CYPRESS CY7C1069AV33_12

CY7C1069AV33
2 M × 8 Static RAM
2 M × 8 Static RAM
Features
Functional Description
■
High speed
❐ tAA = 10 ns
The CY7C1069AV33 is a high performance complementary
metal oxide semiconductor (CMOS) static RAM organized as
2,097,152 words by 8 bits. Writing to the device is accomplished
by enabling the chip (by taking CE1 LOW and CE2 HIGH) and
Write Enable (WE) inputs LOW.
■
Low active power
❐ 990 mW (max)
■
Operating voltages of 3.3 ± 0.3 V
■
2.0 V data retention
■
Automatic power down when deselected
■
TTL-compatible inputs and outputs
■
Easy memory expansion with CE1 and CE2 features
■
Available in Pb-free 54-pin thin small outline package (TSOP) II
package
Reading from the device is accomplished by enabling the chip
(CE1 LOW and CE2 HIGH) as well as forcing the Output Enable
(OE) LOW while forcing the WE HIGH. See “Truth Table” on
page 8 for a complete description of Read and Write modes.
The input/output pins (I/O0 through I/O7) are placed in a high
impedance state when the device is deselected (CE1 HIGH or
CE2 LOW), the outputs are disabled (OE HIGH), or during a
Write operation (CE1 LOW, CE2 HIGH, and WE LOW).
The CY7C1069AV33 is available in a 54-pin TSOP II package
with center power and ground (revolutionary) pinout.
Logic Block Diagram
2048K x 8
ARRAY
POWER
DOWN
Cypress Semiconductor Corporation
Document Number: 38-05255 Rev. *J
•
I/O3
I/O4
A17
A18
A19
A20
A16
A13
A14
A15
I/O6
I/O7
WE
OE
I/O2
I/O5
COLUMN
DECODER
CE1
CE2
SENSE AMPS
I/O1
ROW DECODER
A0
A1
A2
A3
A4
A5
A6
A7
A
A98
A10
A11
A12
I/O0
Data in Drivers
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised November 29, 2010
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CY7C1069AV33
Contents
Selection Guide ................................................................ 3
Pin Configuration ............................................................. 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
DC Electrical Characteristics .......................................... 4
Capacitance ...................................................................... 4
AC Switching Characteristics ......................................... 5
Switching Waveforms ...................................................... 7
Truth Table ........................................................................ 8
Ordering Information ........................................................ 9
Ordering Code Definition ............................................. 9
Document Number: 38-05255 Rev. *J
Package Diagram .............................................................. 9
Acronyms ........................................................................ 10
Document Conventions ................................................. 10
Units of Measure ....................................................... 10
Document History Page ................................................. 11
Sales, Solutions, and Legal Information ...................... 12
Worldwide Sales and Design Support ....................... 12
Products .................................................................... 12
PSoC Solutions ......................................................... 12
Page 2 of 12
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CY7C1069AV33
Selection Guide
Description
–10
Unit
Maximum access time
10
ns
Maximum operating current
275
mA
Maximum CMOS standby current
50
mA
Pin Configuration
Figure 1. 54-pin TSOP II [1, 2]
Top View
NC
VCC
NC
I/O6
VSS
I/O7
A4
A3
A2
A1
A0
NC
CE1
VCC
WE
CE2
A19
A18
A17
A16
A15
I/O0
VCC
I/O1
NC
VSS
NC
1
2
3
54
53
4
52
51
5
6
50
49
7
8
9
10
11
12
48
47
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
NC
VSS
NC
I/O5
VCC
I/O4
A5
A6
A7
A8
A9
NC
OE
VSS
DNU
A20
A10
A11
A12
A13
A14
I/O3
VSS
I/O2
NC
VCC
NC
Notes
1. NC pins are not connected on the die.
2. DNU pins have to be left floating or tied to VSS to ensure proper application.
Document Number: 38-05255 Rev. *J
Page 3 of 12
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CY7C1069AV33
Maximum Ratings
Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested.
