TRIQUINT TGA2600

Advance Product Information
July 20, 2005
X-band Ultra Low Noise Amplifier
TGA2600
Key Features
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Product Description
Frequency Range: 6-12 GHz
0.7 dB Noise Figure
30 dB Nominal Gain
2 dBm Nominal P1dB
> 12 dB Return Loss
Nominal Bias 2.5V @ 17 mA
0.15-um 3MI mHEMT Technology
Chip Dimensions: 2.20 x 0.99 x 0.10 mm
(0.087 x 0.039 x 0.004 in)
Primary Applications
The TriQuint TGA2600-EPU is an
Ultra Low-Noise Amplifier. This LNA
operates from 7-11 GHz with a typical
mid-band noise figure of 0.7 dB.
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•
Radar
X band LNA, ECM
Measured Fixtured Data
The device features 30dB of gain
across the band, while providing a
nominal output power at P1dB gain
compression of 2 dBm. Typical input
and output return loss is 12 dB.
Ground is provided to the circuitry
through vias to the
backside metallization.
Bias Conditions: Vd = 2.5V, Id= 17mA
1.4
Noise Figure (dB)
1.2
The TGA2600-EPU LNA is suitable for
a variety of C and X band applications
such as radar receivers, electronic
counter measures,decoys, jammers,
and phased array systems.
0.6
0.4
0
6
7
8
9
10
11
12
13
14
15
16
Frequency (GHz)
42
36
30
24
18
12
6
0
-6
-12
-18
-24
-30
42
36
30
24
18
12
6
0
-6
-12
-18
-24
-30
Gain
Output
2
4
6
Input
8
10
12
14
16
Return Loss (dB)
Lead-free and RoHS compliant.
0.8
0.2
Gain (dB)
The TGA2600-EPU is 100% DC and
RF tested on-wafer to ensure
performance compliance.
1
18
Frequency (GHz)
Note: This device is early in the characterization process prior to finalizing all electrical specifications. Specifications are subject to
change without notice.
1
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994-8504 Email: [email protected] Web: www.triquint.com
Advance Product Information
July 20, 2005
TGA2600-EPU
TABLE I
MAXIMUM RATINGS 1/
SYMBOL
+
PARAMETER
VALUE
NOTES
4.5 V
2/
V
Positive Supply Voltage
Vg
Gate Supply Voltage Range
I+
Positive Supply Current
50 mA
| IG |
Gate Supply Current
2 mA
PIN
Input Continuous Wave Power
TBD
2/
PD
Power Dissipation
0.23 W
2/, 3/
TCH
Operating Channel Temperature
110 °C
4/, 5/
TM
Mounting Temperature
175 °C
TSTG
Storage Temperature
-2V to +1 V
2/
-65 to 110°C
1/
These ratings represent the maximum operable values for this device.
2/
Current is defined under no RF drive conditions. Combinations of supply voltage, supply
current, input power, and output power shall not exceed PD.
3/
When operated at this power dissipation with a base plate temperature of 70 °C, the median
life is greater than 1 E+6 hours.
4/
Junction operating temperature will directly affect the device median time to failure (T M). For
maximum life, it is recommended that junction temperatures be maintained at the lowest
possible levels.
5/
These ratings apply to each individual FET.
2
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994-8504 Email: [email protected] Web: www.triquint.com
Advance Product Information
July 20, 2005
TGA2600-EPU
TABLE II
RF CHARACTERIZATION TABLE
(TA = 25 °C, Nominal)
Vd = 2.5V, Id = 17 mA
SYMBOL
PARAMETER
TEST
CONDITION
NOMINAL
UNITS
Gain
Small Signal Gain
f = 7-11 GHz
30
dB
IRL
Input Return Loss
f = 7-11 GHz
12
dB
ORL
Output Return Loss
f = 7-11 GHz
12
dB
NF
Noise Figure
f = 7-11 GHz
0.7
dB
Output Power @
1dB Gain
Compression
Output Third Order
Intercept
f = 7-11 GHz
2
dBm
f = 7-11 GHz
14
dBm
P1dB
TOI
TABLE III
THERMAL INFORMATION*
Parameter
RθJC Thermal
Resistance
(channel to backside of
carrier)
Test Conditions
Vd = 2.5 V
ID = 16 mA
Pdiss = 0.04 W
TCH
(oC)
RTJC
(qC/W)
TM
(HRS)
73
75
> 1 E+6
Note: Assumes epoxy mounted at 70°C baseplate temperature. Worst case
condition with no RF applied, 100% of DC power is dissipated.
