HRP 101 - Screening Guide for Discrete Diodes

APPENDIX D
Screening Guides
The following screening procedures are suggested guides for assemblies and their
components:
HRP 101:
HRP 102:
HRP 103:
HRP 104:
HRP 105:
HRP 106:
Screening Guide for Discrete Diodes
Screening Guide for Finished Bridge Rectifier Assemblies
Screening Guide for Capacitors Used in Multiplier Assemblies
Screening Guide for Resistors Used in Multiplier Assemblies
Screening Guide for Multiplier Assemblies
Screening Guide for Hi-rel Hybrid Multiplier Assemblies
HRP 101: Discrete Diodes
The following screening for discrete diodes is a guide for a suggested procedure. It
can be modified or adjusted to suit requirements. This is taken from MIL-PRF-19500
Table IV, JANTX screening.
1)
High Temperature Life
(non-operating life/
stabilization bake
MIL-STD-750)
Method 1032
48 hrs @ +175°C
2)
Temperature Cycling
MIL-STD-750
Method 1051
Condition C
20 Cycles
-65°C to +175°C
15 min. extremes
No dwell @25°C
3)
Interim Electrical
4)
High Temperature
Reverse Bias (HTRB)
Forward Voltage Drop
Leakage Current
Method 1038
Condition A
MIL-STD-750
5)
Final Electrical
MIL-STD-750
96 hrs min. @ TA=150°C
and min. applied voltage
at 80% of rated VR
(TC or TL is optional)
Method
Method
Method
Method
4011
4016
4031
4021
295
Forward Voltage Drop
Leakage Current
Reverse Recovery Time
Peak Inverse Voltage
14