AOS Semiconductor Product Reliability Report AOW482, rev B Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOW482. Accelerated environmental tests are performed on a specific sample size, and then followed by electrical test at end point. Review of final electrical test result confirms that AOW482 passes AOS quality and reliability requirements. The released product will be categorized by the process family and be monitored on a quarterly basis for continuously improving the product quality. Table of Contents: I. II. III. IV. Product Description Package and Die information Environmental Stress Test Summary and Result Reliability Evaluation I. Product Description: TM The AOW482 is fabricated with SDMOS trench technology that combines excellent RDS(ON) with low gate charge and low Qrr. The result is outstanding efficiency with controlled switching behavior. This universal technology is well suited for PWM, load switching and general purpose applications. -RoHS Compliant -Halogen Free Details refer to the datasheet. II. Die / Package Information: AOW482 Standard sub-micron 80V N-Channel MOSFET Package Type TO262 Lead Frame Cu Die Attach Soft solder Bond wire Al wire Mold Material Epoxy resin with silica filler Moisture Level Up to Level 1 * Note * based on info provided by assembler and mold compound supplier Process 2 III. Result of Reliability Stress for AOW482 Test Item Test Condition Time Point MSL Precondition 168hr 85°c /85%RH +3 cycle reflow@250°c Temp = 150°c , Vgs=100% of Vgsmax - 9 lots 2464pcs 0 JESD22A113 168hrs 500 hrs 1000 hrs 6 lots 9 lots 1155pcs 0 JESD22A108 0 JESD22A108 616pcs 0 JESD22A110 0 JESD22A102 0 JESD22A104 HTGB Lot Attribution (Note A*) HTRB Temp = 150°c , Vds=80% of Vdsmax 168hrs 500 hrs 1000 hrs 6 lots 9 lots (Note A*) HAST Pressure Pot Temperature Cycle Total Sample size 1155pcs 77 pcs / lot 96 hrs 8 lots 96 hrs (Note A*) 9 lots 77 pcs / lot 693pcs (Note A*) 77 pcs / lot -65°c to 150°c , air to air, 250 / 500 cycles (Note A*) Reference Standard 77 pcs / lot 130 +/- 2°c , 85%RH, 33.3 psi, Vgs = 100% of Vgs max 121°c , 29.7psi, RH=100% 15 lots Number of Failures 1155pcs 77 pcs / lot Note A: The reliability data presents total of available generic data up to the published date. IV. Reliability Evaluation FIT rate (per billion): 4.16 MTTF = 27466 years The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of the selected product (AOW482). Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one failure per billion hours. 2 9 Failure Rate = Chi x 10 / [2 (N) (H) (Af)] 9 = 1.83 x 10 / [2x (12x77x168 + 18x77x500) x259] = 4.16 9 8 MTTF = 10 / FIT = 2.41 x 10 hrs = 27466 years Chi²= Chi Squared Distribution, determined by the number of failures and confidence interval N = Total Number of units from HTRB and HTGB tests H = Duration of HTRB/HTGB testing Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C) Acceleration Factor [Af] = Exp [Ea / k (1/Tj u – 1/Tj s)] Acceleration Factor ratio list: Af 55 deg C 70 deg C 85 deg C 100 deg C 115 deg C 130 deg C 150 deg C 259 87 32 13 5.64 2.59 1 Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16 Tj u =The use junction temperature in degree (Kelvin), K = C+273.16 k = Boltzmann’s constant, 8.617164 X 10-5eV / K 3