Storage temperature ................................ –65 C to +150 C
DC input voltage[3] ............................... –0.5 V to VCC + 0.5 V
Current into outputs (LOW) ......................................... 20 mA
Operating Range
Ambient temperature with
power applied ........................................... –55 C to +125 C
Range
Supply voltage on VCC to relative GND[3] .....–0.5 V to +4.6 V
Commercial
DC voltage applied to outputs
in high Z state[3] ................................... –0.5 V to VCC + 0.5 V
Industrial
Ambient
Temperature
VCC
0 C to +70 C
3.3 V  0.3 V
–40 C to +85 C
DC Electrical Characteristics
Over the Operating Range
Parameter
Description
Test Conditions
VOH
Output HIGH voltage
VCC = Min, IOH = –4.0 mA
VOL
Output LOW voltage
VCC = Min, IOL = 8.0 mA
VIH
Input HIGH voltage
voltage[3]
–10
Unit
Min
Max
2.4
–
V
–
0.4
V
2.0
VCC + 0.3
V
VIL
Input LOW
–0.3
0.8
V
IIX
Input leakage current
GND < VI < VCC
–1
+1
A
IOZ
Output leakage current
GND < VOUT < VCC, Output Disabled
–1
+1
A
ICC
VCC Operating supply current
VCC = Max, f = fMAX = 1/tRC
–
275
mA
ISB1
Automatic CE power down
current —TTL Inputs
CE2 < VIL, Max VCC, CE1 > VIH
VIN > VIH or VIN < VIL, f = fMAX
–
70
mA
ISB2
Automatic CE power down
current —CMOS inputs
CE2 < 0.3 V, Max VCC,
CE1> VCC – 0.3 V,
VIN > VCC – 0.3 V,
or VIN < 0.3 V, f = 0
–
50
mA
Capacitance
Tested initially and after any design or process changes that may affect these parameters.[4]
Parameter
CIN
COUT
Description
Input capacitance
Test Conditions
TA = 25 C, f = 1 MHz, VCC = 3.3 V
I/O capacitance
TSOP II
Unit
6
pF
8
pF
Notes
3. VIL (min.) = –2.0 V for pulse durations of less than 20 ns.
4. Tested initially and after any design or process changes that may affect these parameters.
Document Number: 38-05255 Rev. *J
Page 4 of 12
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CY7C1069AV33
Figure 2. AC Test Loads and Waveforms[5]
50 
OUTPUT
Z0 = 50 
(a)
R1 317 
VTH = 1.5 V
3.3 V
30 pF* *Capacitive Load consists of all
components of the test environment
OUTPUT
5 pF*
*Including
jig and
scope
(b)
All input pulses
3.3V
90%
10%
GND
R2
351
90%
10%
Fall time: > 1 V/ns
Rise time > 1 V/ns
(c)
AC Switching Characteristics
Over the Operating Range [6]
Parameter
–10
Description
Unit
Min
Max
–
ms
Read Cycle
tpower
VCC(typical) to the first access[7]
1
tRC
Read cycle time
10
–
ns
tAA
Address to data valid
–
10
ns
tOHA
Data hold from address change
3
–
ns
tACE
–
10
ns
tDOE
CE1 LOW/CE2 HIGH to data valid
OE LOW to data valid
tLZOE
OE LOW to low Z
tHZOE
tLZCE
tHZCE
tPU
tPD
Write Cycle[9, 10]
–
5
ns
[8]
1
–
ns
8
Z[ ]
OE HIGH to high
[8]
CE1 LOW/CE2 HIGH to low Z
–
5
ns
3
–
ns
CE1 HIGH/CE2 LOW to high
CE1 LOW/CE2 HIGH to power up[9]
–
5
ns
0
–
ns
–
10
ns
8]
Z[
CE1 HIGH/CE2 LOW to power
down[9]
tWC
Write cycle time
10
–
ns
tSCE
CE1 LOW/CE2 HIGH to write end
7
–
ns
tAW
Address setup to write end
7
–
ns
tHA
Address hold from write end
0
–
ns
tSA
Address setup to write start
0
–
ns
Notes
5. Valid SRAM operation does not occur until the power supplies have reached the minimum operating VDD (3.0V). As soon as 1ms (Tpower) after reaching the
minimum operating VDD, normal SRAM operation can begin including reduction in VDD to the data retention (VCCDR, 2.0V) voltage.
6. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
IOL/IOH and transmission line loads. Test conditions for the Read cycle use output loading shown in part a) of the AC test loads, unless specified otherwise.
7. This part has a voltage regulator which steps down the voltage from 3V to 2V internally. tpower time has to be provided initially before a Read/Write operation
is started.
8. tHZOE, tHZCE, tHZWE and tLZOE, tLZCE, and tLZWE are specified with a load capacitance of 5 pF as in (b) of AC Test Loads. Transition is measured 200 mV
from steady-state voltage.
9. These parameters are guaranteed by design and are not tested.
10. The internal Write time of the memory is defined by the overlap of CE1 LOW/CE2 HIGH, and WE LOW. CE1 and WE must be LOW along with CE2 HIGH to initiate
a Write, and the transition of any of these signals can terminate the Write. The input data setup and hold timing should be referenced to the leading edge of
the signal that terminates the Write.
Document Number: 38-05255 Rev. *J
Page 5 of 12
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CY7C1069AV33
AC Switching Characteristics
Over the Operating Range (continued)[6]
Parameter
Description
tPWE
WE pulse width
tSD
Data setup to write end
tHD
Data hold from write end
tLZWE
WE HIGH to low Z
tHZWE
–10
Min
Max
Unit
7
–
ns
5.5
–
ns
0
–
ns
[8]
3
–
ns
[8]
–
5
ns
WE LOW to high Z
Figure 3. Data Retention Waveform
DATA RETENTION MODE
VCC
3.0 V
tCDR
VDR > 2 V
3.0 V
tR
CE
Document Number: 38-05255 Rev. *J
Page 6 of 12
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CY7C1069AV33
Switching Waveforms
Figure 4. Read Cycle No. 1[11, 12]
tRC
ADDRESS
tOHA
DATA OUT
tAA
PREVIOUS DATA VALID
DATA VALID
Figure 5. Read Cycle No. 2 (OE Controlled)[12, 13]
ADDRESS
tRC
CE1
CE2
tASCE
OE
tHZOE
tDOE
tHZSCE
tLZOE
DATA OUT
HIGH IMPEDANCE
tLZSCE
VCC
SUPPLY
CURRENT
HIGH
IMPEDANCE
DATA VALID
tPD
tPU
50%
50%
ICC
ISB
Notes
11. Device is continuously selected. CE1 = VIL, CE2 = VIH.
12. WE is HIGH for Read cycle.
13. Address valid prior to or coincident with CE1 transition LOW and CE2 transition HIGH.
Document Number: 38-05255 Rev. *J
Page 7 of 12
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CY7C1069AV33
Switching Waveforms
(continued)
Figure 6. Write Cycle No. 1 (CE1 Controlled)[14, 15, 16]
tWC
ADDRESS
tSA
CE
tSCE
tAW
tHA
tPWE
WE
t BW
tSD
tHD
DATAI/O
Figure 7. Write Cycle No. 2 (WE Controlled, OE LOW)[14, 15, 16]
tWC
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tHZWE
tSD
tHD
DATA I/O
tLZWE
Truth Table
CE1
CE2
OE
WE
I/O0–I/O7
Mode
Power
H
X
X
X
High Z
Power down
Standby (ISB)
X
L
X
X
High Z
Power down
Standby (ISB)
L
H
L
H
Data Out
Read all bits
Active (ICC)
L
H
X
L
Data In
Write all bits
Active (ICC)
L
H
H
H
High Z
Selected, outputs disabled
Active (ICC)
