IRFPS37N50A, SiHFPS37N50A Datasheet

IRFPS37N50A, SiHFPS37N50A
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
• Low Gate Charge Qg Results in Simple Drive
Requirement
500
RDS(on) (Max.) ()
VGS = 10 V
0.13
Qg (Max.) (nC)
180
Qgs (nC)
46
Qgd (nC)
• Improved Gate, Avalanche and Dynamic dV/dt
Ruggedness
RoHS*
COMPLIANT
• Fully Characterized Capacitance and Avalanche Voltage
and Current
71
Configuration
Available
Single
• Effective Coss Specified
D
• Compliant to RoHS Directive 2002/95/EC
Super-247
APPLICATIONS
• Switch Mode Power Supply (SMPS)
G
• Uninterruptible Power Supply
S
• High Speed Power Switching
D
G
S
TYPICAL SMPS TOPOLOGIES
N-Channel MOSFET
• Full Bridge Converters
• Power Factor Correction Boost
ORDERING INFORMATION
Package
Super-247
IRFPS37N50APbF
SiHFPS37N50A-E3
IRFPS37N50A
SiHFPS37N50A
Lead (Pb)-free
SnPb
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
LIMIT
Drain-Source Voltage
VDS
500
Gate-Source Voltage
VGS
± 30
Continuous Drain Current
VGS at 10 V
TC = 25 °C
TC = 100 °C
Pulsed Drain Currenta
ID
UNIT
V
36
23
A
IDM
144
3.6
W/°C
Single Pulse Avalanche Energyb
EAS
1260
mJ
Repetitive Avalanche Currenta
IAR
36
A
Repetitive Avalanche Energya
EAR
44
mJ
Linear Derating Factor
Maximum Power Dissipation
TC = 25 °C
Peak Diode Recovery dV/dtc
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
for 10 s
PD
446
W
dV/dt
3.5
V/ns
TJ, Tstg
- 55 to + 150
300d
°C
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Starting TJ = 25 °C, L = 1.94 mH, Rg = 25 , IAS = 36 A (see fig. 12).
c. ISD  36 A, dI/dt  145 A/μs, VDD  VDS, TJ  150 °C.
d. 1.6 mm from case.
* Pb containing terminations are not RoHS compliant, exemptions may apply
Document Number: 91258
S11-0111-Rev. C, 07-Feb-11
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IRFPS37N50A, SiHFPS37N50A
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambient
RthJA
-
40
Case-to-Sink, Flat, Greased Surface
RthCS
0.24
-
Maximum Junction-to-Case (Drain)
RthJC
-
0.28
UNIT
°C/W
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
VDS
VGS = 0 V, ID = 250 μA
500
VGS(th)
VDS = VGS, ID = 250 μA
2.0
-
-
V
-
4.0
V
nA
Static
Drain-Source Breakdown Voltage
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
Drain-Source On-State Resistance
Forward Transconductance
IGSS
IDSS
RDS(on)
gfs
VGS = ± 30 V
-
-
± 100
VDS = 500 V, VGS = 0 V
-
-
25
VDS = 400 V, VGS = 0 V, TJ = 150 °C
-
-
250
-
-
0.13

20
-
-
S
-
5579
-
-
810
-
-
36
-
VDS = 1.0 V , f = 1.0 MHz
-
7905
-
VDS = 400 V , f = 1.0 MHz
-
221
-
-
400
-
-
-
180
ID = 22 Ab
VGS = 10 V
VDS = 50 V, ID = 22
Ab
μA
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Output Capacitance
Coss
Effective Output Capacitance
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
Turn-On Delay Time
td(on)
Turn-Off Delay Time
Fall Time
VGS = 0 V
Coss eff.
