High Speed Characterization Report

High Speed Characterization Report
TMMH-115-05-L-DV-A
Mated With
CLT-115-02-L-D-A
Description:
Micro Surface Mount, Board-to Board, 2.0mm (.0787”) Pitch,
4.77mm (0.188”) Stack Height
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Table of Contents
Connector Overview........................................................................................................ 1
Connector System Speed Rating .................................................................................... 1
Frequency Domain Data Summary ................................................................................. 2
Table 1 - Single-Ended Connector System Performance ............................................ 2
Table 2 - Differential Connector System Bandwidth .................................................... 2
Time Domain Data Summary .......................................................................................... 3
Table 3 - Single-Ended Impedance (Ω) ....................................................................... 3
Table 4 - Differential Impedance (Ω)............................................................................ 3
Table 5 - Single-Ended Crosstalk (%).......................................................................... 4
Table 6 - Differential Crosstalk (%) .............................................................................. 4
Table 7 - Propagation Delay (Mated Connector) ......................................................... 4
Characterization Details .................................................................................................. 5
Differential and Single-Ended Data.............................................................................. 5
Connector Signal to Ground Ratio ............................................................................... 5
Frequency Domain Data.............................................................................................. 7
Time Domain Data....................................................................................................... 7
Appendix A – Frequency Domain Response Graphs ...................................................... 9
Single-Ended Application – Insertion Loss .................................................................. 9
Single-Ended Application – Return Loss ..................................................................... 9
Single-Ended Application – NEXT ............................................................................. 10
Single-Ended Application – FEXT.............................................................................. 10
Differential Application – Insertion Loss..................................................................... 11
Differential Application – Return Loss........................................................................ 11
Differential Application – NEXT ................................................................................. 12
Differential Application – FEXT .................................................................................. 12
Appendix B – Time Domain Response Graphs............................................................. 13
Single-Ended Application – Input Pulse..................................................................... 13
Single-Ended Application – Impedance ..................................................................... 14
Single-Ended Application – Propagation Delay ......................................................... 14
Single-Ended Application – NEXT, “Worst Case In Row” Configuration.................... 15
Single-Ended Application – FEXT, “Worst Case In Row” Configuration .................... 15
Single-Ended Application – NEXT, “Best Case In Row” Configuration ...................... 16
Single-Ended Application – FEXT, “Best Case In Row” Configuration ...................... 16
Single-Ended Application – NEXT, “Across Row” Configuration ............................... 17
Single-Ended Application – FEXT, “Across Row” Configuration................................ 17
Differential Application – Input Pulse ......................................................................... 18
Differential Application – Impedance ......................................................................... 19
Differential Application – Propagation Delay.............................................................. 19
Differential Application – NEXT, “Worst Case In Row ” Configuration ....................... 20
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:ii
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Differential Application – FEXT, “Worst Case In Row” Configuration......................... 20
Differential Application – NEXT, “Best Case In Row” Configuration .......................... 21
Differential Application – FEXT, “Best Case In Row” Configuration........................... 21
Differential Application – NEXT, “Across Row” Configuration.................................... 22
Differential Application – FEXT, “Across Row” Configuration .................................... 22
Appendix C – Product and Test System Descriptions ................................................... 23
Product Description ................................................................................................... 23
Test System Description............................................................................................ 23
Table 8 – PCB Fixture Characterization & Termination Matrix .................................. 24
Signal Conditioning, Calibration Standards And Signal Launch/Monitoring............... 25
Appendix D – Test and Measurement Setup................................................................. 26
Test Instruments ........................................................................................................ 27
Measurement Station Accessories ............................................................................ 27
Test Cables & Adapters............................................................................................. 27
Appendix E - Frequency and Time Domain Measurements .......................................... 28
Frequency (S-Parameter) Domain Procedures ......................................................... 28
CSA8000 Setup ..................................................................................................... 28
Insertion Loss......................................................................................................... 29
Return Loss............................................................................................................ 29
Near-End Crosstalk (NEXT) ................................................................................... 30
Far-End Crosstalk (FEXT)...................................................................................... 30
Time Domain Procedures .......................................................................................... 31
Impedance ............................................................................................................. 31
Propagation Delay.................................................................................................. 31
Crosstalk ................................................................................................................ 31
Appendix F – Glossary of Terms................................................................................... 32
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:iii
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Connector Overview
Micro 2.0mm (.050”) pitch interfaces (TMMH/CLT Series) are available with up to 50
contacts per row and board-to-board spacings of 4.77mm (0.188”) and 18mm (0.709")
between boards. The data in this report is applicable only to the 4.77mm (0.188”)
board-to-board stack height version.
