V24N4 - JANUARY

January 2015
I N
T H I S
I S S U E
Mike Engelhardt shows
how LTspice® is head of the
SPICE pack 10
clocking solutions: 1.4GHz
low jitter PLL with clock
distribution 17
1.5A monolithic buck-boost
DC/DC, 2.5V–15V VIN and
VOUT 24
DC/DC for hundreds of
watts, 60V VIN or VOUT 28
analysis of Hot Swap™
circuits with foldback
current limit 34
Volume 24 Number 4
Temperature-to-Bits: One IC for All
Sensor Types, 0.1°C Conformity
Michael Mayes
Temperature measurement is not new. Galileo invented a
rudimentary thermometer capable of detecting temperature
changes, and two hundred years later, Seebeck discovered the
thermocouple. Given the long history of temperature measurement
and its extensive use today, one would think that accuracy
problems were all but eliminated. Not so. Even though methods
for extracting temperature from sensor elements are well known,
accurately measuring temperatures to better than 0.5°C or
®
0.1°C accuracy remains a challenge. The LTC 2983 enables up
to 0.1°C temperature conformity (measured accuracy against
a precision temperature calibrator), as shown in Figure 1.
Thermocouples, temperature dependent resistance elements (RTDs and thermistors) and semiconductor elements (diodes) are widely used to electrically measure temperature. Digitizing the electrical
signals of these sensor elements requires
significant expertise in a number of areas:
sensor behavior, analog circuit design, digital
circuit design and firmware development.
The LTC2983 packs this expertise into a single
IC and solves each of the unique challenges
associated with thermocouples, RTDs, thermistors and diodes. It combines all analog
circuitry necessary for each sensor type
with temperature measurement algorithms
and linearization data to directly measure
each sensor and output the result in °C.
(continued on page 4)
The LTC2983 solves the unique problems presented by all standard temperature sensors to produce
unmatched conformity and ease-of-use.
w w w. li n ea r.com
Linear in the News
In this issue...
LINEAR AT ELECTRONICA
COVER STORY
Temperature-to-Bits: One IC for All
Sensor Types, 0.1°C Conformity
Michael Mayes
1
DESIGN FEATURES
In November, Linear had a major presence at the biannual Electronica Show in
Munich. The Linear booth featured an ambitious array of 20 live, system-based
demos, showcasing the breadth of the company’s product line. These demos
included:
Vladimir Ostrerov and Josh Simonson
34
•Power over Ethernet port forwarding using 90W LTPoE++™
•High performance amplifiers and converters enabling small, precise instruments
•Complete backup power—when you need it
•Maximize battery pack safety, life and capacity
•Robust IO-Link, PHY solutions
•Highly reliable wireless mesh
network running on solar power
•Wireless power for battery
charging in challenging
environments
•Bidirectional converter allows
backup power
•Precision electrocardiogram signal
chain
•Solar power charging with True
Maximum Power Point Tracking
•Power management for video and
broadcasting
•µModule® regulator with
The Linear booth at Electronica was a hive of activity
with 20 live system-based demos.
READ/WRITE telemetry
•Universal temperature sensor IC
•E-Motorbike battery management
•Batteries of BMW i8 monitored by LTC6802 battery stack monitor
new product briefs
39
NEW VIDEOS
back page circuits
40
SPICE Differentiation
Mike Engelhardt
10
1.4GHz Low Jitter PLL with Clock Distribution
Solves Difficult Clocking Problems: Multi-Clock
Synchronization and Data Converter Clocking
Chris Pearson
17
1.5A Monolithic Buck-Boost DC/DC Converter with
Up to 95% Efficiency Features 2.5V–15V
Input and Output Voltage Ranges
Richard Cook
24
Hundreds of Watts, 60V In or Out: Synchronous
4-Switch Buck-Boost Converter is Easy to
Parallel to Minimize Temperature Rise
Keith Szolusha
28
DESIGN IDEAS
What’s New with LTspice IV?
Gabino Alonso
32
Analysis of Hot Swap Circuits with
Foldback Current Limit
Linear has posted several new videos at www.linear.com, including:
Universal Temperature Measurement System—Michael Mayes presents a series
of lab-based demonstrations that highlight the capabilities of the innovative LTC2983 universal temperature sensor IC. These TechClips show how the
LTC2983 can be used to directly digitize RTDs, themocouples and thermistors to measure temperature to an accuracy of 0.1°C and report the results
in °C or °F. View the TechClips at www.linear.com/solutions/5500
High Power 3-Channel LED Driver—Keith Szolusha shows how the LT®3797
powers three high power strings of LEDs with flexible topologies and major fault protection such as open LED strings and shorted
LED strings. View video at www.linear.com/solutions/5466
2 | January 2015 : LT Journal of Analog Innovation
Linear in the news
More Power, Better Heat Dissipation, Smaller
PCB Area—Video comparison of three
converter options: switching controllers,
monolithic regulators, and µModule regulators in terms of component count, area,
design effort and thermal performance.
The LTM®4633 and LTM4634 µModule
regulators require the lowest component
count, design effort, PCB area and address
thermal concerns with an innovative
package design that includes an integrated
top side heat sink, creating a low thermal
impedance path to the ambient air. See
video at www.linear.com/solutions/5467
A Very Low Power, High Performance I/Q
Modulator­—This video discusses the LTC5599,
a very low power modulator with excellent sideband rejection and carrier
leakage suppression, and with on-chip
capability to adjust these performance
metrics to unprecedented levels. The
device has an exceptionally low output
noise floor and high linearity, producing
superior dynamic range performance
for mission-critical transmitters. View
at www.linear.com/solutions/5429
High Efficiency Buck-Boost Battery Charger—
Today’s battery chargers are expected to
support a variety of battery chemistries
and accept a range of input voltages. In
many applications, the input voltage range
can vary from below the output battery
voltage to above the battery voltage,
requiring both step-down and step-up
capability. This video shows how the
LTC4020 controller meets these challenges,
how it works and its main features. See the
video at www.linear.com/solutions/5430
AWARDS
EDN Hot 100 Products for 2014
EDN in November announced the selection of several Linear Technology products
as EDN Hot 100 Products for 2014:
•LTC6268 ultralow input bias current op
amp
•LT3669 IO-Link PHY-compatible
industrial transceiver
•LTC5599 direct conversion I/Q modulator
Wireless Battery Charger Selected for
Two Awards
Linear’s LTC4120 wireless battery charger
was selected by UK’s Electronic Product
Design & Test magazine for their 2014
E-Legacy Awards in the Environmental
category. The LTC4120 also brought
home the award for Italy’s Selezione di
Elettronica’s 2014 Innovation Award.
The LTC6268
ultralow input
bias current
op amp was
selected as an
EDN Hot 100
Product.
Linear Products Receive Awards in
China
Two Linear Technology products received
awards from major publications in China.
The LTC2338-18 18-bit, 1Msps SAR ADC was
selected by EEPW in their Editors’ Choice
Awards 2014 for Best Mixed-Signal Chip
Award. And Electronic Products China
chose the LTC3330 nanopower buck-boost
converter with energy harvesting battery
life extender for their Top 10 Product
Award and their Green Energy Award.
CONFERENCES & EVENTS
CAR-ELE Japan, 7th International Automotive
Electronics Technology Expo, Tokyo Big Sight, Tokyo,
Japan, January 14-16, West 1 Hall, Booth West
8-12—Linear showcases its high perfor-
mance analog IC solutions for automotive,
including battery management systems.
More info at www.car-ele.jp/en/Home/
APEC 2015, Applied Power Electronics Conference,
Charlotte Convention Center, Charlotte, NC,
March 16-18, Booth 201—Presenting Linear’s
broad range of power management
solutions, including innovative switching regulators, linear regulators, digital
power system management products
and µModule regulators. Michael Jones
is presenting “PMBus Firmware: Using
Arduino for Prototyping and Designing
PMBus Solutions” at 8:30 am, March
17. More info at www.apec-conf.org/
Electronica China, Shanghai New International
Expo Centre, Shanghai, China, March 17-19, Hall E3,
Booth 3318—Linear will exhibit its broad
portfolio of analog and power solutions,
including Silent Switcher® regulators,
LDO+™ linear regulators, high power
LED drivers, µModule regulators, supercap
chargers, universal digital temperature
measurement system, SAR ADCs, automotive battery management systems, wireless
sensor network products and RF products. More info at www.electronicaproductronica-china.com/en/home n
January 2015 : LT Journal of Analog Innovation | 3
The LTC2983 has these polynomials built in for all eight standard
thermocouples (J, K, N, E, R, S, T and B) as well as user programmed table
data for custom thermocouples. The LTC2983 simultaneously measures the
thermocouple output and the cold junction temperature, and performs all
required calculations to report the thermocouple temperature in °C.
(LTC2983, continued from page 1)
LONG LEADS SUSCEPTIBLE TO
50kHz NOISE AND ESD EVENTS
THERMOCOUPLES: OVERVIEW
Thermocouples generate voltage as a function of the temperature difference between
the tip (thermocouple temperature) and
the electrical connection on the circuit
board (cold junction temperature). In
order to determine the thermocouple temperature, an accurate measurement of the
cold junction temperature is required; this
is known as cold junction compensation.
The cold junction temperature is usually
determined by placing a separate (nonthermocouple) temperature sensor at the
cold junction. The LTC2983 allows diodes,
RTDs, and thermistors to be used as cold
junction sensors. In order to convert the
voltage output from the thermocouple into
a temperature result, a high order polynomial equation (up to 14th order) must
be solved (using tables or mathematical
functions) for both the measured voltage
and the cold junction temperature. The
LTC2983 has these polynomials built in for
Figure 1. Typical temperature error conformity of the
LTC2983 with various sensors
0.5
0.4
0.3
ERROR (°C)
0.2
THERMISTOR
THERMOCOUPLE
0.1
0
–0.1
–0.2
–0.3
3904 DIODE
RTD
–0.4
–0.5
–200 0
200 400 600 800 1000 1200 1400
TEMPERATURE (°C)
4 | January 2015 : LT Journal of Analog Innovation
OPEN CIRCUIT FAULT
DETECTION REQUIRED
INPUT CAN GO
BELOW GND
VOLTAGE VS TEMPERATURE
IS HIGHLY NON-LINEAR
AND LOW LEVEL
COLD JUNCTION
TEMPERATURE REQUIRED
Figure 2. Thermocouple design
challenges
INPUT PROTECTION AND
ANTI-ALIASING REQUIRED
all eight standard thermocouples (J, K, N, E,
R, S, T and B) as well as user-programmed
table data for custom thermocouples.
The LTC2983 simultaneously measures
the thermocouple output and the cold
junction temperature, and performs
all required calculations to report the
thermocouple temperature in °C.
THERMOCOUPLES:
WHAT’S IMPORTANT
A thermocouple’s generated output
voltage is small (< 100mV full-scale) (see
Figure 2). As a result, the offset and noise
of the ADC making the voltage measurement must be low. Furthermore, it is
an absolute voltage reading requiring
an accurate/low drift reference voltage.
The LTC2983 contains a low noise, continuously offset calibrated 24-bit deltasigma ADC (offset and noise <1µV) with a
10ppm/°C max reference (see Figure 3).
A thermocouple’s output voltage can
also go below ground when the tip is
exposed to temperatures below the cold
junction temperature. This complicates
systems by either forcing the addition
of a second negative supply or an input
level shifting circuit. The LTC2983 incorporates a proprietary front end capable
of digitizing signals below ground on
a single ground-referenced supply.
In addition to high accuracy measurements, thermocouple circuits need to
incorporate noise rejection, input protection, and anti-alias filtering. The LTC2983
input impedance is high, with a maximum
input current of less than 1n A. It can
accommodate external protection resistors
and filtering capacitors without introducing extra errors. It includes an on chip
digital filter with 75dB rejection of both
50Hz and 60Hz or 120dB of 50Hz or 60Hz.
Fault detection is an important feature of
many thermocouple measurement systems. The most common fault reported
is an open circuit (broken or unplugged
thermocouple). Historically, current
sources or pull-up resistors were applied
to the thermocouple input in order to
detect this type of fault. The problem
with this approach is that these induced
design features
If two perfectly matched excitation current sources of known ratio are applied to the
diode, a voltage of known proportionality to absolute temperature (PTAT) is output. The
LTC2983 automatically generates the ratioed currents, measures the resultant diode
voltage, calculates the temperature using the programmed non-ideality and outputs
the results in °C. It can also be used as the cold junction sensor for thermocouples.
sensor connections are used in industrial
environments. The LTC2983 indicates
via fault reporting if the measured temperature is above/below the expected
range for the specific thermocouple.
2.85V TO 5.25V
LTC2983
“PULSED”
BURNOUT
VREF (10ppm/°C MAX)
1nA MAX
J, K, N, R, S,T , E, B
OR
CUSTOM
THERMOCOUPLE
24-BIT
∆∑ ADC
COLD JUNCTION
CAN BE DIODE OR
RTD OR THERMISTOR
24-BIT
∆∑ ADC
THERMOCOUPLE POLYNOMIALS,
COLD JUNCTION CALCULATION,
FAULT DETECTION
DIODE
CURRENT
GENERATOR
DIODES: OVERVIEW
SPI
INTERFACE
°C/°F
AND
FAULTS
24-BIT
∆∑ ADC
PROPRIETARY
NEGATIVE VOLTAGE
GENERATOR
Figure 3. Thermocouple
measurement using diode
cold junction compensation
signals lead to errors and noise, and
interact with input protection circuitry.
The LTC2983 includes a unique open
circuit detection circuit that checks for
a broken thermocouple just prior to the
measurement cycle. In this case, the open
Figure 4. Diode design
challenges
DIODES: WHAT’S IMPORTANT
circuit excitation current does not interfere with measurement accuracy. The
LTC2983 also reports faults related to the
cold junction sensor. It can detect, report
and recover from electrostatic discharge
(ESD) events that may occur when long
PARASITIC LEAD
RESISTANCE
REQUIRES PRECISELY MATCHED
CURRENT SOURCES
NEED PROGRAMMABLE
NON-IDEALITY FACTOR
OPEN/SHORT/DIRECTION
FAULT DETECTION
Diodes are inexpensive semiconductorbased devices that can be used as temperature sensors. These devices are typically
used as the cold junction sensor for a
thermocouple. When an excitation current is applied to a diode, they generate a
voltage as a function of temperature and
the current that is applied. If two perfectly matched excitation current sources
of known ratio are applied to the diode,
a voltage of known proportionality to
absolute temperature (PTAT) is output.
AUTOMATICALLY USE AS
COLD JUNCTION COMPENSATION
In order to generate a PTAT voltage with
known proportionality, two highly
matched, ratioed current sources are
required (see Figure 4). The LTC2983
accurately generates this ratio by relying
on delta-sigma oversampling architecture.
