IGW40T120 Data Sheet (300 KB, EN)

IGW40T120
®
TrenchStop Series
Low Loss IGBT in TrenchStop® and Fieldstop technology
C
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Short circuit withstand time – 10s
Designed for :
- Frequency Converters
- Uninterrupted Power Supply
®
TrenchStop and Fieldstop technology for 1200 V applications
offers :
- very tight parameter distribution
- high ruggedness, temperature stable behavior
NPT technology offers easy parallel switching capability due to
positive temperature coefficient in VCE(sat)
Low EMI
Low Gate Charge
1
Qualified according to JEDEC for target applications
Pb-free lead plating; RoHS compliant
Complete product spectrum and PSpice Models : http://www.infineon.com/igbt/
Type
IGW40T120
G
E
PG-TO-247-3
VCE
IC
VCE(sat),Tj=25°C
Tj,max
Marking Code
Package
1200V
40A
1.7V
150C
G40T120
PG-TO-247-3
Maximum Ratings
Parameter
Symbol
Value
Unit
Collector-emitter voltage
VCE
1200
V
DC collector current
IC
A
TC = 25C
75
TC = 100C
40
Pulsed collector current, tp limited by Tjmax
ICpul s
105
Turn off safe operating area
-
105
VGE
20
V
tSC
10
s
Ptot
270
W
C
VCE  1200V, Tj  150C
Gate-emitter voltage
2)
Short circuit withstand time
VGE = 15V, VCC  1200V, Tj  150C
Power dissipation
TC = 25C
Operating junction temperature
Tj
-40...+150
Storage temperature
Tstg
-55...+150
Soldering temperature, 1.6mm (0.063 in.) from case for 10s
-
1
2)
260
J-STD-020 and JESD-022
Allowed number of short circuits: <1000; time between short circuits: >1s.
Power Semiconductors
1
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
Thermal Resistance
Parameter
Symbol
Conditions
Max. Value
Unit
RthJC
0.45
K/W
RthJA
40
Characteristic
IGBT thermal resistance,
junction – case
Thermal resistance,
junction – ambient
Electrical Characteristic, at Tj = 25 C, unless otherwise specified
Parameter
Symbol
Conditions
Value
min.
typ.
max.
1200
-
-
T j =2 5 C
-
1.7
2.3
T j =1 2 5 C
-
2.1
-
T j =1 5 0 C
-
2.3
-
5.0
5.8
6.5
Unit
Static Characteristic
Collector-emitter breakdown voltage
V ( B R ) C E S V G E = 0V , I C = 1 .5m A
Collector-emitter saturation voltage
VCE(sat)
V
V G E = 15 V , I C = 40 A
Gate-emitter threshold voltage
VGE(th)
I C = 1. 5m A, V C E = V G E
Zero gate voltage collector current
ICES
V C E = 12 0 0V ,
V G E = 0V
mA
T j =2 5 C
-
-
0.4
T j =1 5 0 C
-
-
4.0
Gate-emitter leakage current
IGES
V C E = 0V , V G E =2 0 V
-
-
600
nA
Transconductance
gfs
V C E = 20 V , I C = 40 A
-
21
-
S
Integrated gate resistor
RGint
Power Semiconductors
6
2
Ω
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
Dynamic Characteristic
Input capacitance
Ciss
V C E = 25 V ,
-
2500
-
Output capacitance
Coss
V G E = 0V ,
-
130
-
Reverse transfer capacitance
Crss
f= 1 MH z
-
110
-
Gate charge
QGate
V C C = 96 0 V, I C =4 0 A
-
203
-
nC
-
13
-
nH
-
210
-
A
pF
V G E = 15 V
LE
Internal emitter inductance
measured 5mm (0.197 in.) from case
Short circuit collector current
1)
IC(SC)
V G E = 15 V ,t S C  10 s
V C C = 6 0 0 V,
T j = 25  C
Switching Characteristic, Inductive Load, at Tj=25 C
Parameter
Symbol
Conditions
Value
min.
typ.
max.
-
48
-
-
34
-
-
480
-
-
70
-
-
3.3
-
-
3.2
-
-
6.5
-
Unit
IGBT Characteristic
Turn-on delay time
td(on)
Rise time
tr
Turn-off delay time
td(off)
Fall time
tf
Turn-on energy
Eon
Turn-off energy
Eoff
Total switching energy
Ets
T j =2 5 C ,
V C C = 60 0 V, I C = 4 0 A,
V G E = 0/ 15 V ,
R G = 15 ,
2)
L  =1 8 0n H,
2)
C  = 3 9p F
Energy losses include
“tail” and diode
reverse recovery.
ns
mJ
Switching Characteristic, Inductive Load, at Tj=150 C
Parameter
Symbol
Conditions
Value
min.
typ.
max.
