IDT ICS889832AK

ICS889832
LOW SKEW, 1-TO-4 DIFFERENTIAL-TOLVDS FANOUT BUFFER
GENERAL DESCRIPTION
FEATURES
The ICS889832 is a high speed 1-to-4 DifferentialICS
to-LVDS Fanout Buffer and is a member of the
HiPerClockS™
HiPerClockS™ family of high performance clock
solutions from IDT. The ICS889832 is optimized
for high speed and very low output skew, making
it suitable for use in demanding applications such as SONET,
1 Gigabit and 10 Gigabit Ethernet, and Fibre Channel. The
internally terminated differential input and VREF _AC pin allow
other differential signal families such as LVPECL, LVDS, and
SSTL to be easily interfaced to the input with minimal use of
external components. The device also has an output enable
pin which may be useful for system test and debug purposes.
The ICS889832 is packaged in a small 3mm x 3mm 16-pin
VFQFN package which makes it ideal for use in spaceconstrained applications.
• Four differential LVDS outputs
• IN, nIN pair can accept the following differential input levels:
LVPECL, LVDS, SSTL
• 50Ω internal input termination to VT
• Output frequency: >2GHz
• Output skew: 25ps (maximum)
• Part-to-part skew: 200ps (maximum)
• Additive phase jitter, RMS: <0.2ps (typical)
• Propagation delay: 510ps (maximum)
• 2.5V operating supply
• -40°C to 85°C ambient operating temperature
• Available in both standard (RoHS 5) and lead-free (RoHS 6)
packages
16 15 14 13
12
IN
nQ0
nQ1 2
11
VT
Q2 3
10
VREF_AC
nQ2 4
Q2
EN
7
8
nIN
ICS889832
nQ2
D
6
EN
50Ω
nIN
9
5
VDD
nQ1
nQ3
50Ω
VREF_AC
GND
Q1 1
Q1
VT
VDD
Q0
Q3
IN
Q0
PIN ASSIGNMENT
nQ0
BLOCK DIAGRAM
16-Lead VFQFN
3mm x 3mm x 0.95 package body
K Package
Top View
Q
Q3
nQ3
IDT ™ / ICS™ LVDS FANOUT BUFFER
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TABLE 1. PIN DESCRIPTIONS
Number
Name
1, 2
Q1, nQ1
Type
Description
Output
Differential output pair. LVDS interface levels.
3, 4
Q2, nQ2
Output
Differential output pair. LVDS interface levels.
5, 6
Q3, nQ3
Output
Differential output pair. LVDS interface levels.
7, 14
VDD
Power
8
EN
Input
9
nIN
Input
Positive supply pins.
Synchronizing clock enable. When LOW, Q outputs will go LOW and nQ
outputs will go HIGH on the next LOW transition at IN inputs. Input
threshold is VDD/2V. Includes a 37kΩ pull-up resistor. Default state is
HIGH when left floating. The internal latch is clocked on the falling edge
of the input signal IN. LVTTL / LVCMOS interface levels.
Inver ting differential clock input. 50Ω internal input termination to VT.
10
VREF_AC
Output
Pullup
Reference voltage for AC-coupled applications.
11
VT
Input
Termination input.
12
IN
Input
Non-inver ting differential clock input. 50Ω internal input termination to VT.
13
GND
Power
Power supply ground.
15, 16
Q0, nQ0
Output
Differential output pair. LVDS interface levels.
NOTE: Pullup refers to internal input resistors. See Table 2, Pin Characteristics, for typical values.
TABLE 2. PIN CHARACTERISTICS
Symbol
Parameter
RPULLUP
Input Pullup Resistor
IDT ™ / ICS™ LVDS FANOUT BUFFER
Test Conditions
Minimum
Typical
37
2
Maximum
Units
kΩ
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TABLE 3A. CONTROL INPUT FUNCTION TABLE
Input
Outputs
EN
Q0:Q3
nQ0:nQ3
0
Disabled; LOW
Disabled; HIGH
1
Enabled
Enabled
After EN switches, the clock outputs are disabled or enabled
following a falling input clock edge as shown in Figure 1.
