NX5P1000 Logic controlled high-side power switch Rev. 2 — 14 January 2014 Product data sheet 1. General description The NX5P1000 is an advanced power switch and ESD- protection device for USB OTG applications. The device includes under voltage and over voltage lockout, over-current, over-temperature, reverse bias and in-rush current protection circuits. These circuits are designed to isolate a VBUS OTG voltage source automatically from a VBUS interface pin when a fault condition occurs. The device features two power switch terminals, one input (VINT) and one output (VBUS). It has a current limit input (ILIM) for defining the over-current and in-rush current limit. A voltage detect output (VDET) is used to determine when VINT is in the correct voltage range. An open-drain fault output (FAULT) indicates when a fault condition has occurred and an enable input (EN) controls the state of the switch. When EN is set LOW the device enters a low-power mode, disabling all protection circuits except the undervoltage lockout. The low-power mode can be entered at anytime unless the over temperature protection circuit has been triggered. Designed for operation from 3 V to 5.5 V, it is used in power domain isolation applications to protect from out of range operation. The enable input includes integrated logic level translation making the device compatible with lower voltage processors and controllers. 2. Features and benefits Wide supply voltage range from 3 V to 5.5 V 30 V tolerant on VBUS ISW maximum 1 A continuous current Very low ON resistance: 100 m (maximum) at a supply voltage of 4.0 V Low-power mode (ground current 20 A typical) 1.8 V control logic Soft start turn-on slew rate Protection circuitry Over-temperature protection Over-current protection with low current output mode Reverse bias current/Back drive protection Overvoltage lockout Undervoltage lockout Analog voltage limited VBUS monitor path ESD protection: HBM ANSI/ESDA/JEDEC JS-001 Class 2 exceeds 2 kV IEC61000-4-2 contact discharge exceeds 8 kV for pins VBUS, D, D+ and ID Specified from 40 C to +85 C NX5P1000 NXP Semiconductors Logic controlled high-side power switch 3. Applications USB OTG applications 4. Ordering information Table 1. Ordering information Type number Package Temperature range Name NX5P1000UK 40 C to +85 C Description Version WLCSP12 wafer level chip-scale package; 12 bumps; 1.36 1.66 0.51 mm, 0.4 mm pitch (Backside Coating included) NX5P1000 5. Marking Table 2. Marking codes Type number Marking code NX5P1000UK NX5P1 6. Functional diagram (1 9%86 9,17 ' 9'(7 ' ,/,0 ,' )$8/7 DDD Fig 1. Logic symbol NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 2 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 10 mA CURRENT SOURCE REVERSE-CURRENT PROTECTION ILIM OVER-CURRENT PROTECTION VBUS VINT UVLO/OVLO PROT VDET CONTROL DD+ ID EN FAULT 125 °C PROT aaa-007136 Fig 2. Logic diagram (simplified schematic) 7. Pinning information 7.1 Pinning 1;3 EDOO$ LQGH[DUHD 1;3 $ $ 9,17 9'(7 9%86 % % 9,17 )$8/7 9%86 & & (1 *1' ,' ' ' ,/,0 ' ' DDD DDD 7UDQVSDUHQWWRSYLHZ Fig 3. 7UDQVSDUHQWWRSYLHZ Pin configuration WLCSP12 package Fig 4. Ball mapping for WLCSP12 7.2 Pin description Table 3. Pin description Symbol Pin Description VINT A1, B1 internal circuitry voltage I VBUS A3, B3 external connector voltage O EN C1 enable input (active HIGH) I ILIM D1 current limiter I/O NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 3 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch Table 3. Pin description …continued Symbol Pin Description VDET A2 VBUS voltage level indicator O FAULT B2 fault condition indicator (open-drain; active LOW) GND C2 ground (0 V) D- D2 ESD-protection I/O D+ D3 ESD-protection I/O ID C3 ESD-protection I/O 8. Functional description Table 4. Function table[1] EN VINT VBUS FAULT Operation mode X 0V Z L no supply X 0V < 30 V Z disabled; switch open X < 3.2 V Z L undervoltage lockout; switch open H > 5.5 V Z L overvoltage lockout; switch