Diodes and the leads connecting to the
ADC contain unknown parasitic diode
effects. The LTC2983 contains a 3-current
measurement mode that removes parasitic
lead resistances. Various diode manufacturers specify different diode non-ideality
factors. The LTC2983 allows individual programming of each diode’s non-ideality factor. Since absolute voltages are measured,
the value and drift of the ADC reference
voltage are critical. The LTC2983 includes a
factory trimmed 10ppm/°C max reference.
January 2015 : LT Journal of Analog Innovation | 5
For RTDs, the LTC2983 automatically generates the excitation current, simultaneously
measures the sense resistor and RTD voltage, calculates the sensor resistance
and reports the result in °C. The LTC2983 can digitize most RTD types (PT‑10,
PT-50, PT-100, PT-200, PT-500, PT-1000 and NI-120) and has built in coefficients
for many standards (American, European, Japanese and ITS-90).
RSENSE
RSENSE VOLTAGE
BELOW ADC VREF
INPUT RANGE
PARASITIC
THERMAL EFFECTS
2-, 3- & 4-WIRE VERSIONS
4-WIRE
RTD
HI-Z INPUT
REQUIRED
NEED FAULT DETECTION
Figure 5. RTD design challenges
The LTC2983 automatically generates the
ratioed currents, measures the resultant
diode voltages, calculates the temperature
using the programmed non-ideality and
outputs the results in °C. It can also be
used as the cold junction sensor for thermocouples. If the diode is broken, shorted
or inserted incorrectly, the LTC2983 detects
this fault and reports it in the conversion
result output word and the corresponding thermocouple result, if it was used to
measure the cold junction temperature.
RTDs: OVERVIEW
RTDs are resistors that change value as a
function of temperature, and can measure
temperatures over a wide temperature
range, from as low as −200°C to 850°C.
In order to measure one of these devices,
a low drift, precision sense resistor is
tied in series with the RTD. An excitation
current is applied to the network and a
ratiometric measurement is made. The
value, in ohms, of the RTD can be determined from this ratio. This resistance is
6 | January 2015 : LT Journal of Analog Innovation
used to determine the temperature of the
sensor element using a table lookup.
The LTC2983 automatically generates
the excitation current, simultaneously
measures the sense resistor and RTD voltage, calculates the sensor resistance and
reports the result in °C. The LTC2983
can digitize most RTD types (PT-10,
PT-50, PT-100, PT-200, PT-500, PT-1000
and NI-120) and has built in coefficients for many standards (American,
European, Japanese and ITS-90).
RTDs: WHAT’S IMPORTANT
A typical PT100 RTD (see Figure 5) resistance varies less than 0.04Ω per tenth
of 1°C corresponding to a signal
level of 4µV at 100µ A current excitation. Low ADC offset and noise are
critical for accurate measurements.
The measurement is ratiometric relative to the sense resistor; the absolute
values of the excitation current and
reference voltage are not as important
when calculating the temperature.
GROUND REFERENCED
INPUT SIGNALS
Historically, the ratiometric measurement between the RTD and sense resistor
was performed with a single ADC. The
sense resistor’s voltage drop was used as
the reference input of the ADC measuring
the RTD voltage drop. This architecture
requires 10k or larger sense resistors,
which must be buffered to prevent droop
due to the ADC reference input dynamic
currents. Since the sense resistor value is
critical, these buffers need to have low
offset, drift and noise. This architecture
makes it difficult to rotate current sources
in order to remove parasitic thermocouple
effects. Delta-sigma ADC reference inputs
are much more susceptible to noise than
the inputs, and small values of reference voltage can lead to instability.
These problems are solved by the
LTC2983’s multiple ADC architecture (see
Figure 6). The LTC2983 uses two highly
matched, buffered, auto-calibrated
ADCs, one for the input and one for the
reference. They simultaneously measure both RTD and RSENSE , calculate
design features
The LTC2983 includes coefficients for calculating the temperature of standard
2.252k, 3k, 5k, 10k and 30k thermistors. Since there is a large variety
of thermistor types and values, the LTC2983 can be programmed with
custom thermistor table data (R vs T) or Steinhart-Hart coefficients.
2.85V TO 5.25V
LTC2983
“PULSED”
BURNOUT
VREF (10ppm/°C MAX)
OPTIONAL
THERMOCOUPLE
PROGRAMMABLE
2, 3, 4-WIRE
CURRENT SOURCES
1nA MAX
Figure 6. RTD temperature measurement using the LTC2983
RSENSE
24-BIT
∆∑ ADC
THERMOCOUPLE POLYNOMIALS,
COLD JUNCTION CALCULATION,
FAULT DETECTION
24-BIT
∆∑ ADC
SPI
INTERFACE
°C/°F
AND
FAULTS
4 3
4-WIRE
RTD
2
24-BIT
∆∑ ADC
1
PROPRIETARY
NEGATIVE VOLTAGE
GENERATOR
the RTD resistance and apply this to a
ROM-based lookup table to ultimately
output the RTD temperature in °C.
where parasitic lead resistance of the
sense resistor degrades performance, the
LTC2983 allows Kelvin sensing of RSENSE .
is automatically used to compensate
for the cold junction temperature.
RTDs come in several configurations:
2-wire, 3-wire and 4-wire. The LTC2983
accommodates all three configurations
with a configurable single hardware
implementation. It can share a single
sense resistor among multiple RTDs. Its
high impedance input allows external
protection circuits between the RTD and
ADC inputs without introducing errors.
It can also autorotate the current excitation to eliminate external thermal
errors (parasitic thermocouples). In cases
The LTC2983 includes fault detection
circuitry to determine if the sense resistor or RTD is broken or shorted. It warns
if the measured temperature is above or
below the maximum specified for the
RTD. When an RTD is used as the cold
junction sensor for a thermocouple,
three ADCs simultaneously measure the
thermocouple, the sense resistor and the
RTD. RTD faults are passed to the thermocouple result and the RTD temperature
Thermistors are resistors that change
value as a function of temperature.
Unlike an RTD, a thermistor’s resistance
varies many orders of magnitude over
their temperature range. In order to
measure one of these devices, a sense
resistor is tied in series with the sensor.
An excitation current is applied to the
network and a ratiometric measurement is made. The value, in ohms, of the
thermistor can be determined from this
ratio. This resistance is used to determine
THERMISTORS: OVERVIEW
January 2015 : LT Journal of Analog Innovation | 7
The LTC2983 includes fault detection circuitry that can determine if the
sense resistor or thermistor is broken/shorted. It warns if the measured
temperature is above or below the maximum specified for the thermistor.
Figure 7. Thermistor design challenges
RSENSE
PARASITIC
THERMAL EFFECTS
HI-Z INPUT
REQUIRED
RESISTANCE VARIES
MANY ORDERS OF
MAGNITUDE
FAULT DETECTION
REQUIRED
MANY STANDARDS TABLE
OR STEINHART-HART
the temperature of the sensor solving
Steinhart-Hart equations or table data.
for calculating the temperature of standard
2.252k, 3k, 5k, 10k and 30k thermistors.
Since there is a large variety of thermistor types and values, the LTC2983 can be
programmed with custom thermistor table
data (R vs T) or Steinhart-Hart coefficients.
RSENSE VOLTAGE
BELOW ADC VREF
INPUT RANGE
THERMISTORS: WHAT’S IMPORTANT
GROUND REFERENCED
INPUT SIGNAL
measures the sense resistor and thermistor
voltage, calculates the thermistor’s
resistance and reports the result in °C.
Thermistors typically operate from −40°C
to 150°C. The LTC2983 includes coefficients
The LTC2983 automatically generates
the excitation current, simultaneously
2.85V TO 5.25V
Figure 8. Thermistor
temperature measurement
using the LTC2983
LTC2983
“PULSED”
BURNOUT
VREF (10ppm/°C MAX)
OPTIONAL
THERMOCOUPLE
PROGRAMMABLE
2, 3, 4-WIRE
CURRENT SOURCES
1nA MAX
RSENSE
24-BIT
∆∑ ADC
24-BIT
∆∑ ADC
PROPRIETARY
NEGATIVE VOLTAGE
GENERATOR
8 | January 2015 : LT Journal of Analog Innovation
THERMOCOUPLE POLYNOMIALS,
COLD JUNCTION CALCULATION,
FAULT DETECTION
24-BIT
∆∑ ADC
SPI
INTERFACE
°C/°F
AND
FAULTS
A thermistor’s resistance (see Figure 7) varies many orders of magnitude over its temperature range. For example, a thermistor
measuring 10k at room temperature can
go as low as 100Ω at its highest temperature and > 300k at its lowest, while other
thermistor standards can go above 1M.
Typically, in order to accommodate large
valued resistance, very small excitation
current sources are used in conjunction
with large sense resistors. This results in
very small signal levels at the low end of
the thermistor’s range. Input and reference
buffers are required to isolate the ADC’s
dynamic input current from these large
resistors. But buffers don’t work well near
ground without separate supplies and
offset/noise errors need to be minimized.
These problems are all solved by the
LTC2983 (see Figure 8). It combines a
proprietary, continuously calibrated
buffer capable of digitizing signals at
or even below ground with its multiple
ADC architecture. Two matched, buffered
ADCs simultaneously measure the thermistor and sense resistor and calculate (based
on the standard) the thermistor temperature in °C. Large value sense resistors are
not required, allowing multiple RTDs and
thermistors of different types to share a
single sense resistor. The LTC2983 can also
design features
The LTC2983 is a groundbreaking, high performance integrated temperature measurement
system that directly digitizes thermocouples, RTDs, thermistors and diodes with laboratory
grade precision. It features high accuracy, an easy sensor interface and tremendous flexibility.
auto-range the excitation current depending on the thermistor’s output resistance.
The LTC2983 includes fault detection
circuitry that can determine if the sense
resistor or thermistor is broken/shorted.
It warns if the measured temperature is
above or below the maximum specified for
the thermistor.
The thermistor can be used as the cold
junction sensor for a thermocouple. In
this case, three ADCs simultaneously
measure the thermocouple, the sense
resistor and the thermistor. Thermistor
faults are passed to the thermocouple
result and the thermistor temperature is automatically used to compensate the cold junction temperature.
UNIVERSAL MEASUREMENT SYSTEM
The LTC2983 can be configured as a universal temperature measurement device
(see Figure 9). Up to four sets of universal
inputs can be applied to a single LTC2983.
Each of these sets can directly digitize
a 3-wire RTD, 4-Wire RTD, thermistor
or thermocouple without changing any
onboard hardware. Each sensor can share
the same four ADC inputs and protection/filtering circuitry, configured using
software. One sense resistor is shared
among all four banks of sensors and cold
junction compensation is measured by a
diode. The LTC2983 input structure allows
any sensor on any channel. Any combination of RTDs, sense resistors, thermistors,
thermocouples, diodes and cold junction
compensation can be applied to any and
all the 21 analog inputs on the LTC2983.
CONCLUSION
The LTC2983 automatically performs
cold junction compensation, can use
any sensor to measure the cold junction and includes fault reporting. It can
directly measure 2-, 3- or 4-wire RTDs,
and can easily share sense resistors to
save cost and rotate current sources
to remove parasitic thermal effects. It
includes auto-ranging current sources
for increased accuracy and reduced noise
associated with thermistor measurements.
The LTC2983 is a groundbreaking, high
performance integrated temperature
measurement system that directly digitizes
thermocouples, RTDs, thermistors and
diodes with laboratory grade precision.
It features high accuracy, an easy sensor
interface and tremendous flexibility.
Its three 24-bit delta-sigma ADCs use
a proprietary front end to solve many
problems typically associated with
temperature measurements. High input
impedance with live-at-zero input range
enables direct digitization of all temperature sensors and easy input projection. Twenty flexible analog inputs allow
a single hardware design to measure
any sensor by simply reprogramming
the device through the SPI interface.
In addition to the built-in sensor profiles, the LTC2983 enables custom, userprogrammable sensor profiles to account
for nonstandard, table-driven RTDs,
thermocouples and thermistors. n
Figure 9. Universal temperature measurement system
CH1
SHARE WITH ALL
FOUR SETS OF SENSORS
UP TO FOUR SETS PER LTC2983
THERMOCOUPLE
THERMISTOR
3-WIRE RTD
RSENSE
LTC2983
CH2
4-WIRE RTD
CH3
3 2
4 3
CH4
2
1
1
2
CH5
1
CH6
COM
COLD
JUNCTION
CH19
January 2015 : LT Journal of Analog Innovation | 9
SPICE Differentiation
Mike Engelhardt
To download LTspice, go to www.linear.com/ltspice
Analog design engineers lean heavily on simulation to predict circuit performance.
The value of a simulator hangs on how well it can predict physical reality, and
how quickly it can produce results. Discrepancy between simulated and real
performance can send a product into costly iterative debugging cycles.
SPICE is used for analog circuit simulation because it can compute the full
large signal behavior of arbitrary circuits. Three numerical methods used in
SPICE account for its success in analog
circuit simulation. Specifically:
•Newton iteration to find the solution
of circuits with nonlinear elements
•Sparse matrix methods to corral huge matrices into the address
space of a practical computer
•Implicit integration to integrate
the differential equations that
arise from circuit reactances
The ability of a SPICE simulator to reliably produce correct results depends
on how well these methods are implemented. This article outlines why LTspice
is better at yielding correct results
than other SPICE implementations.
NEWTON ITERATION
Newton iteration involves expanding
each nonlinear circuit device I-V curve
as a Taylor series but keeping only the
first two terms and then solving the
resultant system of simultaneous linear
equations. If the solution of the linear
system is indeed the very point about
which the Taylor series was expanded,
then, because the Taylor approximation
is exact at that point and accurate near
it, the solution of this linear system is in
10 | January 2015 : LT Journal of Analog Innovation
fact the correct solution to the original
nonlinear circuit.1 Success of convergence of Newton iteration results in
finding a numerical proof that the correct solution of your circuit was found.
Robustness of Newton iteration depends
on (1) having all circuit element I-V curves
being continuous in value and slope and
(2) all nonlinear elements being bypassed
with capacitance so that the previous
time step solution is a good starting point
for the Newton iteration of the current
time point. Conditions (1) and (2) are met
by any physical circuit, but SPICE programs usually don’t get this right because
the semiconductive devices in Berkeley
SPICE have discontinuities and these
implementation errors have spilled over
to pay-for SPICE implementations. These
discontinuities do not occur in LTspice.
To illustrate an example, Figure 1 shows
the I-V curve of a diode in PSpice2 versus
LTspice. The netlist used in each case is
* I-V discontinuity in PSpice diode
V1 N001 0 0
D1 N001 0 D
.dc V1 -.3 -.2 2u
.probe
.model D D(Is=10n)
.end
The PSpice diode I-V curve is discontinuous in both value and slope. Such
discontinuities exist in most of the semiconductive devices in PSpice but none of
the semiconductive devices in LTspice.
