Data Sheet

66
SO
T6
BF1208
Dual N-channel dual gate MOSFET
Rev. 2 — 7 September 2011
Product data sheet
1. Product profile
1.1 General description
The BF1208 is a combination of two dual gate MOSFET amplifiers with shared source
and gate2 leads and an integrated switch. The integrated switch is operated by the gate1
bias of amplifier B.
The source and substrate are interconnected. Internal bias circuits enable DC stabilization
and a very good cross-modulation performance during Automatic Gain Control (AGC).
Integrated diodes between the gates and source protect against excessive input voltage
surges. The transistor has a SOT666 micro-miniature plastic package.
CAUTION
This device is sensitive to ElectroStatic Discharge (ESD). Therefore care should be taken
during transport and handling.
1.2 Features and benefits
 Two low noise gain controlled amplifiers in a single package. One with a fully
integrated bias and one with a partly integrated bias
 Internal switch to save external components
 Superior cross-modulation performance during AGC
 High forward transfer admittance
 High forward transfer admittance to input capacitance ratio
1.3 Applications
 Gain controlled low noise amplifiers for VHF and UHF applications with 5 V supply
voltage
 digital and analog television tuners
 professional communication equipment
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
1.4 Quick reference data
Table 1.
Quick reference data
Per MOSFET unless otherwise specified.
Symbol Parameter
Conditions
Min
Typ
Max Unit
-
-
6
V
-
-
30
mA
-
-
180
mW
amplifier A; ID = 19 mA
26
31
41
mS
amplifier B; ID = 13 mA
28
33
43
mS
amplifier A
-
2.2
2.7
pF
amplifier B
-
2.0
2.5
pF
VDS
drain-source voltage (DC)
ID
drain current (DC)
Ptot
total power dissipation
Tsp  109 C
yfs
forward transfer admittance
f = 1 MHz
Ciss(G1)
input capacitance at gate1
[1]
f = 1 MHz
Crss
reverse transfer capacitance f = 1 MHz
-
20
-
fF
NF
noise figure
amplifier A; f = 400 MHz
-
1.3
1.9
dB
amplifier B; f = 800 MHz
-
1.4
2.1
dB
amplifier A
100
105
-
dBV
amplifier B
100
103
-
dBV
-
-
150
C
Xmod
input level for k = 1 % at
40 dB AGC
junction temperature
Tj
[1]
cross-modulation
Tsp is the temperature at the soldering point of the source lead.
2. Pinning information
Table 2.
Discrete pinning
Pin
Description
1
gate1 (AMP A)
2
gate2
6
5
Symbol
4
AMP A
3
gate1 (AMP B)
4
drain (AMP B)
5
source
6
Simplified outline
G1A
DA
G2
drain (AMP A)
1
2
S
3
G1B
DB
AMP B
sym089
BF1208
Product data sheet
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
2 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
3. Ordering information
Table 3.
Ordering information
Type number
BF1208
Package
Name
Description
Version
-
plastic surface mounted package; 6 leads
SOT666
4. Marking
Table 4.
Marking codes
Type number
Marking code
BF1208
2L
5. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
Min
Max
Unit
Per MOSFET
VDS
drain-source voltage (DC)
-
6
V
ID
drain current (DC)
-
30
mA
IG1
gate1 current
-
10
mA
IG2
gate2 current
-
10
mA
Ptot
total power dissipation
-
180
mW
Tstg
storage temperature
65
+150
C
Tj
junction temperature
-
150
C
[1]
Tsp  109 C
[1]
Tsp is the temperature at the soldering point of the source lead.
001aac193
250
Ptot
(mW)
200
150
100
50
0
0
50
100
150
200
Tsp (˚C)
Fig 1.
BF1208
Product data sheet
Power derating curve
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© NXP B.V. 2011. All rights reserved.
3 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
6. Thermal characteristics
Table 6.
Thermal characteristics
Symbol
Parameter
Conditions
Rth(j-sp)
thermal resistance from junction to solder point
Typ
Unit
225
K/W
7. Static characteristics
Table 7.
