CPC5903 Qual Report

Reliability Report-CPC5903G
Qualification No: 2011-006
Reliability Report
Reliability Data for CPC5903G
Report Title: Reliability Data for CPC5903G
Report Number: 2011-006
Date:
10/18/11
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 1 of 6
Reliability Report-CPC5903G
Qualification No: 2011-006
Introduction:
This report summarizes the Reliability data of IXYS IC Division CPC5903G. The
Reliability data presented here were collected during IXYS IC Division product
qualification. The purpose of this qualification was to verify IXYS IC Division Quality and
Reliability requirements as outlined in IXYS IC Division internal specifications. The
CPC5903G silicon is foundered at ON-SEMI and assembled at Atec in the Philippines. The
ON-SEMI process is D3N (reference qual by comparison for CPC5750, CPC5902).
Reliability Tests:
Table 1 below provides the qualification tests that were performed. The stress tests and
sample size are chosen based on IXYS IC Division internal specifications and with the
approval of the product development team and quality assurance.
Table 1: Product CPC5903G Reliability Tests
Stress
Test
HTOL
Applicable Stress
Specs
Conditions
Mil-Std-883 125°C, 80%
Product/
Package
CPC5902G
8 Pin Dip
THB
JESD22,
CPC5902G
85°C, 85%
A101
8 Pin Dip
1000hrs
Thermal
Mil-Std-883, 0 to 100°C, 10/10 CPC5902G
Shock (T/S) M1011
dwells, 15 cycles 8 Pin Dip
Temp Cycle Mil-Std-883, -55 to 125°C, 10/10 CPC5902G
(T/C)
N1010, “B” dwells,
8 Pin Dip
300 cycles
High Temp JESD22CPC5902G
125°C, 1000hrs
Storage
A103C
8 Pin Dip
MSL
J-STDIR Reflow,
CPC5902G
020D.1
Level 1
8 Pin Dip
MSL
J-STDIR Reflow,
CPC5902G
020D.1
Level 3
8 Pin Dip
ESD
JESD22,
CPC5902G,
1.5kΩ, 100pF
HBM
A114-E
CPC5903G
8 Pin Dip
Number Sample Total
of Lots Size (SS) SS
1
105
105
3
77
231
3
55
165
3
55
165
3
50
150
3
50
150
3
50
150
2
3
6
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 2 of 6
Reliability Report-CPC5903G
Qualification No: 2011-006
Reliability Test Results:
The stress tests and associated results for the product CPC5903G qualification are
summarized in Table 2. The devices chosen for the qualification were from standard
material manufactured through normal production test flow and electrically tested to
datasheet limits prior to stressing. Then reliability stresses were conducted and electrically
tested to datasheet limit at each interval and final readpoints.
Table 2: Product CPC5903G Reliability Test Results
Stress Test
HTOL
THB
Product/Kit
Number
CPC5902
TE3097
CPC5902
TE3078
1115
THB
CPC5902
TE3079
1118
THB
CPC5902
TE3093
1121
Thermal Shock CPC5902
TE3078
1115
Thermal Shock CPC5902
TE3079
1118
Thermal Shock CPC5902
TE3093
1121
Temp Cycle
CPC5902
TE3078
1115
Temp Cycle
CPC5902
TE3079
1118
Readpoint
/ (Reject/
SS)
1000 hrs.
Comments
Qual Lot#1 Data
0/105*
1000 hrs.
Qual Lot#1 Data
0/76
1000 hrs.
Qual Lot#2 Data
0/77
1000 hrs.
Qual Lot#3 Data
0/77
15 Cycles
Qual Lot#1 Data
0/55
15 Cycles
Qual Lot#2 Data
0/33
15 Cycles
Qual Lot#3 Data
0/55*
300 Cycles
Qual Lot#1 Data
0/55
300 Cycles
Qual Lot#2 Data
0/33
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 3 of 6
Reliability Report-CPC5903G
Qualification No: 2011-006
Stress Test
Temp Cycle
High Temp
Storage
High Temp
Storage
High Temp
Storage
Product/Kit
Number
CPC5902
TE3093
1121
CPC5902
TE3078
1115
CPC5902
TE3079
1118
CPC5902
TE3093
1121
Readpoint
/ (Reject/
SS)
300 Cycles
Comments
Qual Lot#3 Data
0/54
1000 hrs.
