NTMS3P03R2 Power MOSFET -3.05 Amps, -30 Volts P–Channel SO–8 Features • • • • • • • High Efficiency Components in a Single SO–8 Package High Density Power MOSFET with Low RDS(on) Miniature SO–8 Surface Mount Package – Saves Board Space Diode Exhibits High Speed with Soft Recovery IDSS Specified at Elevated Temperature Avalanche Energy Specified Mounting Information for the SO–8 Package is Provided http://onsemi.com –3.05 AMPERES –30 VOLTS 0.085 @ VGS = –10 V Applications • DC–DC Converters • Low Voltage Motor Control • Power Management in Portable and Battery–Powered Products, i.e.: P–Channel D Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) G Symbol Value Unit –30 V Gate–to–Source Voltage – Continuous VDSS VGS ±20 V Thermal Resistance – Junction–to–Ambient (Note 1.) Total Power Dissipation @ TA = 25°C Continuous Drain Current @ 25°C Continuous Drain Current @ 70°C Pulsed Drain Current (Note 4.) RθJA PD ID ID IDM 171 0.73 –2.34 –1.87 –8.0 °C/W W A A A Thermal Resistance – Junction–to–Ambient (Note 2.) Total Power Dissipation @ TA = 25°C Continuous Drain Current @ 25°C Continuous Drain Current @ 70°C Pulsed Drain Current (Note 4.) RθJA PD ID ID IDM 100 1.25 –3.05 –2.44 –12 °C/W W A A A RθJA PD ID ID IDM TJ, Tstg 62.5 2.0 –3.86 –3.1 –15 °C/W W A A A Rating Drain–to–Source Voltage Thermal Resistance – Junction–to–Ambient (Note 3.) Total Power Dissipation @ TA = 25°C Continuous Drain Current @ 25°C Continuous Drain Current @ 70°C Pulsed Drain Current (Note 4.) Operating and Storage Temperature Range Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C (VDD = –30 Vdc, VGS = –4.5 Vdc, Peak IL = –7.5 Apk, L = 5 mH, RG = 25 Ω) Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds EAS –55 to +150 °C 140 mJ July, 2001 – Rev. 1 MARKING DIAGRAM SO–8 CASE 751 STYLE 13 8 E3P03 LYWW 1 E3P03 L Y WW = Device Code = Assembly Location = Year = Work Week PIN ASSIGNMENT N.C. 1 8 Drain Source 2 7 Drain Source 3 6 Drain Gate 4 5 Drain Top View TL °C 260 1. Minimum FR–4 or G–10 PCB, t = Steady State. 2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t = steady state. 3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds. 4. Pulse Test: Pulse Width = 300 s, Duty Cycle = 2%. Semiconductor Components Industries, LLC, 2001 S 1 ORDERING INFORMATION Device NTMS3P03R2 Package Shipping SO–8 2500/Tape & Reel Publication Order Number: NTMS3P03R2/D NTMS3P03R2 ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 5.) Symbol Characteristic Min Typ Max Unit –30 – – –30 – – – – – – –1.0 –10 – – –100 – – 100 –1.0 – –1.7 3.6 –2.5 – – – 0.063 0.090 0.085 0.115 gFS – 5.0 – Mhos Ciss – 520 750 pF Coss – 170 325 Crss – 70 135 td(on) – 12 22 tr – 16 30 td(off) – 45 80 tf – 45 80 td(on) – 16 – OFF CHARACTERISTICS V(BR)DSS Drain–to–Source Breakdown Voltage (VGS = 0 Vdc, ID = –250 µAdc) Temperature Coefficient (Positive) Zero Gate Voltage Drain Current (VDS = –30 Vdc, VGS = 0 Vdc, TJ = 25°C) (VDS = –30 Vdc, VGS = 0 Vdc, TJ = 125°C) IDSS Gate–Body Leakage Current (VGS = –20 Vdc, VDS = 0 Vdc) IGSS Gate–Body Leakage Current (VGS = +20 Vdc, VDS = 0 Vdc) IGSS Vdc mV/°C µAdc nAdc nAdc ON CHARACTERISTICS Gate Threshold Voltage (VDS = VGS, ID = –250 µAdc) Temperature Coefficient (Negative) VGS(th) Static