IDT 830584AGILF

ICS830584I
LOW SKEW, PCI-X 1-TO-4 FANOUT BUFFER
GENERAL DESCRIPTION
FEATURES
The ICS830584I is a low skew, general purpose
ICS
PCI-X 1-to-4 Fanout Buffer and a member of the
HiPerClockS™ HiPerClockS™ family of High Performance Clock
Solutions from IDT. Guaranteed output and partto-part skew characteristics make the ICS830584I
ideal for those clock distribution applications demanding well
defined performance and repeatablility. The ICS830584I is designed and characterized from -40°C to 85°C for industrial
applications and is packaged in an 8 TSSOP package.
• General purpose and PCI-X 1:4 clock buffer
• Four single-ended LVCMOS/LVTTL clock outputs
• One single-ended LVCMOS/LVTTL clock input
•
Maximum output frequency: 140MHz
• Output enable control (outputs disabled in logic low state)
•
Output skew: 100ps (maximum)
•
Part-to-part skew: 400ps (maximum)
• Additive phase jitter, RMS: 0.15ps (typical)
• Space-saving 8 lead TSSOP package
• Full 3.3V operating supply mode
•
-40°C to 85°C ambient operating temperature
• Available in lead-free (RoHS 6) packages
BLOCK DIAGRAM
PIN ASSIGNMENT
CLKIN
OE
Q0
GND
Q0
Q1
8
7
6
5
Q3
Q2
VDD
Q1
ICS830584I
CLKIN
8-Lead TSSOP
4.40mm x 3.0mm x 0.925mm
package body
G Package
Top View
Q2
Q3
OE
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2
3
4
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TABLE 1. PIN DESCRIPTIONS
Number
Name
Type
Description
Single-ended clock input reference signal.
LVCMOS/LVTTL interface levels.
Output enable control input pin. See Table 3, Function Table.
LVCMOS / LVTTL interface levels.
Single-ended clock outputs. LVCMOS/LVTTL interface levels.
1
CLKIN
Input
2
OE
Input
3, 5, 7. 8
Q0, Q1, Q2, Q3
Output
4
GND
Power
Power supply ground.
6
VDD
Power
Positive supply pin.
TABLE 2. PIN CHARACTERISTICS
Test Conditions
Minimum
Typical
Maximum
Units
Symbol
Parameter
CIN
Input Capacitance
4
pF
ROUT
Output Impedance
15
Ω
TABLE 3. FUNCTION TABLE
Inputs
OE
0
CLKIN
0
Outputs
Q0:Q3
0
0
1
0
1
0
0
1
1
1
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ABSOLUTE MAXIMUM RATINGS
Supply Voltage, VDD
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause per manent damage to the
device. These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability.
4.6V
Inputs, VI
-0.5V to VDD + 0.5 V
Outputs, VO
-0.5V to VDD + 0.5V
Package Thermal Impedance, θJA 121.5°C/W (0 mps)
Storage Temperature, TSTG
-65°C to 150°C
TABLE 4A. RECOMMENDED OPERATING CONDITIONS, VDD = 3.3V ± 0.3V, TA = -40°C TO 85°C
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
3.3
3.6
VDD
Positive Supply Voltage
3.0
VIH
High Level Input Voltage
0.7*VDD
VIL
Low Level Input Voltage
VI
Input Voltage
IOH
High-Level Output Current
IOL
Low-Level Output Current
TA
Operating Free-Air Temperature
Units
V
V
0.3*VDD
0
-40
V
VDD
V
-24
mA
24
mA
85
°C
TABLE 4B. DC CHARACTERISTICS, VDD = 3.3V ± 0.3V, TA = -40°C TO 85°C
Symbol
Parameter
VIK
Input Voltage
Test Conditions
Minimum
II = -18mA
IOH = -1mA
VOH
Output High Voltage
Typical†
Output Low Voltage
Units
–1.2
V
VDD – 0.2
V
IOH = -24mA
2
V
IOH = -12mA
2.4
V
IOL = 1mA
VOL
Maximum
0.2
V
IOL = 24mA
0.8
V
IOL = 12mA
0.55
V
VO = 1V
–50
mA
IOH
Output High Current
IOL
Output Low Current
II
Input Current
IDD
Dynamic Current
Ci
Input Capacitance
VI = 0V or VDD
3
pF
Co
Output Capacitance
VI = 0V or VDD
3.2
pF
VO = 1.65V
–5 5
VO = 2V
mA
60
VO = 1.65V
mA
70
mA
VI = 0V or VDD
±150
µA
f = 67MHz
37
mA
†
All typical values are at respective nominal VDD and 25°C.