Qual Lot#1 Data
0/50
1000 hrs.
Qual Lot#2 Data
0/33*
1000 hrs.
Qual Lot# 3 Data
0/50*
High Temp
Storage
CPC5902
TE3136
High Temp
Storage
CPC5902
TE3137
MSL
CPC5902
TE3078
1115
IR Reflow
Level 3
0/50
Qual Lot#1 Data
MSL
CPC5902
TE3079
1118
IR Reflow
Level 3
0/41
Qual Lot#2 Data
MSL
CPC5902
TE3093
1121
IR Reflow
Level 3
Qual Lot#3 Data
MSL
CPC5902
TE3097
0/51
IR Reflow
Level 1
Qual Lot#4 Data
CPC5902
TE3121
0/50
IR Reflow
Level 1
Qual Lot#5 Data
CPC5902
TE3122
0/50
IR Reflow
Level 1
Qual Lot#6 Data
MSL
MSL
1000 hrs
Qual Lot# 4 Data
0/50
1000 hrs
Qual Lot# 5 Data
0/50
0/50
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 4 of 6
Reliability Report-CPC5903G
Qualification No: 2011-006
*Note: I/O leakage, output voltage and timing failures reported, however, Failure
Analysis Report FA11-106 results showed these failures to be related to a process
anomaly with preventative action defined and initiated.
ESD Testing Results:
As part of this qualification, the product CPC5903G was subjected to Human Body Model
(HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The
results are summarized in Table 3. All samples were electrically tested to data sheet limits
before and after ESD stressing and they passed after +/-6000V testing.
Table3: Product CPC5903G ESD Characterization Results
ESD
Product/Kit Package
ESD Test
RC
Highest
Class
Model Number
Spec
Network Passed
HBM CPC5902G, 8 Pin Dip
JESD22,
6000V
3A
1.5kΩ,
CPC5903G
A114-E
100pF
TE3063
TE3094
FIT (Failure in Time) Rate on the Product CPC5903G:
Table 4 summarizes the number of devices used for the product CPC5903G reliability stress
with associated failures. Using the HTOL data, FITs were calculated based on the
Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for
125°C test temperature and 40°C use temperatures. For THB stress, FITs were calculated
based on the 85°C /85% RH test condition with 40°C/60% RH ambient use conditions at the
activation energy of 0.7eV. The calculated FITs from the reliability stress came out to be
34.31 and 35.20 for HTOL and THB respectively.
Table 4: Product CPC5903G FIT Rate Summary
Qual# Stress Product/Kit # of
# of Hours Act.
Acc.
Number
Devices Fails Tested Energy Factor
1
1
HTOL CPC5902G
TE3097
105
THB
230
CPC5902G
TE3078
TE 3079
TE3093
0
1000
0.7
Equivalent FIT Rate
Dev. Hours @ 60%
CL
26,817,627
34.31
26,133,978
35.20
255.41
0
1000
0.7
1.1363E
+02
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 5 of 6
Reliability Report-CPC5903G
Qualification No: 2011-006
Conclusion:
The qualification of the product CPC5903G has been successfully completed for the
production release. The reliability and process data for D3N can be found at
S:/REED/Projects/New Process Information/On-Semi.
APPROVAL:
Prepared by:
_Martha W. Brandt*________________________________10/18/11______
Martha W. Brandt
Date
Quality Engineer
Approved by:
_Ana Maria Pinto Stack*_____________________________10/19/11______
Ana Maria Pinto Stack
Date
Product Engineer
Approved by:
_Ronald P. Clark*__________________________________10/19/11______
Ronald P. Clark
Date
Director of Quality
Approved by:
James Archibald*___________________________________10/19/11______
James Archibald
Date
Director of Development Engineering
*Signature on File
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
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