FAIRCHILD FDPF7N50U

TM
UniFET
FDP7N50U/FDPF7N50U
500V N-Channel MOSFET
Features
Description
• 5A, 500V, RDS(on) = 1.5Ω @VGS = 10 V
These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe,
DMOS technology.
• Low gate charge ( typical 12.8 nC)
• Low Crss ( typical 9 pF)
This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and
commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor
correction.
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
D
G
G DS
TO-220
FDP Series
TO-220F
GD S
FDPF Series
S
Absolute Maximum Ratings
Symbol
Parameter
FDP7N50U
VDSS
Drain-Source Voltage
ID
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
IDM
Drain Current
- Pulsed
VGSS
Gate-Source voltage
EAS
IAR
FDPF7N50U
500
5
3.0
(Note 1)
20
Unit
V
5*
3.0 *
A
A
20 *
A
±30
V
Single Pulsed Avalanche Energy
(Note 2)
270
mJ
Avalanche Current
(Note 1)
5
A
EAR
Repetitive Avalanche Energy
(Note 1)
8.9
mJ
dv/dt
Peak Diode Recovery dv/dt
(Note 3)
4.5
V/ns
PD
Power Dissipation
(TC = 25°C)
- Derate above 25°C
89
0.71
TJ, TSTG
Operating and Storage Temperature Range
TL
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
39
0.31
W
W/°C
-55 to +150
°C
300
°C
* Drain current limited by maximum junction temperature.
Thermal Characteristics
Symbol
Parameter
FDP7N50U
FDPF7N50U
Unit
Thermal Resistance, Junction-to-Case
1.4
3.2
°C/W
RθCS
Thermal Resistance, Case-to-Sink Typ.
0.5
--
°C/W
RθJA
Thermal Resistance, Junction-to-Ambient
62.5
62.5
°C/W
RθJC
©2007 Fairchild Semiconductor Corporation
FDP7N50U/FDPF7N50U REV. B
1
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FDP7N50U/FDPF7N50U 500V N-Channel MOSFET
March 2007
Device Marking
Device
Package
Reel Size
Tape Width
Quantity
FDP7N50U
FDP7N50U
TO-220
--
--
50
FDPF7N50U
FDPF7N50U
TO-220F
--
--
50
Electrical Characteristics
Symbol
TC = 25°C unless otherwise noted
Parameter
Conditions
Min.
Typ.
Max Units
500
--
--
V
Off Characteristics
BVDSS
Drain-Source Breakdown Voltage
VGS = 0V, ID = 250µA
∆BVDSS
/ ∆TJ
Breakdown Voltage Temperature
Coefficient
ID = 250µA, Referenced to 25°C
--
0.5
--
V/°C
IDSS
Zero Gate Voltage Drain Current
VDS = 500V, VGS = 0V
VDS = 400V, TC = 125°C
---
---
25
250
µA
µA
IGSSF
Gate-Body Leakage Current, Forward
VGS = 30V, VDS = 0V
--
--
100
nA
IGSSR
Gate-Body Leakage Current, Reverse
VGS = -30V, VDS = 0V
--
--
-100
nA
3.0
--
5.0
V
--
1.2
1.5
Ω
--
2.5
--
S
On Characteristics
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250µA
RDS(on)
Static Drain-Source
On-Resistance
VGS = 10V, ID = 2.5A
gFS
Forward Transconductance
VDS = 40V, ID = 2.5A
(Note 4)
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = 25V, VGS = 0V,
f = 1.0MHz
--
720
940
pF
--
95
190
pF
--
9
13.5
pF
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = 250V, ID = 7A
RG = 25Ω
(Note 4, 5)
VDS = 400V, ID = 7A
VGS = 10V
(Note 4, 5)
--
6
20
ns
--
55
120
ns
--
25
60
ns
--
35
80
ns
--
12.8
16.6
nC
--
3.7
--
nC
--
5.8
--
nC
5
A
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
ISM
Maximum Pulsed Drain-Source Diode Forward Current
--
--
20
A
VSD
Drain-Source Diode Forward Voltage
VGS = 0V, IS = 7A
--
--
1.6
V
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
VGS = 0V, IS = 7A
dIF/dt =100A/µs
(Note 4)
--
40
--
ns
--
0.04
--
µC
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. IAS = 7A, VDD = 50V, L=10mH, RG = 25Ω, Starting TJ = 25°C
3. ISD ≤ 7A, di/dt ≤ 200A/µs, VDD ≤ BVDSS, Starting TJ = 25°C
4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
FDP7N50U/FDPF7N50U REV. B
2
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FDP7N50U/FDPF7N50U 500V N-Channel MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
Top :
ID, Drain Current [A]
15
Bottom :
VGS
10.0 V
8.0V
7.5 V
7.0 V
6.5 V
6.0 V
5.5 V
5.0 V
1
10
ID , Drain Current [A]
20
Figure 2. Transfer Characteristics
10
※ Notes :
1. 250µ s Pulse Test
2. TC = 25℃
5
0
0
10
20
30
40
150℃
0
10
25℃
-1
10
※ Note
1. VDS = 40V
2. 250µ s Pulse Test
-2
50
10
2
VDS, Drain-Source Voltage [V]
8
10
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
2.5
IDR , Reverse Drain Current [A]
RDS(ON) [Ω ],Drain-Source On-Resistance
6
VGS , Gate-Source Voltage [V]
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
2.0
VGS = 10V
1.5
VGS = 20V
1.0
0.5
1
10
0
10
150℃
25℃
※ Notes :
1. VGS = 0V
2. 250µ s Pulse Test
※ Note : TJ = 25℃
0.0
-1
0
5
10
15
10
20
0.2
Figure 5. Capacitance Characteristics
VGS, Gate-Source Voltage [V]
Crss
※ Notes :
1. VGS = 0 V
2. f = 1 MHz
10
0
1.2
1.4
1.6
1.8
1
10
VDS = 250V
10
VDS = 400V