Drain–to–Source On–State Resistance (VGS = –10 Vdc, ID = –3.05 Adc) (VGS = –4.5 Vdc, ID = –1.5 Adc) RDS(on) Forward Transconductance (VDS = –15 Vdc, ID = –3.05 Adc) Vdc Ω DYNAMIC CHARACTERISTICS Input Capacitance (VDS = –24 24 Vd Vdc, VGS = 0 Vd Vdc, f = 1.0 MHz) Output Capacitance Reverse Transfer Capacitance SWITCHING CHARACTERISTICS (Notes 6. & 7.) Turn–On Delay Time Rise Time Turn–Off Delay Time (VDD = –24 Vdc, ID = –3.05 Adc, VGS = –10 Vdc, Vdc RG = 6.0 Ω) Fall Time Turn–On Delay Time (VDD = –24 Vdc, ID = –1.5 Adc, –4 5 Vdc, Vdc VGS = –4.5 RG = 6.0 Ω) Rise Time Turn–Off Delay Time Fall Time Total Gate Charge (VDS = –24 Vdc, VGS = –10 Vdc, ID = –3.05 3 05 Adc) Ad ) Gate–Source Charge Gate–Drain Charge ns ns tr – 42 – td(off) – 32 – tf – 35 – Qtot – 16 25 Qgs – 2.0 – Qgd – 4.5 – VSD – – –0.96 –0.78 –1.25 – Vdc trr – 34 – ns ta – 18 – tb – 16 – QRR – 0.03 – nC BODY–DRAIN DIODE RATINGS (Note 6.) Diode Forward On–Voltage (IS = –3.05 Adc, VGS = 0 V) (IS = –3.05 Adc, VGS = 0 V, TJ = 125°C) Reverse Recovery Time (IS = –3.05 3 05 Adc, Ad VGS = 0 Vdc, Vd dIS/dt = 100 A/µs) Reverse Recovery Stored Charge 5. Handling precautions to protect against electrostatic discharge is mandatory. 6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%. 7. Switching characteristics are independent of operating junction temperature. http://onsemi.com 2 µC NTMS3P03R2 TYPICAL ELECTRICAL CHARACTERISTICS –ID, DRAIN CURRENT (AMPS) VGS = –4 V VGS = –4.6 V VGS = –6 V 4 VGS = –4.8 V TJ = 25°C 3 VGS 2 VGS = –3.6 V VGS = –2.8 V VGS = –3.2 V = –5 V VGS = –2.6 V VGS = –3 V 1 0 0.25 0.5 0.75 1 1.25 1.5 1.75 TJ = 25°C 2 TJ = –55°C 1 1 2 3 4 5 Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics 0.6 0.5 0.4 0.3 0.2 0.1 5 4 6 7 8 0.7 ID = –1.5 A TJ = 25°C 0.6 0.5 0.4 0.3 0.2 0.1 0 2 4 3 5 6 7 –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) Figure 3. On–Resistance vs. Gate–to–Source Voltage Figure 4. On–Resistance vs. Gate–to–Source Voltage 0.25 TJ = 25°C 0.2 VGS = –4.5 V 0.15 VGS = –10 V 0.1 0.05 1 TJ = 100°C 3 –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) ID = –3.05 A TJ = 25°C 3 4 –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) 0.7 0 VDS > = –10 V 5 0 2 2 3 4 5 6 RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED) RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω) VGS = –4.4 V VGS = –8 V 5 0 RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω) 6 VGS = –10 V RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω) –ID, DRAIN CURRENT (AMPS) 6 1.6 1.4 ID = –3.05 A VGS = –10 V 1.2 1 0.8 0.6 –50 –25 0 25 50 75 100 125 –ID, DRAIN CURRENT (AMPS) TJ, JUNCTION TEMPERATURE (°C) Figure 5. On–Resistance vs. Drain Current and Gate Voltage Figure 6. On Resistance Variation with Temperature http://onsemi.com 3 150 NTMS3P03R2 10000 C, CAPACITANCE (pF) IDSS, LEAKAGE (nA) VGS = 0 V TJ = 150°C 1000 TJ = 125°C 100 1200 VDS = 0 V 1000 Ciss VGS = 0 V 800 Ciss Crss 600 400 Coss 200 Crss TJ = 25°C 0 10 10 14 10 22 18 26 30 0 5 –VDS 10 15 20 25 –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS) Figure 7. Drain–to–Source Leakage Current vs. Voltage Figure 8. Capacitance Variation 12 30 30 1000 QT 10 VDS = –24 V ID = –3.05 A VGS = –10 V 25 VDS 8 20 VGS 6 15 Q1 4 tf tr td(on) 