Reliability Report: Reliability Data for Multi-Function Relay/Opto Products 16L SOIC Package (Output Voltage Rating 200V– 450V) Qualification Report No.: 2010-010 Reliability Report Reliability Data for Multi-Function Relay/Opto Products 16L SOIC Package (Output Voltage Rating 200V– 450v) Report Title: Reliability Data for Multi-Function Relay/Opto Products 16L SOIC Package (Output Voltage Rating 200v– 450v) Report Number: 2010-010 Date: 8/17/12 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 1 of 4 Reliability Report: Reliability Data for Multi-Function Relay/Opto Products 16L SOIC Package (Output Voltage Rating 200V– 450V) Qualification Report No.: 2010-010 Introduction: This is to summarize the Reliability (Life-test & Environmental) data for IAA110P that were collected on various family products. These data were collected as part of the qualification or IXYS IC Division monthly Reliability Monitor program. The IAA110P HTRB data presented here are applicable to all Form A Relay and Multifunction Relay/ Opto Products with 200V – 450V rating in 16L SOIC style packaging. Reliability Tests: Table 1 below outlined Reliability stresses performed on various products that are transferable to the IAA110P Product Family. Table 1: IAA110P Product Family Reliability Tests Product/ Package Stress Applicable Specs IAA110P/ 16L SOIC ITC117P/ 16L SOIC IAA110P/ 16L SOIC HTRB ITC117P/ 16L SOIC Thermal Shock Mil-Std-883, (T/S) M1011 IAA110P/ 16L SOIC Temp Cycle (T/C) ITC117P/ 16L SOIC Stress Conditions JESD22-A108 125C, 80% WVDC, 1000 hrs HTRB JESD22-A108 125C, 80% WVDC, 1000 hrs Thermal Shock Mil-Std-883, 0 to 100°C, 10/10 dwells (T/S) M1011 15 cycles # of Sample Total Kits Size SS (SS) 2 120 240 1 129 129 1 129 129 3 55 165 0 to 100°C, 10/10 dwells 15 cycles 1 55 55 Mil-Std-883 M1010, “B” -55 to 125°C, 10/10 dwells, 300 cycles 3 55 165 Temp Cycle (T/C) Mil-Std-883 M1010, “B” -55 to 125°C, 10/10 dwells, 300 cycles 1 55 55 IAA110P/ 16L SOIC MSL J-STD-020D.1 IR Reflow, Level 1 3 50 150 ITC117P 16L SOIC MSL J-STD-020D.1 IR Reflow, Level 1 1 50 50 IAA110P/ 16L SOIC High Temp Storage JESD22-A103C 125°C, 1000hrs 1 50 50 IAA110P/ 16L SOIC ESD HBM JESD22, A114-E 1 1 5 3 5 3 1.5kΩ, 100pF IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 2 of 4 Reliability Report: Reliability Data for Multi-Function Relay/Opto Products 16L SOIC Package (Output Voltage Rating 200V– 450V) Qualification Report No.: 2010-010 Reliability Tests Results: The stress tests data and associated results for the family of IAA110P products are summarized in Table 2. Table 2: IAA110P Product Family Reliability Test Results Product/ Package IAA110P/ 16L SOIC IAA110P/ 16L SOIC IAA110P/ 16L SOIC ITC117P/ 16L SOIC IAA110P/ 16L SOIC IAA110P/ 16L SOIC IAA110P/ 16L SOIC ITC117P/ 16L SOIC Stress Test/ Conditions Kits (lots) Number T22717 IAA110P/ 16L SOIC IAA110P/ 16L SOIC IAA110P/ 16L SOIC ITC117P/ 16L SOIC IAA110P/ 16L SOIC HTRB 125C, 80% WVDC HTRB 125C, 80% WVDC HTRB 125C, 80% WVDC HTRB 125C, 80% WVDC Thermal Shock 0 to 100°C, 10/10 dwell Thermal Shock 0 to 100°C, 10/10 dwell Thermal Shock 0 to 100°C, 10/10 dwell Thermal Shock 0 to 100°C, 10/10 dwell Temp Cycles -55 to 125°C, 10/10 dwell Temp Cycles -55 to 125°C, 10/10 dwell Temp Cycles -55 to 125°C, 10/10 dwell Temp Cycles -55 to 125°C, 10/10 dwell MSL, IR Reflow J-STD-020D.1 IAA110P/ 16L SOIC MSL, IR Reflow J-STD-020D.1 T37682 IAA110P/ 16L SOIC MSL, IR Reflow J-STD-020D.1 T52174 ITC117P/ 16L SOIC MSL, IR Reflow J-STD-020D.1 T48998 IAA110P/ 16L SOIC High Temp Storage JESD22-A103C T52174 T37682 T52174 T48998 T22717 T37682 T52174 T48998 T22717 T37682 T52174 T48998 T22717 Readpoints / (Reject/ SS) 1000 hrs. 0/120 1000 hrs. 0/129 1000 hrs 0/120 1000 hrs 0/129 10 cycles 0/55 10 cycles 0/55 10 cycles 0/55 10 cycles 0/55 300 cycles 0/55 300 cycles 0/55 300 cycles 0/55 300 cycles 0/55 Level 1 0/55 Level 1 0/55 Level 1 0/55 Level 1 0/55 1000 hrs. 0/50 Comments Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data Reliability Monitor Data IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 3 of 4 Reliability Report: Reliability Data for Multi-Function Relay/Opto Products 16L SOIC Package (Output Voltage Rating 200V– 450V) Qualification Report No.: 2010-010 FIT (Failure in Time) Rate of IAA110P Product Family: Table 3 below summarizes the FIT rate from the HTRB data. Using the Reliability HTRB data, FIT rate was calculated based on the equivalent device hours at use condition of 40°C and stressed condition of 125°C. To calculate equivalent device hours, Acceleration Factor (AF) was calculated at 0.7eV of activation energy. The FIT rate came out to be 7.23 FITs. Table 3: IAA110P Product Family FIT Rate Summary Product/ Stress IAA110P/ ITC117P/ HTRB # of Devices # of Fails. 498 0 Hours Tested 1000 Test Temp (°°C) 125 Eq. Dev. Hours FITs @ 60% CL 127,192,171 7.23 ESD Testing Results: As part of this qualification, the IAA110P Family Product was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 4. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/- 8000V zapping. ESD Model HBM Table4: Product IAA110P Family ESD Characterization Results Product Package ESD Test RC Highest Class Number Spec Network Passed IAA110P 16L SOIC JESD22, 8000V 3A 1.5kΩ, A114-E 100pF IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 4 of 4