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TABLE 5. AC CHARACTERISTICS, VDD = 3.3V ± 0.3V, TA = -40°C TO 85°C
Symbol Parameter
t sk(o)
Clock Frequency; NOTE 1
Propagation Delay, Low to High;
NOTE 2
Propagation Delay, High to Low;
NOTE 2
Output Skew; NOTE 3, 4
t sk(p)
Pulse Skew
t sk(pr)
Process Skew
t sk(pp)
Par t-to-Par t Skew; NOTE 4, 5
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter section
fclk
tpLH
tpHL
tjit
Thigh
CLK High Time
Tlow
CLK Low Time
tR
Output Rise Slew Rate‡
Test Conditions
Minimum
Typical†
0
Maximum
Units
140
MHz
1.8
2.5
3
ns
1.8
2.4
3
ns
50
100
ps
170
ps
200
300
ps
250
400
ps
140MHz
140MHz, Integration Range:
10kHz – 20MHz
66MHz
6
ns
140MHz
3
ns
66MHz
6
ns
0.15
140MHz
3
0.2VDD to 0.6VDD
1.5
ps
ns
2.7
4
V/ns
Output Fall Slew Rate‡
0.6VDD to 0.2VDD
1.5
2.7
4
V/ns
tF
†
All typical values are at respective nominal VDD.
‡
This symbol is according to PCI-X terminology.
NOTE 1: Switching characteristics over recommended ranges of supply voltages and operating free-air temperature,
CL = 10pF, VDD = 3.3V ± 0.3V.
NOTE 2: Measured from VDD/2 of the input to VDD/2 of the output.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDD/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 5: Defined as skew between outputs on different devices operating a the same supply voltages and
with equal load conditions. Using the same type of input on each device, the output is measured at VDD/2.
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ADDITIVE PHASE JITTER
band to the power in the fundamental. When the required offset
is specified, the phase noise is called a dBc value, which simply
means dBm at a specified offset from the fundamental. By
investigating jitter in the frequency domain, we get a better
understanding of its effects on the desired application over the
entire time record of the signal. It is mathematically possible to
calculate an expected bit error rate given a phase noise plot.
The spectral purity in a band at a specific offset from the
fundamental compared to the power of the fundamental is called
the dBc Phase Noise. This value is normally expressed using a
Phase noise plot and is most often the specified plot in many
applications. Phase noise is defined as the ratio of the noise power
present in a 1Hz band at a specified offset from the fundamental
frequency to the power value of the fundamental. This ratio is
expressed in decibels (dBm) or a ratio of the power in the 1Hz
SSB PHASE NOISE dBc/HZ
Input/Output Additive Phase Jitter at
140MHz (12kHz – 20MHz) = 0.15ps typical
OFFSET FROM CARRIER FREQUENCY (HZ)
device. This is illustrated above. The device meets the noise floor
of what is shown, but can actually be lower. The phase noise is
dependent on the input source and measurement equipment.