Connector System Speed Rating
TMMH/CLT Surface Mount Series, Micro, Board-to-Board, 2.0 mm Pitch, 4.77mm
(0.188") Stack Height
Signaling
Speed Rating
Single-Ended:
Differential:
5.5 GHz / 11 Gbps
6.5 GHz / 13 Gbps
The Speed Rating is based on the -3 dB insertion loss point of the connector system.
The -3 dB point can be used to estimate usable system bandwidth in a typical, two-level
signaling environment.
To calculate the Speed Rating, the measured -3 dB point is rounded up to the nearest
half-GHz level. The up-rounding corrects for a portion of the test board’s trace loss,
since trace losses are included in the loss data in this report. The resulting loss value is
then doubled to determine the approximate maximum data rate in Gigabits per second
(Gbps).
For example, a connector with a -3 dB point of 7.8 GHz would have a Speed Rating of 8
GHz/ 16 Gbps. A connector with a -3 dB point of 7.2 GHz would have a Speed Rating
of 7.5 GHz/ 15 Gbps.
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:1
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Frequency Domain Data Summary
Table 1 - Single-Ended Connector System Performance
Test Parameter
Configuration
Insertion Loss
GSG
-3dB @ 5.36GHz
Return Loss
GSG
≤ -5 dB to 5.36GHz
GAQG
≤ -5dB to 5.36 GHz
GAGQG
≤ -15dB to 5.36 GHz
Near-End Crosstalk
Far-End Crosstalk
Xrow, GAG to GQG
≤ -8dB to 5.36 GHz
GAQG
≤ -5dB to 5.36 GHz
GAGQG
≤ -15dB to 5.36 GHz
Xrow, GAG to GQG
≤ -8dB to 5.36 GHz
Table 2 - Differential Connector System Bandwidth
Test Parameter
Configuration
Insertion Loss
GSSG
-3dB @ 6.44 GHz
Return Loss
GSSG
≤ -5dB to 6.44 GHz
Near-End Crosstalk
Far-End Crosstalk
GAAQQG
≤ -15dB to 6.44 GHz
GAAGQQG
≤ -30dB to 6.44 GHz
Xrow, GAASS to GQQG
≤ -15dB to 6.44 GHz
GAAQQG
≤ -20dB to 6.44 GHz
GAAGQQG
≤ -32dB to 6.44 GHz
Xrow, GAASS to GQQG
≤ -18 dB to 6.44 GHz
PCB/Connector Test System
Single Ended & Differential Signal Response
CLT-02 / TMMH-05
1
0
-1
Insertion Loss (dB)
-2
-3
-4
Single Ended
-5
Differential
-6
-7
-8
-9
0
1
2
3
4
5
6
7
Frequency (GHz)
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:2
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Time Domain Data Summary
Table 3 - Single-Ended Impedance (Ω)
Signal Risetime
Maximum
Impedance
Minimum
Impedance
30±5ps
50 ps
100 ps
250 ps
500 ps
750 ps
1 ns
52.9
52.0
51.5
51.3
51.1
50.8
50.2
30.0
33.6
38.2
41.7
44.6
46.1
47.1
Single-Ended Application
Impedance vs. Risetime
75
70
65
60
55
maximum
50
minimum
45
40
35
30
35
50
100
250
500
750
1000
Risetime (pSec)
Table 4 - Differential Impedance (Ω)
Signal Risetime
Maximum
Impedance
Minimum
Impedance
30±5ps
50 ps
100 ps
250 ps
500 ps
750 ps
1 ns
103.8
101.3
101.2
101.2
100.9
100.8
100.7
58.0
64.5
73.3
81.6
87.8
91.0
93.0
D i f f er e nt i al A p p l i c at i o n
I mp ed a nc e vs . R i s et i me
120
110
100
90
maximum
minimum
80
70
60
50
35
50
100
250
50 0
750
10 00
Riset ime (pSec)
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Table 5 - Single-Ended Crosstalk (%)
Input
(tr)
30±5ps
50 ps
100 ps
250 ps
500 ps
750 ps
1 ns
NEXT
GAQG
GAGQG
Xrowse
14.2
4.3
8.3
12.1
3.1
7.3
9.2
2.2
5.6
4.0
< 1.0%
2.4
2.1
< 1.0%
1.2
1.5
< 1.0%
< 1.0%
1.1
< 1.0%
< 1.0%
FEXT
GAQG
GAGQG
Xrowse
9.3
2.9
11.5
8.1
2.5
7.9
5.6
1.8
5.0
2.2
< 1.0%
1.6
1.1
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
Table 6 - Differential Crosstalk (%)
Input
(tr)
30±5ps
50 ps
100 ps
250 ps
500 ps
750 ps
1 ns
NEXT
GAAQQSS
GAAGQQG
Xrowdiff
3.4
< 1.0%
3.7
3.2
< 1.0%
2.5
2.3
< 1.0%
2.2
1.0
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
FEXT
GAAQQSS
GAAGQQG
Xrowdiff
1.9
< 1.0%
2.6
1.4
< 1.0%
1.9
< 1.0%
< 1.0%
1.1
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
< 1.0%
Table 7 - Propagation Delay (Mated Connector)
Single-Ended
Differential
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
83ps
78ps
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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Fax: 812-948-5047
Report Revision: 1/30/2006
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Characterization Details
This report presents data which characterizes the signal integrity response of a connector pair in a controlled printed circuit board (PCB) environment. All efforts are made to
reveal typical best-case responses inherent to the system under test (SUT).