EN
VDD/2
VDD/2
tS
tH
nIN
IN
nQx
VIN
→
←
tPD
VOUT Swing
Qx
FIGURE 1. EN TIMING DIAGRAM
TABLE 3B. TRUTH TABLE
Inputs
IN
nI N
Outputs
EN
Q0:Q3
nQ0:nQ3
0
1
1
0
1
1
0
1
1
0
X
X
0
0(NOTE1)
1(NOTE1)
NOTE 1: On next negative transition of the input signal (IN).
IDT ™ / ICS™ LVDS FANOUT BUFFER
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ABSOLUTE MAXIMUM RATINGS
Supply Voltage, VDD
NOTE: Stresses beyond those listed under Absolute
4.6V
Maximum Ratings may cause permanent damage to the
Inputs, VI
-0.5V to VDD + 0.5 V
Outputs, IO (LVDS)
Continuous Current
Surge Current
10mA
15mA
those listed in the DC Characteristics or AC Characteristics is not
Input Current, IN, nIN
±50mA
tended periods may affect product reliability.
VT Current, IVT
±100mA
Input Sink/Source, IREF_AC
± 0.5mA
Operating Temperature Range, TA
-40°C to +85°C
Storage Temperature, TSTG
-65°C to 150°C
Package Thermal Impedance, θJA
51.5°C/W (0 lfpm)
device. These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
implied. Exposure to absolute maximum rating conditions for ex-
(Junction-to-Ambient)
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = 2.5V ± 5%; TA = -40°C TO 85°C
Symbol
Parameter
Test Conditions
VDD
Positive Supply Voltage
IDD
Power Supply Current
Minimum
Typical
Maximum
Units
2.375
2.5
2.625
V
120
mA
TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, VDD = 2.5V ± 5%; TA = -40°C TO 85°C
Symbol
Parameter
Test Conditions
VIH
Input High Voltage
VIL
Input Low Voltage
IIH
Input High Current
EN
VDD = VIN = 2.625V
IIL
Input Low Current
EN
VDD = 2.625V, VIN = 0V
Minimum
Typical
Maximum
Units
1.7
VDD + 0.3
V
0
0.7
V
5
µA
-150
µA
TABLE 4C. DIFFERENTIAL DC CHARACTERISTICS, VDD = 2.5V ± 5%; TA = -40°C TO 85°C
Symbol
Parameter
RIN
Differential Input Resistance
(IN, nIN)
Test Conditions
Minimum
Typical
Maximum
Units
IN-to-VT
40
50
60
Ω
VIH
Input High Voltage
(IN, nIN)
1.2
VDD
V
VIL
Input Low Voltage
(IN, nIN)
0
VIH - 0.15
V
VIN
Input Voltage Swing
0.15
2.8
V
VREF_AC
Reference Voltage
VDIFF_IN
Differential Input Voltage Swing
IIN
Input Current; NOTE 1
VDD - 1.42
0.3
(IN, nIN)
VDD - 1.37
VDD - 1.32
V
3.4
V
35
mA
NOTE 1: Guaranteed by design.