open H 3.2 V to 5.5 V Z L over-temperature; switch open L 3.2 V to 5.5 V Z Z disabled; switch open H 3.2 V to 5.5 V VBUS = VINT Z enabled; switch closed; active H 3.2 V to 5.5 V 0 V to VINT L over-current; switch open; constant current on VBUS H 3.2 V to 5.5 V 0 V to VINT L when ILIM is connected to GND, VBUS is supplied with 10 mA current source H 3.2 V to 5.5 V VINT + 30 mV < VBUS < VINT + 0.45 V (> 4 ms) L reverse bias current/back drive; switch open H 3.2 V to 5.5 V VBUS > VINT + 0.45 V L reverse bias current/back drive; switch open [1] H = HIGH voltage level; L = LOW voltage level, Z = high-impedance OFF-state, X = Don’t care. Table 5. Function table VDET versus VBUS[1] VBUS VDET 3 V < VBUS < 30 V 1.5 < VDET < 5.5 V VDET detects VBUS voltage [1] Operation mode See Figure 22. 8.1 EN input When the EN is set LOW, the N-channel MOSFET is disabled. The device enters low-power mode disabling all protection circuits except the undervoltage lockout circuit and setting the FAULT output high impedance. When EN is set HIGH, all protection circuits are enabled. If an RILIM current limit resistor is detected and no fault conditions exist, the N-channel MOSFET is enabled. 8.2 Undervoltage lockout Independent of the logic level on the EN pin, the undervoltage lockout (UVLO) circuit disables the N-channel MOSFET. It sets the FAULT output LOW and enters low-power mode until VINT > 3.2 V. Once VINT > 3.2 V, the state of the N-channel MOSFET controls the EN pin. The UVLO circuit remains active in low-power mode. NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 4 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 8.3 Overvoltage lockout When EN is set HIGH, the overvoltage lockout (OVLO) circuit disables the N-channel MOSFET. If VINT > 5.75 V, the FAULT output is set LOW. The OVLO circuit is disabled in low-power mode and does not influence the FAULT output state. If the OVLO circuit is active, setting the EN pin LOW returns the device to low-power mode. 8.4 ILIM The over-current protection circuit's (OCP) trigger value Iocp, can be set using an external resistor RILIM connected to the ILIM pin (see Figure 6). When EN is set HIGH and the ILIM pin is grounded, the N-channel MOSFET is disabled. In addition, VBUS is supplied by the 10 mA current source and the FAULT output set LOW. 8.5 Over-current protection If the current through the N-channel MOSFET exceeds Iocp for 20 s or VBUS < VINT 200 mV, the over-current protection (OCP) circuit disables the N-channel MOSFET within 2 s. It supplies VBUS from the 10 mA current source and indicates a fault condition by setting the FAULT pin LOW. The OCP circuit is automatically reset when VINT > VBUS > VINT 200 mV for 20 s. The N-channel MOSFET assumes the state defined by the EN input, the 10 mA current source is disconnected and the FAULT pin is set high impedance. If the OCP circuit is active, setting the EN pin LOW returns the device to low-power mode. 8.6 Over-temperature protection When EN is set HIGH and the device temperature exceeds 125 °C, the Over-temperature protection (OTP) circuit disables the N-channel MOSFET. It indicates a fault condition by setting the FAULT pin LOW. Any transition on the EN pin has no effect. Once the device temperature decreases to below 115 °C, the device returns to the defined state. The OTP circuit is disabled in low-power mode. However, if the OTP circuit is active, setting the EN pin LOW does not return the device to low-power mode. 8.7 Reverse bias current/back drive protection When EN is set HIGH, if (VINT + 30 mV) < VBUS < (VINT + 0.45 V) for longer than 4 ms, or if VBUS > (VINT + 0.45 V), the reverse-bias current protection circuit (RCP) disables the N-channel MOSFET. It indicates a fault condition by setting the FAULT pin LOW. Once VBUS < VINT for longer than 4 ms the device returns to the defined state. If the RCP circuit is active, setting the EN pin LOW returns the device to low-power mode. 8.8 FAULT output The FAULT output is an open-drain output that requires an external pull-up resistor. If any of the UVLO, OVLO, RCP, OCP or OTP circuits are activated the FAULT output is set LOW to indicate a fault has occurred. The FAULT output returns to the high impedance state automatically once the fault condition is removed. 