In this report, the SUT includes the test PCB from drive side probe tips to receive side
probe tips. PCB effects are not removed or de-embedded from the test data. PCB designs with impedance mismatch, large losses, skew, cross talk, or similar impairments
can have a significant impact on observed test data. Therefore, great design effort is
put forth to limit these effects in the PCB utilized in these tests. Some board related effects, such as pad-to-ground capacitance and trace loss, are included in the data presented in this report. But other effects, such as via coupling or stub resonance, are not
evaluated here. Such effects are addressed and characterized fully by the Samtec
Final Inch® products.
Additionally, intermediate test signal connections can mask the connectors’ true performance. Such connection effects are minimized by using high performance test cables, adapters, and microwave probes. Where appropriate, calibration and deembedding routines are also used to reduce residual effects.
Differential and Single-Ended Data
Most Samtec connectors can be used successfully in both differential and single-ended
applications. However, electrical performance will differ depending on the signal drive
type. In this report, data is presented for both differential and single-ended drive scenarios.
Connector Signal to Ground Ratio
Samtec connectors are most often designed for generic applications, and can be implemented using various signal and ground pin assignments. In high speed systems,
provisions must be made in the interconnect for signal return currents. Such paths are
often referred to as “ground”. In some connectors, a ground plane or blade, or an outer
shield is used as the signal return, while in others, connector pins are used as signal
returns. Various combinations of signal pins, ground blades, and shields can also be
utilized. Electrical performance can vary significantly depending upon the number and
location of ground pins.
In general, the more pins dedicated to ground, the better electrical performance will be.
But dedicating pins to ground reduces signal density of a connector. So care must be
taken when choosing signal/ground ratios in cost- or density-sensitive applications.
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:5
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
For this connector, the following configurations were evaluated:
Single-Ended Impedance:
• GSG (ground-signal-ground)
Single-Ended Crosstalk:
• Electrical “worst case”: GAQG (ground-active-quiet-ground)
• Electrical “best case”: GAGQG (ground-active-ground-quiet-ground)
• Across row: Xrowse (from one row of terminals to the other row or across the
ground blade when applicable)
Differential Impedance:
• GSSG (Ground-positive signal-negative signal-ground)
Differential Crosstalk:
• Electrical “worst case”: GAAQQG (ground-active-active-quiet-quiet-ground)
• Electrical “best case”: GAAGQQG (ground-active-active-ground-quiet-quietground)
• Across row:Xrowdiff (from one row of terminals to the other row or across the
ground blade when applicable) (ground-active-active-static-static-ground) across
the row of terminals to (ground-quiet-quiet-ground)
In all cases where a center ground blade is present in the connector it is always
grounded to the PCB. Only one single-ended signal or differential pair was driven for
crosstalk measurements.
Other configurations can be evaluated upon request. Please contact [email protected]
for more information.
In a real system environment, active signals might be located at the outer edges of the
signal contacts of concern, as opposed to the ground signals utilized in laboratory testing. For example, in a single-ended system, a pin-out of “SSSS”, or four adjacent single
ended signals, might be encountered, as opposed to the “GSG” and “GSSG” configurations tested in the laboratory. Electrical characteristics in such applications could vary
slightly from laboratory results. But in most applications, performance can safely be considered equivalent.