SPARSE MATRIX METHODS
The Taylor series is multidimensional—
one dimension for each unknown voltage node in the circuit. For an analog
IC, this can be 100,000 distinct voltage
nodes, leading to a conductivity matrix
of 100,000 by 100,000, or eighty billion
bytes for double precision matrix coefficients. Even today’s 64-bit processors don’t
bond out enough address lines to access
that much memory. Fortunately, almost
every coefficient is zero, so they don’t
need to be stored. Sparse matrix methods
keep track of only the nonzero elements.
This allows a huge matrix to be solved
in a comparatively tiny address space.
The sparsity of the matrix arises from the
physical nature of practical circuits. Most
nodes are only connected to a few other
nodes. For example, even if you write
out the conductively matrix of a circuit
that looks like a fishnet grid of resistors,
the matrix is almost diagonal because
each node is resistively connected only to
adjacent nodes. Practical circuits aren’t
as dense with connections as fishnets are
with knots. The sparsity of a large analog
circuit is in the parts per million range.
This sparsity is what allows the matrix
to be solved in a present day computer.
Newton iteration of analog circuits is not
possible without sparse matrix methods.
design features
LTspice eliminates the overhead in getting the data to the FPU with self-authoring
assembly language source written at run time, after matrix memory has been
allocated, and the addresses returned from malloc() are known. This late-authored
code can resolve concrete matrix element addresses in line with the code so the
data can be efficiently loaded, allowing the FPU to operate with the pipeline full.
Figure 1. Discontinuity in PSpice (left) diode I-V curve vs continuous diode I-V curve in LTspice (right). Discontinuities negatively impact a simulator’s ability to solve
nonlinear circuits.
The greatest similarity across SPICE implementations is in these sparse matrix
methods. All SPICE programs use LU factorization. Most SPICE implementations
use a sparse matrix library derived from
the code distributed with the academic
Berkeley SPICE code, but some, usually
marketed as a fast SPICE, try to improve
on it by using an enhanced sparse
matrix library such as SuperLU.3
A better approach is to simply to get the
processor to do the math at the theoretical FLOP limit of the underlying hardware. The issue is that it takes longer to
get the numerical data to the FPU than
it does to actually perform the FLOP.
The FPU pipeline usually runs empty.
Ultimately, this is a consequence of
the fact that all operating systems use
dynamic memory allocation. At the time
the simulator is written and compiled,
the memory location storing the matrix
data isn’t known. At run time the simulator requests memory with function call
malloc(), which returns an address at
which the simulator is allowed to safely
store matrix data. Since it isn’t humanly
possible to give each matrix element its
own name, arrays are used. This means the
simulator asks for fewer, but larger, pieces
of memory, and the individual coefficients
are indexed off the base address returned
by malloc(). All that is known at simulator
compile time is the address of the address
of the base address off which one indexes
to reach the matrix element. Resolving
this address at run time and fetching
the data pointed to by that address into
the FPU takes longer than executing the
FLOP itself.4 Ideally, the addresses of the
data required for a calculation would
be known ahead of calculation time so
that data can be efficiently fetched and
the FPU doesn’t have to wait for it.
LTspice eliminates the overhead in getting
the data to the FPU with self-authoring
assembly language source written at
run time, after matrix memory has been
allocated, and the addresses returned
from malloc() are known. This lateauthored code can resolve concrete
matrix element addresses in line with
January 2015 : LT Journal of Analog Innovation | 11
PSpice’s Gear integration method often fails. Gear integration doesn’t just dampen
numerical ringing, it dampens all ringing, even physical ringing, making it possible for a
circuit that malfunctions in real life, due to an oscillation, to simulate as perfectly stable
and functional because the instability was damped out of numerical existence.
the code so the data can be efficiently
loaded, allowing the FPU to operate with
the pipeline full once the code is assembled and linked with LTspice’s built-in
assembler and linker. LTspice is unique
in implementing a self-authoring, selfassembling and self-linking sparse matrix
solver. The method performs remarkably better than any other technique.
integration missed. A mask revision
cycle—at considerable expense in time and
treasure—is required to remove the instability to try to achieve initial functionality.
In principle, Gear integration error could
be reduced by having the IC designer
stipulate a small maximum time step. But
this is not a viable solution because (1)
small time steps slow simulation speed to
a crawl and (2) there’s no way to ensure
that the time step is small enough anyway.
IMPLICIT INTEGRATION
Analog circuit simulation requires numerical integration of differential equations
to track the behavior of the capacitances and inductances. This is where
one sees some of the largest differences
between one SPICE implementation and
another: the method(s) available for
integrating the differential equations.
Numerical integration involves error.
Analog circuit simulation entails integrating the behavior of many time constants.
The nature of integrating differential equations that have solutions that look like
exp(-const*time) is that the errors will in
fact add up to infinity unless a numerical
method called implicit integration is used.5
Without implicit integration, transient
analysis would not be possible in SPICE.
SPICE uses second order integration. Most
SPICE implementations follow Berkeley
SPICE and provide two forms of second
order implicit integration: Gear and trapezoidal (trap).6 Trap integration is both
faster and more accurate than Gear. But
trap integration can give rise to a numerical artifact where the integrated discrete
time step solution oscillates time step to
time step about the true continuous-time
12 | January 2015 : LT Journal of Analog Innovation
Figure 2. Simple circuit with solution known by
inspection
behavior. This can cause the user to
be suspicious of the correctness of the
simulator even though each trapezoid
contains the correct integrated area.
Trap ringing has been feared to be so
unacceptable to analog circuit designers 7 that trap integration has been
eliminated from one commercial
SPICE implementation, PSpice, leaving
the slower and less accurate Gear integration as the only available option.
But Gear integration doesn’t just dampen
numerical ringing, it dampens all ringing,
even physical ringing, making it possible
for a circuit that malfunctions in real
life, due to an oscillation, to simulate as
perfectly stable and functional because
the instability was damped out of numerical existence. This has led to disastrous
situations where an IC design is simulated
in PSpice, laid out, and fabricated only
to find that the circuit doesn’t function
due to an instability that PSpice’s Gear
PSpice’s documentation states that it uses
a modified Gear method and does indeed
seem better at picking a small enough time
step to reduce the error than the Gear integration implementation in Berkeley SPICE.
But PSpice’s method often fails. It is
easy to compose a trivial circuit and see
the PSpice numerically integrated result
deviate dramatically from the true solution than can be found by inspection.
Consider Figure 2, which shows a parallel tank circuit with a parallel piecewise
linear current source. The current source
asserts a spike of current over the first
0.2ms and is zero thereafter. The solution
should be that the tank circuit resonance
is excited by the spike of current and
thereafter ring at constant amplitude.
The netlist of the circuit is given by
* Gear (PSpice) integration error
L1 N001 0 50m
I1 0 N001 PWL(0 0 .1m .1 .2m 0)
C1 N001 0 .1u
.tran 1 1 0 50u
.probe
.end
Figure 3 shows that PSpice’s modified Gear
integration artificially dampens the ringing, whereas LTspice immediately yields
design features
LTspice uses an integration method, modified trap, that has the speed and accuracy
of trap but without the ringing artifact. Modified trap is a method I invented some years
ago and was widely available first in LTspice. To the best of my knowledge, it is the best
means to integrate the differential equations of an analog circuit and is not duplicated
in any other SPICE program. It is the only method I recommend for circuit design.
Figure 3. PSpice (left), utilizing modified Gear numerical integration, incorrectly artificially dampens ringing in the circuit of Figure 2. LTspice (right) produces the correct
result.
the correct solution. The error in PSpice
can be reduced by stipulating a smaller
maximum time step (fourth number in
the .tran statement). This should be a
simple circuit for PSpice’s modified Gear
to figure out. But a circuit with many different time constants is basically impossible for PSpice to solve reliably without
the engineer manually inspecting how
the “solution” converges as one stipulates ever smaller maximum time steps.
Figure 3 shows PSpice Gear integration
clearly doesn’t correctly integrate the two
reactances of a trivial circuit with only
one node. The nature of the error of Gear
integration is to make circuits look more
stable in simulation than they actually are
in real life. To put the consequences of
this error in the perspective of a practical example, Figure 4 shows an audio
power amplifier that isn’t stable because
compensation capacitor C2 is too small.
PSpice incorrectly simulates this circuit as
stable, whereas LTspice gives the correct
result. The netlist used in each case is
* Unstable Power Amplifier
Q5 N001 N006 N007 0 Q3904
Q7 N001 N007 OUT 0 Q2219A
Q8 OUT N013 N014 0 Q2219A
Q6 N013 N012 OUT 0 Q3906
V1 N001 0 10
V2 N014 0 -10
R11 N012 N014 5K
R14 OUT 0 8
R9 N006 N008 2K
R10 N008 N012 1K
Q4 N006 N008 N012 0 Q3904
Q1 N005 N009 N011 0 Q3904
Q2 N002 N010 N011 0 Q3904
R3 N011 N014 1K
Q3 N006 N004 N003 0 Q3906
R6 N010 0 20K
R7 OUT N010 200K
V3 IN 0 pulse(0 .1 0
+ 5u 5u 50u 100u)
R8 N001 N003 100
R4 N004 N005 10K
C2 N006 N004 10p
R13 N013 N014 1K
R12 N007 OUT 1K
C3 N006 N012 .001u
Q9 N005 N002 N001 0 Q3906
Q10 N002 N002 N001 0 Q3906
R2 IN N009 9.09K
.tran 100u 100u
.model Q3904 NPN(Is=1E-14 Vaf=100
+ Bf=300 Ikf=0.4 Xtb=1.5
+ Br=4 Cjc=4p Cje=8p Rb=20 Rc=0.1
+ Re=0.1 Tr=250n Tf=.35n
+ Itf=1 Vtf=2 Xtf=3)
.model Q3906 PNP(Is=1E-14 Vaf=100
+ Bf=200 Ikf=0.4 Xtb=1.5
+ Br=4 Cjc=4.5p Cje=10p Rb=20
+ Rc=0.1 Re=0.1 Tr=250n
+ Tf=.35n Itf=1 Vtf=2 Xtf=3)
.model Q2219A NPN(Is=14.34f
+ Xti=3 Eg=1.11 Vaf=74.03
+ Bf=255.9 Ne=1.307 Ise=14.34f
+ Ikf=.2847 Xtb=1.5
+ Br=6.092 Nc=2 Isc=0 Ikr=0
+ Rc=1 Cjc=7.306p Mjc=.3416
+ Vjc=.75 Fc=.5 Cje=22.01p
+ Mje=.377 Vje=.75 Tr=46.91n
+ Tf=411.1p Itf=.6 Vtf=1.7
+ Xtf=3 Rb=10)
.probe
.end
January 2015 : LT Journal of Analog Innovation | 13
Figure 5 compares PSpice’s erroneously
stable result (left) with the correct, oscillating result from LTspice (right). The simulation is a large-signal transient analysis of
step response. If a small enough time step
is stipulated in the PSpice simulation, you
can force it to approach the correct solution, suggesting that PSpice is interpreting
the device equations of the transistors
correctly, PSpice just isn’t accurately
integrating the differential equations.
What is needed is a method with the
speed and accuracy of trap but without
the ringing artifact. To this quest, whereas
PSpice eliminated trap ringing by using
Gear integration but tries to pick a good
time step, another approach is to use a
de-tuned version of trap integration so
that it will damp trap ringing but only
introduce a hopefully acceptably small
error in the true circuit behavior. It is
actually possible, but not recommended,
to de-tune LTspice’s trap integration
with the undocumented option called
trapdamp, by adding the SPICE directive
.options trapdamp=.01
Figure 4. Unstable power amplifier
to your schematic. You might be able
to find a value of trapdamp that duplicates the integration behavior of HSPICE8.
Nevertheless, I do not recommend
using this option because it dampens
real circuit behavior and it isn’t necessary in LTspice, which uses a better
method of eliminating trap ringing.
LTspice uses an integration method, modified trap, that has the speed and accuracy
of trap but without the ringing artifact.
Modified trap is a method I invented some
years ago and was widely available first in
LTspice. To the best of my knowledge, it is
the best means to integrate the differential
equations of an analog circuit and is not
duplicated in any other SPICE program.
It is the only method I recommend for
circuit design. LTspice does also support
the use of the other known methods,
Figure 5. Simulated output from an unstable power amplifier in the face of a large signal transient. PSpice (left) incorrectly indicates the circuit as stable, while LTspice
(right) correctly reveals the instability.
14 | January 2015 : LT Journal of Analog Innovation
design features
trap and Gear, but simply so that a user
can duplicate the erroneous results from
other SPICE simulators to verify that the
models are interpreted the same and only
the integration method is different.
Modified trap is used by LTspice to
produce Figure 3. Note that there is no
change in ringing amplitude even after it
rings for thousands of cycles. This demonstrates that LTspice modified trap does
not introduce artificial numerical damping.
Modified trap is also used by LTspice to
produce Figure 5, where LTspice correctly exposes the amplifier’s instablity.
To demonstrate the ability of LTspice
modified trap to eliminate trap ringing,
we need a circuit that is prone to trap
ringing. Trap ringing is initiated when
discrete time step second order integration has trouble representing the exact
continuous-time circuit behavior. It can be
reduced or eliminated with judicious use
of time step and integration order control.
Since LTspice has been the most popular
SPICE program for the last ten years,9 it
has seen a lot of circuits and there is a lot
Figure 6. Circuit prone to trap ringing
of knowledge libraried into the solver to
avoid trap ringing, so one has to work a
little to find a counter example. Figure 6
shows a circuit that causes trap ringing
due to the highly nonlinear capacitance
of the gates of an unusually dimensioned MOSFET inverter. Trap ringing is
visible in the gate current drive, I(V1).
Figure 7 compares trap integration to
LTspice modified trap. The top plot shows
a zoomed in region of the bottom plot
to clearly show the ringing. If you would
like to reproduce this result in LTspice,
go to the SPICE pane of the Control
Panel and select trapezoidal integration
instead of the default, modified trap.
The netlist for this simulation is:
* Trap Ringing Example
V2 N001 0 3.3
V1 N002 0 PULSE(0 3.3 1n 1u)
M1 OUT N002 N001 N001 P
M2 OUT N002 0 0 N
.tran 0 1.2u 0 .1n
.model N NMOS(Tox=20n Vto=.5
+ Gamma=.5 UO=650 Rs=10)
.model P PMOS(Tox=20n
+ Vto=-.5 Gamma=.5 UO=650
+ Rs=10)
.probe
.end
Figure 7. Trap vs LTspice modified trap integration applied to the circuit in Figure 6. Conventional trap integration (left) exhibits trap ringing while the ringing is
eliminated with LTspice modified trap (right).
