KSMD3P20 / KSMU3P20

KSMD3P20 / KSMU3P20
200V P-Channel MOSFET
Features
•
•
•
•
•
•
TO-252
20-251
-2.4A, -200V, RDS(on) = 2.7Ω @VGS = -10 V
Low gate charge ( typical 6.0 nC)
Low Crss ( typical 7.5 pF)
Fast switching
100% avalanche tested
Improved dv/dt capability
General Description
S
These P-Channel enhancement mode power field effect
transistors are produced using Kersemi proprietary,
planar stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the
avalanche and commutation mode. These devices are well
suited for high efficiency switching DC/DC converters.
!
G!
!
D
Absolute Maximum Ratings
Symbol
VDSS
ID
TC = 25°C unless otherwise noted
Parameter
KSMD3P20 / KSMU3P20
Drain-Source Voltage
- Continuous (TC = 25°C)
Drain Current
-200
- Continuous (TC = 100°C)
IDM
Drain Current
VGSS
Gate-Source Voltage
- Pulsed
(Note 1)
Units
V
-2.4
A
-1.52
A
-9.6
A
±30
V
EAS
Single Pulsed Avalanche Energy
(Note 2)
150
mJ
IAR
Avalanche Current
(Note 1)
-2.4
A
EAR
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (TA = 25°C) *
(Note 1)
3.7
-5.5
2.5
mJ
V/ns
W
37
0.29
-55 to +150
W
W/°C
°C
300
°C
dv/dt
PD
(Note 3)
Power Dissipation (TC = 25°C)
TJ, TSTG
TL
- Derate above 25°C
Operating and Storage Temperature Range
Maximum lead temperature for soldering purposes,
1/8from case for 5 seconds
Thermal Characteristics
Symbol
RθJC
RθJA
RθJA
Parameter
Typ
Max
Units
Thermal Resistance, Junction-to-Case
--
3.4
°CW
Thermal Resistance, Junction-to-Ambient *
--
50
°CW
Thermal Resistance, Junction-to-Ambient
--
110
°CW
* When mounted on the minimum pad size recommended (PCB Mount)
2014-7-30
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KSMD3P20 / KSMU3P20
Electrical CharacteristicsT
Symbol
C
= 25°C unless otherwise noted
Parameter
Test Conditions
Min
Typ
Max
Units
-200
--
--
V
Off Characteristics
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, ID = -250 µA
∆BVDSS
/ ∆TJ
Breakdown Voltage Temperature
Coefficient
ID = -250 µA, Referenced to 25°C
--
-0.18
--
V/°C
-1
µA
µA
IDSS
Zero Gate Voltage Drain Current
VDS = -200 V, VGS = 0 V
--
--
VDS = -160 V, TC = 125°C
--
--
-10
IGSSF
Gate-Body Leakage Current, Forward
VGS = -30 V, VDS = 0 V
--
--
-100
nA
IGSSR
Gate-Body Leakage Current, Reverse
VGS = 30 V, VDS = 0 V
--
--
100
nA
On Characteristics
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = -250 µA
-3.0
--
-5.0
V
RDS(on)
Static Drain-Source
On-Resistance
VGS = -10 V, ID = -1.2 A
--
2.06
2.7
Ω
gFS
Forward Transconductance
VDS = -40 V, ID = -1.2 A
--
1.18
--
S
--
190
250
pF
--
45
60
pF
--
7.5
10
pF
--
8.5
25
ns
(Note 4)
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = -25 V, VGS = 0 V,
f = 1.0 MHz
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = -100 V, ID = -2.8 A,
RG = 25 Ω
(Note 4, 5)
VDS = -160 V, ID = -2.8 A,
VGS = -10 V
(Note 4, 5)
--
35
80
ns
--
12
35
ns
--
25
60
ns
--
6.0
8.0
nC
--
1.7
--
nC
--
2.9
--
nC
A
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
-2.4
ISM
--
--
-9.6
A
VSD
Maximum Pulsed Drain-Source Diode Forward Current
VGS = 0 V, IS = -2.4 A
Drain-Source Diode Forward Voltage
--
--
-5.0
V
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
VGS = 0 V, IS = -2.8 A,
dIF / dt = 100 A/µs
(Note 4)
--
100
--
ns
--
0.34
--
µC
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 39mH, IAS = -2.4A, VDD = -50V, RG = 25 Ω, Starting TJ = 25°C
3. ISD -2.8A, di/dt 300A/µs, VDD BVDSS, Starting TJ = 25°C
4. Pulse Test : Pulse width 300µs, Duty cycle 2%
5. Essentially independent of operating temperature
2014-7-30
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KSMD3P20 / KSMU3P20
Typical Characteristics
VGS
-15.0 V
-10.0 V
-8.0 V
-7.0 V
-6.5 V
-6.0 V
Bottom : -5.5 V
-ID , Drain Current [A]
-I D, Drain Current [A]
Top :
0
10
-1
10
0
150
10
25
-55
Notes :
1. VDS = -40V
2. 250s Pulse Test
Notes :
1. 250s Pulse Test
2. TC = 25
-1
-1
0
10
10
1
10
2
10
4
6
8
10
-VGS , Gate-Source Voltage [V]
-VDS, Drain-Source Voltage [V]