IDT ™ / ICS™ LVDS FANOUT BUFFER
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TABLE 4D. LVDS DC CHARACTERISTICS, VDD = 2.5V ± 5%; TA = -40°C TO 85°C
Symbol
Parameter
VOD
Differential Output Voltage
∆ VOD
VOD Magnitude Change
VOS
Offset Voltage
∆ VOS
VOS Magnitude Change
Test Conditions
Minimum
Typical
Maximum
Units
0.3
0.4
0.5
mV
50
mV
1
1.25
1.5
V
50
mV
Maximum
Units
TABLE 5. AC CHARACTERISTICS, VDD = 2.5V ± 5%; TA = -40°C TO 85°C
Symbol
Parameter
fMAX
Maximum Output Frequency
Propagation Delay; (Differential);
NOTE 1
Output Skew; NOTE 2, 4
t PD
t sk(o)
t sk(pp)
t jit
Condition
Par t-to-Par t Skew; NOTE 3, 4
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter section
Minimum
Typical
>2
275
Integration Range:
12kHz - 20MHz
390
GHz
510
ps
25
ps
200
ps
<0.2
ps
tR/tF
Output Rise/Fall Time
tS
Clock Enable Setup Time
EN to IN, nIN
300
ps
tH
Clock Enable Hold Time
EN to IN, nIN
300
ps
20% to 80%
70
150
235
ps
All parameters are measured at ≤ 1GHz unless otherwise noted.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at the output differential cross points.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at the differential cross points.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
IDT ™ / ICS™ LVDS FANOUT BUFFER
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ADDITIVE PHASE JITTER
band to the power in the fundamental. When the required offset
is specified, the phase noise is called a dBc value, which simply
means dBm at a specified offset from the fundamental. By
investigating jitter in the frequency domain, we get a better
understanding of its effects on the desired application over the
entire time record of the signal. It is mathematically possible to
calculate an expected bit error rate given a phase noise plot.
The spectral purity in a band at a specific offset from the
fundamental compared to the power of the fundamental is called
the dBc Phase Noise. This value is normally expressed using a
Phase noise plot and is most often the specified plot in many
applications. Phase noise is defined as the ratio of the noise power
present in a 1Hz band at a specified offset from the fundamental
frequency to the power value of the fundamental. This ratio is
expressed in decibels (dBm) or a ratio of the power in the 1Hz
0
-10
Additive Phase Jitter @ 200MHz
(12kHz to 20MHz) = <0.2ps (typical)
-20
-30
-40
-50
SSB PHASE NOISE dBc/HZ
-60
-70
-80
-90
-100
-110
-120
-130
-140
-150
-160
-170
-180
-190
1k
10k
100k
1M
10M
100M
OFFSET FROM CARRIER FREQUENCY (HZ)
As with most timing specifications, phase noise measurements
have issues. The primary issue relates to the limitations of the
equipment. Often the noise floor of the equipment is higher than
the noise floor of the device. This is illustrated above. The device
IDT ™ / ICS™ LVDS FANOUT BUFFER
meets the noise floor of what is shown, but can actually be lower.
The phase noise is dependant on the input source and
measurement equipment.
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LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-LVDS FANOUT BUFFER
PARAMETER MEASUREMENT INFORMATION
VDD
SCOPE
Qx
VDD
2.5V±5%
POWER SUPPLY
+ Float GND –
nIN
LVDS
V
Cross Points
IN
V
IH
IN
nQx
V
IL
GND
OUTPUT LOAD AC TEST CIRCUIT
DIFFERENTIAL INPUT LEVEL
nQx
PART 1
Qx
nQx
nQy
nQy
Qx
PART 2
Qy
Qy
t sk(pp)
t sk(o)
PART-TO-PART SKEW
OUTPUT SKEW
nIN
80%
80%
IN
VOD
Clock
Outputs
20%
20%
tR
nQ0:nQ3
tF
Q0:Q3
tPD
OUTPUT RISE/FALL TIME
IDT ™ / ICS™ LVDS FANOUT BUFFER
PROPAGATION DELAY
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nIN
IN
t HOLD
EN
VDIFF_IN, VDIFF_OUT
800mV
(typical)
t SET-UP
SINGLE ENDED & DIFFERENTIAL INPUT VOLTAGE SWING
SETUP & HOLD TIME
VDD
VDD
100
out
➤
VOD/∆ VOD
LVDS
➤
out
DC Input
➤
LVDS
➤
out
DC Input
VIN, VOUT
400mV
(typical)
out
➤
VOS/∆ VOS
➤
DIFFERENTIAL OUTPUT VOLTAGE SETUP
IDT ™ / ICS™ LVDS FANOUT BUFFER
OFFSET VOLTAGE SETUP
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APPLICATION INFORMATION
Ω TERMINATIONS INTERFACE
LVPECL INPUT WITH BUILT-IN 50Ω
The IN /nIN with built-in 50Ω terminations accepts LVDS, LVPECL,
LVHSTL, CML, SSTL and other differential signals. Both VSWING
and VOH must meet the VPP and VCMR input requirements. Figures
1A to 1f show interface examples for the HiPerClockS IN/nIN
input with built-in 50Ω terminations driven by the most common
3.3V or 2.5V
driver types. The input interfaces suggested here are examples
only. If the driver is from another vendor, use their termination
recommendation. Please consult with the vendor of the driver
component to confirm the driver termination requirements.