Static characteristics
Tj = 25 C; unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ
Max Unit
amplifier A
6
-
-
V
amplifier B
6
-
-
V
Per MOSFET; unless otherwise specified
V(BR)DSS
drain-source breakdown voltage
VG1-S = VG2-S = 0 V; ID = 10 A
V(BR)G1-SS
gate1-source breakdown voltage
VG2-S = VDS = 0 V; IG1-S = 10 mA
6
-
10
V
V(BR)G2-SS
gate2-source breakdown voltage
VG1-S = VDS = 0 V; IG2-S = 10 mA
6
-
10
V
VF(S-G1)
forward source-gate1 voltage
VG2-S = VDS = 0 V; IS-G1 = 10 mA
0.5
-
1.5
V
VF(S-G2)
forward source-gate2 voltage
VG1-S = VDS = 0 V; IS-G2 = 10 mA
0.5
-
1.5
V
VG1-S(th)
gate1-source threshold voltage
VDS = 5 V; VG2-S = 4 V; ID = 100 A
0.3
-
1.0
V
VG2-S(th)
gate2-source threshold voltage
VDS = 5 V; VG1-S = 5 V; ID = 100 A
0.4
-
1.0
V
IDSX
drain-source current
VG2-S = 4 V; VDS(B) = 5 V; RG1 = 150 k
IG1-S
IG2-S
gate1 cut-off current
gate2 cut-off current
14
-
24
mA
amplifier B; VDS(B) = 5 V
[2]
9
-
17
mA
amplifier A; VG1-S(A) = 5 V; ID(B) = 0 A
-
-
50
nA
amplifier B; VG1-S(B) = 5 V; VDS(B) = 0 V
-
-
50
nA
-
-
20
nA
VG2-S = 4 V; VG1-S(B) = 0 V;
VG1-S(A) = VDS(A) = VDS(B) = 0 V
RG1 connects gate1 (B) to VGG = 0 V (see Figure 3).
[2]
RG1 connects gate1 (B) to VGG = 5 V (see Figure 3).
Product data sheet
[1]
VG2-S = VDS(A) = 0 V
[1]
BF1208
amplifier A; VDS(A) = 5 V
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
4 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
001aaa552
20
ID
(mA)
16
G1A
(1)
DA
(2)
12
G2
S
(3)
G1B
8
DB
RG1
(4)
VGG
4
(6)
001aac205
(5)
0
0
1
2
3
4
5
VGG (V)
(1) ID(B); RG1 = 120 k.
VGG = 5 V: amplifier A is off; amplifier B is on.
(2) ID(B); RG1 = 150 k.
VGG = 0 V: amplifier A is on; amplifier B is off.
(3) ID(B); RG1 = 180 k.
(4) ID(A); RG1 = 180 k.
(5) ID(A); RG1 = 150 k.
(6) ID(A); RG1 = 120 k.
Fig 2.
Drain currents of MOSFET A and B as a
function of gate1 supply voltage
Fig 3.
Functional diagram
8. Dynamic characteristics
8.1 Dynamic characteristics for amplifier A
Table 8.
Dynamic characteristics for amplifier A[1]
Common source; Tamb = 25 C; VG2-S = 4 V; VDS = 5 V; ID = 19 mA; unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
yfs
forward transfer admittance
Tj = 25 C
26
31
41
mS
Ciss(G1)
input capacitance at gate1
f = 1 MHz
-
2.2
2.7
pF
Ciss(G2)
input capacitance at gate2
f = 1 MHz
-
3.0
-
pF
Coss
output capacitance
f = 1 MHz
-
0.9
-
pF
Crss
reverse transfer capacitance
f = 1 MHz
-
20
-
fF
Gtr
power gain
BS = BS(opt); BL = BL(opt)
f = 200 MHz; GS = 2 mS; GL = 0.5 mS
32
36
40
dB
f = 400 MHz; GS = 2 mS; GL = 1 mS
28
32
36
dB
f = 800 MHz; GS = 3.3 mS; GL = 1 mS
23
27
32
dB
NF
noise figure
BF1208
Product data sheet
f = 11 MHz; GS = 20 mS; BS = 0 S
-
3.0
-
dB
f = 400 MHz; YS = YS(opt)
-
1.3
1.9
dB
f = 800 MHz; YS = YS(opt)
-
1.4
2.1
dB
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
5 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
Table 8.
Dynamic characteristics for amplifier A[1] …continued
Common source; Tamb = 25 C; VG2-S = 4 V; VDS = 5 V; ID = 19 mA; unless otherwise specified.