January 2015 : LT Journal of Analog Innovation | 15
Figure 8. The trap ringing example circuit of Figure 6 run in PSpice (left) does not exhibit trap ringing, but produces other artifacts most likely due to an error in the
implementation of the Yang-Chatterjee charge model. LTspice (right) produces the correct result.
Note that most SPICE programs won’t
run this deck as intended because most
SPICE programs use the Meyer capacitance
model for this type of MOSFET. Because the
Meyer capacitance model doesn’t conserve
charge and is inaccurate for short channels, it fell into obsolescence in the 1990s.
Both LTspice and PSpice have replaced
the Meyer capacitance model with the
Yang-Chatterjee charge model. Since both
simulators use the same updated charge
storage equations, they should give the
same results. But when we compare the
PSpice simulation to LTspice, as shown
in Figure 8, PSpice shows remarkably
erroneous results. The oscillations visible
in the PSpice simulation, though, are not
trap ringing because the oscillation isn’t
from time step to time step and PSpice
doesn’t use trap. This artifact is almost
certainly due to an error in differentiating the Yang-Chatterjee charge equations
to capacitances in the PSpice YangChatterjee charge model implementation.
SUMMARY
LTspice was not the first SPICE implementation, nor is it the only free SPICE,
but it is the best and most widely
used SPICE implementation.
Newton iteration, sparse matrix methods, and implicit integration are the
core numerical methods of SPICE.
The simulator’s robustness, speed
and integrity hinge on how well
these methods are implemented.
In the end, a SPICE simulator needs to earn
designers’ confidence that it can correctly
solve for circuit behavior. This is impossible if the solver doesn’t perform the
core numerical methods correctly. LTspice
performs these methods correctly and better than any other SPICE implementation. n
Notes
1 Otherwise
the solution of the linear system is used as an
iteration step: The original nonlinear circuit is re-expanded as a new Taylor series about this solution, again
keeping only the first two terms, and then solving the
resultant system of simultaneous linear equations. The
process repeats until the proof that the correct solution
has been found is successful.
2 PSpice
is a Cadence trademark. Version 9.2 was used
for the screen shots.
3 The
16 | January 2015 : LT Journal of Analog Innovation
sparser the matrix, the more closely it can be written
as a diagonal, i.e. solved, matrix. Since analog circuit
matrices are so sparse, improving LU factorization with
SuperLU does not give as much speed advantage as
one might hope.
4 Eliminating
the unknowns of a matrix involves mostly addition, subtraction and multiplication. These instructions
cost only three latent clock cycles. (There are also some
divisions which cost much more than three clocks, but
there’s only one division per unknown to be eliminated.)
Fetching data that is only known by the address of the
address of the base address off which one indexes takes
much longer than three clock cycles.
5 Literature
on this points out the numerical solution is not
singular if a small enough time step is guaranteed, but in
practice, an approach with explicit integration and limited
time step size doesn’t work unless you can numerically
integrate with infinite precision. The error doesn’t add up
to infinity because of round off error but because of approximating the derivative with sampled finite differences.
There are no successful general analog circuit simulators
that use explicit integration.
6 SPICE
occasionally drops to first order integration, e.g.,
if an event with a known discontinuous first order time
derivative occurs, such as at the transition between two
straight line segments of a piecewise linear or pulse
function of an independent voltage or current source,
most SPICE implementations drop to first order integration for that circuit’s reactances at the transition. The first
order version of Gear and trap are both backward Euler.
7 Some
users are predisposed to be suspicious of SPICE
because of popular literature denigrating the value of
SPICE simulation.
8 HSPICE
9 LTspice
is a Synopsis trademark.
is downloaded four times per minute and is the
topic of the largest users’ group of any simulator. Using
distribution and use figures of other SPICE implementations based on private communication with representatives from the respective companies that sell those
other SPICE programs, LTspice is distributed and used
three orders of magnitude more than any other SPICE
program.
design features
1.4GHz Low Jitter PLL with Clock Distribution Solves Difficult
Clocking Problems: Multi-Clock Synchronization and Data
Converter Clocking
Chris Pearson
Two of the more difficult challenges facing clock system designers are synchronizing
multiple system clocks and creating low jitter data converter clocks. The LTC6950
overcomes these challenges by featuring Linear Technology’s easy-to-use EZSync™
technology and providing five clock outputs with less than 100fs RMS additive jitter.
Other multi-clock synchronization solutions involve aligning the edges of two or
more high speed input signals within an
extremely precise time window, sometimes within a couple nanoseconds. Such
devices, hinting at the unreliability of this
synchronization method, often include a
SYNCRESULT pin to indicate whether the
synchronization passed or failed, requiring a retry. The elegance of EZSync is it
eliminates the need for precision alignment of any high speed input signals,
while assuring consistent edge alignment
of all outputs on one or multiple EZSync
clock devices. With EZSync, synchronizing multiple devices, multiple boards
and even multiple system level clock
edges is as easy as pressing a button.
The LTC6950 produces five low jitter,
high slew rate differential clocks. These
clock characteristics allow designers to clock multiple high speed data
converters directly, without the typical
additional expense of onboard clock
filtering and clock shaping components.
The LTC6950 simplifies overall system
design and cost compared to traditional
data converter clock architectures.
and DACs directly with the LTC6950.
Finally, a complete LTC6950 design
example shows exactly how easy it is
to design a typical LTC6950 application
using Linear’s ClockWizard™ tool.
The PLL section works in conjunction with the external reference and
external VCO to generate a desired
VCO frequency (fVCO) as follows:
LTC6950 OVERVIEW
where fREF is the reference input frequency,
R is the reference input divide value and
N is the VCO feedback divide value. fVCO is
fed into the clock distribution section.
The block diagram in Figure 1 shows
how the LTC6950 is divided into three
main circuit blocks: the phase-locked
loop (PLL) section, the clock distribution
section and the digital control section.
(1)
The clock distribution section receives a
signal at fVCO and distributes this signal
Figure 1. LTC6950 block diagram
V+
REF+
REF–
R DIVIDER
N DIVIDER
PHASE-LOCKED
LOOP (PLL)
VCP+
PHASE
FREQUENCY
DETECTOR
CHARGE
PUMP
LTC6950
CP
VCO+
VCO–
SYNC
SYNC
CONTROL
STAT2
DIGITAL
CONTROL
STAT1
SDO
SDI
The first part of this article summarizes
the LTC6950’s features and how it works.
The second part covers the LTC6950’s
EZSync functionality. The third part
describes the benefits of clocking ADCs
fVCO = fREF • N/R
SERIAL
PORT
SCLK
CS
DELAY
0 TO 63
DIVIDE
1 TO 63
DELAY
0 TO 63
DIVIDE
1 TO 63
DELAY
0 TO 63
DIVIDE
1 TO 63
DELAY
0 TO 63
DIVIDE
1 TO 63
DELAY
0 TO 63
DIVIDE
1 TO 63
PECL0+
PECL0–
PECL1+
PECL1–
PECL2+
PECL2–
CLOCK
DISTRIBUTION
PECL3+
PECL3–
LV/CM+
LV/CM–
GND
January 2015 : LT Journal of Analog Innovation | 17
The LTC6950 is the first device to offer Linear Technology’s EZSync technology,
which simplifies aligning multiple clocks across multiple parts, boards and
systems. LTC6950 performance levels enable direct clocking of high performance
data converters, simplifying system design and reducing system cost.
to five separate channels. Each of the
five channels has the independent ability to delay the first synchronized clock
edge by 0 to 63 VCO clock cycles and to
divide fVCO by any integer from 1 to 63.
The output signals from the dividers
are sent to a buffer that determines the
output signal type. Four channels produce an extremely low noise differential
LVPECL clock signal capable of output
frequencies up to 1.4GHz. The fifth channel creates a configurable differential
LVDS output or a pair of CMOS outputs.
The LVDS output can produce clock
STANDALONE MODE
(SYNCMD = 1)
Figure 2. EZSync STANDALONE mode
LV/CM+
LV/CM–
VCO–
CP
LTC6950
≥1ms
SYNC
frequencies up to 800MHz , while the
CMOS output is limited to 250MHz.
The third and final section is the digital control section. The box labeled
SET TO
FOLLOWER-SYNCHRONOUS MODE
(FLDRVx = 0)
LV/CM+
LV/CM–
LOOP FILTER
VCO+
VCO–
PECL0+
PECL0–
PECL1+
PECL1–
CP
PECL2+
PECL2–
≥1ms
SYNC
PECL3+
PECL3–
FOLLOW MODE
(SYNCMD = 2, PDPLL = 1)
LTC6950
SET PECL3 TO
FOLLOWER-DRIVER MODE
(FLDRV3 = 1)
LV/CM+
LV/CM–
VCO+
SYNC PULSE SKEW
BETWEEN SYNC PINS
MUST BE < 10µs
VCO+ AND VCO– FOR
DEVICE IN FOLLOW MODE
MUST BE DC COUPLED
VCO–
PECL0+
PECL0–
PECL1+
PECL1–
PECL2+
PECL2–
SYNC
18 | January 2015 : LT Journal of Analog Innovation
LTC6950
PECL1+
PECL1–
ALIGNS ALL 5
CLOCK EDGES
(WHEN ALL SYNC_ENx BITS = 1)
PECL2+
PECL2–
Figure 3. EZSync FOLLOW mode and CONTROL mode using follower-driver and follower-synchronous
outputs
CONTROL MODE
(SYNCMD = 0)
PECL0+
PECL0–
VCO+
LOOP FILTER
PECL3+
PECL3–
ALIGNS ALL 9
CLOCK EDGES
(WHEN ALL SYNC_ENx BITS = 1)
PECL3+
PECL3–
SYNC CONTROL in Figure 1 is the EZSync
control circuitry—functionality described
in detail below. The digital control
section includes a standard 4-wire
serial interface and two pins to monitor the status of certain register bits.
EZSync GUARANTEES MULTI-CLOCK
SYNCHRONIZATION
As mentioned, synchronizing multiple
high speed clocking devices is traditionally difficult due to tight timing constraints and unreliable architectures. In
contrast, EZSync guarantees clock synchronization and has relaxed the timing
constraints. EZSync functionality is best
described visually, as shown in Figures
2, 3 and 4. EZSync has three modes:
STANDALONE (Figure 2), CONTROL (Figures
3 and 4), and FOLLOW (Figures 3 and 4).
STANDALONE mode synchronizes the five
LTC6950 clock outputs after a 1ms high
pulse is applied to the LTC6950 SYNC pin,
as shown in Figure 2. Once the SYNC pin
goes high, all Sync Enabled clock outputs
are held at a logic low once they transition
to that state. After the SYNC pin is returned
low, all Sync Enabled clock outputs
design features
Linear Technology’s ClockWizard tool includes a
Scope Plot simulation tool that allows the user to
quickly predict the output delay response in the
STANDALONE, FOLLOW or CONTROL modes.
resume clocking synchronously. The
designer can also chose to disable synchronization on a per output basis by setting
the output’s SYNC_ENx register bit to a
logic low. These outputs will not be disturbed during a synchronization operation.
CONTROL and FOLLOW modes are used in
tandem when a LTC6950 clock output is
connected to the VCO input of another
EZSync device, as illustrated in Figures
3 and 4. Figures 3 and 4 introduce
some new terminology: CONTROLLER,
FOLLOWER, follower-driver and follower-synchronous, defined below:
In Figure 4, the EZSync CONTROLLER and
FOLLOWER architecture synchronizes 20
FOLLOWER outputs and one followersynchronous output after applying a 1ms
high pulse to all five LTC6950 SYNC pins.
Compared to the STANDALONE architecture, the CONTROLLER and FOLLOWER architecture has an additional modest timing
requirement that the max skew between
all SYNC signals is < 10µs. The outputs are
held in a logic low state during the time
the SYNC pin is set to a logic high value
• CONTROLLER: EZSync device set
CONTROL MODE
(SYNCMD = 0)
to CONTROL mode. A device in
CONTROL mode controls the timing
for all other EZSync devices.
LTC6950
LV/CM+
LV/CM–
• FOLLOWER: EZSync device set to
FOLLOW mode. The clock input of a
FOLLOWER has a DC coupled connection
from a clock output of the CONTROLLER.
LOOP FILTER
VCO+
VCO–
CP
PECL1+
PECL1–
PECL2+
PECL2–
• Follower-Driver: CONTROLLER’s clock output
that is connected to a FOLLOWER’s
clock input. DC coupling is required
between the CONTROLLER output
and FOLLOWER input.
PECL0+
PECL0–
PECL3+
≥1ms
SYNC
PECL3–
SET PECLx TO
FOLLOWER-DRIVER MODE
(FLDRVx = 1)
• Follower-Synchronous: CONTROLLER’s
clock output that is synchronized to
its FOLLOWER devices’ clock outputs.
In Figure 3, the EZSync CONTROLLER and
FOLLOWER architecture synchronizes
the four follower-synchronous outputs of the CONTROLLER and the five
FOLLOWER outputs after applying a 1ms
high pulse to both LTC6950 SYNC pins.
and for a few additional VCO cycles after
the SYNC pin is returned to a logic low. The
user can choose to disable synchronization on any output by setting the appropriate SYNC_ENx register bit to a logic
low. These outputs will not be disturbed
during a synchronization operation.
MAKING EZSync EASIER
While applying a 1ms high pulse to the
LTC6950’s SYNC pin is easy, it does require
some familiarity with the EZSync specification to predict how the outputs will
SET LV/CM OUTPUTS TO
FOLLOWER-SYNCHRONOUS MODE
(FLDRV4 = 0)
FOLLOW MODE
(SYNCMD = 2, PDPLL = 1)
VCO+
VCO–
LTC6950
SYNC
VCO+
VCO–
LTC6950
SYNC
ALIGNS ALL 21
CLOCK EDGES
(WHEN ALL SYNC_ENx BITS = 1)
VCO+
VCO–
SYNC PULSE SKEW
BETWEEN ANY TWO
SYNC PINS
MUST BE < 10µs
LTC6950
SYNC
VCO+ AND VCO– FOR
DEVICES IN FOLLOW MODE
MUST BE DC COUPLED
VCO+
VCO–
LTC6950
Figure 4. EZSync FOLLOW mode and CONTROL
mode using follower-driver and followersynchronous outputs
SYNC
January 2015 : LT Journal of Analog Innovation | 19
1. Select Loop Design
2. Select Sync
3. Set to STANDALONE
4. Set each output to Synchronized
and to 0 Output Delay
5. Select Scope Plot
6. Click Plot
Figure 5. Simulating the LTC6950’s output frequencies and output delays in STANDALONE mode using ClockWizard
respond after the LTC6950 SYNC pins
are returned to a logic low state. Linear
Technology’s ClockWizard tool includes
a Scope Plot simulation tool that allows
the user to quickly predict the output
delay response in the STANDALONE,
FOLLOW or CONTROL modes. Figures
5 and 6 demonstrate ClockWizard’s
Scope Plot simulation capability.