8.9 VDET output VDET is an analog output that allows a controller to monitor the voltage level on VBUS. NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 5 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 8.10 In-rush current protection When either the EN pin or a recovered fault condition enables the N-channel MOSFET, the in-rush current protection circuit affects the switch. It causes the switch to behave as a current source during the time VBUS ramps up to VINT - 200 mV. The resistor connected to ILIM determines the current. The in-rush current protection circuit is disabled in low-power mode. 9. Application diagram The NX5P1000 typically connects a voltage source on VINT to the VBUS of a USB connector supporting USB3 OTG in a portable, battery operated device. The external resistor RILIM sets the maximum current limit threshold. The FAULT signal requires an additional external pull-up resistor. This resistor should be connected to a supply voltage matching the logic input pin supply level it is connected to. P$ &855(176285&( 5(9(56(&855(17 3527(&7,21 29(5&855(17 3527(&7,21 ,/,0 9,17 9%86 89/229/2 3527 & Q) 5SX 9'(7 ' ' ,' &21752/ (1 & ) 86%27*9%86 92/7$*( 6285&( $1' &21752/ )$8/7 & 3527 5,/,0 *1' DDD Fig 5. NX5P1000 application diagram NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 6 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 10. Limiting values Table 6. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V). Symbol Parameter input voltage VI Conditions Min Max Unit VBUS [1] 0.5 +32 V VINT [1] 0.5 +6.0 V EN, ILIM [2] 0.5 VINT + 0.5 V D-, D+, ID [1] 0.5 +6.0 V VO output voltage FAULT 0.5 +6.0 V IIK input clamping current EN: VI < 0.5 V 50 - mA ISK switch clamping current VBUS; VINT; VI < 0.5 V 50 - mA ISW switch current - 1000 mA Tj(max) maximum junction temperature 40 +125 C Tstg storage temperature 65 +150 C - 100 mW Tamb = 85 °C [3] total power dissipation Ptot [1] The minimum and maximum switch voltage ratings may be exceeded if the switch clamping current rating is observed. [2] The minimum input voltage rating may be exceeded if the input current rating is observed. [3] The (absolute) maximum power dissipation depends on the junction temperature Tj. Higher power dissipation is allowed in conjunction with lower ambient temperatures. The conditions to determine the specified values are Tamb = 85 °C and the use of a two layer PCB. 11. Recommended operating conditions Table 7. Recommended operating conditions Symbol Parameter Conditions Min Max Unit VI input voltage VINT 3.0 5.5 V EN, ILIM 0 VINT V VO output voltage VBUS; EN = LOW 0 30 V VI/O input/output voltage D-, D+, ID 0 5.5 V Tamb ambient temperature 40 +85 C 12. Thermal characteristics Table 8. Symbol Rth(j-a) Thermal characteristics Parameter Conditions thermal resistance from junction to ambient [1][2] Typ Unit 73 K/W [1] The overall Rth(j-a) can vary depending on the board layout. To minimize the effective Rth(j-a), all pins must have a solid connection to larger Cu layer areas e.g. to the power and ground layer. In multi-layer PCB applications, the second layer should be used to create a large heat spreader area right below the device. If this layer is either ground or power, it should be connected with several vias to the top layer connecting to the device ground or supply. Try not to use any solder-stop varnish under the chip. [2] Rely on the measurement data given for a rough estimation of the Rth(j-a) in your application. The actual Rth(j-a) value may vary in applications using different layer stacks and layouts NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 7 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 