Symbol
Parameter
Xmod
Conditions
cross-modulation
Min
Typ
Max
Unit
at 0 dB AGC
90
-
-
dBV
at 10 dB AGC
-
90
-
dBV
at 20 dB AGC
-
99
-
dBV
at 40 dB AGC
100
105
-
dBV
[2]
input level for k = 1 %; fw = 50 MHz;
funw = 60 MHz
[1]
For the MOSFET not in use: VG1-S(B) = 0 V; VDS(B) = 0 V.
[2]
Measured in Figure 33 test circuit.
8.1.1 Graphics for amplifier A
001aaa554
30
001aaa555
32
(1)
ID
(mA)
(2)
ID
(mA)
(3)
(1)
(2)
(4)
24
(3)
20
(4)
(5)
16
(5)
(6)
10
(7)
(6)
8
(8)
(9)
(7)
0
0
0
0.4
0.8
1.2
1.6
2
VG1-S (V)
0
2
6
VDS (V)
(1) VG2-S = 4 V.
(1) VG1-S(A) = 1.8 V.
(2) VG2-S = 3.5 V.
(2) VG1-S(A) = 1.7 V.
(3) VG2-S = 3 V.
(3) VG1-S(A) = 1.6 V.
(4) VG2-S = 2.5 V.
(4) VG1-S(A) = 1.5 V.
(5) VG2-S = 2 V.
(5) VG1-S(A) = 1.4 V.
(6) VG2-S = 1.5 V.
(6) VG1-S(A) = 1.3 V.
(7) VG2-S = 1 V.
(7) VG1-S(A) = 1.2 V.
VDS(A) = 5 V; VG1-S(B) = VDS(B) = 0 V; Tj = 25 C.
4
(8) VG1-S(A) = 1.1 V.
(9) VG1-S(A) = 1 V.
VG2-S = 4 V; VG1-S(B) = VDS(B) = 0 V; Tj = 25 C.
Fig 4.
Amplifier A: transfer characteristics; typical
values
BF1208
Product data sheet
Fig 5.
Amplifier A: output characteristics; typical
values
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
6 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
001aaa556
40
yfs
(mS)
ID(A)
(mA)
16
(1)
(2)
30
001aac206
20
12
20
(3)
8
(4)
10
4
(5)
(6)
0
0
0
8
16
24
0
32
20
40
60
ID(B) (μA)
ID (mA)
(1) VG2-S = 4 V.
VDS(A) = 5 V; VG2-S = 4 V; VDS(B) = 5 V; VG1-S(B) = 0 V;
Tj = 25 C.
(2) VG2-S = 3.5 V.
ID(B) = internal G1 current = current in pin drain (B) if
MOSFET (B) is switched off.
(3) VG2-S = 3 V.
(4) VG2-S = 2.5 V.
(5) VG2-S = 2 V.
(6) VG2-S = 1.5 V.
VDS(A) = 5 V; VG1-S(B) = VDS(B) = 0 V; Tj = 25 C.
Fig 6.
Amplifier A: forward transfer admittance as a
function of drain current; typical values
BF1208
Product data sheet
Fig 7.
Amplifier A: drain current as a function of
internal G1 current; typical values
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© NXP B.V. 2011. All rights reserved.
7 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
001aaa558
20
ID
(mA)
16
001aaa559
32
ID
(mA)
24
(1)
12
(2)
(3)
16
(4)
(5)
8
(6)
8
4
0
0
0
1
2
3
4
5
0
2
4
Vsup (V)
VDS(A) = VDS(B) = Vsupply; VG2-S = 4 V; Tj = 25 C;
RG1 = 150 k (connected to ground); see Figure 3.
6
VG2-S (V)
(1) VDS(B) = 5 V.
(2) VDS(B) = 4.5 V.
(3) VDS(B) = 4 V.
(4) VDS(B) = 3.5 V.
(5) VDS(B) = 3 V.
(6) VDS(B) = 2.5 V.
VDS(A) = 5 V; VG1-S(B) = 0 V; gate1 (A) = open;
Tj = 25 C.
Fig 8.
Amplifier A: drain current of amplifier A as a
function of supply voltage of A and B
amplifier; typical values
001aac195
120
Vunw
(dBμV)
Fig 9.