DIRECT CLOCKING HIGH SPEED
CONVERTERS WITH THE LTC6950
For high performance clocks, high speed
ADCs are the de facto benchmark, due to
their industry leading clock jitter requirements. There is a tremendous amount of
literature that discusses requirements and
recommendations for clocking high speed
ADCs, but all can be summarized with
the following statement: ADCs require a
really low phase noise/jitter clock to meet
signal to noise ratio (SNR) targets, and it is
recommended that the ADC input clock is a
differential clock and has fast clock edges.
Historically, these high speed ADC clocking requirements have been attainable, but
only at high cost. This section shows the
value of the LTC6950’s ability to directly
clock high speed ADCs, especially in
regards to simplicity and performance.
ADC documents often start out with
the following two equations.
JITTER TOTAL =
=
Figure 6. ClockWizard’s Scope Plot tool shows simulated results of LTC6950 CONTROL mode
5 CLOCKS
2
(JITTERCLK _IN ) + (JITTER APERTURE ) 2
SNR ADC = 20 • LOG
1
2πfIN • JITTER TOTAL
(2)
(3)
where fIN = ADC analog input frequency
Equation 2 reminds the user the clock
circuitry internal to the ADC also has
jitter, known as aperture jitter. Most
ADC data sheets provide a typical
aperture jitter number for use with
Equation 2. Equation 2 then states the
20 | January 2015 : LT Journal of Analog Innovation
design features
108
90
84
78
72
66
60
54
ADC aperture jitter and the clock jitter at the input of the ADC add together
in a square root of the sum of squares
fashion to produce a total clock jitter.
Equation 3 relates total clock jitter to
the ADC SNR performance. This equation
is often best visualized by Figure 7. The
main point to remember from Equation 3
is as the ADC input frequencies and
SNR levels increase, the total clock jitter requirements become more stringent.
It is worth clarifying that Equation 3
is dependent on the ADC’s analog input
frequency, not the clock frequency.
–40
–60
“All things are difficult
before they are easy.”
—Thomas Fuller
–80
–100
–120
–140
48
10
100
1000
FREQUENCY OF FULL-SCALE INPUT SIGNAL (MHz)
Figure 7. Graphical representation of Equation 3
fCLOCK = 250Msps
fIN = 61.44MHz
SNR = 76dBc
AIN = −2.3dBFS
SAMPLES =8192
–20
AMPLITUDE (dBFS)
10fs
20fs
50fs
100fs
200fs
500fs
1ps
2ps
5ps
10ps
20ps
50ps
96
SNR (dB)
0
TOTAL CLOCK
JITTER (RMS)
102
0
25
50
75
FREQUENCY (MHz)
100
Figure 8. LTC6950 direct ADC clocking performance
The LTC6950 achieves <100fs RMS jitter.
Figure 8 is an SNR plot using the LTC2107
16-bit ADC at a fIN = 61.44MHz (see
Figure 8). Traditionally, to achieve this
level of SNR performance from the ADC,
additional onboard circuitry was needed
to condition the clock signal. For example,
in Figure 9, a single channel of a traditional ADC clock architecture is compared to a LTC6950 direct ADC clocking
architecture. A single LTC6950 has four
differential PECL channels that can drive
four ADC clocks simultaneously. To drive
four ADC clocks, the traditional clock
architecture would repeat four times.
As a result, the LTC6950 reduces design
complexity, saves board space and lowers
the cost of the overall board design.
LTC6950 DESIGN AND SIMULATION
EXAMPLE
ClockWizard is a tool that greatly simplifies the clock system design process.
In addition to being able to read and
write to the LTC6950’s SPI registers, the
ClockWizard includes a PLL loop filter
design tool, a clock output divider/
delay configuration tool, a phase noise
simulation tool and a clock output timing simulation tool. A typical design for
the LTC6950 utilizes the four differential
PECL outputs to clock four data converters and the remaining LVDS/CMOS output to clock an FPGA. The following
example highlights the ClockWizard
design and simulation capabilities when
designing a typical application circuit.
Designing the PLL
Figure 9. Advantages of direct ADC clocking with the LTC6950
TRADITIONAL ADC CLOCK ARCHITECTURE
Clock Source
Does not meet ADC
phase noise/jitter
requirements
Narrow Bandpass Filter
Improves clock phase
noise/jitter, outputs lower
amplitude sine wave
CLOCK
SOURCE
Transformer
• Single ended to
differential conversion
• Step-up transformer for
additional amplitude,
increases sine wave slew rate
Amplitude Limiting Diodes
Increases in sine wave
amplitude can damage ADC
CLK+
ADC
Optional Pre-Gain LNA
For additional amplitude,
increases sine wave slew
rate after filter
CLK–
LTC6950 ADC CLOCK ARCHITECTURE
PECLx+
LTC6950
PECLx–
Download ClockWizard at
www.linear.com/ClockWizard and install.
The design presented here assumes use
of the onboard VCO and reference that
arrive installed on the LTC6950’s demonstration circuit DC1795A. The values
for these onboard components are
pre-programmed into the ClockWizard
under the VCO Params, VCO Noise and
Ref Noise tabs shown in Figure 11. Using
ClockWizard, enter the design goals
and components required to complete
the design, as shown in Figure 11.
CLK+
ADC
CLK–
January 2015 : LT Journal of Analog Innovation | 21
1µF
0.1µF
100MHz
REF
OSC*
49.9Ω
0.1µF
Figure 10. LTC6950 typical application
R DIVIDER
N DIVIDER
49.9Ω
49.9Ω
1µF
5V
VCP+
V+
REF+
REF–
3.3V
PHASE
FREQUENCY
DETECTOR
CHARGE
PUMP
1GHz VCSO
CRYSTEK
CVCSO-914-1000
LTC6950
CP
56nF
196Ω 150Ω
660nF
VCO+
0.1µF
VCO–
SYNC
SYNC
CONTROL
STAT2
STAT1
TO/FROM
PROCESSOR
SDO
SDI
SERIAL
PORT
SCLK
CS
DELAY
0 TO 63
DIVIDE
1 TO 63
DELAY
0 TO 63
DIVIDE
1 TO 63
DELAY
0 TO 63
DIVIDE
1 TO 63
DELAY
0 TO 63
DIVIDE
1 TO 63
DELAY
0 TO 63
DIVIDE
1 TO 63
PECL0–
PECL2+
PECL2–
PECL3–
LV/CM+
LV/CM–
2.Enter reference frequency
3.Enter desired PFD frequency
4.Enter VCO frequency
5.Enter clock frequencies for each of the five clock outputs
6.Click Compute Params
7.Click Design Filter—Filter 1
8.Update component values with the practical component
values shown
9.Choose Copy Loop to System from the Options menu. (This
updates the System and Register Tab with the correct Serial
Interface Values. If a demo board is connected, its serial
interface registers are also updated.)
22 | January 2015 : LT Journal of Analog Innovation
150Ω
0.01µF
0.01µF
49.9Ω
0.01µF
TO
ADC OR
DAC
PECL3+
*CRYSTEK CCHD-575-25-100.000
1.Select Loop Design
49.9Ω
PECL1+
GND
Figure 11. ClockWizard LTC6950 loop filter design
49.9Ω
PECL0+
PECL1–
37.4Ω
TO FPGA
design features
Simulating and Building the PLL
Evaluating the PLL
CONCLUSION
As shown in Figure 11, replace the filter
components determined by ClockWizard
with the nearest standard component values. In Figure 12, ClockWizard predicts the
phase noise of the LTC6950 and the new
loop filter for any of the five clock outputs
selected in the noise plot. This plot shows
how the VCO and reference phase noise
affects the total noise, helping the designer
choose the VCO and reference components.
Once the output phase noise simulation
meets the design goals, install the simulated loop filter values onto the DC1795A.
At this point the LTC6950 can be
powered up and evaluated using
the DC1795A. Download the
DC1795A demonstration circuit manual at
linear.com/product/LTC6950#demoboards
and follow the power up instructions under the quick start procedure.
Verify the output of this example by
connecting one of the PECL outputs
of the DC1795A to a signal source
analyzer, such as Agilent’s E5052.
Figure 13 shows the measured result,
which aligns closely with ClockWizard’s
simulated results in Figure 12.
The LTC6950 is the first device to offer
Linear Technology’s EZSync technology,
which simplifies aligning multiple clocks
across multiple parts, boards and systems.
The LTC6950 performance levels enable
direct clocking of high performance data
converters, simplifying system design and
reducing overall system cost. To further
simplify the design process, ClockWizard
was developed to design the loop filter,
simulate phase noise and simulate clock
output timing and cycle delays. n
Figure 12. Simulating the LTC6950 loop filter performance using ClockWizard
1.Select Noise Plot
2.Select desired Plot option
3.Select outputs to plot
4.Click Plot
5.View results
–100
RMS JITTER= 73fs
(INTEGRATE 100Hz to 40MHz)
fVCO = 1000MHz
fPFD = 100MHz
MO[5:0] = 8
LOOP BW = 4.2kHz
PHASE NOISE (dBc/Hz)
–110
–120
–130
–140
–150
–160
–170
100
Figure 13. LTC6950 PECL0+ measured result at 125MHz
1k
10k
100k
1M
OFFSET FREQUENCY (Hz)
10M 40M
January 2015 : LT Journal of Analog Innovation | 23
1.5A Monolithic Buck-Boost DC/DC Converter with
Up to 95% Efficiency Features 2.5V–15V Input and Output
Voltage Ranges
Richard Cook
Multicell high capacity batteries are increasingly becoming
commonplace in handheld devices and industrial
instruments that receive their power from a variety of
sources. To maximize battery run time and support the
variety of power sources, voltage regulators in multipower
source systems must be able to maintain a constant output
voltage even as the input voltage source resides above,
below or equal to the output. This can be accomplished
using two separate power converters with two controller
ICs. A better solution is to use a single buck-boost DC/DC
converter, which offers a smaller, simpler and more efficient
design, attributes critically important in handheld devices.
The LTC3111 is a monolithic buckboost converter with input and output
voltage ranges of 2.5V to 15V and an
output current capability of 1.5A. It
allows conversion from a variety of
power sources such as single or multi
Li-ion cells, lead acid batteries, capacitor banks, USB cables or wall adapters.
architecture, effectively eliminating jitter
and EMI that can occur when crossing the
boundary between step-up and step-down
operation. This reduces or eliminates the
need for expensive filtering or shielding
for noise sensitive data conversion or
RF circuitry in the system. Selectable Burst
Mode® operation extends the operating time when battery-powered devices
are in idle by substantially reducing the
quiescent current of the power converter.
In addition to its wide operating range, the
LTC3111 features Linear Technology’s proprietary low noise buck-boost PWM control
Figure 2. One, two and three Li-ion cells can be used in this solution with the LTC3111’s accurate RUN
threshold feature
4.7µH
0.1µF
VIN
3V TO 12.6V
1 TO 3-CELL
Li-Ion
+
NUMBER
R
OF CELLS
274k
1
698k
2
3
1.13M
SW1
SW2
BST1
BST2
VIN
VOUT
10µF
LTC3111
0.1µF
680pF
COMP
BURST PWM
R
154k
24 | January 2015 : LT Journal of Analog Innovation
PWM/SYNC
RUN
SNSGND
SGND
26.1k
1M
33pF
27pF
FB
VCC
PGND
191k
1µF
20k
VOUT
5V
750mA
22µF VIN > 4V
Figure 1. LTC3111-based 18W solution
An accurate run threshold provides
the ability to precisely program the
turn‑on threshold voltage of the converter. The integrated fault protection
features include: current limit, thermal
shutdown and short-circuit protection, which provides robust operation
in harsh environments. For applications where component size is critical,
the 800kHz default switching frequency
can be synchronized up to 1.5MHz.
The LTC3111 based converter shown in
Figure 1 can generate 18W of power with
a 12V output. The solution footprint is
less than 180mm2 , more compact than a
controller-based buck-boost and much
more efficient than a complex dual-inductor SEPIC converter design at similar power
levels. The main external components are
limited to the input, output filter capacitors and the power inductor. The LTC3111
design features
In addition to its wide operating range, the LTC3111 features Linear Technology’s
proprietary low noise buck-boost PWM control architecture, effectively eliminating
jitter and EMI that can occur when crossing the boundary between step-up and
step-down operation. This reduces or eliminates the need for expensive filtering
or shielding for noise sensitive data conversion or RF circuitry in the system.
100
PWM
90 BURST MODE
OPERATION
80
TURN ON
THRESHOLD
3.3V
EFFICIENCY (%)
VOUT
1V/DIV
TURN OFF
THRESHOLD
3.0V
70
60
50
VIN
2V/DIV
VIN = 3.6V
VIN = 7.2V
VIN = 10.8V
40
30
0.1m
100ms/DIV
Figure 3. LTC3111 ramped input voltage response using the accurate run for
a single Li-ion solution
is offered in a thermally enhanced 16-lead
4mm × 3mm DFN or 16-lead MSOP package.
ACCURATE RUN THRESHOLD WITH
1-, 2- AND 3-CELL LI-ION
The LTC3111’s RUN pin can either be
used to enable/disable the converter via
digital select, or to set an accurate userprogrammable undervoltage lockout
(UVLO) threshold—by a resistive divider
from VIN to ground. The LTC3111’s
RUN threshold of 1.2V (±5% over temperature) allows customization of the
VIN
LTC4412
GATE
CTL
SENSE
GND
STAT
0.1
1 2
is greater than 3.3V and to turn off when
the input voltage drops below 3V.
This technique can be applied to two
or three series cell designs by changing
the value of R, as shown in the table for
Figure 2. The output voltage response to
a slowly ramped VIN for the single cell
case is shown in Figure 3. VOUT in the
single cell configuration turns on when
the input voltage reaches 3.3V and turns
off at 3V. Similarly, this plot can be scaled
for 2- and 3-cell cases, where turn-on/
Figure 2 shows an application circuit
where the accurate RUN pin threshold is
used to turn the LTC3111 converter on/
off when powered from a one, two or
three Li-ion cell battery. For the single cell
case, R is 267k, configuring the LTC3111
RUN pin to turn on when the input voltage
12V
ADAPTER
10m
ILOAD (A)
Figure 4. 5V output efficiency from one, two and three Li-ion cells
turn-on threshold voltage of the converter. Once enabled, 120mV of hysteresis
is introduced at the RUN pin, requiring
the source input voltage to drop 10%
before disabling power conversion.
