MXHV9910

Reliability Report: 2008-007
1
Reliability Report
Report Title:
MXHV9910 Qualification Report
Report Number:
2008-007
Date:
10/22/08
Clare an IXYS Company, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.CLARE.COM
Reliability Report: 2008-007
2
Introduction:
The purpose of this qualification was to verify the Clare’s Quality and Reliability
requirements as outlined in P0425WW for releasing the product MXHV9910. The
MXHV9910 was manufactured at Clare’s state of the art fabrication site in Beverly, MA
using the P11.2, a BCDMOS on SOI Process and assembled at Orient Semiconductor
Electronics Philippines, Inc. (OSEP), Philippines and available on SOIC – 8L EP packages.
Product Description:
The MXHV9910 drives an external MOSFET at a fixed oscillator frequency set by an
external resistor. Peak constant current to an LED string is maintained by modulating the
MOSFET Gate signal on and off through the external sense resistor connected to the CS
input. The MXHV9910 can operate from 8v to 450v. This highly versatile input operating
voltage enables a broad range of high brightness (HB) LED applications. The driver
features a fixed-frequency, peak-current control method, which provides an ideal solution
for driving multiple LEDs in series and in parallel.
Key Product
Characteristics:
Part Number
Package Bond Wire
Wafer Fab. Process
Max. Power Dissip.
Passivation Layer
Bond Pad Metal
Assembly Location
MXHV9910
1.0 mil dia. AU
P11.2
2.5 W
Si3N4 (Si Rich)
AlCu
OSEP, Philippines
Package Type
Package Mold Compound
Package Die Attach
Package Lead Finish
Package MSL
Max. Peak Reflow Temp.
SOIC – 8L EP
Sumitomo EME G600
Silver Conductive Epoxy
Matte Sn (100%)
1
260°C
Clare an IXYS Company, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.CLARE.COM
Reliability Report: 2008-007
3
Qualification Test Plan:
Table 1 below provides the qualification tests that were performed for this qualification and
as part of the Reliability Monitoring Program afterwards. The stress tests and sample size
are chosen based on the Clare’s specification P-04-25-WW, “Reliability, Risk Analysis and
Qualification Procedure” and with the consent of the product development team.
Table 1: Qualification Tests Plan
Stress
Test
HTRB
Applicable
Specs
Mil-Std-883
ESD
HBM
JESD22,
A114-E
Stress
Conditions
105°C, 80%
1.5kΩ, 100pF
Product/
Package
MXHV9910
SOIC – 8L EP
MXHV9910
SOIC – 8L EP
NumberSample Total
of Lots Size (SS) SS
1 77
77
1
14
Clare an IXYS Company, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.CLARE.COM
14
Reliability Report: 2008-007
4
Qualification Test Results:
The stress tests and associated results for the MXHV9910 qualification are summarized in
Table 2.
The devices chosen for the qualification were from standard material manufactured through
normal production test flow and electrically tested to datasheet limits prior to stressing.
Then reliability stresses were conducted and electrically tested to datasheet limit at each
interval and final readpoints. Any parts that did not meet the datasheet limits were
considered failures. A team of Engineers evaluated the failures upon conducting a complete
Failure Analysis (FA) for each of the failure to decide whether the failure is valid or invalid.
Table 2: MXHV9910 Qualification Tests Results
Readpoint 1
Stress Test Kits
/ (Reject/
Number
SS)
HTRB
IXYS
1000 hrs.
9910-00G 0/77
0806
Readpoint 2
/ (Reject/
Comments
SS)
1500 hrs.
Qual lot#1 data
0/77
ESD Testing Results:
As part of this qualification, MXHV9910 was subjected to Human Body Model (HBM)
ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are
summarized in Table 3. All samples were electrically tested to data sheet limits before and
after ESD stressing and they passed after +/-750V zapping.
ESD
Model
HBM
Table3: MXHV9910 ESD Characterization Results
Kit
Package
ESD Test
RC
Highest
Number
Spec
Network Passed
IXYS
SOIC – 8L EP JESD22,
750 V
1.5kΩ,
9910-00G
A114-E
100pF
0825
Class
1B
Clare an IXYS Company, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.CLARE.COM
Reliability Report: 2008-007
5
Process FIT
(Failure in Time) Data:
The Table 3 below summarizes the number of devices used for MXHV9910 reliability stress
with associated failures. Using the HTRB data, FITs were calculated based on the
Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy
according to the Clare’s procedure P-04-25-WW for 105°C test temperature and 40°C use
temperatures. The calculated FITs from the reliability stress came out to be 91.83 for
HTRB.
Qual# Stress
1
HTRB
Kits
IXYS
9910-00G
0806
Table 3: FITs calculation Summary
# of
# of
Hours Act.
Acc.
Equivalent
Devices Fails Tested Energy Factor Dev. Hours
77
0
1500
0.7
86.74
10,018,525.33
Conclusion:
The qualification of the MXHV9910 has successfully completed for the production release.
Clare an IXYS Company, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.CLARE.COM
FIT Rate
@ 60%
CL
91.83
Reliability Report: 2008-007
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APPROVAL:
Prepared by: _ Martha W. Brandt*______________ 10/25/08____
Martha W. Brandt
Quality Engineer
Date
Approved by: __Ajit Patel*_____________________ 11/4/08____
Ajit Patel
Product Engineer
Date
Approved by: _Ronald P. Clark*________________ 11/4/08_____
Ronald P. Clark
Director of Quality
Date
Approved by: _James Archibald*________________11/4/08_____
James Archibald
Date
Director of Development Engineering
*Signature on File
Clare an IXYS Company, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.CLARE.COM