Amplifier A: drain current as a function of
gate2 voltage; typical values
001aac196
0
gain
reduction
(dB)
10
110
20
100
30
90
40
80
50
0
10
20
30
40
50
gain reduction (dB)
VDS(A) = VDS(B) = 5 V; VG1-S(B) = 0 V; fw = 50 MHz;
funw = 60 MHz; Tamb = 25 C; see Figure 33.
Fig 10. Amplifier A: unwanted voltage for 1 %
cross-modulation as a function of gain
reduction; typical values
BF1208
Product data sheet
0
1
2
3
4
VAGC (V)
VDS(A) = VDS(B) = 5 V; VG1-S(B) = 0 V; f = 50 MHz; see
Figure 33.
Fig 11. Amplifier A: gain reduction as a function of
AGC voltage; typical values
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
8 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
001aac197
28
001aac566
102
bis, gis
(mS)
ID
(mA)
10
20
bis
1
12
gis
10−1
10−2
4
0
10
20
30
40
50
gain reduction (dB)
10
001aac567
102
|yfs|
|yfs|
(mS)
−102
ϕfs
(deg)
103
f (MHz)
VDS(A) = VDS(B) = 5 V; VG1-S(B) = 0 V; f = 50 MHz;
Tamb = 25 C; see Figure 33.
Fig 12. Amplifier A: drain current as a function of gain
reduction; typical values
102
VDS(A) = 5 V; VG2-S = 4 V; VDS(B) = VG1-S(B) = 0 V;
ID(A) = 19 mA
Fig 13. Amplifier A: input admittance as a function of
frequency; typical values
001aac568
103
−103
ϕrs
(deg)
|yrs|
(μS)
ϕrs
102
−102
−10
10
ϕfs
|yrs|
−10
10
1
10
−1
103
102
1
10
f (MHz)
Fig 14. Amplifier A: forward transfer admittance and
phase as a function of frequency; typical
values
Product data sheet
103
−1
f (MHz)
VDS(A) = 5 V; VG2-S = 4 V; VDS(B) = VG1-S(B) = 0 V;
ID(A) = 19 mA
BF1208
102
VDS(A) = 5 V; VG2-S = 4 V; VDS(B) = VG1-S(B) = 0 V;
ID(A) = 19 mA
Fig 15. Amplifier A: reverse transfer admittance and
phase as a function of frequency; typical
values
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
9 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
001aac569
10
bos, gos
(mS)
bos
1
gos
10−1
10−2
102
10
103
f (MHz)
VDS(A) = 5 V; VG2-S = 4 V; VDS(B) = VG1-S(B) = 0 V; ID(A) = 19 mA
Fig 16. Amplifier A: output admittance as a function of frequency; typical values
8.1.2 Scattering parameters for amplifier A
Table 9.
Scattering parameters for amplifier A
VDS(A) = 5 V; VG2-S = 4 V; ID(A) = 19 mA; VDS(B) = 0 V; VG1-S(B) = 0 V; Tamb = 25 C; typical values.
f
(MHz)
s11
Magnitude
(ratio)
Angle
(deg)
s21
Magnitude
(ratio)
Angle
(deg)
s12
50
0.991
3.86
3.08
100
0.990
7.73
200
0.986
300
0.980
400
s22
Magnitude
(ratio)
Angle
(deg)
Magnitude
(ratio)
Angle
(deg)
175.91 0.0009
77.41
0.992
1.41
3.03
171.76 0.0019
78.10
0.991
2.81
15.43 2.99
163.68 0.0037
78.39
0.990
5.57
22.98 2.94
155.54 0.0054
73.53
0.989
8.34
0.970
30.44 2.89
147.55 0.0070
68.74
0.986
11.08
500
0.960
37.60 2.82
139.76 0.0085
63.64
0.983
13.78
600
0.948
44.62 2.75
132.16 0.0098
59.62
0.980
16.45
700
0.935
51.44 2.67
124.70 0.0110
55.09
0.977
19.10
800
0.921
58.04 2.58
117.39 0.0120
50.79
0.973
21.69
900
0.908
64.41 2.50
110.20 0.0128
46.62
0.970
24.28
1000
0.894
70.49 2.40
103.31 0.0135
42.78
0.967
26.87
8.1.3 Noise data for amplifier A
Table 10. Noise data for amplifier A
VDS(A) = 5 V; VG2-S = 4 V; ID(A) = 19 mA; VDS(B) = 0 V; VG1-S(B) = 0 V; Tamb = 25 C; typical values;
unless otherwise specified.
f (MHz)
BF1208
Product data sheet
NFmin (dB)
opt
rn ()
ratio
(deg)
400
1.3
0.718
16.06
0.683
800
1.4
0.677
37.59
0.681
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
10 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
8.2 Dynamic characteristics for amplifier B
Table 11. Dynamic characteristics for amplifier B[1]
Common source; Tamb = 25 C; VG2-S = 4 V; VDS = 5 V; ID = 13 mA; unless otherwise specified.