5 ID = –3.05 A TJ = 25°C 0 2 4 6 8 10 12 1 0 16 14 10 1 100 Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (Ω) Figure 9. Gate–to–Source and Drain–to–Source Voltage vs. Total Charge Figure 10. Resistive Switching Time Variation vs. Gate Resistance 3 100 tr tf 1 10 IS, SOURCE CURRENT (AMPS) VDS = –24 V ID = –1.5 A VGS = –4.5 V 10 td(off) 10 10 Q2 2 0 100 1000 t, TIME (ns) 5 –VGS t, TIME (ns) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) 6 td(off) td(on) 100 VGS = 0 V TJ = 25°C 2.5 2 1.5 1 0.5 0 0.2 0.4 0.6 0.8 1 RG, GATE RESISTANCE (Ω) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) Figure 11. Resistive Switching Time Variation vs. Gate Resistance Figure 12. Diode Forward Voltage vs. Current http://onsemi.com 4 1.2 NTMS3P03R2 VGS = 12 V SINGLE PULSE TA = 25°C 10 1.0 ms di/dt 10 ms IS dc 1.0 ta trr tb TIME 0.1 RDS(on) THERMAL LIMIT PACKAGE LIMIT 0.01 0.1 10 1.0 0.25 IS tp IS 100 –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) Figure 13. Maximum Rated Forward Biased Safe Operating Area Figure 14. Diode Reverse Recovery Waveform 1.0 Rthja(t), EFFECTIVE TRANSIENT THERMAL RESPONSE –ID, DRAIN CURRENT (AMPS) 100 D = 0.5 0.2 0.1 0.1 Normalized to RθJA at Steady State (1″ pad) Chip Junction 2.32 Ω 18.5 Ω 50.9 Ω 37.1 Ω 56.8 Ω 0.05 0.02 0.01 1E–03 0.0014 F 0.01 0.0073 F 0.022 F 0.105 F 0.484 F 3.68 F Ambient Single Pulse 1E–02 24.4 Ω 1E–01 1E+00 1E+01 t, TIME (s) Figure 15. FET Thermal Response http://onsemi.com 5 1E+02 1E+03 NTMS3P03R2 INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS Surface mount board layout is a critical portion of the total design. The footprint for the semiconductor packages must be the correct size to ensure proper solder connection interface between the board and the package. With the correct pad geometry, the packages will self–align when subjected to a solder reflow process. 0.060 1.52 0.275 7.0 0.155 4.0 0.024 0.6 0.050 1.270 inches mm SOLDERING PRECAUTIONS • The soldering temperature and time shall not exceed 260°C for more than 10 seconds. • When shifting from preheating to soldering, the maximum temperature gradient shall be 5°C or less. • After soldering has been completed, the device should be allowed to cool naturally for at least three minutes. Gradual cooling should be used as the use of forced cooling will increase the temperature gradient and result in latent failure due to mechanical stress. • Mechanical stress or shock should not be applied during cooling. The melting temperature of solder is higher than the rated temperature of the device. When the entire device is heated to a high temperature, failure to complete soldering within a short time could result in device failure. Therefore, the following items should always be observed in order to minimize the thermal stress to which the devices are subjected. • Always preheat the device. • The delta temperature between the preheat and soldering should be 100°C or less.