Reliability Report

RR701-13
Reliability Report for PLL701-13
1.0 TITLE: Reliability Report on Device: PLL701-13.
2.0 Purpose and Scope
To perform the qualification of PLL701-13 based on the evaluation study of three assembly
date codes of the same part. This procedure is to assure the quality and reliability of this
product meets the standard set forth by PhaseLink Corp.
3.0 Description of the Device Tested .
4.1 Test Device/Vehicle: PLL701-13
4.2 Wafer Fabrication Vendor Name: Chartered Semiconductor Mfg. Co.
4.3 Wafer Fabrication Process Technology: 0.5um CMOS
4.4 Package Assembly Vendor Name: ChantWorld Technology Inc
4.5 Package Type: 8 Pin SOIC
4.0 Device/Material Lot or I.D. Number(s) Included in these Tests.
Device Part Number
Lot or Date Code Number
PLL701-13
E0263/0118
PLL701-13
E0292/0122
PLL701-13
E0292/0123
Reliability Report. Device: PLL701-13
1
rev. 11/13/01
47745 Fremont Blvd., Fremont, CA 94538
(510) 492-0990 FAX: (510) 492-0991 www.phaselink.com
RR701-13
Reliability Report for PLL701-13
5.0 Quality Criteria
5.0 Material shall be manufactured according to the quality standards and meet all
specifications approved by PhaseLink Corp.
5.1 Any additional quality standards that apply to specific lots shall be recorded in this
report.
5.2 Observe all Electro-Static Dissipations (ESD) control rules in handling device products.
5.3 The contracted laboratory performs the testing shall be ISO9000 certified.
6.0 Reliability Test Methods and Specifications
The tests follow the general guideline set forth accordance to Mil-Std. 883, while the actual
test conditions may vary and set to each of the following test criteria.
6.1 ESD
6.2 Latch-Up
6.3 Pre-Conditioning Stress Test.
6.4 High Temperature Life Test - Dynamic HTOL
6.5 High Accelerated Stress Test – HAST
6.6 Temperature Cycles.
7.0 Test Results
7.1 ESD
ESD test was not performed on PLL701-13. For reference, ESD test on the PLL702-01A1,
which uses the same ESD protection on the same silicon IC base was performed and passed.
Device Lot/Date
Code #
Sample Size
Test Result
AI0122
3
pass
7.2 Latch-Up
Latch-Up test was not performed on PLL701-13. For reference, Latch-up test on the
PLL702-01A1, which uses the silicon IC base, was performed and passed.
Device Lot/Date
Code #
Sample Size
Test Result
AI0122
3
pass
Reliability Report. Device: PLL701-13
2
rev. 11/13/01
47745 Fremont Blvd., Fremont, CA 94538
(510) 492-0990 FAX: (510) 492-0991 www.phaselink.com
RR701-13
Reliability Report for PLL701-13
7.3 Pre-Conditioning Stress Test.
Device Lot/Date
Code #
Sample Size
Test Result
E0263/0118
150
pass
E0292/0122
100
pass
E0292/0123
175
pass
7.4 High Temperature Life Test - Dynamic HTOL
Device Lot / Date
Code #
Sample Test Result 168 Test Result
Size
hours
500 hours
Test Result
1000 hours
E0263/0118
55
Pass
Pass
Pass
E0292/0122
30
Pass
Pass
Pass
E0292/0123
30
Pass
Pass
Pass
Visual Inspection data: passed
7.5 High Accelerated Stress Test - HAST
Device Lot/Date
Code #
Sample Size
Test Result
E0263/0118
55
pass
E0292/0122
30
pass
E0292/0123
30
pass
Device Lot/Date
Code #
Sample Size
Test Result
E0263/0118
25
pass
E0292/0122
25
pass
7.6 Temperature Cycles.
NA
Visual Inspection data: Passed
Reliability Report. Device: PLL701-13
3
rev. 11/13/01
47745 Fremont Blvd., Fremont, CA 94538
(510) 492-0990 FAX: (510) 492-0991 www.phaselink.com
RR701-13
Reliability Report for PLL701-13
8.0 Process Flow Diagram
ESD
test
Receiving
Inspection
Sample lot(s)
Latchup
test
Pre-conditioning
125C, 24 hrs.
30C, 70% RH,168 hrs
240C, IR Reflow, 3X
HTOL
125C, 3.6V, 1000 hrs
HAST
131C, 85%RH, 96 hrs
Visual
sampling
inspection
C-SAM
+ Visual
sampling
inspection
Temp. cycles
-40C to 125C,
1,000 cycles
Visual
sampling
inspection
Reliability Report. Device: PLL701-13
4
rev. 11/13/01
47745 Fremont Blvd., Fremont, CA 94538
(510) 492-0990 FAX: (510) 492-0991 www.phaselink.com