AT93C46 (AT35514) 3-Wire Bus Serial EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT93C46 3-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado Springs Facility. This report summarizes the product level qualification data, ESD, Latchup, and Write Endurance for the AT93C46 Serial EEPROM. This data, in conjunction with the AT35000 Process Qualification and Reliability Report, qualifies the AT93C46. Package specific qualification data is provided separately. • 2325 Orchard Parkway • San Jose CA 95131 • AT35514 Product Qualification ESD Characterization ORYX Model 11000 ESD Test System Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C & 125C Quantity Tested: 3/Lot/Voltage Device:AT93C46 (35514) Human Body Model Testing – Mil Std 883, Method 3015 Lot Number: 3e2855 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 500V 2000V Name 1000V 4000V Vcc Power Vcc 3/0 3/0 3/0 3/3 3/0 3000 Gnd Ground Gnd 3/0 3/0 3/0 3/3 3/0 3000 Org Internal Organization Input 3/0 3/0 3/0 3/3 3/0 3000 DO Serial Data Output output 3/0 3/0 3/0 3/3 3/0 3000 CS Chip Select Input 3/0 3/0 3/0 3/3 3/0 3000 DC Don’t Connect Input 3/0 3/0 3/0 3/3 3/0 3000 SK Serial Data Clock Input 3/0 3/0 3/0 3/3 3/0 3000 DI Serial Data Input Input 3/0 3/0 3/0 3/3 3/0 3000 Functional Test Only. Failing Pin Not Identified See Above 3/0 3/0 3/0 3/3 3/0 3000 Machine Model Testing – JEDEC Std 22A, Method 115A Lot Number: 3j3547/4g2804F 1 Positive & 1 Negative Pulse per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 100V 200V Name 150V 300V Vcc Power Vcc 3/0 3/0 3/0 3/3 3/0 250 Gnd Ground Gnd 3/0 3/0 3/0 3/3 3/0 250 Org Internal Organization Input 3/0 3/0 3/0 3/3 3/0 250 DO Serial Data Output output 3/0 3/0 3/0 3/3 3/0 250 CS Chip Select Input 3/0 3/0 3/0 3/3 3/0 250 DC Don’t Connect Input 3/0 3/0 3/0 3/3 3/0 250 SK Serial Data Clock Input 3/0 3/0 3/0 3/3 3/0 250 DI Serial Data Input Input 3/0 3/0 3/0 3/3 3/0 250 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 • 2325 Orchard Parkway • San Jose CA 95131 • 3/0 3/3 250 AT35514 Product Qualification ESD Characterization ORYX Model 9000 ESD Test System Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C & 125C Quantity Tested: 3/Lot/Voltage Device: AT93C46 (35514) Charged Device Model Testing – JESD 22-C101A Lot Number:3j3426/4g2804F 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 250V 750V Name 500V 1000V Vcc Power Vcc 3/0 3/0 3/0 3/0 3/0 1000 Gnd Ground Gnd 3/0 3/0 3/0 3/0 3/0 1000 Org Internal Organization Input 3/0 3/0 3/0 3/0 3/0 1000 DO Serial Data Output Output 3/0 3/0 3/0 3/0 3/0 1000 CS Chip Select Input 3/0 3/0 3/0 3/0 3/0 1000 DC Don’t Connect Input 3/0 3/0 3/0 3/0 3/0 1000 SK Serial Data Clock Input 3/0 3/0 3/0 3/0 3/0 1000 DI Serial Data Input Input 3/0 3/0 3/0 3/0 3/0 1000 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 • 2325 Orchard Parkway • San Jose CA 95131 • 3/0 3/0 1000 AT35514 Product Qualification Latch-Up Characterization Device: AT93C46 Lot Number: 3h2544 Quantity Tested: 5 per lot Test Method: JEDEC 78 Test Temperature: 125C Electrical Test Temperature: -40C, 25C, 125C Over Current Test Voltage Vcc = 5.0V Maximum Applied Trigger Current = 200 mA Maximum Applied Trigger Voltage = 7.0 V Max Trigger Current Pin Name Vcc Gnd Org DO CS DC SK DI Tested As Function Power Vcc Ground Gnd Internal Organization Input Serial Data Output Output Chip Select Input Don’t Connect Input Serial Data Clock Input Serial Data Input Input Passing* -I (mA) --200 200 200 200 200 200 200 Passing* +I (mA) --200 200 200 200 200 200 200 Max Trigger Voltage Compliance Passing* Passing* Compliance +V (V) Setting (mA) Setting (V) -V (V) --------7.0 ------7.0 ------7.0 ------7.0 ------7.0 ------7.0 ------7.0 ------- * 0 Fails for Latchup or Post Stress Functional Tests. Write Endurance Characterization Device: AT93C46 Lot Number: 2h2886 Quantity Tested: 100 Test Temperature: 125C Electrical Test Temperature: -40C, 25C, 125C Vcc: 5 Volts Write Mode: Byte Highest Passing Cycles: 1,000,000 Cycles To First Failure: NA Quantity Failed: 0 • 2325 Orchard Parkway • San Jose CA 95131 •