Symbol Parameter
Conditions
Min
Typ
Max Unit
yfs
forward transfer admittance
Tj = 25 C
28
33
43
mS
Ciss(G1)
input capacitance at gate1
f = 1 MHz
-
2.0
2.5
pF
Ciss(G2)
input capacitance at gate2
f = 1 MHz
-
3.4
-
pF
Coss
output capacitance
f = 1 MHz
-
0.85
-
pF
Crss
reverse transfer capacitance f = 1 MHz
-
20
-
fF
Gtr
power gain
f = 200 MHz; GS = 2 mS; GL = 0.5 mS
33
37
41
dB
f = 400 MHz; GS = 2 mS; GL = 1 mS
30
34
38
dB
f = 800 MHz; GS = 3.3 mS; GL = 1 mS
29
33
37
dB
f = 11 MHz; GS = 20 mS; BS = 0 S
-
5
-
dB
f = 400 MHz; YS = YS(opt)
-
1.3
1.9
dB
-
1.4
2.1
dB
at 0 dB AGC
90
-
-
dBV
at 10 dB AGC
-
88
-
dBV
at 20 dB AGC
-
94
-
dBV
at 40 dB AGC
100
103
-
dBV
NF
noise figure
BS = BS(opt); BL = BL(opt)
f = 800 MHz; YS = YS(opt)
Xmod
cross-modulation
input level for k = 1 %; fw = 50 MHz;
funw = 60 MHz
[1]
For the MOSFET not in use: VG1-S(A) = 0 V; VDS(A) = 0 V.
[2]
Measured in Figure 34 test circuit.
BF1208
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 7 September 2011
[2]
© NXP B.V. 2011. All rights reserved.
11 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
8.2.1 Graphics for amplifier B
001aaa568
(1)
(4)
30
ID
(mA)
(2)
ID
(mA)
001aaa569
32
(1)
(3)
24
(2)
(5)
20
(3)
(4)
16
(5)
(6)
10
(6)
8
(7)
(7)
0
0
0
0.4
0.8
1.2
1.6
2
VG1-S (V)
0
2
(1) VG1-S(B) = 1.6 V.
(2) VG2-S = 3.5 V.
(2) VG1-S(B) = 1.5 V.
(3) VG2-S = 3 V.
(3) VG1-S(B) = 1.4 V.
(4) VG2-S = 2.5 V.
(4) VG1-S(B) = 1.3 V.
(5) VG2-S = 2 V.
(5) VG1-S(B) = 1.2 V.
(6) VG2-S = 1.5 V.
(6) VG1-S(B) = 1.1 V.
(7) VG2-S = 1 V.
(7) VG1-S(B) = 1 V.
Fig 17. Amplifier B: transfer characteristics; typical
values
BF1208
Product data sheet
6
VDS (V)
(1) VG2-S = 4 V.
VDS(B) = 5 V; VDS(A) = VG1-S(A) = 0 V; Tj = 25 C.
4
VG2-S = 4 V; VDS(A) = VG1-S(A) = 0 V; Tj = 25 C.
Fig 18. Amplifier B: output characteristics; typical
values
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
12 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
001aaa570
100
(1)
IG1
(μA)
80
(2)
(3)
001aaa571
(1)
(2)
40
yfs
(mS)
(3)
30
(4)
(4)
60
20
40
(5)
(5)
10
20
(6)
(6)
(7)
(7)
0
0
0
0.4
0.8
1.2
0
1.6
2
VG1-S (V)
8
(1) VG2-S = 4 V.
(2) VG2-S = 3.5 V.
(2) VG2-S = 3.5 V.
(3) VG2-S = 3 V.
(3) VG2-S = 3 V.
(4) VG2-S = 2.5 V.
(4) VG2-S = 2.5 V.
(5) VG2-S = 2 V.
