CYPRESS CY7C1041BNV33

CY7C1041BNV33
256 K × 16 Static RAM
256 K × 16 Static RAM
Features
Functional Description
■
High speed
❐ tAA = 12 ns
The CY7C1041BNV33 is a high-performance CMOS Static RAM
organized as 262,144 words by 16 bits.
■
Low active power
❐ 612 mW (max.)
■
Low CMOS standby power
❐ 1.8 mW (max.)
■
2.0 V Data Retention (660 W at 2.0 V retention)
Writing to the device is accomplished by taking Chip Enable (CE)
and Write Enable (WE) inputs LOW. If Byte Low Enable (BLE) is
LOW, then data from I/O pins (I/O0 through I/O7), is written into
the location specified on the address pins (A0 through A17). If
Byte High Enable (BHE) is LOW, then data from I/O pins (I/O8
through I/O15) is written into the location specified on the address
pins (A0 through A17).
■
Automatic power-down when deselected
■
TTL-compatible inputs and outputs
■
Easy memory expansion with CE and OE features
Reading from the device is accomplished by taking Chip Enable
(CE) and Output Enable (OE) LOW while forcing the Write
Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data
from the memory location specified by the address pins will
appear on I/O0 to I/O7. If Byte High Enable (BHE) is LOW, then
data from memory will appear on I/O8 to I/O15. See the truth table
at the back of this data sheet for a complete description of read
and write modes.
The input/output pins (I/O0 through I/O15) are placed in a
high-impedance state when the device is deselected (CE HIGH),
the outputs are disabled (OE HIGH), the BHE and BLE are
disabled (BHE, BLE HIGH), or during a write operation (CE LOW,
and WE LOW).
The CY7C1041BNV33 is available in a standard 44-pin
400-mil-wide body width SOJ and 44-pin TSOP II package with
center power and ground (revolutionary) pinout.
Logic Block Diagram
256K x 16
ARRAY
1024 x 4096
SENSE AMPS
A0
A1
A2
A3
A4
A5
A6
A7
A8
ROW DECODER
INPUT BUFFER
I/O0 – I/O7
I/O8 – I/O15
A9
A10
A 11
A 12
A 13
A14
A15
A16
A17
COLUMN
DECODER
Cypress Semiconductor Corporation
Document #: 001-06434 Rev. *C
•
198 Champion Court
BHE
WE
CE
OE
BLE
•
San Jose, CA 95134-1709
•
408-943-2600
Revised March 30, 2011
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CY7C1041BNV33
Contents
Pin Configuration ............................................................. 3
Selection Guide ................................................................ 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
Electrical Characteristics ................................................. 4
Capacitance ...................................................................... 4
AC Test Loads and Waveforms ....................................... 4
Switching Characteristics ................................................ 5
Data Retention Characteristics ....................................... 6
Data Retention Waveform ................................................ 6
Switching Waveforms ...................................................... 7
Read Cycle No. 1 ........................................................ 7
Read Cycle No. 2 (OE Controlled) .............................. 7
Write Cycle No. 1 (CE Controlled) ............................... 8
Write Cycle No. 2 (BLE or BHE Controlled) ................ 8
Document #: 001-06434 Rev. *C
Truth Table ........................................................................ 9
