AUTOMOTIVE PRODUCT AEC-Q100G Qualification Test Plan Objective: Merlot PQFN_CHG_Cu Wire Qualification Qual Vehicle PN: MC33926PNB Qual Vehicle Name:: Merlot PQFN Customer Name(s): Various PN(s): Technology: SMOS8MV Package Description: PQFN 8x8 Fab site: Assembly site: Final Test site: Rel Test site: Die Size (in mm) WxLxT Test Program ID: VARIOUS Test Program Rev: Rel. Circuits Doc. #: CAB #: FSL Qual Quartz Tracking #: Target Dates NA Test Start: Test Finish: PPAP target date: Freescale Contact: Bai Yun Phone Number: +86-85684704 Mask set#: N36K Revision #: Product Engr: Ge Y.C Packaging Engr: Reliability Engr: Tian Meng CHD-Fab FSL-TJN-FM FSL-TJN-FM Part Operating -40 to 125 Temp. Range: AEC Grade: 2.429x2.41 Report Type: QUAL PLAN Revision #: Date: 28Oct13 Rel. Engr. Approval Signature: Date: CAB Approval Signature: Date: Tian Meng 28Oct13 Paige Somero 10Jul14 Customer Approval Signature: Date: PRE-STRESS REQUIREMENTS/OPTIONS Stress PC JEDEC22 Reference A113 J-STD-020 Test Conditions Preconditioning (PC) MSL 3 at 250°C, +5/-0°C CSAM: Note 3 Freescale/Jedec Reflow will be used for qualification End Point Requirements Minimum # of Total Sample Size per Lots Units lot including spares TEST at RH (add C if All surface mount devices prior to PC before HTOL); THB/HAST, AC/UHST, TC, CSAM PC+PTC, or as required per individual stress Test Conditions. Results Lot A nominal Lot B nominal Lot C nominal Lot D HH Lot E LL Comments (Generic Data: Note 2) PC is performed and results reported as part of the individual stress tests. GROUP A - ACCELERATED ENVIRONMENTAL STRESS TESTS HAST A110 TEST @ RH; Highly Accelerated Stress Test (HAST): CSAM PC before HAST if required. HAST = 110°C/85%RH for 264 hrs,528hrs FIO. Bias: 5V; 16V Timed RO of 48hrs. MAX UHST A118 Unbiased HAST (UHST): PC before UHST if required. UHST = 110°C/85%RH for 264 hrs,528hrs FIO. Timed RO of 48hrs. MAX TC PC + PTC A104 Temperature Cycle (TC): AEC Q100- PC before TC if required. Appendix 3 TC = -50°C to 150°C for 1000 cycles,2000cycles FIO WBP after qual readpoint on 5 devices from each lot; 2 bonds per corner and one mid-bond per side on each device. Record which pins were used. A105 Preconditioning plus Power Temperature Cycle (PC+PTC):PTC = -40°C to 125°C for 1000 cycles;Bias: 5V, 5V, 12V 77 3 240 TEST @ R; CSAM 77 3 240 264hrs: 0/85 528hrs: 0/80 264hrs: 0/85 528hrs: 0/80 264hrs: 0/85 528hrs: 0/80 TEST @ H WBP =/> 3 grams CSAM 77 5 400 1K: 0/100 2K: 0/90 1K: 0/100 2K: 0/90 1K: 0/100 2K: 0/90 TEST @ RH 22 1 25 0/25 0/26 PTC A105 TEST @ RH Power Temperature Cycle (PTC):PTC = 40°C to 125°C for 1000 cycles;Bias: 5V, 5V, 12V 23 1 26 HTSL A103 High Temperature Storage Life (HTSL): HTSL = 150°C for 1008hrs,2016hrs FIO Timed RO = 96hrs. MAX TEST @ RH 45 1 48 264hrs: 0/85 528hrs: 0/80 264hrs: 0/85 528hrs: 0/80 264hrs: 0/85 528hrs: 0/80 When biased humidity is required either HAST or THB can be performed. HAST is the preferred biased humidity test. When unbaised humidity testing is required, UHST is the preferred unbiased humidity test. The AC option is NOT recommended. 1K: 0/100 2K: 0/90 1K: 0/100 2K: 0/90 1008hrs: 0/53 2016Hrs: 0/53 If WP is to be performed at interim readpoints, add additional samples so that the minimum sample size is maintained for the final readpoint. TEST GROUP B - ACCELERATED LIFETIME SIMULATION TESTS HTOL ELFR A108 High Temperature Operating Life (HTOL): HTOL = 125°C for 1008hrs,2016hrs FIO Bias: 5V, 16V Timed RO of 96hrs. MAX AEC Q100- Early Life Failure Rate ELFR): 008 ELFR = 125°C for 48 hrs; Timed RO of 48 hrs MAX TEST @ RHC; 77 1 80 1008hrs: 0/90 2016Hrs: 0/85 TEST @ RH 800 1 803 0/803 For HTOL drift analysis requirements, see Notes 5 & 6. 1 lot HTOL for Merlot PQFN 1 lot ELFR for Merlot PQFN TEST GROUP C - PACKAGE ASSEMBLY INTEGRITY TESTS Full Assy. CZ + Cu WB Cz 5 FSL Internal Full assembly process CZ Data collection per Requirement FSL CZ template (for Cu WB) for 3 tech cert lots with nominal Cu WB process. Perform Wire Bond CZ specifically for Copper Wire for 1 HH and 1 LLTech Cert lots. PASS PASS Merlot PQFN Assy CZ data WBS AEC Q100- Wire Bond shear (WBS) 001 Cpk = or > 1.67 30 bonds from minimum 5 units 5 25 PASS PASS PASS PASS PASS Performed by Assembly Site during qual lot builds - PE to include this requirement in the qual lot build ERF. WBP MilStd8832011 Cpk = or > 1.67 30 bonds from minimum 5 units 5 25 PASS PASS PASS PASS PASS Performed by Assembly Site during qual lot builds - PE to include this requirement in the qual lot build ERF Wire Bond Pull (WBP): Cond. C or D TEST GROUP D - DIE FABRICATION RELIABILITY TESTS TEST GROUP E - ELECTRICAL VERIFICATION TESTS TEST ED Freescale 48A Pre- and Post Functional / Parametrics (TEST): Test software shall meet requirements of AECQ100-007. Testing performed to the limits of device specification in temperature and limit value. AEC-Q100- Electrical Distribution (ED) 009, Freescale 48A spec 0 Fails TEST @ RHC Cpk = or > 1.67 All All All 30 3 90 TEST results is shown for each individual stress test in the qual results report generated upon qual completion. FSL SQA release required for qual test program. See justification report See justification report See justification report Merlot PQFN