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:6
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Signal Edge Speed (Rise Time):
In pulse signaling applications, the perceived performance of an interconnect can vary
significantly depending on the edge rate or rise time of the exciting signal. For this report, the fastest rise time used was 30 +/-5 ps. Generally, this should demonstrate
worst case performance.
In many systems, the signal edge rate will be significantly slower at the connector than
at the driver launch point. To estimate interconnect performance at other edge rates,
data is provided for several rise times between 30 ps and 1.0 ns.
For this report, rise times were measured at 10%-90% signal levels.
Frequency Domain Data
Frequency domain parameters are helpful in evaluating the connector system’s signal
loss and crosstalk characteristics across a range of sinusoidal frequencies. In this report, parameters presented in the frequency domain are insertion loss, return loss, and
near-end and far-end crosstalk. Other parameters or formats, such as VSWR or Sparameters, may be available upon request. Please contact our Signal Integrity Group
at [email protected] for more information.
Frequency performance characteristics for the SUT are generated from time domain
measurements using Fourier Transform calculations. Procedures and methods used in
generating the SUT’s frequency domain data are provided in the frequency domain test
procedures in Appendix E of this report.
Time Domain Data
Time Domain parameters indicate impedance mismatch versus length, signal propagation time, and crosstalk in a pulsed signal environment. Time Domain data is provided
in Appendix E of this report. Parameters or formats not included in this report may be
available upon request. Please contact our Signal Integrity Group at [email protected]
for more information.
Reference plane impedance is 50 ohms for single-ended measurements and 100 ohms
for differential measurements. The fastest risetime signal exciting the SUT is 30 ± 5
picoseconds.
In this report, propagation delay is defined as the signal propagation time through the
PCB connector pads and connector pair. It does not include PCB traces. Delay is
measured at 30 ± 5 picoseconds signal risetime. Delay is calculated as the difference
in time measured between the 50% amplitude levels of the input and output pulses.
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:7
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Crosstalk or coupled noise data is provided for various signal configurations. All measurements are single disturber. Crosstalk is calculated as a ratio of the input line voltage
to the coupled line voltage. The input line is sometimes described as the active or drive
line. The coupled line is sometimes described as the quiet or victim line. Crosstalk ratio
is tabulated in this report as a percentage. Measurements are made at both the nearend and far-end of the SUT.
Data for other configurations may be available. Please contact our Signal Integrity
Group at [email protected] for further information.
As a rule of thumb, 10% crosstalk levels are often used as a general first pass limit for
determining acceptable interconnect performance. But modern system crosstalk tolerance can vary greatly. For advice on connector suitability for specific applications,
please contact our Signal Integrity Group at [email protected].
Additional information concerning test conditions and procedures is located in the appendices of this report. Further information may be obtained by contacting our Signal
Integrity Group at [email protected].
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:8
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Appendix A – Frequency Domain Response Graphs
Single-Ended Application – Insertion Loss
PCB/Connector Test System
Single Ended Application
CLT-02 / TMMH-05
1
0
-1
Insertion Loss (dB)
-2
-3
-4
Single Ended
-5
-6
-7
-8
-9
0
1
2
3
4
5
6
7
Frequency (GHz)
Single-Ended Application – Return Loss
PCB/Connector Test System
Single Ended Application
CLT-02 / TMMH-05
0
-10
-20
Return Loss (dB)
-30
-40
-50
Single Ended
-60
-70
-80
-90
0
1
2
3
4
5
6
7
Frequency (GHz)
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:9
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Single-Ended Application – NEXT
PCB/Connector Test System
Single Ended Application
CLT-02 / TMMH-05
0
-10
Near-End Crosstalk (dB)
-20
-30
-40
ACROSS ROW
Best Case
-50
Worst Case
-60
-70
-80
-90
0
1
2
3
4
5
6
7
Frequency (GHz)
Single-Ended Application – FEXT
PCB/Connector Test System
Single Ended Application
CLT-02 / TMMH-05
0
-10
Far-End Crosstalk (dB)
-20
-30
-40
ACROSS ROW
Worst Case
-50
Best Case
-60
-70
-80
-90
0
1
2
3
4
5
6
7
Frequency (GHz)
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:10
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Differential Application – Insertion Loss
PCB/Connector Test System
Differential Application
CLT-02 / TMMH-05
1
0
-1
Insertion Loss (dB)
-2
-3
-4
Differential
-5
-6
-7
-8
-9
0
1
2
3
4
5
6
7
Frequency (GHz)
Differential Application – Return Loss
PCB/Connector Test System
Differential Application
CLT-02 / TMMH-05
0
-10
-20
Return Loss (dB)
-30
-40
-50
Differential
-60
-70
-80
-90
0
1
2
3
4
5
6
7
Frequency (GHz)
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
Page:11
Phone: 812-944-6733
Fax: 812-948-5047
Report Revision: 1/30/2006
All Rights Reserved
High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Differential Application – NEXT
PCB/Connector Test System
Differential Application
CLT-02 / TMMH-05
0
-10
Near-End Crosstalk (dB)
-20
-30
-40
ACROSS ROW
Worst Case
-50
Best Case
-60
-70
-80
-90
0
1
2
3
4
5
6
7
Frequency (GHz)
Differential Application – FEXT
PCB/Connector Test System
Differential Application
CLT-02 / TMMH-05
0
-10
Far-End Crosstalk (dB)
-20
-30
-40
Worst Case
Best Case
-50
ACROSS ROW
-60
-70
-80
-90
0
1
2
3
4
5
6
7
Frequency (GHz)
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Appendix B – Time Domain Response Graphs
Single-Ended Application – Input Pulse
Samtec Inc.