Total Gate Charge
Rise Time
VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5
tr
td(off)
VDS = 0 V to 400 V
VGS = 10 V
ID = 36 A, VDS = 400 V,
see fig. 6 and 13b
VDD = 250 V, ID = 36 A,
RG = 2.15 , RD = 7.0
see fig. 10b
tf
-
-
46
-
-
71
-
23
-
-
98
-
-
52
-
-
80
-
-
-
36
-
-
144
pF
nC
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulsed Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Forward Turn-On Time
ton
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
S
TJ = 25 °C, IS = 36 A, VGS = 0 Vb
TJ = 25 °C, IF = 36 A, dI/dt = 100 A/μsb
-
-
1.5
V
-
570
860
ns
-
8.6
13
μC
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width  300 μs; duty cycle  2 %.
c. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 % to 80 % VDS.
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Document Number: 91258
S11-0111-Rev. C, 07-Feb-11
IRFPS37N50A, SiHFPS37N50A
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
1000
1000
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
I D , Drain-to-Source Current (A)
100
10
4.5V
1
20µs PULSE WIDTH
TJ = 25 °C
0.1
0.1
100
1
10
I D , Drain-to-Source Current (A)
TJ = 150 ° C
TJ = 25 ° C
10
100
V DS = 50V
20µs PULSE WIDTH
5.0
6.0
7.0
8.0
VDS , Drain-to-Source Voltage (V)
VGS , Gate-to-Source Voltage (V)
Fig. 1 - Typical Output Characteristics
Fig. 3 - Typical Transfer Characteristics
3.0
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
TOP
10
4.5V
1
0.1
100
1
4.0
20µs PULSE WIDTH
TJ = 150 ° C
1
10
VDS , Drain-to-Source Voltage (V)
Fig. 2 - Typical Output Characteristics
Document Number: 91258
S11-0111-Rev. C, 07-Feb-11
100
RDS(on) , Drain-to-Source On Resistance
(Normalized)
I D , Drain-to-Source Current (A)
TOP
9.0
ID = 36A
2.5
2.0
1.5
1.0
0.5
0.0
-60 -40 -20
VGS = 10V
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature ( °C)
Fig. 4 - Normalized On-Resistance vs. Temperature
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IRFPS37N50A, SiHFPS37N50A
Vishay Siliconix
1000
V GS = 0V,
f = 1MHz
C iss = C gs + C gd, C dsSHORTED
C rss = C gd
C oss = C ds + C gd
ISD , Reverse Drain Current (A)
C, Capacitance (pF)
100000
10000
100
C iss
1000
C oss
100
TJ = 150 ° C
10
TJ = 25 ° C
1
Crss
10
A
1
10
100
0.1
0.2
1000
V GS = 0 V
0.4
0.6
0.8
1.0
1.2
1.4
VDS , Drain-to-Source Voltage (V)
VSD ,Source-to-Drain Voltage (V)
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
Fig. 7 - Typical Source-Drain Diode Forward Voltage
1000
ID = 36A
OPERATION IN THIS AREA LIMITED
BY RDS(on)
VDS = 400V
VDS = 250V
VDS = 100V
16
ID , Drain Current (A)
VGS , Gate-to-Source Voltage (V)
20
10us
100
12
8
100us
10
4
FOR TEST CIRCUIT
SEE FIGURE 13
0
0
40
80
120
160
200
QG , Total Gate Charge (nC)
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
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1
1ms
10ms
TC = 25 ° C
TJ = 150 ° C
Single Pulse
10
100
1000
10000
VDS , Drain-to-Source Voltage (V)
Fig. 8 - Maximum Safe Operating Area
Document Number: 91258
S11-0111-Rev. C, 07-Feb-11
IRFPS37N50A, SiHFPS37N50A
Vishay Siliconix
RD
VDS
40
VGS
D.U.T.
ID , Drain Current (A)
RG
+
- VDD
30
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
20
Fig. 10a - Switching Time Test Circuit
VDS
10
90 %
0
25
50
75
100
125
150
10 %
VGS
TC , Case Temperature ( ° C)
td(on)
Fig. 9 - Maximum Drain Current vs. Case Temperature
td(off) tf
tr
Fig. 10b - Switching Time Waveforms
Thermal Response (Z thJC )
1
D = 0.50
0.1
0.01
0.20
0.10
0.05
0.02
0.01
0.001
0.00001
PDM
t1
SINGLE PULSE
(THERMAL RESPONSE)
t2
Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.0001
0.001
0.01
0.1
1
t1 , Rectangular Pulse Duration (sec)
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
Document Number: 91258
S11-0111-Rev. C, 07-Feb-11
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IRFPS37N50A, SiHFPS37N50A
Vishay Siliconix
V DSav , Avalanche Voltage (V)
580
15 V
Driver
L
VDS
D.U.T.
