RR701-13 Reliability Report for PLL701-13 1.0 TITLE: Reliability Report on Device: PLL701-13. 2.0 Purpose and Scope To perform the qualification of PLL701-13 based on the evaluation study of three assembly date codes of the same part. This procedure is to assure the quality and reliability of this product meets the standard set forth by PhaseLink Corp. 3.0 Description of the Device Tested . 4.1 Test Device/Vehicle: PLL701-13 4.2 Wafer Fabrication Vendor Name: Chartered Semiconductor Mfg. Co. 4.3 Wafer Fabrication Process Technology: 0.5um CMOS 4.4 Package Assembly Vendor Name: ChantWorld Technology Inc 4.5 Package Type: 8 Pin SOIC 4.0 Device/Material Lot or I.D. Number(s) Included in these Tests. Device Part Number Lot or Date Code Number PLL701-13 E0263/0118 PLL701-13 E0292/0122 PLL701-13 E0292/0123 Reliability Report. Device: PLL701-13 1 rev. 11/13/01 47745 Fremont Blvd., Fremont, CA 94538 (510) 492-0990 FAX: (510) 492-0991 www.phaselink.com RR701-13 Reliability Report for PLL701-13 5.0 Quality Criteria 5.0 Material shall be manufactured according to the quality standards and meet all specifications approved by PhaseLink Corp. 5.1 Any additional quality standards that apply to specific lots shall be recorded in this report. 5.2 Observe all Electro-Static Dissipations (ESD) control rules in handling device products. 5.3 The contracted laboratory performs the testing shall be ISO9000 certified. 6.0 Reliability Test Methods and Specifications The tests follow the general guideline set forth accordance to Mil-Std. 883, while the actual test conditions may vary and set to each of the following test criteria. 6.1 ESD 6.2 Latch-Up 6.3 Pre-Conditioning Stress Test. 6.4 High Temperature Life Test - Dynamic HTOL 6.5 High Accelerated Stress Test – HAST 6.6 Temperature Cycles. 7.0 Test Results 7.1 ESD ESD test was not performed on PLL701-13. For reference, ESD test on the PLL702-01A1, which uses the same ESD protection on the same silicon IC base was performed and passed. Device Lot/Date Code # Sample Size Test Result AI0122 3 pass 7.2 Latch-Up Latch-Up test was not performed on PLL701-13. For reference, Latch-up test on the PLL702-01A1, which uses the silicon IC base, was performed and passed. Device Lot/Date Code # Sample Size Test Result AI0122 3 pass Reliability Report. Device: PLL701-13 2 rev. 11/13/01 47745 Fremont Blvd., Fremont, CA 94538 (510) 492-0990 FAX: (510) 492-0991 www.phaselink.com RR701-13 Reliability Report for PLL701-13 7.3 Pre-Conditioning Stress Test. Device Lot/Date Code # Sample Size Test Result E0263/0118 150 pass E0292/0122 100 pass E0292/0123 175 pass 7.4 High Temperature Life Test - Dynamic HTOL Device Lot / Date Code # Sample Test Result 168 Test Result Size hours 500 hours Test Result 1000 hours E0263/0118 55 Pass Pass Pass E0292/0122 30 Pass Pass Pass E0292/0123 30 Pass Pass Pass Visual Inspection data: passed 7.5 High Accelerated Stress Test - HAST Device Lot/Date Code # Sample Size Test Result E0263/0118 55 pass E0292/0122 30 pass E0292/0123 30 pass Device Lot/Date Code # Sample Size Test Result E0263/0118 25 pass E0292/0122 25 pass 7.6 Temperature Cycles. NA Visual Inspection data: Passed Reliability Report. Device: PLL701-13 3 rev. 11/13/01 47745 Fremont Blvd., Fremont, CA 94538 (510) 492-0990 FAX: (510) 492-0991 www.phaselink.com RR701-13 Reliability Report for PLL701-13 8.0 Process Flow Diagram ESD test Receiving Inspection Sample lot(s) Latchup test Pre-conditioning 125C, 24 hrs. 30C, 70% RH,168 hrs 240C, IR Reflow, 3X HTOL 125C, 3.6V, 1000 hrs HAST 131C, 85%RH, 96 hrs Visual sampling inspection C-SAM + Visual sampling inspection Temp. cycles -40C to 125C, 1,000 cycles Visual sampling inspection Reliability Report. Device: PLL701-13 4 rev. 11/13/01 47745 Fremont Blvd., Fremont, CA 94538 (510) 492-0990 FAX: (510) 492-0991 www.phaselink.com