2.5V
2.5V
2.5V
Zo = 50 Ohm
Zo = 50 Ohm
IN
IN
VT
Zo = 50 Ohm
nIN
Receiver
With
Built-In
50 Ohm
LVDS
Receiver
With
Built-In
50 Ohm
2.5V LVPECL
R1
18
Ω
FIGURE 1A. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
DRIVEN BY AN LVDS DRIVER
2.5V
VT
Zo = 50 Ohm
nIN
Ω
FIGURE 1B. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
DRIVEN BY AN LVPECL DRIVER
2.5V
2.5V
2.5V
Zo = 50 Ohm
Zo = 50 Ohm
IN
IN
VT
Zo = 50 Ohm
nIN
CML - Open Collector
VT
Zo = 50 Ohm
nIN
Receiver
With
Built-In
50 Ohm
CML - Built-in 50 Ohm Pull-up
Receiver
With
Built-In
50 Ohm
Ω
FIGURE 1D. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
DRIVEN BY A CML DRIVER WITH
Ω
FIGURE 1C. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
DRIVEN BY AN OPEN COLLECTOR CML DRIVER
Ω PULLUP
BUILT-IN 50Ω
2.5V
2.5V
3.3V
3.3V
3.3V LVPECL
Zo = 50 Ohm
C1
3.3V CML with
Built-In Pullup
IN
Zo = 50 Ohm
C1
IN
50 Ohm
50 Ohm
VT
Zo = 50 Ohm
C2
VT
50 Ohm
Zo = 50 Ohm
nIN
R5
100 - 200 Ohm
REF_AC
Receiver with Built-In 50Ω
Receiver with Built-In 50Ω
Ω
FIGURE 1E. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
IDT ™ / ICS™ LVDS FANOUT BUFFER
50 Ohm
nIN
REF_AC
R5
100 - 200 Ohm
C2
Ω
FIGURE 1F. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
DRIVEN BY A 3.3V CML DRIVER WITH
BUILT-IN PULLUP
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RECOMMENDATIONS FOR UNUSED OUTPUT PINS
OUTPUTS:
LVDS Output
All unused LVDS outputs can be left floating. We recommend
that there is no trace attached. Both sides of the differential
output pair should either be left floating or terminated.
2.5V LVDS DRIVER TERMINATION
transmission line environment. For buffer with multiple LDVS driver,
it is recommended to terminate the unused outputs.
Figure 2 shows a typical termination for LVDS driver in
characteristic impedance of 100Ω differential (50Ω single)
2.5V
2.5V
LVDS_Driv er
+
R1
100
-
100 Ohm
Differential
Transmission
Line
Ω
100Ω
Differential Transmission
Line
FIGURE 2. TYPICAL LVDS DRIVER TERMINATION
IDT ™ / ICS™ LVDS FANOUT BUFFER
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POWER CONSIDERATIONS
This section provides information on power dissipation and junction temperature for the ICS889832.
Equations and example calculations are also provided.
1. Power Dissipation.
The total power dissipation for the ICS889832 is the sum of the core power plus the power dissipated in the load(s).