RG
+
A
- VDD
IAS
20 V
tp
0.01 Ω
Fig. 12a - Unclamped Inductive Test Circuit
560
540
520
500
A
0
VDS
10
20
30
40
I av , Avalanche Current (A)
tp
Fig. 12d - Maximum Avalanche Energy vs. Drain Current
IAS
QG
10 V
Fig. 12b - Unclamped Inductive Waveforms
QGS
EAS , Single Pulse Avalanche Energy (mJ)
3000
TOP
2500
BOTTOM
ID
16A
23A
36A
QGD
VG
Charge
2000
Fig. 13a - Basic Gate Charge Waveform
1500
1000
Current regulator
Same type as D.U.T.
500
50 kΩ
12 V
0.2 µF
0.3 µF
0
25
50
75
100
125
150
+
Starting TJ , Junction Temperature ( °C)
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
D.U.T.
-
VDS
VGS
3 mA
IG
ID
Current sampling resistors
Fig. 13b - Gate Charge Test Circuit
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Document Number: 91258
S11-0111-Rev. C, 07-Feb-11
IRFPS37N50A, SiHFPS37N50A
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T.
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
Rg
•
•
•
•
+
dV/dt controlled by Rg
Driver same type as D.U.T.
ISD controlled by duty factor “D”
D.U.T. - device under test
+
-
VDD
Driver gate drive
P.W.
Period
D=
P.W.
Period
VGS = 10 Va
D.U.T. lSD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
Inductor current
VDD
Body diode forward drop
Ripple ≤ 5 %
ISD
Note
a. VGS = 5 V for logic level devices
Fig. 14 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?91258.
Document Number: 91258
S11-0111-Rev. C, 07-Feb-11
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Package Information
Vishay Siliconix
TO-274AA (HIGH VOLTAGE)
B
A
E
E4
A
D2
E1
A1
R
D1
D
L1
L
Detail “A”
C
b
e
A2
0.10 (0.25) M B A M
10°
b4
b2
Lead Tip
5°
Detail “A”
Scale: 2:1
MILLIMETERS
DIM.
MIN.
MAX.
INCHES
MIN.
MAX.
MILLIMETERS
DIM.
MIN.
MAX.
INCHES
MIN.
MAX.
A
4.70
5.30
0.185
0.209
D1
15.50
16.10
0.610
0.634
A1
1.50
2.50
0.059
0.098
D2
0.70
1.30
0.028
0.051
A2
2.25
2.65
0.089
0.104
E
15.10
16.10
0.594
0.634
b
1.30
1.60
0.051
0.063
E1
13.30
13.90
0.524
0.547
b2
1.80
2.20
0.071
0.087
e
b4
3.00
3.25
0.118
0.128
L
13.70
14.70
0.539
0.579
c
0.80
1.20
0.031
0.047
L1
1.00
1.60
0.039
0.063
D
19.80
20.80
0.780
0.819
R
2.00
3.00
0.079
0.118
5.45 BSC
0.215 BSC
ECN: S-82247-Rev. A, 06-Oct-08
DWG: 5975
Notes
1. Dimensioning and tolerancing per ASME Y14.5M-1994.
2. Dimension D and E do not include mold flash. Mold flash shall not exceed 0.127 mm (0.005") per side. These dimensions are measured at the
outer extremes of the plastic body.
3. Outline conforms to JEDEC outline to TO-274AA.
Document Number: 91365
Revision: 06-Oct-08
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Please note that some Vishay documentation may still make reference to RoHS Directive 2002/95/EC. We confirm that
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Revision: 02-Oct-12
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Document Number: 91000