As with most timing specifications, phase noise measurements
has issues relating to the limitations of the equipment. Often the
noise floor of the equipment is higher than the noise floor of the
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PARAMETER MEASUREMENT INFORMATION
VDD
V
DD
Qx
140Ω
2
Yn
V
10pF
DD
140Ω
Qy
3.3V CORE/3.3V OUTPUT LOAD AC TEST CIRCUIT
Part 1
Qx
2
tsk(o)
OUTPUT SKEW
VDD
VDD
V
DD
2
2
CLKIN
2
VDD
VDD
Part 2
Q0:Q3
V
DD
Qy
2
2
tpLH
tpHL
2
tsk(pp)
PART-TO-PART SKEW
PROPAGATION DELAY
V
DD
2
Q0:Q3
t PW
t
odc =
tcyc
PERIOD
t PW
thigh
x 100%
0.6VDD
VIH(min)
t PERIOD
tlow
Vtest
VIL(max)
0.2VDD
OUTPUT DUTY CYCLE/PULSE WIDTH/PERIOD
0.6VDD
VF
0.2VDD
Q0:Q3
Parameter
0.6VDD
VR
0.2VDD
tR
0.4VDD
Peak-to-Peak (min)
tF
Value
Unit
VIH(min)
0.5VDD
V
VIL(max)
0.35VDD
V
Vtest
0.4VDD
V
NOTE: All parameters are according to PCI-X 1.0 specifications
OUTPUT RISE/FALL SLEW RATES
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PARAMETER MEASUREMENT INFORMATION, CONTINUED
Supply Current
vs
Frequency
35
VDD=3.6V
o
TA=85 C
30
IDD - Supply Current - mA
25
20
15
10
5
0
0
20
40
60
80
100
120
140
160
f - Frequency - MHz
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APPLICATION INFORMATION
RECOMMENDATIONS FOR UNUSED INPUT AND OUTPUT PINS
INPUTS:
OUTPUTS:
OE INPUT
The OE pin must be tied either HIGH or LOW. Do not leave
floating.
LVCMOS OUTPUTS
All unused LVCMOS outputs can be left floating. We recommend
that there is no trace attached.
RELIABILITY INFORMATION
TABLE 6. θJAVS. AIR FLOW TABLE
FOR
8 LEAD TSSOP
θJA by Velocity (Meters per Second)
Multi-Layer PCB, JEDEC Standard Test Boards
0
1
2.5
121.5°C/W
117.3°C/W
115.3°C/W
TRANSISTOR COUNT
The transistor count for ICS830584I is: 307
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PACKAGE OUTLINE - G SUFFIX FOR 8 LEAD TSSOP
TABLE 7. PACKAGE DIMENSIONS
SYMBOL
Millimeters
Minimum
N
Maximum
8
A
--
1.20
A1
0.05
0.15
A2
0.80
1.05
b
0.19
0.30
c
0.09
0.20
D
2.90
3.10
E
E1
6.40 BASIC
4.30
e
4.50
0.65 BASIC
L
0.45
0.75
α
0°
8°
aaa
--
0.10
Reference Document: JEDEC Publication 95, MO-153
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TABLE 8. ORDERING INFORMATION
Part/Order Number
Marking
Package
Shipping Packaging
Temperature
830584AGILF
84AIL
8 lead "Lead-Free" TSSOP
tube
-40°C to 85°C
84AIL
8 lead "Lead-Free" TSSOP
2500 tape & reel
-40°C to 85°C
830584AGILFT
NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant.
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Incorporated (IDT) assumes no responsibility for either its use or for
infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and
industrial applications. Any other applications such as those requiring high reliability or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT
reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments.
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REVISION HISTORY SHEET
Rev
Table
Page
B
T4B
3
Description of Change
DC Characteristics Table - corrected Input Current typo from ±5µA max. to
±150µA max.
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Date
3/18/08
ICS830584AGI REV. B MARCH 31, 2009
ICS830584I
LOW SKEW, PCI-X 1-TO-4 FANOUT BUFFER
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© 2008 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT, the IDT logo, ICS and HiPerClockS are trademarks
of Integrated Device Technology, Inc. Accelerated Thinking is a service mark of Integrated Device Technology, Inc. All other brands, product names and marks are or may be
trademarks or registered trademarks used to identify products or services of their respective owners.
Printed in USA