13. Static characteristics Table 9. Static characteristics VI(VINT) = 4.0 V to 5.5 V; unless otherwise specified; Voltages are referenced to GND (ground = 0 V). Symbol Parameter Tamb = 25 C Conditions Tamb = 40 C to +85 C Unit Min Typ[1] Max Min Max VIH HIGH-level input voltage EN input 1.2 - - 1.2 - V VIL LOW-level input voltage EN input - - 0.4 - 0.4 V VO output voltage VDET; IVDET = 2 mA; 3V < VBUS < 30 V 1.5 - 5.5 1.5 5.5 V VOL LOW-level output voltage FAULT, IO = 8 mA - - 0.5 - 0.5 V IO output current Iocp overcurrent protection current Current source - 10 - 8 15 mA EN = HIGH; FAULT = Hi-Z - - IOS - IOS mA EN = HIGH; see Figure 6 - - - - - mA Rpu pull-up resistance FAULT 20 - 200 - - k Vpu pull-up voltage FAULT - - VINT - VINT V RILIM current limit resistance ILIM 40 - 300 40 300 k IGND ground current VBUS open; EN = LOW; see Figure 7 and Figure 8 - 20 - - 40 A VBUS open; EN = HIGH; see Figure 7 and Figure 8 - 220 - - 330 A IOFF power-off leakage current VBUS = 0 V to 30 V; VINT = 0 V; see Figure 9 [2] - 2 - - 20 A IS(OFF) OFF-state leakage current VBUS = 0 V to 30 V; see Figure 10 and Figure 11 [2] - 2 - - 20 A VUVLO undervoltage lockout voltage 3.0 3.2 3.4 3.0 3.4 V VOVLO overvoltage lockout voltage 5.5 5.75 6.0 5.5 6.0 V - 150 - - - mV - - - pF Vhys(OVLO) overvoltage lockout hysteresis voltage CI/O input/output capacitance D-, D+, ID - 3 CI input capacitance EN - 2 - - - pF CS(ON) ON-state capacitance - - 1 - 1 nF [1] Typical values are measured at Tamb = 25 C and VI(VINT) = 5.0 V. [2] Typical value is measured at Tamb = 25 C and VI(VBUS) = 5.0 V. NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 8 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 13.1 Graphs DDD &XUUHQW OLPLW $ DDD ,*1' $ 5,/,0Nȍ 7DPE& (1) Enabled (2) Disabled Fig 6. Typical over-current and in-rush current limit versus the external resistor value. Fig 7. DDD ,*1' $ Typical ground current versus temperature DDD ,2)) $ 9,(19 9,9%869 (1) Tamb = 85 C (2) Tamb = 25 C (3) Tamb = 40 C Fig 8. Typical ground current versus input voltage NX5P1000 Product data sheet Fig 9. Typical power-off leakage current versus input voltage on pin VBUS All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 9 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch DDD ,62)) $ DDD ,62)) $ 9,9%869 (1) Tamb = 85 C (1) VI(VBUS) = 15.0 V (2) Tamb = 25 C (2) VI(VBUS) = 10.0 V (3) Tamb = 40 C (3) VI(VBUS) = 5.0 V Fig 10. Typical OFF-state leakage current versus input voltage on pin VBUS 7DPE& Fig 11. Typical OFF-state leakage current versus temperature 13.2 ON resistance Table 10. ON resistance At recommended operating conditions; voltages are referenced to GND (ground = 0 V) Symbol Parameter RON Tamb = 25 C Conditions Tamb = 40 C to +85 C Unit Min Typ Max Min Max - 60 - - 100 ON resistance switch enabled; ILOAD = 200 mA; see Figure 12, Figure 13 and Figure 14 VI(VINT) = 4.0 V to 5.5 V m 13.3 ON resistance test circuit and waveforms 96: (1 9 9%86 9,17 *1' ,/2$' 9, DDD RON = VSW / ILOAD. Fig 12. Test circuit for measuring ON resistance NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 10 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch DDD 521 Pȍ 521 Pȍ DDD 7DPE& (1) VI(VINT) = 5.5 V (1) Tamb = 85 C (2) VI(VINT) = 4.0 V (2) Tamb = 25 C 9,179 (3) Tamb = 40 C Fig 13. Typical ON resistance versus temperature Fig 14. Typical ON resistance versus input voltage 14. Dynamic characteristics Table 11. Dynamic characteristics At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for test circuit see Figure 16. VI(VINT) = 4.0 V to 5.5 V. Symbol Parameter Tamb = 25 C Conditions Tamb = 40 C to +85 C Min Typ Max Min Max Unit ten enable time EN to VBUS; see Figure 15 - 0.24 - 0.16 - ms tdis disable time EN to VBUS; see Figure 15 - 1.5 - - - ms ton turn-on time EN to VBUS; see Figure 15 - 0.63 - 0.52 - ms toff turn-off time EN to VBUS; see Figure 15 - 34.5 - - - ms tTLH LOW to HIGH output transition time VBUS; see Figure 15 - 0.39 - 0.16 - ms tTHL HIGH