Notes
14. Data I/O is high-impedance if OE = VIH.
15. If CE1 goes HIGH/CE2 LOW simultaneously with WE going HIGH, the output remains in a high–impedance state.
16. CE above is defined as a combination of CE1 and CE2. It is active low.
Document Number: 38-05255 Rev. *J
Page 8 of 12
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CY7C1069AV33
Ordering Information
Speed
(ns)
10
Ordering Code
CY7C1069AV33-10ZXC
Package
Diagram
51-85160
Package Type
54-pin TSOP II (Pb-free)
Operating
Range
Commercial
Ordering Code Definition
CY 7 C 106 9 A V33
Voltage: 3.3 V
Technology: 150 nm
Bus Width: x8
Density: 16 Mbit
Technology: CMOS
Marketing Code: 7= SRAM
Company ID : CY = Cypress
Package Diagram
Figure 8. 54-pin TSOP II, 51-85160
51-85160 *A
Document Number: 38-05255 Rev. *J
Page 9 of 12
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CY7C1069AV33
Acronyms
Document Conventions
Acronym
Description
Units of Measure
BE
Byte Enable
CMOS
complementary metal oxide semiconductor
ns
nano seconds
I/O
Input/output
V
Volts
OE
Output Enable
µA
micro Amperes
SRAM
static random access memory
mA
milli Amperes
TSOP
thin small outline package
mV
milli Volts
TTL
transistor-transistor logic
mW
milli Watts
WE
Write Enable
ms
milli seconds
Document Number: 38-05255 Rev. *J
Symbol
Unit of Measure
pF
pico Farad
°C
degree Celcius
W
Watts
%
percent
Page 10 of 12
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CY7C1069AV33
Document History Page
Document Title: CY7C1069AV33 2 M × 8 Static RAM
Document Number: 38-05255
REV.
ECN NO.
Submission
Date
Orig. of
Change
Description of Change
**
113724
03/27/02
NSL
New Data Sheet
*A
117060
07/31/02
DFP
Removed 15-ns bin
*B
117990
08/30/02
DFP
Added 8-ns bin
Changing ICC for 8, 10, 12 bins
tpower changed from 1 s to 1 ms
Load Cap Comment changed (for Tx line load)
tSD changed to 5.5 ns for the 10-ns bin
Changed some 8-ns bin #'s (tHZ, tDOE, tDBE)
Removed hz < lz comments
*C
120385
11/13/02
DFP
Final Data Sheet
Added note 4 to “AC Test Loads and Waveforms” and note 7 to tpu and tpd
Updated Input/Output Caps (for 48BGA only) to 8 pf/10 pf and for the 54-pin
TSOP to 6/8 pf
*D
124441
2/25/03
MEG
Changed ISB1 from 100 mA to 70 mA
Shaded the 48fBGA product offering information
*E
403984
See ECN
NXR
Changed the Logic Block Diagram On page # 1
Added notes under Pin Configuration
Changed the Package diagram of 51-85162 from Rev *A to Rev *D
Changed 48-Ball FBGA to 60-Ball FBGA in Pin Configuration
Updated the Ordering Information
*F
492137
See ECN
NXR
Removed 8 ns speed bin from product offering
Changed the description of IIX from Input Load Current to Input Leakage
Current in DC Electrical Characteristics table
Updated the Ordering Information
*G
2784946
10/12/2009
*H
2897049
03/25/10
AJU
Removed inactive parts from the ordering information table. Updated
package diagrams.
*I
2950666
06/11/2010
VKN
Removed 12ns speed bin,
Removed 60 Ball FBGA package
Updated Ordering Information
Added Acronyms and Ordering Code Definition.
*J
3096933
11/29/2010
PRAS
Document Number: 38-05255 Rev. *J
VKN/PYRS Updated template
Corrected typo in footnote 9
Updated Ordering Information table
Added Units of Measure.
Minor edits and updated in new template.
Page 11 of 12
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CY7C1069AV33
Sales, Solutions, and Legal Information
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© Cypress Semiconductor Corporation, 2002-2010. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 38-05255 Rev. *J
Revised November 29, 2010
Page 12 of 12
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