-
52
-
-
40
-
-
580
-
-
120
-
-
5.0
-
-
5.4
-
-
10.4
-
Unit
IGBT Characteristic
Turn-on delay time
td(on)
Rise time
tr
Turn-off delay time
td(off)
Fall time
tf
Turn-on energy
Eon
Turn-off energy
Eoff
Total switching energy
Ets
1)
2)
T j =1 5 0 C
V C C = 60 0 V, I C = 4 0 A,
V G E = 0/ 15 V ,
R G = 1 5 ,
2)
L  =1 8 0n H,
2)
C  = 3 9p F
Energy losses include
“tail” and diode
reverse recovery.
ns
mJ
Allowed number of short circuits: <1000; time between short circuits: >1s.
Leakage inductance L  a nd Stray capacity C  due to dynamic test circuit in Figure E.
Power Semiconductors
3
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
100A
tp=3µs
100A
80A
10µs
IC, COLLECTOR CURRENT
IC, COLLECTOR CURRENT
TC=80°C
TC=110°C
60A
40A
Ic
20A
10A
50µs
150µs
500µs
1A
Ic
20ms
DC
0A
10Hz
100Hz
1kHz
10kHz
0,1A
1V
100kHz
f, SWITCHING FREQUENCY
Figure 1. Collector current as a function of
switching frequency
(Tj  150C, D = 0.5, VCE = 600V,
VGE = 0/+15V, RG = 15)
10V
100V
1000V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 2. Safe operating area
(D = 0, TC = 25C,
Tj 150C;VGE=15V)
70A
60A
IC, COLLECTOR CURRENT
Ptot, POWER DISSIPATION
250W
200W
150W
100W
50W
0W
25°C
50A
40A
30A
20A
10A
50°C
75°C
100°C
0A
25°C
125°C
TC, CASE TEMPERATURE
Figure 3. Power dissipation as a function of
case temperature
(Tj  150C)
Power Semiconductors
4
75°C
125°C
TC, CASE TEMPERATURE
Figure 4. Collector current as a function of
case temperature
(VGE  15V, Tj  150C)
Rev. 2.4
Nov. 09
IGW40T120
®
100A
100A
90A
90A
80A
VGE=17V
70A
15V
IC, COLLECTOR CURRENT
IC, COLLECTOR CURRENT
TrenchStop Series
13V
60A
11V
50A
9V
40A
7V
30A
VGE=17V
70A
15V
13V
60A
11V
50A
9V
40A
7V
30A
20A
20A
10A
10A
0A
0A
0V
1V
2V
3V
4V
5V
6V
0V
100A
90A
80A
70A
60A
50A
40A
30A
20A
TJ=150°C
25°C
10A
0A
0V
2V
4V
6V
8V
10V
12V
VGE, GATE-EMITTER VOLTAGE
Figure 7. Typical transfer characteristic
(VCE=20V)
Power Semiconductors
1V
2V
3V
4V
5V
6V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 6. Typical output characteristic
(Tj = 150°C)
VCE(sat), COLLECTOR-EMITT SATURATION VOLTAGE
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 5. Typical output characteristic
(Tj = 25°C)
IC, COLLECTOR CURRENT
80A
3,5V
IC=80A
3,0V
2,5V
2,0V
IC=40A
1,5V
IC=25A
1,0V
IC=10A
0,5V
0,0V
-50°C
0°C
50°C
100°C
TJ, JUNCTION TEMPERATURE
Figure 8. Typical collector-emitter
saturation voltage as a function of
junction temperature
(VGE = 15V)
5
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
td(off)
100ns
t, SWITCHING TIMES
t, SWITCHING TIMES
1000 ns
tf
td(on)
tr
10ns
td(off)
tf
100 ns
td(on)
tr
10 ns
1ns
0A
20A
40A
1 ns

60A
IC, COLLECTOR CURRENT
Figure 9. Typical switching times as a
function of collector current
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, RG=15Ω,
Dynamic test circuit in Figure E)




RG, GATE RESISTOR
Figure 10. Typical switching times as a
function of gate resistor
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, IC=40A,
Dynamic test circuit in Figure E)
VGE(th), GATE-EMITT TRSHOLD VOLTAGE
t, SWITCHING TIMES
td(off)
100ns
tf
td(on)
tr
10ns
0°C
50°C
100°C
150°C
TJ, JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
function of junction temperature
(inductive load, VCE=600V,
VGE=0/15V, IC=40A, RG=15Ω,
Dynamic test circuit in Figure E)
Power Semiconductors
7V
6V
max.
5V
typ.
4V
min.
