NTMD4840N Power MOSFET 30 V, 7.5 A, Dual N−Channel, SOIC−8 Features • • • • • Low RDS(on) to Minimize Conduction Losses Low Capacitance to Minimize Driver Losses Optimized Gate Charge to Minimize Switching Losses Dual SOIC−8 Surface Mount Package Saves Board Space This is a Pb−Free Device http://onsemi.com RDS(on) Max V(BR)DSS 24 mW @ 10 V 30 V Applications 7.5 A 36 mW @ 4.5 V • Disk Drives • DC−DC Converters • Printers N−Channel D MAXIMUM RATINGS (TJ = 25°C unless otherwise stated) Symbol Value Unit Drain−to−Source Voltage VDSS 30 V Gate−to−Source Voltage VGS ±20 V ID 5.5 A Rating Continuous Drain Current RqJA (Note 1) TA = 25°C Power Dissipation RqJA (Note 1) TA = 25°C PD 1.14 W Continuous Drain Current RqJA (Note 2) TA = 25°C ID 4.5 A TA = 25°C PD 0.68 W Continuous Drain Current RqJA t < 10 s (Note 1) TA = 25°C ID 7.5 A Power Dissipation RqJA t < 10 s (Note 1) TA = 25°C PD 1.95 W IDM 30 A TJ, TSTG −55 to +150 °C Power Dissipation RqJA (Note 2) ID Max TA = 70°C Steady State Pulsed Drain Current TA = 70°C Operating Junction and Storage Temperature Source Current (Body Diode) S 3.5 TA = 70°C TA = 25°C, tp = 10 ms 6.0 IS 2.0 A Single Pulse Drain−to−Source Avalanche Energy TJ = 25°C, VDD = 30 V, VGS = 10 V, IL = 7.5 Apk, L = 1.0 mH, RG = 25 W EAS 28 mJ Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) TL 260 °C Rating Symbol Max Junction−to−Ambient – Steady State (Note 1) RqJA 110 Junction−to−Ambient – t≤10 s (Note 1) RqJA 64 Junction−to−FOOT (Drain) RqJF 40 Junction−to−Ambient – Steady State (Note 2) RqJA 183.5 1 D1 D1 D2 D2 8 SOIC−8 CASE 751 STYLE 11 8 1 4840N AYWW G 1 S1 G1 S2 G2 4840N A Y WW G = Device Code = Assembly Location = Year = Work Week = Pb−Free Package ORDERING INFORMATION Package Shipping† Unit NTMD4840NR2G SOIC−8 (Pb−Free) 2500/Tape & Reel °C/W †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Surface−mounted on FR4 board using 1 inch sq pad size, 1 oz Cu. 2. Surface−mounted on FR4 board using the minimum recommended pad size. September, 2009 − Rev. 1 MARKING DIAGRAM & PIN ASSIGNMENT Device THERMAL RESISTANCE RATINGS © Semiconductor Components Industries, LLC, 2009 G 4.4 Publication Order Number: NTMD4840N/D NTMD4840N ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)jk Characteristic Symbol Test Condition Min V(BR)DSS VGS = 0 V, ID = 250 mA 30 Typ Max Unit OFF CHARACTERISTICS Drain−to−Source Breakdown Voltage Drain−to−Source Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate−to−Source Leakage Current V(BR)DSS/TJ IDSS V 18 VGS = 0 V, VDS = 24 V mV/°C TJ = 25°C 1.0 TJ = 100°C 10 IGSS VDS = 0 V, VGS = ±20 V VGS(TH) VGS = VDS, ID = 250 mA mA ±100 nA 3.0 V ON CHARACTERISTICS (Note 3) Gate Threshold Voltage Negative Threshold Temperature Coefficient Drain−to−Source On Resistance Forward Transconductance VGS(TH)/TJ 1.5 6.0 RDS(on) gFS mV/°C VGS = 10 V ID = 6.9 A 16 24 VGS = 4.5 V ID = 5.0 A 26 36 VDS = 1.5 V, ID = 6.9 A 15 mW S CHARGES, CAPACITANCES AND GATE RESISTANCE Input Capacitance CISS Output Capacitance COSS Reverse Transfer Capacitance CRSS 70 Total Gate Charge QG(TOT) 4.8 Threshold Gate Charge QG(TH) Gate−to−Source Charge QGS Gate−to−Drain Charge QGD Total Gate Charge QG(TOT) 520 VGS = 0 V, f = 1.0 MHz, VDS = 15 V VGS = 4.5 V, VDS = 15 V, ID = 6.9 A 140 pF 1.1 nC 2.1 1.9 VGS = 10 V, VDS = 15 V, ID = 6.9 A 9.5 nC SWITCHING CHARACTERISTICS (Note 4) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time td(ON) tr td(OFF) 7.6 VGS = 10 V, VDD = 15 V, ID = 1.0 A, RG = 3.0 W tf 5.0 ns 17 3.0 DRAIN−TO−SOURCE CHARACTERISTICS Forward Diode Voltage VSD Reverse Recovery Time tRR Charge Time Ta Discharge Time Reverse Recovery Time Tb VGS = 0 V ID = 2.0 A TJ = 25°C 0.76 TJ = 125°C 0.58 1.0 12.5 VGS = 0 V, dIS/dt = 100 A/ms, IS = 2.0 A V ns 7.3 5.2 QRR 6.0 nC LS 0.66 nH 0.20 nH PACKAGE PARASITIC VALUES Source Inductance Drain Inductance LD Gate Inductance LG Gate Resistance RG TA = 25°C 1.50 2.0 3. Pulse Test: pulse width v 300 ms, duty cycle v 2%. 