SSF7507 75V N-Channel MOSFET Main Product Characteristics VDSS 75V RDS(ON) 5mohm(typ.) ID 110A TO-220 Schematic Diagram Assignment Features and Benefits Marking and Pin Advanced trench MOSFET process technology Special designed for PWM, load switching and general purpose applications Ultra low on-resistance with low gate charge Fast switching and reverse body recovery 175℃ operating temperature Lead free product Description It utilizes the latest trench processing techniques to achieve the high cell density and reduces the on-resistance with high repetitive avalanche rating. These features combine to make this design an extremely efficient and reliable device for use in power switching application and a wide variety of other applications. Absolute Max Rating Parameter Max. ID @ TC = 25°C Symbol Continuous Drain Current, VGS @ 10V① 110 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V① 80 IDM Pulsed Drain Current② 420 Power Dissipation③ 241 W Linear Derating Factor 1.5 W/°C VDS Drain-Source Voltage 75 V VGS Gate-to-Source Voltage ± 20 V EAS Single Pulse Avalanche Energy @ L=0.3mH② 633 mJ IAR Avalanche Current @ L=0.3mH② 65 A -55 to + 175 °C PD @TC = 25°C TJ TSTG www.goodark.com Operating Junction and Storage Temperature Range Page 1 of 8 Units A Rev.1.0 SSF7507 75V N-Channel MOSFET Thermal Resistance Symbol Characteristics RθJC RθJA Typ. Max. Units Junction-to-case③ — 0.62 ℃/W Junction-to-ambient (t ≤ 10s) ④ — 62.5 ℃/W Junction-to-Ambient (PCB mounted, steady-state) ④ — 40 ℃/W Electrical Characteristics @TA=25℃ Symbol Parameter V(BR)DSS Drain-to-Source breakdown voltage RDS(on) Static Drain-to-Source on-resistance VGS(th) Gate threshold voltage IDSS Drain-to-Source leakage current IGSS Gate-to-Source forward leakage Qg unless otherwise specified Min. Typ. Max. Units 75 — — V — 5 6 — 9 — 2 — 4 — 2.45 — — — 1 — — 50 — — 100 -100 — — Total gate charge — 127.7 — Qgs Gate-to-Source charge — 30.9 — Qgd Gate-to-Drain("Miller") charge — 47.6 — td(on) Turn-on delay time — 23.1 — tr Rise time — 19.9 — td(off) Turn-Off delay time — 61.4 — tf Fall time — 28.4 — Ciss Input capacitance — 6776 — Coss Output capacitance — 535 — Crss Reverse transfer capacitance — 484 — mΩ Conditions VGS = 0V, ID = 250μA VGS=10V,ID = 30A TJ = 125℃ V VDS = VGS, ID = 250μA TJ = 125℃ μA nA VDS = 75V,VGS = 0V TJ = 125°C VGS =20V VGS = -20V ID = 30A, nC VDS=30V, VGS = 10V VGS=10V, VDS=30V, ns RL=15Ω, RGEN=2.55Ω VGS = 0V, pF VDS = 25V, ƒ = 1.0MHz Source-Drain Ratings and Characteristics Symbol IS ISM Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Min. Typ. Max. Units — — 110 A — — 420 A Conditions MOSFET symbol showing the integral reverse p-n junction diode. VSD Diode Forward Voltage — 0.84 1.3 V IS=30A, VGS=0V trr Reverse Recovery Time — 42.8 — ns TJ = 25°C, IF =75A, di/dt = Qrr Reverse Recovery Charge — 86.7 — nC 100A/μs www.goodark.com Page 2 of 8 Rev.1.0 SSF7507 75V N-Channel MOSFET Test Circuits and Waveforms Switch Waveforms: Notes: ①The maximum current rating is limited by bond-wires. ②Repetitive rating; pulse width limited by max. junction temperature. ③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal resistance. ④The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C ⑤These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=175°C. ⑥ The maximum current rating is limited by bond-wires. www.goodark.com Page 3 of 8 Rev.1.0 SSF7507 75V N-Channel MOSFET Typical Electrical and Thermal Characteristics Figure 2. Gate to source cut-off voltage Figure 1: Typical Output Characteristics Figure 3. Drain-to-Source Breakdown Voltage vs. Temperature Temperature www.goodark.com Figure 4: Normalized On-Resistance Vs. Case Page 4 of 8 Rev.1.0 SSF7507 75V N-Channel MOSFET Typical Electrical and Thermal Characteristics Figure 5. Maximum Drain Current Vs. Case Figure 6.Typical Capacitance Vs. Drain-to-Source Temperature Voltage Figure7. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.goodark.com Page 5 of 8 Rev.1.0 SSF7507 75V N-Channel MOSFET Notes: ①The maximum current rating is limited by bond-wires. ②Repetitive rating; pulse width limited by max. junction temperature. ③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal resistance. ④The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C ⑤These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=175°C. ⑥ The maximum current rating is limited by bond-wires. www.goodark.com Page 6 of 8 Rev.1.0 SSF7507 75V N-Channel MOSFET Mechanical Data TO220 PACKAGE OUTLINE DIMENSION Symbol A A1 A2 b b2 c D D1 DEP E E1 ФP 1 e e1 H1 L L1 L2 ФP Q Q1 ϴ1 ϴ2 www.goodark.com Dimension In Millimeters Min Nom Max 4.400 4.550 4.700 1.270 1.300 1.330 2.590 2.690 2.790 0.770 0.900 1.230 1.360 0.480 0.500 0.520 15.100 15.400 15.700 9.000 9.100 9.200 0.050 0.285 0.520 10.060 10.160 10.260 8.700 1.400 1.500 1.600 2.54BSC 5.08BSC 6.100 6.300 6.500 12.750 12.960 13.170 3.950 1.85REF 3.570 3.600 3.630 2.730 2.800 2.870 0.200 0 5 0 1 0 7 0 3 0 9 0 5 Page 7 of 8 Min 0.173 0.050 0.102 0.030 0.048 0.019 0.354 0.002 0.396 0.055 0.240 0.502 0.141 0.107 0 5 0 1 Dimension In Inches Nom 0.179 0.051 0.106 0.020 0.606 0.358 0.011 0.400 0.343 0.059 0.1BSC 0.2BSC 0.248 0.510 0.073REF 0.142 0.110 0.008 0 7 0 3 Max 0.185 0.052 0.110 0.035 0.054 0.020 0.362 0.020 0.404 0.063 0.256 0.519 0.156 0.143 0.113 0 9 0 5 Rev.1.0 SSF7507 75V N-Channel MOSFET Ordering and Marking Information Device Marking: SSF7507 Package (Available) TO-220 Operating Temperature Range C : -55 to 175 ºC Devices per Unit Package Units/ Tubes/Inner Type Tube Box TO-220 50 Units/Inner Box 20 Reliability Test Program Test Item Conditions High Temperature Reverse Bias(HTRB) High Temperature Gate Bias(HTGB) www.goodark.com 1000 Inner Units/Carton Boxes/Carton Box Box 6 6000 Duration Sample Size Tj=125℃ to 175℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices Tj=150℃ or 175℃ @ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices Page 8 of 8 Rev.1.0