View detail for AT93C46 Reliability Qualification Report

AT93C46
(AT35514)
3-Wire Bus Serial EEPROM
Product Qualification
• 2325 Orchard Parkway • San Jose CA 95131 •
The AT93C46 3-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS
process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado
Springs Facility.
This report summarizes the product level qualification data, ESD, Latchup, and Write
Endurance for the AT93C46 Serial EEPROM. This data, in conjunction with the
AT35000 Process Qualification and Reliability Report, qualifies the AT93C46.
Package specific qualification data is provided separately.
• 2325 Orchard Parkway • San Jose CA 95131 •
AT35514 Product Qualification
ESD Characterization
ORYX Model 11000 ESD Test System
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C & 125C
Quantity Tested: 3/Lot/Voltage
Device:AT93C46 (35514)
Human Body Model Testing – Mil Std 883, Method 3015
Lot Number: 3e2855
3 Positive & 3 Negative Pulses per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
500V
2000V
Name
1000V
4000V
Vcc
Power
Vcc
3/0
3/0
3/0
3/3
3/0
3000
Gnd
Ground
Gnd
3/0
3/0
3/0
3/3
3/0
3000
Org
Internal Organization
Input
3/0
3/0
3/0
3/3
3/0
3000
DO
Serial Data Output
output
3/0
3/0
3/0
3/3
3/0
3000
CS
Chip Select
Input
3/0
3/0
3/0
3/3
3/0
3000
DC
Don’t Connect
Input
3/0
3/0
3/0
3/3
3/0
3000
SK
Serial Data Clock
Input
3/0
3/0
3/0
3/3
3/0
3000
DI
Serial Data Input
Input
3/0
3/0
3/0
3/3
3/0
3000
Functional Test Only. Failing
Pin Not Identified
See Above
3/0
3/0
3/0
3/3
3/0
3000
Machine Model Testing – JEDEC Std 22A, Method 115A
Lot Number: 3j3547/4g2804F
1 Positive & 1 Negative Pulse per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
100V
200V
Name
150V
300V
Vcc
Power
Vcc
3/0
3/0
3/0
3/3
3/0
250
Gnd
Ground
Gnd
3/0
3/0
3/0
3/3
3/0
250
Org
Internal Organization
Input
3/0
3/0
3/0
3/3
3/0
250
DO
Serial Data Output
output
3/0
3/0
3/0
3/3
3/0
250
CS
Chip Select
Input
3/0
3/0
3/0
3/3
3/0
250
DC
Don’t Connect
Input
3/0
3/0
3/0
3/3
3/0
250
SK
Serial Data Clock
Input
3/0
3/0
3/0
3/3
3/0
250
DI
Serial Data Input
Input
3/0
3/0
3/0
3/3
3/0
250
Functional Test Only
Failing Pin Not Identified
See Above
3/0
3/0
3/0
• 2325 Orchard Parkway • San Jose CA 95131 •
3/0
3/3
250
AT35514 Product Qualification
ESD Characterization
ORYX Model 9000 ESD Test System
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C & 125C
Quantity Tested: 3/Lot/Voltage
Device: AT93C46 (35514)
Charged Device Model Testing – JESD 22-C101A
Lot Number:3j3426/4g2804F
3 Positive & 3 Negative Pulses per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
250V
750V
Name
500V
1000V
Vcc
Power
Vcc
3/0
3/0
3/0
3/0
3/0
1000
Gnd
Ground
Gnd
3/0
3/0
3/0
3/0
3/0
1000
Org
Internal Organization
Input
3/0
3/0
3/0
3/0
3/0
1000
DO
Serial Data Output
Output
3/0
3/0
3/0
3/0
3/0
1000
CS
Chip Select
Input
3/0
3/0
3/0
3/0
3/0
1000
DC
Don’t Connect
Input
3/0
3/0
3/0
3/0
3/0
1000
SK
Serial Data Clock
Input
3/0
3/0
3/0
3/0
3/0
1000
DI
Serial Data Input
Input
3/0
3/0
3/0
3/0
3/0
1000
Functional Test Only
Failing
Pin Not Identified
See Above
3/0
3/0
3/0
• 2325 Orchard Parkway • San Jose CA 95131 •
3/0
3/0
1000
AT35514 Product Qualification
Latch-Up Characterization
Device: AT93C46
Lot Number: 3h2544
Quantity Tested: 5 per lot
Test Method: JEDEC 78
Test Temperature: 125C
Electrical Test Temperature: -40C, 25C, 125C
Over Current Test Voltage Vcc = 5.0V
Maximum Applied Trigger Current = 200 mA
Maximum Applied Trigger Voltage = 7.0 V
Max Trigger Current
Pin Name
Vcc
Gnd
Org
DO
CS
DC
SK
DI
Tested As
Function
Power
Vcc
Ground
Gnd
Internal Organization
Input
Serial Data Output
Output
Chip Select
Input
Don’t Connect
Input
Serial Data Clock
Input
Serial Data Input
Input
Passing*
-I (mA)
--200
200
200
200
200
200
200
Passing*
+I (mA)
--200
200
200
200
200
200
200
Max Trigger Voltage
Compliance Passing* Passing* Compliance
+V (V) Setting (mA)
Setting (V)
-V (V)
--------7.0
------7.0
------7.0
------7.0
------7.0
------7.0
------7.0
-------
* 0 Fails for Latchup or Post Stress Functional Tests.
Write Endurance Characterization
Device: AT93C46
Lot Number: 2h2886
Quantity Tested: 100
Test Temperature: 125C
Electrical Test Temperature: -40C, 25C, 125C
Vcc: 5 Volts
Write Mode: Byte
Highest Passing Cycles: 1,000,000
Cycles To First Failure: NA
Quantity Failed: 0
• 2325 Orchard Parkway • San Jose CA 95131 •