3
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994-8504 Email: [email protected] Web: www.triquint.com
Advance Product Information
July 20, 2005
TGA2600-EPU
Measured Fixtured Data
Bias Conditions: Vd = 2.5V, Id= 17mA
1.4
Noise Figure (dB)
1.2
1
0.8
0.6
0.4
0.2
0
6
7
8
9
10
11
12
13
14
15
16
Frequency (GHz)
2
Id = 17mA
Id = 10mA
Id = 8mA
Id = 5mA
1.8
Noise Figure (dB)
1.6
1.4
1.2
1
0.8
0.6
0.4
0.2
0
5
6
7
8
9
10
11
12
13
Frequency (GHz)
4
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994-8504 Email: [email protected] Web: www.triquint.com
Advance Product Information
July 20, 2005
TGA2600-EPU
Measured Fixtured Data
42
36
30
24
18
12
6
0
-6
-12
-18
-24
-30
42
36
30
24
18
12
6
0
-6
-12
-18
-24
-30
Gain
Output
2
4
Input
6
8
10
12
14
16
Return Loss (dB)
Gain (dB)
Bias Conditions: Vd = 2.5V, Id= 17mA
18
Frequency (GHz)
33
32
Gain (dB)
31
30
29
28
7 GHz
9 GHz
11 GHz
27
26
25
-14
-12
-10
-8
-6
-4
-2
0
2
4
6
Pout (dBm)
3.5
Output P1dB (dBm)
3
2.5
2
1.5
1
0.5
0
6
7
8
9
10
11
12
Frequency (GHz)
5
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994-8504 Email: [email protected] Web: www.triquint.com
Advance Product Information
July 20, 2005
TGA2600-EPU
Measured Fixtured Data
Bias Conditions: Vd = 2.5V, Id= 17mA
18
Output TOI (dBm)
17
16
15
14
13
12
11
10
6
7
8
9
10
11
12
-9
-7
Frequency (GHz)
60
58
IMD3 (dBc)
56
54
52
50
48
7 GHz
9 GHz
11 GHz
46
44
42
40
-19
-17
-15
-13
-11
Output Power Per Tone (dBm)
6
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994-8504 Email: [email protected] Web: www.triquint.com
Advance Product Information
July 20, 2005
TGA2600-EPU
Mechanical Characteristics
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GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should
be observed during handling, assembly and test.
7
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994-8504 Email: [email protected] Web: www.triquint.com
Advance Product Information
July 20, 2005
TGA2600-EPU
Recommended Assembly Diagram
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GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should
be observed during handling, assembly and test.
8
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994-8504 Email: [email protected] Web: www.triquint.com
Advance Product Information
July 20, 2005
TGA2600-EPU
Assembly Process Notes
Assembly notes:
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Use conductive epoxy with limited exposure to temperatures at or above 175 °C.
Coefficient of thermal expansion matching is critical for long-term reliability.
Devices must be stored in a dry nitrogen atmosphere.
Component placement and adhesive attachment assembly notes:
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Vacuum pencils and/or vacuum collets are the preferred method of pick up.
Air bridges must be avoided during placement.
The force impact is critical during auto placement.
Curing should be done in a convection oven; proper exhaust is a safety concern.
Microwave or radiant curing should not be used because of differential heating.
Interconnect process assembly notes:
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•
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Thermosonic ball bonding is the preferred interconnect technique.
Force, time, and ultrasonics are critical parameters.
Aluminum wire should not be used.
Maximum stage temperature is 150 °C.
GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should
be observed during handling, assembly and test.
9
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994-8504 Email: [email protected] Web: www.triquint.com