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Single-Ended Application – Impedance
Single-Ended Application – Propagation Delay
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Single-Ended Application – NEXT, “Worst Case In Row” Configuration
Single-Ended Application – FEXT, “Worst Case In Row” Configuration
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Single-Ended Application – NEXT, “Best Case In Row” Configuration
Single-Ended Application – FEXT, “Best Case In Row” Configuration
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Single-Ended Application – NEXT, “Across Row” Configuration
Single-Ended Application – FEXT, “Across Row” Configuration
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Differential Application – Input Pulse
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Differential Application – Impedance
Differential Application – Propagation Delay
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Differential Application – NEXT, “Worst Case In Row ” Configuration
Differential Application – FEXT, “Worst Case In Row” Configuration
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Differential Application – NEXT, “Best Case In Row” Configuration
Differential Application – FEXT, “Best Case In Row” Configuration
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Differential Application – NEXT, “Across Row” Configuration
Differential Application – FEXT, “Across Row” Configuration
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Appendix C – Product and Test System Descriptions
Product Description
Product samples are surface mount micro sockets CLT-115-02-L-D-A & CLT-125-02-LDV-A. Mating micro terminal samples are the TMMH-115-05-L-DV-A & TMMH-125-05L-DV-A respectively. A board-to-board stack height of 4.77mm (0.188”) exists between
boards
Each connector structure consists of 2 rows of 15 or 25 positions mounted into a plastic
housing with a surface mount design. The contacts are evenly spaced at a 2.0mm
(.0787”) pitch
Test System Description
The test fixtures are composed of a 4-layer FR-4 material with 50Ω and100Ω signal
trace and pad configurations designed for the electrical characterization of Samtec hispeed connector products. The pictured fixtures are specific to the CLT/TMMH surface
mount series connector and are identified by Samtec P/N PCB-100348-TST-01 and P/N
PCB-100348-TST-02 (Figure 1)
Figure 1 Mated PCB Test Fixture with Mounted Test Connectors
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
PCB-100348-TST-01 (Figure 1, bottom pcb) is designated as the test signal launch
board and holds two CLT socket series connectors. A 15 signals/row connector is used
for characterizing single ended (GSG) test signals and the 25 signals/row connector
characterizes differential test signals (GSSG). Test fixture PCB -100348 -TST-02 holds
the mating TMMH terminal connectors (Figure 1, top pcb) and is the main signal monitoring section of the fixture. PCB -100348 -TST-02 also provides the reference plane
and/or calibration standards used in generating time delay and s-parameter information.
When the two PCB fixtures are mated labeled probe points coordinate to create continuous electrical transmission paths between the signal launch pads and monitoring
junctions. Both the single-ended and differential fixtures “J” number represents each
signal terminal’s designated position within the connector. Signals can also be
launched from the header side of the connector but the response may not necessarily
correlate with a socket side launch All data and waveforms presented in the report are
results from a socket side signal launch. Table 8 below identifies the launch, monitoring
and adjacent line termination points used in generating characterization data for this report.
Table 8 – PCB Fixture Characterization & Termination Matrix
Single Ended
50Ω to Gnd.
