AT24C02A (AT35530) 2-Wire Bus Serial EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT24C02A 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado Springs Facility. This report summarizes the product level qualification data, ESD, Latchup, and Write Endurance for the AT24C02A Serial EEPROM. This data, in conjunction with the AT35000 Process Qualification and Reliability Report, qualifies the AT24C02A. Package specific qualification data is provided separately. • 2325 Orchard Parkway • San Jose CA 95131 • AT35530 Product Qualification ESD Characterization ORYX Model 11000 ESD Test System Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester Quantity Tested: 3/Lot/Voltage Device:AT24C02A Human Body Model Testing – Mil Std 883, Method 3015 Lot Number: 1j2988 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Pin Qty/Fail Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 2000V Name 500V 1000V 4000V Vcc Power Vcc 3/0 3/0 3/0 2/0 3/0 2500 Gnd Ground Gnd 3/0 3/0 3/0 2/0 3/0 2500 A0 Address Input 3/0 3/0 3/0 2/0 3/0 2500 A1 Address Input 3/0 3/0 3/0 2/0 3/0 2500 A2 Address Input 3/0 3/0 3/0 2/0 3/0 2500 WP Write Protect Input 3/0 3/0 3/0 2/0 3/0 2500 SCL Serial Clock Input Input 3/0 3/0 3/0 2/0 3/0 2500 SDA Serial Data Input/Output 3/0 3/0 3/0 2/0 3/0 2500 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 2/0 3/0 2500 Machine Model Testing – JEDEC Std 22A, Method 115A Lot Number: 2h2255 1 Positive & 1 Negative Pulse per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 50V 150V Name 100V 200V Vcc Power Vcc 3/0 3/0 3/0 3/3 3/0 150 Gnd Ground Gnd 3/0 3/0 3/0 3/3 3/0 150 A0 Address Input 3/0 3/0 3/0 3/3 3/0 150 A1 Address Input 3/0 3/0 3/0 3/3 3/0 150 A2 Address Input 3/0 3/0 3/0 3/3 3/0 150 WP Write Protect Input 3/0 3/0 3/0 3/3 3/0 150 SCL Serial Clock Input Input 3/0 3/0 3/0 3/3 3/0 150 SDA Serial Data Input/Output 3/0 3/0 3/0 3/3 3/0 150 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 • 2325 Orchard Parkway • San Jose CA 95131 • 3/3 3/0 150 AT35530 Product Qualification Latch-Up Characterization Device: AT24C02A Lot Number: 1j2988 Quantity Tested: 5 per lot Test Method: JEDEC 78 Test Temperature: 25C Over Current Test Voltage Vcc = 5.0V Maximum Applied Trigger Current = 200 mA Maximum Applied Trigger Voltage = 7.0 V Pin Name Function Vcc Gnd A0 A1 A2 WP SCL SDA SDA Power Ground Address Address Address Write Protect Serial Clock Input Serial Data Serial Data Max Trigger Current Max Trigger Voltage Complianc Passing* Passing* Passing* Passing* Compliance e Setting Tested As -I (mA) +V (V) Setting (mA) +I (mA) -V (V) (V) Vcc --------7.0 250 Gnd ------------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Output 200 200 7.0 ------- * 0 Fails for Latchup or Post Stress Functional Tests. Write Endurance Characterization Device: AT24C02A Lot Number: 1j2988 Quantity Tested: 100 Test Temperature: 25C Vcc: 5 Volts Write Mode: Page Highest Passing Cycles: 2,400,000 Cycles To First Failure: NA Quantity Failed: 0 • 2325 Orchard Parkway • San Jose CA 95131 •