Figure 5. LTC4412 PowerPath™
controller selects highest voltage input
to power the LTC3111 converter
1- OR 2-SERIES
Li-ION CELLS
1m
1N5819
4.7µH
0.1µF
SW1
SW2
BST1
BST2
VIN
VOUT
47µF
LTC3111
0.1µF
1200pF
COMP
BURST PWM
OFF ON
PWM/SYNC
1M
FB
VCC
PGND
VCC
20k
33pF
27pF
RUN
SGND
25.5k
22µF
VOUT
3.3V
1.2A
MBR0520L
316k
1µF
January 2015 : LT Journal of Analog Innovation | 25
The LTC3111 includes circuitry to minimize loop gain variation, resulting
in improved line transient response. Regulation for VOUT = 3.3V
remains within 50mV, or 1.5%, during a 20µs, 7.2V-to-12V, VIN rise
and fall transition with a 22µF output capacitor and 1A load.
100
EFFICIENCY (%)
80
VOUT
100mV/DIV
PWM
90
BURST MODE OPERATION
70
VIN
2V/DIV
60
50
40
30
0.1m
turn-off thresholds are 6.6V/6V and 9.9V/9V,
respectively. The accurate RUN feature
can also be applied to sources where
operation must be restricted to a minimum
input operating voltage such as a bank of
capacitors, lead acid or NiCd batteries.
Efficiency curves for the one, two and
three Li-ion cell designs operating at their
typical voltages are shown in Figure 4.
Peak efficiencies of greater than 90% are
achieved over all three battery voltages.
Note that the maximum load current
capability for a 5V output decreases
when the input voltage is less than 6V.
The LTC3111 data sheet provides performance curves showing maximum
output current capability versus input
voltage in PWM and Burst Mode operation for various output voltages to aid
in determining if the load can be supported over a specific input range.
VIN = 7.2V
VIN = 12V
1m
10m
ILOAD (A)
0.1
1 2
500µs/DIV
Figure 6. LTC3111 efficiency vs load current VOUT =
3.3V, VIN = 7.2V and 12V
Figure 7. Line response for VOUT = 3.3V, VIN stepped
from 7.2V to/from 12V
MULTIPLE INPUT SOURCES
Efficiency curves versus load current
for the 3.3V output, based on the two
input sources, are given in Figure 6.
Peak efficiencies of greater than 89%
are achieved. Selectable Burst Mode
operation with 49µ A of typical sleep
current extends high efficiency over
two decades of load current.
The wide operating range of the LTC3111
makes it easy to power devices from
multiple input sources. Figure 5 shows an
application where the LTC4412 PowerPath
controller (SOT-23 package) selects from
the higher of two input sources. The
LTC4412 maintains a 20mV forward voltage across the selected P-channel MOSFET,
keeping losses to a minimum. In this
circuit, the LTC4412 switches the input of
the LTC3111 to the greater of a 7.2V lithium
ion battery or 12V wall adapter.
4.7µH
0.1µF
VIN
5V
SW1
SW2
BST1
BST2
VIN
VOUT
10µF
LTC3111
0.1µF
2.5V < VOUT < 10V
680pF
COMP
VCC
PWM/SYNC
RUN
SNSGND
SGND
Figure 8. LTC3111 configured
as a variable output supply
26 | January 2015 : LT Journal of Analog Innovation
The LTC3111 includes circuitry to minimize loop gain variation, resulting in
improved line transient response. As
illustrated in Figure 7, VOUT regulation
is maintained within 50mV, or 1.5%,
26.1k
20k
R2
191k
0V < VCONTROL < 1.2V
VCONTROL
R3
162k
1µF
27pF
FB
VCC
PGND
1µF
VOUT
22µF
R1
1M
33pF
design features
The LTC3111 provides low noise buck-boost conversion for a variety of applications
requiring an extended input or output voltage range. The LTC3111’s ability to support heavy
loads makes it ideal for power hungry devices. Solution size and conversion efficiency benefit
from the 90mΩ internal N-channel MOSFET switches and thermally enhanced packages.
2.5
VOUT
2V/DIV
IOUT (A)
2
VCONTROL
500mV/DIV
1.5
1
0.5
5ms/DIV
0
VIN = 5V
INPUT CURRENT LIMIT = 2.3A
2
3
4
5
6
7
VOUT (V)
8
9
10
Figure 9. Variable output response using the
LTC3111
Figure 10. Maximum output current in PWM mode vs
output voltage for VIN = 5V
during the 20µs rise and fall transition with a 22µ F output capacitor and
1A load in stepdown operation.
Figure 9 shows the output voltage
response of a 0V to 1.2V ramped control
signal operating at 100Hz. The corresponding output voltage swings from
10V to 2.5V, providing an inverting gain of
6.2 from VCONTROL to VOUT. The low noise
PWM control provides low distortion and
high quality replication of the input signal.
VARIABLE OUTPUT VOLTAGE USING
THE LTC3111
For applications such as motor control,
lighting or power supply margin testing, the LTC3111 can be configured as
a variable voltage supply. This can be
accomplished in a number of ways.
Figure 8 shows one method: adding a
summing resistor between the FB pin
and a control voltage (VCONTROL).
The programmed output voltage can be
calculated using the following equation:
 R1  R1
VOUT = 0.8V 1+  + (0.8V − VCONTROL )
 R2  R3
where R1 is the resistor connected between
VOUT and FB, R2 is the resistor connected
from FB and ground and R3 is the resistor
connected from FB and VCONTROL .
When using the LTC3111 as a variable
output voltage regulator, the maximum
load current capability of the LTC3111
is reduced when VOUT > VIN (i.e., when
the part is in boost or step-up mode). As
Figure 10 shows, the maximum output
current capability is effectively reduced
by the step-up ratio of the converter.
For example, the output current capability when VOUT = 2VIN is roughly one
half the capability when VOUT = VIN . In
the example application above, a fixed
500m A load is applied to the output,
which the part is capable of supplying at
all output voltages. To ensure converter
stability, compensation values for this
application are determined at the highest boost ratio of VIN = 5V to VOUT = 10V.
SUMMARY
The LTC3111 provides low noise buckboost conversion for a variety of applications requiring an extended input or
output voltage range. The LTC3111’s
ability to efficiently support heavy load
currents makes it ideal for power hungry devices. Solution size and conversion
efficiency benefit from the 90mΩ internal
N-channel MOSFET switches and thermally
enhanced packages. Low quiescent current Burst Mode operation extends high
efficiency over several decades of load
current, enabling longer run times in
many battery powered applications. n
January 2015 : LT Journal of Analog Innovation | 27
Hundreds of Watts, 60V In or Out: Synchronous 4-Switch
Buck-Boost Converter is Easy to Parallel to Minimize
Temperature Rise
Keith Szolusha
The LT3790 is a 4-switch synchronous buck-boost
DC/DC converter that regulates both constant voltage
and constant current at up to 98.5% efficiency using
only a single inductor. It can deliver hundreds of watts
and features a 60V input and output rating, making it an
ideal DC/DC voltage regulator and battery charger when
both step-up and step-down conversion are needed.
A single LT3790 converter can deliver high
power due to its synchronous switching
topology, but eventually the switching
and/or conduction losses at higher power
can overwhelm a single converter with
excessive board heating. Although heat can
VIN
8V TO 56V
RIN
1.5mΩ
4.7µF
100V
×2
INTVCC
VIN
1µF
TG1
499k
M1
0.1µF
M4
M2
L1
10µH
M3
SWI
EN/UVLO
BG1
OVLO
INTVCC
LT3790
200k
4.7µF
50V
×2
BG2
SW2
TG2
ISP
ISN
FB
CTRL
CSS
33nF
1000pF
RT
RC
15k
CC
10nF
SGND
147k
200kHz
VOUT
24V
5A (12A*)
71.5k
1.37k
SNSN
SS SYNC VC
28 | January 2015 : LT Journal of Analog Innovation
ROUT
8mΩ
PGND
PWM
100k
COUT
220µF
35V
×2
RSENSE
2mΩ
ISMON
CLKOUT
PWMOUT
VREF
0.1µF
+
SNSP
SHORT
C/10
CCM
IVINMON
33nF
Figure 1. 120W, 24V, 5A output
buck-boost voltage regulator with
8V–56V input has up to 98.5%
efficiency and is easy to parallel.
CVCC
4.7µF
0.1µF
BST1
IVINP
100k
C1
47µF
80V
BST2
470nF
27.4k
+
D1 D2
IVINN
88.7k
The buck-boost converter shown in
Figure 1 regulates 24V with 0A–5A load
at up to 98.5% efficiency. It operates
from an input voltage range of 8V to
56V. Adjustable undervoltage and overvoltage lockout protect the circuit. It
has short-circuit protection and the
SHORT output flag indicates when there
is a short circuit on the output. It features DCM operation at light load for
lowest power consumption and reverse
current protection. The sense resistor
ROUT sets the output current limit during
be mitigated with bulked up heat sinks,
additional external gate drivers, and/or
forced airflow, it may be better to simply
tie together two or more converters in
parallel to spread the load. This is easy to
do with the LT3790 buck-boost regulator.
51Ω
499k
120W, 24V, 5A OUTPUT BUCK-BOOST
VOLTAGE REGULATOR
D1, D2: NXP BAT46WJ
L1: COILCRAFT SER2915L-103KL 10µH
M1, M2: INFINEON BSC100N06LS3 60Vds
M3, M4: INFINEON BSC032N04LS 40Vds
C1: NIPPON CHEMICON EMZA800ADA470MJAOG
COUT: SUNCON 35HVT220M ×2
*WITH VIN > 20V, CAN DELIVER 300W USING ROUT = 4mΩ, RC = 5k, CC = 22nF
3.83k
design features
Figure 3. Two LT3790 24V voltage regulators are easy
to parallel for double the output with limited discrete
component temperature rise.
VIN
8V TO
56V
1.5mΩ
499k
Figure 2. Single 24V, 5A converter shown in Figure 1
has a maximum of 20°C temp rise on any component
at 12V input (a) and 50°C at 9V input (b). Even at 8V
input (c), the hottest component reaches only 96.5°C
without forced airflow or heat sinking.
470nF
499k
IVINP
EN/UVLO
EN
51Ω
1µF
IVINN VIN INTVCC
27.4k
C/10
TG1
M1
SWI
SHORT
VREF
BG1
LT3790
PWM
M2
0.1µF
VOUT
24V
10A (25A*)
L1
10µH
ROUT1
8mΩ
M4
51Ω
M3
+
COUT1
220µF
35V
×2
+
COUT2
220µF
35V
×2
0.47µF
SNSP
2mΩ
100k
SNSN
PGND
SS
33nF
4.7µF
50V
×2
BST1
CTRL
VIN = 12V
VOUT = 24V
IOUT = 5A
SINGLE PCB
NO FORCED AIR
4.7µF
10V
D1 D2
0.1µF
200k
0.1µF
C1
47µF
80V
BST2
INTVCC1
SHORT
+
INTVCC1
CCM
OVLO
88.7k
4.7µF
100V
×2
BG2
IVINMON
CLKOUT
ISMON
SYNC
SW2
VC
(a)
1.37k
3.83k
147k
200kHz
5k
1000pF
SGND
RT
71.5k
TG2
ISP
ISN
FB
47nF
VIN
1.5mΩ
499k
VIN = 9V
VOUT = 24V
IOUT = 5A
SINGLE PCB
NO FORCED AIR
470nF
499k
IVINP
EN/UVLO
EN
51Ω
1µF
IVINN VIN INTVCC
27.4k
0.1µF
C/10
0.1µF
TG1
SHORT
VREF
BG1
LT3790
M6
0.1µF
L2
10µH
M8
M7
ROUT2
8mΩ
51Ω
0.47µF
SNSP
2mΩ
100k
33nF
M5
SWI
PWM
4.7µF
50V
×2
BST1
200k
SHORT
C2
47µF
80V
4.7µF
10V
D3 D4
BST2
INTVCC2
(b)
+
INTVCC2
CCM
OVLO
88.7k
4.7µF
100V
×2
SNSN
PGND
SS
BG2
1nF
VIN = 8V
VOUT = 24V
IOUT = 5A
SINGLE PCB
NO FORCED AIR
CTRL
IVINMON
ISMON
CLKOUT
SYNC
VC
470Ω
(c)
22nF
RT
SW2
TG2
ISP
ISN
FB
SGND
147k
200kHz
71.5k
14.0k
D1–D4: NXP BAT46WJ
3.83k
L1, L2: COILCRAFT SER2915L-103KL 10µH
M1, M2, M5, M6: INFINEON BSC100N06LS3 60Vds
M3, M4, M7, M8: INFINEON BSC032N04LS 40Vds
COUT1, COUT2: SUNCON 35HVT220M ×2
C1, C2: NIPPON CHEMICON EMZA800ADA470MJAOG
*25A FOR VIN > 20V AND ROUT1,2 =4mΩ
January 2015 : LT Journal of Analog Innovation | 29
The CLKOUT pin of the master can be directly tied to the SYNC input pin of the slave for
180° phase-interleaving of the two parallel converters. The 180° phase difference between
the converters reduces overall converter output ripple, instead of doubling it. If more than
two converters are connected in parallel, they can be synchronized to either operate
phase-shifted or in-phase with an external clock source, or daisy-chaining CLKOUT pins.
0.5
IL1(MASTER)
5A/DIV
IL2(SLAVE)
5A/DIV
IL1(MASTER)
2A/DIV
IL2(SLAVE)
2A/DIV
0.4
0.3
0.2
ISMON1
500mV/DIV
ISMON2
500mV/DIV
∆I (A)
0.1
ISMON1
500mV/DIV
ISMON2
500mV/DIV
0.0
–0.1
–0.2
–0.3
–0.4
VIN = 12V
VOUT = 24V
ILOAD = 10A
2µs/DIV
VIN = 24V
VOUT = 24V
ILOAD = 10A
2µs/DIV
–0.5
0
2
6
4
LOAD CURRENT (A)
8
10
Figure 4. Parallel converter inductor and output current matching
both a short-circuit and overload situations, making this a robust application.
The temperature rise of this 120W board
at 12V input is only 20°C on the hottest
component (a switching MOSFET) as shown
in Figure 2a. There is still margin for either
higher output power at 12V input, or the
same 120W from a lower VIN without
excessive component temperature rise—
note that higher output power requires a
correspondingly increased output current
limit. When operated down to 8V input
with 120W output, the components on
this standard 4-layer LT3790 PCB remain
below 97°C (at room temp) without
forced airflow or heat sinking. To deliver
significantly higher power with the same,
limited temperature rise and input voltage range, two or more LT3790 converters can easily be connected in parallel.
30 | January 2015 : LT Journal of Analog Innovation
PARALLEL CONVERTERS,
CONSTANT VOLTAGE MASTER,
CONSTANT CURRENT SLAVE
Ideally, paralleled switching converters
share the load equally throughout the
entire output range. The LT3790’s ability to
run in either constant voltage or constant
current operation allows one master converter to control the output voltage, while
its current monitor output (ISMON) tells
one or more slave converters how much
output current to regulate (CTRL input)
in order to match its own output level.