Termination
TST-01
TST-02
J-3
J3
J-8
J8
TST-01
TST-02
J_23
J-8
J25
J8
J-3
J_3
J_7
J8
J-3
J_3
J_7
TST-01
TST-02
Launch
Monitor
TST-01
TST-02
100Ω across Sig. Pair
Termination
TST-01
TST-02
J43_45
J43-45
J37_39
J37-39
TST-01
TST-01
TST-01
J9_11
J5_7
J43_45
J37_39
J38_40
J38_40
J37_39
J43_45
TST-01
TST-02
TST-01
TST-02
J5-7
J9-11
J37-39
J43-45
J38-40
J37-39
J43-45
J38-40
TST-02
J25
J9_11
J5-7
J5_7
J9-11
J-3
J-8
J_7
J8
J43_45
J37-39
J37_39
J43_45
J38-40
J43-45
J-3
J-8
J_3
J_7
J38_40
J37-39
J43_45
J37_39
J38-40
J43-45
Launch
Monitor
TST-01
TST-02
J-7
J_7
TST-01
TST-01
NEXT(worst)
J-25
J-23
NEXT(best)
J-7
J-3
NEXT(xrow)
J-7
J-8
TST-01
TST-02
FEXT(worst)
J-25
J_23
J-23
FEXT(best)
J-7
J_3
FEXT(xrow)
J-7
J8
USE PCB
IL, RL
Z, PD
USE PCB
USE PCB
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
Differential
WWW.SAMTEC.COM
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Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Signal Conditioning, Calibration Standards And Signal Launch/Monitoring
Figure 2 represents the layout of the footprint, connector, and signal trace transitions
where exact test signal configuration conditions can be determined. In general these
GSG or GSSG conditions are spelled out in the characterization details section of this
report. However, the geometry and signal conditioning surrounding the actual test
points are not detailed and should not be assumed to have non-aggressive or response
changing attributes. This graphic depicts test conditions, calibration standards, and
reference traces used in characterizing the CLT/TMMH connector series presented in
this report.
Figure 2 PCB Test Board Signal Routing
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Appendix D – Test and Measurement Setup
Test instruments are a Tektronix CSA8000 Communication Signal Analyzer Mainframe
and the Agilent 8720ES Vector Network Analyzer. Four bays of the CSA8000 are occupied with three Tektronix 80E04 TDR/Sampling Heads and one Tektronix 80E03
Sampling Head. For this series of tests, four of the eight TDR/Sampling Head capability
is used (Figure 3). The 8720ES serves as a supporting test instrument for verification
or troubleshooting results obtained from the TDA Systems IConnect Software package.
IConnect is a TDR based measurement software tool used in generating frequency domain related responses from high speed interconnects.
The probe stations illuminated video microscopy system, microprobe positioners, and
40GHz capable probes provide both the mechanical properties and electrical characteristics for obtaining the precise signal launch and calibrations that are critical in obtaining
accurate high speed measurements. The 450 micron pitch probes are located to PCB
launch points with 25X to 175X magnification and XYZ fine positioning adjustments
available from both the probe table and micro-probe positioners. Electrically the microwave probes rate a < 1.0 dB insertion loss, a < 18 dB return loss, and an isolation of 38
dB to 40 GHz (Figure 4). Test cables and interconnect adapters are high quality and
insure high-bandwidth and low parasitic measurements.
Figure 3– Probe Station Measurements Capability
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
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Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Test Instruments
QTY Description
1
Tektronix CSA8000 Communication Signal Analyzer
3
Tektronix 80E04 Dual Channel 20 GHz TDR Sampling Module
1
Tektronix 80E03 Dual Channel 20 GHz Sampling Module
1
Agilent 8720ES Vector Network Analyzer, 50 MHz to 20 GHz
Measurement Station Accessories
QTY Description
1
GigaTest Labs Model (GTL3030) Probe Station
4
GTL Micro-Probe Positioners
2
Picoprobe by GGB Ind. Model 40A GSG (single ended applications)
2
Picoprobe by GGB Ind. Dual Model 40A GSG-GSG (differential applications)
1
Keyence VH-5910 High Resolution Video Microscope
1
Keyence VH-W100 Fixed Magnification Lens 100 X
1
Keyence VH-Z25 Standard Zoom Lens 25X-175X
1
CS-9 GSG Picoprobe Calibration Substrate (U9450.sq)
1
CS-11 GS-SG Picoprobe Calibration Substrate (U11450.sq)
Figure 4 – 40 GHz High Performance Microwave Probes
Test Cables & Adapters
QTY Description
4
Micro-Coax Cable Assembly 48” 3.5mm Male to 3.5mm Female, 26.5 GHz
(IL = .33 dB@ 10 GHz)
2
Huber-Suhner Cable Assembly 36” SMA Female to SMA Female 26.5 GHz
(IL = .34 dB @ 10 GHz)
4
Pasternack Precision Adapters, 3.5 mm Male to 2.9(K) Male,
Max.VSWR 1.25 @ 34GHz
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Appendix E - Frequency and Time Domain Measurements
It is important to note before gathering measurement data that TDA Systems IConnect
measurements and CSA8000 measurements are virtually the same measurements with
diverse formats. This means that the operator, being extremely aware, can obtain SI
time and frequency characteristics in an almost simultaneous fashion.