3V
2V
1V
0V
-50°C
0°C
50°C
100°C
150°C
TJ, JUNCTION TEMPERATURE
Figure 12. Gate-emitter threshold voltage as
a function of junction temperature
(IC = 1.5mA)
6
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
*) Eon and Ets include losses
due to diode recovery
Ets*
20,0mJ
15,0mJ
Eon*
10,0mJ
Eoff
5,0mJ
0,0mJ
10A
20A
30A
40A
50A
60A
10 mJ
Eon*
Eoff
5 mJ
0 mJ
70A
IC, COLLECTOR CURRENT
Figure 13. Typical switching energy losses
as a function of collector current
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, RG=15Ω,
Dynamic test circuit in Figure E)




RG, GATE RESISTOR
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, IC=40A,
Dynamic test circuit in Figure E)
*) Eon and Ets include losses
due to diode recovery
*) Eon and Ets include losses
due to diode recovery
15mJ
Ets*
10mJ
Eoff
5mJ
Eon*
E, SWITCHING ENERGY LOSSES
15mJ
E, SWITCHING ENERGY LOSSES
Ets*
15 mJ
25,0mJ
E, SWITCHING ENERGY LOSSES
E, SWITCHING ENERGY LOSSES
*) Eon and Etsinclude losses
due to diode recovery
10mJ
Ets*
5mJ E
off
Eon*
0mJ
50°C
100°C
0mJ
400V
150°C
TJ, JUNCTION TEMPERATURE
Figure 15. Typical switching energy losses
as a function of junction
temperature
(inductive load, VCE=600V,
VGE=0/15V, IC=40A, RG=15Ω,
Dynamic test circuit in Figure E)
Power Semiconductors
500V
600V
700V
800V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 16. Typical switching energy losses
as a function of collector emitter
voltage
(inductive load, TJ=150°C,
VGE=0/15V, IC=40A, RG=15Ω,
Dynamic test circuit in Figure E)
7
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
1nF
15V
240V
c, CAPACITANCE
VGE, GATE-EMITTER VOLTAGE
Ciss
960V
10V
Crss
5V
0V
10pF
0nC
50nC
100nC
150nC
200nC
IC(sc), short circuit COLLECTOR CURRENT
10µs
5µs
12V
14V
20V
300A
200A
100A
0A
16V
VGE, GATE-EMITTETR VOLTAGE
Figure 19. Short circuit withstand time as a
function of gate-emitter voltage
(VCE=600V, start at TJ=25°C)
Power Semiconductors
10V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 18. Typical capacitance as a function
of collector-emitter voltage
(VGE=0V, f = 1 MHz)
15µs
0µs
0V
250nC
QGE, GATE CHARGE
Figure 17. Typical gate charge
(IC=40 A)
tSC, SHORT CIRCUIT WITHSTAND TIME
Coss
100pF
12V
14V
16V
18V
VGE, GATE-EMITTETR VOLTAGE
Figure 20. Typical short circuit collector
current as a function of gateemitter voltage
(VCE  600V, Tj  150C)
8
Rev. 2.4
Nov. 09
IGW40T120
®
VCE
600V
60A
400V
40A
200V
20A
600V
60A
40A
IC
400V
200V
20A
VCE
IC
0V
0A
0us
0.5us
1us
1.5us
t, TIME
Figure 21. Typical turn on behavior
(VGE=0/15V, RG=15Ω, Tj = 150C,
Dynamic test circuit in Figure E)
ZthJC, TRANSIENT THERMAL RESISTANCE
IC, COLLECTOR CURRENT
VCE, COLLECTOR-EMITTER VOLTAGE
TrenchStop Series
0A
0us
0V
0.5us
1us
1.5us
t, TIME
Figure 22. Typical turn off behavior
(VGE=15/0V, RG=15Ω, Tj = 150C,
Dynamic test circuit in Figure E)
D=0.5
-1
10 K/W
0.2
0.1
0.05
-2
10 K/W
R,(K/W)
0.159
0.133
0.02
0.120
0.01
0.038
single pulse
R1
, (s)
1.10*10-1
1.56*10-2
1.35*10-3
1.51*10-4
R2
C 1 =  1 /R 1
C 2 =  2 /R 2
10ms
100ms
-3
10 K/W
10µs
100µs
1ms
tP, PULSE WIDTH
Figure 23. IGBT transient thermal resistance
(D = tp / T)
Power Semiconductors
9
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
PG-TO247-3
Power Semiconductors
10
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
1
2
r1
n
r2
rn
Tj (t)
p(t)
r1
r2
rn
Figure A. Definition of switching times
TC
Figure D. Thermal equivalent
circuit
Figure B. Definition of switching losses
Power Semiconductors
Figure E. Dynamic test circuit
Leakage inductance L =180nH
an d Stray capacity C  =39pF.
11
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
Power Semiconductors
12
Rev. 2.4
Nov. 09
IGW40T120
®
TrenchStop Series
Edition 2006-01
Published by
Infineon Technologies AG
81726 München, Germany
© Infineon Technologies AG 12/7/11.
All Rights Reserved.
Attention please!
The information given in this data sheet shall in no event be regarded as a guarantee of conditions or
characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein, any typical
values stated herein and/or any information regarding the application of the device, Infineon Technologies
hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of
non-infringement of intellectual property rights of any third party.
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For further information on technology, delivery terms and conditions and prices please contact your nearest
Infineon Technologies Office (www.infineon.com).
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in question please contact your nearest Infineon Technologies Office.
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Power Semiconductors
13
Rev. 2.4
Nov. 09