VISHAY IRFP22N50A

IRFP22N50A, SiHFP22N50A
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
• Low Gate Charge Qg Results in Simple Drive
Requirement
500
RDS(on) (Ω)
VGS = 10 V
0.23
Qg (Max.) (nC)
120
Qgs (nC)
32
Qgd (nC)
52
Configuration
• Improved Gate, Avalanche and Dynamic dV/dt
Ruggedness
• Fully
Characterized
Capacitance
Avalanche Voltage and Current
Single
Available
RoHS*
COMPLIANT
and
• Lead (Pb)-free Available
D
APPLICATIONS
TO-247
• Switch Mode Power Supply (SMPS)
• Uninterruptable Power Supply
G
• High Speed Power Switching
S
D
TYPICAL SMPS TOPOLOGIES
S
G
• Full Bridge Converters
N-Channel MOSFET
• Power Factor Correction Boost
ORDERING INFORMATION
Package
TO-247
IRP22N50APbF
SiHFP22N50A-E3
IRP22N50A
SiHFP22N50A
Lead (Pb)-free
SnPb
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
LIMIT
Drain-Source Voltage
VDS
500
Gate-Source Voltage
VGS
± 30
Continuous Drain Current
Pulsed Drain
VGS at 10 V
TC = 25 °C
TC = 100 °C
Currenta
ID
IDM
Linear Derating Factor
UNIT
V
22
14
A
88
2.2
W/°C
mJ
Single Pulse Avalanche Energyb
EAS
1180
Repetitive Avalanche Currenta
IAR
22
A
Repetitive Avalanche Energya
EAR
28
mJ
Maximum Power Dissipation
TC = 25 °C
Peak Diode Recovery dV/dtc
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
Mounting Torque
for 10 s
6-32 or M3 screw
PD
277
W
dV/dt
4.8
V/ns
TJ, Tstg
- 55 to + 150
300d
°C
10
lbf · in
1.1
N·m
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Starting TJ = 25 °C, L = 4.87 mH, RG = 25 Ω, IAS = 22 A (see fig. 12).
c. ISD ≤ 22 A, dI/dt ≤ 190 A/µs, VDD ≤ VDS, TJ ≤ 150 °C.
d. 1.6 mm from case.
* Pb containing terminations are not RoHS compliant, exemptions may apply
Document Number: 91207
S-81264-Rev. A, 21-Jul-08
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IRFP22N50A, SiHFP22N50A
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambient
RthJA
-
40
Case-to-Sink, Flat, Greased Surface
RthCS
0.24
-
Maximum Junction-to-Case (Drain)
RthJC
-
0.45
UNIT
°C/W
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
VDS
VGS = 0 V, ID = 250 µA
500
-
-
V
ΔVDS/TJ
Reference to 25 °C, ID = 1 mA
-
0.55
-
V/°C
VGS(th)
VDS = VGS, ID = 250 µA
2.0
-
4.0
V
nA
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
Drain-Source On-State Resistance
Forward Transconductance
IGSS
IDSS
RDS(on)
gfs
VGS = ± 30 V
-
-
± 100
VDS = 500 V, VGS = 0 V
-
-
25
VDS = 400 V, VGS = 0 V, TJ = 125 °C
-
-
250
ID = 13 Ab
VGS = 10 V
VDS = 50 V, ID = 13 Ab
µA
-
-
0.23
Ω
12
-
-
S
-
3450
-
-
513
-
-
27
-
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Output Capacitance
Effective Output Capacitance
Total Gate Charge
Gate-Source Charge
Coss
VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5
VGS = 0 V
Coss eff.
VDS = 1.0 V, f = 1.0 MHz
4935
VDS = 400 V, f = 1.0 MHz
137
VDS = 0 V to 400
Vc
Qg
Qgs
VGS = 10 V
ID = 22 A, VDS = 400 V,
see fig. 6 and 13b
pF
264
-
-
120
-
-
32
nC
Gate-Drain Charge
Qgd
-
-
52
Turn-On Delay Time
td(on)
-
26
-
-
94
-
-
47
-
-
47
-
-
-
22
-
-
88
-
-
1.5
-
570
850
ns
-
6.1
9.2
µC
Rise Time
Turn-Off Delay Time
Fall Time
tr
td(off)
VDD = 250 V, ID = 22 A,
RG = 4.3 Ω, RD = 11 Ω, see fig. 10b
tf
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulsed Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Forward Turn-On Time
ton
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
S
TJ = 25 °C, IS = 22A, VGS = 0 Vb
TJ = 25 °C, IF = 22 A, dI/dt = 100 A/µsb
V
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width ≤ 300 µs; duty cycle ≤ 2 %.
c. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80 % VDS.
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Document Number: 91207
S-81264-Rev. A, 21-Jul-08
IRFP22N50A, SiHFP22N50A
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
Fig. 1 - Typical Output Characteristics
Fig. 2 - Typical Output Characteristics
Document Number: 91207
S-81264-Rev. A, 21-Jul-08
Fig. 3 - Typical Transfer Characteristics
Fig. 4 - Normalized On-Resistance vs. Temperature
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IRFP22N50A, SiHFP22N50A
Vishay Siliconix
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
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Fig. 7 - Typical Source-Drain Diode Forward Voltage
Fig. 8 - Maximum Safe Operating Area
Document Number: 91207
S-81264-Rev. A, 21-Jul-08
IRFP22N50A, SiHFP22N50A
Vishay Siliconix
RD
VDS
VGS
D.U.T.
RG
+
- VDD
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
Fig. 10a - Switching Time Test Circuit
VDS
90 %
10 %
VGS
td(on)
Fig. 9 - Maximum Drain Current vs. Case Temperature
td(off) tf
tr
Fig. 10b - Switching Time Waveforms
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
VDS
L
Vary tp to obtain
required IAS
VDS
tp
VDD
D.U.T
RG
+
-
IAS
V DD
A
VDS
10 V
tp
0.01 Ω
Fig. 12a - Unclamped Inductive Test Circuit
Document Number: 91207
S-81264-Rev. A, 21-Jul-08
IAS
Fig. 12b - Unclamped Inductive Waveforms
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IRFP22N50A, SiHFP22N50A
Vishay Siliconix
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
Fig. 12d - Typical Drain-to-Source Voltage vs.
Avalanche Current
Current regulator
Same type as D.U.T.
50 kΩ
QG
10 V
12 V
0.2 µF
0.3 µF
QGS
QGD
+
D.U.T.
VG
-
VDS
VGS
3 mA
Charge
IG
ID
Current sampling resistors
Fig. 13a - Basic Gate Charge Waveform
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Fig. 13b - Gate Charge Test Circuit
Document Number: 91207
S-81264-Rev. A, 21-Jul-08
IRFP22N50A, SiHFP22N50A
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T.
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
RG
•
•
•
•
dV/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by duty factor "D"
D.U.T. - device under test
Driver gate drive
P.W.
+
Period
D=
+
-
VDD
P.W.
Period
VGS = 10 V*
D.U.T. ISD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
VDD
Body diode forward drop
Inductor current
Ripple ≤ 5 %
ISD
* VGS = 5 V for logic level devices
Fig. 14 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?91207.
Document Number: 91207
S-81264-Rev. A, 21-Jul-08
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Vishay
Disclaimer
All product specifications and data are subject to change without notice.
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or in any other disclosure relating to any product.
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therein, which apply to these products.
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Document Number: 91000
Revision: 18-Jul-08
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