Write Cycle No. 3 (WE Controlled, OE LOW) ............. 9
Ordering Information ...................................................... 10
Ordering Code Definitions ......................................... 10
Package Diagrams .......................................................... 11
Acronyms ........................................................................ 12
Document Conventions ................................................. 12
Units of Measure ....................................................... 12
Document History Page ................................................. 13
Sales, Solutions, and Legal Information ...................... 14
Worldwide Sales and Design Support ....................... 14
Products .................................................................... 14
PSoC Solutions ......................................................... 14
Page 2 of 14
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CY7C1041BNV33
Pin Configuration
SOJ
TSOP II
Top View
A0
A1
A2
A3
A4
CE
I/O0
I/O1
I/O2
I/O3
VCC
VSS
I/O4
I/O5
I/O6
I/O7
WE
A5
A6
A7
A8
A9
1
44
2
3
43
42
4
41
40
39
38
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A17
A16
A15
OE
BHE
BLE
I/O15
I/O14
I/O13
I/O12
VSS
VCC
I/O11
I/O10
I/O9
I/O8
NC
A14
A13
A12
A11
A10
Selection Guide
-12
Maximum Access Time (ns)
12
Maximum Operating Current (mA)
Commercial
190
Maximum CMOS Standby Current (mA)
Commercial
0.5
Document #: 001-06434 Rev. *C
Page 3 of 14
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CY7C1041BNV33
Maximum Ratings
DC Voltage Applied to Outputs
in High Z State[1] .................................. –0.5 V to VCC + 0.5 V
Exceeding the maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
DC Input Voltage[1] .............................. –0.5 V to VCC + 0.5 V
Current into Outputs (LOW)......................................... 20 mA
Storage Temperature ................................ –65 °C to +150 °C
Operating Range
Ambient Temperature with
Power Applied .......................................... –55 °C to +125 °C
Supply Voltage on VCC to Relative GND[1] ...–0.5 V to +4.6 V
Range
Ambient
Temperature[2]
VCC
Commercial
0 °C to +70 °C
3.3 V ± 0.3 V
Electrical Characteristics
Over the Operating Range
Parameter
Description
-12
Test Conditions
VOH
Output HIGH Voltage
VCC = Min, IOH = –4.0 mA
VOL
Output LOW Voltage
VCC = Min, IOL = 8.0 mA
VIH
Input HIGH Voltage
Voltage[1]
Unit
Min
Max
2.4
–
V
–
0.4
V
2.2
VCC + 0.5
V
VIL
Input LOW
–0.5
0.8
V
IIX
Input Leakage Current
GND < VI < VCC
–1
+1
mA
IOZ
Output Leakage Current
GND < VOUT < VCC, Output Disabled
–1
+1
mA
ICC
VCC Operating Supply Current
VCC = Max., f = fMAX = 1/tRC
–
190
mA
ISB1
Automatic CE Power-Down Current Max. VCC, CE > VIH, VIN > VIH or VIN < VIL, f = fMAX
—TTL Inputs
–
40
mA
ISB2
Automatic CE Power-Down Current Max. VCC, CE > VCC – 0.3V,
Commercial
—CMOS Inputs
VIN > VCC – 0.3V, or VIN < 0.3V, f = 0
–
0.5
mA
Commercial
Capacitance[3]
Parameter
Description
CIN
Input Capacitance
COUT
I/O Capacitance
Test Conditions
Max
Unit
8
pF
8
pF
TA = 25 °C, f = 1 MHz, VCC = 3.3 V
AC Test Loads and Waveforms
R1 317 
3.3 V
THÉVENIN EQUIVALENT
OUTPUT
OUTPUT
R2
351
30 pF
INCLUDING
JIG AND
SCOPE
167
(b)
3.3 V
1.73 V
GND
Rise time: 1 V/ns
(a)
ALL INPUT PULSES
90%
10%
90%
10%
Fall time:
1 V/ns
Notes
1. VIL (min.) = –2.0 V for pulse durations of less than 20 ns.
2. TA is the “Instant On” case temperature.
3. Tested initially and after any design or process changes that may affect these parameters.
Document #: 001-06434 Rev. *C
Page 4 of 14
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CY7C1041BNV33
Switching Characteristics[4]
Over the Operating Range
Parameter
Description
-12
Min
Max
Unit
READ CYCLE
tRC
Read Cycle Time
12
–
ns
tAA
Address to Data Valid
–
12
ns
tOHA
Data Hold from Address Change
3
–
ns
tACE
CE LOW to Data Valid
–
12
ns
tDOE
OE LOW to Data Valid
–
6
ns
tLZOE
OE LOW to Low Z
0
–
ns
–
6
ns
tHZOE
OE HIGH to High
Z[5, 6]
Z[6]
tLZCE
CE LOW to Low
3
–
ns
tHZCE
CE HIGH to High Z[5, 6]
–
6
ns
tPU
CE LOW to Power-Up
0
–
ns
tPD
CE HIGH to Power-Down
–
12
ns
tDBE
Byte Enable to Data Valid
–
6
ns
tLZBE
Byte Enable to Low Z
0
–
ns
Byte Disable to High Z
–
6
ns
tHZBE
WRITE
CYCLE[7, 8]
tWC
Write Cycle Time
12
–
ns
tSCE
CE LOW to Write End
10
–
ns
tAW
Address Set-Up to Write End
10
–
ns
tHA
Address Hold from Write End
0
–
ns
tSA
Address Set-Up to Write Start
0
–
ns
tPWE
WE Pulse Width
10
–
ns
tSD
Data Set-Up to Write End
7
–
ns
tHD
Data Hold from Write End
0
–
ns
[6]
tLZWE
WE HIGH to Low Z
3
–
ns
tHZWE
WE LOW to High Z[5, 6]
–
6
ns
tBW
Byte Enable to End of Write
10
–
ns
Notes
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V, and output loading of the specified
IOL/IOH and 30-pF load capacitance.
5. tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads and Waveforms on page 4. Transition is measured ±500 mV
from steady-state voltage.
6. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
7. The internal write time of the memory is defined by the overlap of CE LOW, and WE LOW. CE and WE must be LOW to initiate a write, and the transition of either
of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
8. The minimum write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
Document #: 001-06434 Rev. *C
Page 5 of 14
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CY7C1041BNV33
Data Retention Characteristics
Over the Operating Range
Parameter
Description
VDR
VCC for Data Retention
ICCDR
Data Retention Current
tCDR[10]
Chip Deselect to Data
Retention Time
tR[11]
Operation Recovery Time
Conditions[9]
VCC = VDR = 2.0 V,
CE > VCC – 0.3 V,
VIN > VCC – 0.3 V or VIN < 0.3 V
Min
Max
Unit
2.0
–
V
–
330
A
0
–
ns
tRC
–
ns
Data Retention Waveform
DATA RETENTION MODE
VCC
3.0 V
VDR > 2 V
tCDR
3.0 V
tR
CE
Notes
9. No input may exceed VCC + 0.5V.
10. Tested initially and after any design or process changes that may affect these parameters.
11. tr < 3 ns for the -12 and -15 speeds.
Document #: 001-06434 Rev. *C
Page 6 of 14
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CY7C1041BNV33
Switching Waveforms
Read Cycle No. 1[12, 13]
tRC
ADDRESS
tOHA
DATA OUT
tAA
PREVIOUS DATA VALID
DATA VALID
Read Cycle No. 2 (OE Controlled)[13, 14]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
BHE, BLE
tLZOE
tHZCE
tDBE
tLZBE
DATA OUT
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZBE
DATA VALID
HIGH
IMPEDANCE
tPD
tPU
50%
50%
ICC
ISB
Notes
12. Device is continuously selected. OE, CE, BHE and/or BHE = VIL.
13. WE is HIGH for read cycle.
14. Address valid prior to or coincident with CE transition LOW.
Document #: 001-06434 Rev. *C
Page 7 of 14
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CY7C1041BNV33
Switching Waveforms (continued)
Write Cycle No. 1 (CE Controlled)[15, 16]
tWC
ADDRESS
CE
tSA
tSCE
tAW
tHA
tPWE
WE
tBW
BHE, BLE
tSD
tHD
DATAI/O
Write Cycle No. 2 (BLE or BHE Controlled)
tWC
ADDRESS
BHE, BLE
tSA
tBW
tAW
tHA
tPWE
WE
tSCE
CE
tSD
tHD
DATAI/O
Notes
15. Data I/O is high-impedance if OE or BHE and/or BLE= VIH.
16. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high–impedance state.