Since IConnect setup procedures are specific to the frequency information sought, it is
mandatory that the sample preparation and CSA8000 functional setups be consistent
throughout the waveform gathering process. If the operators test equipment permits
recall sequencing between the various test parameter setups, it insures IConnect functional setups remain consistent with the TDR/TDT waveforms previously recorded. Related time and frequency test parameter data recorded for this report were gathered simultaneously.
Frequency (S-Parameter) Domain Procedures
Frequency data extraction involves two steps that first measure the frequency related
time domain waveform followed by post-processing of the time domain waveforms into
loss and crosstalk response parameters versus frequency. The first step utilizes the
Tektronix CSA8000 time based instrument to capture frequency related single-ended or
differential signal types propagating through an appropriately prepared SUT. The second step involves a correlation of the time based waveforms using the TDA Systems
IConnect software tool to post-process these waveforms into frequency response parameters. TDA Systems labels these frequency related waveform relationships as the
Step and DUT reference. This report establishes the setup procedures for defining the
Step and DUT reference for frequency parameters of interest. Once established, the
Step and DUT references are post-processed in IConnect’s S-parameter computations
window.
CSA8000 Setup
Listed below are the CSA 8000 functional menu setups used for single-ended and differential frequency response extractions. Both signal types utilize I-Connect software
tools to generate S-parameter upper and lower frequency boundaries along with the
step frequency. These frequency boundaries are determined by a time domain instruments functional settings such as window length, number of points and averaging capability. Once window length, number of points and averaging functions are set, maintain
the same instrument settings throughout the extraction process.
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
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Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Vertical Scale:
Offset:
Horizontal Scale:
Max. Record Length:
Averages:
Single-Ended Signal
100 mV/ Div:
Default / Scroll
1nSec/ Div = 20 MHz step
frequency
4000 = Min. Resolution
≥ 128
Differential Signal
100 mV/ Div:
Default / Scroll
1nSec/ Div = 20 MHz step
frequency
4000 = Min. Resolution
≥ 128
Insertion Loss
SUT Preparation - For signal launch and monitoring path guidelines reference table 8.
Terminate all the suggested active or adjacent signal lines at the impedance values
recommended in the table. Signal trace locations and configurations can be verified using figure 2.
Step Reference - Establish this waveform by making a TDT transmission measurement
that includes all cables, adapters, and probes connected in the test systems transmission path. The transmission path is completed by inserting a negligible length of transmission standard between the microwave probes. (Note: Use the split-cal1 standard in
TDT mode located on Samtec PCB-100348 -TST- 02 fixtures).
DUT Reference - Establish these waveforms by making an active TDT transmission
measurement that includes all cables, adapters, and probes connected in the test systems transmission path. Insert the SUT between the probes in place of the transmission standard and record the measurement.
Return Loss
SUT Preparation – For signal launch and monitoring path guidelines reference table 8.
Terminate all the suggested active or adjacent signal lines at the impedance values
recommended in the table. Signal trace locations and configurations can be verified using figure 2.
Step Reference - Establish the waveform by making an active TDR reflection measurement that includes all cables, adapters, and probes connected in the test systems electrical path up to and including an open standard. (Note: Use split-cal1 standard in TDR
mode located on Samtec PCB-100348 -TST- 02 fixtures).
DUT Reference – Retain same signal paths and test setup used in obtaining insertion
loss waveforms. Establish these waveforms by making a TDT (matched) reflection
measurement that includes all cables, adapters, and probes connected in the test systems transmission path. For this condition the quality cables and adapters located on
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
the far-end of the inserted SUT serves as the resistive load impedance closely matching
the test system input impedance of 50Ω single-ended and100Ω differential.
Near-End Crosstalk (NEXT)
SUT Preparation – For signal launch and monitoring path guidelines reference table 8.
Terminate all the suggested active or adjacent signal lines at the impedance values
recommended in the table. Signal trace locations and configurations can be verified using figure 2.