The following is the power dissipation for VDD = 2.5V + 5% = 2.625V, which gives worst case results.
•
Power_MAX = VDD_MAX * IDD_MAX = 2.625V * 120mA = 315mW
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad and directly affects the reliability of the
device. The maximum recommended junction temperature for HiPerClockSTM devices is 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA
Tj = Junction Temperature
θJA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used. Assuming no air
flow of and a multi-layer board, the appropriate value is 51.5°C/W per Table 6 below.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 0.315W * 51.5°C/W = 101.2°C. This is well below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow, and
the type of board (single layer or multi-layer).
TABLE 6. THERMAL RESISTANCE θ JA
FOR
16-PIN VFQFN, FORCED CONVECTION
θJA vs. 0 Air Flow (Linear Feet per Minute)
0
Multi-Layer PCB, JEDEC Standard Test Boards
IDT ™ / ICS™ LVDS FANOUT BUFFER
51.5°C/W
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RELIABILITY INFORMATION
TABLE 7. θJAVS. AIR FLOW TABLE
FOR
16 LEAD VFQFN
θJA vs. 0 Air Flow (Linear Feet per Minute)
0
Multi-Layer PCB, JEDEC Standard Test Boards
51.5°C/W
TRANSISTOR COUNT
The transistor count for ICS889832 is: 206
Pin compatible with SY89832U
IDT ™ / ICS™ LVDS FANOUT BUFFER
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PACKAGE OUTLINE - K SUFFIX FOR 16 LEAD VFQFN
TABLE 8. PACKAGE DIMENSIONS
JEDEC VARIATION
ALL DIMENSIONS IN MILLIMETERS
SYMBOL
MINIMUM
MAXIMUM
16
N
A
0.80
1.0
A1
0
0.05
0.25 Reference
A3
b
0.18
0.30
e
0.50 BASIC
ND
4
NE
4
3.0
D
D2
0.25
1.25
3.0
E
E2
0.25
1.25
L
0.30
0.50
Reference Document: JEDEC Publication 95, MO-220
IDT ™ / ICS™ LVDS FANOUT BUFFER
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TABLE 9. ORDERING INFORMATION
Part/Order Number
Marking
Package
Shipping Packaging
Temperature
ICS889832AK
832A
16 Lead VFQFN
tube
-40°C to 85°C
ICS889832AKT
832A
16 Lead VFQFN
2500 tape & reel
-40°C to 85°C
ICS889832AK
TBD
16 Lead "Lead-Free" VFQFN
tube
-40°C to 85°C
ICS889832AKT
TBD
16 Lead "Lead-Free" VFQFN
2500 tape & reel
-40°C to 85°C
NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant.
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Incorporated (IDT) assumes no responsibility for either its use or for
infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and
industrial applications. Any other applications such as those requiring high reliability or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT
reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments.
IDT ™ / ICS™ LVDS FANOUT BUFFER
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Innovate with IDT and accelerate your future networks. Contact:
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For Sales
For Tech Support
800-345-7015
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Fax: 408-284-2775
[email protected]
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Asia Pacific and Japan
Europe
Integrated Device Technology, Inc.
6024 Silver Creek Valley Road
San Jose, CA 95138
United States
800 345 7015
+408 284 8200 (outside U.S.)
Integrated Device Technology
Singapore (1997) Pte. Ltd.
Reg. No. 199707558G
435 Orchard Road
#20-03 Wisma Atria
Singapore 238877
+65 6 887 5505
IDT Europe, Limited
321 Kingston Road
Leatherhead, Surrey
KT22 7TU
England
+44 (0) 1372 363 339
Fax: +44 (0) 1372 378851
© 2006 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT, the IDT logo, ICS and HiPerClockS are trademarks
of Integrated Device Technology, Inc. Accelerated Thinking is a service mark of Integrated Device Technology, Inc. All other brands, product names and marks are or may be
trademarks or registered trademarks used to identify products or services of their respective owners.
Printed in USA