* • When preheating and soldering, the temperature of the leads and the case must not exceed the maximum temperature ratings as shown on the data sheet. When using infrared heating with the reflow soldering method, the difference shall be a maximum of 10°C. * Soldering a device without preheating can cause excessive thermal shock and stress which can result in damage to the device. http://onsemi.com 6 NTMS3P03R2 TYPICAL SOLDER HEATING PROFILE temperature versus time. The line on the graph shows the actual temperature that might be experienced on the surface of a test board at or near a central solder joint. The two profiles are based on a high density and a low density board. The Vitronics SMD310 convection/infrared reflow soldering system was used to generate this profile. The type of solder used was 62/36/2 Tin Lead Silver with a melting point between 177–189°C. When this type of furnace is used for solder reflow work, the circuit boards and solder joints tend to heat first. The components on the board are then heated by conduction. The circuit board, because it has a large surface area, absorbs the thermal energy more efficiently, then distributes this energy to the components. Because of this effect, the main body of a component may be up to 30 degrees cooler than the adjacent solder joints. For any given circuit board, there will be a group of control settings that will give the desired heat pattern. The operator must set temperatures for several heating zones and a figure for belt speed. Taken together, these control settings make up a heating “profile” for that particular circuit board. On machines controlled by a computer, the computer remembers these profiles from one operating session to the next. Figure 16 shows a typical heating profile for use when soldering a surface mount device to a printed circuit board. This profile will vary among soldering systems, but it is a good starting point. Factors that can affect the profile include the type of soldering system in use, density and types of components on the board, type of solder used, and the type of board or substrate material being used. This profile shows STEP 1 PREHEAT ZONE 1 “RAMP” 200°C STEP 2 STEP 3 VENT HEATING “SOAK” ZONES 2 & 5 “RAMP” DESIRED CURVE FOR HIGH MASS ASSEMBLIES STEP 4 HEATING ZONES 3 & 6 “SOAK” 160°C STEP 5 STEP 6 STEP 7 HEATING VENT COOLING ZONES 4 & 7 205° TO 219°C “SPIKE” PEAK AT 170°C SOLDER JOINT 150°C 150°C 100°C 140°C 100°C SOLDER IS LIQUID FOR 40 TO 80 SECONDS (DEPENDING ON MASS OF ASSEMBLY) DESIRED CURVE FOR LOW MASS ASSEMBLIES 5°C TIME (3 TO 7 MINUTES TOTAL) TMAX Figure 16. Typical Solder Heating Profile http://onsemi.com 7 NTMS3P03R2 PACKAGE DIMENSIONS SO–8 CASE 751–07 ISSUE W –X– NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. A 8 5 0.25 (0.010) S B 1 M Y M 4 K –Y– G C N X 45 SEATING PLANE –Z– 0.10 (0.004) H M D 0.25 (0.010) M Z Y S X S J DIM A B C D G H J K M N S MILLIMETERS MIN MAX 4.80 5.00 3.80 4.00 1.35 1.75 0.33 0.51 1.27 BSC 0.10 0.25 0.19 0.25 0.40 1.27 0 8 0.25 0.50 5.80 6.20 STYLE 13: PIN 1. 2. 3. 4. 5. 6. 7. 8. http://onsemi.com 8 N.C. SOURCE SOURCE GATE DRAIN DRAIN DRAIN DRAIN INCHES MIN MAX 0.189 0.197 0.150 0.157 0.053 0.069 0.013 0.020 0.050 BSC 0.004 0.010 0.007 0.010 0.016 0.050 0 8 0.010 0.020 0.228 0.244 NTMS3P03R2 Notes http://onsemi.com 9 NTMS3P03R2 Notes http://onsemi.com 10 NTMS3P03R2 Notes http://onsemi.com 11 NTMS3P03R2 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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