View detail for AT24C02A Reliability Qualification Report

AT24C02A
(AT35530)
2-Wire Bus Serial EEPROM
Product Qualification
• 2325 Orchard Parkway • San Jose CA 95131 •
The AT24C02A 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS
process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado
Springs Facility.
This report summarizes the product level qualification data, ESD, Latchup, and Write
Endurance for the AT24C02A Serial EEPROM. This data, in conjunction with the
AT35000 Process Qualification and Reliability Report, qualifies the AT24C02A.
Package specific qualification data is provided separately.
• 2325 Orchard Parkway • San Jose CA 95131 •
AT35530 Product Qualification
ESD Characterization
ORYX Model 11000 ESD Test System
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester
Quantity Tested: 3/Lot/Voltage
Device:AT24C02A
Human Body Model Testing – Mil Std 883, Method 3015
Lot Number: 1j2988
3 Positive & 3 Negative Pulses per The Specified Pin
Combinations
Max Passing
Voltage
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
2000V
Name
500V
1000V
4000V
Vcc
Power
Vcc
3/0
3/0
3/0
2/0
3/0
2500
Gnd
Ground
Gnd
3/0
3/0
3/0
2/0
3/0
2500
A0
Address
Input
3/0
3/0
3/0
2/0
3/0
2500
A1
Address
Input
3/0
3/0
3/0
2/0
3/0
2500
A2
Address
Input
3/0
3/0
3/0
2/0
3/0
2500
WP
Write Protect
Input
3/0
3/0
3/0
2/0
3/0
2500
SCL
Serial Clock Input
Input
3/0
3/0
3/0
2/0
3/0
2500
SDA
Serial Data
Input/Output
3/0
3/0
3/0
2/0
3/0
2500
Functional Test Only
Failing Pin Not Identified
See Above
3/0
3/0
3/0
2/0
3/0
2500
Machine Model Testing – JEDEC Std 22A, Method 115A
Lot Number: 2h2255
1 Positive & 1 Negative Pulse per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
50V
150V
Name
100V
200V
Vcc
Power
Vcc
3/0
3/0
3/0
3/3
3/0
150
Gnd
Ground
Gnd
3/0
3/0
3/0
3/3
3/0
150
A0
Address
Input
3/0
3/0
3/0
3/3
3/0
150
A1
Address
Input
3/0
3/0
3/0
3/3
3/0
150
A2
Address
Input
3/0
3/0
3/0
3/3
3/0
150
WP
Write Protect
Input
3/0
3/0
3/0
3/3
3/0
150
SCL
Serial Clock Input
Input
3/0
3/0
3/0
3/3
3/0
150
SDA
Serial Data
Input/Output
3/0
3/0
3/0
3/3
3/0
150
Functional Test Only
Failing Pin Not Identified
See Above
3/0
3/0
3/0
• 2325 Orchard Parkway • San Jose CA 95131 •
3/3
3/0
150
AT35530 Product Qualification
Latch-Up Characterization
Device: AT24C02A
Lot Number: 1j2988
Quantity Tested: 5 per lot
Test Method: JEDEC 78
Test Temperature: 25C
Over Current Test Voltage Vcc = 5.0V
Maximum Applied Trigger Current = 200 mA
Maximum Applied Trigger Voltage = 7.0 V
Pin
Name
Function
Vcc
Gnd
A0
A1
A2
WP
SCL
SDA
SDA
Power
Ground
Address
Address
Address
Write Protect
Serial Clock Input
Serial Data
Serial Data
Max Trigger Current
Max Trigger Voltage
Complianc
Passing* Passing*
Passing* Passing* Compliance
e Setting
Tested As -I (mA)
+V (V) Setting (mA)
+I (mA)
-V (V)
(V)
Vcc
--------7.0
250
Gnd
------------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Output
200
200
7.0
-------
* 0 Fails for Latchup or Post Stress Functional Tests.
Write Endurance Characterization
Device: AT24C02A
Lot Number: 1j2988
Quantity Tested: 100
Test Temperature: 25C
Vcc: 5 Volts
Write Mode: Page
Highest Passing Cycles: 2,400,000
Cycles To First Failure: NA
Quantity Failed: 0
• 2325 Orchard Parkway • San Jose CA 95131 •