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
8
-IDR , Reverse Drain Current [A]
RDS(on) [ Ω ],
Drain-Source On-Resistance
10
VGS = - 10V
6
VGS = - 20V
0
10
4
2
150
25
Notes :
1. VGS = 0V
2. 250s Pulse Test
Note : TJ = 25
0
-1
0
2
4
6
10
8
-ID , Drain Current [A]
0.4
1.2
1.6
2.0
2.4
2.8
-VSD , Source-Drain Voltage [V]
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
12
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
400
0.8
VDS = -40V
10
Capacitance [pF]
300
-V GS , Gate-Source Voltage [V]
VDS = -100V
Ciss
Coss
200
Notes :
1. VGS = 0 V
2. f = 1 MHz
Crss
100
0
-1
10
6
4
2
Note : ID = -2.8 A
0
0
10
0
1
10
1
2
3
4
5
6
7
QG, Total Gate Charge [nC]
-VDS, Drain-Source Voltage [V]
Figure 5. Capacitance Characteristics
2014-7-30
VDS = -160V
8
Figure 6. Gate Charge Characteristics
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KSMD3P20 / KSMU3P20
Typical Characteristics
(Continued)
2.5
1.2
-BV DSS , (Normalized)
Drain-Source Breakdown Voltage
2.0
RDS(ON) , (Normalized)
Drain-Source On-Resistance
1.1
1.0
Notes :
1. VGS = 0 V
2. ID = -250 A
0.9
0.8
-100
-50
0
50
100
150
1.5
1.0
Notes :
1. VGS = -10 V
2. ID = -1.4 A
0.5
0.0
-100
200
-50
0
o
50
100
150
200
o
TJ, Junction Temperature [ C]
TJ, Junction Temperature [ C]
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
2.5
Operation in This Area
is Limited by R DS(on)
2.0
1
100 µs
-I D, Drain Current [A]
-I D, Drain Current [A]
10
1 ms
10 ms
DC
0
10
-1
10
Notes :
1.5
1.0
0.5
o
1. TC = 25 C
o
2. TJ = 150 C
3. Single Pulse
-2
10
0
1
10
0.0
25
2
10
10
50
( t) , T h e r m a l R e s p o n s e
Figure 9. Maximum Safe Operating Area
100
125
150
Figure 10. Maximum Drain Current
vs. Case Temperature
D = 0 .5
10
0
N o te s :
1 . Z J C ( t) = 3 .4 /W M a x .
2 . D u ty F a c to r , D = t 1 /t 2
3 . T J M - T C = P D M * Z J C ( t)
0 .2
0 .1
0 .0 5
PDM
0 .0 2
10
-1
0 .0 1
10
-5
t1
s i n g l e p u ls e
Z
JC
75
TC, Case Temperature []
-VDS, Drain-Source Voltage [V]
10
-4
10
t2
-3
10
-2
10
-1
10
0
10
1
t 1 , S q u a r e W a v e P u ls e D u r a t io n [ s e c ]
Figure 11. Transient Thermal Response Curve
2014-7-30
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KSMD3P20 / KSMU3P20
Gate Charge Test Circuit & Waveform
VGS
Same Type
as DUT
50K
Qg
200nF
12V
-10V
300nF
VDS
VGS
Qgs
Qgd
DUT
-3mA
Charge
Resistive Switching Test Circuit & Waveforms
VDS
RL
t on
VDD
VGS
RG
td(on)
VGS
t off
tr
td(off)
tf
10%
DUT
-10V
VDS
90%
Unclamped Inductive Switching Test Circuit & Waveforms
BVDSS
1
EAS = ---- L IAS2 -------------------2
BVDSS - VDD
L
VDS
tp
ID
VDD
RG
VDD
DUT
-10V
VDS (t)
ID (t)
IAS
BVDSS
tp
2014-7-30
Time
5
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KSMD3P20 / KSMU3P20
Peak Diode Recovery dv/dt Test Circuit & Waveforms
+
VDS
DUT
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
Compliment of DUT
(N-Channel)
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
Body Diode Reverse Current
I SD
( DUT )
IRM
di/dt
IFM , Body Diode Forward Current
VDS
( DUT )
VSD
Body Diode
Forward Voltage Drop
VDD
Body Diode Recovery dv/dt
2014-7-30
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KSMD3P20 / KSMU3P20
Package Dimensions
DPAK
MIN0.55
0.91 ±0.10
9.50 ±0.30
0.50 ±0.10
0.76 ±0.10
0.50 ±0.10
1.02 ±0.20
2.30TYP
[2.30±0.20]
(1.00)
(3.05)
(2XR0.25)
(0.10)
2.70 ±0.20
6.10 ±0.20
9.50 ±0.30
6.60 ±0.20
(5.34)
(5.04)
(1.50)
(0.90)
2.30 ±0.20
(0.70)
2.30TYP
[2.30±0.20]
(0.50)
2.30 ±0.10
0.89 ±0.10
MAX0.96
(4.34)
2.70 ±0.20
0.80 ±0.20
0.60 ±0.20
(0.50)
6.10 ±0.20
5.34 ±0.30
0.70 ±0.20
6.60 ±0.20
0.76 ±0.10
2014-7-30
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KSMD3P20 / KSMU3P20
Package Dimensions
(Continued)
IPAK
2.30 ±0.20
6.60 ±0.20
5.34 ±0.20
0.76 ±0.10
2.30TYP
[2.30±0.20]
2014-7-30
0.50 ±0.10
16.10 ±0.30
6.10 ±0.20
0.70 ±0.20
(0.50)
9.30 ±0.30
MAX0.96
(4.34)
1.80 ±0.20
0.80 ±0.10
0.60 ±0.20
(0.50)
2.30TYP
[2.30±0.20]
8
0.50 ±0.10
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