC 60mW, 71.3dB SNR, 5mm x 5mm QFN Package LTC2226 12-Bit, 25Msps ADC 75mW, 71.4dB SNR, 5mm x 5mm QFN Package LTC2227 12-Bit, 40Msps ADC 120mW, 71.4dB SNR, 5mm x 5mm QFN Package LTC2228 12-Bit, 65Msps ADC 205mW, 71.3dB SNR, 5mm x 5mm QFN Package LTC2229 12-Bit, 80Msps ADC 211mW, 70.6dB SNR, 5mm x 5mm QFN Package LTC2230 10-Bit, 170Msps ADC 890mW, 61.2dB SNR, 9mm x 9mm QFN Package LTC2231 10-Bit, 135Msps ADC 630mW, 61.2dB SNR, 9mm x 9mm QFN Package LTC2232 10-Bit, 105Msps ADC 475mW, 61.3dB SNR, 7mm x 7mm QFN Package LTC2233 10-Bit, 80Msps ADC 366mW, 61.3dB SNR, 7mm x 7mm QFN Package LTC2234 10-Bit, 135Msps ADC 630mW, 61.2dB SNR, 7mm x 7mm QFN Package LTC2236 10-Bit, 25Msps ADC 75mW, 61.8dB SNR, 5mm × 5mm QFN Package LTC2237 10-Bit, 40Msps ADC 120mW, 61.8dB SNR, 5mm × 5mm QFN Package LTC2238 10-Bit, 65Msps ADC 205mW, 61.8dB SNR, 5mm × 5mm QFN Package LTC2239 10-Bit, 80Msps ADC 211mW, 61.6dB SNR, 5mm × 5mm QFN Package LTC2245 14-Bit, 10Msps ADC 60mW, 74.4dB SNR, 5mm × 5mm QFN Package LTC2246 14-Bit, 25Msps ADC 75mW, 74.5dB SNR, 5mm × 5mm QFN Package LTC2247 14-Bit, 40Msps ADC 120mW, 74.4dB SNR, 5mm × 5mm QFN Package LTC2248 14-Bit, 65Msps ADC 205mW, 74.3dB SNR, 5mm × 5mm QFN Package LT5512 DC-3GHz High Signal Level Downconverting Mixer DC to 3GHz, 21dBm IIP3, Integrated LO Buffer LT5514 Ultralow Distortion IF Amplifier/ADC Driver with Digitally Controlled Gain 450MHz 1dB BW, 47dB OIP3, Digital Gain Control 10.5dB to 33ddB in 1.5dB/Step LT5515 1.5GHz to 2.5GHz Direct Conversion Quadrature Demodulator 20dBm IIP3, Integrated LO Quadrature Generator LT5516 0.8GHz to 1.5GHz Direct Conversion Quadrature Demodulator 21.5dBm IIP3, Integrated LO Quadrature Generator LT5517 40MHz to 900MHz Direct Conversion Quadrature Demodulator 21dBm IIP3, Integrated LO Quadrature Generator LT5522 600MHz to 2.7GHz High Linearity Downconverting Mixer 4.5V to 5.25V Supply, 25dBm IIP3 at 900MHz, NF = 12.5dB, 50Ω Single-Ended RF and LO Ports 2249f 20 Linear Technology Corporation LT/TP 1004 1K • PRINTED IN USA 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2004