4. Switching characteristics are independent of operating junction temperatures. http://onsemi.com 2 nH 3.0 W NTMD4840N TYPICAL PERFORMANCE CURVES 8 TJ = 25°C ID, DRAIN CURRENT (AMPS) 10 3.4 V 6 3.2 V 4 3.0 V 2 0 RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) 32 10V 4.5 V 4.2 V 4V 3.8 V 2.8 V 2.6 V 0 1.0 2.0 4.0 3.0 5.0 24 20 16 12 4 0.045 0.040 0.035 0.030 0.025 0.020 2.5 2 3.5 3 4 5 4 7 6 8 9 TJ = 25°C 0.028 0.026 VGS = 4.5 V 0.024 0.022 0.020 0.018 VGS = 10 V 0.016 0.014 2 10 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 4.5 0.030 3.5 5 6.5 8 9.5 12.5 11 14 ID, DRAIN CURRENT (AMPS) Figure 4. On−Resistance vs. Drain Current and Gate Voltage Figure 3. On−Resistance vs. Gate−to−Source Voltage 100000 1.65 VGS = 0 V ID = 7.5 A VGS = 10 V IDSS, LEAKAGE (nA) RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) TJ = −55°C Figure 2. Transfer Characteristics 0.050 1.45 TJ = 25°C Figure 1. On−Region Characteristics 0.055 1.55 TJ = 125°C 8 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) TJ = 25°C ID = 6.9 A 3 VDS ≥ 10 V VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 0.060 0.015 28 0 1.5 RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) ID, DRAIN CURRENT (AMPS) 12 1.35 10000 1.25 1.15 1.05 0.95 TJ = 150°C 1000 TJ = 125°C 0.85 0.75 0.65 −50 −25 0 25 50 75 100 125 150 100 5 10 15 20 25 TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 5. On−Resistance Variation with Temperature Figure 6. Drain−to−Source Leakage Current vs. Voltage http://onsemi.com 3 30 NTMD4840N TYPICAL PERFORMANCE CURVES TJ = 25°C 600 C, CAPACITANCE (pF) VGS, GATE-TO-SOURCE VOLTAGE (VOLTS) 700 VGS = 0 V Ciss 500 400 300 200 Coss 100 0 Crss 0 5 10 15 20 25 DRAIN−TO−SOURCE VOLTAGE (VOLTS) 30 10 QT 9 VDS 8 7 VGS 6 5 3 2 VGS = 10 V ID = 6.9 A TJ = 25°C 1 0 1 0 Figure 7. Capacitance Variation IS, SOURCE CURRENT (AMPS) td(off) tf t, TIME (ns) 8 3 5 6 7 4 QG, TOTAL GATE CHARGE (nC) 9 10 2.5 VDD = 15 V ID = 1 A VGS = 10 V 10 td(on) tr 1 10 1.5 1 0.5 0 0.4 0.5 0.6 0.7 0.8 Figure 9. Resistive Switching Time Variation vs. Gate Resistance Figure 10. Diode Forward Voltage vs. Current 100 ms 1 ms 1 10 ms VGS = 20 V SINGLE PULSE TC = 25°C dc RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 1 10 100 EAS, SINGLE PULSE DRAIN−TO−SOURCE AVALANCHE ENERGY (mJ) VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS) 10 0.01 0.01 VGS = 0 V TJ = 25°C RG, GATE RESISTANCE (OHMS) 10 ms 0.1 2 100 100 ID, DRAIN CURRENT (AMPS) 2 Figure 8. Gate−To−Source and Drain−To−Source Voltage vs. Total Charge 100 1 QGD QGS 4 30 25 ID = 7.5 A 20 15 10 5 0 25 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 11. Maximum Rated Forward Biased Safe Operating Area 125 50 75 100 TJ, STARTING JUNCTION TEMPERATURE (°C) Figure 12. Maximum Avalanche Energy vs. Starting Junction Temperature http://onsemi.com 4 150 NTMD4840N PACKAGE DIMENSIONS SOIC−8 NB CASE 751−07 ISSUE AJ −X− NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. 751−01 THRU 751−06 ARE OBSOLETE. NEW STANDARD IS 751−07. A 8 5 S B 0.25 (0.010) M Y M 1 4 −Y− K G C N DIM A B C D G H J K M N S X 45 _ SEATING PLANE −Z− 0.10 (0.004) H D 0.25 (0.010) M Z Y S X M J S INCHES MIN MAX 0.189 0.197 0.150 0.157 0.053 0.069 0.013 0.020 0.050 BSC 0.004 0.010 0.007 0.010 0.016 0.050 0 _ 8 _ 0.010 0.020 0.228 0.244 STYLE 11: PIN 1. SOURCE 1 2. GATE 1 3. SOURCE 2 4. GATE 2 5. DRAIN 2 6. DRAIN 2 7. DRAIN 1 8. DRAIN 1 SOLDERING FOOTPRINT* 1.52 0.060 7.0 0.275 MILLIMETERS MIN MAX 4.80 5.00 3.80 4.00 1.35 1.75 0.33 0.51 1.27 BSC 0.10 0.25 0.19 0.25 0.40 1.27 0_ 8_ 0.25 0.50 5.80 6.20 4.0 0.155 0.6 0.024 1.270 0.050 SCALE 6:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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