(5) VG2-S = 2 V.
(6) VG2-S = 1.5 V.
(6) VG2-S = 1.5 V.
(7) VG2-S = 1 V.
(7) VG2-S = 1 V.
VDS(B) = 5 V; VDS(A) = VG1-S(A) = 0 V; Tj = 25 C.
001aaa572
24
24
32
ID (mA)
(1) VG2-S = 4 V.
Fig 19. Amplifier B: gate1 current as a function of
gate1 voltage; typical values
16
VDS(B) = 5 V; VDS(A) = VG1-S(A) = 0 V; Tj = 25 C.
Fig 20. Amplifier B: forward transfer admittance as a
function of drain current; typical values
001aaa573
16
ID
(mA)
ID
(mA)
12
16
8
8
4
0
0
10
20
30
40
50
IG1 (μA)
VDS(B) = 5 V; VG2-S = 4 V; VDS(A) = VG1-S(A) = 0 V;
Tj = 25 C.
Fig 21. Amplifier B: drain current as a function of
gate1 current; typical values
BF1208
Product data sheet
0
0
1
2
3
4
5
VGG (V)
VDS(B) = 5 V; VG2-S = 4 V; VDS(A) = VG1-S(A) = 0 V;
Tj = 25 C; RG1 = 150 k (connected to VGG); see
Figure 3.
Fig 22. Amplifier B: drain current as a function of
gate1 supply voltage; typical values
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
13 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
001aaa574
24
001aaa575
16
(1)
ID
(mA)
(1)
ID
(mA)
(2)
(3)
(2)
12
(4)
(3)
16
(5)
(4)
(5)
8
(6)
(7)
(8)
8
4
0
0
0
2
4
6
0
VGG = VDS (V)
2
4
6
VG2-S (V)
(1) RG1 = 68 k.
(1) VGG = 5.0 V.
(2) RG1 = 82 k.
(2) VGG = 4.5 V.
(3) RG1 = 100 k.
(3) VGG = 4.0 V.
(4) RG1 = 120 k.
(4) VGG = 3.5 V.
(5) RG1 = 150 k.
(5) VGG = 3.0 V.
VDS(B) = 5 V; VDS(A) = VG1-S(A) = 0 V; Tj = 25 C;
RG1 = 150 k (connected to VGG); see Figure 3.
(6) RG1 = 180 k.
(7) RG1 = 220 k.
(8) RG1 = 270 k.
VG2-S = 4 V; VDS(A) = VG1-S(A) = 0 V; Tj = 25 C; RG1 is
connected to VGG; see Figure 3.
Fig 23. Amplifier B: drain current as a function of
gate1 supply voltage and drain supply voltage;
typical values
BF1208
Product data sheet
Fig 24. Amplifier B: drain current as a function of
gate2 voltage; typical values
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
14 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
001aaa576
30
Vunw
(dBμV)
(1)
IG1
(μA)
(2)
20
001aac198
120
110
(3)
(4)
100
(5)
10
90
80
0
0
2
4
6
0
20
40
60
gain reduction (dB)
VG2-S (V)
VDS(B) = 5 V; VGG = 5 V; VDS(A) = VG1-S(A) = 0 V;
RG1 = 150 k (connected to VGG); fw = 50 MHz;
funw = 60 MHz; Tamb = 25 C; see Figure 34.
(1) VGG = 5.0 V.
(2) VGG = 4.5 V.
(3) VGG = 4.0 V.
(4) VGG = 3.5 V.
(5) VGG = 3.0 V.
VDS(B) = 5 V; VDS(A) = VG1-S(A) = 0 V; Tj = 25 C;
RG1 = 150 k (connected to VGG); see Figure 3.
Fig 25. Amplifier B: gate1 current as a function of
gate2 voltage; typical values
001aac199
0
gain
reduction
(dB)
10
Fig 26. Amplifier B: unwanted voltage for 1 %
cross-modulation as a function of gain
reduction; typical values
001aac200
16
ID
(mA)
12
20
8
30
4
40
0
50
0
1
2
3
4
0
10
VAGC (V)
VDS(B) = 5 V; VGG = 5 V; VDS(A) = VG1-S(A) = 0 V;
RG1 = 150 k (connected to VGG); f = 50 MHz;
Tamb = 25 C; see Figure 34.