8
6
4
2
※ Note : ID = 7 A
0
0
5
10
15
QG, Total Gate Charge [nC]
VDS, Drain-Source Voltage [V]
FDP7N50U/FDPF7N50U REV. B
1.0
VDS = 100V
Coss
10
0.8
12
Ciss
100
0.6
Figure 6. Gate Charge Characteristics
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
1000
0.4
VSD , Source-Drain Voltage [V]
ID, Drain Current [A]
Capacitance [pF]
4
3
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FDP7N50U/FDPF7N50U 500V N-Channel MOSFET
Typical Performance Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. Maximum Drain Current
Vs. Case Temperature
6
BVDSS, (Normalized)
Drain-Source Breakdown Voltage
1.2
ID, Drain Current [A]
1.1
1.0
♦ Notes :
0.9
1. VGS = 0 V
4
2
2. ID = 250 µA
0.8
-100
-50
0
50
100
150
0
25
200
o
50
TJ, Junction Temperature [ C]
Figure 9-1. Maximum Safe Operating Area
- FDP7N50U
ID, Drain Current [A]
ID, Drain Current [A]
DC
-1
10
10 us
※ Notes :
100 us
1 ms
10 ms
0
10
Operation in This Area
is Limited by R DS(on)
DC
-1
10
※ Notes :
o
o
1. TC = 25 C
1. TC = 25 C
o
o
2. TJ = 150 C
3. Single Pulse
2. TJ = 150 C
3. Single Pulse
-2
10
150
1
10 ms
Operation in This Area
is Limited by R DS(on)
125
10
100 us
1 ms
10
100
Figure 9-2. Maximum Safe Operating Area
- FDPF7N50U
10 us
1
10
0
75
TC, Case Temperature [℃]
-2
0
10
1
10
10
2
10
FDP7N50U/FDPF7N50U REV. B
0
10
VDS, Drain-Source Voltage [V]
1
10
2
10
VDS, Drain-Source Voltage [V]
4
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FDP7N50U/FDPF7N50U 500V N-Channel MOSFET
Typical Performance Characteristics (Continued)
FDP7N50U/FDPF7N50U 500V N-Channel MOSFET
Figure 10-1. Transient Thermal Response Curve - FDP7N50U
Zθ JC(t), Thermal Response
10
0
D = 0 .5
0 .2
0 .1
10
-1
PDM
0 .0 5
t1
0 .0 2
0 .0 1
s in g le p u ls e
10
t2
※ N o te s :
1 . Z θ J C(t) = 1 .4 ℃ /W M a x.
2 . D u ty F a c to r, D = t 1 /t 2
3 . T J M - T C = P D M * Z θ J C(t)
-2
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ]
Figure 10-2. Transient Thermal Response Curve - FDPF7N50U
Zθ JC(t), Thermal Response
D = 0 .5
10
0
0 .2
0 .1
PDM
0 .0 5
10
t1
-1
0 .0 2
0 .0 1
10
s in g le p u ls e
-2
10
-5
10
-4
t2
※ N o te s :
1 . Z θ JC(t) = 3 .2 ℃ /W M a x.
2 . D u ty F a c to r, D = t 1 /t 2
3 . T JM - T C = P D M * Z θ JC(t)
10
-3
10
-2
10
-1
10
0
10
1
t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ]
FDP7N50U/FDPF7N50U REV. B
5
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FDP7N50U/FDPF7N50U 500V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FDP7N50U/FDPF7N50U REV. B
6
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FDP7N50U/FDPF7N50U 500V N-Channel MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FDP7N50U/FDPF7N50U REV. B
7
www.fairchildsemi.com
FDP7N50U/FDPF7N50U 500V N-Channel MOSFET
Mechanical Dimensions
TO-220
Dimensions in Millimeters
FDP7N50U/FDPF7N50U REV. B
8
www.fairchildsemi.com
(Continued)
3.30 ±0.10
TO-220F
10.16 ±0.20
2.54 ±0.20
ø3.18 ±0.10
(7.00)
(1.00x45°)
15.87 ±0.20
15.80 ±0.20
6.68 ±0.20
(0.70)
0.80 ±0.10
)
0°
(3
9.75 ±0.30
MAX1.47
#1
+0.10
0.50 –0.05
2.54TYP
[2.54 ±0.20]
2.76 ±0.20
2.54TYP
[2.54 ±0.20]
9.40 ±0.20
4.70 ±0.20
0.35 ±0.10
Dimensions in Millimeters
FDP7N50U/FDPF7N50U REV. B
9
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FDP7N50U/FDPF7N50U 500V N-Channel MOSFET
Mechanical Dimensions
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which, (a) are intended for surgical implant into the body or
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when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
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2. A critical component in any component of a life support,
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PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Advance Information
Formative or In Design
This datasheet contains the design specifications for product
development. Specifications may change in any manner without notice.
Definition
Preliminary
First Production
This datasheet contains preliminary data; supplementary data will be
published at a later date. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild Semiconductor
reserves the right to make changes at any time without notice to improve
design.
Obsolete
Not In Production
This datasheet contains specifications on a product that has been
discontinued by Fairchild Semiconductor. The datasheet is printed for
reference information only.
Rev. I24
© 2007 Fairchild Semiconductor Corporation
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