to LOW output transition time VBUS; see Figure 15 - 33 - - - ms NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 11 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 14.1 Waveforms, graphs and test circuit 9, (1LQSXW 90 *1' 92+ WRQ WRII WGLV WHQ 9; 9%86RXWSXW 9< *1' W7/+ W7+/ DDD Measurement points are given in Table 12. Logic level: VOH is the typical output voltage that occurs with the output load. Fig 15. Switching times Table 12. Measurement points Supply voltage EN Input Output VI(VINT) VM VX VY 4.0 V to 5.5 V 0.5 VI 0.9 VOH 0.1 VOH (1 9%86 * 9, 5/ 9,17 9(;7 &/ DDD Test data is given in Table 13. Definitions test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. VEXT = External voltage for measuring switching times. Fig 16. Test circuit for measuring switching times Table 13. Test data Supply voltage Input Load VEXT VI CL RL 4.0 V to 5.5 V 1.5 V 100 F 150 NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 12 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch DDD DDD (1 9%86 9 ,9,17 $ ,9,17 $ (1 9%86 9 WPV WPV EN = 1.5 V; VINT = 4 V; RL = 150 ; CL = 220 F; RILIM = 50 k; Tamb = 25 C. EN = 1.5 V; VINT = 5.5 V; RL = 150 ; CL = 220 F; RILIM = 50 k; Tamb = 25 C. (1) EN (1) EN (2) VBUS (2) VBUS (3) II(VINT) (3) II(VINT) Fig 17. Typical enable time and in-rush current DDD Fig 18. Typical enable time and in-rush current DDD 9%86 9 WHQ V 5,/,0Nȍ EN = 1.5 V; VINT = 4 V; RL = 150 ; CL = 100 F; Tamb = 25 C. Fig 19. Typical enable time versus current limit resistance (RILIM) NX5P1000 Product data sheet WPV EN = 1.5 V; VINT = 4 V; RL = 150 ; CL = 100 F; RILIM = 50 k; Tamb = 25 C. Fig 20. Typical disable time All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 13 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch DDD DDD 9'(7 9 9%86 9 WPV 9%869 EN = 1.5 V; VINT = 5.5 V; RL = 150 ; CL = 100 F; RILIM = 50 k; Tamb = 25 C. Fig 21. Typical disable time NX5P1000 Product data sheet Fig 22. Typical VDET versus VBUS All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 14 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 15. Package outline :/&63ZDIHUOHYHOFKLSVFDOHSDFNDJH EXPSV[[PPPPSLWFK%DFNVLGHFRDWLQJLQFOXGHG $ ( 1;3 % $ EDOO$ LQGH[DUHD $ ' $ GHWDLO; H H & Y Z E & $ % & \ ' H & H H % $ EDOO$ LQGH[DUHD ; PP VFDOH 'LPHQVLRQVPPDUHWKHRULJLQDOGLPHQVLRQV 8QLW PP $ PD[ QRP PLQ $ $ E ' ( H H H Y Z \ ZOFVSBQ[SBSR 2XWOLQH YHUVLRQ 5HIHUHQFHV ,(& -('(& -(,7$ (XURSHDQ SURMHFWLRQ ,VVXHGDWH 1;3 Fig 23. Package outline NX5P1000 (WLCSP12) NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 15 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 16. Abbreviations Table 14. Abbreviations Acronym Description CDM Charged Device Model DUT Device Under Test ESD ElectroStatic Discharge HBM Human Body Model MOSFET Metal-Oxide Semiconductor Field Effect Transistor OCP Overcurrent Protection OTP Overtemperature Protection RCP Reverse Current Protection USB OTG Universal Serial Bus On-The-Go UVLO Undervoltage lockout VBUS USB Power Supply OVLO Overvoltage lockout 17. Revision history Table 15. Revision history Document ID Release date Data sheet status Change notice Supersedes NX5P1000 v.2 20140114 Product data sheet - NX5P1000 v.1 - - Modifications: NX5P1000 v.1 NX5P1000 Product data sheet • IOS changed into Iocp (errata). 20130429 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 16 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 18. Legal information 18.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 18.2 Definitions Draft — The document is a draft version only. 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This document supersedes and replaces all information supplied prior to the publication hereof. NX5P1000 Product data sheet Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in life support, life-critical or safety-critical systems or equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors and its suppliers accept no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. 