Current matching between multiple converters is nearly ideal using this technique.
The CLKOUT pin of the master can be
directly tied to the SYNC input pin of the
slave for 180° phase-interleaving of the
two parallel converters. The 180° phase
difference between the converters reduces
overall converter output ripple, instead of
doubling it. If more than two converters
are connected in parallel, they can be synchronized to either operate phase-shifted
or in-phase with an external clock
source, or daisy-chaining CLKOUT pins.
Figure 3 shows a 24V, 10A (or 25A under
certain conditions, see figure) voltage
regulator formed by running two
LT3790s in parallel. By using two parallel circuits, the maximum temperature
rise on any one discrete component is
only 20°C for the M3 and M7 MOSFETs
at 12V input and 50°C at 9V input.
The top converter (master) in Figure 3
regulates the 24V output voltage and commands the current level that is regulated
by the bottom (slave) converter. The
ISMON output of the master indicates
how much current the master is providing, and by connecting ISMON directly to
the CTRL input of the slave, the slave is
forced to follow the master. The LT3790
ISMON output level and CTRL input level
are identically mapped so that a direct
connection from one to the other is possible, and doing so forces the total output
current to be shared equally between the
design features
Ideally, paralleled switching converters share the load equally throughout the entire
output range. The LT3790’s ability to run in either constant voltage or constant
current operation allows one master converter to control the output voltage, while
its current monitor output (ISMON) tells one or more slave converters how much
output current to regulate (CTRL input) in order to match its own output level.
VOUT
1V/DIV
(AC COUPLED)
ISMON1
(MASTER)
500mV/DIV
ISMON1
(MASTER)
500mV/DIV
ISMON2
(SLAVE)
500mV/DIV
ISMON2
(SLAVE)
500mV/DIV
VIN = 12V
500µs/DIV
VOUT = 24V
ILOAD = 5A TO 10A
The constant current slave must have
its loop broken and signal injected in
the current loop feedback path instead
of the traditional voltage feedback
path since that is the feedback loop
in use during parallel operation. The
master bode plot in Figure 7 demonstrates the stability of the system.
500µs/DIV
VIN = 24V
VOUT = 24V
ILOAD = 5A TO 10A
CONCLUSION
The LT3790 synchronous buck-boost
controller delivers over 100W at up to
98.5% efficiency to a variety of loads,
and it is easy to parallel multiple converters for even higher power outputs. The
ability to control either output voltage
or current, combined with the levelmatching of the ISMON output amplifier
and the CTRL input amplifier, simplifies the connection of a master voltage
regulator and one or more slave current regulators. The result is high power
60V buck-boost regulation that can deliver
hundreds of watts at high efficiency. n
Figure 5. Parallel converter transient response evenly shares current
parallel converters, as shown in Figure 4.
Note that the output voltage of the slave is
set slightly higher (28V) so that the voltage
feedback loop of the slave is not in regulation, allowing it to follow the master.
demonstrates a properly compensated
converter and equally shared load current. Further analysis with the network
analyzer gives us the details of the separate
converters. The noise injection point and
measurement to generate control loop
bode plots is different for the constant
voltage regulator master and the constant
current regulator slave. Separately, each
loop can be measured by injecting the
LOOP ANALYSIS FOR STABILITY
Transient response and network analyzer
loop analysis can be used to measure
stability. A transient response of 50%
to 100% current, shown in Figure 5,
IOUT
ROUT1
+
+
100Ω
CH1
– +
CH2
–
CURRENT LOOP BODE PLOT
MEASUREMENT SETUP
FOR SLAVE
72.8k
IOUT
ROUT2
VOUT
+
COUT1
– CH1 +
NOISE
INJECT
ISP
– CH2 +
39Ω
VOUT
COUT2
NOISE
INJECT
60
180
50
150
40
120
30
90
PHASE
20
GAIN (dB)
VOLTAGE LOOP BODE PLOT
MEASUREMENT SETUP
FOR MASTER
30
0
3.83k
ISN
Figure 6. Loop response measurement of parallel converters
0
GAIN
–10
–30
–20
–60
–30
VIN = 18V
VOUT = 24V
ILOAD = 10A
–40
–50
FB
60
10
–60
PHASE (°)
VOUT
1V/DIV
(AC COUPLED)
perturbation signal and measuring the
loop response, as shown in Figure 6.
0.2
–90
–120
–150
PARALLEL
1
10
FREQUENCY (kHz)
50
–180
Figure 7. Bode plot shows measured results for parallel system.
January 2015 : LT Journal of Analog Innovation | 31
What’s New with LTspice IV?
Gabino Alonso
New Blog Video: “LTspice: SOAtherm
Tutorial” by Dan Eddleman
www.linear.com/solutions/5445
BLOG BY ENGINEERS, FOR
ENGINEERS
Check out the LTspice blog
(www.linear.com/solutions/LTspice)
for tech news, insider tips and interesting points of view regarding LTspice.
New Video: “LTspice: SOAtherm
Tutorial” by Dan Eddleman
www.linear.com/solutions/5445
This video shows how to use the new
SOAtherm models distributed with
LTspice. SOAtherm models can be used
to verify that the MOSFET maximum
die temperature is not exceeded, even
in the Spirito region, where allowable
current falls off exponentially at high
drain-to-source voltages. SOAtherm
reports the temperature of the hottest
point on the MOSFET die; SOAtherm
models do not influence the electrical
behavior of the circuit simulation.
What is LTspice IV?
LTspice® IV is a high performance SPICE
simulator, schematic capture and waveform
viewer designed to speed the process of power
supply design. LTspice IV adds enhancements
and models to SPICE, significantly reducing
simulation time compared to typical SPICE
simulators, allowing one to view waveforms for
most switching regulators in minutes compared
to hours for other SPICE simulators.
LTspice IV is available free from Linear
Technology at www.linear.com/LTspice. Included
in the download is a complete working version of
LTspice IV, macro models for Linear Technology’s
power products, over 200 op amp models, as
well as models for resistors, transistors and
MOSFETs.
32 | January 2015 : LT Journal of Analog Innovation
—Follow @LTspice at www.twitter.com/LTspice
—Like us at facebook.com/LTspice
SELECTED DEMO CIRCUITS
For a complete list of example simulations
utilizing Linear Technology’s devices,
please visit www.linear.com/democircuits.
Buck Regulators
• LT8302: Negative to negative buck
converter (−18 to −42V, −12V 1.8A)
www.linear.com/LT8302
• LT6110/LT3976: Buck regulator
with cable/wire voltage drop
compensation (5V–40V to 3.3V at
5A) www.linear.com/LT6110
• LTC3639: High efficiency, 150V synchro-
nous buck converter (4V–150V to 3.3V at
100m A) www.linear.com/LTC3639
• LTC3774: High efficiency 2-phase
buck converter with discrete
MOSFET drivers (7V–14V to 1.2V at
60A) www.linear.com/LTC3774
• LTC3838-1: High current, dual output
synchronous buck converter
(4.5V–14V to 1.5V & 1.2V at 20A)
www.linear.com/LTC3838-1
• LTC3869: high efficiency dual
V/1.2V buck converter using
DCR current sensing (4.5V–14V to 1.5V &
1.2V at 15A) www.linear.com/LTC3869
1.5
• LTM4634: Triple 5A /5A /4A µModule buck
regulator (4.8V–28V to 1.0V, 3.3V at 5A &
12.0V at 4A) www.linear.com/LTM4634
• LTM4639: High efficiency 20A µModule
buck regulator (2.4V–7V to 1.2V at
20A) www.linear.com/LTM4639
Boost Regulators
• LT3048-15: Low noise bias voltage
generator from single cell Li-ion
battery (2.7V–4.8V to 15V at 24m A)
www.linear.com/LT3048-15
• LTC3872: High efficiency 5V input,
24V output boost converter (3V–9.8V to
24V at 1A) www.linear.com/LTC3872
Buck-Boost Converter
• LT8302: Negative to positive buck-boost
converter (−4 to −42V VIN to 12V VOUT at
1.3A) www.linear.com/LT8302
Isolated Converters
• LT8310: 72W isolated nonsynchronous
forward converter with opto
feedback (36V–72V to 12V at 6A)
www.linear.com/LT8310
• LTM8058: Series-conntected low noise
isolated µModule regulators (5V–28V to
10V at 300m A) www.linear.com/LTM8058
SCAP Charger
• LTC3625: Solar powered SCAP charger
with MPPT www.linear.com/LTC3625
Hot Swap Controller
• LTC4226: Dual 12V, 7.6A dual ideal
diode and Hot Swap controller
www.linear.com/LTC4226
• LTC4232: 12V, 5A Hot Swap controller
with auto-retry www.linear.com/LTC4232
design ideas
VOLTAGE CONTROLLED SWITCHES
LTspice includes a large number of excellent FET models, but sometimes you need
to simulate a simple switch that opens and closes at specific times or under certain
conditions.
One classic application of voltage-controlled switches is simulating open-circuit and
short-circuit conditions. In the example shown, two switches simulate a short- and
open-circuit condition on an LED string.
To insert and configure a switch in LTspice… (This example is available in
LTspice at \LTspiceIV\examples\Educational\Vswitch.asc)
1.Insert the symbol for the voltage-controlled switch in your schematic (press F2 and
type “sw” in the search field of the symbol library).
2.Insert a SPICE directive (press S) and define the SW model’s parameters using this
example:
.model MYSW SW(Ron=1 Roff=1Meg Vt=.5 Vh=-.4)
where “MYSW” is the unique model name, Ron and Roff are the on and off
resistances and Vt and Vh are the trip and hysteresis voltages. The switch trips at
(Vt − Vh) and (Vt + Vh).
LTspice Help (press F1) contains more about the SW model parameters.
3.Assign the MYSW model to the switch symbol S1: right-click “SW” and enter the
unique model name, “MYSW”.
4.Control the switch with a voltage source connected to the positive terminal of the
switch and ground the negative terminal. In this example a PULSE function source
is used to generate a 0V–1V triangle waveform with a 1ms period.
Replace
Device Name
with Model
Name
Happy simulations!
Switch Model
Definition
Power User Tip
SELECT MODELS
To search the LTspice library for a particular device model, choose Component
from the Edit menu or press F2. LTspice
is updated often with new models, so be
sure to keep your installation of LTspice
current by choosing Sync Release from
the Tools menu. LTspice’s changelog.txt
file (in the root installation directory)
lists the LTspice revision history.
Buck Regulators
• LTC3637: 76V, 1A step-down regulator
www.linear.com/LTC3637
• LTM4639: Low VIN 20A DC/DC µModule
step-down regulator www.
linear.com/LTM4639
Boost Regulators
• LTC3124: 15V, 5A 2-phase synchronous
step-up DC/DC converter with output
disconnect www.linear.com/LTC3124
Buck-Boost Regulators
• LT3790: 60V synchronous 4-switch
buck-boost controller www.linear.
com/LT3790 www.linear.com/LT3790
Forward Controllers
• LT3752-1: Active clamp synchronous
forward controllers with
internal housekeeping controller
www.linear.com/LT3752
• LTC4054-4.2: Standalone linear Li-ion
battery charger with thermal regulation www.linear.com/LTC4054-4.2
• LTC4079: 60V, 250m A linear charger
with low quiescent current
www.linear.com/LTC4079
Precision Amplifiers
• LT6017: Quad 3.2MHz , 0.8V/µs low
power, Over-The-Top® precision
op amp www.linear.com/LT6017
• LTC6268/LTC6269: Single/dual 500MHz
ultralow bias current FET input op
amp www.linear.com/LTC6268
Battery Management/Chargers
High Speed Comparators
• LT8584: 2.5A monolithic active cell
• LTC6752: 280MHz , 2.9ns comparator
balancer with telemetry interface
www.linear.com/LT8584
family with rail-to-rail inputs and
CMOS outputs www.linear.com/LTC6752 n
January 2015 : LT Journal of Analog Innovation | 33
Analysis of Hot Swap Circuits with Foldback Current Limit
Vladimir Ostrerov and Josh Simonson
A reliable analog circuit guarantees proper operation within the parametric tolerances of the
active controlling IC and passive components. For a Hot Swap circuit to perform properly,
the minimum and maximum values of a number of parameters must be gathered from the
data sheets of all components. From these, the Hot Swap circuit’s behavior in the face
of various capacitive loads should be known. This article shows how critical capacitive
loads are calculated for Hot Swap circuits with foldback current limit characteristics.
OVERVIEW
For a Hot Swap circuit, as shown in
Figure 1, the critical parameters are
operating voltage (VOPER) maximum current limit (ILIMIT) timer period (T) and the
maximum output voltage slew rate (SO),
which happens when the Hot Swap circuit
starts to operate with no-load. These
parameters are selected initially based on
the load requirements, supply limitations
and MOSFET’s drain-source on-resistance
(RDS(ON)) and its safe operating area (SOA).
CLOAD =
ILIMIT • T
VOPER
For an R-C load it is easy to define a
surplus current, which is allowed for
the capacitive component of the load,
and select proper load capacitance.
current limit is constant (ILIMIT = constant).
The voltage VFIX is lower than VOPER .
The current limit value as a function of
the output voltage, shown in Figure 1b,
is expressed by three separate equations
for different output voltage levels:
There are two common problems
that require solutions when charging a load with a Hot Swap circuit:
ILOAD(VOUT ) = IINIT
•The maximum pure capacitive load
for a successful power-up transient.
ILOAD(VOUT ) = IINIT + • VOUT (t)
While slewing, the MOSFET acts as a source
follower so the maximum output voltage
slew rate, SO , is the same as the GATE pin
slew rate SG , and it is defined by the circuit
components (gate current divided by gate
to ground capacitance), and has a strong
influence on the power up transient. The
timer period, T, is the time allowed for
the Hot Swap circuit to operate in current limit mode before a fault is generated. A successful power-up transient
is one that does not generate a fault.
•The maximum capacitive load, which
can be added in parallel to a resistive
load, RL , for a successful power-up
transient.
I
I
where = LIMIT INIT
VFIX VINIT
The problem of proper operation over the
full variation of the circuit parameters is
relatively simple for a circuit with constant
current limit, ILIMIT. The relationship of
parameters of a purely capacitive load at
the constant current limit for time T is:
This current limit value persists until the
output voltage reaches VLIMIT (point A),
after which the current limit increases linearly, which occurs after the output voltage reaches VFIX (point B). After point B the
34 | January 2015 : LT Journal of Analog Innovation
A linear approximation of the foldback
characteristic is shown in Figure 1b. It is
used in all the following considerations.
The main points of this characteristic are:
•The operating voltage is VOPER .