Fig 27. Amplifier B: gain reduction as a function of
AGC voltage; typical values
BF1208
Product data sheet
20
30
40
50
gain reduction (dB)
VDS(B) = 5 V; VGG = 5 V; VDS(A) = VG1-S(A) = 0 V;
RG1 = 150 k (connected to VGG); f = 50 MHz;
Tamb = 25 C; see Figure 34.
Fig 28. Amplifier B: drain current as a function of gain
reduction; typical values
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
15 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
001aac570
102
001aac571
102
bis, gis
(mS)
|yfs|
|yfs|
(mS)
10
−102
ϕfs
(deg)
bis
1
−10
10
ϕfs
gis
10−1
10−2
10
102
1
103
10
−1
103
102
f (MHz)
f (MHz)
VDS(B) = 5 V; VG2-S = 4 V; VDS(A) = VG1-S(A) = 0 V;
ID(B) = 13 mA
Fig 29. Amplifier B: input admittance as a function of
frequency; typical values
001aac572
103
−103
ϕrs
(deg)
|yrs|
(μS)
ϕrs
102
−102
VDS(B) = 5 V; VG2-S = 4 V; VDS(A) = VG1-S(A) = 0 V;
ID(B) = 13 mA
Fig 30. Amplifier B: forward transfer admittance and
phase as a function of frequency; typical
values
001aac573
10
bos, gos
(mS)
bos
1
|yrs|
gos
10
1
10
102
103
−10
10−1
−1
10−2
10
VDS(B) = 5 V; VG2-S = 4 V; VDS(A) = VG1-S(A) = 0 V;
ID(B) = 13 mA
Fig 31. Amplifier B: reverse transfer admittance and
phase as a function of frequency; typical
values
BF1208
Product data sheet
102
103
f (MHz)
f (MHz)
VDS(B) = 5 V; VG2-S = 4 V; VDS(A) = VG1-S(A) = 0 V;
ID(B) = 13 mA
Fig 32. Amplifier B: output admittance as a function of
frequency; typical values
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
16 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
8.2.2 Scattering parameters for amplifier B
Table 12. Scattering parameters for amplifier B
VDS(B) = 5 V; VG2-S = 4 V; ID(B) = 13 mA; VDS(A) = 0 V; VG1-S(A) = 0 V; Tamb = 25 C; typical values.
f
(MHz)
s11
s21
s12
Magnitude
(ratio)
Angle
(deg)
Magnitude
(ratio)
Angle
(deg)
50
0.985
3.42
3.33
100
0.984
6.96
200
300
s22
Magnitude
(ratio)
Angle
(deg)
Magnitude
(ratio)
Angle
(deg)
176.41 0.0010
87.55
0.988
1.60
3.31
172.70 0.0020
83.45
0.988
3.16
0.980
13.51 3.27
165.59 0.0039
82.84
0.987
6.31
0.975
20.07 3.23
158.42 0.0054
82.01
0.986
9.40
400
0.969
26.61 3.19
151.34 0.0068
79.73
0.984
12.46
500
0.961
32.89 3.14
144.33 0.0085
77.91
0.982
15.57
600
0.955
39.19 3.07
137.54 0.0100
76.31
0.980
18.62
700
0.945
45.39 3.00
130.72 0.0115
73.76
0.977
21.70
800
0.938
51.39 2.93
123.98 0.0131
71.58
0.974
24.76
900
0.930
57.36 2.85
117.31 0.0145
69.18
0.971
27.81
1000
0.920
63.10 2.77
110.39 0.0157
67.54
0.967
30.86
8.2.3 Noise data for amplifier B
Table 13. Noise data for amplifier B
VDS(B) = 5 V; VG2-S = 4 V; ID(B) = 13 mA; VDS(A) = 0 V; VG1-S(A) = 0 V; Tamb = 25 C; typical values;
unless otherwise specified.