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Customer is responsible for doing all necessary testing for the customer’s applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer’s general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 17 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from competent authorities. Non-automotive qualified products — Unless this data sheet expressly states that this specific NXP Semiconductors product is automotive qualified, the product is not suitable for automotive use. It is neither qualified nor tested in accordance with automotive testing or application requirements. NXP Semiconductors accepts no liability for inclusion and/or use of non-automotive qualified products in automotive equipment or applications. In the event that customer uses the product for design-in and use in automotive applications to automotive specifications and standards, customer (a) shall use the product without NXP Semiconductors’ warranty of the product for such automotive applications, use and specifications, and (b) whenever customer uses the product for automotive applications beyond NXP Semiconductors’ specifications such use shall be solely at customer’s own risk, and (c) customer fully indemnifies NXP Semiconductors for any liability, damages or failed product claims resulting from customer design and use of the product for automotive applications beyond NXP Semiconductors’ standard warranty and NXP Semiconductors’ product specifications. Translations — A non-English (translated) version of a document is for reference only. The English version shall prevail in case of any discrepancy between the translated and English versions. 18.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 19. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] NX5P1000 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 14 January 2014 © NXP B.V. 2014. All rights reserved. 18 of 19 NX5P1000 NXP Semiconductors Logic controlled high-side power switch 20. Contents 1 2 3 4 5 6 7 7.1 7.2 8 8.1 8.2 8.3 8.4 8.5 8.6 8.7 8.8 8.9 8.10 9 10 11 12 13 13.1 13.2 13.3 14 14.1 15 16 17 18 18.1 18.2 18.3 18.4 19 20 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 Functional description . . . . . . . . . . . . . . . . . . . 4 ENinput. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Undervoltage lockout . . . . . . . . . . . . . . . . . . . . 4 Overvoltage lockout . . . . . . . . . . . . . . . . . . . . . 5 ILIM. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Over-current protection. . . . . . . . . . . . . . . . . . . 5 Over-temperature protection . . . . . . . . . . . . . . 5 Reverse bias current/back drive protection . . . 5 FAULToutput . . . . . . . . . . . . . . . . . . . . . . . . . 5 VDEToutput . . . . . . . . . . . . . . . . . . . . . . . . . . 5 In-rush current protection . . . . . . . . . . . . . . . . . 6 Application diagram . . . . . . . . . . . . . . . . . . . . . 6 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 7 Recommended operating conditions. . . . . . . . 7 Thermal characteristics . . . . . . . . . . . . . . . . . . 7 Static characteristics. . . . . . . . . . . . . . . . . . . . . 8 Graphs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 ON resistance . . . . . . . . . . . . . . . . . . . . . . . . . 10 ON resistance test circuit and waveforms . . . 10 Dynamic characteristics . . . . . . . . . . . . . . . . . 11 Waveforms, graphs and test circuit . . . . . . . . 12 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 15 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 16 Legal information. . . . . . . . . . . . . . . . . . . . . . . 17 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 17 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Contact information. . . . . . . . . . . . . . . . . . . . . 18 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2014. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 14 January 2014 Document identifier: NX5P1000