•The initial current limit value, when the
output voltage 0 ≤ VOUT ≤ VINIT, is IINIT.
when
(1)
0 VOUT VINIT
when VINIT VOUT VFIX
(2)
ILOAD(VOUT ) = ILIMIT
when
(3)
VFIX VOUT VOPER
The value of the parameters marked on
Figure 1b, the timer period T value and the
slew rate SO are all known, with tolerance,
and used in the following solutions. For
some circuits, the slew rate SO is fast
enough that it has a negligible effect on
the inrush transient, and for others, it
is significant. The two loads above are
solved for these two cases of slew rate.
design ideas
Figure 1. (a) Major functional components of a
Hot Swap circuit and (b) linear approximation of
the foldback characteristic
(a)
(b)
RSENSE
Q1
CL
Hot Swap
CONTROLLER
Consider two critical capacitive loads:
CNO_FLT and CFLT. CNO_FLT is the maximum capacitive load with which the
circuit passes the power-up transient
without a fault for any possible combination of circuit parameters. CFLT is the
minimum capacitive load with which
the power-up transient is always unsuccessful, and a fault is generated. From
these, the capacitive load range can be
divided into three groups. The powerup transient is successful for capacitive
loads from zero to CNO_FLT. Power-up is
unsuccessful for loads larger than CFLT.
The power-up transient is unpredictable for loads from the CNO_FLT to CFLT.
The following Hot Swap circuit parameters can be initially defined with tolerance: VINIT, VFIX , IINIT, ILIMIT, T.
The function ILOAD (VOUT) shown in
Figure 1b and equations (1–3) has three
distinct operating regions for current limit.
The slew rate, SO , can either cause the circuit to leave a current limit mode in any of
these operating regions (before the timer
period T expires), or it can have no effect
(i.e., SO is very fast). Each of these scenarios, transients, should by analyzed for any
Hot Swap circuit. Each is described below.
Some transients allow finding an analytical
expression for the worst-case parameters.
RL
A
IINIT
CGATE
CALCULATING THE MAXIMUM PURE
CAPACITIVE LOAD
One important parameter to know for a
Hot Swap circuit is the maximum pure
capacitive load that a circuit can successfully power up into without a fault.
ILOAD
VOPER
B
ILIMIT
CTIMER
VINIT
However, the general or universal solution can be obtained in a numerical form.
Case 1: S O Never Limits Current
Suppose that natural slew rate SO is
fast enough to keep the operating point
in current limit mode in all three portions of the function ILOAD (VOUT).
In the first stage of the transient,
the current is IINIT and the output
voltage rises linearly from zero to
VINIT during the time t1. The capacitive load CLOAD1 can be expressed as:
CLOAD1
IINIT t 1
VINIT
The output voltage as a function of time is:
dVOUT (t) IINIT + • VOUT (t)
=
dt
CLOAD1
1
CLOAD1
[IINIT +
• VOUT (t)] dt
(7)
which leads to the first order
differential equation
dVOUT (t)
IINIT
• VOUT (t)
=0
dt
CLOAD1
CLOAD1
IINIT t 1
CLOAD1
(8)
The solution for Equation (8) is:
VOUT (t) =
IINIT
+ VINIT e
(
t CLOAD1)
IINIT
(10)
The output voltage at time t2 is VFIX
VOUT (t 2 ) = VFIX =
=
IINIT
+ VINIT e
(
t 2 CLOAD1)
IINIT
(11)
The duration of interval t2 is
(5)
t2 =
(6)
(9)
Equation (8) describes VOUT(t) from
the start of stage 2, t = 0, to time
t2 , when the current limit reaches
its maximum value, ILIMIT.
t1
Substituting the expression (2)
in equation (5) produces:
VOUT (t) =
or
VOUT (0) = VINIT =
(4)
1
ILOAD(t)dt
CLOAD1 0
VOPER
with initial condition
In the second stage of the transient, the
current increases linearly from IINIT to
ILIMIT according to (2) as the output voltage increases from VINIT to VFIX . Time
t2 represents the duration of this stage,
completed when the output voltage
reaches VFIX . VFIX is usually set to (0.5 to
0.9)VOPER (it must be lower than VOPER) by
proper selection of the resistive divider.
VOUT (t) =
VFIX
VOUT
CLOAD1
• ln
VFIX +
VINIT +
IINIT
IINIT
(12)
The third equation should describe how
CLOAD1 is charged with current ILIMIT during the interval t3 from VFIX to some
intermediate-level VINTERIM where the
January 2015 : LT Journal of Analog Innovation | 35
There are two common problems that require solution when charging a load
with a Hot Swap circuit: (1) the maximum pure capacitive load for a successful
power-up transient; and (2) the maximum capacitive load, which could be added
in parallel to a resistive load, RL, for a successful power-up transient.
ILOAD
1A/DIV
ILOAD
10mA/DIV
VC(TIMER)
500mV/DIV
VOUT
2V/DIV
VOUT
2V/DIV
ILOAD
1A/DIV
VOUT
2V/DIV
VC(TIMER)
500mV/DIV
2ms/DIV
VC(TIMER)
500mV/DIV
2ms/DIV
2ms/DIV
Figure 2. (Case 1) Pure capacitive load. Operating
point leaves current limit mode in the third area,
where current limit is ILIMIT.
Figure 3. (Case 2) Pure capacitive load with a limited
SO (natural output voltage slew rate). Operating
point leaves current limit mode in the first area,
where current limit is IINIT.
Figure 4. (Case 4) Pure capacitive load with a limited
SO (natural output voltage slew rate). Operating
point leaves current limit mode in the second area,
where current limit rises linearly.
operation point leaves a current limit
mode because the MOSFET transconductance drops off in the triode region. When
this region is entered, successful start-up is
assured, but the point at which this region
begins is difficult to solve for because it
involves MOSFET parameters that may
not be available. This region is usually
small, so it makes sense to simplify the
description of this region with the assumption that CLOAD1 is charged from VFIX to
VOPER with ILIMIT. In this case the time:
CLOAD1 =
Case 2: S O Limits Current at Point A
C
(V
V )
t 3 = LOAD1 OPER FIX
ILIMIT
(13)
according to (4)
t1 =
CLOAD1VINIT
IINIT
(14)
Taking into account T = t1 + t2 + t3 , the
capacitive load could be expressed
36 | January 2015 : LT Journal of Analog Innovation
(15)
T
IINIT
=
VFIX +
VINIT 1
V
V
+ ln
+ OPER FIX
IINIT
IINIT
I
LIMIT
VINIT +
The minimum value of CLOAD1 from
equation (15) is obtained with TMIN ,
VINIT_MAX , IINIT_MIN , and VFIX_MAX . The
same parametric limits must be used
for expression of CNO_FLT that follows.
For the case where the slew rate
limit, SO , causes the operating point
to leave a current limit mode exactly
at point A in Figure 1, the capacitive
load CLOAD2 can be expressed as:
CLOAD2
IINIT T
VINIT
(16)
CLOAD2 has a minimum with
IINIT_MIN , TMIN and VINIT_MAX .
Figure 2 shows this type of start-up
transient.
It should be noted that the maximum
output voltage slew rate in this case is
The output voltage slew rate range
for this case falls in the range:
SLOAD2_MAX =
IINIT
CLOAD2
(16a)
SLOAD1_MIN =
IINIT
CLOAD1
(15a)
It is constant while the operating point
resides in the current limit mode.
SLOAD1_MAX =
ILIMIT
CLOAD1
(15b)
Figure 3 shows this transient.
design ideas
during the time t2_4 it becomes equal to SO.
The following method is recommended.
The output voltage rises from zero
to the VFIX during the time t1_4 , which
can be expressed from (16) as
VOUT
2V/DIV
ILOAD
1A/DIV
VOUT
2V/DIV
ILOAD
1A/DIV
VC(TIMER)
500mV/DIV
VC(TIMER)
500mV/DIV
2ms/DIV
Figure 5. R-C load without limitation for SO.
Operating point leaves current limit mode in the third
area, where current limit is ILIMIT.
Case 3: S O Limits Current at Point B
To produce an analytical expression of
CLOAD3 for the case when the operating point leaves a current limit mode at
point B, assume that it happens exactly
as the output voltage reaches VFIX .
The full duration of operation in current limit mode, T, includes two intervals t1 and t2 . According to (14) t1 is:
t 1_ 3 =
CLOAD3VINIT
IINIT
(17)
In a second part of this transient, the output voltage changes according to expression (10) and the duration of interval t2 is:
t2 =
CLOAD3
ln
VFIX +
VINIT +
IINIT
IINIT
and from (17) and (18)
(18)
t 1_ 4 =
The output voltage VOUT(t2_4) should be
equal to the voltage on the second stage
of the characteristic Figure 1 (equation 2):
2ms/DIV
Figure 6. R-C load with limited SO. Operating point
leaves current limit mode in the first area, where
current limit is IINIT.
CLOAD3 =
T
IINIT
(19)
VFIX +
VINIT 1
+ ln
I
IINIT
VINIT + INIT
The output voltage slew rate range
for this case can be defined as:
SLOAD3_MAX =
IINIT
CLOAD3
ILIMIT
CLOAD3
VOUT (t 2_ 4 ) =
(19a)
(19b)
Case 4: S O Limits Current Between
Points A and B
ILOAD(t 2_ 4 ) IINIT
(20)
Substituting ILOAD (t2_4) in (14) with
SO CLOAD4 , taking into an account
that t2_4 = T − t1_4 , and placing the
equal sign between (14) and (11)
forms the following equation:
SOCLOAD4
From equation (19), the minimum
value of CLOAD3 is produced using TMIN ,
VINIT_MAX , IINIT_MIN , and VFIX_MAX .
SLOAD3_MIN =
CLOAD4 • VINIT
IINIT
=
IINIT
+ VINIT e
(
t CLOAD4 )
(21)
This transcendental equation (21) with
unknown CLOAD4 can be solved with the
proper calculation software (Mathcad,
MATLAB, Mathematica) or LTspice.
Figure 4 demonstrates a successful
power-up transient, where the current is limited for a time less than the
timer period at maximum slew rate.
As a result, the transient begins in current limit mode and finishes the inrush
in slew rate limited operation.
If the output voltage slew rate SO is in the
range SLOAD1_MIN ≤ SO ≤ SLOAD1_MAX , current limiting stops before the output voltage reaches VFIX (before point B), meaning
that during the time t1_4 the output voltage
slew rate is a constant (due to IINIT) and
January 2015 : LT Journal of Analog Innovation | 37
The derived expressions in this article and the approach
to the numerical solutions can serve as a basis for
a detailed optimization of Hot Swap solutions.
MAXIMUM CAPACITIVE LOAD
FOR SUCCESSFUL POWERUP TRANSIENT WITHOUT THE
LIMITATION OF THE OUTPUT
VOLTAGE SLEW RATE AND A
DEFINED RESISTIVE LOAD
The solution to equation (23) describes
the output voltage from the beginning
of this stage to the time t2 , when
the output voltage reaches VFIX .
VOUT (t) =
If the passive load can be defined as a
resistive load RL and all Hot Swap circuit
parameters (VOPER , VFIX , IINIT, ILIMIT, T)
are known, then the maximum capacitive load should be found to ensure a
successful power-up transient. A successful power-up transient is completed only
after the current reaches ILIMIT, because
the slew rate is fast enough to stay in a
current limit for the entire transient.
The differential equation
for the first stage is:
CLR1
dVOUT (t) VOUT (t)
+
= IINIT
dt
RL
(22)
The equation (22) solution is:
(
VOUT (t) = IINIT • RL 1 e
t CLR1RL
)
(23)
At the end of the first stage (t1) the
output voltage is equal to VINIT and
IINIT • RL
t 1 = CLR1 • RLOAD • ln
IINIT • RL VINIT
(24)
dVOUT (t) VOUT (t)
+
= IINIT + VOUT (t) (25)
dt
RL
The first component on the left
side of equation (25) is a current
charging the capacitor; the second
one is a resistive current.
38 | January 2015 : LT Journal of Analog Innovation
RL 1
t
CLR1RL
IINITRL
1 (26)
RL 1
IINITRL
+
IINITRL VINIT
I R
VFIX + INIT L
RL
RL 1
CLR1 = T ÷ +
ln
+ (31)
RL 1 V + IINITRL
INIT
RL 1
+RLOAD ln
VFIX ILIMITRL
VOPER ILIMITRL
The time interval t2 could be expressed
as a function of CLOAD from (26) as:
Figure 5 shows measured results
for this case.
I R
VFIX + INIT L
RLCLR1
RL 1
t2 =
ln
RL 1 V + IINITRL
INIT
RL 1
MAXIMUM CAPACITIVE LOAD
FOR SUCCESSFUL POWER-UP
TRANSIENT WHEN CURRENT IS
LIMITED BY THE OUTPUT VOLTAGE
SLEW RATE AND A DEFINED
RESISTIVE LOAD IS PRESENT
(27)
The differential equation
for the third stage is:
dV (t) V (t)
CLR1 OUT + OUT = ILIMIT
dt
RL
(28)
With the assumption that the output voltage slew rate, SO , does not affect the transient, it is possible to say that the output
voltage is changing according to (28) up to
VOPER . The solution for equation (28) is:
VOUT (t) =
The differential equation for the second
stage is:
CLR1
I R
= VINIT + INIT L e
RL 1
RL ln
( VFIX
ILIMITRL ) e
(
t CLR1RL )
+ILIMITRL
(29)
At the end of this stage:
The transient in Figure 6 illustrates
this case, when the operating point
leaves the current limit mode in the
first stage of current limit area.
VOUT (t 3 ) = VOPER
And time t3 equals:
t 3 = RLCLR1ln
VFIX ILIMITRL
VOPER ILIMITRL
The value of the output voltage slew
rate, SO , defines how long a Hot Swap
circuit should operate in the current
limit mode. This event (leaving the
current limit mode) can happen at any
moment of the three stages of the transient. For defined points A and B, during the third stage it is possible to use
equations from the previous section. For
any intermediate points, it is possible
to use the approach demonstrated in
“Case 4” with a transcendental equation.
(30)
Since T = t1 + t2 + t3 , CLOAD for this case is:
CONCLUSION
The derived expressions in this article
and the approach to the numerical solutions can serve as a basis for a detailed
optimization of Hot Swap solutions. n
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Two of the three general purpose input/
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PROTECTS BATTERIES FROM
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January 2015 : LT Journal of Analog Innovation | 39
highlights from circuits.linear.com
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4V TO 20V
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10µF
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CLKIN CLKOUT
VOUT
1.5V
47µF 3A
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SVIN
RUN
INTVCC
LTM4623
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PHMODE
TRACK/SS
0.1µF
FB
PGOOD
COMP
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High speed comparators are often used in digital systems to recover distorted clock
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BST
EN/UV
SW
ISP
SYNC
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INTVCC
0.1µF
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VOUT
0.97V
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ISN
BIAS
PG
FB
TR/SS
RT
1µF
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f = 300kHz
L: VISHAY IHLP2525CZ-01
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2×100µF
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VEE + 5V
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