f (MHz)
BF1208
Product data sheet
NFmin (dB)
opt
rn ()
ratio
(deg)
400
1.3
0.695
13.11
0.694
800
1.4
0.674
32.77
0.674
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
17 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
9. Test information
VDS(A)
VAGC
5V
4.7 nF
10 kΩ
4.7 nF
RGEN
50 Ω
G2
4.7 nF
Vi
RL
50 Ω
S
BF1208
G1B
50 Ω
4.7 nF
DA
G1A
4.7 nF
50 Ω
L1
2.2 μH
DB
L2
2.2 μH
RG1
4.7 nF
VGG
VDS(B)
0V
5V
001aac201
Fig 33. Cross-modulation test set-up for amplifier A
VDS(A)
VAGC
5V
4.7 nF
10 kΩ
4.7 nF
50 Ω
DA
G1A
4.7 nF
G2
4.7 nF
RGEN
50 Ω
L1
2.2 μH
BF1208
G1B
50 Ω
S
4.7 nF
DB
L2
2.2 μH
RG1
RL
50 Ω
4.7 nF
Vi
VGG
5V
VDS(B)
5V
001aac202
Fig 34. Cross-modulation test set-up for amplifier B
BF1208
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
18 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
10. Package outline
Plastic surface-mounted package; 6 leads
SOT666
D
E
A
X
Y S
S
HE
6
5
4
pin 1 index
A
1
2
e1
c
3
bp
w M A
Lp
e
detail X
0
1
2 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
bp
c
D
E
e
e1
HE
Lp
w
y
mm
0.6
0.5
0.27
0.17
0.18
0.08
1.7
1.5
1.3
1.1
1.0
0.5
1.7
1.5
0.3
0.1
0.1
0.1
OUTLINE
VERSION
REFERENCES
IEC
JEDEC
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
04-11-08
06-03-16
SOT666
Fig 35. Package outline SOT666
BF1208
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
19 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
11. Revision history
Table 14.
Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
BF1208 v.2
20110907
Product data sheet
-
BF1208 v.1
Modifications:
BF1208 v.1
(9397 750 14254)
BF1208
Product data sheet
•
The format of this data sheet has been redesigned to comply with the new identity
guidelines of NXP Semiconductors.
•
•
Legal texts have been adapted to the new company name where appropriate.
Package outline drawings have been updated to the latest version.
20050316
Product data sheet
-
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 7 September 2011
-
© NXP B.V. 2011. All rights reserved.
20 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
12. Legal information
12.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
12.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
12.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications and
products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
No offer to sell or license — Nothing in this document may be interpreted or
construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from national authorities.
BF1208
Product data sheet
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Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
21 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It is neither qualified nor tested
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in automotive equipment or applications.
In the event that customer uses the product for design-in and use in
automotive applications to automotive specifications and standards, customer
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such automotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconductors for any
liability, damages or failed product claims resulting from customer design and
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specifications.
12.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
13. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
BF1208
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 7 September 2011
© NXP B.V. 2011. All rights reserved.
22 of 23
BF1208
NXP Semiconductors
Dual N-channel dual gate MOSFET
14. Contents
1
1.1
1.2
1.3
1.4
2
3
4
5
6
7
8
8.1
8.1.1
8.1.2
8.1.3
8.2
8.2.1
8.2.2
8.2.3
9
10
11
12
12.1
12.2
12.3
12.4
13
14
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1
General description . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Quick reference data . . . . . . . . . . . . . . . . . . . . 2
Pinning information . . . . . . . . . . . . . . . . . . . . . . 2
Ordering information . . . . . . . . . . . . . . . . . . . . . 3
Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3
Thermal characteristics . . . . . . . . . . . . . . . . . . 4
Static characteristics. . . . . . . . . . . . . . . . . . . . . 4
Dynamic characteristics . . . . . . . . . . . . . . . . . . 5
Dynamic characteristics for amplifier A. . . . . . . 5
Graphics for amplifier A . . . . . . . . . . . . . . . . . . 6
Scattering parameters for amplifier A . . . . . . . 10
Noise data for amplifier A . . . . . . . . . . . . . . . . 10
Dynamic characteristics for amplifier B. . . . . . 11
Graphics for amplifier B . . . . . . . . . . . . . . . . . 12
Scattering parameters for amplifier B . . . . . . . 17
Noise data for amplifier B . . . . . . . . . . . . . . . . 17
Test information . . . . . . . . . . . . . . . . . . . . . . . . 18
Package outline . . . . . . . . . . . . . . . . . . . . . . . . 19
Revision history . . . . . . . . . . . . . . . . . . . . . . . . 20
Legal information. . . . . . . . . . . . . . . . . . . . . . . 21
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 21
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Contact information. . . . . . . . . . . . . . . . . . . . . 22
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2011.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 7 September 2011
Document identifier: BF1208