Reliability Report-IX2204NE Qualification No: 2013-007 Reliability Report Reliability Data for IX2204NE Report Title: Reliability Data for IX2204NE Report Number: 2013-007 Date: 11/14/13 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 1 of 5 Reliability Report-IX2204NE Qualification No: 2013-007 Introduction: This report summarizes the Reliability data of IXYS Integrated Circuits Division IX2204NE. The Reliability data presented here were collected during IXYS product qualification. The purpose of this qualification was to verify the IXYS Quality and Reliability requirements as outlined in IXYS internal specifications. The IX2204NE silicon is manufactured at IXYS IC Division using the P32 process and assembled at Greatek in Taiwan. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the IXYS internal specification and with the approval of the product development team and quality assurance. Table 1: Product IX2204NE Reliability Tests Stress Test Applicable Specs Stress Conditions Mil-Std-883 125°C, 80% 1000hrs JESD22130°C, 85% A110-C 18.8PSI, 96hrs Thermal Mil-Std-883, 0 to 100°C, 10/10 Shock (T/S) M1011 dwells, 15 cycles Temp Cycle Mil-Std-883, -55 to 125°C, 10/10 (T/C) N1010, “B” dwells, 300 cycles MSL J-STDIR Reflow, 020D.1 Level 1 Hot JESD22125C, 1000 hrs Storage A103-C ESD JESD22, 1.5kΩ, 100pF HBM A114-E HTRB HAST Product/ Package IX2204NE 16L SOICN IX2204NE 16L SOICN IX2204NE 16L SOICN IX2204NE 16L SOICN IX2204NE 16L SOICN IX2204NE 16L SOICN IX2204NE 16L SOICN Number Sample Total of Lots Size (SS) SS 3 467 1 110, 110, 112 77, 78, 78 78, 78, 78 55 2 55 110 1 50 50 1 50 50 1 15 15 6 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 2 of 5 332 55 Reliability Report-IX2204NE Qualification No: 2013-007 Reliability Test Results: The stress tests and associated results for the product IX2204NE qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: Product IX2204NE Reliability Test Results Stress Test HTRB HTRB HTRB Product/Kit Number IX2204NE GGE0013 IX2204NE GGE0023 IX2204NE GGE0012 HAST IX2204NE HAST GGE0010 IX2204NE GGE0013 Readpoint / (Reject/ SS) 1000 hrs. 0/110 1000 hrs. 0/110 1000 hrs. 0/112 96 hrs. 0/77 96 hrs 0/78 HAST HAST IX2204NE GGE0012 IX2204NE GGE0023 HAST IX2204NE GGE0031 HAST IX2204NE GGE0031 Thermal Shock IX2204NE GGE0023 Temp Cycle IX2204NE GGE0023 Temp Cycle IX2204NE GGE0031 96 hrs 0/78 96 hrs 0/78 96 hrs 0/78 96 hrs 0/78 15 cycles 0/55 300 cycles 0/55 300 cycles 0/55 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 3 of 5 Reliability Report-IX2204NE Qualification No: 2013-007 Stress Test MSL Hot Storage Product/Kit Number IX2204NE GGE0024 IX2204NE GGE0023 Readpoint / (Reject/ SS) Level 1 0/50 1000 hrs 0/50 ESD Testing Results: As part of this qualification, the product IX2204NE was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 3. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/-700V testing. Table3: Product IX2204NE ESD Characterization Results ESD Product/Kit Package ESD Test RC Highest Class Model Number Spec Network Passed HBM IX2204NE 16L SOICN JESD22, 700V 1B 1.5kΩ, GGE0013 A114-E 100pF FIT (Failure in Time) Rate on the Product IX2204NE: Table 4 summarizes the number of devices used for the product IX2204NE reliability stress with associated failures. Using the HTRB data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 125°C test temperature and 40°C use temperature. For HAST stress, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV activation energy for 130°C test temperature and 40°C use temperature. The calculated FITs from the reliability stress came out to be 10.85 and 14.33 for HTRB and HAST, respectively. IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 4 of 5 Reliability Report-IX2204NE Qualification No: 2013-007 Table 4: Product IX2204NE FIT Rate Summary Qual# Stress Product/Kit # of # of Hours Act. Acc. Number Devices Fails Tested Energy Factor 1 1 HTRB IX2204NE GGE0010 GGE0013 GGE0012 332 HAST IX2204NE GGE0010 GGE0013 GGE0012 GGE0023 GGE0031 467 0 1000 Equivalent Dev. Hours FIT Rate @ 60% CL 84,794,781 10.85 1.4318E 64,189,811 +03 14.33 0.7 255.41 0 96 0.7 Conclusion: The qualification of the product IX2204NE has been successfully completed for the production release. APPROVAL: Prepared by: _Martha W. Brandt*__________________________________11/15/13_ Martha W. Brandt Date Quality Engineer Approved by: _Jose Pinales*_______________________________________11/25/13_ Jose Pinales Date Product Engineer Approved by: _Ronald P. Clark*___________________________________11/22/13_ Ronald P. Clark Date Director of Quality Approved by: _James Archibald*___________________________________11/22/13_ James Archibald Date Director of Engineering *Signature on File IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 5 of 5