Step Reference - Establish these waveforms by making an active measurement that includes all cables, adapters, and probes connected in the test systems electrical path up
to and including an open standard. (Note: Use split-cal1 standard in TDR mode located
on Samtec PCB-100348 -TST- 02 fixtures).
DUT Reference - Establish these waveforms by driving the suggested signal line and
monitoring the TDR coupled energy at the adjacent near-end signal line. Establish {6}
measurement waveforms of worst case, best case and across row (xrow) coupling conditions for both signal types.
Far-End Crosstalk (FEXT)
SUT Preparation - For signal launch and monitoring path guidelines reference table 8.
Terminate all the suggested active or adjacent signal lines at the impedance values
recommended in the table. Signal trace locations and configurations can be verified using figure 2.
Step Reference - Establish these waveforms by making a TDT transmission measurement that includes all cables, adapters, and probes connected in the test systems
transmission path. The transmission path is completed by inserting a negligible length
of transmission standard (Note: Use the split-cal1 standard in TDT mode located on
Samtec PCB-100348 -TST- 02 fixtures).
DUT Reference - Establish these waveforms by driving the suggested signal line and
monitoring the TDR coupled energy at the adjacent near-end signal line. Establish {6}
measurement waveforms of worst case, best case and across row (xrow) coupling conditions for both signal types.
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Time Domain Procedures
Measurements involving digital type pulses are performed utilizing either Time Domain
Reflectometer (TDR) or Time Domain Transmission (TDT) methods. For this series of
tests, TDR methods are employed for the impedance and propagation delay measurements. Crosstalk measurements utilize TDT methods. The Tektronix 80E04 TDR/ Sampling Head provide both the signaling type and sampling capability necessary to accurately
and fully characterize the SUT.
Impedance
The signal line(s) of the SUT’s signal configuration is energized with a TDR pulse. The
far-end of the energized signal line is terminated in the test systems characteristic impedance (e.g.; 50Ω or 100Ω terminations). By terminating the adjacent signal lines in
the test systems characteristic impedance, the effects on the resultant impedance
shape of the waveform is limited. For signal launch and monitoring path guidelines reference table 8.
Propagation Delay
This connector series uses the fastest edge rate (30ps) of the TDR impedance waveform to measure propagation delay. Differential or single ended signal delay for this test
is the measured difference of propagation between a known signal trace length delay
and the delay through a mated SUT. Measure a known delay length.(reference PCB100348 -TST- 02 fixtures for known delay lengths) Then measure a related signal
through path of an SUT. Propagation through a mated SUT connector is the one-way
travel time between the 50% amplitudes of each of the rising edges of the two pulses.
Termination of the adjacent signal lines into the test systems characteristic impedance
eliminate alternate current paths providing for better measurement accuracy. For signal
launch and monitoring path guidelines reference table 8.
Crosstalk
An active pulsed waveform is transmitted through a selected SUT signal line. The adjacent quiet signal lines are monitored for the coupled energy at the near-end and far-end.
Active and quiet lines not being monitored are terminated in the test systems characteristic impedance. Signal lines adjacent to the quiet lines remain terminated on both ends
throughout the test sequence. Failing to terminate the active near or far end, quiet
lines, or in some cases, signal lines adjacent to the quiet line may have an effect on
amplitude and shape of the coupled energy. For signal launch and monitoring path
guidelines reference table 8.
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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Fax: 812-948-5047
Report Revision: 1/30/2006
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High Speed Characterization Report
Series: TMMH/CLT Surface Mount Series
Description: Micro, Board-to-Board, 2.0mm Pitch, 4.77mm (0.188”) Stack Height
Appendix F – Glossary of Terms
BC – Best Case crosstalk configuration
DP – Differential Pair signal configuration
DUT – Device under test; TDA IConnect reference waveform
FEXT – Far-End Crosstalk
GSG – Ground–Signal-Ground; geometric configuration
NEXT – Near-End Crosstalk
PCB – Printed Circuit Board
SE – Single-Ended
SI – Signal Integrity
SUT – System under test
TDR – Time Domain Reflectometry
TDT – Time Domain Transmission
WC – Worst Case crosstalk configuration
Xrowse – Cross ground/ power bar crosstalk, single-ended signal
Xrowdiff – Cross ground/ power bar crosstalk, differential signal
Z – Impedance (expressed in ohms)
Samtec Inc.
520 Park East Blvd.
New Albany IN 47151-1147 USA
©Samtec, Inc. 2005
WWW.SAMTEC.COM
1-800-SAMTEC-9 (US & Canada)
[email protected]
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