CPC7691

Reliability Report: LCAS 75XX/76XX Series Products (16L/20L/28L SOIC)
Qualification Report No.: 2013-005
Reliability Report
Reliability Data for LCAS 75XX/76XX Series Products
(16L/20L/28L SOIC)
Report Title:
Reliability Data for LCAS 75XX/76XX Series
Products (16L/20L/28L SOIC)
Report Number:
2013-005
Date:
2/11/13
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM
Page 1 of 4
Reliability Report: LCAS 75XX/76XX Series Products (16L/20L/28L SOIC)
Qualification Report No.: 2013-005
Introduction:
This report summarizes the Reliability data of IXYS Integrated Circuits Division LCAS
75XX/76XX Series Products . The Reliability data presented here were collected during
IXYS IC Division product qualification. The purpose of this qualification was to verify
IXYS IC Division Quality and Reliability requirements as outlined in IXYS IC Division
internal specifications. The LCAS 75XX/76XX Series Products are manufactured at IXYS
IC DIvision and assembled at ATEC in the Philippines. The process is IXYS IC Division
P10 and LCAS 75XX/76XX is available in a 16L/20L/28L SOIC package type.
Reliability Tests:
Table 1 below provides the qualification tests that were performed. The stress tests and
sample size are chosen based on the IXYS IC Division internal specifications and with the
approval of the product development team and quality assurance.
Table 1: LCAS 75XX/76XX Series Products Reliability Tests
Product Package Stress Test
CPC7692BC
16L SOIC
HTRB
CPC7692BC
16L SOIC
ESD
HBM
Applicable Specs Stress
# Lots Sample Size Total
and Readpoints
Conditions
JESD22-A108
125C, 80%
1
109
109
WVDC,
1000 hrs
JESD22,
1
15
15
1.5kΩ, 100pF
A114-E
Reliability Test Results:
The stress tests and associated results for LCAS 75XX/76XX Series Products qualification
are summarized in Table 2. The devices chosen for the qualification were from standard
material manufactured through normal production test flow and electrically tested to
datasheet limits prior to stressing. Then reliability stresses were conducted and electrically
tested to datasheet limit at each interval and final readpoints.
Table 2: LCAS 75XX/76XX Series Products Reliability Test Results
Product/
Package
Stress/
Kits
CPC7692BC HTRB
16L SOIC
TE3169
Readpoint 1 Readpoint 2
/ Reject/
/ Reject/
SS
SS
500 hrs.
1000 hrs.
0/109
0/109
Comments
Qual #1 Data
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM
Page 2 of 4
Reliability Report: LCAS 75XX/76XX Series Products (16L/20L/28L SOIC)
Qualification Report No.: 2013-005
ESD Testing Results:
As part of this qualification, the product LCAS 75XX/76XX Series Products was subjected
to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek
Zapmaster system. The results are summarized in Table 3. All samples were electrically
tested to data sheet limits before and after ESD stressing and they passed after +/-1000V
zapping.
Table3: LCAS 75XX/76XX Series Products ESD Characterization Results
ESD
Kit
Package
ESD Test
RC
Highest
Class
Model Number
Spec
Network Passed
1000V
1C
HBM
CPC7692BC SOIC – 16L JESD22,
1.5kΩ,
TE3169
A114-E
100pF
FIT (Failure in Time) Rate of LCAS 75XX/76XX Series Products
Table 4 below summarizes the FIT rate from the HTRB data. Using the Reliability HTRB
data, FIT rate was calculated based on the equivalent device hours at use condition of 40°C
and stressed condition of 125°C at 0.7eV of activation. The FIT rate came out to be 33.05
FITs.
Table 4: LCAS 75XX/76XX Series Products FIT Rate Summary
Product/
Lot
# of
# of
Hours Test
Eq. Device
Stress
Number Devices Failed Tested Temp Hours
(°°C)
CPC7692BC/ TE3169
109
0
1000
125
27,839,250
HTRB
FITs
@ 60%
CL
33.05
Conclusion:
The qualification of the product LCAS 75XX/76XX Series Products has been successfully
completed for the production release.
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM
Page 3 of 4
Reliability Report: LCAS 75XX/76XX Series Products (16L/20L/28L SOIC)
Qualification Report No.: 2013-005
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM
Page 4 of 4