Document #: 001-06434 Rev. *C
Page 8 of 14
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CY7C1041BNV33
Switching Waveforms (continued)
Write Cycle No. 3 (WE Controlled, OE LOW)
tWC
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tBW
BHE, BLE
tHZWE
tSD
tHD
DATA I/O
tLZWE
Truth Table
CE
OE
WE
BLE
BHE
I/O0–I/O7
I/O8–I/O15
Mode
Power
H
X
X
X
X
High Z
High Z
Power Down
Standby (ISB)
L
L
H
L
L
Data Out
Data Out
Read All Bits
Active (ICC)
L
L
H
L
H
Data Out
High Z
Read Lower Bits Only
Active (ICC)
L
L
H
H
L
High Z
Data Out
Read Upper Bits Only
Active (ICC)
L
X
L
L
L
Data In
Data In
Write All Bits
Active (ICC)
L
X
L
L
H
Data In
High Z
Write Lower Bits Only
Active (ICC)
L
X
L
H
L
High Z
Data In
Write Upper Bits Only
Active (ICC)
L
H
H
X
X
High Z
High Z
Selected, Outputs Disabled
Active (ICC)
Document #: 001-06434 Rev. *C
Page 9 of 14
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CY7C1041BNV33
Ordering Information
Speed
(ns)
Ordering Code
Package
Diagram
12
CY7C1041BNV33L-12VXC
51-85082
44-pin (400-Mil) Molded SOJ (Pb-free)
CY7C1041BNV33L-12ZXC
51-85087
44-pin TSOP II (Pb-free)
Package Type
Operating
Range
Commercial
Ordering Code Definitions
CY 7 C 1 04 1 BN V33 L - 12 XX C
Temperature Range:
C = Commercial
Package Type: XX = VX or ZX
VX = 44-pin Molded SOJ (Pb-free)
ZX = 44-pin TSOP II (Pb-free)
Speed: 12 ns
L = Low Power
V33 = Voltage range (3 V to 3.6 V)
BN = 0.25 µm Technology
1 = Data width × 16-bits
04 = 4-Mbit density
1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
7 = SRAM
CY = Cypress
Please contact local sales representative regarding availability of these parts.
Document #: 001-06434 Rev. *C
Page 10 of 14
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CY7C1041BNV33
Package Diagrams
Figure 1. 44-Lead (400-Mil) Molded SOJ (51-85082)
51-85082 *C
Figure 2. 44-Pin TSOP II (51-85087)
51-85087 *C
Document #: 001-06434 Rev. *C
Page 11 of 14
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CY7C1041BNV33
Acronyms
Document Conventions
Description
Units of Measure
CMOS
Complementary metal oxide semiconductor
Symbol
CE
Chip Enable
°C
degree Celsius
I/O
Input/output
A
micro Amperes
OE
Output Enable
mA
milli Amperes
SRAM
Static Random Access Memory
F
micro Farad
SOJ
Small Outline J-lead
s
micro seconds
TTL
transistor-transistor logic
ms
milli seconds
TSOP
thin small-outline package
ns
nano seconds
WE
Write Enable
pF
pico Farad
V
Volts

ohms
W
micro Watts
mW
milli Watts
W
Watts
%
percent
Acronym
Document #: 001-06434 Rev. *C
Unit of Measure
Page 12 of 14
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CY7C1041BNV33
Document History Page
Document Title: CY7C1041BNV33 256 K × 16 Static RAM
Document Number: 001-06434
REV.
ECN NO.
Issue Date
Orig. of
Change
Description of Change
**
423877
See ECN
NXR
New Data Sheet
*A
2899016
See ECN
VKN
Removed Industrial grade
Removed 15ns speed
Updated Ordering Information table
Updated Package Diagrams
*B
3109184
12/13/2010
AJU
Added Ordering Code Definitions.
*C
3210222
03/30/2011
PRAS
Document #: 001-06434 Rev. *C
Updated Selection Guide.
Added Acronyms and Units of Measure.
Updated in new template.
Page 13 of 14
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CY7C1041BNV33
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
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© Cypress Semiconductor Corporation, 2006-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document #: 001-06434 Rev. *C
Revised March 30, 2011
Page 14 of 14
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